Статті в журналах: "X-ray diffraction technique"

1

Jensen, D. Juul, and H. F. Poulsen. "The three dimensional X-ray diffraction technique." Materials Characterization 72 (October 2012): 1–7. http://dx.doi.org/10.1016/j.matchar.2012.07.012.

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2

Sonawane, Tushar D., Rajesh Z. Mujoriya, and Harsha N. Nandre. "Review on X-Ray Powder Diffraction Technique." Research Journal of Pharmaceutical Dosage Forms and Technology 8, no. 4 (2016): 292. http://dx.doi.org/10.5958/0975-4377.2016.00040.9.

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3

Gurzhiy, Vladislav V. "Single-Crystal X-Ray Diffraction." AM&P Technical Articles 178, no. 1 (January 1, 2020): 32–34. http://dx.doi.org/10.31399/asm.amp.2020-01.p032.

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4

Noyan, I. C., and G. Sheikh. "X-ray tensile testing of thin films." Journal of Materials Research 8, no. 4 (April 1993): 764–70. http://dx.doi.org/10.1557/jmr.1993.0764.

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The “x-ray tensile test” is the combination of the standard uniaxial tensile test with x-ray diffraction techniques. In this test, in addition to the mechanical stress-strain values usually obtained from a tensile test, one measures the x-ray strain and stress in the diffracting regions of the sample. In multilayer thin films or in multiphase materials, x-ray diffraction enables the determination of strains and stresses in the individual layers or phases. Correlation of the x-ray data with the mechanical stress-strain values may be used to analyze strain and load partitioning within the specimen. In this paper an extended theoretical analysis of this technique and its application to evaporated Cu films on Ni substrates is presented.

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5

Hansford, G. M. "Phase-targeted X-ray diffraction." Journal of Applied Crystallography 49, no. 5 (September 1, 2016): 1561–71. http://dx.doi.org/10.1107/s1600576716011936.

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A powder X-ray diffraction (XRD) method to enhance the signal of a specific crystalline phase within a mixture is presented for the first time. Specificity to the targeted phase relies on finding coincidences in the ratios of crystal d spacings and the ratios of elemental characteristic X-ray energies. Such coincidences can be exploited so that the two crystal planes diffract through the same scattering angle at two different X-ray energies. An energy-resolving detector placed at the appropriate scattering angle will detect a significantly enhanced signal at these energies if the target mineral or phase is present in the sample. When implemented using high scattering angles, for example 2θ > 150°, the method is tolerant to sample morphology and distance on the scale of ∼2 mm. The principle of the method is demonstrated experimentally using Pd Lα1 and Pd Lβ1 emission lines to enhance the diffraction signal of quartz. Both a pure quartz powder pellet and an unprepared mudstone rock specimen are used to test and develop the phase-targeted method. The technique is further demonstrated in the sensitive detection of retained austenite in steel samples using a combination of In Lβ1 and Ti Kβ emission lines. For both these examples it is also shown how the use of an attenuating foil, with an absorption edge close to and above the higher-energy characteristic X-ray line, can serve to isolate to some degree the coincidence signals from other fluorescence and diffraction peaks in the detected spectrum. The phase-targeted XRD technique is suitable for implementation using low-cost off-the-shelf components in a handheld or in-line instrument format.

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6

Klevtsov, Ghennadiy Vsevolodovich, Ludmila Rafailovna Botvina, and Natal'ya Arturovna Klevtsova. "X-ray Diffraction Technique for Analysing Failed Components." ISIJ International 36, no. 2 (1996): 222–28. http://dx.doi.org/10.2355/isijinternational.36.222.

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7

HAMAYA, Nozomu. "Polycrystalline X-ray Diffraction Technique with a DAC." REVIEW OF HIGH PRESSURE SCIENCE AND TECHNOLOGY 9, no. 4 (1999): 263–69. http://dx.doi.org/10.4131/jshpreview.9.263.

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8

Kohara, S., N. Umesaki, H. Ohno, K. Suzuya, and I. Sakai. "The structure of oxide glasses studied by high-energy x-ray diffraction." Physics and Chemistry of Glasses: European Journal of Glass Science and Technology Part B 61, no. 6 (December 12, 2020): 233–38. http://dx.doi.org/10.13036/17533562.61.6.kohara.

