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Статті в журналах з теми "Microanalyis"
Ashino, R., S. J. Desjardins, C. Heil, M. Nagase, and R. Vaillancourt. "Smooth tight frame wavelets and image microanalyis in the fourier domain." Computers & Mathematics with Applications 45, no. 10-11 (May 2003): 1551–79. http://dx.doi.org/10.1016/s0898-1221(03)00136-6.
Повний текст джерелаMeisenkothen, Frederick, Robert Wheeler, Michael D. Uchic, Robert D. Kerns, and Frank J. Scheltens. "Electron Channeling: A Problem for X-Ray Microanalysis in Materials Science." Microscopy and Microanalysis 15, no. 2 (March 16, 2009): 83–92. http://dx.doi.org/10.1017/s1431927609090242.
Повний текст джерелаCliff, Graham, and Peter B. Kenway. "Atomic AEM - poissonian problems from gaussian probes!" Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1228–29. http://dx.doi.org/10.1017/s0424820100130778.
Повний текст джерелаZaluzec, Nestor J. "Microscopy Society of America." Microscopy and Microanalysis 17, S1 (July 4, 2011): 40–48. http://dx.doi.org/10.1017/s1431927611000742.
Повний текст джерелаFriel, John J., and Richard B. Mott. "Energy-Dispersive Spectrometry from Then until Now: A Chronology of Innovation." Microscopy and Microanalysis 4, no. 6 (December 1998): 559–66. http://dx.doi.org/10.1017/s1431927698980539.
Повний текст джерелаBerry, J. P., R. Masse, F. Escaig, and P. Galle. "Intracellular Localization of Cerium. A Microanalytical Study using an Electron Microprobe and Ionic Microanalysis." Human Toxicology 8, no. 6 (November 1989): 511–20. http://dx.doi.org/10.1177/096032718900800614.
Повний текст джерелаBull, Peter. "The Microanalysis of Political Discourse." Philologia Hispalensis 1, no. 16 (2012): 79–93. http://dx.doi.org/10.12795/ph.2012.v26.i01.04.
Повний текст джерелаMiksza, Peter, Jennifer Blackwell, and Nicholas E. Roseth. "Self-Regulated Music Practice: Microanalysis as a Data Collection Technique and Inspiration for Pedagogical Intervention." Journal of Research in Music Education 66, no. 3 (July 26, 2018): 295–319. http://dx.doi.org/10.1177/0022429418788557.
Повний текст джерелаHunt, J. A., A. J. Strutt, and D. B. Williams. "Quantitative light-element analysis using parallel EELS." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 722–23. http://dx.doi.org/10.1017/s0424820100087926.
Повний текст джерелаLong, J. V. P. "Microanalysis." Micron 24, no. 2 (January 1993): 143–48. http://dx.doi.org/10.1016/0968-4328(93)90065-9.
Повний текст джерелаДисертації з теми "Microanalyis"
Elzière, Sophie. "Nuées d'oiseaux et crocus évangiles. Ted Hughes et le poème de l'être complet." Thesis, Sorbonne université, 2021. https://tel.archives-ouvertes.fr/tel-03789589.
Повний текст джерелаThis thesis explores Ted Hughes’s poetic work and focuses on the question of the completion of being and of language. The poet sheds light on the man of ‘logos’, heir to Socrates and Descartes, criminal because he wanted, by the sole force of his rational mind, to own and control the outer world of nature and to be the master of the inner world of his individuality, body and soul alike. The myths and stories that fill Ted Hughes’s poetic and critical work trace the trajectory of a human being who has acknowledged the harm he has done and asks for forgiveness to the Goddess of Complete Being, both his Mother-Earth and Sacred Bride, both Queen of Hell and Flower of Paradise. As he surrenders to her unconditionally, an ultimate and ‘last-ditch miracle’ occurs, one that reveals his true and divine ‘self at the source’, his ‘vital nucleus’ and ‘the most inaccessible thing of all’. According to the poet, one should speak like the animals and the birds that, far beyond human words, manage to ‘express this being pure and without effort’ and a truth ‘at the core of us – strange, beautiful, pathetic, terrible’. One should decipher the inaudible music of the wind, the grass and the rocks, because it bears the truth of a nameless Goddess, the ‘Annunciation of clay, water and sunlight’, or the ‘crocus evangels’, which tell man that he should take all the risks throughout his journey. The human being that the poet describes has a black wound on his body and a rainbow jewel in his soul; he has been through the softness of agony and the sorrows of ecstasy – and thus he feels the inmost core of being and of language, and the secret of the magic spell cast by poetry
Carswell, Stewart. "Microanalysis of dyes from textiles." Thesis, Queensland University of Technology, 1991. https://eprints.qut.edu.au/35972/1/35972_Carswell_1991.pdf.
