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Статті в журналах з теми "CARRIER RELIABILITY"
NASEH, SASAN, and M. JAMAL DEEN. "RF CMOS RELIABILITY." International Journal of High Speed Electronics and Systems 11, no. 04 (December 2001): 1249–95. http://dx.doi.org/10.1142/s0129156401001088.
Повний текст джерелаZHAO, Lijuan. "Reliability Design of Shearer's Planet Carrier." Journal of Mechanical Engineering 55, no. 8 (2019): 192. http://dx.doi.org/10.3901/jme.2019.08.192.
Повний текст джерелаCheng, Junji, and Xingbi Chen. "Hot-carrier reliability in OPTVLD-LDMOS." Journal of Semiconductors 33, no. 6 (June 2012): 064003. http://dx.doi.org/10.1088/1674-4926/33/6/064003.
Повний текст джерелаJie Liao, Cher Ming Tan, and Geert Spierings. "Hot-Carrier Reliability of Power SOI EDNMOS." IEEE Transactions on Power Electronics 25, no. 7 (July 2010): 1685–91. http://dx.doi.org/10.1109/tpel.2010.2041255.
Повний текст джерелаSoares, C. Guedes, and A. P. Teixeira. "Structural reliability of two bulk carrier designs." Marine Structures 13, no. 2 (March 2000): 107–28. http://dx.doi.org/10.1016/s0951-8339(00)00004-6.
Повний текст джерелаKoeppel, Gaudenz, and Göran Andersson. "Reliability modeling of multi-carrier energy systems." Energy 34, no. 3 (March 2009): 235–44. http://dx.doi.org/10.1016/j.energy.2008.04.012.
Повний текст джерелаSugiharto, D. S., C. Y. Yang, Huy Le, and J. E. Chung. "Beating the heat [CMOS hot-carrier reliability]." IEEE Circuits and Devices Magazine 14, no. 5 (1998): 43–51. http://dx.doi.org/10.1109/101.721519.
Повний текст джерелаHwang, Hyunsang, Jack Lee, Pierre Fazan, and Chuck Dennison. "Hot-carrier reliability characteristics of narrow-width MOSFETs." Solid-State Electronics 36, no. 4 (April 1993): 665–66. http://dx.doi.org/10.1016/0038-1101(93)90284-w.
Повний текст джерелаAur, S., and Ping Yang. "IVB-6 hot-carrier reliability of trench transistor." IEEE Transactions on Electron Devices 34, no. 11 (November 1987): 2374. http://dx.doi.org/10.1109/t-ed.1987.23289.
Повний текст джерелаMinehane, S., S. Healy, P. O'Sullivan, K. McCarthy, A. Mathewson, and B. Mason. "Direct parameter extraction for hot-carrier reliability simulation." Microelectronics Reliability 37, no. 10-11 (October 1997): 1437–40. http://dx.doi.org/10.1016/s0026-2714(97)00081-4.
Повний текст джерелаДисертації з теми "CARRIER RELIABILITY"
Tsarouchas, Ioannis. "Through life reliability of a bulk carrier." Thesis, University of Glasgow, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.368736.
Повний текст джерелаJiang, Wenjie 1963. "Hot-carrier reliability assessment in CMOS digital integrated circuits." Thesis, Massachusetts Institute of Technology, 1998. http://hdl.handle.net/1721.1/47514.
Повний текст джерелаChan, Vei-Han. "Hot-carrier reliability evaluation for CMOS devices and circuits." Thesis, Massachusetts Institute of Technology, 1995. http://hdl.handle.net/1721.1/36532.
Повний текст джерелаWang, Lei. "Reliability control of GNSS carrier-phase integer ambiguity resolution." Thesis, Queensland University of Technology, 2015. https://eprints.qut.edu.au/86976/1/Lei_Wang_Thesis.pdf.
Повний текст джерелаLe, Huy X. P. "Characterization of hot-carrier reliability in analog sub-circuit design." Thesis, Massachusetts Institute of Technology, 1996. http://hdl.handle.net/1721.1/41379.
Повний текст джерелаIncludes bibliographical references (leaves 52-54).
by Huy X.P. Le.
M.Eng.
