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Статті в журналах з теми "X-RAY DEVICE"
Butler, M., and MW Regan. "A Novel X-Ray Targeting Device." Annals of The Royal College of Surgeons of England 89, no. 2 (March 2007): 179. http://dx.doi.org/10.1308/rcsann.2007.89.2.179b.
Повний текст джерелаGambato, Marco, Nicola Scotti, Giacomo Borsari, Jacopo Zambon Bertoja, Joseph-Domenico Gabrieli, Alessandro De Cassai, Giacomo Cester, Paolo Navalesi, Emilio Quaia, and Francesco Causin. "Chest X-ray Interpretation: Detecting Devices and Device-Related Complications." Diagnostics 13, no. 4 (February 6, 2023): 599. http://dx.doi.org/10.3390/diagnostics13040599.
Повний текст джерелаKalaiselvi, S. M. P., T. L. Tan, A. Talebitaher, P. Lee, and R. S. Rawat. "Optimization of neon soft X-ray emission from 200 J plasma focus device for application in soft X-ray lithography." International Journal of Modern Physics: Conference Series 32 (January 2014): 1460323. http://dx.doi.org/10.1142/s2010194514603238.
Повний текст джерелаSharma, Anju, Preeth Sivakumar, Andrew Feigel, In Tae Bae, Lawrence P. Lehman, Joseph Gregor, James Cash, and Joseph Kolly. "Effects of x-ray exposure on NOR and NAND flash memories during high-resolution 2D and 3D x-ray inspection." International Symposium on Microelectronics 2016, no. 1 (October 1, 2016): 000660–65. http://dx.doi.org/10.4071/isom-2016-thp53.
Повний текст джерелаGrunthaner, F. J. "Fundamentals of X-Ray Photoemission Spectroscopy." MRS Bulletin 12, no. 6 (September 1987): 60–64. http://dx.doi.org/10.1557/s0883769400067245.
Повний текст джерелаMurphy, Michael C., and Michael R. Wilds. "X-Rated X-Ray Invades Privacy Rights." Criminal Justice Policy Review 12, no. 4 (December 2001): 333–43. http://dx.doi.org/10.1177/0887403401012004005.
Повний текст джерелаKärtner, Franz X. "Terahertz accelerator based electron and x-ray sources." Terahertz Science and Technology 13, no. 1 (March 2020): 22–31. http://dx.doi.org/10.1051/tst/2020131022.
Повний текст джерелаZhang, Ran, Xiaobing Zou, Xinlei Zhu, Shen Zhao, Haiyun Luo, and Xinxin Wang. "X-Ray Emission From a Tabletop $X$-Pinch Device." IEEE Transactions on Plasma Science 40, no. 12 (December 2012): 3354–59. http://dx.doi.org/10.1109/tps.2012.2207919.
Повний текст джерелаTeng Yuepeng, 滕玥鹏, 孙天希 Sun Tianxi, 刘志国 Liu Zhiguo, 罗萍 Luo Ping, 潘秋丽 Pan Qiuli, and 丁训良 Ding Xunliang. "New Type Monocapillary X-Ray Optical Device." Acta Optica Sinica 30, no. 2 (2010): 542–45. http://dx.doi.org/10.3788/aos20103002.0542.
Повний текст джерелаLiu Duo, 刘舵, 强鹏飞 Qiang Pengfei, 李林森 Li Linsen, 刘哲 Liu Zhe, 盛立志 Sheng Lizhi, 刘永安 Liu Yong′an, and 赵宝升 Zhao Baosheng. "Multilayer Nested X-Ray Focusing Optical Device." Acta Optica Sinica 36, no. 8 (2016): 0834002. http://dx.doi.org/10.3788/aos201636.0834002.
Повний текст джерелаДисертації з теми "X-RAY DEVICE"
Hill, Joanne E. "The charge coupled device as an X-Ray polarimeter." Thesis, University of Leicester, 1999. http://hdl.handle.net/2381/30620.
Повний текст джерелаBray, Terry Lee. "A novel device for growing protein crystals : computer control and automation." Thesis, Georgia Institute of Technology, 1990. http://hdl.handle.net/1853/30428.
Повний текст джерелаCarter, David John Donat 1966. "Sub-50nm x-ray lithography with application to a coupled quantum dot device." Thesis, Massachusetts Institute of Technology, 1998. http://hdl.handle.net/1721.1/50037.
Повний текст джерелаIncludes bibliographical references (p. 214-231).
by David John Donat Carter.
