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Статті в журналах з теми "AFM Modes"
Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, and José Martín Yañez Limón. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.
Повний текст джерелаEby, R. K., R. L. McEvoy, and S. Marchese-Ragona. "AFM of polymers using force spectroscopy modes." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1076. http://dx.doi.org/10.1017/s042482010017311x.
Повний текст джерелаDillon, Eoghan, Kevin Kjoller, and Craig Prater. "Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale." Microscopy Today 21, no. 6 (November 2013): 18–24. http://dx.doi.org/10.1017/s1551929513000989.
Повний текст джерелаXia, Fangzhou, and Kamal Youcef-Toumi. "Review: Advanced Atomic Force Microscopy Modes for Biomedical Research." Biosensors 12, no. 12 (December 2, 2022): 1116. http://dx.doi.org/10.3390/bios12121116.
Повний текст джерелаIgnat, Ioan, Bernhard Schuster, Jonas Hafner, MinHee Kwon, Daniel Platz, and Ulrich Schmid. "Intermodal coupling spectroscopy of mechanical modes in microcantilevers." Beilstein Journal of Nanotechnology 14 (January 19, 2023): 123–32. http://dx.doi.org/10.3762/bjnano.14.13.
Повний текст джерелаPishkenari, Hossein Nejat, and Ali Meghdari. "Effects of higher oscillation modes on TM-AFM measurements." Ultramicroscopy 111, no. 2 (January 2011): 107–16. http://dx.doi.org/10.1016/j.ultramic.2010.10.015.
Повний текст джерелаPatel, Anisha N., and Christine Kranz. "(Multi)functional Atomic Force Microscopy Imaging." Annual Review of Analytical Chemistry 11, no. 1 (June 12, 2018): 329–50. http://dx.doi.org/10.1146/annurev-anchem-061417-125716.
Повний текст джерелаLi, Qing Fen, Li Zhu, Guo Jin, and Xiu Fang Cui. "3D-Modeling and Numerical Analysis of Fracture Behavior in AFM-Specimen on Mixed-Mode I-II Loading Condition." Advanced Materials Research 450-451 (January 2012): 1391–94. http://dx.doi.org/10.4028/www.scientific.net/amr.450-451.1391.
Повний текст джерелаGuzman, Horacio V., Pablo D. Garcia, and Ricardo Garcia. "Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments." Beilstein Journal of Nanotechnology 6 (February 4, 2015): 369–79. http://dx.doi.org/10.3762/bjnano.6.36.
Повний текст джерелаStarodubtseva, M. N. "Atomic force microscopy of cells as a method for the study of the pathogenesis and AS THE basis for the development of methods of DISEASE DIAGNOSIS." Health and Ecology Issues, no. 4 (December 28, 2017): 99–106. http://dx.doi.org/10.51523/2708-6011.2017-14-4-21.
Повний текст джерелаДисертації з теми "AFM Modes"
Devailly, Clémence. "Fluctuations thermiques - un outil pour étudier les fluides simples et binaires à l'échelle du micron." Thesis, Lyon, École normale supérieure, 2014. http://www.theses.fr/2014ENSL0976.
Повний текст джерелаPhase transitions near a critical point, or second order phase transitions, are still a recent object of studies because of the large amount of interesting critical phenomena as the critical Casimir force, confinements problems or out of equilibrium phenomena following a quench at the critical point. This thesis experimentally studies phenomena near a critical point. This manuscript is divided in two parts : the first one consists in building several experimental set-up which measure viscosity through thermal fluctuation at micrometric scale. The second part consists in finding and characterize binary mixtures which show a second order phase transition. Preliminary results have been done in these samples. One of the principal points of these experimental set-up are a well regulated temperature, a probe sensitive to thermal fluctuation and/or pN forces and a reproducible binary mixture which presents a critical point easy to reach experimentally. We mounted from an Atomic Force Microscope (AFM) already built in the laboratory, a hanging-fiber probe to measure viscosity of liquids. Despite its weak efficiency as a metrologic probe, we described and developed a mode coupling model which let us understand mechanics of hanging-fiber probes. I also developed in the lab the dynamic differential microscopy technique (DDM) which do measurements with several probes. I discussed about the measure precision with in mind the aim of studying critical fluctuations. For the choice of the sample, we studied several binary mixtures. We characterized them by classical methods as turbidity measurements and static light scattering. These characterizations let us learn about binary mixtures in order to use them in a third experimental set-up : beads trapped in an optical tweezers already built in the lab. We added to it a home-made thermal regulation which can be used with the constraints of optical tweezers. These tests showed an unexpected phenomenon of oscillating phase transition induce by laser. We developed a model to describe it. At last, preliminary experiments with optical tweezers in binary mixtures showed qualitative effects of an approach near a critical point on the viscosity and on interactions between beads as critical Casimir force
Oral, Hasan Giray. "Modeling time-resolved interaction force mode AFM imaging." Thesis, Georgia Institute of Technology, 2012. http://hdl.handle.net/1853/43691.
