Готові списки джерел за темами / In situ SEM characterization

Зміст

  1. Статті в журналах
  2. Дисертації
  3. Книги
  4. Частини книг
  5. Тези доповідей конференцій
  6. Звіти організацій

Добірка наукової літератури з теми "In situ SEM characterization"

Автор: Grafiati
Опубліковано: 12 жовтня 2024

Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями

Оберіть тип джерела:

Ознайомтеся зі списками актуальних статей, книг, дисертацій, тез та інших наукових джерел на тему "In situ SEM characterization".

Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.

Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.

Статті в журналах з теми "In situ SEM characterization"

1

Lupinacci, A., P. Hosemann, A. Minor, and A. Shapiro. "In-Situ SEM Characterization of Fracture Behavior." Microscopy and Microanalysis 18, S2 (July 2012): 792–93. http://dx.doi.org/10.1017/s1431927612005818.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Qu, Juntian, and Xinyu Liu. "Recent Advances on SEM-Based In Situ Multiphysical Characterization of Nanomaterials." Scanning 2021 (June 9, 2021): 1–16. http://dx.doi.org/10.1155/2021/4426254.

Повний текст джерела
Анотація:
Functional nanomaterials possess exceptional mechanical, electrical, and optical properties which have significantly benefited their diverse applications to a variety of scientific and engineering problems. In order to fully understand their characteristics and further guide their synthesis and device application, the multiphysical properties of these nanomaterials need to be characterized accurately and efficiently. Among various experimental tools for nanomaterial characterization, scanning electron microscopy- (SEM-) based platforms provide merits of high imaging resolution, accuracy and stability, well-controlled testing conditions, and the compatibility with other high-resolution material characterization techniques (e.g., atomic force microscopy), thus, various SEM-enabled techniques have been well developed for characterizing the multiphysical properties of nanomaterials. In this review, we summarize existing SEM-based platforms for nanomaterial multiphysical (mechanical, electrical, and electromechanical) in situ characterization, outline critical experimental challenges for nanomaterial optical characterization in SEM, and discuss potential demands of the SEM-based platforms to characterizing multiphysical properties of the nanomaterials.
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Antoniou, Nicholas, Konrad Rykaczewski, and Michael D. Uchic. "In situ FIB-SEM characterization and manipulation methods." MRS Bulletin 39, no. 4 (April 2014): 347–52. http://dx.doi.org/10.1557/mrs.2014.58.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Lu, Yang, Yajing Shen, Xinyu Liu, Mohd Ridzuan Bin Ahmad, and Yan Chen. "In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization." Scanning 2017 (2017): 1–2. http://dx.doi.org/10.1155/2017/8016571.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Gan, Meixue, Lang Tian, Yiruo Chen, Jieting Xin, Hui Si, Yimin Xie, and Qinghua Feng. "All-cellulose composites fabricated by in-situ welding." BioResources 18, no. 2 (March 6, 2023): 3044–55. http://dx.doi.org/10.15376/biores.18.2.3044-3055.

Повний текст джерела
Анотація:
As a consequence of increasingly serious environmental problems, many researchers are highlighting biomass materials. Cellulose, the most abundant bioresource, is becoming a key consideration for alleviating environmental pollution. Characterization of cellulosic materials is fundamental to exploring their structures and elemental contents. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) are frequently employed to study the structure of cellulose. Thus, it is urgent to combine traditional means with new ones. This study focused on the characterization of the all-cellulose composites (ACCs) model prepared via partially dissolving filter paper using 40% benzyltrimethylammonium hydroxide (BzMe3NOH) aqueous solution. Characterized by SEM, XRD, Fourier transformation infrared spectroscopy, Raman spectroscopy, and X-ray photoelectron spectroscopy, the unique transformation from cellulose I to cellulose II of the ACCs model was explored. These characterization methods exhibited respective features, which could be universal ways to investigate ACCs.
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Gauvin, Raynald, Karim Zaghib, Nicolas Brodusch, Maryam Golozar, and Nicolas Dumaresq. "In-Situ Characterization of Lithium Ion Batteries in the SEM." ECS Meeting Abstracts MA2022-02, no. 7 (October 9, 2022): 2433. http://dx.doi.org/10.1149/ma2022-0272433mtgabs.

Повний текст джерела
Анотація:
This paper will present state of the art characterization of Lithium Ion Batteries usimg low voltage EELS and EDS of Li using the SU-9000 STEM from Hitachi working at 30 keV and 3 keV. Extensive in-situ work in SEM of LIB made with Li anodes will also be presented.
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Jiang, Chenchen, Haojian Lu, Hongti Zhang, Yajing Shen, and Yang Lu. "Recent Advances on In Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials." Scanning 2017 (2017): 1–11. http://dx.doi.org/10.1155/2017/1985149.

Повний текст джерела
Анотація:
In the past decades, in situ scanning electron microscopy (SEM) has become a powerful technique for the experimental study of low-dimensional (1D/2D) nanomaterials, since it can provide unprecedented details for individual nanostructures upon mechanical and electrical stimulus and thus uncover the fundamental deformation and failure mechanisms for their device applications. In this overview, we summarized recent developments on in situ SEM-based mechanical and electrical characterization techniques including tensile, compression, bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis. In addition, the advantages and disadvantages of in situ SEM tests were also discussed with some possible solutions to address the challenges. Furthermore, critical challenges were also discussed for the development and design of robust in situ SEM characterization platform with higher resolution and wider range of samples. These experimental efforts have offered in-depth understanding on the mechanical and electrical properties of low-dimensional nanomaterial components and given guidelines for their further structural and functional applications.
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Laval, J. Y., M. H. Berger, and C. Cabanel. "In Situ Electrical and Microstructural Characterization of Individual Boundaries." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 336–37. http://dx.doi.org/10.1017/s0424820100164143.

Повний текст джерела
Анотація:
In order to get direct information on the relationships between the structural and electrical properties of interfaces, we developed in situ experiments in TEM-STEM and SEM for the characterization of the local behaviour of majority and minority carriers. In particular, we described here our new technique for local determination of interfacial potential barriers in electronic ceramics. This information is completed by voltage contrast imaging in SEM at 1 kV which enables a full map of the distribution of these interfacial barriers to be obtained.The TEM experiment is schematized in fig. 1. A tungsten microelectrode (100 nm diameter) can be micromanipulated in situ and gently set down on the TEM sample. The contact between the microelectrode and the sample is shown sharply by the modification of extinction contours in each adjacent grain (Fig. 2ab).
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Kim, Jeong Guk. "Analysis of Heat Generation during Fracture in Ceramic Matrix Composites." Key Engineering Materials 385-387 (July 2008): 689–92. http://dx.doi.org/10.4028/www.scientific.net/kem.385-387.689.