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The use of high‑energy x‑ray diffraction techniques with the latest generation synchrotron sources has created new approaches to study quantitatively the structure of noncrystalline materials. Recently, this technique has been combined with neutron diffraction at pulsed source to provide more detailed and reliable structural information not previously available. This article reviews and summarises recent results obtained from the high energy x‑ray diffraction on several oxide glasses, SiO2, B2O3 and PbSiO3, using bending magnet beamlines at SPring‑8. In particular, it addresses the structural models of the oxide glasses obtained by the reverse Monte Carlo (RMC) modelling technique using both the high energy x‑ray and neutron diffraction data.

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9

Palmer, David C. "Digital analysis of X-ray films." Mineralogical Magazine 61, no. 406 (June 1997): 453–61. http://dx.doi.org/10.1180/minmag.1997.061.406.11.

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AbstractHigh-resolution intensity profiles can be generated from X-ray diffraction films using a desk-top scanner and computer image analysis. The resulting intensity profiles have spatial resolutions equal to, or exceeding that of modern powder diffractometers — at a fraction of the cost. This technique provides an economical way of preserving the information stored in libraries of old (and deteriorating) powder diffraction films. The same technique can also be extended to permit quantitative analysis of single-crystal diffraction films.

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10

Huang, T. C. "Grazing-incidence X-Ray Analysis of Surfaces and Thin Films." Advances in X-ray Analysis 35, A (1991): 143–50. http://dx.doi.org/10.1154/s0376030800008776.

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AbstractGrazing-incidence X-ray analysis techniques which are commonly used for the nondestructive characterization of surfaces and thin films are reviewed. The X-ray reflectivity technicue is used to study surface uniformity and oxidation, layer thickness and density, interface roughness and diffusion, etc. The grazing-incidence in-plane diffraction technique is used to determine in-plane crystallography of epitaxial films. The grazing-incidence asymmetric-Bragg diffraction is used for surface phase identification and structural depth profiling determination of polycrystalline films. Typical examples to illustrate the types of information that can be obtained by the techniques are presented.

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11

Goryczka, Tomasz, Grzegorz Dercz, Lucjan Pająk, and Eugeniusz Łągiewka. "Lattice and Peak Profile Parameters in GIXD Technique." Solid State Phenomena 130 (December 2007): 281–86. http://dx.doi.org/10.4028/www.scientific.net/ssp.130.281.

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Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.

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12

Lima, A. N. C., M. A. R. Miranda, and J. M. Sasaki. "X-ray diffraction in superabsorbing crystals: absorption intrinsic width." Acta Crystallographica Section A Foundations and Advances 75, no. 5 (August 30, 2019): 772–76. http://dx.doi.org/10.1107/s2053273319009732.

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The several mathematical formulations of X-ray diffraction theory facilitate its understanding and use as a materials characterization technique, since one can opt for the simplest formulation that adequately describes the case being studied. As synchrotrons advance, new techniques are developed and there is a need for simple formulations to describe them. One of these techniques is soft resonant X-ray diffraction, in which the X-rays suffer large attenuation due to absorption. In this work, an expression is derived for the X-ray diffraction profiles of reflections where the linear absorption is far greater than primary extinction; in other words, the crystal is superabsorbing. The case is considered of a parallel plate crystal, for which the diffraction profile of the superabsorbing crystal is computed as a function of crystal size normal to the diffraction planes. For thin crystals or those with negligible absorption, the diffraction profile of a superabsorbing crystal coincides with the result of the kinematical theory. For thick crystals, the absorption intrinsic profile is obtained, described by a Lorentzian function and characterized by the absorption intrinsic width. This absorption intrinsic width is proportional to the linear absorption coefficient and its expression is similar to that for the Darwin width, while the absorption intrinsic profile is a special case of the Laue dynamical theory, and it is similar to the Ornstein–Zernike Lorentzian. The formulation of X-ray diffraction of superabsorbing crystals is simple and provides new perspectives for the soft resonant X-ray diffraction technique.

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13

Almarshad, Hassan A., Sayed M. Badawy, and Abdalkarem F. Alsharari. "Structural Characterization of Gallbladder Stones Using Energy Dispersive X-ray Spectroscopy and X-ray Diffraction." Combinatorial Chemistry & High Throughput Screening 21, no. 7 (November 15, 2018): 495–500. http://dx.doi.org/10.2174/1386207321666180913113803.

