Книги з теми "X-ray Photoemission Spectroscopy (XPS)"

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Crist, B. Vincent. Handbook of monochromatic XPS spectra. Chichester: John Wiley, 2000.

Cultural heritage materials: An XPS approach. New York: Nova Science Publishers, 2012.

1948-, Briggs D., ed. High resolution XPS of organic polymers: The Scienta ESCA300 database. Chichester [England]: Wiley, 1992.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

Grasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.

Surface analysis of polymers by XPS and static SIMS. Cambridge, U.K: Cambridge University Press, 1998.

International Symposium on the Electronic Structure of High Tc Superconductors (1988 Rome, Italy). High Tc superconductors electronic structure: Proceedings of the International Symposium on the Electronic Structure of High Tc Superconductors, Rome, 5-7 October 1988. Oxford [England]: Pergamon Press, 1989.

F, Moulder John, and Chastain Jill, eds. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporatioon, Physical Electronics Division, 1992.

Moulder, John F. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporation, Physical Electronics Division, 1992.

Saffarini, Ghassan. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), differential scanning calorimetry (DSC) and density study of ternary chalcogenide glasses based on Ge-Se and Ge-S. Uxbridge: Brunel University, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Aeronautics and Space Administration (NASA) Staff. X-Ray Photoelectron Spectroscopy (Xps), Rutherford Back Scattering (Rbs) Studies. Independently Published, 2018.

Magnuson, Martin. Electronic Structure Studies Using Resonant X-Ray and Photoemission Spectroscopy. Uppsala Universitet, 1999.

Verma, Hem Raj. Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques. Springer London, Limited, 2007.

Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques. Springer Berlin / Heidelberg, 2010.

Briggs, D. Surface Analysis of Polymers by XPS and Static SIMS. Cambridge University Press, 2005.

1944-, Bianconi A., and Marcelli A, eds. High Tc superconductors: Electronic structure : proceedings of the International Symposium on the Electronic Structure of High Tc Superconductors,Rome, 5-7 October 1988. Pergamon, 1989.

Moulder, John F., William F. Stickle, Peter E. Sobol, and Kenneth D. Bomben. Handbook of X Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of Xps Data. Physical Electronics, 1995.

Unoccupied electronic states: Fundamentals for XANES, EELS, IPS, and BIS. Berlin: Springer-Verlag, 1992.