Добірка наукової літератури з теми "TEM ANALYSIS"

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся зі списками актуальних статей, книг, дисертацій, тез та інших наукових джерел на тему "TEM ANALYSIS".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Статті в журналах з теми "TEM ANALYSIS"

1

Du, Z. W., A. S. Liu, B. L. Shao, Z. Y. Zhang, X. S. Zhang, and Z. M. Sun. "TEM analysis of Gd5Si1.85Ge2.15 alloy." Materials Characterization 59, no. 9 (September 2008): 1241–44. http://dx.doi.org/10.1016/j.matchar.2007.10.005.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Rajan, Krishna, and Peter Sewell. "Surface Analysis in the TEM." JOM 38, no. 10 (October 1986): 34–35. http://dx.doi.org/10.1007/bf03258578.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Mizunaga, Hideki, and Toshiaki Tanaka. "Development of Temtool for TEM analysis." BUTSURI-TANSA(Geophysical Exploration) 67, no. 2 (2014): 135–42. http://dx.doi.org/10.3124/segj.67.135.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Okamoto, Tatsuki, Masaki Kanegami, and Naohiro Hozumi. "TEM Analysis of Polyethylene with EELS." IEEJ Transactions on Fundamentals and Materials 118, no. 7-8 (1998): 767–72. http://dx.doi.org/10.1541/ieejfms1990.118.7-8_767.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

HIROSE, Yukinori, and Koji FUKUMOTO. "Evaluation and Analysis Technique Using TEM." Journal of the Surface Finishing Society of Japan 54, no. 1 (2003): 21–25. http://dx.doi.org/10.4139/sfj.54.21.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Stöger-Pollach, M., A. Steiger-Thirsfeld, and S. Schwarz. "Low voltage TEM for semiconductor analysis." Journal of Physics: Conference Series 326 (November 9, 2011): 012027. http://dx.doi.org/10.1088/1742-6596/326/1/012027.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Rowlands, Neil, and Simon Burgess. "Energy dispersive analysis in the TEM." Materials Today 12 (2010): 46–48. http://dx.doi.org/10.1016/s1369-7021(10)70145-0.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Dahmen, U., N. Thangaraj, and R. Kilaas. "Quantitative TEM analysis of microstructural anisotropy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 682–83. http://dx.doi.org/10.1017/s0424820100171146.

Повний текст джерела
Анотація:
Preferred orientation of grain boundaries or interfaces in solids is an important indicator of anisotropy in boundary energy or kinetics. The present study is part of an ongoing investigation of faceting in thin films with the mazed bicrystal microstructure which possesses several unique features that are difficult to measure with standard parameters such as grain size distribution. One of the important characteristics of this microstructure is the degree and type of anisotropy. Figure 1 shows a micrograph with a typical mazed bicrystal microstructure. Only two grain orientations with about equal volume fraction are seen in black and white contrast, respectively. It is apparent that unlike a normal polycrystalline thin film, individual grains in this microstructure have unusual convoluted shapes with both concave and convex regions.The standard stereological method to measure microstructural anisotropy is the rose plot generated from a count of intersections with a reference grid overlaid on the micrograph at different angles.
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Bauer, Natalie, Jyoti Rai, Hairu Chen, Lillianne Harris, Lalita Shevde, Tim Moore, and Judy King. "Microparticles/Exosomes: Isolation and TEM Analysis." Microscopy Today 17, no. 2 (March 2009): 42–45. http://dx.doi.org/10.1017/s1551929500054493.