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Aim and Objective: Formation of the gallbladder stones is a common disease and a major health problem. The present study aimed to identify the structures of the most common types of gallbladder stones using X-ray spectroscopic techniques, which provide information about the process of stone formation. Material and Method: Phase and elemental compositions of pure cholesterol and mixed gallstones removed from gallbladders of patients were studied using energy-dispersive X-ray spectroscopy combined with scanning electron microscopy analysis and X-ray diffraction. Results: The crystal structures of gallstones which coincide with standard patterns were confirmed by X-ray diffraction. Plate-like cholesterol crystals with laminar shaped and thin layered structures were clearly observed for gallstone of pure cholesterol by scanning electron microscopy; it also revealed different morphologies from mixed cholesterol stones. Elemental analysis of pure cholesterol and mixed gallstones using energy-dispersive X-ray spectroscopy confirmed the different formation processes of the different types of gallstones. Conclusion: The method of fast and reliable X-ray spectroscopic techniques has numerous advantages over the traditional chemical analysis and other analytical techniques. The results also revealed that the X-ray spectroscopy technique is a promising technique that can aid in understanding the pathogenesis of gallstone disease.

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14

Bokhimi, Xim, and Carlos Gonzalez. "Modeling X-ray diffractomerers using ray tracing and parallel coprocessors." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1078. http://dx.doi.org/10.1107/s2053273314089219.

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In X-ray powder diffraction, the use of the Rietveld technique to refine crystalline structures requires modeling the diffractometer. Some of the codes using this technique incorporate simple models for it. These codes do not affect the refined parameters only when the X-ray source is a synchrotron with enough X-ray optic to reduce the associated aberrations. When the diffractometer belongs to a standard laboratory, however, the optic associated to it gives rise to large aberrations; for example, asymmetric and shifted peaks that depend on the diffraction angle. When the above codes are used to refine crystalline structures, the refined parameters are non-confident, because they are partially modeling these aberrations. If in the code, the effect of the optical components on the diffraction pattern is modeled correctly, the obtained refined parameters will be more confident. This kind of modeling has been done in the codes that use the fundamental parameters model for the diffractometer. There are two ways to perform this modeling: in one of them the codes use an analytical model for each one of the optical components of the diffractometer; other codes use the ray tracing technique to model the path of the x-rays along the optic. This last technique requires a powerful computer facility. In this work, we present the developing of an open-source code to model the diffractometer by using the ray tracing technique. To reduce the calculation time, the code was written in OpenCL for a computer with a Fermi K20 coprocessor, and for a computer with a Xeon-Phi coprocessor, using the Qt platform for both systems. The device-function generated with this code can be used as input for any other code that models diffraction patterns, or refines crystalline structures. The code can also be used for teaching the effect of the different optical components on an X-ray powder diffraction pattern, including the effect of a wrong alignment of these components.

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15

Hilhorst, J., F. Marschall, T. N. Tran Thi, A. Last, and T. U. Schülli. "Full-field X-ray diffraction microscopy using polymeric compound refractive lenses." Journal of Applied Crystallography 47, no. 6 (November 4, 2014): 1882–88. http://dx.doi.org/10.1107/s1600576714021256.

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Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

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16

Li Xiao-Dong, Li Hui, and Li Peng-Shan. "High pressure single-crystal synchrotron X-ray diffraction technique." Acta Physica Sinica 66, no. 3 (2017): 036203. http://dx.doi.org/10.7498/aps.66.036203.

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17

Tayebifard, S. A., K. Ahmadi, R. Yazdani-Rad, and M. Doroudian. "New X-ray powder diffraction data for Mo2.85Al1.91Si4.81." Powder Diffraction 21, no. 3 (September 2006): 238–40. http://dx.doi.org/10.1154/1.2244544.

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X-ray powder diffraction data for Mo2.85Al1.91Si4.81 are reported. The new Mo2.85Al1.91Si4.81 compound was successfully prepared using the self-propagating high-temperature synthesis (SHS) technique. The starting atomic mixture of reactant powders was Mo+2(1−x)Si+2xAl with x=0.3. The final powder compound obtained by the SHS technique was determined to be Mo2.85Al1.91Si4.81 by ICP-AES. X-ray powder diffraction pattern of Mo2.85Al1.91Si4.81 was recorded using an X-ray powder diffractometer, Cu Kα radiation, and analyzed by automatic indexing programs. Mo2.85Al1.91Si4.81 was found to be hexagonal with a=4.6929(2) Å and c=6.5515(4) Å. The XRD results are in good agreement with those of Mo2.85Ga2Si4.15.

