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Статті в журналах з теми "AFM"
Nuryana, Christiana Tri, Tiara Puspita Agustin, Sofia Mubarika Haryana, Yohanes Widodo Wirohadidjojo та Nur Arfian. "Achatina fulica Mucus Ameliorates UVB-induced Human Dermal Fibroblast Photoaging via the TGF-β/Smad Pathway". Indonesian Biomedical Journal 15, № 6 (11 грудня 2023): 375–82. http://dx.doi.org/10.18585/inabj.v15i6.2580.
Повний текст джерелаPeña, Brisa, Mostafa Adbel-Hafiz, Maria Cavasin, Luisa Mestroni, and Orfeo Sbaizero. "Atomic Force Microscopy (AFM) Applications in Arrhythmogenic Cardiomyopathy." International Journal of Molecular Sciences 23, no. 7 (March 28, 2022): 3700. http://dx.doi.org/10.3390/ijms23073700.
Повний текст джерелаMadeira, Mariana De Resende, Maximiliano De Souza Martins, Gustavo Pereira Martins, and Fernando Flecha Alkmim. "Caracterização faciológica e evolução sedimentar da Formação Moeda (Supergrupo Minas) na porção noroeste do Quadrilátero Ferrífero, Minas Gerais." Geologia USP. Série Científica 19, no. 3 (October 2, 2019): 129–48. http://dx.doi.org/10.11606/issn.2316-9095.v19-148467.
Повний текст джерелаKAWAI, Akira, and Daisuke INOUE. "EffectofThermalStressonPeelPropertyofLineResistPatternAnalyzedbyAtomicForceMicroscope(AFM." Journal of The Adhesion Society of Japan 39, no. 3 (2003): 107–10. http://dx.doi.org/10.11618/adhesion.39.107.
Повний текст джерелаBowman, Dick. "AFM/PC." ACM SIGAPL APL Quote Quad 22, no. 4 (June 1992): 12–13. http://dx.doi.org/10.1145/140660.140679.
Повний текст джерелаVinson, V. "AFM Uncompromised." Science 344, no. 6182 (April 24, 2014): 341. http://dx.doi.org/10.1126/science.344.6182.341-c.
Повний текст джерелаBarrier, Gaëlle, and Edwige Biard. "AFM-Téléthon." médecine/sciences 31 (November 2015): 50. http://dx.doi.org/10.1051/medsci/201531s315.
Повний текст джерелаBurnham, Nancy A., and Uwe Hartmann. "Misinterpreting AFM." Science News 142, no. 14 (October 3, 1992): 211. http://dx.doi.org/10.2307/4017921.
Повний текст джерелаHiggins, Michael, Gordon G. Wallace, Amy Gelmi, and Scott T. McGovern. "Electrochemical AFM." Imaging & Microscopy 11, no. 2 (May 2009): 40–43. http://dx.doi.org/10.1002/imic.200990038.
Повний текст джерелаKoklu, Mehti. "Performance Assessment of Fluidic Oscillators Tested on the NASA Hump Model." Fluids 6, no. 2 (February 7, 2021): 74. http://dx.doi.org/10.3390/fluids6020074.
Повний текст джерелаДисертації з теми "AFM"
Cooper, Katherine. "AFM and C-AFM Studies of GaN Films." VCU Scholars Compass, 2005. http://scholarscompass.vcu.edu/etd/1246.
Повний текст джерелаRossell, Jacqueline. "Protein immobilisation for AFM." Thesis, University of Nottingham, 2003. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.404144.
Повний текст джерелаLee, Sunyoung S. M. Massachusetts Institute of Technology. "Chemical functionalization of AFM cantilevers." Thesis, Massachusetts Institute of Technology, 2005. http://hdl.handle.net/1721.1/34205.
Повний текст джерелаIncludes bibliographical references (p. 47-52).
Atomic force microscopy (AFM) has been a powerful instrument that provides nanoscale imaging of surface features, mainly of rigid metal or ceramic surfaces that can be insulators as well as conductors. Since it has been demonstrated that AFM could be used in aqueous environment such as in water or various buffers from which physiological condition can be maintained, the scope of the application of this imaging technique has been expanded to soft biological materials. In addition, the main usage of AFM has been to image the material and provide the shape of surface, which has also been diversified to molecular-recognition imaging - functional force imaging through force spectroscopy and modification of AFM cantilevers. By immobilizing of certain molecules at the end of AFM cantilever, specific molecules or functionalities can be detected by the combination of intrinsic feature of AFM and chemical modification technique of AFM cantilever. The surface molecule that is complementary to the molecule at the end of AFM probe can be investigated via specificity of molecule-molecule interaction.