Повний текст джерела
Анотація:
Microparticles and exosomes are small vesicular fragments of cell membrane which are released from activated and apoptotic cells. Microparticles (MPs) range in size from 0.5-1.5 μm, and exosomes are 0.5 μm and under. For the purposes of this article we will refer to both categories as microparticles. They differ from apoptotic bodies based on their smaller size, intact structure, and lack of degraded nuclear material. MPs have been shown to be released from a variety of cell types including platelets, endothelium, vascular smooth muscle cells, dendritic cells, and tumor cells. Jimenez and others have shown that based on the stimulus and cell type the MPs released are both quantitatively and phenotypically distinct. More recent data have shown the proteomics of MPs released from human umbilical vein endothelial cells differ dependent on whether they are stimulated with PAI or TNF-α.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Neumann, Wolfgang, Holm Kirmse, Ines Häusler, Reinhard Otto, and Irmela Hähnert. "Quantitative TEM analysis of quantum structures." Journal of Alloys and Compounds 382, no. 1-2 (November 2004): 2–9. http://dx.doi.org/10.1016/j.jallcom.2004.05.066.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Дисертації з теми "TEM ANALYSIS"

1

Foo, Seng-Lee. "Analysis of electromagnetic fields in loaded TEM cells." Thesis, University of Ottawa (Canada), 1988. http://hdl.handle.net/10393/5170.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Kylberg, Gustaf. "Automatic Virus Identification using TEM : Image Segmentation and Texture Analysis." Doctoral thesis, Uppsala universitet, Avdelningen för visuell information och interaktion, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-217328.

Повний текст джерела
Анотація:
Viruses and their morphology have been detected and studied with electron microscopy (EM) since the end of the 1930s. The technique has been vital for the discovery of new viruses and in establishing the virus taxonomy. Today, electron microscopy is an important technique in clinical diagnostics. It both serves as a routine diagnostic technique as well as an essential tool for detecting infectious agents in new and unusual disease outbreaks. The technique does not depend on virus specific targets and can therefore detect any virus present in the sample. New or reemerging viruses can be detected in EM images while being unrecognizable by molecular methods. One problem with diagnostic EM is its high dependency on experts performing the analysis. Another problematic circumstance is that the EM facilities capable of handling the most dangerous pathogens are few, and decreasing in number. This thesis addresses these shortcomings with diagnostic EM by proposing image analysis methods mimicking the actions of an expert operating the microscope. The methods cover strategies for automatic image acquisition, segmentation of possible virus particles, as well as methods for extracting characteristic properties from the particles enabling virus identification. One discriminative property of viruses is their surface morphology or texture in the EM images. Describing texture in digital images is an important part of this thesis. Viruses show up in an arbitrary orientation in the TEM images, making rotation invariant texture description important. Rotation invariance and noise robustness are evaluated for several texture descriptors in the thesis. Three new texture datasets are introduced to facilitate these evaluations. Invariant features and generalization performance in texture recognition are also addressed in a more general context. The work presented in this thesis has been part of the project Panvirshield, aiming for an automatic diagnostic system for viral pathogens using EM. The work is also part of the miniTEM project where a new desktop low-voltage electron microscope is developed with the aspiration to become an easy to use system reaching high levels of automation for clinical tissue sections, viruses and other nano-sized particles.
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Hajduček, Jan. "Zobrazování metamagnetických tenkých vrstev pomocí TEM." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443233.

Повний текст джерела
Анотація:
Komplexní magnetické materiály v nanoměřítku mají své nezastupitelné místo v moderních zařízeních, jako jsou digitální paměti nebo senzory. Moderní technologické procesy vyžadují porozumění a možnost kontroly moderních magnetických materiálů až na atomární úrovni. Jednou z možných cest je magnetická analýza za použití transmisní elektronové mikroskopie (TEM), která je unikátní díky možnosti zobrazování až v subatomárním měřítku. Tato práce popisuje možnosti zobrazování metamagnetických materiálů metodou TEM. Tyto materiály se vyznačují možností stabilizace více magnetických uspořádání najednou za daných vnějších podmínek. Modelovým systémem pro popis zobrazovacích možností metody TEM byly zvoleny tenké vrstvy metamagnetické slitiny FeRh. Tento materiál prochází při zahřívání fázovou přeměnou z antiferomagnetické do feromagnetické fáze. Podrobně jsou rozebrány procesy výroby vzorků, což je zásadní pro úspěšnou TEM analýzu. Pro magnetické zobrazování vzorků v TEMu je využita technika diferenciálního fázového kontrastu (DPC), umožňující přímé mapování rozložení magnetické indukce ve vzorku. Důsledně je diskutován vznik signálu v DPC, což je nezbytné pro porozumění a analýzu výsledných dat. FeRh vrstvy jsou podrobeny analýze struktury, chemického složení a především magnetických vlastností obou magnetických fází. Závěrem je představen proces přímého ohřevu metamagnetických vrstev v TEMu.
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Nord, Magnus Kristofer. "Quantitative (S)TEM analysis of intermediate band solar cell materials." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for fysikk, 2011. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13655.

