Добірка наукової літератури з теми "Gallium nitrate"
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Статті в журналах з теми "Gallium nitrate"
Hughes, Thomas E., and Lea Ann Hansen. "Gallium Nitrate." Annals of Pharmacotherapy 26, no. 3 (March 1992): 354–62. http://dx.doi.org/10.1177/106002809202600310.
Повний текст джерелаTodd, Peter A., and Andrew Fitton. "Gallium Nitrate." Drugs 42, no. 2 (August 1991): 261–73. http://dx.doi.org/10.2165/00003495-199142020-00007.
Повний текст джерелаChitambar, Christopher R. "Gallium nitrate revisited." Seminars in Oncology 30, no. 2 Suppl 5 (April 2003): 1–4. http://dx.doi.org/10.1016/s0093-7754(03)00169-6.
Повний текст джерелаWarrell, R. P., D. Lovett, F. A. Dilmanian, R. Schneider, and R. T. Heelan. "Low-dose gallium nitrate for prevention of osteolysis in myeloma: results of a pilot randomized study." Journal of Clinical Oncology 11, no. 12 (December 1993): 2443–50. http://dx.doi.org/10.1200/jco.1993.11.12.2443.
Повний текст джерелаCsaky, Karl G., and Rafael C. Caruso. "Gallium Nitrate Optic Neuropathy." American Journal of Ophthalmology 124, no. 4 (October 1997): 567–68. http://dx.doi.org/10.1016/s0002-9394(14)70881-5.
Повний текст джерелаHo, D. H., J. R. Lin, N. S. Brown, and R. A. Newman. "Bioavailability of gallium nitrate." European Journal of Pharmacology 183, no. 4 (July 1990): 1200. http://dx.doi.org/10.1016/0014-2999(90)94293-7.
Повний текст джерелаWarrell, R. P., W. K. Murphy, P. Schulman, P. J. O'Dwyer, and G. Heller. "A randomized double-blind study of gallium nitrate compared with etidronate for acute control of cancer-related hypercalcemia." Journal of Clinical Oncology 9, no. 8 (August 1991): 1467–75. http://dx.doi.org/10.1200/jco.1991.9.8.1467.
Повний текст джерелаVenkatachalam, Taracad K., Paul V. Bernhardt, Damion H. R. Stimson, Gregory K. Pierens, Rajiv Bhalla, and David C. Reutens. "A Novel Strategy to Introduce 18F, a Positron Emitting Radionuclide, into a Gallium Nitrate Complex: Synthesis, NMR, X-Ray Crystal Structure, and Preliminary Studies on Radiolabelling with 18F." Australian Journal of Chemistry 71, no. 3 (2018): 81. http://dx.doi.org/10.1071/ch17334.
Повний текст джерелаLi, Lei, Hao Chang, Nie Yong, Meixi Li, Yi Hou, and Wei Rao. "Superior antibacterial activity of gallium based liquid metals due to Ga3+ induced intracellular ROS generation." Journal of Materials Chemistry B 9, no. 1 (2021): 85–93. http://dx.doi.org/10.1039/d0tb00174k.
Повний текст джерелаGoodley, Paul H., and Moshe Rogosnitzky. "The Effect of Gallium Nitrate on Arresting Blood Flow from a Wound." Case Reports in Medicine 2011 (2011): 1–3. http://dx.doi.org/10.1155/2011/819710.
Повний текст джерелаДисертації з теми "Gallium nitrate"
Stern, Lawrence S. "Studies on the effects of gallium nitrate on rat bone /." The Ohio State University, 1993. http://rave.ohiolink.edu/etdc/view?acc_num=osu1487842372894675.
Повний текст джерелаCrawford, Jessica F. "Using room-temperature liquid metals as a new reaction environment." Thesis, Queensland University of Technology, 2022. https://eprints.qut.edu.au/232783/1/Jessica_Crawford_Thesis.pdf.
Повний текст джерелаLi, Ting. "Gallium nitride and aluminum gallium nitride-based ultraviolet photodetectors /." Digital version accessible at:, 2000. http://wwwlib.umi.com/cr/utexas/main.
Повний текст джерелаMuensit, Supasarote. "Piezoelectric coefficients of gallium arsenide, gallium nitride and aluminium nitride." Phd thesis, Australia : Macquarie University, 1999. http://hdl.handle.net/1959.14/36187.
Повний текст джерелаThesis (PhD)--Macquarie University, School of Mathematics, Physics, Computing and Electronics, 1999.