Kim, SeokWon Abraham 1970. "Hot-carrier reliability of MOSFETs at room and cryogenic temperature." Thesis, Massachusetts Institute of Technology, 1999. http://hdl.handle.net/1721.1/28215.
Повний текст джерелаVita.
Includes bibliographical references.
Hot-carrier reliability is an increasingly important issue as the geometry scaling of MOSFET continues down to the sub-quarter micron regime. The power-supply voltage does not scale at the same rate as the device dimensions, and thus, the peak lateral E-field in the channel increases. Hot-carriers, generated by this high lateral E-field, gain more kinetic energy and cause damage to the device as the geometry dimension of MOSFETs shortens. In order to model the device hot-carrier degradation accurately, accurate model parameter extraction is critically important. This thesis discusses the model parameters' dependence on the stress conditions and its implications in terms of the device lifetime prediction procedure. As geometry scaling approaches the physical limit of fabrication techniques, such as photolithography, temperature scaling becomes a more viable alternative. MOSFET performance enhancement has been investigated and verified at cryogenic temperatures, such as at 77K. However, hot-carrier reliability problems have been shown to be exacerbated at low temperature. As the mean-free path increases at low temperature due to reduced phonon-scattering, hot-carriers become more energetic at low temperature, causing more device degradation. It is clear that various hot-carrier reliability issues must be clearly understood in order to optimize the device performance vs. reliability trade-off, both at short channel lengths and low temperatures. This thesis resolves numerous, unresolved issues of hot-carrier reliability at both room and cryogenic temperature, and develops a general framework for hot carrier reliability assessment.
by SeokWon Abraham Kim.
Ph.D.
Jiang, Liangjun. "HOT CARRIER EFFECT ON LDMOS TRANSISTORS." Doctoral diss., University of Central Florida, 2007. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3230.
Повний текст джерелаPh.D.
School of Electrical Engineering and Computer Science
Engineering and Computer Science
Electrical Engineering
Le, Huy X. P. "On the methodology of assessing hot-carrier reliability of analog circuits." Thesis, Massachusetts Institute of Technology, 1999. http://hdl.handle.net/1721.1/84212.
Повний текст джерелаDas, A. G. Man Mohan. "Effect of wearout processes on the critical timing parameters and reliability of CMOS bistable circuits." Thesis, Durham University, 1997. http://etheses.dur.ac.uk/4701/.
Повний текст джерелаKoeppel, Gaudenz Alesch. "Reliability considerations of future energy systems : multi-carrier systems and the effect of energy storage /." Zürich : ETH, 2007. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=17058.
Повний текст джерелаКниги з теми "CARRIER RELIABILITY"
Y, Tsui Paul G., ed. Hot-carrier circuit reliability simulation. Reading, Mass: Addison-Wesley, 1992.
Знайти повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. Hot-Carrier Reliability of MOS VLSI Circuits. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7.
Повний текст джерелаLeblebici, Yusuf. Hot-carrier reliability of MOS VLSI circuits. Boston: Kluwer Academic, 1993.
Знайти повний текст джерелаLeblebici, Yusuf. Hot-Carrier Reliability of MOS VLSI Circuits. Boston, MA: Springer US, 1993.
Знайти повний текст джерелаUtas, Greg. Robust communications software: Extreme availability, reliability and scalability for carrier-grade systems. Chichester: John Wiley & Sons, 2005.
Знайти повний текст джерелаFord-class carriers: Lead ship testing and reliability shortfalls will limit initial fleet capabilities : report to congressional requesters. [Washington, D.C.]: United States Government Accountability Office, 2013.
Знайти повний текст джерелаChhutiashvili, Lela. Environmental sustainability control system of economic entities. ru: INFRA-M Academic Publishing LLC., 2022. http://dx.doi.org/10.12737/1819036.
Повний текст джерелаBartoli, Gianni, Francesco Ricciardelli, and Vincenzo Sepe, eds. WINDERFUL Wind and INfrastructures. Florence: Firenze University Press, 2004. http://dx.doi.org/10.36253/8884531381.
Повний текст джерелаLeonovich, Sergey, Evgeniy Shalyy, Elena Polonina, Elena Sadovskaya, Lev Kim, and Valentin Dorkin. Durability of port reinforced concrete structures (Far East and Sakhalin). ru: INFRA-M Academic Publishing LLC., 2021. http://dx.doi.org/10.12737/1816638.