Ph.D.
Poust, Benjamin David. "X-ray scatter based metrologies for the development of metamorphic semiconductor device structures." Diss., Restricted to subscribing institutions, 2007. http://proquest.umi.com/pqdweb?did=1320974691&sid=1&Fmt=2&clientId=1564&RQT=309&VName=PQD.
Повний текст джерелаMahadik, Nadeemullah A. "Non-destructive x-ray characterization of wide-bandgap semiconductor materials and device structures." Fairfax, VA : George Mason University, 2008. http://hdl.handle.net/1920/3404.
Повний текст джерелаVita: p. 104. Thesis director: Mulpuri V. Rao. Submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering. Title from PDF t.p. (viewed Mar. 17, 2009). Includes bibliographical references (p. 99-103). Also issued in print.
Swaminathan, S. "Characterisation of III-V quaternary multilayer semiconductor device materials by X-ray diffraction." Thesis, University of Warwick, 1985. http://wrap.warwick.ac.uk/110577/.
Повний текст джерелаOzkan, Cigdem. "The Controlled Drift Detector As An X-ray Imaging Device For Diffraction Enhanced Imaging." Master's thesis, METU, 2009. http://etd.lib.metu.edu.tr/upload/2/12610414/index.pdf.
Повний текст джерелаPym, Alexander Thomas Gafswood. "Grazing incidence X-Ray scattering from the interfaces of thin film magnetic device materials." Thesis, Durham University, 2008. http://etheses.dur.ac.uk/2317/.
Повний текст джерелаKang, Jun. "Thin film CdTe as high energy x-ray detector material for medical applications." Connect to full text in OhioLINK ETD Center, 2008. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1228060515.
Повний текст джерелаGow, Jason Peter David. "Radiation damage analysis of the swept charge device for the C1XS instrument." Thesis, Brunel University, 2010. http://bura.brunel.ac.uk/handle/2438/4311.
Повний текст джерелаКниги з теми "X-RAY DEVICE"
S, Swaminathan. Characterisation of III-V quaternary multilayer semiconductor device materials by x-ray diffraction. [s.l.]: typescript, 1985.
Знайти повний текст джерелаMcGovern, Mark Edward. Monolayer chemistry - interaction of OTS with quartz/glass surfaces in various solvents probed by x-ray photoelectron spectroscopy and surface acoustic wave device. Ottawa: National Library of Canada, 1993.
Знайти повний текст джерелаM, Ceglio Natale, Dhez Pierre, Society of Photo-optical Instrumentation Engineers., and University of Alabama in Huntsville. Center for Applied Optics., eds. Multilayer structures and laboratory X-ray laser research: 19-20 August 1986, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Знайти повний текст джерелаStarr, Richard. Annual report for Catholic University co-operative agreement NCC-5-83, 1 April 1997 through 31 March 1998. [Washington, DC: National Aeronautics and Space Administration, 1998.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Знайти повний текст джерелаF, Marshall Gerald, and Society of Photo-optical Instrumentation Engineers., eds. Applications of thin-film multilayered structures to figured X-ray optics: August 20-22, 1985, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.
Знайти повний текст джерелаFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Знайти повний текст джерелаFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Знайти повний текст джерелаCenter, Goddard Space Flight, ed. Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1997.
Знайти повний текст джерелаЧастини книг з теми "X-RAY DEVICE"
Aoki, Toru, Katsuyuki Takagi, Hiroki Kase, and Akifumi Koike. "X-Ray Semiconductor Imaging Device Technology and Medical-Imaging Application." In Biomedical Engineering, 279–96. New York: Jenny Stanford Publishing, 2021. http://dx.doi.org/10.1201/9781003141945-14.
Повний текст джерелаFiedorova, Klara, Martin Augustynek, Jan Kubicek, Marek Penhaker, Andrea Vodakova, and Karol Korhelik. "Modeling and Objectification of Skiagraphy Image Quality Deterioration Caused by X-Ray Secondary Irradiation on Mobile X-Ray Device." In IFMBE Proceedings, 1599–608. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-31635-8_197.
Повний текст джерелаLee, S. G., J. G. Bak, and M. Bitter. "A Vacuum X-Ray Crystal Spectrometer for the Hanbit Magnetic Mirror Device." In Advanced Diagnostics for Magnetic and Inertial Fusion, 241–44. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/978-1-4419-8696-2_43.