Повний текст джерела
Анотація:
In this thesis the strain properties of two InAs/GaAs quantum dot intermediate band solar cell materials have been explored. Both samples were thin films grown on a (100) GaAs substrate. The quantum dot material was InAs, and the bulk material was GaAs. One sample had AlAs-cap, while the other had GaAs-cap. Geometrical phase analysis was used to study the strain. A higher degree of strain was found in the AlAs-capped sample. Negative strain was observed in directly above and below the quantum dots in both samples. A stacking fault in a quantum dot in the AlAs-capped sample was found to relax all the strain. Analysis of the chemical composition of the AlAs-capped sample was performed using HAADF-STEM and multislice analysis. This analysis found an average indium concentration inside the quantum dots of 25% +- 10%, with peaks up to 50%.
Стилі APA, Harvard, Vancouver, ISO та ін.
5

ElFallagh, Fathi Ali. "3D Analysis of Indentation Damage by FIB tomography and TEM." Thesis, University of Sheffield, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500111.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

McLaughlin, Kirsten Kathleen. "TEM diffraction analysis of the deformation underneath low load indentations." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.613392.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Sears, Jasmine, Ricky Gibson, Michael Gehl, Sander Zandbergen, Patrick Keiffer, Nima Nader, Joshua Hendrickson, Alexandre Arnoult, and Galina Khitrova. "TEM EDS analysis of epitaxially-grown self-assembled indium islands." AMER INST PHYSICS, 2017. http://hdl.handle.net/10150/624718.

Повний текст джерела
Анотація:
Epitaxially-grown self-assembled indium nanostructures, or islands, show promise as nanoantennas. The elemental composition and internal structure of indium islands grown on gallium arsenide are explored using Transmission Electron Microscopy (TEM) Energy Dispersive Spectroscopy (EDS). Several sizes of islands are examined, with larger islands exhibiting high (>94%) average indium purity and smaller islands containing inhomogeneous gallium and arsenic contamination. These results enable more accurate predictions of indium nanoantenna behavior as a function of growth parameters. (C) 2017 Author(s).
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Issa, Inas. "In situ TEM nanocompression and mechanical analysis of ceramic nanoparticles." Thesis, Lyon, 2016. http://www.theses.fr/2016LYSEI008/document.

