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Статті в журналах з теми "Atom Probe Tomography Characterization"
Miller, M. K. "Atom Probe Tomography Of Interfaces." Microscopy and Microanalysis 5, S2 (August 1999): 118–19. http://dx.doi.org/10.1017/s143192760001391x.
Повний текст джерелаBagot, P. A., T. Li, E. Tsang, G. Smith, and M. P. Moody. "Atom Probe Tomography Characterization of Catalyst Nanoparticles." Microscopy and Microanalysis 19, S2 (August 2013): 1018–19. http://dx.doi.org/10.1017/s1431927613007083.
Повний текст джерелаThompson, G. B., H. L. Fraser, and M. K. Miller. "Atom Probe Tomography Characterization of Multilayer Films." Microscopy and Microanalysis 9, S02 (July 21, 2003): 574–75. http://dx.doi.org/10.1017/s1431927603442876.
Повний текст джерелаMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 10, no. 3 (June 2004): 336–41. http://dx.doi.org/10.1017/s1431927604040577.
Повний текст джерелаXiong, Xiangyuan, and Matthew Weyland. "Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography." Microscopy and Microanalysis 20, no. 4 (May 12, 2014): 1022–28. http://dx.doi.org/10.1017/s1431927614000798.
Повний текст джерелаAmouyal, Yaron, and Guido Schmitz. "Atom probe tomography—A cornerstone in materials characterization." MRS Bulletin 41, no. 1 (January 2016): 13–18. http://dx.doi.org/10.1557/mrs.2015.313.
Повний текст джерелаMiller, M. K., and E. A. Kenik. "Atom Probe Tomography: A Technique for Nanoscale Characterization." Microscopy and Microanalysis 8, S02 (August 2002): 1126–27. http://dx.doi.org/10.1017/s1431927602103709.
Повний текст джерелаPfeiffer, Björn, Torben Erichsen, Eike Epler, Cynthia A. Volkert, Piet Trompenaars, and Carsten Nowak. "Characterization of Nanoporous Materials with Atom Probe Tomography." Microscopy and Microanalysis 21, no. 3 (May 20, 2015): 557–63. http://dx.doi.org/10.1017/s1431927615000501.
Повний текст джерелаMartin, Andrew J., Ajay Kumar Kambham, and Ahmad D. Katnani. "Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs." EDFA Technical Articles 19, no. 2 (May 1, 2017): 22–30. http://dx.doi.org/10.31399/asm.edfa.2017-2.p022.
Повний текст джерелаKelly, Thomas F., Osamu Nishikawa, J. A. Panitz, and Ty J. Prosa. "Prospects for Nanobiology with Atom-Probe Tomography." MRS Bulletin 34, no. 10 (October 2009): 744–50. http://dx.doi.org/10.1557/mrs2009.249.
Повний текст джерелаДисертації з теми "Atom Probe Tomography Characterization"
Chang, Yanhong [Verfasser], Dierk [Akademischer Betreuer] Raabe, and Sandra [Akademischer Betreuer] Korte-Kerzel. "Characterization of H/D in Ti and its alloys with atom probe tomography / Yanhong Chang ; Dierk Raabe, Sandra Korte-Kerzel." Aachen : Universitätsbibliothek der RWTH Aachen, 2019. http://d-nb.info/1195238029/34.
Повний текст джерелаMühlbacher, Marlene. "High-resolution characterization of TiN diffusion barrier layers." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120394.
Повний текст джерелаHwang, Junyeon Kaufman M. J. "Characterization and mechanical properties of nanoscale precipitates in modified Al-Si-Cu alloys using transmission electron microscopy and 3D atom probe tomography." [Denton, Tex.] : University of North Texas, 2007. http://digital.library.unt.edu/permalink/meta-dc-3661.
Повний текст джерелаHwang, Junyeon. "Characterization and Mechanical Properties of Nanoscale Precipitates in Modified Al-Si-Cu Alloys Using Transmission Electron Microscopy and 3D Atom Probe Tomography." Thesis, University of North Texas, 2007. https://digital.library.unt.edu/ark:/67531/metadc3661/.
Повний текст джерелаYu, Xinghua. "Characterization and Modeling of Heat Affected Zone Microstucture in a Blast Resistant Steel." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1262201157.
Повний текст джерелаWithrow, Travis P. "Computational Modeling of Atom Probe Tomography." The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1525763934302517.
Повний текст джерелаEngberg, David. "Atom Probe Tomography of TiSiN Thin Films." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-122724.
Повний текст джерелаYang, Qifeng. "Atom probe tomography research on catalytic alloys and nanoparticles." Thesis, University of Oxford, 2018. http://ora.ox.ac.uk/objects/uuid:f3acdf37-3d23-4893-a4de-12e81712157a.