Повний текст джерелаSiddiqui, Rafay Mehmood, Inam Ul Ahad, Samreen Amir, Bassim Aklan, and Tahir Uddin. "X-Ray IO Monitor Device for Primary Intensity Measurement in Computed Tomography (CT) Scanner." In IFMBE Proceedings, 33–36. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-32183-2_9.
Повний текст джерелаKim, Young-Pyo, Tae-Gon Kim, Yong-Pil Park, Min-Woo Cheon, and Yang-Sun Lee. "The Study on the Mobile Diagnostic X-ray Device of Frequency Modulation Method by PI Controlled." In Lecture Notes in Electrical Engineering, 249–58. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-94-007-4516-2_25.
Повний текст джерелаSiddiqui, Rafay Mehmood, Inam Ul Ahad, Syedah Sadaf Zehra, and Anurag. "Characterization of X-Ray Sensors and Io Monitor Device Testing for Primary and Secondary Intensities Measurement." In IFMBE Proceedings, 37–40. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-32183-2_10.
Повний текст джерелаDudley, M., X. Huang, and W. M. Vetter. "Synchrotron White Beam X-Ray Topography and High Resolution X-RayDiffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures." In Silicon Carbide, 629–48. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-642-18870-1_26.
Повний текст джерелаArney, David, Julian M. Goldman, Susan F. Whitehead, and Insup Lee. "Improving Patient Safety with X-Ray and Anesthesia Machine Ventilator Synchronization: A Medical Device Interoperability Case Study." In Biomedical Engineering Systems and Technologies, 96–109. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-11721-3_7.
Повний текст джерелаHayashi, Makoto, and Shinobu Okido. "Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device." In Materials Science Forum, 19–27. Stafa: Trans Tech Publications Ltd., 2005. http://dx.doi.org/10.4028/0-87849-969-5.19.
Повний текст джерелаKasap, Safa, and Zahangir Kabir. "X-Ray Detectors." In Springer Handbook of Semiconductor Devices, 747–76. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-79827-7_20.
Повний текст джерелаТези доповідей конференцій з теми "X-RAY DEVICE"
Lo, William, Puneet Gupta, Rakshith Venkatesh, Rudolf Schlangen, Howard Marks, Bruce Cory, Frances Su, Benjamin Stripe, Sylvia Lewis, and Wenbing Yun. "X-Ray Device Alteration Using a Scanning X-Ray Microscope." In ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022p0153.
Повний текст джерелаWhalen, Mallory, Ralf K. Heilmann, and Mark L. Schattenburg. "Device for measuring stress stability in reflective coatings for thin-shell x-ray mirrors." In Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, edited by Giovanni Pareschi, Stephen L. O'Dell, and Jessica A. Gaskin. SPIE, 2021. http://dx.doi.org/10.1117/12.2594627.
Повний текст джерелаScherer, Brian, Sudeep Mandal, Joshua Salisbury, Peter Edic, Forrest Hopkins, and Susanne M. Lee. "Towards brilliant, compact x-ray sources: a new x-ray photonic device." In SPIE Defense + Security, edited by Amit Ashok, Edward D. Franco, Michael E. Gehm, and Mark A. Neifeld. SPIE, 2017. http://dx.doi.org/10.1117/12.2266793.
Повний текст джерелаAoki, Toru, Katsuyuki Takagi, Akifumi Koike, and Keitaro Hitomi. "TlBr photon-counting imaging device (Conference Presentation)." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI, edited by Arnold Burger, Ralph B. James, and Stephen A. Payne. SPIE, 2019. http://dx.doi.org/10.1117/12.2529746.
Повний текст джерелаVon Jackowski, Jeannette, Georg Schulz, Tino Töpper, Bekim Osmani, and Bert Müller. "Three-dimensional characterization of soft silicone elements for intraoral device." In Developments in X-Ray Tomography XII, edited by Bert Müller and Ge Wang. SPIE, 2019. http://dx.doi.org/10.1117/12.2529340.
Повний текст джерелаSchoonenberg, Gert A. F., Peter W. van den Houten, Raoul Florent, Pierre Lelong, John D. Carroll, and Bart M. ter Haar Romeny. "Device enhancement using rotational x-ray angiography." In SPIE Medical Imaging, edited by Josien P. W. Pluim and Benoit M. Dawant. SPIE, 2009. http://dx.doi.org/10.1117/12.812094.
