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Статті в журналах з теми "AFM PROCESS"
Walia, R. S., H. S. Shan, and P. Kumar. "Enhancing AFM process productivity through improved fixturing." International Journal of Advanced Manufacturing Technology 44, no. 7-8 (February 4, 2009): 700–709. http://dx.doi.org/10.1007/s00170-008-1893-7.
Повний текст джерелаFite, Kelby, E. Thomas Smiley, John McIntyre, and Christina Wells. "Evaluation of a Soil Decompaction and Amendment Process for Urban Trees." Arboriculture & Urban Forestry 37, no. 6 (November 1, 2011): 293–300. http://dx.doi.org/10.48044/jauf.2011.038.
Повний текст джерелаBao, Tim. "Traceable Dimension Metrology by AFM for Nanoscale Process Control." Key Engineering Materials 381-382 (June 2008): 549–52. http://dx.doi.org/10.4028/www.scientific.net/kem.381-382.549.
Повний текст джерелаMangesh, Gharat Saurabh, and Aviral Misra. "Finite element analysis of viscoelastic media used in abrasive flow machining process." IOP Conference Series: Materials Science and Engineering 1248, no. 1 (July 1, 2022): 012005. http://dx.doi.org/10.1088/1757-899x/1248/1/012005.
Повний текст джерелаMekid, Samir. "In-Process Atomic-Force Microscopy (AFM) Based Inspection." Sensors 17, no. 6 (May 31, 2017): 1194. http://dx.doi.org/10.3390/s17061194.
Повний текст джерелаBabicz, S., A. Zieliński, J. Smulko, and K. Darowicki. "Corrosion process monitoring by AFM higher harmonic imaging." Measurement Science and Technology 28, no. 11 (October 18, 2017): 114001. http://dx.doi.org/10.1088/1361-6501/aa844a.
Повний текст джерелаCambel, V., J. Martaus, J. Šoltýs, R. Kúdela, and D. Gregušová. "AFM nanooxidation process – Technology perspective for mesoscopic structures." Surface Science 601, no. 13 (July 2007): 2717–23. http://dx.doi.org/10.1016/j.susc.2006.12.058.
Повний текст джерелаHu, Xiaodong, and Xiaotang Hu. "Analysis of the process of anodization with AFM." Ultramicroscopy 105, no. 1-4 (November 2005): 57–61. http://dx.doi.org/10.1016/j.ultramic.2005.06.018.
Повний текст джерелаSato, Takashi, Stephen Wan, and Yu Jing Ang. "Study of Process Characteristics of Abrasive Flow Machining (AFM) for Ti-6Al-4V and Validation with Process Model." Advanced Materials Research 797 (September 2013): 411–16. http://dx.doi.org/10.4028/www.scientific.net/amr.797.411.
Повний текст джерелаGupta, Ravi, Rahul O. Vaishya, Dr R. S. Walia Dr. R.S Walia, and Dr P. K. Kalra Dr. P.K Kalra. "Experimental Study of Process Parameters On Material Removal Mechanism in Hybrid Abrasive Flow Machining Process (AFM)." International Journal of Scientific Research 2, no. 6 (June 1, 2012): 234–37. http://dx.doi.org/10.15373/22778179/june2013/75.
Повний текст джерелаДисертації з теми "AFM PROCESS"
Al-Musawi, Raheem. "Theoretical and experimental investigations about the AFM tip-based nanomachining process." Thesis, Cardiff University, 2016. http://orca.cf.ac.uk/99795/.
Повний текст джерелаCOSENTINO, MICHELA. "AFM-STED correlative nanoscopy provides a new view on the formation process of misfolded protein aggregates." Doctoral thesis, Università degli studi di Genova, 2019. http://hdl.handle.net/11567/939919.
Повний текст джерелаDHULL, SACHIN. "INVESTIGATION OF HYBRID ELECTROCHEMICAL AND MAGNETIC FIELD ASSISTED ABRASIVE FLOW FINISHING PROCESS." Thesis, DELHI TECHNOLOGICAL UNIVERSITY, 2021. http://dspace.dtu.ac.in:8080/jspui/handle/repository/18780.
Повний текст джерелаPIANIGIANI, MICHELE. "Nano Imprinting Lithography Ultrafast process and its chemical and physical effects on advanced plastic materials." Doctoral thesis, Università degli Studi di Trieste, 2017. http://hdl.handle.net/11368/2908135.