Повний текст джерелаBillingsley, Daniel Jeffrey. "Convergent transcription and nested gene models studied by AFM." Thesis, University of Leeds, 2012. http://etheses.whiterose.ac.uk/3149/.
Повний текст джерелаYurtsever, Ayhan. "Nanotribological surface characterization by frequency modulated torsional resonance mode AFM." Diss., kostenfrei, 2008. http://edoc.ub.uni-muenchen.de/8718/.
Повний текст джерелаStone, Peter (Peter Robert). "A new model for electric force microscopy and its application for electrostatically generated phase difference in tapping mode AFM." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/32855.
Повний текст джерелаIncludes bibliographical references (leaf 37).
The harmonic force balance method was used to model and simulate electric force microscopy (EFM) and electrostatically generated phase difference in tapping mode AFM (EPTA) measurements. Simulations show that the harmonic force balance approach matches and explains EFM and EPTA experimental results well. Simulations also show that the model depended on both geometric and materials parameters. The harmonic force balance model was subsequently used to directly simulate a previously performed EPTA experiment. Data obtained from the model showed a remarkable similarity to the experimentally obtained data, thus validating the use of the harmonic force balance model to simulate EPTA data.
by Peter Stone.
S.B.
Nasrallah, Hussein. "Capillary adhesion and friction : an approach with the AFM Circular Mode." Phd thesis, Université du Maine, 2011. http://tel.archives-ouvertes.fr/tel-00651818.
Повний текст джерелаHida, H., M. Shikida, K. Fukuzawa, A. Ono, K. Sato, K. Asaumi, Y. Iriye, and K. Sato. "Quartz tuning-fork type AFM probe operated in Anti-phase Vibration Mode." IEEE, 2006. http://hdl.handle.net/2237/9554.
Повний текст джерелаLin, Zhen. "AFM electrical mode development for nanostructure semiconductor study : application on Ge / Si nanostructure." Lyon, INSA, 2010. http://theses.insa-lyon.fr/publication/2010ISAL0135/these.pdf.
Повний текст джерелаNowadays, the semiconductor technology is facing a great challenge to increase the device performance while reducing its dimension. This downscaling in microelectronics industry causes a drastic development of microscopy to reveal new physical characteristics at nanoscale. The understanding of these new properties in nanometer scale is of prime importance. In this work, the AFM fundamental working principle and some typical electric property characterization techniques in semiconductor industry were introduced. The electrical AFM modes including scanning capacitance microscopy (SCM) and spectroscopy (SCS), electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) were developed at room temperature to study the properties of the promising replacement of the conventional poly-silicon floating gate, Germanium nanocrystals local Ge/Si nanostructures, which were fabricated by dewetting process. SCM, SCS, EFM and KPFM were proved to be available methodologies for semiconductor nanostructures characterizations, especially the nanocrystal study in nanometer scale. These characterisation works with developed AFM electrical mode are of prime importance in developing electronic devices application, especially the memory transistors application using Ge/Si nanocrystal
Sebinelli, Heitor Gobbi. "Estudo de proteolipossomos constituídos de Na,K-ATPase utilizando a técnica de microscopia de força atômica." Universidade de São Paulo, 2016. http://www.teses.usp.br/teses/disponiveis/59/59138/tde-21092016-140434/.