Повний текст джерелаOffice, General Accounting. Operation Desert Storm: Apache helicopter was considered effective in combat, but reliability problems persist : report to the Chairman, Subcommittee on Oversight and Investigations, Committee on Energy and Commerce, House of Representatives. Washington, D.C: U.S. General Accounting Office, 1992.
Знайти повний текст джерелаЧастини книг з теми "CARRIER RELIABILITY"
Leblebici, Yusuf, and Sung-Mo Kang. "Circuit Design for Reliability." In Hot-Carrier Reliability of MOS VLSI Circuits, 191–207. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_8.
Повний текст джерелаIoannou, D. E. "Hot Carrier Reliability of SOI Structures." In Physical and Technical Problems of SOI Structures and Devices, 199–210. Dordrecht: Springer Netherlands, 1995. http://dx.doi.org/10.1007/978-94-011-0109-7_18.
Повний текст джерелаScholten, A. J., B. De Vries, J. Bisschop, and G. T. Sasse. "Reliability Simulation Models for Hot Carrier Degradation." In Hot Carrier Degradation in Semiconductor Devices, 477–517. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-08994-2_16.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Transistor-Level Simulation for Circuit Reliability." In Hot-Carrier Reliability of MOS VLSI Circuits, 111–42. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_5.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Fast Timing Simulation for Circuit Reliability." In Hot-Carrier Reliability of MOS VLSI Circuits, 143–63. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_6.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Introduction." In Hot-Carrier Reliability of MOS VLSI Circuits, 1–13. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_1.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Oxide Degradation Mechanisms in MOS Transistors." In Hot-Carrier Reliability of MOS VLSI Circuits, 15–53. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_2.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Modeling of Degradation Mechanisms." In Hot-Carrier Reliability of MOS VLSI Circuits, 55–76. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_3.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Modeling of Damaged Mosfets." In Hot-Carrier Reliability of MOS VLSI Circuits, 77–109. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_4.
Повний текст джерелаLeblebici, Yusuf, and Sung-Mo Kang. "Macromodeling of Hot-Carrier Induced Degradation in Mos Circuits." In Hot-Carrier Reliability of MOS VLSI Circuits, 165–90. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-3250-7_7.
Повний текст джерелаТези доповідей конференцій з теми "CARRIER RELIABILITY"
Burnett, David, and Chenming Hu. "Hot-Carrier Reliability of Bipolar Transistors." In 28th International Reliability Physics Symposium. IEEE, 1990. http://dx.doi.org/10.1109/irps.1990.363517.
Повний текст джерелаJiang, W., H. Le, J. Chung, T. Kopley, P. Marcoux, and C. Dai. "Assessing circuit-level hot-carrier reliability." In 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual. IEEE, 1998. http://dx.doi.org/10.1109/relphy.1998.670509.
Повний текст джерелаWu, Xiangjun, and Zongkai Yang. "Research on reliability of carrier ethernet." In Asia-Pacific Optical Communications, edited by Jianli Wang, Gee-Kung Chang, Yoshio Itaya, and Herwig Zech. SPIE, 2007. http://dx.doi.org/10.1117/12.745291.
Повний текст джерелаHao, Jifa. "Hot carrier reliability in LDMOS devices." In 2017 IEEE 12th International Conference on ASIC (ASICON). IEEE, 2017. http://dx.doi.org/10.1109/asicon.2017.8252561.
Повний текст джерелаPark, Hokyung, Rino Choi, Seung Song, Man Chang, Chadwin Young, Gennadi Bersuker, Byoung Lee, Jack Lee, and Hyunsang Hwang. "Decoupling of cold carrier effects in hot carrier reliability of HfO2 gated nMOSFETs." In 2006 IEEE International Reliability Physics Symposium Proceedings. IEEE, 2006. http://dx.doi.org/10.1109/relphy.2006.251217.
Повний текст джерелаMittl, Steven W., and Michael J. Hargrove. "Hot Carrier Degradation in P-Channel MOSFETs." In 27th International Reliability Physics Symposium. IEEE, 1989. http://dx.doi.org/10.1109/irps.1989.363369.