Повний текст джерела
Анотація:
Ceramic matrix composites (CMCs) have evolved as potential candidate materials for high-temperature structural applications due to lightweight, high-temperature strength and excellent corrosion and wear resistance. In this investigation, damage evolution and heat generation of CMCs during monotonic loadings were investigated using different types of nondestructive evaluation (NDE) techniques, such as acoustic emission (AE) and infrared (IR) thermography and microstructural characterization. IR camera was used for in-situ monitoring of temperature evolution, and the temperature changes during testing were measured. A significant temperature increase has been observed at the time of failure. Microstructural characterizations using scanning electron microscopy (SEM) were performed to investigate fracture behavior of CMC samples. In this investigation, the NDE technique and SEM characterization were employed to analyze damage evolution and progress of ceramic matrix composites during monotonic loading.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Weiland, H., D. P. Field, and B. L. Adams. "In situ observation of orientation changes on metallic surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 246–47. http://dx.doi.org/10.1017/s0424820100137604.

Повний текст джерела
Анотація:
The characterization of crystalline aggregates by the crystallographic orientations of their grains and subgrains has become a subject of increasing interest. The information obtained is not only used for the characterization of materials, but also more importantly for the determination of properties. To mention only a few, applications have been found in the areas of fracture analysis, recrystallization, and plastic deformation.Most commonly, crystallographic orientations are determined from Backscattered Kikuchi Diffraction (BKD) in the SEM and from Kikuchi patterns obtained by microdiffraction in the TEM. Since the development of fully automatic pattern analysis routines for the BKD, the SEM based techniques currently finds the most applications. In conjunction with computer controlled stage or beam displacements, the technique is known as Orientation Imaging Microscopy (OIM). In this manner, thousands of diffraction patterns are analyzed automatically within a short time. This leads to a statistical description of the distribution of crystallographic orientations, which sufficiently represent the bulk material.
Стилі APA, Harvard, Vancouver, ISO та ін.
Більше джерел

Дисертації з теми "In situ SEM characterization"

1

Berthier, Rémy. "Development of characterization methods for in situ annealing and biasing of semiconductor devices in the TEM." Thesis, Université Grenoble Alpes (ComUE), 2018. http://www.theses.fr/2018GREAY014/document.

Повний текст джерела
Анотація:
Dans cette thèse, nous abordons les défis rencontrés lors de la caractérisation des mémoires non volatiles par microscopie en transmission in situ. Les innovations récentes menées sur les porte-objets de TEM in situ basés sur l'utilisation de puces en silicium apportent de grands avantages comparée aux précédents modèles. Cependant, cette technique reste complexe et les expériences de MET in situ sont difficiles à mener à terme. Ce manuscrit tente d'apporter de nouvelles solutions pour permettre l'observation à l'échelle atomique pendant le recuit, ou la polarisation d'un échantillon dans le MET. Ce projet a été mené à travers plusieurs améliorations effectuées au cours des différentes étapes des expériences de MET in situ. Cette thèse se focalise plus particulièrement sur les problèmes rencontrés lors de la polarisation de dispositifs de mémoires résistives de taille nanométrique. Ces travaux furent conduits à travers une étude des instruments utilisés, le développement de nouvelles méthodes de préparation d'échantillons, et une analyse de l'impact de l'imagerie électronique sur le fonctionnement d'un dispositif dans le MET.Tout d’abord, une nouvelle méthode est développée spécifiquement pour les expériences de MET in situ en température. Grâce à ces développements, la cristallisation de mémoires à changement de phase en GeTe est observée en temps réel. Ces résultats ont notamment permis d'obtenir des informations utiles pour le développement de mémoires à changement de phase de type chalcogénure. Ensuite, de nouvelles puces en silicium dédiées à la polarisation in situ sont développées et produites. Une étude est ensuite menée sur la préparation d'échantillons par FIB afin d'améliorer la qualité des contacts électriques pour la polarisation in situ, ainsi que la technique de préparation elle-même. La qualité de cette méthode est ensuite démontrée à travers des mesures quantitatives obtenues pendant la polarisation in situ d'un échantillon de référence de type jonction PN. Ces développements sont ensuite appliqués afin d’observer des dispositifs de mémoires résistives de type CBRAM en fonctionnement dans le microscope électronique en transmission. Ces résultats ont permis d'apporter de nouvelles informations sur les mécanismes de fonctionnement des mémoires résistives, ainsi que sur la technique de polarisation in situ
In this work, we address the current challenges encountered during in situ Transmission Electron Microscopy characterization of emerging non volatile data storage technologies. Recent innovation on in situ TEM holders based on silicon micro chips have led to great improvements compared to previous technologies. Still, in situ is a particularly complicated technique and experiments are extremely difficult to implement. This work provides new solutions to perform live observations at the atomic scale during both heating and biasing of a specimen inside the TEM. This was made possible through several improvements performed at different stages of the in situ TEM experiments. The main focus of this PhD concerned the issues faced during in situ biasing of a nanometer size resistive memory device. This was made possible through hardware investigation, sample preparation method developments, and in situ biasing TEM experiments.First, a new sample preparation method has been developed specifically to perform in situ heating experiments. Through this work, live crystallization of a GeTe phase change Memory Material is observed in the TEM. This allowed to obtain valuable information for the development of chalcogenide based Phase Change Resistive Memories. Then, new chips dedicated to in situ biasing experiments have been developed and manufactured. The FIB sample preparation is studied in order to improve electrical operation in the TEM. Quantitative TEM measurements are then performed on a reference PN junction to demonstrate the capabilities of this new in situ biasing experimental setup. By implementing these improvements performed on the TEM in situ biasing technique, results are obtained during live operation of a Conductive Bridge Resistive Memory device. This allowed to present new information on the resistive memories functioning mechanisms, as well as the in situ TEM characterization technique itself
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Bignoli, Francesco. "Tailoring mechanical behavior of metallic thin films through nanoengineering design strategies : investigation of metallic glass and high entropy alloy films." Electronic Thesis or Diss., Paris 13, 2024. http://www.theses.fr/2024PA131031.