Повний текст джерелаNa, K-ATPase (NKA) is a membrane protein present in eukaryotic multicellular organisms. Its functions and activity are already widely described in the literature. Its minimal functional structure is a heterodimer of two main subunits , with transmembrane domains. However, dimers and tetramers of the enzyme are also known to have enzymatic activity. Since there are intrinsic lipid-protein interactions, NKA proteoliposomes composed of DPPC and DPPC:DPPE (1:1 molar ratio) were prepared by the co-solubilization method and liposomes of the same compositions were obtained by extrusion and/or sonication to be used as control. The samples to the AFM study were prepared using glutaraldehyde to protect the vesicles from mechanical shocks and dehydration. Liposomes composed of DPPC and DPPC:DPPE (1:1 molar ratio) were prepared by extrusion and sonication, respectively, as control. The topographical images for DPPC liposomes showed vesicles with an oval shape and smoothed surfaces with a mean diameter of 151 + 46 nm. DPPC:DPPE vesicles also presented smoothed surfaces, but with pointed corners and mean diameter of 98 + 28 nm. Phase images for both lipid compositions showed no differences in chemical composition. For DPPC:DPPE samples, this can be explained by the neutral net charge of both lipids. The proteoliposomes observed in the AFM phase images showed darker and large circular spots in the vesicles. These spots represent delays in the phase oscillation of the AFM probe and are associated with different chemical composition. The phase changes showed the reconstitution of the NKA in the proteoliposomes. When compared with topographical images, this spots matched protrusions. The mean diameter of DPPC-NKA proteoliposomes determined by AFM was 390 + 326 nm. In the three-dimensional topographical images of composition, protrusions from 38 to 115 nm near the areas of different phases indicate the diameters of the NKA microdomains. The phase changes for DPPC:DPPE-NKA appeared as bright interstices with the protrusions of the topographical images in between them. The size of these protrusions ranged from 20 to 66 nm and the mean diameter of the proteoliposomes was 189 + 156 nm. The DSC liposomes data showed that the glutaraldehyde concentration used in the AFM analysis affect the physical chemistry properties of the samples with DPPE. AFM proved to be an efficient method to confirm the reconstitution of into proteoliposomes with phase images and to determine the diameter of the protein microdomains with the topographical images.
Horstmeier, Sebastian [Verfasser]. "Dynamische AFM-Kraftspektroskopie an Desoxyribonukleinsäure im frequenz-modulierten Modus mit konstanter Anregung / Sebastian Horstmeier." Bielefeld : Universitätsbibliothek Bielefeld, 2013. http://d-nb.info/1045878561/34.
Повний текст джерелаКниги з теми "AFM Modes"
Zmysłowski, Wojciech. Wybrane problemy syntezy sterowań w układzie ruchowym: Algorytmy transformacji programów ruchowych w sygnały sterujące. Warszawa: Polska Akademia Nauk, Instytut Biocybernetyki i Inżynierii Biomedycznej, 1987.
Знайти повний текст джерелаHarald, Weber, and U.S. Air Force Geophysics Laboratory. Atmospheric Sciences Division., eds. Validation of a surface-layer windflow model using climatology and meteorological tower data from Vandenberg AFB, California. Hanscom AFB, MA: Atmospheric Sciences Division, Air Force Geophysics Laboratory, 1987.
Знайти повний текст джерелаAssociation for Computing Machinery. ACM transactions on modeling and computer simulation: A publication of the Association for Computing Machinery. New York, NY: Association for Computing Machinery, 1991.
Знайти повний текст джерелаApplin, Zachary T. Low-speed stability and control characteristics of a transport model with aft-fuselage-mounted advanced turboprops. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.
Знайти повний текст джерелаApplin, Zachary T. Low-speed stability and control characteristics of a transport model with aft-fuselage-mounted advanced turboprops. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Branch, 1986.
Знайти повний текст джерелаApplin, Zachary T. Low-speed stability and control characteristics of a transport model with aft-fuselage-mounted advanced turboprops. Hampton, Va: Langley Research Center, 1986.
Знайти повний текст джерелаShepard, Larry. Rebuild & powertune Carter/Edelbrock carburetors: Covers AFB, AVS and TQ models for street, performance and racing. New York, N.Y: HPBooks, 2010.