Повний текст джерелаKerr, R. T. "Spatial resolution in STEM EDX microanalysis." Thesis, University of Oxford, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355758.
Повний текст джерелаWyse, Cathy. "Exhaled breath microanalysis in veterinary medicine." Thesis, University of Glasgow, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.433584.
Повний текст джерелаKossakovski, Dmitri A. Beauchamp Jesse L. Beauchamp Jesse L. "Scanning probe chemical and topographical microanalysis /." Diss., Pasadena, Calif. : California Institute of Technology, 2000. http://resolver.caltech.edu/CaltechETD:etd-02272009-085501.
Повний текст джерелаMuscat, Richard. "Behavioural microanalysis of dopamine autoreceptor function." Thesis, London Metropolitan University, 1987. http://repository.londonmet.ac.uk/3060/.
Повний текст джерелаVatter, Ian A. "High resolution microanalysis of alloy steel." Thesis, University of Bath, 1993. https://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.359723.
Повний текст джерелаMoy, Aurélien. "Contribution à la modélisation physique du dosage des actinides par microanalyse électronique." Thesis, Montpellier 2, 2014. http://www.theses.fr/2014MON20211/document.
Повний текст джерелаElectron probe microanalysis (EPMA) is used to quantify with a high accuracy the amount of different elements present on a sample of unknown composition. EPMA is largely used to quantify the amount of actinides present in fresh and irradiated fuels, to manage waste disposal and to date rocks. However, quantitative EPMA is not always possible to achieve for these materials due to the lack of suitable reference standards for the radionuclides. To overcome this difficulty, standardless methods of analysis are employed with mean of virtual calculated standards. These calculated standards are generally obtained from empirical formulae based on experimental extrapolations or from theoretical calculations that require physical parameters which are poorly known as it is the case for the X-ray production cross section.The accurate knowledge of these cross sections is required in many applications such as in particle transport code and in Monte Carlo simulations. The computer simulations are widely used in the medical field and particularly in medical imaging and in electron beam therapy. In the field of astronomy, these data are used to perform simulations that predict the compositions of stars and galactic clouds, and the formation of planetary systems.In the present work, L- and M-shell absolute x-ray production cross sections were determined experimentally for elements lead, thorium and uranium by electron impact using ultrathin self-supporting targets with thickness varying from 0.2 to 8 nm. The measured cross sections have been compared, with the distorted-wave Born approximation (DWBA) calculated by Bote et al. and with the predictions of analytical formulae widely used in practical applications. For the conversion of inner-shell ionization cross sections into x-ray production cross sections, atomic relaxation parameters were extracted from the literature. The predictions of the DWBA calculations are in excellent agreement with our measured x-ray production cross sections. This confirms the predictive results of this model and its usefulness for the calculation of virtual standards.The DWBA calculations were used into the Monte Carlo simulation code PENELOPE to calculate the X-ray intensity produced by pure actinide standards. The X-ray intensities were calculated for elements with atomic number 89 ≤ Z ≤ 99 and for accelerating voltage ranging from the ionization threshold up to 40 kV with a step of 0.5 kV. For a practical use, the calculated intensities for the most intense L and M lines were stored in a database.The predictions of our calculated standards have been compared with the x-ray intensity of known composition actinide samples (such as U, UO2, ThO2, ThF4, PuO2…) and with the data acquired during previous measurement projects. Actinide quantifications performed by virtual standards were found to be in fair agreement with the expected results. This confirms the reliability of the developed virtual standards and demonstrates that actinide quantification by EPMA can now be possible to perform without material actinide standards and with a good level of accuracy
McGibbon, Alastair J. "High spatial resolution microanalysis of semiconductor interfaces." Thesis, University of Glasgow, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.329680.
Повний текст джерелаKale, Andy. "Quantitative microanalysis using the hyperbolic field analyser." Thesis, University of York, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.399581.