(cont.) Thus, this AFM cantilever chemistry, or chemical functionalization of AFM cantilever for the purpose of chemomechanical surface characterization, can be considered as an infinite source of applications important to understanding biological materials and material interactions. This thesis is mainly focused on three parts: (1) AFM cantilever chemistry that introduces specific protocols in details such as adsorption method, gold chemistry, and silicon nitride cantilever modification; (2) validation of cantilever chemistry such as X-ray photoelectron spectroscopy (XPS), AFM blocking experiment, and fluorescence microscopy, through which various AFM cantilever chemistry is verified; and (3) application of cantilever chemistry, especially toward the potential of force spectroscopy and the imaging of biological material surfaces.
by Sunyoung Lee.
S.M.
Subedi, Laxmi P. "AFM Tip-Graphene-Surface Interactions." University of Akron / OhioLINK, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=akron1291144388.
Повний текст джерелаHegrová, Veronika. "Aplikace korelativní AFM/SEM mikroskopie." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-402580.
Повний текст джерелаAndersen, Christopher. "The construction of carbon nanotube AFM probes for high resolution AFM of novel biological systems." Thesis, University of Nottingham, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.421480.
Повний текст джерелаSonnenberg, Lars. "AFM-basierte Desorption einzelner oberflächenadsorbierter Polyelektrolyte." Diss., lmu, 2007. http://nbn-resolving.de/urn:nbn:de:bvb:19-76109.
Повний текст джерелаFilip-Boar, Diana. "AFM-CSLM microrheology of aggregated emulsions." Enschede : University of Twente [Host], 2006. http://doc.utwente.nl/56171.
Повний текст джерелаGröger, Roland. "Nanokontaktdrucken mit AFM-gesteuert phasenseparierten Blockcopolymerschichten." Karlsruhe Forschungszentrum Karlsruhe, 2006. http://d-nb.info/986521612/34.
Повний текст джерелаFILHO, HENRIQUE DUARTE DA FONSECA. "METALLIC NANOSTRUCTURE FABRICATION BY AFM LITHOGRAPHY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2004. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=6061@1.
Повний текст джерелаNesta dissertação de mestrado, nós desenvolvemos um processo de litografia baseado na técnica de microscopia de força atômica. O estudo do processo de litografia aqui utilizado inicia-se com a deposição e caracterização de filmes finos de sulfeto de arsênio amorfo (a-As2S3) em substratos de silício e a deposição de uma camada metálica de alumínio, utilizada como máscara, sobre a superfície do a-As2S3. O microscópio de força atômica é utilizado para escrever os padrões de forma controlada na camada metálica, e para tal, a influencia dos parâmetros de controle do microscópio na realização da litografia foi analisada. Para a transferência do padrão litografado realiza-se um posterior processo de fotossensibilização e dissolução química do a-As2S3 com uma solução de K2CO3. Após a dissolução, uma camada de ouro foi depositada por erosão catódica DC, seguido de uma nova dissolução, desta vez com NaOH resultando na transferência de nanoestruturas de Au para o substrato de silício.
In this dissertation, we have developed a lithography process based on the atomic force microscopy of technique. The study of the lithography process starts with the deposition and characterization of amorphous arsenic sulfide thin films (a-As2S3) in silicon substrates and the deposition of a metallic aluminum layer, used as mask, on the surface of the a-As2S3. An atomic force microscope was used to write patterns in a controlled way on the metallic layer. Therefore, the influence of microscope feedback system on the accomplishment of the lithography was analyzed. In order to transfer the lithographed pattern to a silicon substrate, the a- As2S3 was exposed to a UV light source and was dissolved with a K2CO3 solution. Then, a thin gold layer was deposited by sputtering DC, and a new dissolution, now with NaOH was performed, leading to the deposition of Au nanostructures onto the silicon substrate.
Книги з теми "AFM"
Suleman, A. U. M. AFM studies of cellulosic fibres. Manchester: UMIST, 1996.
Знайти повний текст джерелаYuan, Shuai, Lianqing Liu, Zhidong Wang, and Ning Xi. AFM-Based Observation and Robotic Nano-manipulation. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-0508-9.
Повний текст джерелаDelmonte, Clive. Advances in AFM & STM applied to thenucleic acids. Northampton: Clive Delmonte Publications, 1997.
Знайти повний текст джерелаJ, Erasmus L. AFM unity in theological education?: A historical perspective. Midrand, South Africa: International Theological Institute, 1996.
Знайти повний текст джерелаVeselý, Jozef. Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-48302-3.
Повний текст джерелаJohn, Ferrante, and United States. National Aeronautics and Space Administration., eds. Theoretical modelling of AFM for bimetallic tip-substrate interactions. [Washington, DC]: National Aeronautics and Space Administration, 1991.