Повний текст джерелаHoward, Mitchell James. "Development of a machine-tooling-process integrated approach for abrasive flow machining (AFM) of difficult-to-machine materials with application to oil and gas exploration componenets." Thesis, Brunel University, 2014. http://bura.brunel.ac.uk/handle/2438/9262.
Повний текст джерелаSörensen, Malin Helena. "Mesostructured particulate silica materials with tunable pore size : Synthesis, characterization and applications." Doctoral thesis, KTH, Ytkemi (stängd 20081231), 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-10089.
Повний текст джерелаQC 20100811
Martin, Lucile. "Etude de l'oxyde de cuivre CuO, matériau de conversion en film mince pour microbatteries au lithium : caractérisation des processus électrochimiques et chimiques en cyclage." Thesis, Pau, 2013. http://www.theses.fr/2013PAUU3027/document.
Повний текст джерелаThe miniaturization of electronic components and the increasing number of their functionalities lead to the development of suitable energy microsources, among which lithium microbatteries appear. Despite the excellent performances of these all-solid-state electrochemical power sources, one main limitation that remains is their surface capacity. Its value being intrinsically connected to the nature of electrode materials, we chose to focus on CuO thin films which are characterized by a theoretical volumetric capacity (426 µAh .cm-2.µm-1) in far larger than the one of conventional intercalation materials used today. Indeed, this material reacts with lithium according to a particular mechanism, referred as conversion reaction, inducing the formation of a multiphase nanostructured system with a high complexity. In the framework of this study, understanding of electrochemical and chemical mechanisms which take place during the cycling of copper oxide thin films (CuO) was the main objective. This one has required a fine characterization of the electrode active material and the generated interfaces (solid/solid interfaces and solid/electrolyte interface). These studies have been mainly carried out with X-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM) and theoretical approaches based on quantum chemistry methods. The chemical and morphological properties of the cycled CuO thin films have been linked to their electrochemical behavior. An important influence of their initial structure and morphology was then evidenced
Combes, Julien. "Etude de l'adhésion d'ostéoblastes sur substituts apatitiques par microscopie à force atomique." Phd thesis, Ecole Nationale Supérieure des Mines de Saint-Etienne, 2009. http://tel.archives-ouvertes.fr/tel-00445705.
Повний текст джерелаDoskočilová, Veronika. "Využití agentů v business procesech." Master's thesis, Vysoká škola ekonomická v Praze, 2011. http://www.nusl.cz/ntk/nusl-124783.
Повний текст джерелаDario, Alan de Genaro. "Processos de Cox com intensidade difusiva afim." Universidade de São Paulo, 2011. http://www.teses.usp.br/teses/disponiveis/45/45133/tde-01052013-111713/.
Повний текст джерелаThis Thesis deals with the Cox Process when its intensity belongs to a family of affine diffusions. The form of the probability density function of the Cox process is obtained when the density is described by an arbitrary d-dimensional affine diffusion. Coupling and convergence results are also addressed for a general Cox process with affine intensity. We adopted the Feller diffusion for driving the underlying intensity of the Cox Process to illustrate our results. Additionally the parameters of the underlying intensity processes are estimated by means of the Kalman Filter in conjunction with Quasi-Maximum Likelihood estimation.
Книги з теми "AFM PROCESS"
editor, Malik Lokendra, and Arora Manish editor, eds. The chief justice speaks: Selected judicial and extra-judicial reflections of Justice A.M. Ahmadi. Gurgaon, Haryana, India: Universal Law Publishing, an imprint of LexisNexis, 2016.
Знайти повний текст джерелаMaryLynn, Jacobs, and Austin Noelle, eds. Splinting the hand and upper extremity: Principles and process. Baltimore, Md: Lippincott Williams & Wilkins, 2003.
Знайти повний текст джерелаUnited States. Department of Justice, ed. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10: 30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Department of Justice, 1985.
Знайти повний текст джерелаMeese, Edwin. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10:30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Dept. of Justice, 1985.
Знайти повний текст джерелаSaral, Melek. Turkey's 'Self' and 'Other' Definitions in the Course of the EU Accession Process. NL Amsterdam: Amsterdam University Press, 2017. http://dx.doi.org/10.5117/9789462981171.
Повний текст джерелаBabalis, Dimitra, ed. Ecological design for an effective urban regeneration. Florence: Firenze University Press, 2004. http://dx.doi.org/10.36253/88-8453-146-2.
