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Статті в журналах з теми "X-ray diffraction technique"
Jensen, D. Juul, and H. F. Poulsen. "The three dimensional X-ray diffraction technique." Materials Characterization 72 (October 2012): 1–7. http://dx.doi.org/10.1016/j.matchar.2012.07.012.
Повний текст джерелаSonawane, Tushar D., Rajesh Z. Mujoriya, and Harsha N. Nandre. "Review on X-Ray Powder Diffraction Technique." Research Journal of Pharmaceutical Dosage Forms and Technology 8, no. 4 (2016): 292. http://dx.doi.org/10.5958/0975-4377.2016.00040.9.
Повний текст джерелаGurzhiy, Vladislav V. "Single-Crystal X-Ray Diffraction." AM&P Technical Articles 178, no. 1 (January 1, 2020): 32–34. http://dx.doi.org/10.31399/asm.amp.2020-01.p032.
Повний текст джерелаNoyan, I. C., and G. Sheikh. "X-ray tensile testing of thin films." Journal of Materials Research 8, no. 4 (April 1993): 764–70. http://dx.doi.org/10.1557/jmr.1993.0764.
Повний текст джерелаHansford, G. M. "Phase-targeted X-ray diffraction." Journal of Applied Crystallography 49, no. 5 (September 1, 2016): 1561–71. http://dx.doi.org/10.1107/s1600576716011936.
Повний текст джерелаKlevtsov, Ghennadiy Vsevolodovich, Ludmila Rafailovna Botvina, and Natal'ya Arturovna Klevtsova. "X-ray Diffraction Technique for Analysing Failed Components." ISIJ International 36, no. 2 (1996): 222–28. http://dx.doi.org/10.2355/isijinternational.36.222.
Повний текст джерелаHAMAYA, Nozomu. "Polycrystalline X-ray Diffraction Technique with a DAC." REVIEW OF HIGH PRESSURE SCIENCE AND TECHNOLOGY 9, no. 4 (1999): 263–69. http://dx.doi.org/10.4131/jshpreview.9.263.
Повний текст джерелаKohara, S., N. Umesaki, H. Ohno, K. Suzuya, and I. Sakai. "The structure of oxide glasses studied by high-energy x-ray diffraction." Physics and Chemistry of Glasses: European Journal of Glass Science and Technology Part B 61, no. 6 (December 12, 2020): 233–38. http://dx.doi.org/10.13036/17533562.61.6.kohara.
Повний текст джерелаPalmer, David C. "Digital analysis of X-ray films." Mineralogical Magazine 61, no. 406 (June 1997): 453–61. http://dx.doi.org/10.1180/minmag.1997.061.406.11.
Повний текст джерелаHuang, T. C. "Grazing-incidence X-Ray Analysis of Surfaces and Thin Films." Advances in X-ray Analysis 35, A (1991): 143–50. http://dx.doi.org/10.1154/s0376030800008776.
Повний текст джерелаДисертації з теми "X-ray diffraction technique"
Hart, John Francis. "A new multiple scattering technique for X-ray photoelectron diffraction." Thesis, University of Leicester, 1997. http://hdl.handle.net/2381/30673.
Повний текст джерелаHe, Yue, and 贺悦. "Characterization of metal stabilization effect by X-ray diffraction technique and nano-indentation." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2011. http://hub.hku.hk/bib/B47753067.
Повний текст джерелаpublished_or_final_version
Civil Engineering
Master
Master of Philosophy
Rachwal, James D. "X-ray diffraction applications in thin films and (100) silicon substrate stress analysis." Scholar Commons, 2010. http://scholarcommons.usf.edu/etd/1745.
Повний текст джерелаBöhm, Jochen. "In situ tensile testing at the limits of X-ray diffraction a new synchrotron-based technique." Stuttgart Max-Planck-Inst. für Metallforschung, 2004. http://deposit.d-nb.de/cgi-bin/dokserv?idn=972182810.
Повний текст джерелаNieh, Yeu-Perng. "Development of the large-angle oscillation technique in rapid X-ray diffraction data collection and time-resolved Laue diffraction studies of hydroxymethylbilane synthase enzyme." Thesis, University of Manchester, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.680176.
Повний текст джерелаVoufack, Ariste Bolivard. "Modélisation multi-technique de la densité électronique." Thesis, Université de Lorraine, 2018. http://www.theses.fr/2018LORR0168/document.