Знайти повний текст джерелаEnvironment, Alberta Alberta. Alberta climate model (ACM) to provide climate estimates (1961-1990) for any location in Alberta from its geographic coordinates. [Edmonton]: Alberta Environment, 2005.
Знайти повний текст джерелаEl-Habash, N. A. Final report of frontal barrier impacts of a 1985 Pontiac Grand AM 2-door coupe in support of Crash III damage algorithm reformation. [Washington, D.C.]: U.S. Dept. of Transportation, National Highway Traffic Safety Administration, 1988.
Знайти повний текст джерелаA, Freeman Kerry, Rivele Richard J, and Webb Ron, eds. Chilton's repair manual.: All U.S. and Canadian front wheel drive models. Radnor, PA: Chilton Book Company, 1992.
Знайти повний текст джерелаЧастини книг з теми "AFM Modes"
Pacheco, Louis, and Nicolas F. Martinez. "Enhanced Current Dynamic Range Using ResiScope™ and Soft-ResiScope™ AFM Modes." In Conductive Atomic Force Microscopy, 263–76. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.ch12.
Повний текст джерелаAliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "AFM, Tapping Mode." In Encyclopedia of Nanotechnology, 99. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_33.
Повний текст джерелаNakajima, Hideo. "Phase Mode SPM/AFM." In Compendium of Surface and Interface Analysis, 441–44. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_72.
Повний текст джерелаAliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "AFM, Non-contact Mode." In Encyclopedia of Nanotechnology, 93–99. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_32.
Повний текст джерелаNoel, Olivier, Nguyen Anh Dung, and Pierre-Emmanuel Mazeran. "The Circular Mode AFM." In 21st Century Nanoscience – A Handbook, 5–1. Boca Raton, Florida : CRC Press, [2020]: CRC Press, 2020. http://dx.doi.org/10.1201/9780429340420-5.
Повний текст джерелаFukuma, Takeshi, and Michael J. Higgins. "Dynamic-Mode AFM in Liquid." In Atomic Force Microscopy in Liquid, 87–119. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch4.
Повний текст джерелаQuintanilla, Miguel Angel Sánchez. "Surface Analysis Using Contact Mode AFM." In Encyclopedia of Tribology, 3401–11. Boston, MA: Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_323.
Повний текст джерелаWang, L., K. Wu, and S. I. Rokhlin. "Nanoscale Viscoelastic Characterization Using Tapping Mode AFM." In Review of Progress in Quantitative Nondestructive Evaluation, 1741–48. Boston, MA: Springer US, 1999. http://dx.doi.org/10.1007/978-1-4615-4791-4_223.
Повний текст джерелаYuan, Shuai, Lianqing Liu, Zhidong Wang, and Ning Xi. "AFM Image Reconstruction Algorithm Based on Tip Model." In AFM-Based Observation and Robotic Nano-manipulation, 83–106. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-0508-9_4.
Повний текст джерелаDiaw, Mariteuw Chimère, Joachim Nguièbouri, Bruhnel Vambi N’Tambu, Julie Gagoe Tchoko, Marie Françoise Roselle Ngo Baneg, and Caroline Bilogui. "ACM and Model Forests." In Responding to Environmental Issues through Adaptive Collaborative Management, 239–73. London: Routledge, 2023. http://dx.doi.org/10.4324/9781003325932-19.
Повний текст джерелаТези доповідей конференцій з теми "AFM Modes"
Alekseev, P. A., M. S. Dunaevskiy, A. M. Monakhov, V. V. Dudelev, G. S. Sokolovskii, A. Baranov, and R. Teissier. "AFM visualization of half-disk WGM laser modes." In 2016 International Conference Laser Optics (LO). IEEE, 2016. http://dx.doi.org/10.1109/lo.2016.7549730.
Повний текст джерелаEchols-Jones, Piers M., Maxim E. Dokukin, Igor Sokolov, and William C. Messner. "Switched dual-actuator control for AFM subresonant tapping modes." In 2017 American Control Conference (ACC). IEEE, 2017. http://dx.doi.org/10.23919/acc.2017.7962957.
Повний текст джерелаBelikov, Sergey, and Sergei Magonov. "Simulation of Asymptotic Amplitude-Phase Dynamics for AFM Resonant Modes*." In 2019 American Control Conference (ACC). IEEE, 2019. http://dx.doi.org/10.23919/acc.2019.8815218.