Повний текст джерела
Анотація:
Dans cette étude, nous proposons d’utiliser la compression in situ dans le MET afin de caractériser les propriétés mécaniques de nanoparticules céramiques dont la taille caractéristique est de l’ordre de quelques dizaines de nanomètres. Nous appliquerons cette méthode à des nanocubes monocristallins de MgO, une céramique modèle dont la plasticité est bien connue dans le matériau massif. Les essais de nanocompression montrent que les nanocubes de MgO se déforment de façon homogène jusqu’à de grandes déformations (>50%) sans fissure apparente. L’analyse des résultats est assistée par des méthodes de corrélation d’images numériques et simulations de type dynamique moléculaire. Le mécanisme de déformation et l'effet de taille sur la limite élastique sont identifiés. Dans une deuxième partie de la thèse, nous présentons une étude sur des nanoparticules d’alumine de transition compactée en CED (Cellule à Enclumes en Diamant) à température ambiante, sous plusieurs pressions (5 GPa, 15 GPa et 20 GPa). Des lames minces préparées par FIB ont été étudiées en MET. Des images HRTEM montrent une texture cristallographique qui devient plus importante à des pressions plus élevées. Une orientation cristallographique préférentielle est observée, avec les plans {220} de la phase gamma de l’alumine la plupart du temps parallèles à la surface de contact avec une particule voisine. Ce comportement mécanique est cohérent avec un système de glissement, connu pour les structures spinelles. Une corrélation de ce comportement avec les tests in situ MET réalisés sur des nanoparticules similaires, par Emilie Calvié lors de sa thèse, est présentée. Enfin, des clichés de diffraction de type Debye Scherrer sont réalisés sur ces lames minces de nanoparticules d’alumine de transition compactées en CED à différentes pressions. L’analyse quantitative de ces clichés montre une transformation de phase de ces nanoparticules d’alumine de phase gamma en phase delta, de manière croissante avec la pression
In this study, we propose an innovative mechanical observation protocol of ceramics nanoparticles in the 100nm size range. This Protocol consists of in situ TEM nanocompression tests of isolated nanoparticles. Load–real displacements curves, obtained by Digital Image Correlation, are analyzed and these analyses are correlated with Molecular Dynamics simulations. By this protocol a constitutive law with its mechanical parameters (Young modulus, Yield stress...) of the studied material at the nano-scale can be obtained. In situ TEM nano-compression tests on magnesium oxide nanocubes are performed. Magnesium oxide is a model material and its plasticity is very well known at bulk. The MgO nanocubes show large plastic deformation, more than 50% of plastic strain without any fracture. The TEM results are correlated to MD simulations and the deformation mechanism can be identified.The size effect and the electron beam effect on the yield strength are investigated. In a second part of the dissertation, we present a study on transition alumina nanoparticles compacted in a Diamond Anvil Cell at different uniaxial pressures. Thin Foils of these compacted nanoparticles are prepared by FIB for HRTEM Observations. Their analysis reveals the plastic deformation of the nanoparticles. The crystallographic texture observed inthese compacted nanoparticles in DAC shows a preferred orientation of the {110} lattice planes, orientated perpendicular to the compression direction. This is compatible with the slip system. This argument was reinforced with a preferred orientation of slip bands observed during in situ TEM nano-compression tests. Moreover, electron diffraction patterns (Debye Scherrer) analysis on these compacted transition alumina nanoparticles reveals the decrease of the presence of gamma-alumina and the increase of delta-alumina with increasing pressure. This reveals the phase transformation with increasing pressure from gamma to delta* alumina
Стилі APA, Harvard, Vancouver, ISO та ін.
9

King, Jason Peters King. "An investigation of spin-valves and related films by TEM." Thesis, University of Glasgow, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301949.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Woonbumroong, Apinya. "Fresnel contrast analysis and analytical TEM study of grain boundaries in electroceramics." Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624490.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Книги з теми "TEM ANALYSIS"

1

Henning, K. H. Electron micrographs (TEM, SEM) of clays and clay minerals. Berlin: Akademie-Verlag, 1986.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Haron, Sharifah Zabidah. Aspects of tea analysis. Salford: University of Salford, 1991.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Clemente, Filipe Manuel, Fernando Manuel Lourenço Martins, and Rui Sousa Mendes. Social Network Analysis Applied to Team Sports Analysis. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-25855-3.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Passos, Pedro. Performance Analysis in Team Sports. Abingdon, Oxon ; New York, NY : Routledge is an imprint of the: Routledge, 2016. http://dx.doi.org/10.4324/9781315739687.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

1973-, Coliva Annalisa, ed. Filosofia analitica: Temi e problemi. Roma: Carocci, 2007.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Chen, Yen-Sen. Lox manifold tee analysis: Final report. Huntsville, Ala: SECA, Inc., 1990.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Commerce, Ceylon Chamber of. Tea sector statistical analysis, 2012-2013. Colombo: The Ceylon Chamber of Commerce, 2014.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Guzʹ, Aleksandr Nikolaevich. Trekhmernai͡a︡ teorii͡a︡ ustoĭchivosti deformiruemykh tel. Kiev: Nauk. dumka, 1985.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