Includes bibliographical references.
Introduction -- A Michelson interferometer for measurement of piezoelectric coefficients -- The piezoelectric coefficient of gallium arsenide -- Extensional piezoelectric coefficients of gallium nitrides and aluminium nitride -- Shear piezoelectric coefficients of gallium nitride and aluminium nitride -- Electrostriction in gallium nitride, aluminium nitride and gallium arsenide -- Summary and prognosis.
The present work represents the first use of the interferometric technique for determining the magnitude and sign of the piezoelectric coefficients of III-V compound semiconductors, in particular gallium arsenide (GaAs), gallium nitride (GaN), and aluminium nitride (AIN). The interferometer arrangement used in the present work was a Michelson interferometer, with the capability of achieving a resolution of 10⁻¹³ m. -- The samples used were of two types. The first were commercial wafers, with single crystal orientation. Both GaAs and GaN were obtained in this form. The second type of sample was polycrystalline thin films, grown in the semiconductor research laboratories at Macquarie University. GaN and AIN samples of this type were obtained. -- The d₁₄ coefficient of GaAs was measured by first measuring the d₃₃ value of a [111] oriented sample. This was then transformed to give the d₁₄ coefficient of the usual [001] oriented crystal. The value obtained for d₁₄ was (-2.7 ± 0.1) pmV⁻¹. This compares well with the most recent reported measurements of -2.69 pmV⁻¹. The significance of the measurement is that this represents the first time this coefficient has been measured using the inverse piezoelectric effect. -- For AIN and GaN samples, the present work also represents the first time their piezoelectric coefficients have been measured by interferometry. For GaN, this work presents the first reported measurements of the piezoelectric coefficients, and some of these results have recently been published by the (Muensit and Guy, 1998). The d₃₃ and d₃₁ coefficients for GaN were found to be (3.4 ± 0.1) pmV⁻¹ and (-1.7 ± 0.1) pmV⁻¹ respectively. Since these values were measured on a single crystal wafer and have been corrected for substrate clamping, the values should be a good measure of the true piezoelectric coefficients for bulk GaN. -- For AIN, the d₃₃ and d₃₁ coefficients were found to be (5.1 ± 0.2) pmV⁻¹, and (-2.6 ± 0.1) pmV⁻¹ respectively. Since these figures are measured on a polycrystalline sample it is quite probable that the values for bulk AIN would be somewhat higher.
The piezoelectric measurements indicate that the positive c axis in the nitride films points away from the substrate. The piezoelectric measurements provide a simple means for identifying the positive c axis direction. -- The interferometric technique has also been used to measure the shear piezoelectric coefficient d₁₅ for AIN and GaN. This work represents the first application of this technique to measure this particular coefficient. The d₁₅ coefficients for AIN and GaN were found to be (-3.6 ± 0.1) pmV⁻¹ and (-3.1 ± 0.1) pmV⁻¹ respectively. The value for AIN agrees reasonably well with the only reported value available in the literature of -4.08 pmV⁻¹. The value of this coefficient for GaN has not been measured. -- Some initial investigations into the phenomenon of electrostriction in the compound semiconductors were also performed. It appears that these materials have both a piezoelectric response and a significant electrostrictive response. For the polycrystalline GaN and AIN, the values of the M₃₃ coefficients are of the order of 10⁻¹⁸ m²V⁻². The commercial single crystal GaN and GaAs wafers display an asymmetric response which cannot be explained.
Mode of access: World Wide Web.
Various pagings ill
Cheng, Chung-choi, and 鄭仲材. "Positron beam studies of fluorine implanted gallium nitride and aluminium gallium nitride." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2009. http://hub.hku.hk/bib/B43278577.
Повний текст джерелаCheng, Chung-choi. "Positron beam studies of fluorine implanted gallium nitride and aluminium gallium nitride." Click to view the E-thesis via HKUTO, 2009. http://sunzi.lib.hku.hk/hkuto/record/B43278577.
Повний текст джерелаPopa, Laura C. "Gallium nitride MEMS resonators." Thesis, Massachusetts Institute of Technology, 2015. http://hdl.handle.net/1721.1/99296.
Повний текст джерелаCataloged from PDF version of thesis.
Includes bibliographical references (pages 187-206).