Повний текст джерелаLangbein, Hermann. Auschwitz przed sądem: Proces w Frankfurcie nad Menem 1963-1965 : dokumentacja. Wrocław: Via Nova, 2011.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Final test report for the qualification of the gristblast assembly and process for the inside diameter of the RSRM forward and aft domes. Brigham City, UT: Thiokol Corporation Space Operations, 1992.
Знайти повний текст джерелаCompliance review process and missile defense: Hearing before the Subcommittee on International Security, Proliferation, and Federal Services of the Committee on Governmental Affairs, United States Senate, One Hundred Fifth Congress, first session, July 21, 1997. Washington: U.S. G.P.O., 1997.
Знайти повний текст джерелаConference on Thermal Analysis of Molten Aluminum (1984 Rosemont, Ill.). Thermal analysis of molten aluminum: A new in-process technique for quality control : proceedings of the AFS/CMI Conference, December 11-12, 1984, Sheraton International at O'Hare, Rosemont, Illinois. Des Plaines, IL: Cast Metals Institute, 1985.
Знайти повний текст джерелаЧастини книг з теми "AFM PROCESS"
Yan, Yong Da, Tao Sun, and Shen Dong. "Study on Effects of the Feed on AFM-Based Nanomachining Process." In Materials Science Forum, 257–60. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-421-9.257.
Повний текст джерелаMatsumoto, Kazuhiko. "Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process." In Applied Scanning Probe Methods, 459–67. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-642-35792-3_16.
Повний текст джерелаYan, Yong Da, Tao Sun, Shen Dong, and Ying Chun Liang. "MD Analysis on Tip Geometry Effects in AFM-Based Lithography Process." In Progress of Precision Engineering and Nano Technology, 228–33. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-430-8.228.
Повний текст джерелаKim, Y. S., S. O. Choi, S. R. Lee, and J. Kim. "An Atomic Simulation of AFM-Based Nano Lithography Process for Nano Patterning." In Solid Mechanics and its Applications, 331–41. Dordrecht: Springer Netherlands, 2004. http://dx.doi.org/10.1007/978-1-4020-2111-4_32.
Повний текст джерелаChaturvedi, Rishabh, and Pankaj Kumar Singh. "Analysis of the Factors Affecting MRR in AFM and Centrifugal Process Using Taguchi Method." In Lecture Notes in Mechanical Engineering, 393–99. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-1328-2_36.
Повний текст джерелаKrüger, Daniel, Roger Rousseau, Dominik Marx, Harald Fuchs, and Michele Parrinello. "Car-Parrinello Density Functional Calculations of the Bond Rupture Process of Thiolate on Gold in AFM Measurements: Progress and First Results." In High Performance Computing in Science and Engineering 2000, 257–72. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-56548-9_20.
Повний текст джерелаSem, Helle Frisak, Steinar Carlsen, and Gunnar John Coll. "On Two Approaches to ACM." In Business Process Management Workshops, 12–23. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_3.
Повний текст джерелаSwenson, Keith D. "Position: BPMN Is Incompatible with ACM." In Business Process Management Workshops, 55–58. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_7.
Повний текст джерелаGroßmann, K., A. Hardtmann, H. Wiemer, L. Penter, and S. Kriechenbauer. "Advanced Forming Process Model - AFPM." In Lecture Notes in Production Engineering, 383–401. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-32448-2_17.
Повний текст джерелаTran Thi Kim, Thanh, Erhard Weiss, Christoph Ruhsam, Christoph Czepa, Huy Tran, and Uwe Zdun. "Embracing Process Compliance and Flexibility Through Behavioral Consistency Checking in ACM." In Business Process Management Workshops, 43–54. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-42887-1_4.
Повний текст джерелаТези доповідей конференцій з теми "AFM PROCESS"
Kizu, Ryosuke, Ichiko Misumi, Akiko Hirai, and Satoshi Gonda. "Photoresist shrinkage observation by a metrological tilting-AFM." In Metrology, Inspection, and Process Control XXXVII, edited by John C. Robinson and Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2655566.
Повний текст джерелаvan Reijzen, Maarten E., Mehmet S. Tamer, Maarten H. van Es, Martijn M. C. J. M. van Riel, Sasan Keyvani, Hamed Sadeghian, and Marco van der Lans. "Improved sub-surface AFM using photothermal actuation." In Metrology, Inspection, and Process Control for Microlithography XXXIII, edited by Ofer Adan and Vladimir A. Ukraintsev. SPIE, 2019. http://dx.doi.org/10.1117/12.2515441.