Повний текст джерелаAoki, Toru, Akifumi Koike, Takaharu Okunoyama, Hisashi Morii, Katsuyuki Takagi, and Junichi Nishizawa. "CdTe imaging device driven by current integration mode (Conference Presentation)." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, edited by Michael Fiederle, Arnold Burger, Larry Franks, and Ralph B. James. SPIE, 2016. http://dx.doi.org/10.1117/12.2240381.
Повний текст джерелаTakeda, Eiji. "A Migration Path to Nano-Meter Lithography: From the viewpoint of VLSIs." In Soft X-Ray Projection Lithography. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/sxray.1993.tua.1.
Повний текст джерелаZhang, Ran, Xiaobing Zou, Xinlei Zhu, Shen Zhao, Haiyun Luo, and Xinxin Wang. "X-ray emission from a table-top X-pinch device." In 2012 IEEE International Power Modulator and High Voltage Conference (IPMHVC). IEEE, 2012. http://dx.doi.org/10.1109/ipmhvc.2012.6518700.
Повний текст джерелаMcNulty, Ian. "Low-noise charge-coupled device camera for soft-x-ray imaging." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.mmm4.
Повний текст джерелаЗвіти організацій з теми "X-RAY DEVICE"
Waymel, Robert, Enrico Quintana, Phillip Reu, Kyle Thompson, Andrew Lentfer, Gabriella Dalton, and Thomas Martinez. X-ray image acquisition of a device undergoing pyroshock. Office of Scientific and Technical Information (OSTI), September 2021. http://dx.doi.org/10.2172/1821320.
Повний текст джерелаJohnson, Tony. An Energy Tunable X-ray Delay Device – Phase I CRADA No.: SLAC-261. Office of Scientific and Technical Information (OSTI), May 2019. http://dx.doi.org/10.2172/1542937.
Повний текст джерелаFry, David A. High Energy X-Ray System Specification for the Device Assembly Facility (DAF) at the NNSS. Office of Scientific and Technical Information (OSTI), August 2012. http://dx.doi.org/10.2172/1048834.
Повний текст джерелаBitter, M., D. Gates, D. Monticello, H. Neilson, A. Reiman, A. Roquemore, S. Morita, M. Goto, H. Yamada, and J. Rice. Objectives and Layout of a High-Resolution X-ray Imaging Crystal Spectrometer for the Large Helical Device (LHD). Office of Scientific and Technical Information (OSTI), July 2010. http://dx.doi.org/10.2172/984471.
Повний текст джерелаBitter, M., D. Gates, H. Neilson, A. Reiman, A. Roquemore, S. Morita, M. Goto, H. Yamada, and J. Rice. Design Parameters and Objectives of a High-�Resolution X-�ray Imaging Crystal Spectrometer for the Large Helical Device (LHD). Office of Scientific and Technical Information (OSTI), May 2010. http://dx.doi.org/10.2172/981706.
Повний текст джерелаPablant, N. A., L. Delgado-Apricio, M. Goto, K. W. Hill, S. Lzerson, S. Morita, A. L. Roquemore, et al. Layout And Results From The Initial Operation Of The High-resolution X-ray Imaging Crystal Spectrometer On The Large Helical Device. Office of Scientific and Technical Information (OSTI), April 2012. http://dx.doi.org/10.2172/1063122.
Повний текст джерелаMary, Brian J., and Charles H. Robinson. Technical Evaluation and Testing of Ruggedization of the CT Scanner. Development of a Sighting Device for the Hand-Held Dental X-Ray. Fort Belvoir, VA: Defense Technical Information Center, September 1992. http://dx.doi.org/10.21236/ada260147.
Повний текст джерелаBaral, Aniruddha, Jeffery Roesler, and Junryu Fu. Early-age Properties of High-volume Fly Ash Concrete Mixes for Pavement: Volume 2. Illinois Center for Transportation, September 2021. http://dx.doi.org/10.36501/0197-9191/21-031.
Повний текст джерелаCorriveau, Elizabeth, Ashley Mossell, Holly VerMeulen, Samuel Beal, and Jay Clausen. The effectiveness of laser-induced breakdown spectroscopy (LIBS) as a quantitative tool for environmental characterization. Engineer Research and Development Center (U.S.), April 2021. http://dx.doi.org/10.21079/11681/40263.
Повний текст джерелаBengtsson, Johan. NSLS X-Ray Ring: Impact of Insertion Devices. Office of Scientific and Technical Information (OSTI), September 2007. http://dx.doi.org/10.2172/1525426.
Повний текст джерела