As a wide band-gap semiconductor, with large breakdown fields and saturation velocities, Gallium Nitride (GaN) has been increasingly used in high-power, high-frequency electronics and monolithic microwave integrated circuits (MMICs). At the same time, GaN also has excellent electromechanical properties, such as high acoustic velocities and low elastic losses. Together with a strong piezoelectric coupling, these qualities make GaN ideal for RF MEMS resonators. Hence, GaN technology offers a platform for the seamless integration of low-loss, piezoelectric RF MEMS resonators with high power, high frequency electronics. Monolithic integration of MEMS resonators with ICs would lead to reduced parasitics and matching constraints, enabling high-purity clocks and frequency-selective filters for signal processing and high-frequency wireless communications. This thesis highlights the physics and resonator design considerations that must be taken into account in a monolithically integrated solution. We then show devices that achieve the highest frequency-quality factor product in GaN resonators to date (1.56 x 1013). We also highlight several unique transduction mechanisms enabled by this technology, such as the ability to use the 2D electron gas (2DEG) channel of High Electron Mobility Transistors (HEMTs) as an electrode for transduction. This enables a unique out-of-line switching capability which allowed us to demonstrate the first DC switchable solid-state piezoelectric resonator. Finally, we discuss the benefits of using active HEMT sensing of the mechanical signal when scaling to GHz frequencies, which enabled the highest frequency lithographically defined resonance reported to date in GaN (3.5 GHz). These demonstrated features sh
by Laura C. Popa.
Ph. D.
Allums, Kimberly K. "Proton radiation and thermal stabilty [sic] of gallium nitride and gallium nitride devices." [Gainesville, Fla.] : University of Florida, 2006. http://purl.fcla.edu/fcla/etd/UFE0013123.
Повний текст джерелаHolmes, Kenneth L. "Two-dimensional modeling of aluminum gallium nitride/gallium nitride high electron mobility transistor." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 2002. http://library.nps.navy.mil/uhtbin/hyperion-image/02Jun%5FHolmes.pdf.
Повний текст джерелаMareš, Petr. "Depozice Ga a GaN nanostruktur na křemíkový a grafenový substrát." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2014. http://www.nusl.cz/ntk/nusl-231443.
Повний текст джерелаКниги з теми "Gallium nitrate"
Gallium nitride electronics. Berlin: Springer, 2008.
Знайти повний текст джерела1922-, Pankove Jacques I., Moustakas T. D, and Willardson Robert K, eds. Gallium nitride (GaN) II. San Diego: Academic Press, 1999.
Знайти повний текст джерелаTechnology of gallium nitride crystal growth. Heidelberg: Springer, 2010.
Знайти повний текст джерелаFeenstra, Randall M., and Colin E. C. Wood, eds. Porous Silicon Carbide and Gallium Nitride. Chichester, UK: John Wiley & Sons, Ltd, 2008. http://dx.doi.org/10.1002/9780470751817.
Повний текст джерелаEhrentraut, Dirk, Elke Meissner, and Michal Bockowski, eds. Technology of Gallium Nitride Crystal Growth. Berlin, Heidelberg: Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-04830-2.
Повний текст джерелаInternational Conference on Nitride Semiconductors (4th 2001 Denver, Colo.). ICNS-4: Fourth International Conference on Nitride Semiconductors, Denver, Colorado, USA, 2001 : proceedings. Berlin: Wiley-VCH, 2002.
Знайти повний текст джерелаConference on Semiconducting and Insulating Materials (9th 1996 Toulouse, France). Semiconducting and insulating materials 1996: Proceedings of the 9th Conference on Semiconducting and Insulating Materials (SIMC'9), April 29/May 3, 1996, Toulouse, France. New York: Institute of Electrical and Electronics Engineers, 1996.
Знайти повний текст джерелаB, Gil, ed. Low-dimensional nitride semiconductors. Oxford: Oxford University Press, 2002.
Знайти повний текст джерелаInternational, Workshop on Nitride Semiconductors (2000 Nagoya Japan). IWN Nagoya 2000: International Workshop on Nitride Semiconductors : IWN2000 : September 24-27, 2000, Nagoya Congress Center, Nagoya, Japan. Tokyo: Institute of Pure and Applied Physics, 2000.
Знайти повний текст джерелаA, Ponce Fernando, ed. Gallium nitride and related materials: The First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1996.
Знайти повний текст джерелаЧастини книг з теми "Gallium nitrate"
Chitambar, Christopher R. "Gallium Nitrate, Apoptotic Effects." In Encyclopedia of Metalloproteins, 807–12. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-1533-6_112.