Повний текст джерелаHu, Z. J., Y. D. Yan, Y. H. Zhang, T. Sun, and S. Dong. "Penetrating Process Analysis of AFM Diamond Tip." In 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21109.
Повний текст джерелаPromyoo, Rapeepan, Hazim El-Mounayri, and Kody Varahramyan. "AFM-Based Nanoindentation Process: A Comparative Study." In ASME 2012 International Manufacturing Science and Engineering Conference collocated with the 40th North American Manufacturing Research Conference and in participation with the International Conference on Tribology Materials and Processing. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/msec2012-7356.
Повний текст джерелаBreton, Mary A., Jennifer Fullam, Lan Yu, Dexin Kong, Daniel Schmidt, Andrew Greene, Liying Jiang, Sean Hand, and Jason Osborne. "AFM characterization for Gate-All-Around (GAA) devices." In Metrology, Inspection, and Process Control for Microlithography XXXIV, edited by Ofer Adan and John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551931.
Повний текст джерелаCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday, and David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection." In Metrology, Inspection, and Process Control XXXVII, edited by John C. Robinson and Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2658485.
Повний текст джерелаCerbu, Dorin, Kristof Paredis, Alain Moussa, Anne-Laure Charley, and Philippe Leray. "Deep learning-enabled vertical drift artefact correction for AFM images." In Metrology, Inspection, and Process Control XXXVI, edited by John C. Robinson and Matthew J. Sendelbach. SPIE, 2022. http://dx.doi.org/10.1117/12.2614029.
Повний текст джерелаCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday, and David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection (Erratum)." In Metrology, Inspection, and Process Control XXXVII, edited by John C. Robinson and Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.3005374.
Повний текст джерелаLiu, Hao-Chih, David Fong, Gregory A. Dahlen, Marc Osborn, Sean Hand, and Jason R. Osborne. "Carbon nanotube AFM probes for microlithography process control." In SPIE 31st International Symposium on Advanced Lithography, edited by Chas N. Archie. SPIE, 2006. http://dx.doi.org/10.1117/12.656807.
Повний текст джерелаKizu, Ryosuke, Ichiko Misumi, Akiko Hirai, and Satoshi Gonda. "Comparison of SEM and AFM performances for LER reference metrology." In Metrology, Inspection, and Process Control for Microlithography XXXIV, edited by Ofer Adan and John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551468.
Повний текст джерелаЗвіти організацій з теми "AFM PROCESS"
Hedgecock, Nancy S. Hexavalent Chromium Reduction Pretreatment Process Evaluation, Randolph AFB, Texas. Fort Belvoir, VA: Defense Technical Information Center, September 1990. http://dx.doi.org/10.21236/ada228805.
Повний текст джерелаSisterson, Douglas. ARM Lead Mentor Selection Process and Key Roles and Responsibilities. Office of Scientific and Technical Information (OSTI), January 2018. http://dx.doi.org/10.2172/1418462.
Повний текст джерелаBaca, Ana. Assessment of AFM - KPFM and SSRM for Measuring and Characterizing Materials Aging Processes. Office of Scientific and Technical Information (OSTI), November 2020. http://dx.doi.org/10.2172/1733233.
Повний текст джерелаSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), February 2001. http://dx.doi.org/10.2172/775070.
Повний текст джерелаSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), February 2001. http://dx.doi.org/10.2172/775071.
Повний текст джерелаSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), August 2000. http://dx.doi.org/10.2172/760271.
Повний текст джерелаSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), August 2000. http://dx.doi.org/10.2172/760272.
Повний текст джерелаMcHale, James, Timothy A. Chick, and Eugene Miluk. Implementation Guidance for the Accelerated Improvement Method (AIM). Software Engineering Process Management: Special Report. Fort Belvoir, VA: Defense Technical Information Center, December 2010. http://dx.doi.org/10.21236/ada536176.
Повний текст джерелаKroll, Joshua A. ACM TechBrief: Facial Recognition Technology. ACM, February 2022. http://dx.doi.org/10.1145/3520137.
Повний текст джерелаDooraghi, Michael R., Afshin M. Andreas, Mark C. Kutchenreiter, Ibrahim M. Reda, Marta Stoddard, Manajit Sengupta, and Aron M. Habte. Broadband Outdoor Radiometer Calibration (BORCAL) Process for the Atmospheric Radiation Measurement (ARM) Program: Second Edition. Office of Scientific and Technical Information (OSTI), February 2019. http://dx.doi.org/10.2172/1494284.
Повний текст джерела