Повний текст джерелаКниги з теми "Microanalyis"
Morgan, A. John. X-ray microanalysis in electron microscopy for biologists. Oxford [Oxfordshire]: Oxford University Press Oxford [Oxfordshire], 1985.
Знайти повний текст джерелаLaser microanalysis. New York: Wiley, 1989.
Знайти повний текст джерелаScanning electron microscopy and x-ray microanalysis. Englewood Cliffs, N.J: PTR Prentice Hall, 1993.
Знайти повний текст джерелаYacobi, B. G., D. B. Holt, and L. L. Kazmerski, eds. Microanalysis of Solids. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4899-1492-7.
Повний текст джерелаZierold, Karl, and Herbert K. Hagler, eds. Electron Probe Microanalysis. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-74477-8.
Повний текст джерелаYacobi, B. G. Microanalysis of Solids. Boston, MA: Springer US, 1994.
Знайти повний текст джерелаG, Yacobi B., Holt D. B, and Kazmerski Lawrence L, eds. Microanalysis of solids. New York: Plenum Press, 1994.
Знайти повний текст джерелаScott, V. D. Quantitative electron-probe microanalysis. 2nd ed. New York: Ellis Horwood, 1995.
Знайти повний текст джерелаMarinenko, R. B. Glasses for microanalysis: SRM's 1871-1875. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Знайти повний текст джерелаHow many exceptionalisms?: Explorations in microanalysis. Philadelphia: Temple University Press, 2008.
Знайти повний текст джерелаЧастини книг з теми "Microanalyis"
Hodson, Martin J. "Microanalysis." In Methods in Plant Electron Microscopy and Cytochemistry, 263–78. Totowa, NJ: Humana Press, 2000. http://dx.doi.org/10.1007/978-1-59259-232-6_19.
Повний текст джерелаDykstra, Michael J., and Laura E. Reuss. "Microanalysis." In Biological Electron Microscopy, 395–403. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-1-4419-9244-4_23.
Повний текст джерелаDykstra, Michael J. "Microanalysis." In Biological Electron Microscopy, 285–94. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4684-0010-6_13.
Повний текст джерелаvan den Bel, Martijn M. "Microanalysis." In Archaeological Investigations on Guadeloupe, French West Indies, 197–247. London: Routledge, 2021. http://dx.doi.org/10.4324/9781003181651-5.
Повний текст джерелаOakley, Jacob G. "Compromise Microanalysis." In Cybersecurity for Space, 127–40. Berkeley, CA: Apress, 2020. http://dx.doi.org/10.1007/978-1-4842-5732-6_10.
Повний текст джерелаJoy, David C. "Microanalysis with HIM." In SpringerBriefs in Materials, 43–48. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-8660-2_6.
Повний текст джерелаEchlin, Patrick. "Low-Temperature Microanalysis." In Low-Temperature Microscopy and Analysis, 413–90. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4899-2302-8_11.
Повний текст джерелаLyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Light Element Microanalysis." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 117–21. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_20.
Повний текст джерелаLyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Trace Element Microanalysis." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 122–26. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_21.
Повний текст джерелаLyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Light Element Microanalysis." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 330–34. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_49.
Повний текст джерелаТези доповідей конференцій з теми "Microanalyis"
Abel, François. "Microanalyse nucléaire." In Élaboration et caractérisation des cristaux massifs et en couches minces pour l'optique. Les Ulis, France: EDP Sciences, 2003. http://dx.doi.org/10.1051/bib-sfo:2002801.
Повний текст джерелаBach, Hans, and Klaus Bange. "Microanalysis Of Thin Films." In 1988 International Congress on Optical Science and Engineering, edited by Karl H. Guenther and Hans K. Pulker. SPIE, 1989. http://dx.doi.org/10.1117/12.950019.
Повний текст джерелаNazmov, V. P., A. A. Legkodymov, S. M. Zhmodik, G. N. Kulipanov, and N. P. Pokhilenko. "XRF microanalysis of thick objects." In SYNCHROTRON AND FREE ELECTRON LASER RADIATION: Generation and Application (SFR-2020). AIP Publishing, 2020. http://dx.doi.org/10.1063/5.0030498.