Повний текст джерела
Анотація:
Les couches minces métalliques sont devenues l'objet de recherches intensives ces dernières années en raison de l'activation des effets de taille mécanique améliorant la résistance et la plasticité.Cependant, l'étude de la connexion entre la structure locale et le comportement mécanique d'un film mince n'est pas pleinement comprise et la recherche de nouvelles nanostructures capables d'améliorer leurs propriétés mécaniques est encore un sujet ouvert.Dans ce projet de doctorat, nous exploitons le potentiel du dépôt laser pulsé (PLD) pour synthétiser de nouveaux verres métalliques (TFMG) et des alliages à haute entropie en films minces (TFHEA) avec une microstructure unique et sur mesure, y compris assemblée en grappes, en nanolaminés, ajustant la chimie locale (notamment avec l'oxygène) pour produire des couches minces présentant une résistance et une plasticité améliorées.Pour le cas des TFMGs, le contrôle de la structure locale permet de retarder et de supprimer les bandes de cisaillement et d'améliorer la résistance, ce qui se traduit par des films ayant la limite d'élasticité > 3 GPa et une déformation homogène de 15 %.Pour le cas des TFHEAs, le PLD peut contrôler la taille des grains obtenant des valeurs élevées de dureté (11 GPa) et une résistance à la fissuration lors de tests de traction sur Kapton® (3,44 %) par rapport aux échantillons fait par pulvérisation (8,3 GPa et 2 %). Dans l'ensemble, dans cette thèse, nous ouvrons la voie à l'utilisation du PLD comme nouvelle technique de synthèse de films métalliques avec une nanostructure et une composition uniques et de grandes propriétés mécaniques pour des applications en revêtements structuraux haute performance
Metallic thin films have become object of intense research in recent years due to the activation of mechanical size effects improving strength and plasticity.However, the study of the connection between the local structure and the mechanical behavior of a thin film is not fully understood yet and the research for new nanostructures capable to further improve and tailor their mechanical properties is still an open subject.In this PhD project, we exploit the potential of Pulsed Laser Deposition (PLD) to synthetize novel thin film metallic glasses (TFMGs) and high entropy alloys (TFHEAs) with unique and tailored composition-microstructure including cluster-assembled, nanolaminate, while tuning local chemistry (especially with O incorporation) to produce thin films with improved strength and plasticity.For the case of TFMGs the control of the local structure allows the delay and suppression of shear bands and improvement of the strength resulting in films with yield strength > 3 GPa and 15% homogeneous deformation.For the case of TFHEAs, PLD can control the grain size obtaining large values of hardness (11 GPa) and have improved crack resistance on tensile tests on Kapton® (3.44%) with respect to sputtered samples (8.3 GPa and 2%).Overall, within this thesis we open the way to the use of PLD as a new technique to synthetize metallic films with unique nanostructure and composition and large mechanical properties for applications as high-performance structural coatings
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Willeman, Héloïse. "Multi-scale characterization of deformation mechanisms of poly-ether-ether-ketone (PEEK) under tensile stretching." Electronic Thesis or Diss., Lyon, INSA, 2023. http://www.theses.fr/2023ISAL0006.

Повний текст джерела
Анотація:
L’objectif de cette thèse est d’établir le scénario multi-échelles de déformation du PEEK lorsqu’il est sollicité en traction uniaxiale. Préalablement à la mise en oeuvre d’échantillons de deux grades commerciaux de PEEK, les propriétés thermiques et mécaniques de ces matériaux ont été caractérisées. La température d’oubli thermodynamique ainsi que la sensibilité aux vitesses de refroidissement ont été établies. Des éprouvettes de traction ont été obtenues à partir de plaques thermocompressées, procédé choisi pour obtenir des morphologies les plus isotropes possibles. Les propriétés mécaniques en traction ont ensuite été caractérisées au-dessus et au-dessous de la transition vitreuse de la phase amorphe (Tg). Grâce à un dispositif expérimental fabriqué sur mesure, des essais de traction à deux températures distinctes au-dessous et au-dessus de Tg ont été suivis par diffusion des rayons X aux petits (SAXS) et grands angles (WAXS) pour caractériser les déformations à l’échelle des empilements lamellaires et à l’échelle de la maille cristalline. Simultanément, le champ de déformation a été mesurée par corrélation d’images (DIC) afin de comparer la déformation macroscopique et microscopique. Pour les deux températures, les lamelles tendent à s’orienter perpendiculairement à la direction de traction (TD). Ce mécanisme d’orientation local (que nous appelons « modèle de réseau de chaînes ») est induit par la transmission des contraintes par les chaînes amorphes reliant les lamelles cristallines adjacentes. Au-dessus de Tg, l’allongement local est plus faible que l’allongement macroscopique dans les lamelles perpendiculaire à TD, ce qui implique que les lamelles inclinées doivent être cisaillées. L’évolution de la distribution d’orientation des lamelles appuie ce résultat. Une morphologie fortement orientée est finalement obtenue quelle que soit la température. Cependant, le profil d’endommagement est différent. En-dessous de Tg, le profil de diffusion centrale indique l’existence de petites entités (lamelles ou crystallites) orientées aléatoirement. A hautes température, le matériau est fibrillaire et présente des cavités
The aim of this PhD work is accessing the microscopic deformation mechanisms of bulk poly-ether-ether-ketone (PEEK) under tensile stretching. Beforehand, the thermal and mechanical properties of two commercial grades of PEEK were characterized. Tensile specimens were then compression-molded to obtain morphologies as isotropic as possible and characterized below and above the glass transition temperature. Deformations at the scales of lamellar stacks and of the crystalline unit cell have been characterized by small and wide-angle X-ray scattering (SAXS and WAXS) performed in-situ during tensile tests. Simultaneously, the strain field within the samples was followed by digital image correlation (DIC) in order to compare microscopic and macroscopic strains. At both temperatures, lamellae tend to orient perpendicular to the tensile direction (TD). This orientation mechanism (which we denote as ‘Chain Network model’) is driven by the amorphous chains which transmit the stress between adjacent lamellae. The tensile strain in lamellar stacks perpendicular to TD is lower than the macroscopic tensile strain, which must be compensated by increased shear in inclined stacks. Some differences of behavior have been observed depending on the test temperature, especially at high deformation. A highly oriented morphology is ultimately obtained in all cases. However, the central scattering profiles changes with testing temperatures. Below Tg, the presence of small entities randomly oriented is indicated. Above Tg, the material is fibrillar and contains cavities
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Chavez, Castillo Ana Gabriela. "Apport des modèles réduits pour la caractérisation thermique de matériaux de construction : mesures in situ d'isolants et étude multi-échelle d'un bois sec." Thesis, université Paris-Saclay, 2020. http://www.theses.fr/2020UPAST040.