Повний текст джерелаBennett, Samantha. "Nitride semiconductors studied by atom probe tomography and correlative techniques." Thesis, University of Cambridge, 2011. https://www.repository.cam.ac.uk/handle/1810/236685.
Повний текст джерелаChen, Yi-Sheng. "Characterisation of hydrogen trapping in steel by atom probe tomography." Thesis, University of Oxford, 2017. http://ora.ox.ac.uk/objects/uuid:9d8ee66f-176d-4ac1-aad6-ccb33efc924d.
Повний текст джерелаКниги з теми "Atom Probe Tomography Characterization"
Miller, M. K. Atom Probe Tomography. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4615-4281-0.
Повний текст джерелаMiller, Michael K., and Richard G. Forbes. Atom-Probe Tomography. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3.
Повний текст джерелаLarson, David J., Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, and Thomas F. Kelly. Local Electrode Atom Probe Tomography. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-8721-0.
Повний текст джерелаLarson, David J. Local electrode atom probe tomography: A user's guide. New York: Springer, 2013.
Знайти повний текст джерелаMiller, M. K. Atom probe tomography: Analysis at the atomic level. New York: Kluwer Academic / Plenum Publishers, 2000.
Знайти повний текст джерелаAtom Probe Tomography: Analysis at the Atomic Level. Boston, MA: Springer US, 2000.
Знайти повний текст джерелаP, Moody Michael, Cairney Julie M, Ringer Simon P, and SpringerLink (Online service), eds. Atom Probe Microscopy. New York, NY: Springer New York, 2012.
Знайти повний текст джерелаAtom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 2000.
Знайти повний текст джерелаK, Miller M., Oak Ridge National Laboratory, and U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Atom probe tomography characterization of the solute distributions in a neutron-irradiated and annealed pressure vessel steel weld. Washington, DC: U.S. Nuclear Regulatory Commission, 2000.
Знайти повний текст джерелаLefebvre, Williams, Francois Vurpillot, and Xavier Sauvage. Atom Probe Tomography. Elsevier Science & Technology Books, 2016.
Знайти повний текст джерелаЧастини книг з теми "Atom Probe Tomography Characterization"
Schreiber, Daniel, and Joseph V. Ryan. "Atom Probe Tomography of Glasses." In Modern Glass Characterization, 1–39. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119051862.ch10.
Повний текст джерелаBlavette, D., F. Vurpillot, B. Deconihout, and A. Menand. "Atom Probe Tomography: 3D Imaging at the Atomic Level." In Fabrication and Characterization in the Micro-Nano Range, 201–22. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-17782-8_9.
Повний текст джерелаZhang, Tianmu, Scott R. Broderick, and Krishna Rajan. "Topological Data Analysis for the Characterization of Atomic Scale Morphology from Atom Probe Tomography Images." In Nanoinformatics, 133–55. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7617-6_7.
Повний текст джерелаLim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-67244-1_49.
Повний текст джерелаLim, Yun Soo, Dong Jin Kim, and Seong Sik Hwang. "Microstructural Characterization of Proton-Irradiated 316 Stainless Steels by Transmission Electron Microscopy and Atom Probe Tomography." In The Minerals, Metals & Materials Series, 759–72. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-030-04639-2_49.
Повний текст джерелаKelly, Thomas F. "Atom-Probe Tomography." In Springer Handbook of Microscopy, 715–63. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-00069-1_15.
Повний текст джерелаOlszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In Proceedings of the 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems — Water Reactors, 1503–17. Cham: Springer International Publishing, 2011. http://dx.doi.org/10.1007/978-3-319-48760-1_93.
Повний текст джерелаOlszta, Matthew J., Daniel K. Schreiber, Larry E. Thomas, and Stephen M. Bruemmer. "Electron Microscopy Characterizations and Atom Probe Tomography of Intergranular Attack in Alloy 600 Exposed to PWR Primary Water." In 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors, 1503–16. Hoboken, New Jersey, Canada: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118456835.ch157.
Повний текст джерелаMiller, Michael K., and Richard G. Forbes. "Introduction to Atom-Probe Tomography." In Atom-Probe Tomography, 1–49. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_1.
Повний текст джерелаMiller, Michael K., and Richard G. Forbes. "Introduction to the Physics of Field Ion Emitters." In Atom-Probe Tomography, 51–109. Boston, MA: Springer US, 2014. http://dx.doi.org/10.1007/978-1-4899-7430-3_2.
Повний текст джерелаТези доповідей конференцій з теми "Atom Probe Tomography Characterization"
Cojocaru-Miredin, Oana, Pyuck-Pa Choi, Daniel Abou-Ras, and Dierk Raabe. "Characterization of CIGS grain boundaries using Atom Probe Tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186338.