Повний текст джерелаKoudrine, A. V., and A. V. Skalny. "Gallium Nitrate and Zinc Content in Peripheral Blood Lymphocytes of Patients with Lung Cancer." In Trace Elements in Man and Animals 10, 640. New York, NY: Springer US, 2002. http://dx.doi.org/10.1007/0-306-47466-2_207.
Повний текст джерелаLinares, R. C., and R. M. Ware. "Gallium Nitride." In Inorganic Reactions and Methods, 202. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2007. http://dx.doi.org/10.1002/9780470145227.ch146.
Повний текст джерелаSchoonmaker, Richard C., Claudia E. Burton, J. Lundstrom, and J. L. Margrave. "Gallium (III) Nitride." In Inorganic Syntheses, 16–18. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2007. http://dx.doi.org/10.1002/9780470132388.ch5.
Повний текст джерелаBin, Dong. "9 The Packaging Technologies for GaN HEMTs." In Gallium Nitride Power Devices, 261–80. CRC Press Taylor & Francis Group 6000 Broken Sound Parkway NW, Suite 300 Boca Raton, FL 33487-2742: CRC Press, 2017. http://dx.doi.org/10.1201/9781315196626-10.
Повний текст джерелаFeenstra, R. M., and S. W. Hla. "2.3.7 GaN, Gallium Nitride." In Physics of Solid Surfaces, 52–53. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-47736-6_24.
Повний текст джерелаKinski, Isabel, and Paul F. McMillan. "Gallium Nitride and Oxonitrides." In Ceramics Science and Technology, 91–130. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2010. http://dx.doi.org/10.1002/9783527631735.ch3.
Повний текст джерелаKinski, Isabel, and Paul F. McMillan. "Gallium Nitride and Oxonitrides." In Ceramics Science and Technology, 91–130. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2014. http://dx.doi.org/10.1002/9783527631940.ch15.
Повний текст джерелаChowdhury, Srabanti. "Vertical Gallium Nitride Technology." In Power Electronics and Power Systems, 101–21. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-43199-4_5.
Повний текст джерелаKhandelwal, Sourabh. "Gallium Nitride Semiconductor Devices." In Advanced SPICE Model for GaN HEMTs (ASM-HEMT), 1–8. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-77730-2_1.
Повний текст джерелаТези доповідей конференцій з теми "Gallium nitrate"
Adamcakova-Dodd, Andrea, Jessica M. Magwood, Jong Sung Kim, Kevin M. Kelly, Pradeep K. Singh, and Peter S. Thorne. "Toxicity Assessment Of Gallium Nitrate Inhalation Using Murine Model." In American Thoracic Society 2010 International Conference, May 14-19, 2010 • New Orleans. American Thoracic Society, 2010. http://dx.doi.org/10.1164/ajrccm-conference.2010.181.1_meetingabstracts.a6266.
Повний текст джерелаMyers, M., A. Podolska, T. Pope, F. M. L. Khir, B. D. Nener, M. V. Baker, and G. Parish. "8.1.5 Nitrate-selective gallium nitride transistor-based ion sensors with low detection limit." In 14th International Meeting on Chemical Sensors - IMCS 2012. AMA Service GmbH, Von-Münchhausen-Str. 49, 31515 Wunstorf, Germany, 2012. http://dx.doi.org/10.5162/imcs2012/8.1.5.
Повний текст джерелаYu, Quanmao. "Study on the Preparation Technology for High Pure Gallium Nitrate." In First International Conference on Information Sciences, Machinery, Materials and Energy. Paris, France: Atlantis Press, 2015. http://dx.doi.org/10.2991/icismme-15.2015.100.
Повний текст джерелаNovick, Steven, Lieven J. Dupont, Yves Baert, and Raymond P. Warrell. "Abstract 1678: Systemic gallium nitrate therapy results in sustained sputum concentrations that may be therapeutic for biofilm-associated pulmonary bacterial infections." In Proceedings: AACR 101st Annual Meeting 2010‐‐ Apr 17‐21, 2010; Washington, DC. American Association for Cancer Research, 2010. http://dx.doi.org/10.1158/1538-7445.am10-1678.
Повний текст джерелаCatalin Sburlan, Ion, Ionut Vasile, and Emil Tudor. "Comparative study between semiconductor power devices based on silicon Si, silicon carbide SiC and gallium nitrate GaN used in the electrical system subassembly of an electric vehicle." In 2021 International Semiconductor Conference (CAS). IEEE, 2021. http://dx.doi.org/10.1109/cas52836.2021.9604127.
