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Статті в журналах з теми "Analyse des circuits"
Flatscher, Matthias, Markus Neumayer, Thomas Bretterklieber, and Hannes Wegleiter. "Transmission Lines in Capacitance Measurement Systems: An Investigation of Receiver Structures." Sensors 23, no. 3 (January 19, 2023): 1148. http://dx.doi.org/10.3390/s23031148.
Повний текст джерелаFouad Hanna, Victor, Joseph Achkar, Odile Picon, Jacques Citerne, M’hamed Drissi, and Chakir Amrani. "Analyse de Circuits Passifs en Technologie Microruban Suspendu." Annales Des Télécommunications 47, no. 11-12 (November 1992): 515–29. http://dx.doi.org/10.1007/bf02998314.
Повний текст джерелаARYA, SUNIL, MORDECAI J. GOLIN, and KURT MEHLHORN. "On the Expected Depth of Random Circuits." Combinatorics, Probability and Computing 8, no. 3 (May 1999): 209–28. http://dx.doi.org/10.1017/s096354839900382x.
Повний текст джерелаMihaylenko, V., J. Chunyak, and V. Bachinskiy. "Analysis of processes in converter with eleven zone regulation output voltage." POWER ENGINEERING: economics, technique, ecology, no. 3 (April 6, 2020): 35–40. http://dx.doi.org/10.20535/1813-5420.3.2020.228610.
Повний текст джерелаLi, Quan. "To Prosecute or Not to Prosecute, That is the Question: Agency Litigation under the Influence of Appellate Courts." Canadian Journal of Political Science 45, no. 1 (March 2012): 185–205. http://dx.doi.org/10.1017/s0008423911000953.
Повний текст джерелаMarani, R., and A. G. Perri. "Review—Thermal Effects in the Design of CNTFET-Based Digital Circuits." ECS Journal of Solid State Science and Technology 11, no. 4 (April 1, 2022): 041006. http://dx.doi.org/10.1149/2162-8777/ac63e6.
Повний текст джерелаQuinones, Gloria, and Iris Duhn. "Circuits of sympathy: Posthuman child, vibrant forces, things and places." Contemporary Issues in Early Childhood 23, no. 3 (September 2022): 237–52. http://dx.doi.org/10.1177/14639491221117223.
Повний текст джерелаKhatibi, Mahmood, and Hasan Modir Shanechi. "Using a modified Modal Series to analyse weakly nonlinear circuits." International Journal of Electronics 102, no. 9 (November 25, 2014): 1457–74. http://dx.doi.org/10.1080/00207217.2014.982212.
Повний текст джерелаBremer, J. K., C. Zemko, J. Schmackers, and W. Mathis. "Analyse und Entwurf von hochbitratigen Clock-and-Data-Recovery Schaltungen in CMOS-Technologie." Advances in Radio Science 5 (June 13, 2007): 215–19. http://dx.doi.org/10.5194/ars-5-215-2007.
Повний текст джерелаМihaylenko, V., J. Chunyak, K. Trubitsin, and V. Bachynskiy. "MATHEMATICAL MODEL OF A TWELVE-PULSE CONVERTER WITH SIXTEEN ZONE CONTROL OF THE OUTPUT VOLTAGE AND ACTIVE-INDUCTIVE LOADS." Collection of scholarly papers of Dniprovsk State Technical University (Technical Sciences) 2, no. 37 (April 23, 2021): 68–72. http://dx.doi.org/10.31319/2519-2884.37.2020.13.
Повний текст джерелаДисертації з теми "Analyse des circuits"
Melcher, Elmar. "Analyse temporelle de circuits combinatoires /." Paris : Ecole nationale supérieure des télécommunications, 1993. http://catalogue.bnf.fr/ark:/12148/cb355884954.
Повний текст джерелаOndo, Ossa Albert. "Analyse des circuits financiers au Gabon." Nancy 2, 1985. http://www.theses.fr/1985NAN20005.
Повний текст джерелаBENBOUDJEMA, KAMEL. "Analyse symbolique des circuits micro-ondes." Paris 6, 1995. http://www.theses.fr/1995PA066524.
Повний текст джерелаOrdas, Thomas. "Analyse des émissions électromagnétiques des circuits intégrés." Thesis, Montpellier 2, 2010. http://www.theses.fr/2010MON20001.