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18

Bauch, J., H. J. Ullrich, and D. Reiche. "X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique." Crystal Research and Technology 35, no. 4 (April 2000): 473–78. http://dx.doi.org/10.1002/1521-4079(200004)35:4<473::aid-crat473>3.0.co;2-1.

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19

Gao, Yuan, Ross Harder, Stephen H. Southworth, Jeffrey R. Guest, Xiaojing Huang, Zijie Yan, Leonidas E. Ocola, et al. "Three-dimensional optical trapping and orientation of microparticles for coherent X-ray diffraction imaging." Proceedings of the National Academy of Sciences 116, no. 10 (February 14, 2019): 4018–24. http://dx.doi.org/10.1073/pnas.1720785116.

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Optical trapping has been implemented in many areas of physics and biology as a noncontact sample manipulation technique to study the structure and dynamics of nano- and mesoscale objects. It provides a unique approach for manipulating microscopic objects without inducing undesired changes in structure. Combining optical trapping with hard X-ray microscopy techniques, such as coherent diffraction imaging and crystallography, provides a nonperturbing environment where electronic and structural dynamics of an individual particle in solution can be followed in situ. It was previously shown that optical trapping allows the manipulation of micrometer-sized objects for X-ray fluorescence imaging. However, questions remain over the ability of optical trapping to position objects for X-ray diffraction measurements, which have stringent requirements for angular stability. Our work demonstrates that dynamic holographic optical tweezers are capable of manipulating single micrometer-scale anisotropic particles in a microfluidic environment with the precision and stability required for X-ray Bragg diffraction experiments—thus functioning as an “optical goniometer.” The methodology can be extended to a variety of X-ray experiments and the Bragg coherent diffractive imaging of individual particles in solution, as demonstrated here, will be markedly enhanced with the advent of brighter, coherent X-ray sources.

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20

Guan, Ching Chin, Sha Shiong Ng, Hassan Zainuriah, and Abu Hassan Haslan. "Structural Properties Studies of GaN on 6H-SiC by Means of X-Ray Diffraction Technique." Advanced Materials Research 173 (December 2010): 40–43. http://dx.doi.org/10.4028/www.scientific.net/amr.173.40.

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Epitaxial growth of GaN has become an interest topic in term of light emitting device fabrication. Most of the commercial GaN based device is normally grown on sapphire substrate. For power device application, SiC has been found to be a desirable candidate for GaN epilayer due to their high thermal conductivity, small lattice mismatch, and hexagonal lattice mismatch with cleaved facet for the laser cavity. In this paper, X-ray diffraction (XRD) technique is employed to study the structural properties of GaN thin film grown on 6H-SiC substrate. For conventional XRD -2 scan, only diffraction peaks from GaN (002) and its multiple diffractions were observed, along with diffractions from SiC (006) peak. These results suggested that the GaN film is in wurtzite phase. For XRD rocking curve of omega scan of (002) diffraction plane of the GaN, a full width at half maximum of about 259 arcsec is obtained.

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21

Henry, L., N. Guignot, A. King, E. Giovenco, J. P. Deslandes, and J. P. Itié. "In situ characterization of liquids at high pressure combining X-ray tomography, X-ray diffraction and X-ray absorption using the white beam station at PSICHÉ." Journal of Synchrotron Radiation 29, no. 3 (April 25, 2022): 853–61. http://dx.doi.org/10.1107/s1600577522003411.

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A novel experimental setup dedicated to the study of liquid and amorphous materials, on the white beam station of the PSICHÉ beamline at SOLEIL, is described. The Beer–Lambert absorption method has been developed using a broad-spectrum (white) incident beam for in situ density measurements at extreme conditions of pressure and temperature. This technique has been combined with other existing X-ray techniques (radiographic imaging, tomography and combined angle energy dispersive X-ray diffraction). Such a multi-technical approach offers new possibilities for the characterization of liquid and amorphous materials at high pressure and high temperature. The strength of this approach is illustrated by density measurements of liquid gallium at pressures up to 4 GPa, combining the three independent X-ray techniques (the Beer–Lambert absorption method, tomography and X-ray diffraction).

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22

Henry, L., N. Guignot, A. King, E. Giovenco, J. P. Deslandes, and J. P. Itié. "In situ characterization of liquids at high pressure combining X-ray tomography, X-ray diffraction and X-ray absorption using the white beam station at PSICHÉ." Journal of Synchrotron Radiation 29, no. 3 (April 25, 2022): 853–61. http://dx.doi.org/10.1107/s1600577522003411.