Повний текст джерелаX-ray and neutron diffraction methods can be combined to determine simultaneously electron charge and spin densities in crystals based on spin resolved electron density model developed at CRM2. This method enables to carry out the study of interaction paths leading to the observed ferromagnetic order. First applications of this model were to coordination complexes, where the unpaired electron is mainly located on the transition metal, then generalized to explore organic radicals and to inorganic materials. In radical Nit(SMe)Ph, the modeling of the experimental charge and spin densities showed localization of spin density on O-N-C-N-O group (nitronyl -nitroxyde function), in agreement with previous works. It is also evidenced the involvement of the hydrogen bonds in the magnetic interactions leading to the ferromagnetic transition at very low temperature (0.6K). This study revealed dissymmetrical spin population of the two N-O groups that only CASSCF-type calculations can reproduce in amplitude (not DFT). This dissymmetry originates from both molecular and crystal effects. In radical p-O2NC6F4CNSSN belonging to the family of dithiadiazolyl, the joint refinement showed that the majority of the spin is distributed on -CNSSN group in agreement with the previous works. From topological properties of the charge density, halogen, chalcogen and π interactions have been highlighted. The most important magnetic interactions are observed through the network formed by contacts S ... N2 between neighboring molecules leading to the ferromagnetic order below 1.23K. Concerning the inorganic material, YTiO3, the charge densities in both paramagnetic and ferromagnetic phases and spin density were modelled. The results show that the most populated d orbitals of Ti atom are dxz and dyz. The orbital ordering evidenced in this material is observed at 100 and 20 K due to the orthorhombic distorsion. The wave function of the unpaired electron is a linear combination of these particularly populated t2g orbitals
Dogan, Ilker. "Fabrication And Characterization Of Aluminum Oxide And Silicon/aluminum Oxide Films With Si Nanocrystals Formed By Magnetron Co-sputtering Technique." Master's thesis, METU, 2008. http://etd.lib.metu.edu.tr/upload/12609687/index.pdf.
Повний текст джерелаSibanyoni, Johannes Mlandu. "Nanostructured light weight hydrogen storage materials." University of the Western Cape, 2012. http://hdl.handle.net/11394/4631.
Повний текст джерелаThe main objective of this study was to advance kinetic performances of formation and decomposition of magnesium hydride by design strategies which include high energy ball milling in hydrogen (HRBM), in combination with the introduction of catalytic/dopant additives. In this regard, the transformation of Mg → MgH2 by high energy reactive ball milling in hydrogen atmosphere (HRBM) of Mg with various additives to yield nanostructured composite hydrogen storage materials was studied using in situ pressure-temperature monitoring that allowed to get time-resolved results about hydrogenation behaviour during HRBM. The as-prepared and re-hydrogenated nanocomposites were characterized using XRD, high-resolution SEM and TEM, as well as measurements of the mean particle size. Dehydrogenation performances of the nanocomposites were studied by DSC / TGA and TDS; and the re-hydrogenation behaviour was investigated using Sieverts volumetric technique.
Olmo, Osuna Cristian. "Ultrasound micromolding technique and real-time X-ray diffraction using synchrotron radiation : applications to porous scaffolds for biomedical devices and study of thermal-induced transitions." Doctoral thesis, Universitat Politècnica de Catalunya, 2021. http://hdl.handle.net/10803/672329.