Повний текст джерелаIn the area of secure integrated circuits, such as smart cards, circuit designers are always looking to innovate to find new countermeasures against attacks by the various side channels that exist today. Indeed, side channels attacks such as the analysis of electromagnetic emissions permit to extract secret information contained in circuits. Based on this observation, in this thesis, we focused on the study of electromagnetic analysis to observe the analysis possibilities. This manuscript is organized as follows. Initially, we presented a measurement system for electromagnetic emissions in time domain, and the results obtained on different circuits. From these results, a summary of opportunities, relating to the security threat, posed by electromagnetic analysis, is proposed as well as solutions proposals to reduce electromagnetic radiations of integrated circuits. In a second step, we are interested in the simulation of electromagnetic emissions. A state of the art of simulation tools which exist today, has allowed us to demonstrate that none of them allowed to have a fine enough resolution in terms of electromagnetic emissions. To fill this gap, a simulation tool has been developed and to validate this flow, a comparison between measurement results and simulation results was performed
Romefort, Dominique Villedieu. "Analyse statistique des circuits intégrès : caractérisation des modèles." Toulouse 3, 1990. http://www.theses.fr/1990TOU30087.
Повний текст джерелаDehbaoui, Amine. "Analyse Sécuritaire des Émanations Électromagnétiques des Circuits Intégrés." Thesis, Montpellier 2, 2011. http://www.theses.fr/2011MON20020.
Повний текст джерелаThe integration of cryptographic primitives in different electronic devices is widely used today incommunications, financial services, government services or PayTV.Foremost among these devices include the smart card. According to a report published in August 2010, IMS Research forecasts that the smart card market will reach 5.8 billion units sold in this year. The vast majority is used in telecommunications (SIM) and banking.The smart card incorporates an integrated circuit which can be a dedicated processor for cryptographic calculations. Therefore, these integrated circuits contain secrets such as secret or private keys used by the symmetric or asymmetric cryptographic algorithms. These keys must remain absolutely confidential to ensure the safety chain.Therefore the robustness of smart cards against attacks is crucial. These attacks can be classifiedinto three main categories: invasive, semi-invasive and non-invasive.Non-invasive attacks can be considered the most dangerous, since this kind of attack can be achieved without any contact with the circuit.Indeed, while using electronic circuits that compose them are subjected to variations in current and voltage. These variations generate an electromagnetic radiation propagating in the vicinity of the circuit.These radiations are correlated with secret information (eg a secret key used for authentication). Several attacks based on these leakages were published by the scientific community.This thesis aims to: (a) understand the different sources of electromagnetic emanations of integrated circuits, and propose a localized near field attack to test the robustness of a cryptographic circuit and (b) propose counter-measures to these attacks
Laurent, Jacques. "Projet ACIME analyse des circuits intégrés par microscopie électronique /." S.l. : Université Grenoble 1, 2008. http://tel.archives-ouvertes.fr/tel-00311762.
Повний текст джерелаKALFANE, ANISHA. "Analyse de la sensibilite technologique des circuits integres gaas." Université Louis Pasteur (Strasbourg) (1971-2008), 1993. http://www.theses.fr/1993STR13215.
Повний текст джерелаRebaï, Mohamed Mehdi. "Analyse des circuits intégrés par laser en mode sonde." Thesis, Bordeaux, 2014. http://www.theses.fr/2014BORD0362/document.
Повний текст джерелаThe main objective of the presented research work in this PhD thesis is to help to understand the different mechanisms and phenomena involved in the interaction of a laser with a semiconductor in the analysis of a submicron integrated circuit. The aim is to master and improve the Electro Optical Probing techniques. Miniaturization and densification of electronic components lead the failure analysis techniques using Laser to their limits. Knowing the impact of different physical, optical and electrical parameters on a probing analysis is a key to improve the understanding the measured EOP signals. These studies also show the significant effect of temperature on the EOP techniques
Yahya, Eslam. "Modélisation, analyse et optimisation des performances des circuits asynchrones multi-protocoles." Grenoble INPG, 2009. http://www.theses.fr/2009INPG0145.
Повний текст джерелаAsynchronous circuits show potential interest from many aspects. However modeling, analysis and optimization of asynchronous circuits are stumbling blocks to spread this technology on commercial level. This thesis concerns the development of asynchronous circuit modeling method which is based on analytical models for the underlying handshaking protocols. Based on this modeling method, a fast and accurate circuit analysis method is developed. This analysis provides a full support for statistically variable delays and is able to analyze different circuit structures (Linear/Nonlinear, Unconditional/Conditional). In addition, it enables the implementation of timing analysis, power analysis and process-effect analysis for asynchronous circuits. On top of these modeling and analysis methods, an optimization technique has been developed. This optimization technique is based on selecting the minimum number of asynchronous registers required for satisfying the performance constraints. By using the proposed methods, the asynchronous handshaking protocol effect on speed, power consumption distribution and effect of process variability is studied. For validating the proposed methods, a group of tools is implemented using C++, Java and Matlab. These tools show high efficiency, high accuracy and fast time response
Книги з теми "Analyse des circuits"
Analyse de circuits: Introduction. 2nd ed. Montréal: Éditions du Renouveau pédagogique, 1985.