Повний текст джерелаPerez, J. M., P. Pei, Y. Zhang, and S. M. Hsu. "Diesel Deposit Forming Tendencies - Microanalysis Methods." In International Congress & Exposition. 400 Commonwealth Drive, Warrendale, PA, United States: SAE International, 1991. http://dx.doi.org/10.4271/910750.
Повний текст джерелаPérez, Carlos A., and Angelo Malachias de Souza. "Preface: X-Ray Optics and Microanalysis." In X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 21st International Congress. AIP, 2012. http://dx.doi.org/10.1063/1.3703333.
Повний текст джерелаWollman, D. A. "Low voltage microanalysis using microcalorimeter EDS." In The 2000 international conference on characterization and metrology for ULSI technology. AIP, 2001. http://dx.doi.org/10.1063/1.1354447.
Повний текст джерелаMason, Maribeth, Genghmun Eng, Martin Leung, Gary Stupian, and Terence Yeoh. "Microanalysis for tin whisker risk assessment." In 2011 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2011. http://dx.doi.org/10.1109/irps.2011.5784473.
Повний текст джерелаNg, F. L., and J. Wei. "X-Ray Microanalysis of Metallic Thin Films." In ASME 2005 International Mechanical Engineering Congress and Exposition. ASMEDC, 2005. http://dx.doi.org/10.1115/imece2005-79319.
Повний текст джерелаTague, Thomas J., David Sampson, P. M. Champion, and L. D. Ziegler. "Combined High Resolution AFM and Raman Microanalysis." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482822.
Повний текст джерелаLyman, Charles E., and Paul S. Dimick. "Advanced STEM microanalysis of bimetallic nanoparticle catalysts." In X-RAY OPTICS AND MICROANALYSIS: Proceedings of the 21st International Congress. AIP, 2012. http://dx.doi.org/10.1063/1.3703348.
Повний текст джерелаЗвіти організацій з теми "Microanalyis"
Pennycook, S. J., D. E. Jesson, N. D. Browning, and M. F. Chisholm. Microanalysis at atomic resolution. Office of Scientific and Technical Information (OSTI), June 1995. http://dx.doi.org/10.2172/81051.
Повний текст джерелаSmart, Peter, N. K. Tovey, Mark W. Hounslow, Xiaoling Leng, and Xiaohong Bai. Microanalysis of Deformation of Soil. Fort Belvoir, VA: Defense Technical Information Center, June 1993. http://dx.doi.org/10.21236/ada271870.
Повний текст джерелаGellman, Andrew J. Surface Microanalysis Investigations of Friction and Lubrication. Fort Belvoir, VA: Defense Technical Information Center, October 1999. http://dx.doi.org/10.21236/ada371223.
Повний текст джерелаMikula, R. J. Application of x-ray microanalysis to tar sands emulsions. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1986. http://dx.doi.org/10.4095/304977.
Повний текст джерелаBradley, J. Development of Integrated Microanalysis of Nanomaterials (06-ERI-001). Office of Scientific and Technical Information (OSTI), October 2009. http://dx.doi.org/10.2172/967759.
Повний текст джерелаWilliams, D. B. ,. Watanabe, M. and Burke, M. G. Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet. Office of Scientific and Technical Information (OSTI), November 2001. http://dx.doi.org/10.2172/938978.
Повний текст джерелаLawson, R. L. Nondestructive x-ray microanalysis bidirectional scanning and data acquisition system. Office of Scientific and Technical Information (OSTI), September 1989. http://dx.doi.org/10.2172/10143413.
Повний текст джерелаLauf, R. J. Secondary sulfate minerals from Alum Cave Bluff: Microscopy and microanalysis. Office of Scientific and Technical Information (OSTI), July 1997. http://dx.doi.org/10.2172/631175.
Повний текст джерелаPryor, R. J., N. Basu, and T. Quint. Development of Aspen: A microanalytic simulation model of the US economy. Office of Scientific and Technical Information (OSTI), February 1996. http://dx.doi.org/10.2172/204675.
Повний текст джерелаArtino, Jr, Cleary Anthony R., Dong Timothy J., Hemmer Ting, Durning Paul A., and Steven J. Exploring Clinical Reasoning in Novices: A Self-Regulated Learning Microanalytic Approach. Fort Belvoir, VA: Defense Technical Information Center, July 2013. http://dx.doi.org/10.21236/ada587612.
Повний текст джерела