Добірка наукової літератури з теми "Electronic secondary emission"
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Статті в журналах з теми "Electronic secondary emission"
Yater, J. E. "Secondary electron emission and vacuum electronics." Journal of Applied Physics 133, no. 5 (February 7, 2023): 050901. http://dx.doi.org/10.1063/5.0130972.
Повний текст джерелаNeugebauer, R., R. Wuensch, T. Jalowy, K. O. Groeneveld, H. Rothard, A. Clouvas, and C. Potiriadis. "Secondary electron emission near the electronic stopping power maximum." Physical Review B 59, no. 17 (May 1, 1999): 11113–16. http://dx.doi.org/10.1103/physrevb.59.11113.
Повний текст джерелаKlochkov, V. P., and V. L. Bogdanov. "Secondary emission accompanying excitation of high electronic states (Review)." Journal of Applied Spectroscopy 43, no. 1 (July 1985): 699–714. http://dx.doi.org/10.1007/bf00660572.
Повний текст джерелаFitting, H. J., and D. Hecht. "Secondary electron field emission." Physica Status Solidi (a) 108, no. 1 (July 16, 1988): 265–73. http://dx.doi.org/10.1002/pssa.2211080127.
Повний текст джерелаHowie, A. "Threshold Energy Effects in Secondary Electron Emission." Microscopy and Microanalysis 5, S2 (August 1999): 662–63. http://dx.doi.org/10.1017/s1431927600016639.
Повний текст джерелаNovikov, Yu A. "Modern Scanning Electron Microscopy. 1. Secondary Electron Emission." Поверхность. Рентгеновские, синхротронные и нейтронные исследования, no. 5 (May 1, 2023): 80–94. http://dx.doi.org/10.31857/s102809602305014x.
Повний текст джерелаVaughan, J. R. M. "A new formula for secondary emission yield." IEEE Transactions on Electron Devices 36, no. 9 (September 1989): 1963–67. http://dx.doi.org/10.1109/16.34278.
Повний текст джерелаHuang, Ling, and Qian Wang. "Study on Secondary Electron Yield of Dielectric Materials." Journal of Physics: Conference Series 2433, no. 1 (February 1, 2023): 012002. http://dx.doi.org/10.1088/1742-6596/2433/1/012002.
Повний текст джерелаPintao, Carlos. "Mylar secondary emission-energy distribution and yields." IEEE Transactions on Dielectrics and Electrical Insulation 21, no. 1 (February 2014): 311–16. http://dx.doi.org/10.1109/tdei.2014.6740754.
Повний текст джерелаMichizono, Shinichiro. "Secondary electron emission from alumina RF windows." IEEE Transactions on Dielectrics and Electrical Insulation 14, no. 3 (June 2007): 583–92. http://dx.doi.org/10.1109/tdei.2007.369517.
Повний текст джерелаДисертації з теми "Electronic secondary emission"
Ludwick, Jonathan. "Physics of High-Power Vacuum Electronic Systems Based on Carbon Nanotube Fiber Field Emitters." University of Cincinnati / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1613745398331048.
Повний текст джерелаRansley, Chau Diem Nguyen. "Secondary electron emission from organic monolayers." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.612907.
Повний текст джерелаFarhang, Mohammad Hossein. "Secondary electron emission yield from carbon samples." Thesis, University of Southampton, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.318220.
Повний текст джерелаVempati, Pratyusha. "Analytical fits to Secondary Emission Yield Data." University of Cincinnati / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1523635397854801.
Повний текст джерелаCormier, Pierre Richard Sébastien. "Secondary electron emission properties of molybdenum disulfide thin films." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk3/ftp04/mq31189.pdf.
Повний текст джерелаMuellejans, Harald. "Secondary electron emission in coincidence with primary energy losses." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.240071.
Повний текст джерелаVaz, Raquel Maria Amaro. "Studies of the secondary electron emission from diamond films." Thesis, University of Bristol, 2013. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.616564.
Повний текст джерелаThomson, Clint D. "Measurements of the Secondary Electron Emission Properties of Insulators." DigitalCommons@USU, 2005. https://digitalcommons.usu.edu/etd/2093.
Повний текст джерелаHaidara, Modibo. "Impulsions de Trichel dans le cyclohexane liquide et les gaz comprimés." Grenoble 1, 1988. http://www.theses.fr/1988GRE10160.
Повний текст джерелаDavies, Robert. "Measurement of Angle-Resolved Secondary Electron Spectra." DigitalCommons@USU, 1999. https://digitalcommons.usu.edu/etd/1698.
Повний текст джерелаКниги з теми "Electronic secondary emission"
International Commission on Radiation Units and Measurements., ed. Secondary electron spectra from charged particle interactions. Bethesda, Md: International Commission on Radiation Units and Measurements, 1996.
Знайти повний текст джерелаM, Asnin Vladimir, Petukhov Andre G, and NASA Glenn Research Center, eds. Secondary electron emission spectroscopy of diamond surfaces. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 1999.