Повний текст джерелаEl uso de piezas de tamaño reducido se ha extendido en los últimos años como sinónimo de evolución tecnológica, especialmente en biomedicina, donde se están realizando grandes avances con el fin de mejorar la eficiencia de los tratamientos terapéuticos y aumentar el uso de procedimientos menos invasivos. El micromoldeo por ultrasonidos (USM) es una novedosa técnica para la obtención de micropiezas caracterizada por el uso de ultrasonidos como fuente de calor; gracias a este sistema calefacción el USM presenta tiempos de ciclo extremadamente cortos y un alto rendimiento energético. El trabajo expuesto en esta tesis doctoral se divide en dos partes, un primer bloque enfocado en explorar posibles aplicaciones biomédicas de micropiezas basadas en polímeros biodegradables y un segundo bloque en el que se estudia la posibilidad del uso de dicha técnica para la preparación de nanocompuestos. La polilactida (PLA) fue seleccionada como polímero biodegradable en el primer bloque para la producción de micropiezas cargadas con fármacos y scaffolds con actividad antibacteriana o reforzada con hidroxiapatita (HAp) para incrementar su osteoconductividad. Como agentes bactericidas se escogieron clorhexidina (CHX) y triclosan (TCS), los cuales se cargaron con éxito en la matriz de PLA presentando una distribución uniforme y una clara actividad antibacteriana. Los scaffolds porosos se prepararon por un proceso indirecto al remover la sal soluble en agua tras ser moldeada junto al polímero. Aunque era factible obtener piezas de PLA cargadas con NaCI sin problemas de cavitación o degradación del polímero la conexión entre los poros era insuficiente y una gran cantidad de sal quedaba retenida en la pieza final. Con tal de incrementar dicha interconexión y conseguir un scaffolds poroso libre de NaCI fue necesario agregar polietilenglicol (PEG). Los scaffolds finales cargados con TCS presentan una mejora en la proliferación celular, un efecto bactericida y bacteriostático y una liberación más rápida. En los sistemas PLA/HAp fue crítico el uso HAp libre de impurezas para evitar cavitaciones yamarilleamiento en las muestras. La incorporación de HAp mejoró la estabilidad térmica, la hidrofobicidad y la proliferación y colonización celular. Los procesos convencionales para la producción de nanocompuestos (preparación por disolución y mezclado en fundido) suelen usar ondas de ultrasonidos para mejorar el proceso y evitar la aglomeración de las nanopartículas, aumentando así las interacciones refuerzo-polímero. Con esta premisa en mente el segundo bloque de esta tesis abarca la producción, mediante USM de dos tipos de nanocom puestos: una matriz de policaprolactona (PCL) con nanotubos de carbono (MWCNT) y una matriz de poliamida 12 (Nylon 12) con arcilla. El USM es un proceso adecuado para la obtención de nanocompuestos exfoliados en un solo paso, incluso cuando la arcilla utilizada no ha sido modificada orgánicamente (N757). La influencia de ambos agentes externos (MWCNT y N757) en el proceso de cristalización y la morfología cristalina se han estudiado mediante e>IJ) erimentos de sincrotrón en tiempo real. Las transiciones polimórficas del nylon 12 también fueron estudiadas mediante los datos recopilados en los experimentos con radiación sincrotrón. En un último bloque se han estudiado también las estructuras y transiciones estructurales de los nylons 12 9, 8 9, 4 9, 4 5, así como varias copoliamides derivadas de la 1,4-butanodiamina y distintas proporciones de ácidos glutárico y azelaico (nylon 4,5+9) mediante datos calorimétricos, espectrocópicos y de difracción de rayos X recogidos en barridos de calentamiento y enfriamiento . Estas poliamidas tipo par-impar muestran estructuras peculiares y unas transiciones estructurales diferentes a las de otras poliamidas convencionales y cuyo origen aún no está claro.
Polímers i biopolímers
Böhm, Jochen [Verfasser]. "In situ tensile testing at the limits of X-ray diffraction : a new synchrotron-based technique / Institut für Metallkunde der Universität Stuttgart ... Vorgelegt von Jochen Böhm." Stuttgart : Max-Planck-Inst. für Metallforschung, 2004. http://d-nb.info/972182810/34.
Повний текст джерелаКниги з теми "X-ray diffraction technique"
Grant, Norton M., ed. X-Ray diffraction: A practical approach. New York: Plenum Press, 1998.
Знайти повний текст джерела1941-, Snyder R. L., ed. Introduction to X-ray powder diffractometry. New York: Wiley, 1996.
Знайти повний текст джерелаJohansson, Sven A. E. PIXE: A novel technique for elemental analysis. Chichester: Wiley, 1988.
Знайти повний текст джерелаE, Buhrke Victor, Jenkins Ron, and Smith, Deane K. (Deane Kingsley), eds. A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis. New York: Wiley-VCH, 1998.
Знайти повний текст джерелаD, Bartunik H., and Chance Britton, eds. Structural biological applications of x-ray absorption, scattering, and diffraction. Orlando: Academic Press, 1986.
Знайти повний текст джерелаR, Helliwell John, and Rentzepis Peter M. 1934-, eds. Time-resolved diffraction. Oxford: Clarendon Press, 1997.
Знайти повний текст джерелаInternational Conference on X-ray and Related Techniques in Research and Industry (2010 Langkawi Island, Kedah, Malaysia). X-ray and related techniques: Selected, peer reviewed papers from the International Conference on X-ray and Related Techniques in Research and Industry (IXCRI [sic] 2010) held at Langkawi Island, Malaysia from 9th to 10th of June 2010. Stafa-Zurich, Switzerland: Trans Tech Publications, 2011.
