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Статті в журналах з теми "Scanning Tunneling Microscopy [Tool]"
Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (November 1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.
Повний текст джерелаStemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.
Повний текст джерелаDenley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.
Повний текст джерелаvan de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (January 1987): 108–12. http://dx.doi.org/10.1007/bf00469119.
Повний текст джерелаRohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.
Повний текст джерелаBracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.
Повний текст джерелаEdel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 618. http://dx.doi.org/10.1116/1.585471.
Повний текст джерелаBetzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.
Повний текст джерелаElings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.
Повний текст джерелаXIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (November 2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.
Повний текст джерелаДисертації з теми "Scanning Tunneling Microscopy [Tool]"
Kulawik, Maria. "Low temperature scanning tunneling microscopy." Doctoral thesis, [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=979718848.
Повний текст джерелаDing, Haifeng. "Spin-polarized scanning tunneling microscopy." [S.l. : s.n.], 2001. http://deposit.ddb.de/cgi-bin/dokserv?idn=963217186.
Повний текст джерелаGustafsson, Alexander. "Theoretical modeling of scanning tunneling microscopy." Doctoral thesis, Linnéuniversitetet, Institutionen för fysik och elektroteknik (IFE), 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:lnu:diva-69012.
Повний текст джерелаBlackham, Ian George. "Scanning tunneling microscopy of electrode surfaces." Thesis, University of Oxford, 1992. https://ora.ox.ac.uk/objects/uuid:f9d27595-1177-406f-89a2-1448ac654dd3.
Повний текст джерелаHeben, Michael J. Lewis Nathan Saul Lewis Nathan Saul. "Scanning tunneling microscopy in electrochemical environments /." Diss., Pasadena, Calif. : California Institute of Technology, 1990. http://resolver.caltech.edu/CaltechETD:etd-06122007-104233.
Повний текст джерелаWeeks, Brandon Lea. "Applications of high-pressure scanning tunneling microscopy." Thesis, University of Cambridge, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.621999.
Повний текст джерелаSalazar, Enríquez Christian David. "Scanning tunneling microscopy on low dimensional systems." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2016. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-211572.
Повний текст джерелаDiLullo, Andrew R. "Manipulative Scanning Tunneling Microscopy and Molecular Spintronics." Ohio University / OhioLINK, 2013. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1363821351.
Повний текст джерелаKersell, Heath R. "Alternative Excitation Methods in Scanning Tunneling Microscopy." Ohio University / OhioLINK, 2015. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1449074449.
Повний текст джерелаGambrel, Grady A. "Scanning Tunneling Microscopy of Two-Dimensional Materials." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu149424786854182.
Повний текст джерелаКниги з теми "Scanning Tunneling Microscopy [Tool]"
Neddermeyer, H., ed. Scanning Tunneling Microscopy. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1812-5.
Повний текст джерела1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. Boston: Academic Press, 1993.
Знайти повний текст джерела1956-, Stroscio Joseph Anthony, and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. San Diego: Academic Press, 1993.
Знайти повний текст джерела1956-, Stroscio Joseph A., and Kaiser William J. 1955-, eds. Scanning tunneling microscopy. London: Academic Press, 1993.
Знайти повний текст джерелаH, Neddermeyer, ed. Scanning tunneling microscopy. Dordrecht: Kluwer Academic Publishers, 1993.
Знайти повний текст джерелаGüntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Berlin, Heidelberg: Springer Berlin Heidelberg, 1994. http://dx.doi.org/10.1007/978-3-642-79255-7.
Повний текст джерелаGüntherodt, Hans-Joachim, and Roland Wiesendanger, eds. Scanning Tunneling Microscopy I. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97343-7.
Повний текст джерелаWiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy II. Berlin, Heidelberg: Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-97363-5.
Повний текст джерелаWiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-642-97470-0.
Повний текст джерелаWiesendanger, Roland, and Hans-Joachim Güntherodt, eds. Scanning Tunneling Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1996. http://dx.doi.org/10.1007/978-3-642-80118-1.
Повний текст джерелаЧастини книг з теми "Scanning Tunneling Microscopy [Tool]"
Howland, Rebecca S. "The Scanning Probe Microscope as a Metrology Tool." In Atomic Force Microscopy/Scanning Tunneling Microscopy, 347–58. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_35.
Повний текст джерелаDella Pia, Ada, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Surface Science Techniques, 565–97. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-34243-1_19.
Повний текст джерелаFeenstra, R. M. "Scanning Tunneling Microscopy." In Interaction of Atoms and Molecules with Solid Surfaces, 357–79. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4684-8777-0_11.
Повний текст джерелаBinning, G., and H. Rohrer. "Scanning tunneling microscopy." In Scanning Tunneling Microscopy, 40–54. Dordrecht: Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_3.
Повний текст джерелаNg, Kwok-Wai. "SCANNING TUNNELING MICROSCOPY." In Handbook of Measurement in Science and Engineering, 2025–42. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2016. http://dx.doi.org/10.1002/9781119244752.ch56.
Повний текст джерелаPia, Ada Della, and Giovanni Costantini. "Scanning Tunneling Microscopy." In Encyclopedia of Nanotechnology, 3531–43. Dordrecht: Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_45.
Повний текст джерелаVoigtländer, Bert. "Scanning Tunneling Microscopy." In Scanning Probe Microscopy, 279–308. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-45240-0_20.