Повний текст джерелаGorman, Brian P., Andrew G. Norman, Dan Lawrence, Ty Prosa, Harvey Guthrey, and Mowafak Al-Jassim. "Atomic scale characterization of compound semiconductors using atom probe tomography." In 2011 37th IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2011. http://dx.doi.org/10.1109/pvsc.2011.6186667.
Повний текст джерелаMiller, M. K., S. Venkataraman, J. Eckert, L. Schultz, and D. Sordelet. "Atom Probe Tomography Characterization of a Gas Atomized Metallic Glass." In 2006 19th International Vacuum Nanoelectronics Conference. IEEE, 2006. http://dx.doi.org/10.1109/ivnc.2006.335295.
Повний текст джерелаVurpillot, F., M. Gruber, S. Duguay, E. Cadel, B. Deconihout, Erik M. Secula, David G. Seiler, et al. "Modeling artifacts in the analysis of test semiconductor structures in atom probe tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009. AIP, 2009. http://dx.doi.org/10.1063/1.3251216.
Повний текст джерелаWedderhoff, K., M. Ogiewa, A. Shariq, S. Teichert, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, and Erik M. Secula. "Investigation of Boron Redistribution during Silicidation in TiSi[sub 2] using Atom Probe Tomography." In FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011. AIP, 2011. http://dx.doi.org/10.1063/1.3657868.
Повний текст джерелаDiercks, David R., Jiaojiao Li, Joseph D. Beach, Colin A. Wolden, and Brian P. Gorman. "Atom probe tomography for nanoscale characterization of CdTe device absorber layers and interfaces." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925241.
Повний текст джерелаGorman, B. P. "Atomic scale chemical and structural characterization of internal interfaces with atom probe tomography." In 2008 17th IEEE International Symposium on the Applications of Ferroelectrics (ISAF). IEEE, 2008. http://dx.doi.org/10.1109/isaf.2008.4693792.
Повний текст джерелаStoffers, Andreas, Oana Cojocaru-Miredin, Otwin Breitenstein, Winfried Seifert, Stefan Zaefferer, and Dierk Raabe. "Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography." In 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC). IEEE, 2014. http://dx.doi.org/10.1109/pvsc.2014.6925089.
Повний текст джерелаSoneda, Naoki, Kenji Nishida, Kenji Dohi, Akiyoshi Nomoto, William L. Server, Milan Brumovsky, Milos Kytka, and Jack Spanner. "Microstructural Changes Related to Through-Wall Attenuation of Neutron Irradiation Embrittlement." In ASME 2010 Pressure Vessels and Piping Division/K-PVP Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/pvp2010-25636.
Повний текст джерелаRosseel, Thomas M., Mikhail A. Sokolov, Xiang Chen, and Randy K. Nanstad. "Current Status of the Characterization of RPV Materials Harvested From the Decommissioned Zion Unit 1 Nuclear Power Plant." In ASME 2017 Pressure Vessels and Piping Conference. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/pvp2017-65090.
Повний текст джерелаЗвіти організацій з теми "Atom Probe Tomography Characterization"
Miller, M. K. Atom Probe Tomography Characterization of the Solute Distributions in a Neutron-Irradiated and Annealed Pressure Vessel Steel Weld. Office of Scientific and Technical Information (OSTI), January 2001. http://dx.doi.org/10.2172/777685.
Повний текст джерелаEdmondson, Philip D. An On-Axis Tomography Holder for Correlative Electron and Atom Probe Microscopy. Office of Scientific and Technical Information (OSTI), October 2018. http://dx.doi.org/10.2172/1479802.
Повний текст джерелаSanford, Norman A. Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures. National Institute of Standards and Technology, April 2022. http://dx.doi.org/10.6028/nist.tn.2201.
Повний текст джерелаWells, Peter, and G. Robert Odette. Status Summary of FY16 Atom Probe Tomography Studies on UCSB ATR-2 Irradiated RPV Steels. Office of Scientific and Technical Information (OSTI), May 2016. http://dx.doi.org/10.2172/1364468.
Повний текст джерелаKnipling, Keith, Fred Meisenkothen, and Eric B. Steel. Proceedings of the International Conference on Atom-Probe Tomography and Microscopy (APT&M 2018). National Institute of Standards and Technology, December 2019. http://dx.doi.org/10.6028/nist.sp.2100-03.
Повний текст джерелаTiley, J., O. Senkov, G. Viswanathan, S. Nag, R. Banerjee, and J. Hwang. Determination of Gamma-Prime Site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-Ray Diffraction (Preprint). Fort Belvoir, VA: Defense Technical Information Center, August 2012. http://dx.doi.org/10.21236/ada563340.
Повний текст джерела