Знайти повний текст джерелаSuryanarayana, C., and M. Grant Norton. X-Ray Diffraction: A Practical Approach. Springer, 2013.
Знайти повний текст джерелаMethodik der Vielkristall-Röntgendiffraktometrie: Vorträge einer Weiterbildungsveranstaltung. Leipzig: Deutscher Verlag für Grundstoffindustrie, 1992.
Знайти повний текст джерелаCampbell, John L., and Sven A. E. Johansson. Pixe: A Novel Technique for Elemental Analysis. John Wiley & Sons Inc, 1988.
Знайти повний текст джерелаЧастини книг з теми "X-ray diffraction technique"
Knapp, G. S., M. A. Beno, G. Jennings, M. Engbretson, and M. Ramanathan. "Synchrotron and Laboratory Studies Utilizing a New Powder Diffraction Technique." In Advances in X-Ray Analysis, 653–61. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2972-9_75.
Повний текст джерелаChaudhuri, J., and F. Hashmi. "Determination of Thickness of Multiple Layer Thin Films by X-ray Diffraction Technique." In Advances in X-Ray Analysis, 637–43. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-5377-9_69.
Повний текст джерелаPardue, E. B. S., and R. H. McSwain. "X-Ray Diffraction Stress Analysis as an NDE Technique." In Review of Progress in Quantitative Nondestructive Evaluation, 1421–28. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4613-0979-6_65.
Повний текст джерелаTanyag, Rico Mayro P., Bruno Langbehn, Thomas Möller, and Daniela Rupp. "X-Ray and XUV Imaging of Helium Nanodroplets." In Topics in Applied Physics, 281–341. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-94896-2_7.
Повний текст джерелаSakaida, Yoshihisa, Keisuke Tanaka, and Shintaro Harada. "Measurement of Residual Stress Distribution of Ground Silicon Nitride by Glancing Incidence X-Ray Diffraction Technique." In Advances in X-Ray Analysis, 331–38. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-5377-9_37.
Повний текст джерелаShih, Kaimin. "Quantitative X-Ray Diffraction Technique for Waste Beneficial Use Opportunities." In Lecture Notes in Civil Engineering, 43–50. Singapore: Springer Singapore, 2019. http://dx.doi.org/10.1007/978-981-13-7010-6_3.
Повний текст джерелаKumar Maity, Swapan, and Ramkrishna Maiti. "Identification of the Sediment Sources Using X-Ray Diffraction (XRD) Technique." In SpringerBriefs in Earth Sciences, 57–78. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-71315-1_4.
Повний текст джерелаShin, Y. C., S. J. Oh, and C. O. Ruud. "Interrogation of Residual Stresses of Machined Surface by an X-ray Diffraction Technique." In Nondestructive Characterization of Materials IV, 409–18. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4899-0670-0_50.
Повний текст джерелаFitting, Dale W., William P. Dube’, and Thomas A. Siewert. "High Energy X-Ray Diffraction Technique for Monitoring Solidification of Single Crystal Castings." In Nondestructive Characterization of Materials VIII, 217–21. Boston, MA: Springer US, 1998. http://dx.doi.org/10.1007/978-1-4615-4847-8_34.
Повний текст джерелаYoo, Keun Bong, and Jae Hoon Kim. "Assessment of Fatigue Life for High-Temperature Pipeline Welds Using X-Ray Diffraction Technique." In Key Engineering Materials, 130–33. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-456-1.130.
Повний текст джерелаТези доповідей конференцій з теми "X-ray diffraction technique"
Clemens, B. M., A. P. Payne, T. C. Hufnagel, J. A. Bain, and S. Brennan. "In-Situ Grazing Incidence X-Ray Diffraction During Sputter Deposition." In Physics of X-Ray Multilayer Structures. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/pxrayms.1992.wa4.
Повний текст джерелаPriyanto, T. H., N. Suparno, Setiawan, M. R. Muslih, Abarrul Ikram, Agus Purwanto, Sutiarso, Anne Zulfia, Sunit Hendrana, and Zeily Nurachman. "Texture and Structure Analysis of AluminumA-1050 using Neutron Diffraction Technique." In NEUTRON AND X-RAY SCATTERING 2007: The International Conference. AIP, 2008. http://dx.doi.org/10.1063/1.2906101.