United States. National Aeronautics and Space Administration., ed. Transient Ejector Analysis (TEA) code user's guide. [Washington, DC: National Aeronautics and Space Administration, 1993.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Geological Survey (U.S.), ed. Geologic hazards team. [Reston, Va.?]: U.S. Dept. of the Interior, U.S. Geological Survey, 1997.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Частини книг з теми "TEM ANALYSIS"

1

McHendry, P., AJ Craven, and LJ Murphy. "TEM studies of organic pigments." In Electron Microscopy and Analysis 1997, 665–68. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-172.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Rambousky, R., and H. Garbe. "Analysis of Open TEM-Waveguide Structures." In Ultra-Wideband, Short-Pulse Electromagnetics 10, 49–58. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-9500-0_4.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Li, Xiu, Guoqiang Xue, and Changchun Yin. "Velocity Analysis of TEM Pseudo Wave Field." In Migration Imaging of the Transient Electromagnetic Method, 105–23. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-2708-6_6.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Kirkland, A. I., W. O. Saxton, and R. Meyer. "Super resolved microscopy and aberration determination in the TEM." In Electron Microscopy and Analysis 1997, 105–8. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-26.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Voelkl, E., L. F. Allard, J. Bruley, V. J. Keast, and D. B. Williams. "The teaching of TEM by telepresence microscopy over the internet." In Electron Microscopy and Analysis 1997, 45–48. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-10.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Kondo, Y., H. Ohnishi, Q. Ru, H. Kimata, and K. Takayanagi. "Newly developed UHV-FE-HR-TEM for particle surface studies." In Electron Microscopy and Analysis 1997, 241–44. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-62.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Blank, V. D., B. A. Kulnitskiy, Ye V. Tatyanin, and O. M. Zhigalina. "TEM study of the crystalline and amorphous phases in C60." In Electron Microscopy and Analysis 1997, 593–96. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-154.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Kylberg, Gustaf, Ida-Maria Sintorn, and Gunilla Borgefors. "Towards Automated TEM for Virus Diagnostics: Segmentation of Grid Squares and Detection of Regions of Interest." In Image Analysis, 169–78. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-02230-2_18.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Gupta, Anindya, Amit Suveer, Joakim Lindblad, Anca Dragomir, Ida-Maria Sintorn, and Nataša Sladoje. "Convolutional Neural Networks for False Positive Reduction of Automatically Detected Cilia in Low Magnification TEM Images." In Image Analysis, 407–18. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-59126-1_34.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

MacLaren, I., and C. B. Ponton. "TEM investigation of hydrothermally synthesised Ba(Mg1/3Ta2/3)O3, powders." In Electron Microscopy and Analysis 1997, 531–34. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-137.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Тези доповідей конференцій з теми "TEM ANALYSIS"