Знайти повний текст джерелаMange, Daniel. Analyse et synthèse des systèmes logiques. 4th ed. Lausanne: Presses Polytechniques Romandes, 1987.
Знайти повний текст джерелаBoylestad's circuit analysis. 3rd ed. Toronto: Pearson Prentice Hall, 2004.
Знайти повний текст джерелаParanjothi, S. R. Electric Circuit Analysis. 3rd ed. London: New Academic Science, 2010.
Знайти повний текст джерелаA, Bell David. Fundamentals of electric circuits. 7th ed. Don Mills, Ont: Oxford University Press, 2009.
Знайти повний текст джерелаIrwin, J. David. Basic engineering circuit analysis. 5th ed. Upper Saddle River, N.J: Prentice Hall, 1996.
Знайти повний текст джерелаIrwin, J. David. Basic engineering circuit analysis. 3rd ed. New York: Macmillan, 1989.
Знайти повний текст джерелаM, Nelms R., ed. Basic engineering circuit analysis. 8th ed. Hoboken, NJ: J. Wiley & Sons, 2005.
Знайти повний текст джерелаBasic engineering circuit analysis. 2nd ed. New York: Macmillan Pub. Co., 1987.
Знайти повний текст джерелаIrwin, J. David. Basic engineering circuit analysis. 4th ed. New York: Macmillan, 1993.
Знайти повний текст джерелаЧастини книг з теми "Analyse des circuits"
Zheng, Yang, Wushuang Liu, Xuan Zhou, Wanying Liu, and Qijuan Chen. "Complex Frequency-Domain Oscillation Analysis of the Pumped-Storage Systems." In Lecture Notes in Civil Engineering, 439–44. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-2532-2_37.
Повний текст джерелаLakin, Matthew R., Carlo Spaccasassi, and Andrew Phillips. "Computational Design of Nucleic Acid Circuits: Past, Present, and Future." In Natural Computing Series, 311–46. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-9891-1_18.
Повний текст джерелаKaufmann, Daniela, and Armin Biere. "AMulet 2.0 for Verifying Multiplier Circuits." In Tools and Algorithms for the Construction and Analysis of Systems, 357–64. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-72013-1_19.
Повний текст джерелаTakhar, Gourav, Ramesh Karri, Christian Pilato, and Subhajit Roy. "HOLL: Program Synthesis for Higher Order Logic Locking." In Tools and Algorithms for the Construction and Analysis of Systems, 3–24. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-99524-9_1.
Повний текст джерелаCraig, Edwin C. "Integrated Circuits." In Electronics via Waveform Analysis, 237–78. New York, NY: Springer New York, 1993. http://dx.doi.org/10.1007/978-1-4612-4338-0_12.
Повний текст джерелаBáez-Lópe, David, and Félix E. Guerrero-Castro. "Digital Circuits." In Circuit Analysis with Multisim, 159–80. Cham: Springer International Publishing, 2011. http://dx.doi.org/10.1007/978-3-031-79840-5_6.
Повний текст джерелаBrzozowski, Janusz A., and Carl-Johan H. Seger. "Symbolic Analysis." In Asynchronous Circuits, 275–311. New York, NY: Springer New York, 1995. http://dx.doi.org/10.1007/978-1-4612-4210-9_14.
Повний текст джерелаMorris, Noel M. "Polyphase Circuits." In Electrical Circuit Analysis and Design, 144–70. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-22560-6_7.
Повний текст джерелаGlisson, Tildon H. "Equivalent Circuits." In Introduction to Circuit Analysis and Design, 83–112. Dordrecht: Springer Netherlands, 2010. http://dx.doi.org/10.1007/978-90-481-9443-8_4.
Повний текст джерелаMay, Colin. "DC Circuits." In Passive Circuit Analysis with LTspice®, 41–100. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-38304-6_2.
Повний текст джерелаТези доповідей конференцій з теми "Analyse des circuits"
Sharma, Vijender Kumar, Jai Narayan Tripathi, and Hitesh Shrimali. "An Inspection Based Method to Analyse Deterministic Noise in N-port Circuits." In 2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS). IEEE, 2020. http://dx.doi.org/10.1109/epeps48591.2020.9231394.
Повний текст джерелаKorotyeyev, Igor, and Marius Klytta. "Analyse of steady-state process in circuits with incommensurable frequencies of voltage sources." In 2016 2nd International Conference on Intelligent Energy and Power Systems (IEPS). IEEE, 2016. http://dx.doi.org/10.1109/ieps.2016.7521846.
Повний текст джерелаReig, Càndid, and María-Dolores Cubells-Beltrán. "Circuit simulators for circuit analysis in graduate engineering courses." In Fourth International Conference on Higher Education Advances. Valencia: Universitat Politècnica València, 2018. http://dx.doi.org/10.4995/head18.2018.8030.
