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Статті в журналах з теми "Atomic force microscopy- Nanomaterials"
Jahan, Nusrat, Hanwei Wang, Shensheng Zhao, Arkajit Dutta, Hsuan-Kai Huang, Yang Zhao, and Yun-Sheng Chen. "Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification." Nanophotonics 8, no. 10 (September 20, 2019): 1659–71. http://dx.doi.org/10.1515/nanoph-2019-0181.
Повний текст джерелаYANG, X. H., Y. F. WANG, A. P. LIU, H. Z. XIN, and J. C. LIU. "STUDIES ON MAGNETIC NANOMATERIALS BY ATOMIC FORCE MICROSCOPY WITH HIGH RESOLUTION." Modern Physics Letters B 19, no. 09n10 (April 30, 2005): 469–72. http://dx.doi.org/10.1142/s0217984905008396.
Повний текст джерелаBozec, L., J. de Groot, M. Odlyha, B. Nicholls, and M. A. Horton. "Mineralised tissues as nanomaterials: analysis by atomic force microscopy." IEE Proceedings - Nanobiotechnology 152, no. 5 (2005): 183. http://dx.doi.org/10.1049/ip-nbt:20050004.
Повний текст джерелаQu, Juntian, and Xinyu Liu. "Recent Advances on SEM-Based In Situ Multiphysical Characterization of Nanomaterials." Scanning 2021 (June 9, 2021): 1–16. http://dx.doi.org/10.1155/2021/4426254.
Повний текст джерелаSaka, Masumi, Hironori Tohmyoh, M. Muraoka, Yang Ju, and K. Sasagawa. "Formation of Metallic Micro/Nanomaterials by Utilizing Migration Phenomena and Techniques for their Applications." Materials Science Forum 614 (March 2009): 3–9. http://dx.doi.org/10.4028/www.scientific.net/msf.614.3.
Повний текст джерелаStylianou, Andreas. "Atomic Force Microscopy for Collagen-Based Nanobiomaterials." Journal of Nanomaterials 2017 (2017): 1–14. http://dx.doi.org/10.1155/2017/9234627.
Повний текст джерелаKim, Kwanlae. "Advances in Atomic Force Microscopy for the Electromechanical Characterization of Piezoelectric and Ferroelectric Nanomaterials." Korean Journal of Metals and Materials 60, no. 9 (September 5, 2022): 629–43. http://dx.doi.org/10.3365/kjmm.2022.60.9.629.
Повний текст джерелаLi, Longhai, Xu Zhang, Hongfei Wang, Qian Lang, Haitao Chen, and Lian Liu. "Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy." Nanomaterials 9, no. 4 (April 6, 2019): 561. http://dx.doi.org/10.3390/nano9040561.
Повний текст джерелаFu, Wanyi, and Wen Zhang. "Measurement of the surface hydrophobicity of engineered nanoparticles using an atomic force microscope." Physical Chemistry Chemical Physics 20, no. 37 (2018): 24434–43. http://dx.doi.org/10.1039/c8cp04676j.
Повний текст джерелаHAN, XIAODONG, ZE ZHANG, and ZHONG LIN WANG. "EXPERIMENTAL NANOMECHANICS OF ONE-DIMENSIONAL NANOMATERIALS BY IN SITU MICROSCOPY." Nano 02, no. 05 (October 2007): 249–71. http://dx.doi.org/10.1142/s1793292007000623.
Повний текст джерелаДисертації з теми "Atomic force microscopy- Nanomaterials"
Kent, Ronald Douglas. "Controlled Evaluation of Silver Nanoparticle Dissolution Using Atomic Force Microscopy." Thesis, Virginia Tech, 2011. http://hdl.handle.net/10919/35632.
Повний текст джерелаMaster of Science
Rupasinghe, R.-A. Thilini Perera. "Probing electrical and mechanical properties of nanoscale materials using atomic force microscopy." Diss., University of Iowa, 2015. https://ir.uiowa.edu/etd/2268.
Повний текст джерелаWood, Erin Leigh. "An Atomic Force Microscopy Nanoindentation Study of Size Effects in Face-Centered Cubic Metal and Bimetallic Nanowires." ScholarWorks @ UVM, 2014. http://scholarworks.uvm.edu/graddis/260.