1

Chong, H. B., Brandon Van Leer, V. Narang, and M. Y. Ho. "Sideways FIB TEM sample preparation for improved construction analysis in TEM." In 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306257.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Chen, S. Y., W. Yang, G. F. Xu, and C. T. Liu. "TEM EELS analysis for DRAM failure analysis." In 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2021. http://dx.doi.org/10.1109/ipfa53173.2021.9617371.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Ianconescu, Reuven, and Vladimir Vulfin. "TEM transmission line radiation losses analysis." In 2016 46th European Microwave Conference (EuMC). IEEE, 2016. http://dx.doi.org/10.1109/eumc.2016.7824381.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Xiaoding Cai. "Analysis of longitudinal characteristics TEM cells." In International Symposium on Electromagnetic Compatibility. IEEE, 1989. http://dx.doi.org/10.1109/isemc.1989.240866.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Esa, S. R., R. Yahya, A. Hassan, and G. Omar. "Copper oxidation study by TEM." In 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012). IEEE, 2012. http://dx.doi.org/10.1109/ipfa.2012.6306315.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Lin, Ching-Chun, Jay Wang, and Kim Hsu. "TEM applications for III-V material analysis." In 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2017. http://dx.doi.org/10.1109/ipfa.2017.8060204.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Du, A. Y., J. Zhu, Y. K. Zhou, B. H. Liu, Eddie Er, Z. Q. Mo, S. P. Zhao, and Jeffrey Lam. "Advanced TEM applications in semiconductor devices." In 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2014. http://dx.doi.org/10.1109/ipfa.2014.6898193.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Zhu, Xiangqin, Weiqing Chen, Zaigao Chen, and Jianguo Wang. "Analysis of TEM Horn with Dielectric Loaded." In 2018 IEEE International Conference on Computational Electromagnetics (ICCEM). IEEE, 2018. http://dx.doi.org/10.1109/compem.2018.8496637.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Lee, Tan-Chen, Jui-Yen Huang, Li-Chien Chen, Ruey-Lian Hwang, and David Su. "Methodology for TEM Analysis of Barrier Profiles." In ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0689.

Повний текст джерела
Анотація:
Abstract Device shrinkage has resulted in thinner barriers and smaller vias. Transmission Electron Microscopy (TEM) has become a common technique for barrier profile analysis because of its high image resolution. TEM sample preparation and image interpretation becomes difficult when the size of the small cylindrical via is close to the TEM sample thickness. Effects of different sample thickness and specimen preparation methods, therefore, have been investigated. An automatic FIB program has been shown to be useful in via sample preparation. Techniques for imaging a TEM specimen will be discussed in the paper. Conventional TEM bright field (BF) image is adequate to examine the barrieronly via; however, other techniques are more suitable for a Cu filled via.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Fuhrmann, T., J. Pletzer, and A. Uhl. "Computer assisted morphometric analysis of TEM images." In IET 3rd International Conference MEDSIP 2006. Advances in Medical, Signal and Information Processing. IEE, 2006. http://dx.doi.org/10.1049/cp:20060362.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Звіти організацій з теми "TEM ANALYSIS"

1

Kass, M. A., Yaoguo Li, Richard Krahenbuhl, Misac Nabighian, and Douglas Oldenburg. Enhancement of TEM Data and Noise Characterization by Principal Component Analysis. Fort Belvoir, VA: Defense Technical Information Center, May 2010. http://dx.doi.org/10.21236/ada571505.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Gerberich, W. W. Micromechanisms of brittle fracture: STM, TEM and electron channeling analysis. Final report. Office of Scientific and Technical Information (OSTI), January 1997. http://dx.doi.org/10.2172/463626.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Percival, J. B., T. Jensen, K. Wasyliuk, G. Drever, J. Sader, M. Sarfi, P A Hunt, C. Bibby, S. Wong, and A. Enright. EXTECH IV mineralogical database: XRD, infrared and TEM analyses. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2012. http://dx.doi.org/10.4095/292112.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Calahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, July 2022. http://dx.doi.org/10.31979/mti.2021.2130.

Повний текст джерела
Анотація:
For cost-efficiency, public safety, and sustainability, improving long-term performance in highway projects is imperative for public administrations. Project delivery and procurement methods provide an opportunity to align design and construction processes with this goal. While previous studies have explored whether project delivery methods impact the long-term performance of highway projects, these studies did not focus on how core elements within project procurement relate to long-term performance. Thus, to fill this gap, this research explores how and to what extent long-term evaluation criteria are considered in design-build best-value procurement of highway projects. To this end, the team conducted content analysis on 100 projects procured between 2009 and 2019 by 19 DOTs across the U.S. The analysis of 365 evaluation criteria found that (1) roughly 11% of them related to long-term performance. (2) The weight given to these criteria in the overall technical proposal was lower than 30%. (3) Sixty-five percent (65%) of long-term evaluation criteria focused on design while 15% related to materials and technology, respectively. The results of this study are a stepping stone to initiate a deep exploration of the relationship between procurement practices and actual project performance. Currently, as sustainability and life cycle assessments remain top concerns in infrastructure projects, this line of research may benefit DOTs and highway agencies across the U.S. and worldwide.
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Calahorra-Jimenez, Maria. Contracting Strategies: A Different Approach to Address Long-term Performance. Mineta Transportation Institute, July 2022. http://dx.doi.org/10.31979/mti.2022.2130.