Повний текст джерела
Анотація:
En simulation numérique thermique, le problème inverse consiste à partir de mesures de température, à retrouver un ou plusieurs paramètres de l'équation de la chaleur discrétisée. C'est une procédure complexe qui reste souvent limitée à une géométrie simple. L'idée est alors d'utiliser des modèles réduits thermiques de type modaux, qui vont permettre de diminuer considérablement le nombre d'inconnues tout en maintenant une précision satisfaisante sur l'intégralité du domaine modélisé. Ces modèles vont alors permettre d'étendre la technique des problèmes inverses à tout type de géométrie, quelle que soit sa complexité.L'objectif de ce travail de thèse consiste à évaluer l'efficacité d'une telle méthode pour une application liée à la thermique du bâtiment, dans laquelle on cherche à identifier les propriétés de matériaux isolants (capacité et conductivité thermiques).Le principal travail a été la mise en application de cette technique pour une mesure in situ, via une sonde de type fil chaud, jusqu'ici inadaptée aux isolants thermiques.Une seconde application de cette technique de résolution de problèmes inverses par modèle réduit est la caractérisation d'un matériau bio-sourcé à partir de relevés tomographiques à l'échelle microscopique.Pour ces deux applications, les développements numériques effectués ont permis la réalisation de premiers essais expérimentaux encourageants
In numerical thermal simulation, the inverse problem consists in finding one or more parameters of the discretized heat equation from temperature measurements. This is a complex procedure that often remains limited to simple geometry. The idea is then to use modal-type thermal reduced models, which will considerably reduce the number of unknowns while maintaining satisfactory accuracy over the entire modelled domain. These models will then allow to extend the technique of inverse problems to any type of geometry, whatever its complexity.The objective of this thesis work is to evaluate the efficiency of such a method for an application related to building thermics, in which one seeks to identify the properties of insulating materials (thermal capacity and conductivity).The main work has been the application of this technique for an in situ measurement, using a hot wire probe, which has so far been unsuitable for thermal insulation.A second application of this technique to solve inverse problems by reduced model is the characterization of a bio-sourced material from tomographic surveys at the microscopic scale.For these two applications, the digital developments carried out have allowed the realization of encouraging first experimental trials
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Ben, Hafsia Khaoula. "Identification des micro-mécanismes de déformation du PET amorphe et semi-cristallin in situ au cours d’un essai mécanique." Thesis, Université de Lorraine, 2016. http://www.theses.fr/2016LORR0081/document.

Повний текст джерела
Анотація:
Selon leur formulation et leur mise en forme et grâce à leur complexité microstructurale induite, les polymères thermoplastiques bénéficient d’une grande diversité de propriétés thermomécaniques. Cependant, l’évolution de la microstructure de ces matériaux au cours de leur utilisation reste difficile à identifier. Afin de mieux comprendre les modifications microstructurales ayant lieu au cours de sollicitations thermomécaniques, différentes techniques non destructives de caractérisation en temps réel et in situ ont été développées. Dans ce contexte, un Poly (Ethylène Téréphtalate) (PET) amorphe et semi-cristallin a été étudié afin de mettre en évidence l’effet de la microstructure sur les propriétés macroscopiques du matériau. Pour ce faire, plusieurs couplages de techniques expérimentales de caractérisation ont été mis en œuvre tels que la spectroscopie Raman et la diffraction/diffusion des rayons X couplées au système de VidéoTraction™ ou la spectroscopie Raman couplée à la calorimétrie différentielle à balayage (DSC) pour une caractérisation des micromécanismes de déformation et du comportement thermique du matériau respectivement. Le suivi de différentes bandes vibrationnelles judicieusement identifiées a permis d’établir un nouveau critère robuste et capable de mesurer avec exactitude le taux de cristallinité du matériau ou de remonter aux températures caractéristiques de sa morphologie (Tg, Tc, Tcc, Tf) grâce aux informations extraites d’un spectre Raman. De plus, un système de caractérisation relaxationnelle par un couplage de la spectroscopie diélectrique dynamique avec un essai de traction a été utilisé afin de mettre en évidence l’effet de la mobilité moléculaire sur la déformation élasto-visco-plastique du PET. D’un point de vue mécanique, les principaux micromécanismes de déformation ont été étudiés en temps réel pendant un essai de traction à différentes températures et vitesses de déformation vraies constantes : l’orientation macromoléculaire, l’endommagement volumique, le développement de mésophase et la cristallisation induite sous contrainte, ont été observés et quantifiés in situ en utilisant les couplages précédents au synchrotron Petra III de Hambourg et au synchrotron Elettra de Trieste. En parallèle, une étude de la mobilité moléculaire (paramètre déterminant à la prédominance de tel ou tel micromécanisme de déformation) a été menée via des analyses relaxationnelles réalisées au cours de la déformation du matériau. En complément, des expériences en temps réel, des études post mortem par les techniques précédemment citées et par radiographie X, microscopie électronique à balayage et tomographie X ont été réalisées afin d’apprécier l’influence de la relaxation mécanique du PET
According to their formulations and forming processes and thanks to the complexity of their induced microstructure, thermoplastic polymers show a wide range of thermomechanical properties. However, the identification of the evolution of the microstructure of these materials during their use remains difficult. To better understand the microstructural changes occurring during thermomechanical loadings, various in situ and non-destructive techniques of characterization have been used. In this context, a Poly (Ethylene Terephthalate) (PET) amorphous and semi-crystalline was studied in order to highlight the effect of the microstructure on the macroscopic properties of the material. This way, different coupling systems combining several experimental characterization techniques have been implemented such as Raman spectroscopy and X-rays diffraction/scattering coupled to the VidéoTraction™ system or Raman spectroscopy coupled with differential scanning calorimetry (DSC) for the characterization of the deformation micro-mechanisms and the thermal behavior of the material respectively. Monitoring specific vibrational bands thoroughly identified allowed the establishment of a new robust criterion which enables to accurately measure the crystallinity ratio of the material and the identification of the characteristic temperatures of its morphology (Tg, Tc, Tcc, Tm). In addition, a relaxational characterization system by coupling dynamic dielectric spectroscopy to a tensile test has been used in order to highlight the effect of molecular mobility on the elasto-visco-plastic deformation of PET. From a mechanical point of view, the main deformation micro-mechanisms have been studied in real time during a tensile test at different temperatures and constant true strain rates: macromolecular orientation, volume damage, development of mesophase and strain induced crystallization were observed and quantified in situ using the coupled characterization technics presented previously at Petra III (Hambourg) and Elettra (Trieste) synchrotrons. In parallel, a study of the molecular mobility (a determining parameter for the predominance of one deformation micromechanism to another) was conducted via relaxational analysis performed during the deformation of the material. In addition to in situ experiments, post mortem analysis by the previously mentioned technics and by X radiography, scanning electron microscopy and X tomography were performed to assess the influence of the mechanical relaxation of the polymer
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Chaudemanche, Samuel. "Caractérisation in situ de l'endommagement volumique par Spectroscopie Raman et rayons X de différents polypropylènes déformés en traction uniaxiale." Thesis, Université de Lorraine, 2013. http://www.theses.fr/2013LORR0263/document.