Знайти повний текст джерелаCTI-AFM Conference (4th 1993 Leicester, England). Selected proceedings from the 4th Annual CTI-AFM Conference. Edited by Williams B. C. 1950-, Nicholson Ailsa H. S, and CTI Centre for Accounting, Finance and Management. Norwich: CTI Centre for Accounting Finance and Management, University of East Anglia, 1993.
Знайти повний текст джерелаJohn, Ferrante, and United States. National Aeronautics and Space Administration., eds. Theoretical modelling of AFM for bimetallic tip-substrate interactions. [Washington, DC]: National Aeronautics and Space Administration, 1991.
Знайти повний текст джерелаCTI-AFM Conference (7th 1996 Brighton). Selected proceedings from the 7th Annual CTI-AFM Conference. Edited by Williams B. C. 1950-, Nicholson Ailsa H. S, and CTI Centre for Accounting, Finance and Management. Norwich: CTI Centre for Accounting Finance and Management, University of East Anglia, 1996.
Знайти повний текст джерелаCappella, Brunero. Mechanical Properties of Polymers Measured through AFM Force-Distance Curves. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-29459-9.
Повний текст джерелаЧастини книг з теми "AFM"
Mehlhorn, Heinz. "AFM." In Encyclopedia of Parasitology, 67. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-43978-4_4500.
Повний текст джерелаMehlhorn, Heinz. "AFM." In Encyclopedia of Parasitology, 1. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-642-27769-6_4500-1.
Повний текст джерелаAliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "AFM." In Encyclopedia of Nanotechnology, 83. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100017.
Повний текст джерелаDeJonge, Andrea, Christoph Golbeck, Shahjahan Bhuiyan, Alnoor Ebrahim, Kate Ruff, Claudia Bode-Harlass, Karun K. Singh, et al. "AFM." In International Encyclopedia of Civil Society, 18. New York, NY: Springer US, 2010. http://dx.doi.org/10.1007/978-0-387-93996-4_9005.
Повний текст джерелаAndo, Toshio. "Interactive HS-AFM (iHS-AFM)." In High-Speed Atomic Force Microscopy in Biology, 97–101. Berlin, Heidelberg: Springer Berlin Heidelberg, 2022. http://dx.doi.org/10.1007/978-3-662-64785-1_6.
Повний текст джерелаAliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "AFM Tips." In Encyclopedia of Nanotechnology, 93. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100019.
Повний текст джерелаAliano, Antonio, Giancarlo Cicero, Hossein Nili, Nicolas G. Green, Pablo García-Sánchez, Antonio Ramos, Andreas Lenshof, et al. "AFM Probes." In Encyclopedia of Nanotechnology, 90–93. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_109.
Повний текст джерелаBauch, Jürgen, and Rüdiger Rosenkranz. "AFM - Rasterkraftmikroskopie." In Physikalische Werkstoffdiagnostik, 16–17. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53952-1_8.
Повний текст джерелаMoreno-Herrero, Fernando, and Julio Gomez-Herrero. "AFM: Basic Concepts." In Atomic Force Microscopy in Liquid, 1–34. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527649808.ch1.
Повний текст джерелаEspinosa, Horacio D., Nicolaie Moldovan, and K. H. Kim. "Novel AFM Nanoprobes." In NanoScience and Technology, 77–134. Berlin, Heidelberg: Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-37321-6_3.
Повний текст джерелаТези доповідей конференцій з теми "AFM"
Yi, L., M. Gallagher, S. Howells, T. Chen, and D. Sarid. "Combination STM/AFM and AFM Images of Magnetic Domains." In Scanned probe microscopy. AIP, 1991. http://dx.doi.org/10.1063/1.41399.
Повний текст джерелаSkládal, P., J. Přibyl, V. Horňáková, P. Gereg, Z. Fohlerová, D. Kovář, and M. Pešl. "Biosensing with AFM." In The World Congress on Recent Advances in Nanotechnology. Avestia Publishing, 2016. http://dx.doi.org/10.11159/icnb16.1.
Повний текст джерелаTian, Xiaojun, Yuechao Wang, Ning Xi, Zaili Dong, and Wenjung Li. "Accurate Positioning of AFM Probe for AFM Based Robotic Nanomanipulation System." In 2006 IEEE/RSJ International Conference on Intelligent Robots and Systems. IEEE, 2006. http://dx.doi.org/10.1109/iros.2006.282317.
Повний текст джерелаSpeet, Bart G., Giampiero Gerini, Samaneh Mashaghi Tabari, Hamed Sadeghian Marnani, and Fabrizio Silvestri. "Metasurface enhanced AFM cantilevers." In Metamaterials, edited by Allan D. Boardman, Kevin F. MacDonald, and Anatoly V. Zayats. SPIE, 2018. http://dx.doi.org/10.1117/12.2307099.