Повний текст джерела
Анотація:
For cost-efficiency, public safety, and sustainability, improving long-term performance in highway projects is imperative for public administrations. Project delivery and procurement methods provide an opportunity to align design and construction processes with this goal. While previous studies have explored whether project delivery methods impact the long-term performance of highway projects, these studies did not focus on how core elements within project procurement relate to long-term performance. Thus, to fill this gap, this research explores how and to what extent long-term evaluation criteria are considered in design-build best-value procurement of highway projects. To this end, the team conducted content analysis on 100 projects procured between 2009 and 2019 by 19 DOTs across the U.S. The analysis of 365 evaluation criteria found that (1) roughly 11% of them related to long-term performance. (2) The weight given to these criteria in the overall technical proposal was lower than 30%. (3) Sixty-five percent (65%) of long-term evaluation criteria focused on design while 15% related to materials and technology, respectively. The results of this study are a stepping stone to initiate a deep exploration of the relationship between procurement practices and actual project performance. Currently, as sustainability and life cycle assessments remain top concerns in infrastructure projects, this line of research may benefit DOTs and highway agencies across the U.S. and worldwide.
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Aponte, C. I. Supernate source term analysis: Revision 1. Office of Scientific and Technical Information (OSTI), October 1994. http://dx.doi.org/10.2172/10105057.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Author, Not Given. Vehicle Systems Analysis Technical Team Roadmap. Office of Scientific and Technical Information (OSTI), June 2013. http://dx.doi.org/10.2172/1220129.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Allison, Ralph E., and Jr. Analysis of First-Term Army Attrition. Fort Belvoir, VA: Defense Technical Information Center, April 1999. http://dx.doi.org/10.21236/ada362968.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Canto, Patricia, ed. Lessons to be learnt for initiatives to promote cross-border collaboration: an experience in the New Aquitaine-Euskadi-Navarre euroregion. Universidad de Deusto, 2022. http://dx.doi.org/10.18543/xjrt7954.

Повний текст джерела
Анотація:
The aim of this report is to identify lessons for organisations that promote cross-border cooperation initiatives for innovation and for those interested in taking part in them. The study analyses how the organisations with a medium-term track record in the New Aquitaine-Euskadi-Navarre cross-border cluster grouping behave in terms of cross-border cooperation and innovation. This analysis is based on a survey carried out among the Klusteuro organisations (network of cross-border clusters in the New Aquitaine, the Basque Country and Navarre Euroregion). The study examines the importance given by these organisations to the barriers that can inhibit or facilitate cross-border cooperation (barriers to cross-border cooperation in innovation), in order to investigate how Klusteuro contributes to overcoming them. This analysis also identifies the type of innovation usually carried out by these organisations to understand the role played by the cluster in the development of different types of innovations. Finally, a series of lessons are drawn on the value that participation of a cross-border cluster or other initiatives that promote cross-border cooperation can bring to the partners involved.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Sawan, M. E., G. L. Kulcinski, and D. L. Henderson. Nuclear Analysis for Near Term Fusion Devices. Office of Scientific and Technical Information (OSTI), April 2007. http://dx.doi.org/10.2172/901591.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
Ми пропонуємо знижки на всі преміум-плани для авторів, чиї праці увійшли до тематичних добірок літератури. Зв'яжіться з нами, щоб отримати унікальний промокод!

До бібліографії