Повний текст джерелаBelikov, Sergey. "Force Curves Restoration in Atomic Force Microscopy (AFM) Resonant Modes*." In 2022 American Control Conference (ACC). IEEE, 2022. http://dx.doi.org/10.23919/acc53348.2022.9867568.
Повний текст джерелаWang, Guoliang, Baishun Sun, Xiaomin Wu, Wenxiao Zhang, Yingmin Qu, Zhengxun Song, Zuobin Wang, and Dayou Li. "Imaging Quality Assessment of Different AFM Working Modes on Living Cancer Cells." In 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO). IEEE, 2019. http://dx.doi.org/10.1109/3m-nano46308.2019.8947426.
Повний текст джерелаNikooienejad, Nastaran, Mohammad Maroufi, and S. O. Reza Moheimani. "A Novel Non-Raster Scan Method for AFM Imaging." In ASME 2018 Dynamic Systems and Control Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/dscc2018-9049.
Повний текст джерелаZhang, Chuan, Oh Chong Khiam, and Esther P. Y. Chen. "Conductive-AFM for Scan Logic Failure Analysis at Advanced Technology Nodes." In ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0458.
Повний текст джерелаKim, Il Kwang, Jea Woong Jang, and Soo Il Lee. "Empirical Mode Decomposition for Dynamic AFM Microcantilevers in Air and Liquid Environment." In ASME 2018 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/detc2018-86215.
Повний текст джерелаLaxminarayana, Karthik, and Nader Jalili. "A Review of Recent Developments in Atomic Force Microscopy Systems With Application to Manufacturing and Biological Processes." In ASME 2003 International Mechanical Engineering Congress and Exposition. ASMEDC, 2003. http://dx.doi.org/10.1115/imece2003-41170.
Повний текст джерелаKahrobaiyan, M. H., M. Rahaeifard, and M. T. Ahmadian. "Torsional Sensitivity of the First Four Modes of an AFM Cantilever With a Sidewall Probe Using Analytical Method." In ASME 2009 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2009. http://dx.doi.org/10.1115/detc2009-87035.
Повний текст джерелаЗвіти організацій з теми "AFM Modes"
Davis, Brian, Ross Henning, Kyle Henik, Levi Benning, Joseph R. Vanstrom, and Jacek A. Koziel. ADM Demonstration Model Sifter. Ames: Iowa State University, Digital Repository, April 2018. http://dx.doi.org/10.31274/tsm416-180814-34.
Повний текст джерелаBohl, W. R., F. R. Parker, D. Wilhelm, J. Berthier, L. Goutagny, and Ninokata. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), September 1990. http://dx.doi.org/10.2172/6664961.
Повний текст джерелаWilhelm, D. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), September 1990. http://dx.doi.org/10.2172/6545907.
Повний текст джерелаBohl, W. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), September 1990. http://dx.doi.org/10.2172/6636482.
Повний текст джерелаBerthier, J., D. Wilhelm, and W. Bohl. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), September 1990. http://dx.doi.org/10.2172/6599591.
Повний текст джерелаParker, F. AFDM: An Advanced Fluid-Dynamics Model. Office of Scientific and Technical Information (OSTI), September 1990. http://dx.doi.org/10.2172/6641372.
Повний текст джерелаHenneges, G., and S. Kleinheins. AFDM: An advanced fluid-dynamics model. Volume 6: EOS-AFDM interface. Office of Scientific and Technical Information (OSTI), January 1994. http://dx.doi.org/10.2172/10140789.
Повний текст джерелаLouis, J. F. Testbed model and data assimilation for ARM. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/7035239.
Повний текст джерелаLong, Douglas, and Peter Samsel. Asynchronous Transfer Mode (ATM) User Security Services. Fort Belvoir, VA: Defense Technical Information Center, June 2001. http://dx.doi.org/10.21236/ada388288.
Повний текст джерелаThomen, D., and V. Hamilton. Amphibious Assault Model (AAM) Application Support Package (ASP). Fort Belvoir, VA: Defense Technical Information Center, February 1995. http://dx.doi.org/10.21236/ada297704.
Повний текст джерела