Повний текст джерелаRokhinson, L., L. Weng, L. Zhang, and Y. P. Chen. "AFM Nanolithography of Graphene." In 2009 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2009. http://dx.doi.org/10.7567/ssdm.2009.g-9-1.
Повний текст джерелаTakagahara, Kazuhiko, Yusuke Takei, Eiji Iwase, Kiyoshi Matsumoto, and Isao Shimoyama. "Batch fabrication of carbon nanotubes at AFM probe tips and AFM imaging." In 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems. IEEE, 2008. http://dx.doi.org/10.1109/memsys.2008.4443756.
Повний текст джерелаKeeren, Kathrin, Sindy Böttcher, and Sabine Diedrich. "Acute Flaccid Paralysis/Myelitis (AFM/AFP) - Results from National Enterovirus Surveillance." In Abstracts of the 45th Annual Meeting of the Society for Neuropediatrics. Georg Thieme Verlag KG, 2019. http://dx.doi.org/10.1055/s-0039-1698184.
Повний текст джерелаBartenwerfer, M., S. Fatikow, R. Tunnell, U. Mick, C. Stolle, C. Diederichs, D. Jasper, and V. Eichhorn. "Towards automated AFM-based nanomanipulation in a combined nanorobotic AFM/HRSEM/FIB system." In 2011 IEEE International Conference on Mechatronics and Automation (ICMA). IEEE, 2011. http://dx.doi.org/10.1109/icma.2011.5985651.
Повний текст джерелаPromyoo, Rapeepan, Hazim El-Mounayri, and Ashlie Martini. "AFM-Based Nanomachining for Nano-Fabrication Processes: MD Simulation and AFM Experimental Verification." In ASME 2010 International Manufacturing Science and Engineering Conference. ASMEDC, 2010. http://dx.doi.org/10.1115/msec2010-34115.
Повний текст джерелаYao, Tsung-Fu, Andrew Duenner, and Michael Cullinan. "In-Line Dimensional Metrology for Nanomanufacturing Systems." In ASME 2016 11th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/msec2016-8566.
Повний текст джерелаЗвіти організацій з теми "AFM"
Brejnholt, Nicolai F. AFM report to Coastline Optic. Office of Scientific and Technical Information (OSTI), June 2015. http://dx.doi.org/10.2172/1242007.
Повний текст джерелаBaca, Ana. AFM Insitu Heating Experiment Data. Office of Scientific and Technical Information (OSTI), May 2020. http://dx.doi.org/10.2172/1618032.
Повний текст джерелаSwinford, Richard. An AFM-SIMS Nano Tomography Acquisition System. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.5369.
Повний текст джерелаBurgens, LaTashia. The Atomic Force Microscopic (AFM) Characterization of Nanomaterials. Fort Belvoir, VA: Defense Technical Information Center, June 2009. http://dx.doi.org/10.21236/ada550815.
Повний текст джерелаRiechers, Shawn, Alan Schemer-Kohrn, Mychailo Toloczko, and Danny Edwards. Nanoscale Consequences of Irradiation Investigated by RAD-AFM. Office of Scientific and Technical Information (OSTI), June 2024. http://dx.doi.org/10.2172/2373196.
Повний текст джерелаBeaux, Miles Frank, Miguel A. Santiago Cordoba, Stephen Anthony Joyce, and Igor Olegovich Usov. AFM/STM Plutonium capability, research summary and future plans. Office of Scientific and Technical Information (OSTI), June 2016. http://dx.doi.org/10.2172/1259630.
Повний текст джерелаMinne, Stephen C. Micromachines for Microchips: Bringing the AFM up to Speed. Fort Belvoir, VA: Defense Technical Information Center, September 2002. http://dx.doi.org/10.21236/ada407019.
Повний текст джерелаMinne, Stephen C. Micromachines for Microchips: Bringing the AFM up to Speed. Fort Belvoir, VA: Defense Technical Information Center, March 2000. http://dx.doi.org/10.21236/ada375973.
Повний текст джерелаSarid, Dror. Novel Nanostructure Fabrication and Their Characterization by STM and AFM. Fort Belvoir, VA: Defense Technical Information Center, November 2000. http://dx.doi.org/10.21236/ada391137.
Повний текст джерелаAlthaus, C., A. Clemens, and C. Orme. ORISE Internship Report - An AFM study of Zn/MnO2 Co-deposition. Office of Scientific and Technical Information (OSTI), July 2023. http://dx.doi.org/10.2172/1991463.
Повний текст джерела