Повний текст джерелаNiehus, Horst. "Scanning Tunneling Microscopy." In Equilibrium Structure and Properties of Surfaces and Interfaces, 29–68. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3394-8_2.
Повний текст джерелаTomitori, Masahiko. "Scanning Tunneling Microscopy." In Roadmap of Scanning Probe Microscopy, 7–14. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_2.
Повний текст джерелаHasegawa, Yukio. "Scanning Tunneling Microscopy." In Compendium of Surface and Interface Analysis, 599–604. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_97.
Повний текст джерелаТези доповідей конференцій з теми "Scanning Tunneling Microscopy [Tool]"
Zaitsev, Boris. "Atomic Force Microscopy as a Tool for Applied Virology and Microbiology." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639726.
Повний текст джерелаOhtsu, Motoichi. "Photon Scanning Tunneling Microscope." In Spectral Hole-Burning and Related Spectroscopies: Science and Applications. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/shbs.1994.fc1.
Повний текст джерелаde Pablos, P. F. "Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals." In SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03. AIP, 2003. http://dx.doi.org/10.1063/1.1639790.
Повний текст джерелаCourjon, D. "Near Field Optical Microscopy." In The European Conference on Lasers and Electro-Optics. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/cleo_europe.1996.tutc.
Повний текст джерелаClayton, G. M., and S. Devasia. "Image-Based Trajectory Estimation for Scanning Tunneling Microscopy." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-42262.
Повний текст джерелаBennett, Jean M., Jay Jahanmir, John C. Podlesny, Tami L. Balter, and Daniel T. Hobbs. "The Scanning Force Microscope as a Tool for Studying Optical Surfaces." In Optical Fabrication and Testing. Washington, D.C.: Optica Publishing Group, 1994. http://dx.doi.org/10.1364/oft.1994.omd1.
Повний текст джерелаCricenti, Antonio, S. Selci, M. Scarselli, Renato Generosi, F. Amaldi, and G. Chiarotti. "Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in scanning tunneling microscopy." In OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering, edited by Clayton C. Williams. SPIE, 1993. http://dx.doi.org/10.1117/12.146384.
Повний текст джерелаAvouris, Ph, I. W. Lyo, F. Bozso, B. Schubert, and R. Hoffmann. "The Elucidation of the Mechanism of the Initial Stages of Si(111)-7x7 Oxidation Using Scanning Tunneling Microscopy." In The Microphysics of Surfaces: Beam-Induced Processes. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/msbip.1991.mb2.
Повний текст джерелаJalili, Nader, Mohsen Dadfarnia, and Darren M. Dawson. "Distributed-Parameters Base Modeling and Vibration Analysis of Micro-Cantilevers Used in Atomic Force Microscopy." In ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/detc2003/vib-48502.
Повний текст джерелаJaculbia, Rafael B., Hiroshi Imada, Kuniyuki Miwa, Takeshi Iwasa, Masato Takenaka, Bo Yang, Emiko Kazuma, Norihiko Hayazawa, Tetsuya Taketsugu, and Yousoo Kim. "Vibrational symmetry of a single molecule revealed by tip-enhanced Raman spectroscopy." In JSAP-OSA Joint Symposia. Washington, D.C.: Optica Publishing Group, 2019. http://dx.doi.org/10.1364/jsap.2019.18p_e208_9.
Повний текст джерелаЗвіти організацій з теми "Scanning Tunneling Microscopy [Tool]"
Bartels, Ludwig. Towards the Assembly and Characterization of Individual Molecules by Use of the Scanning Tunneling Microscope as a Nanoscopic Tool. Fort Belvoir, VA: Defense Technical Information Center, September 2002. http://dx.doi.org/10.21236/ada408395.
Повний текст джерелаDow, John D. Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1992. http://dx.doi.org/10.21236/ada249262.
Повний текст джерелаBotkin, D. A. Ultrafast scanning tunneling microscopy. Office of Scientific and Technical Information (OSTI), September 1995. http://dx.doi.org/10.2172/270266.
Повний текст джерелаQuate, C. F. Scanning Tunneling Microscopy of Semiconductor Surfaces. Fort Belvoir, VA: Defense Technical Information Center, September 1988. http://dx.doi.org/10.21236/ada199836.
Повний текст джерелаLyding, Joseph W. Cryogenic Ultrahigh Vacuum Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 1993. http://dx.doi.org/10.21236/ada262264.
Повний текст джерелаSnyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.
Повний текст джерелаHeben, M. J., T. L. Longin, R. Pyllki, R. M. Penner, R. Blumenthal, and N. S. Lewis. Applications of Scanning Tunneling Microscopy to Electrochemistry. Fort Belvoir, VA: Defense Technical Information Center, September 1992. http://dx.doi.org/10.21236/ada263326.
Повний текст джерелаLewis, Nathan S. Applications of Scanning Tunneling Microscopy to Electrochemistry. Fort Belvoir, VA: Defense Technical Information Center, August 1993. http://dx.doi.org/10.21236/ada269129.
Повний текст джерелаWilliams, Ellen D. Scanning Tunneling Microscopy as a Surface Chemical Probe. Fort Belvoir, VA: Defense Technical Information Center, March 1988. http://dx.doi.org/10.21236/ada192710.
Повний текст джерелаColeman, R. V. Surface structure and analysis with scanning tunneling microscopy and electron tunneling spectroscopy. Office of Scientific and Technical Information (OSTI), January 1992. http://dx.doi.org/10.2172/6017304.
Повний текст джерела