Повний текст джерела
Анотація:
L'utilisation de matériaux polymères a su s'imposer au cours du 20ième siècle, en remplaçant ou se combinant aux matériaux métalliques, pour des applications mécaniques toujours plus techniques. La grande diversité des propriétés physiques des polymères est intimement lié à leur forte complexité microstructurale, qui malgré leur utilisation massive reste, au demeurant, encore très incomprise. Afin de mieux comprendre les évolutions microstructurales aux échelles nano et micrométrique dont résultent le comportement macroscopique il est nécessaire de développer de nouvelles techniques de caractérisation in situ. Ce travail fait état de l'utilisation de la spectroscopie Raman couplée au système VidéoTractionTM afin d'obtenir des informations microstructurales de la déformation de polymère semi-cristallins. Pour cela, des polypropylènes de formulations diverses ont été étudiés, permettant de souligner le rôle joué par la matrice et les charges organiques et minérales dans le processus de déformation plastique. Des mesures in situ de l'orientation des chaînes macromoléculaires déterminées in situ par Raman ont été confirmées, au synchrotron Petra III d'Hambourg, par une expérience couplant le système VidéoTractionTM-Raman à un dispositif de diffusion des rayons X aux grands angles. L'endommagent volumique des matériaux a été étudié post mortem par Tomographie X et radiographie X. Les améliorations apportées au système VidéoTractionTM-Raman ainsi qu'une étude de la diffusion de la lumière incohérente de nos matériaux au cours de leurs déformations ont permis l'établissement d'un critère de mesure de l'endommagement volumique in situ par Raman
The use of polymer materials - replacing or combining with metallic materials - has successfully established itself in the 20th century for increasingly technical mechanical applications. The great diversity of polymers physical properties is closely related to their high microstructural complexity, which is still very misunderstood despite their massive use. The development of new techniques for in situ characterization allows to better understand the microstructural evolutions on nanoscale and micrometer scale which affect the macroscopic behavior. This work report the use of Raman spectroscopy coupled with the VideoTractionTM system in order to obtain information about the microstructural deformation of polymer. Various formulations of polypropylene were studied to highlight the role played by the polypropylene matrix and the organic and mineral fillers in the plastic deformation process. The in situ measures of the macromolecular chains' orientation determined by Raman were confirmed by the performing of an experimental setup coupling the Raman-VideoTractionTM system with a device of Wide angle X-ray scattering. The volume damage of material was studied post mortem using X-ray tomography. The improvements made to VideoTractionTM-Raman system and a study of the incoherent light scattering of our materials enabled the setting of a Raman criterion for measuring in situ the volume damage. The studies carried out to evaluate in situ macromolecular orientation and volume damage highlight the existence of competition between these two processes. The degree of influence of organic and mineral fillers in this competition within the polypropylene matrix was determined
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Babinský, Tomáš. "Rekrystalizace automatové oceli studované technikou in-situ SEM/EBSD." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2018. http://www.nusl.cz/ntk/nusl-378404.

Повний текст джерела
Анотація:
Placing recrystallization annealing in a manufacturing proces is often necessary in order to restore plasticity of worked blanks right before working products to its final shape. For better understanding of processes which are taking place in a material during annealing the use of in-situ techniques is favorable. Such observations enable us to watch changes in the materiál in real time at the original spot. Observations at grain-level are ideally made with scanning electron microscope – SEM by electron back-scattered diffraction – EBSD. The technique makes watching nucleation, growth and potential coarsening of recrystallized grains possible. Special construction of a tensile stage allows us to watch changes of a sample during tensile tests which can be used in observing influence of MnS inclusions on plasticity of free-cutting steels. Materials studied in this work are commonly used free-cutting steel 11SMnPb30 and its lead-free alternative 11SMnBi30.
Стилі APA, Harvard, Vancouver, ISO та ін.
8

COUTINHO, BETANIA RODRIGUES. "CHARACTERIZATION, IN SITU TESTS, FLUORESCENCE." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2002. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=2760@1.

Повний текст джерела
Анотація:
COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIOR
O tema da dissertação, Caracterização de Áreas Contaminadas Através de Ensaios in Situ, aponta o estado-da-arte dos sensores que estão sendo adaptados ao conepenetrômetro, permitindo a detecção e o registro do poluente no subsolo e lençol freático.Talvez como uma conseqüência da atual conscientização da sociedade para o caráter emergencial no enfrentamento dos problemas relacionados à contaminação do subsolo,tem-se exigido uma significativa demanda de serviços especializados na caracterização dos agentes e processos de contaminação e nos procedimentos de remediação. A pesquisa apresenta técnicas de ensaio in situ para a caracterização de áreas contaminadas em função do contaminante que se quer detectar. O primeiro grande grupo abrange as tecnologias utilizadas na detecção dos hidrocarbonetos, em seguida estão agrupadas as técnicas de detecção dos compostos orgânicos voláteis e, finalmente, o terceiro grande grupo enfoca as técnicas utilizadas na detecção de metais pesados.Neste trabalho ensaios foram feitos em duas etapas: com o LIDAR-PUC e com o Fluorímetro, e são apresentados seus resultados, bem como as conclusões da pesquisa e algumas sugestões para estudos futuros, destacando-se as potencialidades e limitações de cada ensaio realizado.
The subject of the research, Characterization of Contaminated Areas by in Situ Tests, shows the state-of-art of the sensors that are being adapted to the conepenetrometer system, allowing for the detection and register of the polluent in the subsurface and water table.Perhaps as a consequence of the new conscientization of the society about the emergencial character in facing problems related to subsurface contamination, it has been claimed such a significative demand forward specialized services in characterization of agents and contamination processes, besides remediation procedures.In situ sampling techniques for the characterization of contaminated areas related to the targeted polluents are presented in this study. The first group covers technologies used in the detection of hydrocarbons, furthermore there are some techniques for the detection of volatiles organic compounds and, finally, the third group focuses the techniques used in the detection of heavy metals. In this work tests were done in two parts: with the LIDAR- PUC and with the Fluorimeter, and their results are presented as well the conclusions of the research and some suggestions for future works, principally the potentialities and limitations of each test done.
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Rølvåg, Line Kathinka Fjellstad. "EBSD undersøkelser og in situ strekktesting av stål i SEM." Thesis, Norges teknisk-naturvitenskapelige universitet, Institutt for materialteknologi, 2012. http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-19246.