Повний текст джерелаTyaginov, S. E., A. Makarov, M. Jech, J. Franco, P. Sharma, B. Kaczer, and T. Grasser. "On the effect of interface traps on the carrier distribution function during hot-carrier degradation." In 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, 2016. http://dx.doi.org/10.1109/iirw.2016.7904911.
Повний текст джерелаChung, James E. "Key issues in evaluating hot-carrier reliability." In Microelectronic Manufacturing 1996, edited by Ih-Chin Chen, Nobuo Sasaki, Divyesh N. Patel, and Girish A. Dixit. SPIE, 1996. http://dx.doi.org/10.1117/12.250889.
Повний текст джерелаChen, Zhan, and Israel Koren. "Technology mapping for hot-carrier reliability enhancement." In Microelectronic Manufacturing, edited by Ali Keshavarzi, Sharad Prasad, and Hans-Dieter Hartmann. SPIE, 1997. http://dx.doi.org/10.1117/12.284706.
Повний текст джерелаAur, S. "Kinetics of Hot Carrier Effects for Circuit Simulation." In 27th International Reliability Physics Symposium. IEEE, 1989. http://dx.doi.org/10.1109/irps.1989.363367.
Повний текст джерелаЗвіти організацій з теми "CARRIER RELIABILITY"
La Porte, Todd R., Karlene Roberts, and Gene I. Rochlin. Aircraft Carrier Operations at Sea: The Challenges of High Reliability Performance. Fort Belvoir, VA: Defense Technical Information Center, July 1988. http://dx.doi.org/10.21236/ada198692.
Повний текст джерелаMorrison, Robert James. SYS645 Design for Reliability Maintainability and Supportability: H12 Universal Cartridge Carrier (circa 1952). Office of Scientific and Technical Information (OSTI), January 2020. http://dx.doi.org/10.2172/1592836.
Повний текст джерелаMatulionis, Arvydas, H. Morkoc, U. Ozgur, J. Xie, J. H. Leach, M. Wu, X. Ni, J. Lee, X. Li, and R. Katilius. Limitation of Hot-Carrier Generated Heat Dissipation on the Frequency of Operation and Reliability of Novel Nitride-Based High-Speed HFETs. Fort Belvoir, VA: Defense Technical Information Center, July 2010. http://dx.doi.org/10.21236/ada542888.
Повний текст джерелаNessim and Zhou. L51998 Current Status and Future Development Needs of Limit States Designs for Onshore Pipelines. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), September 2003. http://dx.doi.org/10.55274/r0011219.
Повний текст джерелаChen, Qishi, Joe Zhou, Duane DeGeer, Ola Bjornoy, and Richard Verley. JTM13-CCP Collapse of Corroded Pipelines. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), April 2001. http://dx.doi.org/10.55274/r0011820.
Повний текст джерелаSOLOVYANENKO, N. I. CROSS-BORDER BUSINESS OPERATIONS IN DIGITAL ECOSYSTEMS OF THE EAEU: LEGAL ISSUES. DOI CODE, 2021. http://dx.doi.org/10.18411/0131-5226-2021-70003.
Повний текст джерелаNeuert, Mark, and Smitha Koduru. PR-244-173856-R01 In-line Inspection Crack Tool Reliability and Performance Evaluation. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), June 2019. http://dx.doi.org/10.55274/r0011599.
Повний текст джерелаNikolova, Nikolina, Pencho Mihnev, Temenuzhka Zafirova-Malcheva, Ralitza Stamenkova, Stanislav Ivanov, Donatella Persico, Marcello Passarelli, Francesca Pozzi, and Erica Volta. Intellectual Output 4: Evaluation kit for inclusion-oriented collaborative learning activities. PLEIADE Project, July 2023. http://dx.doi.org/10.60063/nn.2023.0089.95.
Повний текст джерелаSkow. PR-244-093703-R01 Uncertainties of In-line Inspection Crack Detection Tools Phases 1-2. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), October 2014. http://dx.doi.org/10.55274/r0010828.
Повний текст джерелаXie, Gao, and Olsen. PR-179-13601-R01 CFD Analysis of the Heat Transfer Characteristics and the Effect of Thermowells. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), October 2013. http://dx.doi.org/10.55274/r0010818.
Повний текст джерела