Знайти повний текст джерелаA, Jensen Kenneth, Roman Robert F, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Division., eds. Secondary electron emission characteristics of molybdenum-masked, ion-textured OFHC copper. [Washington, D.C.]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1990.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. [Washington, DC]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., ed. Calculation of secondary electron trajectories in multistage depressed collectors for microwave amplifiers. [Washington, DC]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.
Знайти повний текст джерелаT, Mearini G., and United States. National Aeronautics and Space Administration., eds. Effects of surface treatments on secondary electron emission from CVD diamond films. [Washington, D.C: National Aeronautics and Space Administration, 1995.
Знайти повний текст джерелаNauchnyĭ sovet po probleme "Fizicheskai͡a ėlektronika" (Akademii͡a nauk SSSR) and Tashkentskiĭ politekhnicheskiĭ institut im. Abu Raĭkhana Beruni, eds. VII Simpozium po vtorichnoĭ ėlektronnoĭ, fotoėlektronnoĭ ėmissii͡am i spektroskopii poverkhnosti tverdogo tela, Tashkent, 7-9 ii͡uni͡a 1990 goda: Tezisy dokladov. Tashkent: Tashkentskiĭ politekhnicheskiĭ in-t im. Beruni, 1990.
Знайти повний текст джерелаA, Jensen Kenneth, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch., eds. Textured carbon on copper: A novel surface with extremely low secondary electron emission characteristics. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1985.
Знайти повний текст джерелаNovikov, I︠U︡ A. Mekhanizmy vtorichnoĭ ėlektronnoĭ ėmissii relʹefnoĭ poverkhnosti tverdogo tela. Moskva: Nauka, Fizmatlit, 1998.
Знайти повний текст джерелаKovalev, V. P. Vtorichnye ėlektrony. Moskva: Ėnergoatomizdat, 1987.
Знайти повний текст джерелаЧастини книг з теми "Electronic secondary emission"
Maguire, H. G. "Auger and Secondary Emission Electronic Structural Characteristics in Metals and Insulators." In Springer Series in Surface Sciences, 159–65. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-75066-3_19.
Повний текст джерелаSchou, Jørgen. "Secondary Electron Emission from Insulators." In NATO ASI Series, 351–58. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2840-1_24.
Повний текст джерелаReimer, Ludwig. "Emission of Backscattered and Secondary Electrons." In Springer Series in Optical Sciences, 135–69. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-540-38967-5_4.
Повний текст джерелаAkkerman, A., A. Breskin, R. Chechik, and A. Gibrekhterman. "Secondary Electron Emission from Alkali Halides Induced by X-Rays and Electrons." In NATO ASI Series, 359–80. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2840-1_25.
Повний текст джерелаFujii, Haruhisa, and Yuhki Ishihara. "Electron Beam Induced Charging and Secondary Electron Emission of Surface Materials." In Protection of Materials and Structures From the Space Environment, 437–45. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30229-9_40.
Повний текст джерелаWen, Kaile, Shulin Liu, Baojun Yan, Yang Yu, and Yuzhen Yang. "Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam." In Springer Proceedings in Physics, 113–16. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-13-1313-4_23.
Повний текст джерелаCui, Wanzhao, Yun Li, Hongtai Zhang, and Jing Yang. "Basic Theory and Measurement Method of Secondary Electron Emission in Multipactor." In Simulation Method of Multipactor and Its Application in Satellite Microwave Components, 23–78. Boca Raton: CRC Press, 2021. http://dx.doi.org/10.1201/9781003189794-2.
Повний текст джерелаDevooght, J., J. C. Dehaes, A. Dubus, M. Cailler, and J. P. Ganachaud. "Theoretical description of secondary electron emission induced by electron or ion beams impinging on solids." In Springer Tracts in Modern Physics, 67–128. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991. http://dx.doi.org/10.1007/bfb0041378.
Повний текст джерелаNitta, Kumi, Eiji Miyazaki, Shinichiro Michizono, and Yoshio Saito. "Effects of Secondary Electron Emission Yield of Polyimide Films on Atomic Oxygen Irradiation." In Protection of Materials and Structures From the Space Environment, 143–50. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-30229-9_12.
Повний текст джерелаMarten, H. "Inelastic Scattering and Secondary Electron Emission under Resonance Conditions in RHEED from Pt(111)." In NATO ASI Series, 109–15. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4684-5580-9_8.
Повний текст джерелаТези доповідей конференцій з теми "Electronic secondary emission"
Wang, L. "Research on Pulsed High-Current Secondary Electron Emission Cathode." In 2024 IEEE International Conference on Plasma Science (ICOPS), 1. IEEE, 2024. http://dx.doi.org/10.1109/icops58192.2024.10627566.
Повний текст джерелаDamamme, G., N. Ghorbel, A. Si Ahmed, K. Said, and G. Moya. "Modeling of secondary electron emission and charge trapping in an insulator under an electronic beam." In 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). IEEE, 2016. http://dx.doi.org/10.1109/ceidp.2016.7785520.