Повний текст джерела
Анотація:
Denne masteroppgaven har tatt for seg undersøkelser av stål designet for lavtemperaurappliksjoner ved bruk av elektronmikroskop i kombinasjon med diffraksjon av tilbakespredte elektroner (Electron Backscatter Diffraction - EBSD). Målet med oppgaven var å bruke EBSD-teknikken i kombinasjon med in situ deformasjon og en spesiallaget kaldfinger for å kunne studere materialene ved lave temperaturer. To ulike stål ble undersøkt; et smidd finkornet strukturelt stål (F70) og et varmvalset supermartensittisk rustfritt stål (Supermartensitic Stainless Steel - SMSS).F70-stålet ble sveisesimulert for å oppnå en mikrostruktur tilsvarende interkritisk grovkornet HAZ (Heat Affected Zone). Dette ble gjort ved en tosykel sveisesimulering. Prøvestaver av materialet ble varmet opp med en ønsket makstempertur på Tp1= 1350°C og Tp2= 780°C. For å undersøke effekten av ulike avkjølingshastigheter ble halvparten av prøvestavene avkjølt med Dt8/5 = 5 sekund, og den andre halvparten med Dt8/5 = 15 sekund. Ved sveising av stål kan det dannes lokale sprø soner som martensitt/austenitt-faser (MA-faser). Bilder tatt i lysmikroskop viser at strukturen til sveisesimulert F70-stål består av martensitt og noe bainitt. MA-faser er lokalisert langs korngrensene.EBSD-teknikken krever at materialet på forhånd gjennomgår en tilfredsstillende prøvepreparering for å gi gode resultater. Det var tidligere etablert en tilfredsstillende prepareringsteknikk for SMSS. I denne oppgaven ble to ulike prepareringsmetoder testet på sveisesimulerte prøver av F70-stål, som er et forholdsvis nytt materiale. Metodene som ble testet var ionesputtering og elektropolering. Preparerte prøver ble undersøkt med EBSD for å analysere kvaliteten på prepareringen. Det viste seg at MA-fasene reagerte annerledes på prepareringen enn resten av strukturen, og det var derfor vanskelig å få disse fram på EBSD-skann. De to prepareringsmetodene ga også forskjellige utfall for andel austenitt (g-fase) i stålet. Da det i hovedsak er MA-fasene som er interessante ved in situ undersøkelser ble det besluttet å ikke gjennomføre disse på F70-stålet, da en tilfredsstillende preparering må etableres først. Ved bruk av EBSD-teknikken kan orienteringsdataene som lagres behandles i programvaren TSL OIM Analysis 5.32, som tilbyr ulike renseoperasjoner. Grain CI Standarization gir alle punktene i et korn, innenfor en gitt vinkeltoleranse, samme CI-verdi som den maksimale CI-verdien funnet blant punktene i dette kornet. Det er også mulig å legge på et CI-filter som fjerner alle punkter med en CI ≤ 0,05, og erstatter disse med svarte eller grå piksler. Effekten av disse to operasjonene ble undersøkt på et EBSD-skann av SMSS tatt ved romtemperatur, uten noe form for deformasjon. Renseoperasjonene førte til at 8,1 % av alle punkter ble fjernet. 3,8 % av disse var av g-fasen, som utgjør kun 17,3 % av skannet før renseoperasjonene ble benyttet. Punkter som fjernes ligger i hovedsak i forbindelse med korngrenser eller øyer av restaustenitt. For SMSS som inneholder rundt 20 vol.% restaustenitt i opprinnelig (dvs. interkristisk glødet) tilstand, ble det gjennomført undersøkelser av deformasjonsindusert fasetransformasjon ved bruk av in situ strekktesting med påfølgende EBSD karakterisering. Undersøkelsene ble utført ved romtemperatur og -80°C. Et spesiallaget strekkbord ble montert på SEM (Scanning Electron Microscope) stagen med prøven fastmontert, og en kaldfinger ble brukt for å kjøle ned prøven. EBSD karakteriseringen ble foretatt uten deformasjon og ved 1, 2, 3 og 4 % forlengelse. En sammenligning av resultatene ved romtemperatur og -80°C ble deretter utført. Det ble konkludert med at øyer av restaustenitt transformeres til martensitt som følge av plastisk deformasjon i større grad ved -80°C, som følge av høyere termodynamiske drivkrefter for reaksjonen. Ved romtemperatur var det mulig å verifisere at martensitten som ble dannet oppfyller Kurdjomov-Sachs kriteriet som beviser at den er korrekt indisert. Dette var vanskelig å verifisere for lavtemperatursforsøkene, da skannene har en mye lavere kvalitet.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Kirch, Dirk Michael. "In-situ SEM investigation of individual and connected grain boundaries in aluminum /." Göttingen : Cuvillier, 2008. http://d-nb.info/988571765/04.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
Більше джерел

Книги з теми "In situ SEM characterization"

1

Ziegler, Alexander, Heinz Graafsma, Xiao Feng Zhang, and Joost W. M. Frenken, eds. In-situ Materials Characterization. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-45152-2.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

name, No. In-situ characterization of soils. Lisse: Balkema, 2001.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

name, No. In-situ characterization of rocks. Lisse: Balkema, 2002.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Kumar, Challa S. S. R., ed. In-situ Characterization Techniques for Nanomaterials. Berlin, Heidelberg: Springer Berlin Heidelberg, 2018. http://dx.doi.org/10.1007/978-3-662-56322-9.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Rodriguez, José A., Jonathan C. Hanson, and Peter J. Chupas, eds. In-situ Characterization of Heterogeneous Catalysts. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118355923.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

D, Abruña Héctor, ed. Electrochemical interfaces: Modern techniques for in-situ interface characterization. New York: VCH Pub., 1991.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

S, Ameen Mohammed, and Geological Society of London, eds. Fracture and in-situ stress characterization of hydrocarbon reservoirs. London: Geological Society, 2003.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Brüning, Karsten. In-situ Structure Characterization of Elastomers during Deformation and Fracture. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-06907-4.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

M, Fanconi B., United States. Army Research Office., and United States. National Bureau of Standards., eds. In-situ characterization of the interface of glass reinforced composites. [Gaithersburg, MD]: U.S. Dept. of Commerce, National Bureau of Standards, 1987.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

M, Fanconi B., United States. Army Research Office, and United States. National Bureau of Standards, eds. In-situ characterization of the interface of glass reinforced composites. [Gaithersburg, MD]: U.S. Dept. of Commerce, National Bureau of Standards, 1987.