Повний текст джерелаBecerril-Garcia, Hector Alejandro. "DNA-Templated Nanomaterials." Diss., CLICK HERE for online access, 2007. http://contentdm.lib.byu.edu/ETD/image/etd1823.pdf.
Повний текст джерелаMartinez-Morales, Alfredo Adolfo. "Synthesis, characterization and applications of novel nanomaterial systems and semiconducting nanowires." Diss., [Riverside, Calif.] : University of California, Riverside, 2010. http://proquest.umi.com/pqdweb?index=0&did=2019838541&SrchMode=2&sid=2&Fmt=2&VInst=PROD&VType=PQD&RQT=309&VName=PQD&TS=1273864032&clientId=48051.
Повний текст джерелаIncludes abstract. Available via ProQuest Digital Dissertations. Title from first page of PDF file (viewed May 14, 2010). Includes bibliographical references. Also issued in print.
Kent, Ronald Douglas. "Controlled Evaluation of Metal-Based Nanomaterial Transformations." Diss., Virginia Tech, 2015. http://hdl.handle.net/10919/74998.
Повний текст джерелаPh. D.
Colaço, Élodie. "Design and characterization of biomimetic biomineralized nanomaterials." Thesis, Compiègne, 2019. http://www.theses.fr/2019COMP2529.
Повний текст джерелаThe design of a composite based on collagen and hydroxyapatite crystals attractes a great interest in materials science and biomedical research particularly for bone tissue applications. The objective is to synthesize, at the nanoscale, a biomaterial from these two components in a controlled conditions in order to modulate its physicochemical, structural and mechanical properties. This thesis project highlights the role of collagen in the mineralization mechanism with the aim of developing a biomimetic biomineralized nanomaterial. To this end, several strategies have been suggested: (i) assembly of collagen with preformed hydroxyapatite crystals, (ii) mineralization of hydroxyapatite by enzymatic catalysis (iii) elaboration of mineralized enzyme-based multilayers by the "layer-by-layer" strategy to form a nanofilm or nanotube in the presence of collagen or not. The characterization of the various mineralized nanostructured materials obtained is performed by several physicochemical techniques including transmission electron microscopy (TEM) and scanning electron microscopy (SEM), atomic force microscopy (AFM), vibrational spectroscopy (IR and Raman), turbiscan, quartz crystal microbalance (QCM-D) and light scattering measurement (DLS)
Iwasiewicz-Wabnig, Agnieszka. "Studies of carbon nanomaterials based on fullerenes and carbon nanotubes." Doctoral thesis, Umeå : Department of Physics, Umeå University, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-1312.
Повний текст джерелаYu-Su, Sherryl Yao Sheiko Sergei. "Molecular visualization of polymer thin films by atomic force microscopy towards patterning and replication of soft nanostructures for nanomaterial design and construction /." Chapel Hill, N.C. : University of North Carolina at Chapel Hill, 2009. http://dc.lib.unc.edu/u?/etd,2277.
Повний текст джерелаTitle from electronic title page (viewed Jun. 26, 2009). "... in partial fulfillment of the requirements for the degree of Doctor of Philosophy in the Curriculum of Applied Sciences and Engineering." Discipline: Applied and Materials Sciences; Department/School: Applied and Materials Sciences.
Rasel, Md Alim Iftekhar. "Experimental exploration of boron nitride nanoparticle interaction with living cells." Thesis, Queensland University of Technology, 2017. https://eprints.qut.edu.au/118067/1/Alim_Rasel_Thesis.pdf.
Повний текст джерелаКниги з теми "Atomic force microscopy- Nanomaterials"
Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. New Jersey: Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.
Повний текст джерелаAhmed, Touhami. Atomic Force Microscopy. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-031-02385-9.
Повний текст джерелаSantos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. New York, NY: Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.
Повний текст джерелаHaugstad, Greg. Atomic Force Microscopy. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.
Повний текст джерелаVoigtländer, Bert. Atomic Force Microscopy. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.
Повний текст джерелаPaul, West, ed. Atomic force microscopy. Oxford: Oxford University Press, 2010.