Повний текст джерелаMuslih, M. Refai, I. Sumirat, Sairun, Purwanta, Abarrul Ikram, Agus Purwanto, Sutiarso, Anne Zulfia, Sunit Hendrana, and Zeily Nurachman. "Internal Stress Distribution Measurement of TIG Welded SUS304 Samples Using Neutron Diffraction Technique." In NEUTRON AND X-RAY SCATTERING 2007: The International Conference. AIP, 2008. http://dx.doi.org/10.1063/1.2906103.
Повний текст джерелаJingzhu Hu, Ho-kwang Mao, Jinfu Shu, and Russell J. Hemley. "High-pressure energy dispersive X-ray diffraction technique with synchrotron radiation." In High-pressure science and technology—1993. AIP, 1994. http://dx.doi.org/10.1063/1.46138.
Повний текст джерелаFukuyama, Yoshimitsu, Nobuhiro Yasuda, Shigeru Kimura, Yoshihito Tanaka, Hitoshi Osawa, Jungeun Kim, Haruno Murayama, et al. "Pump-probe X-ray Diffraction Technique for Irreversible Phase Change Materials." In SRI 2009, 10TH INTERNATIONAL CONFERENCE ON RADIATION INSTRUMENTATION. AIP, 2010. http://dx.doi.org/10.1063/1.3463176.
Повний текст джерелаFowler, Alex J., and Mehmet Toner. "X-Ray Diffraction Studies of Laser Created Amorphous Ice." In ASME 1998 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 1998. http://dx.doi.org/10.1115/imece1998-0811.
Повний текст джерелаAbdali, S., F. E. Christensen, K. D. Joensen, K. Mogensen, L. Gerward, and J. Garnæs. "X-Ray, HRTEM and AFM Analysis of Thick and Thin Ni/C Multilayers." In Physics of X-Ray Multilayer Structures. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/pxrayms.1994.mc.7.
Повний текст джерелаFiala, Jaroslav, Vaclav Mentl, Vladislav Kolarik, and Michal Chocholousek. "Evaluation of Fatigue Damage by X-Ray Diffraction Technique of Steam Turbine Rotor Steels at Elevated Temperatures." In ASME 2009 Pressure Vessels and Piping Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/pvp2009-77386.
Повний текст джерелаDelijaicov, Sergio, Hugo Resende, Mario Henrique Batalha, and João Paulo Buoro Perandini. "Residual stresses in aluminum alloy AA7475-T761 using X-Ray diffraction technique." In 24th ABCM International Congress of Mechanical Engineering. ABCM, 2017. http://dx.doi.org/10.26678/abcm.cobem2017.cob17-0683.
Повний текст джерелаWang, Yang, and Dayong Lu. "STUDY ON ORAL ULCER POWDER USING TEMPERATURE-DEPENDENT X-RAY DIFFRACTION TECHNIQUE." In International Conference on New Materials and Intelligent Manufacturing (ICNMIM). Volkson Press, 2018. http://dx.doi.org/10.26480/icnmim.01.2018.104.106.
Повний текст джерелаЗвіти організацій з теми "X-ray diffraction technique"
Holden, T., J. Root, and R. Hosbons. CWI1988-Andi-12 Neutron Diffraction of Axial Residual Strains in the Vicinity of a Girth Weld. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), April 1988. http://dx.doi.org/10.55274/r0011390.
Повний текст джерелаKirz, Janos, and Chris Jacobsen. X-ray microimaging by diffractive techniques. Office of Scientific and Technical Information (OSTI), July 2001. http://dx.doi.org/10.2172/794176.
Повний текст джерелаSaw, C., T. Lian, S. Day, and J. Farmer. X-ray Diffraction Techniques for Structural Determination of Amorphous Materials. Office of Scientific and Technical Information (OSTI), October 2006. http://dx.doi.org/10.2172/900132.
Повний текст джерелаWilliams, Stefan Thurston DuBard. Materials Characterization Techniques Lecture Series: X-Ray Diffraction. Summary of LANL's Materials Capabilities in MPA-11. Office of Scientific and Technical Information (OSTI), June 2020. http://dx.doi.org/10.2172/1633561.
Повний текст джерела(X-ray microimaging by diffractive techniques). Office of Scientific and Technical Information (OSTI), January 1991. http://dx.doi.org/10.2172/5819424.
Повний текст джерелаX ray microimaging by diffractive techniques. Office of Scientific and Technical Information (OSTI), January 1990. http://dx.doi.org/10.2172/7005623.
Повний текст джерела[X-ray microimaging by diffractive techniques]. Progress report. Office of Scientific and Technical Information (OSTI), December 1991. http://dx.doi.org/10.2172/10114442.
Повний текст джерела