Знайти повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
Більше джерел

Частини книг з теми "In situ SEM characterization"

1

Garcı́a, D. Morán, E. Garfias-Garcı́a, and J. D. Muñoz-Andrade. "Determination of the Activation Energy of Copper During In Situ Tension Testing by SEM." In Characterization of Metals and Alloys, 49–59. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-31694-9_5.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Pockwinse, Shirwin M., Prachi N. Ghule, and Anne Higgins. "Characterization of Human Embryonic Stem Cells by Cytogenetics: Karyotyping and Fluorescence In Situ Hybridization." In Human Stem Cell Technology and Biology, 199–208. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2010. http://dx.doi.org/10.1002/9780470889909.ch17.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Sateesh Kumar, Ch, M. Muralidhar Singh, and Ram Krishna. "Scanning Electron Microscope (SEM)." In Advanced Materials Characterization, 49–59. Boca Raton: CRC Press, 2023. http://dx.doi.org/10.1201/9781003340546-6.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Duperron, Sébastien. "Characterization of Bacterial Symbionts in Deep-Sea Fauna: Protocols for Sample Conditioning, Fluorescence In Situ Hybridization, and Image Analysis." In Springer Protocols Handbooks, 343–62. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/8623_2015_73.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Nebe, Martin. "In situ characterization methodology." In In Situ Characterization Methodology for the Design and Analysis of Composite Pressure Vessels, 51–80. Wiesbaden: Springer Fachmedien Wiesbaden, 2022. http://dx.doi.org/10.1007/978-3-658-35797-9_4.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Datye, Abhaya, and Andrew DeLaRiva. "Scanning Electron Microscopy (SEM)." In Springer Handbook of Advanced Catalyst Characterization, 359–80. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-07125-6_18.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Chergui, Majed. "In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy." In In-situ Materials Characterization, 1–38. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-45152-2_1.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Vonk, Vedran, and Heinz Graafsma. "In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources." In In-situ Materials Characterization, 39–58. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-45152-2_2.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Zhang, Xiao Feng. "In-situ Transmission Electron Microscopy." In In-situ Materials Characterization, 59–109. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-45152-2_3.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Ziegler, Alexander. "Ultrafast Transmission Electron Microscopy and Electron Diffraction." In In-situ Materials Characterization, 111–45. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-45152-2_4.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.

Тези доповідей конференцій з теми "In situ SEM characterization"

1

Bi, Jiawei, Xuecheng Yu, Hui Zhang, Junhao Liu, Jia Du, Pengli Zhu, Gang Li, and Rong Sun. "Study on the Effect of Fillers on Hygrothermal Properties of Underfill via in-Situ SEM-DIC Characterization." In 2024 25th International Conference on Electronic Packaging Technology (ICEPT), 1–5. IEEE, 2024. http://dx.doi.org/10.1109/icept63120.2024.10668573.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Cossu, F., E. Makarova, A. S. Rabaneda, M. Portabella, J. Tenerelli, N. Reul, A. Stoffelen, et al. "Error Characterization of In Situ, Satellite, and Synergistic Sea Surface Wind Products Under Tropical Cyclone Conditions." In IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium, 5810–13. IEEE, 2024. http://dx.doi.org/10.1109/igarss53475.2024.10640615.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Neuman, Jan, Radek Dao, Ondřej Novotný, Vojtěch Schánilec, Veronika Hegrová, Libor Strakoš, Tomáš Vystavěl, and Umberto Celano. "In-situ Correlative AFM-SEM Characterization for Failure Analysis." In ISTFA 2023. ASM International, 2023. http://dx.doi.org/10.31399/asm.cp.istfa2023tpl1.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Johnson, Gregory M., and Frank Hitzel. "AFM in SEM for Device Characterization and Defect Localization." In ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022p0438.

Повний текст джерела
Анотація:
Abstract The results of analyses on a commercially available 7 nm SRAM, using an in-situ AFM inside a SEM, are presented. In addition to typical results for conductive AFM, a novel method is described that uses the SEM beam to prepare a region for additional material removal, thus bringing out clearer electrical data. This would be of exceptional value for technology nodes using cobalt as a contact material. Finally, techniques making use of the current from the SEM beam as the source of current during the measurement are described. The technique may have value for well resistance measurements using in-situ structures on live product, a survey of junction health, or the localization of point defects.
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Lee, Gyujei, Min-jae Choi, Suk-woo Jeon, Kwang-yoo Byun, and Dongil Kwon. "Microstructure and stress characterization around TSV using in-situ PIT-in-SEM." In 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC). IEEE, 2012. http://dx.doi.org/10.1109/ectc.2012.6248921.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Young, Richard J., Michael P. Bernas, Mary V. Moore, Young-Chung Wang, Jay P. Jordan, Ruud Schampers, and Ian van Hees. "In-Situ Sample Preparation and High-Resolution SEM-STEM Analysis." In ISTFA 2004. ASM International, 2004. http://dx.doi.org/10.31399/asm.cp.istfa2004p0331.