Повний текст джерелаCui, Qiang, Yan Han, Juin J. Liou, and Shurong Dong. "Analyse of Protection Devices' Speed Performance against ESD under CDM Using TCAD." In 2007 IEEE Conference on Electron Devices and Solid-State Circuits. IEEE, 2007. http://dx.doi.org/10.1109/edssc.2007.4450166.
Повний текст джерелаRammohan, Rathi Adarshi, Jeevan Medikonda, and Dan Issac Pothiyil. "Speech Signal-Based Modelling of Basic Emotions to Analyse Compound Emotion: Anxiety." In 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER). IEEE, 2020. http://dx.doi.org/10.1109/discover50404.2020.9278094.
Повний текст джерелаKeyes, Edward, and Jason Abt. "An Advanced Integrated Circuit Analysis System." In ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0398.
Повний текст джерелаHuang, Jiang, Junsheng Yu, Nana Wang, and Yadong Jiang. "Energy losing analyse of organic solar cells based on pentacene and C60." In 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2009. http://dx.doi.org/10.1109/ipfa.2009.5232573.
Повний текст джерелаWen, Gaojie, Xiaocui Li, Li Tian, and Jun Ren. "Dynamic current monitoring and probe laser simulation strategy to analyse complicated functional failure on mixed signal integrated circuit." In 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2017. http://dx.doi.org/10.1109/ipfa.2017.8060073.
Повний текст джерелаNguyen, Dat, Bob Davis, and Corey Lewis. "Copper Bond Over Active Circuit (BOAC) and Copper Over Anything (COA) Failure Analysis." In ISTFA 2003. ASM International, 2003. http://dx.doi.org/10.31399/asm.cp.istfa2003p0076.
Повний текст джерелаSedykh, Sergey, Dmitriy Gadashev, and Alexandr Drakin. "METHODS OF REDUCING PULSATIONS OF LIGHT FLOW IN LED LIGHT SOURCES." In CAD/EDA/SIMULATION IN MODERN ELECTRONICS 2019. Bryansk State Technical University, 2019. http://dx.doi.org/10.30987/conferencearticle_5e028213f33ad1.39341792.
Повний текст джерелаЗвіти організацій з теми "Analyse des circuits"
Shonhe, Toendepi. Covid-19 and the Political Economy of Tobacco and Maize Commodity Circuits: Makoronyera, the ‘Connected’ and Agrarian Accumulation in Zimbabwe. Institute of Development Studies (IDS), March 2021. http://dx.doi.org/10.19088/apra.2021.009.
Повний текст джерелаBlakely, Scott. Probabilistic Analysis for Reliable Logic Circuits. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.1859.
Повний текст джерелаBurns, Steven M., and Alain J. Martin. Performance Analysis and Optimization of Asynchronous Circuits. Fort Belvoir, VA: Defense Technical Information Center, January 1990. http://dx.doi.org/10.21236/ada447734.
Повний текст джерелаROME AIR DEVELOPMENT CENTER GRIFFISS AFB NY. Automated Sneak Circuit Analysis Technique. Fort Belvoir, VA: Defense Technical Information Center, June 1990. http://dx.doi.org/10.21236/ada279354.
Повний текст джерелаLippmann, B. A. Equivalent circuit analysis of sled. Office of Scientific and Technical Information (OSTI), May 1986. http://dx.doi.org/10.2172/5596307.
Повний текст джерелаWheat, Jr., Robert M. Chaos in Electronic Circuits: Nonlinear Time Series Analysis. Office of Scientific and Technical Information (OSTI), July 2003. http://dx.doi.org/10.2172/821547.
Повний текст джерелаBacon, L. D., and R. P. Toth. LineCAP (Line/Circuit Analysis Program): Cross-coupling on PC (printed circuit) board traces including discontinuities and circuit elements. Office of Scientific and Technical Information (OSTI), June 1989. http://dx.doi.org/10.2172/6038898.
Повний текст джерелаBrandt, Howard E. Quantum Computer Circuit Analysis and Design. Fort Belvoir, VA: Defense Technical Information Center, February 2009. http://dx.doi.org/10.21236/ada494934.
Повний текст джерелаRELIABILITY ANALYSIS CENTER GRIFFISS AFB NY. Worst Case Circuit Analysis Application Guidelines. Fort Belvoir, VA: Defense Technical Information Center, January 1993. http://dx.doi.org/10.21236/ada278216.
Повний текст джерелаOler, Kiri J., and Carl H. Miller. Reverse Engineering Integrated Circuits Using Finite State Machine Analysis. Office of Scientific and Technical Information (OSTI), April 2016. http://dx.doi.org/10.2172/1417449.
Повний текст джерела