Повний текст джерелаKopot, M. A., V. D. Yeryomka, and V. D. Naumenko. "Electronic Shell Generation in the MM-Wave Secondary Emission Magnetron with Cold Cathode." In 2007 17th International Crimean Conference "Microwave and Telecommunication Technology" (CriMiCo '2007). IEEE, 2007. http://dx.doi.org/10.1109/crmico.2007.4368680.
Повний текст джерелаShibahara, Masahiko, Shin-Ichi Satake, and Jun Taniguchi. "Quantum Molecular Dynamics Study on Energy Transfer to the Secondary Electron in Surface Collision Process of an Ion." In ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference collocated with the ASME 2007 InterPACK Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ht2007-32144.
Повний текст джерелаMartens, V. Ya. "COMPENSATION BY IONS OF THE SPATIAL CHARGE OF THE ELECTRON BEAM, PAIRED AND SECONDARY ELECTRONS." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-64-70.
Повний текст джерелаTROMAYER, Jürgen, Roland KIRCHBERGER, Gerd NEUMANN, and Helmut EICHLSEDER. "Are low-cost, low-tech solutions adequate for small capacity EU III motorcycles?" In Small Engine Technology Conference & Exposition. 10-2 Gobancho, Chiyoda-ku, Tokyo, Japan: Society of Automotive Engineers of Japan, 2007. http://dx.doi.org/10.4271/2007-32-0014.
Повний текст джерелаSergeev, N. S., and I. A. Sorokin. "MEASUREMENT OF THE TOTAL SECONDARY ELECTRON EMISSION COEFFICIENT IN A LINEAR PLASMA SIMULATOR BPD-PSI." In Plasma emission electronics. Buryat Scientific Center of SB RAS Press, 2023. http://dx.doi.org/10.31554/978-5-7925-0655-8-2023-233-237.
Повний текст джерелаGeorge, Anoop, Robert A. Schill, Richard Kant, and Stan Goldfarb. "Secondary Electron Emission from Niobium." In IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science. IEEE, 2005. http://dx.doi.org/10.1109/plasma.2005.359503.
Повний текст джерелаHopman, H. J., and J. Verhoeven. "Secondary electron emission from insulators." In Eighth international symposium on the production and neutralization of negative ions and beams and the seventh european workshop on the production and application of light negative ions. AIP, 1998. http://dx.doi.org/10.1063/1.56369.
Повний текст джерелаWang, Joseph, Pu Wang, Mohamed Belhai, and Jean-Charles Mateo-Velez. "Modeling Secondary Electron Emission Experiment." In 49th AIAA Aerospace Sciences Meeting including the New Horizons Forum and Aerospace Exposition. Reston, Virigina: American Institute of Aeronautics and Astronautics, 2011. http://dx.doi.org/10.2514/6.2011-1060.
Повний текст джерелаЗвіти організацій з теми "Electronic secondary emission"
Kirby, R. E. Secondary electron emission from accelerator materials. Office of Scientific and Technical Information (OSTI), February 2000. http://dx.doi.org/10.2172/753300.
Повний текст джерелаKirby, R. Artifacts in Secondary Electron Emission Yield Measurements. Office of Scientific and Technical Information (OSTI), July 2004. http://dx.doi.org/10.2172/827328.
Повний текст джерелаWilson, Warren G. Secondary and Backscatter Electron Emission from Conductors. Fort Belvoir, VA: Defense Technical Information Center, July 1998. http://dx.doi.org/10.21236/ada359512.
Повний текст джерелаKirby, Robert E. Secondary Electron Emission Yields from PEP-II Accelerator Materials. Office of Scientific and Technical Information (OSTI), October 2000. http://dx.doi.org/10.2172/784708.
Повний текст джерелаFurman, M. Probabilistic Model for the Simulation of Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), May 2004. http://dx.doi.org/10.2172/826907.
Повний текст джерелаZhang S. Y. Secondary Electron Emission at the SNS Storage Ring Collimator. Office of Scientific and Technical Information (OSTI), October 1998. http://dx.doi.org/10.2172/1157228.
Повний текст джерелаM.D. Campanell, A. Khrabrov and I. D. Kaganovich. Absence of Debye Sheaths Due to Secondary Electron Emission. Office of Scientific and Technical Information (OSTI), May 2012. http://dx.doi.org/10.2172/1062662.
Повний текст джерелаBasovic, Milos. Secondary Electron Emission from Plasma Processed Accelerating Cavity Grade Niobium. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1351260.
Повний текст джерелаGeorge, Anoop. Study of Secondary Electron Emission from Niobium at Cryogenic Temperatures. Office of Scientific and Technical Information (OSTI), August 2005. http://dx.doi.org/10.2172/1552175.
Повний текст джерелаFurman, M. A., and M. T. F. Pivi. Simulation of secondary electron emission based on a phenomenological probabilistic model. Office of Scientific and Technical Information (OSTI), June 2003. http://dx.doi.org/10.2172/835149.
Повний текст джерела