Знайти повний текст джерелаLanza, Mario, ed. Conductive Atomic Force Microscopy. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.
Повний текст джерелаMorita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.
Повний текст джерелаMorita, Seizo, Franz J. Giessibl, Ernst Meyer, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3.
Повний текст джерелаMorita, Seizo, Franz J. Giessibl, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6.
Повний текст джерелаЧастини книг з теми "Atomic force microscopy- Nanomaterials"
Baykara, Mehmet Z. "Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces." In Surface Science Tools for Nanomaterials Characterization, 273–316. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-44551-8_8.
Повний текст джерелаMaharaj, Dave, and Bharat Bhushan. "Nanomanipulation and Nanotribology of Nanoparticles and Nanotubes Using Atomic Force Microscopy." In Handbook of Nanomaterials Properties, 299–315. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-31107-9_18.
Повний текст джерелаTorres-Ventura, H. H., J. J. Chanona-Pérez, L. Dorantes-Álvarez, J. V. Méndez-Méndez, B. Arredondo-Tamayo, P. I. Cauich-Sánchez, and Ana Elena Jiménez-Carmona. "Atomic Force Microscopy Principles and Recent Studies of Imaging and Nanomechanical Properties in Bacteria." In Biogenic Nanomaterials, 49–82. Boca Raton: Apple Academic Press, 2022. http://dx.doi.org/10.1201/9781003277149-4.
Повний текст джерелаArnold, W. "Investigation of Ceramics and Ferroelectric Materials by Atomic Force Acoustic Microscopy." In Ceramic Nanomaterials and Nanotechnologies IV, 239–46. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118408049.ch24.
Повний текст джерелаEdwards-Gayle, Charlotte J. C., and Jacek K. Wychowaniec. "Characterization of Peptide-Based Nanomaterials." In Peptide Bionanomaterials, 255–308. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-29360-3_8.
Повний текст джерелаBandyopadhyay, S., S. K. Samudrala, A. K. Bhowmick, and S. K. Gupta. "Applications of Atomic Force Microscope (AFM) in the Field of Nanomaterials and Nanocomposites." In Functional Nanostructures, 504–68. New York, NY: Springer New York, 2008. http://dx.doi.org/10.1007/978-0-387-48805-9_9.
Повний текст джерелаBykov, Victor A., Arseny Kalinin, Vyatcheslav Polyakov, and Artem Shelaev. "Modern Aspects of Technologies of Atomic Force Microscopy and Scanning Spectroscopy for Nanomaterials and Nanostructures Investigations and Characterizations." In Nanoscience and Nanoengineering, 217–24. Description : Toronto; New Jersey : Apple Academic Press, 2019.: Apple Academic Press, 2018. http://dx.doi.org/10.1201/9781351138789-16.
Повний текст джерелаMarinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering, 1–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-642-35950-7_6577-3.
Повний текст джерелаMarinello, Francesco. "Atomic Force Microscopy." In CIRP Encyclopedia of Production Engineering, 93–96. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6577.
Повний текст джерелаSugawara, Yasuhiro. "Atomic Force Microscopy." In Roadmap of Scanning Probe Microscopy, 15–21. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-34315-8_3.
Повний текст джерелаТези доповідей конференцій з теми "Atomic force microscopy- Nanomaterials"
Lawn, Malcolm. "Traceable dimensional measurement of nanomaterials with Atomic Force Microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.691.
Повний текст джерелаBdikin, Igor. "MODELING THE PIEZOELECTRIC PROPERTIES OF NANOMATERIALS IN ATOMIC FORCE MICROSCOPY." In Mathematical modeling in materials science of electronic component. LCC MAKS Press, 2021. http://dx.doi.org/10.29003/m2485.mmmsec-2021/107-108.
Повний текст джерелаKamal, Ahmed, Hassan Abu Bakr, Ziyang Wang, H. El Samman, Paolo Fiorini, and Sherif Sedky. "Characterization of (Bi0.25Sb0.75)2Te3 Deposited by Pulsed Laser Deposition." In ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/mn2008-47020.