Повний текст джерелаBACH, LEONARDO CASSOL, CASSIANO RECH, and ALESSANDRO LUIZ BATSCHAUER. "Análise do Conversor Totem Pole para Correção do Fator de Potência utilizando Semicondutores de Nitreto de Gálio (GaN)." In Seminar on Power Electronics and Control (SEPOC 2021). sepoc, 2021. http://dx.doi.org/10.53316/sepoc2021.016.
Повний текст джерелаWu, Tsung Han, Zhe Chuan Feng, Fangfei Li, Chung Cherng Lin, Ian Ferguson, Ray Hua Horng, Weijie Lu, P. M. Champion, and L. D. Ziegler. "Brillouin scattering studies of gallium nitride and Indium gallium nitride." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482346.
Повний текст джерелаMartin, Kevin N. "European gallium nitride capability." In 2015 IEEE International Radar Conference (RadarCon). IEEE, 2015. http://dx.doi.org/10.1109/radar.2015.7131004.
Повний текст джерелаLi, Changyi, Antonio Hurtado, Jeremy B. Wright, Huiwen Xu, Sheng Liu, Ting S. Luk, Igal Brener, Steven R. Brueck, and George T. Wang. "Gallium Nitride Nanotube Lasers." In CLEO: Science and Innovations. Washington, D.C.: OSA, 2014. http://dx.doi.org/10.1364/cleo_si.2014.sw1g.3.
Повний текст джерела"Front Matter: Volume 10532." In Gallium Nitride Materials and Devices XIII, edited by Jen-Inn Chyi, Hadis Morkoç, and Hiroshi Fujioka. SPIE, 2018. http://dx.doi.org/10.1117/12.2323347.
Повний текст джерелаЗвіти організацій з теми "Gallium nitrate"
Harris, J. S. Bulk Gallium Nitride Growth. Fort Belvoir, VA: Defense Technical Information Center, September 1998. http://dx.doi.org/10.21236/ada353635.
Повний текст джерелаHeikman, Sten J., and Umesh K. Mishra. System for Bulk Growth of Gallium Nitride. Vapor Phase Epitaxy of Gallium Nitride by Gallium Arc Evaporation. Fort Belvoir, VA: Defense Technical Information Center, March 2005. http://dx.doi.org/10.21236/ada464611.
Повний текст джерелаSkowronski, M. Deposition of Gallium Nitride Epilayers by OMVPE. Fort Belvoir, VA: Defense Technical Information Center, January 1998. http://dx.doi.org/10.21236/ada337316.
Повний текст джерелаJones, Kenneth A., Randy P. Tompkins, Michael A. Derenge, Kevin W. Kirchner, Iskander G. Batyrev, and Shuai Zhou. Gallium Nitride (GaN) High Power Electronics (FY11). Fort Belvoir, VA: Defense Technical Information Center, January 2012. http://dx.doi.org/10.21236/ada556955.
Повний текст джерелаAllen, N. Gallium Nitride Superjunction Transistor: Continued Funding Report. Office of Scientific and Technical Information (OSTI), September 2022. http://dx.doi.org/10.2172/1890078.
Повний текст джерелаMitchell, Christine Charlotte. Defect reduction in gallium nitride using cantilever epitaxy. Office of Scientific and Technical Information (OSTI), August 2003. http://dx.doi.org/10.2172/918286.
Повний текст джерелаHarris, H. M., J. Laskar, and S. Nuttinck. Engineering Support for High Power Density Gallium Nitride Microwave Transistors. Fort Belvoir, VA: Defense Technical Information Center, December 2001. http://dx.doi.org/10.21236/ada397860.
Повний текст джерелаMcHugo, S. A., J. Krueger, and C. Kisielowski. Metallic impurities in gallium nitride grown by molecular beam epitaxy. Office of Scientific and Technical Information (OSTI), April 1997. http://dx.doi.org/10.2172/603696.
Повний текст джерелаHite, Jennifer, Mark Twigg, Michael Mastro, Jr Freitas, Meyer Jaime, Vurgaftman Jerry, O'Connor Igor, et al. Development of Periodically Oriented Gallium Nitride for Non-linear Optics. Fort Belvoir, VA: Defense Technical Information Center, September 2012. http://dx.doi.org/10.21236/ada563315.
Повний текст джерелаPatibandla, Nag, and Vivek Agrawal. Advanced Epi Tools for Gallium Nitride Light Emitting Diode Devices. Office of Scientific and Technical Information (OSTI), December 2012. http://dx.doi.org/10.2172/1150624.
Повний текст джерела