Повний текст джерела
Анотація:
Abstract The dual-beam system, which combines a high-resolution scanning electron microscope (SEM) with a focused ion beam (FIB), allows sample preparation, imaging, and analysis to be accomplished in a single tool. This paper discusses how scanning transmission electron microscopy (STEM) with the electron beam enhances the analysis capabilities of the dualbeam. In particular, it shows how, using the combination of in-situ sample preparation and integrated SEM-STEM imaging, more failure analysis and characterization problems can be solved in the dual-beam without needing to use the Ångstrom-level capabilities of the transmission electron microscope (TEM).
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Yaglioglu, Onnik, Treliant Fang, Rod Martens, and Ben Eldridge. "Electroless silver plating and in-situ SEM characterization of CNT-metal hybrid contactors." In 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm). IEEE, 2014. http://dx.doi.org/10.1109/holm.2014.7031077.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Ahmad, Mohd Ridzuan, Masahiro Nakajima, Seiji Kojima, Michio Homma, and Toshio Fukuda. "In-situ single cell mechanical characterization of W303 Yeast cells inside Environmental-SEM." In 2007 7th IEEE Conference on Nanotechnology (IEEE-NANO). IEEE, 2007. http://dx.doi.org/10.1109/nano.2007.4601357.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Lemang, Mathilde. "In-situ heating and microstructural characterization using state of the art SEM-TKD stage." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.440.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Kim, Taeyong, Soyeon Park, Vasudevan Iyer, Qi Jiang, Usama Choudhry, Basamat Shaheen, Gage Eichman, et al. "In Situ Characterization of Photo-induced Ion Migration in Hybrid Perovskites." In CLEO: Science and Innovations. Washington, D.C.: Optica Publishing Group, 2023. http://dx.doi.org/10.1364/cleo_si.2023.sm3f.4.

Повний текст джерела
Анотація:
We characterize photo-induced ion migration in hybrid perovskites using in situ laser illumination inside an SEM. We observed long-range migration of halide ions and elucidated the transport pathways of various ions.
Стилі APA, Harvard, Vancouver, ISO та ін.

Звіти організацій з теми "In situ SEM characterization"

1

Cook, Samantha, Matthew Bigl, Sandra LeGrand, Nicholas Webb, Gayle Tyree, and Ronald Treminio. Landform identification in the Chihuahuan Desert for dust source characterization applications : developing a landform reference data set. Engineer Research and Development Center (U.S.), October 2022. http://dx.doi.org/10.21079/11681/45644.

Повний текст джерела
Анотація:
ERDC-Geo is a surface erodibility parameterization developed to improve dust predictions in weather forecasting models. Geomorphic landform maps used in ERDC-Geo link surface dust emission potential to landform type. Using a previously generated southwest United States landform map as training data, a classification model based on machine learning (ML) was established to generate ERDC-Geo input data. To evaluate the ability of the ML model to accurately classify landforms, an independent reference landform data set was created for areas in the Chihuahuan Desert. The reference landform data set was generated using two separate map-ping methodologies: one based on in situ observations, and another based on the interpretation of satellite imagery. Existing geospatial data layers and recommendations from local rangeland experts guided site selections for both in situ and remote landform identification. A total of 18 landform types were mapped across 128 sites in New Mexico, Texas, and Mexico using the in situ (31 sites) and remote (97 sites) techniques. The final data set is critical for evaluating the ML-classification model and, ultimately, for improving dust forecasting models.
Стилі APA, Harvard, Vancouver, ISO та ін.
2

Lei, Jinglei, Lingjie Li, Robert Kostecki, Rolf Muller, and Frank McLarnon. Characterization of SEI layers on LiMn2O4 cathodes with in-situ spectroscopic ellipsometry. Office of Scientific and Technical Information (OSTI), August 2004. http://dx.doi.org/10.2172/837416.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
3

Frazer, David, Joshua White, Tarik Saleh, and Stuart Maloy. In-Situ SEM Irradiation Enhanced Creep Studies of 14 YWT. Office of Scientific and Technical Information (OSTI), October 2021. http://dx.doi.org/10.2172/1827678.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
4

Mook, William, Jon K. Baldwin, Ricardo M. Martinez, and Nathan A. Mara. SEM in situ MiniCantilever Beam Bending of U-10Mo/Zr/Al Fuel Elements. Office of Scientific and Technical Information (OSTI), June 2014. http://dx.doi.org/10.2172/1134776.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
5

Chen, Wei-Ying, Yiren Chen, Peter Baldo, Lin Gao, Dzmitry Harbaruk, and Josh Hlavenka. In-situ and ex-situ characterization of irradiated AM materials. Office of Scientific and Technical Information (OSTI), September 2024. http://dx.doi.org/10.2172/2447070.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
6

Chen, Wei-Ying, Yiren Chen, Peter Baldo, Josh Hlavenka, and Dzmitry Harbaruk. In-situ and ex-situ characterization of ion-irradiated AM materials. Office of Scientific and Technical Information (OSTI), July 2023. http://dx.doi.org/10.2172/1992453.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
7

Thundat, Thomas G., Zhiyu Hu, Gilbert M. Brown, and Baohua Gu. Microcantilever Sensors for In-Situ Subsurface Characterization. Office of Scientific and Technical Information (OSTI), June 2006. http://dx.doi.org/10.2172/895615.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
8

Tiku, Pussegoda, and Luffman. L52031 In-Situ Pipeline Mechanical Property Characterization. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), June 2003. http://dx.doi.org/10.55274/r0011133.

Повний текст джерела
Анотація:
The focus in the present study was to establish whether there is a reasonable correlation between the Charpy Vee Notch (CVN) toughness and the non-destructive Potential Difference (PD) measurements of ferritic-pearlitic steels having a range of CVN toughness values. Complete material characterization was carried out for six steels procured for this program. The characterization included chemical analysis, microstructural information, tensile properties and CVN transition curves. In addition, most of the data including the CVN transition curves were available for five suitable pipe line steels from a recent publication in the literature.
Стилі APA, Harvard, Vancouver, ISO та ін.
9

Clark, Hart, and Beavers. L52030 In-Situ Pipeline Mechanical Property Characterization. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), March 2005. http://dx.doi.org/10.55274/r0011148.

Повний текст джерела
Анотація:
The objective of this program is to identify reliable, field applicable nondestructive test methods that can be used for estimating the yield strength, tensile strength, and fracture toughness of line pipe steels. This will include the proper procedures and limitations for the equipment identified. Since a majority of the pipe that may not be properly documented is from older lines, this program is focused on Grade X60 or lower material.
Стилі APA, Harvard, Vancouver, ISO та ін.
10

Tweedale, F., J. J. Hanley, D. J. Kontak, and N. Rogers. Methodology for solute characterization of fluid inclusions by petrographic and SEM/EDS complementary analysis. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2015. http://dx.doi.org/10.4095/296495.

Повний текст джерела
Стилі APA, Harvard, Vancouver, ISO та ін.
Також вас можуть зацікавити розширені добірки на тему "In situ SEM characterization" для конкретних типів джерел:
Статті в журналах Дисертації Книги
Ми пропонуємо знижки на всі преміум-плани для авторів, чиї праці увійшли до тематичних добірок літератури. Зв'яжіться з нами, щоб отримати унікальний промокод!

До бібліографії