Повний текст джерелаKatakura, Kenta, Kenta Nakazawa, and Futoshi Iwata. "Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode." In 2019 International Symposium on Micro-NanoMechatronics and Human Science (MHS). IEEE, 2019. http://dx.doi.org/10.1109/mhs48134.2019.9249318.
Повний текст джерелаKarsliog˘lu, Ramazan, Hatem Akbulut, and Ahmet Alp. "CVD Nano-Crystalline Tin Oxide Coatings on Glass Substrate: The Effect of Substrate Temperature." In ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/mn2008-47075.
Повний текст джерелаZembrzycki, Krzysztof, Tomasz Aleksander Kowalewski, Sylwia Pawlowska, Justyna Chrzanowska-Gizynska, Marcin Nowak, Mateusz Walczak, and Filippo Pierini. "Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions." In Optical Trapping and Optical Micromanipulation XV, edited by Kishan Dholakia and Gabriel C. Spalding. SPIE, 2018. http://dx.doi.org/10.1117/12.2319732.
Повний текст джерелаYehia, Ahmed, Ayman A. El-Midani, Suzan S. Ibrahim, and Jan D. Miller. "Nano-Interfacial Chemistry of Waste Paper Deinking Processes Using Fatty Ethoxylates." In ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/mn2008-47005.
Повний текст джерелаGuler, Mehmet Oguz, Mirac Alaf, Deniz Gultekin, Hatem Akbulut, and Ahmet Alp. "The Effect of Pressure on the Microstructural Behavior on SnO2 Thin Films Deposited by RF Sputtering." In ASME 2008 2nd Multifunctional Nanocomposites and Nanomaterials International Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/mn2008-47071.
Повний текст джерелаLombardo, Jeffrey J., Andrew C. Lysaght, Daniel G. Goberman, and Wilson K. S. Chiu. "Growth and Characterization of Iron Nanoparticle Catalysts for Nanomaterial Synthesis." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68449.
Повний текст джерелаDongdong Zhang and Xiaoping Qian. "Scanning in atomic force microscopy." In 2009 IEEE International Conference on Robotics and Automation (ICRA). IEEE, 2009. http://dx.doi.org/10.1109/robot.2009.5152555.
Повний текст джерелаЗвіти організацій з теми "Atomic force microscopy- Nanomaterials"
Burgens, LaTashia. The Atomic Force Microscopic (AFM) Characterization of Nanomaterials. Fort Belvoir, VA: Defense Technical Information Center, June 2009. http://dx.doi.org/10.21236/ada550815.
Повний текст джерелаTurner, Joseph A. Materials Characterization by Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, April 2003. http://dx.doi.org/10.21236/ada414116.
Повний текст джерелаSnyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Fort Belvoir, VA: Defense Technical Information Center, February 1992. http://dx.doi.org/10.21236/ada246852.
Повний текст джерелаHouston, J. E., and J. G. Fleming. Non-contact atomic-level interfacial force microscopy. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/453500.
Повний текст джерелаCrone, Joshua C., Santiago Solares, and Peter W. Chung. Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples. Fort Belvoir, VA: Defense Technical Information Center, June 2007. http://dx.doi.org/10.21236/ada469876.
Повний текст джерелаSalapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, March 2009. http://dx.doi.org/10.21236/ada495364.
Повний текст джерелаNoy, A., J. J. De Yoreo, and A. J. Malkin. Carbon Nanotube Atomic Force Microscopy for Proteomics and Biological Forensics. Office of Scientific and Technical Information (OSTI), January 2002. http://dx.doi.org/10.2172/15004647.
Повний текст джерелаHaydell, Jr, and Michael W. Direct Writing of Graphene-based Nanoelectronics via Atomic Force Microscopy. Fort Belvoir, VA: Defense Technical Information Center, May 2012. http://dx.doi.org/10.21236/ada571834.
Повний текст джерелаHough, P., and V. Elings. Methods for Study of Biological Structure by Atomic Force Microscopy. Office of Scientific and Technical Information (OSTI), May 1998. http://dx.doi.org/10.2172/770449.
Повний текст джерелаKlabunde, Kenneth J., and Dong Park. Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents). Fort Belvoir, VA: Defense Technical Information Center, June 1994. http://dx.doi.org/10.21236/ada281417.
Повний текст джерела