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Статті в журналах з теми "Electron microscope"
Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Повний текст джерелаGauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (August 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.
Повний текст джерелаRoss, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (June 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.
Повний текст джерелаKordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
Повний текст джерелаO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Повний текст джерелаKONNO, Mitsuru, Toshie YAGUCHI, and Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope." Journal of the Japan Society of Colour Material 79, no. 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.
Повний текст джерелаWatson, John H. L. "In the beginning there were electrons." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.
Повний текст джерелаAi, R. "A Microscope-Compatible Auger Electron Spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.
Повний текст джерелаKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Повний текст джерелаSchatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Повний текст джерелаДисертації з теми "Electron microscope"
Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /." Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Повний текст джерелаMartin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope." Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.
Повний текст джерелаDuckett, Gordon Richard. "Electron microscope studies of organic pigments." Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.
Повний текст джерелаSkoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.
Повний текст джерелаLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Повний текст джерелаElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope." Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.
Повний текст джерелаJohnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
Повний текст джерелаThe technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Lyster, Martin. "Electron microscope studies of cadmium mercury telluride." Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.
Повний текст джерелаDellith, Meike. "Electron microscope investigations of defects in DRAMs." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.
Повний текст джерелаChristensen, K. N. "Electron microscope studies of oxygen implanted silicon." Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.
Повний текст джерелаКниги з теми "Electron microscope"
Thomas, Mulvey, and Sheppard C. J. R, eds. Advances inoptical and electron microscopy. London: Academic, 1990.
Знайти повний текст джерелаChampness, P. E. Electron diffraction in the transmission electron microscope. Oxford: BIOS Scientific Publishers, 2001.
Знайти повний текст джерелаHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Знайти повний текст джерелаReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2nd ed. Berlin: Springer, 1998.
Знайти повний текст джерелаJ, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Amsterdam: Elsevier, 1985.
Знайти повний текст джерелаTomb, Howard. Microaliens: Dazzling journeys with an electron microscope. New York: Farrar, Straus and Giroux, 1993.
Знайти повний текст джерелаEgerton, Ray F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-6887-2.
Повний текст джерелаEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-5099-7.
Повний текст джерелаEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-9583-4.
Повний текст джерелаEgerton, R. F. Electron energy-loss spectroscopy in the electron microscope. 2nd ed. New York: Plenum Press, 1996.
Знайти повний текст джерелаЧастини книг з теми "Electron microscope"
Gooch, Jan W. "Electron Microscope." In Encyclopedic Dictionary of Polymers, 889. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.
Повний текст джерелаWeik, Martin H. "electron microscope." In Computer Science and Communications Dictionary, 505. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.
Повний текст джерелаSchmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering, 1–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-642-35950-7_6595-4.
Повний текст джерелаStaufer, U., L. P. Muray, D. P. Kern, and T. H. P. Chang. "Miniaturized Electron Microscope." In Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications, 101–10. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1729-6_9.
Повний текст джерелаDijkstra, Jeanne, and Cees P. de Jager. "Electron Microscope Serology." In Practical Plant Virology, 380–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72030-7_59.
Повний текст джерелаSchmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering, 1501–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6595.
Повний текст джерелаGooch, Jan W. "Scanning Electron Microscope." In Encyclopedic Dictionary of Polymers, 647. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_10317.
Повний текст джерелаMitome, Masanori. "Transmission Electron Microscope." In Compendium of Surface and Interface Analysis, 775–81. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_124.
Повний текст джерелаKinoshita, Toyohiko. "Photoemission Electron Microscope." In Compendium of Surface and Interface Analysis, 465–69. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_76.
Повний текст джерелаSchmitt, Robert. "Scanning Electron Microscope." In CIRP Encyclopedia of Production Engineering, 1085–89. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6595.
Повний текст джерелаТези доповідей конференцій з теми "Electron microscope"
Yatagai, Toyohiko, Katsuyuki Ohmura, and Shigeo Iwasaki. "Phase sensitive analysis of electron holograms." In Holography. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.
Повний текст джерелаLarionov, Yu V., and Yu A. Novikov. "Virtual scanning electron microscope." In International Conference on Micro-and Nano-Electronics 2012, edited by Alexander A. Orlikovsky. SPIE, 2013. http://dx.doi.org/10.1117/12.2016977.
Повний текст джерелаPostek, Michael T. "Scanning electron microscope metrology." In Critical Review Collection. SPIE, 1994. http://dx.doi.org/10.1117/12.187461.
Повний текст джерелаMačák, Martin. "Electrohydrodynamic Model Of Electron Microscope." In STUDENT EEICT 2021. Brno: Fakulta elektrotechniky a komunikacnich technologii VUT v Brne, 2021. http://dx.doi.org/10.13164/eeict.2021.209.
Повний текст джерелаKrysztof, Michał, Marcin Białas, and Tomasz Grzebyk. "Imaging Using Mems Electron Microscope." In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188948.
Повний текст джерелаKrysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza, and Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope." In 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.
Повний текст джерелаSimonaitis, John W., Maurice A. R. Krielaart, Stewart A. Koppell, Benjamin J. Slayton, Joseph Alongi, William P. Putnam, Karl K. Berggren, and Phillip D. Keathley. "Electron-Photon Interactions in a Scanning Electron Microscope." In 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188999.
Повний текст джерелаDemarest, James, Chris Deeb, Thomas Murray, and Hong-Ying Zhai. "Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms." In ISTFA 2010. ASM International, 2010. http://dx.doi.org/10.31399/asm.cp.istfa2010p0301.
Повний текст джерелаIvanov, S. N., S. N. Shilimanov, and Sergei I. Shkuratov. "Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination." In XVI International Symposium on Discharges and Electrical Insulation in Vacuum, edited by Gennady A. Mesyats. SPIE, 1994. http://dx.doi.org/10.1117/12.174564.
Повний текст джерелаAksenov, Y. Y., E. G. I. Reinders, Jan Greve, C. van Blitterswijk, J. de Bruijn, and Cees Otto. "Integration of a confocal Raman microscope in an electron microscope." In EOS/SPIE European Biomedical Optics Week, edited by Karsten Koenig, Hans J. Tanke, and Herbert Schneckenburger. SPIE, 2000. http://dx.doi.org/10.1117/12.410628.
Повний текст джерелаЗвіти організацій з теми "Electron microscope"
Crewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), June 1991. http://dx.doi.org/10.2172/6000131.
Повний текст джерелаCrewe, A. V., and O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), July 1992. http://dx.doi.org/10.2172/7015892.
Повний текст джерелаKenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), November 1989. http://dx.doi.org/10.2172/5356814.
Повний текст джерелаRen, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, January 2001. http://dx.doi.org/10.21236/ada392051.
Повний текст джерелаHadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Fort Belvoir, VA: Defense Technical Information Center, March 2001. http://dx.doi.org/10.21236/ada388472.
Повний текст джерелаStirling, J. A. R., and G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.
Повний текст джерелаMarder, A., K. Barmak, and D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), November 1998. http://dx.doi.org/10.2172/676882.
Повний текст джерелаCollins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler, and Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), November 2016. http://dx.doi.org/10.2172/1331925.
Повний текст джерелаFraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, October 1987. http://dx.doi.org/10.21236/ada189111.
Повний текст джерелаRuggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), January 1993. http://dx.doi.org/10.2172/6854553.
Повний текст джерела