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A novel experimental setup dedicated to the study of liquid and amorphous materials, on the white beam station of the PSICHÉ beamline at SOLEIL, is described. The Beer–Lambert absorption method has been developed using a broad-spectrum (white) incident beam for in situ density measurements at extreme conditions of pressure and temperature. This technique has been combined with other existing X-ray techniques (radiographic imaging, tomography and combined angle energy dispersive X-ray diffraction). Such a multi-technical approach offers new possibilities for the characterization of liquid and amorphous materials at high pressure and high temperature. The strength of this approach is illustrated by density measurements of liquid gallium at pressures up to 4 GPa, combining the three independent X-ray techniques (the Beer–Lambert absorption method, tomography and X-ray diffraction).

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23

Hamilton, R. D., and N. G. Peletis. "The Determination of Quartz in Perlite by X-ray Diffraction." Advances in X-ray Analysis 33 (1989): 493–97. http://dx.doi.org/10.1154/s0376030800019923.

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AbstractIARC's designation of crystalline silica as a “probable carcinogen” triggered the requirement to label products containing greater than 0.1 % crystalline silica. For perlite and other materials which may contain crystalline silica in levels close to 0.1% an accurate determination is critical from both legal and marketing considerations.Existing analytical techniques for the determination of crystalline silica at levels of less than 1.0% were found to be inadequate to meet the new requirements. An improved technique based on x-ray diffraction has been developed specifically to analyze perlite for crystalline silica, which occurs largely in the form of quartz, at the 0.1%. level. The technique employs long counting times and improved sample preparation and mounting to increase both precision and accuracy, and to lower the detection limit to less than 0.1%.The technique was tested on a large number of samples from a variety of sources and proven to give excellent results for all types of expanded perlites and perlite ores. The procedures developed are applicable to a wide variety of materials in addition to perlite.

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24

Brower, Daniel T., Brian S. Medower, and Ting C. Huang. "Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity." Advances in X-ray Analysis 39 (1995): 615–25. http://dx.doi.org/10.1154/s0376030800023041.

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X-ray polycrystalline diffraction was used to track progress toward improving the structural properties of SrS:(Eu,Sm) thin films. These thin films are used as the active layer of the ETOM (Electron Trapping Optical Memory) media. In this study conventional x-ray diffraction and x-ray reflectivity were used to evaluate the effect of two deposition parameters on film structures. Line broadening analysis performed using the Warren-Averbach technique showed the beneficial effects of a hydrogen sulfide reactive atmosphere and the RF magnetron sputtering technique on crystallite size and microstrain. A factor of five improvement in crystallite size and a factor of two reduction in microstrain was observed. Film thickness, density, and interfacial and surface roughnesses were determined for two SrS thin films. The sin2Ψ technique was used to determine the in-plane biaxial stress for two films prepared by different deposition techniques. These films exhibit inhomogeneous stress states with an average stress of less than IMPa.

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25

Rashmi and D. K. Suri. "X-ray powder diffraction study of CuInSeTe." Powder Diffraction 15, no. 1 (March 2000): 65–68. http://dx.doi.org/10.1017/s0885715600010861.

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CuInSeTe was synthesized by the melt and anneal technique. The compound crystallized in the chalcopyrite structure having space group I4¯2d with Z=4. Complete X-ray powder diffraction data were obtained and the unit cell parameters a and c, X-ray density and u parameter were calculated. These are a=0.5987(1) nm, c=1.1979(4) nm, Dx=5.96×103kg/m3, and u=0.2498. Atomic positions in the unit cell are proposed.© 2000 International Centre for Diffraction Data.

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26

Bogdanowicz, Włodzimierz, Robert Albrecht, Arkadiusz Onyszko, and Jan Sieniawski. "Characterization of Single-Crystal Turbine Blades by X-Ray Diffraction Methods." Solid State Phenomena 203-204 (June 2013): 63–66. http://dx.doi.org/10.4028/www.scientific.net/ssp.203-204.63.

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Characterization of structure defects in turbine blades is the basis for determination of the overall crystalline perfections. This work presents the possibilities of identifying casting defects by combining different X-ray diffraction techniques. The investigation was conducted on samples prepared from as-cast turbine blades airfoil and tips. It was found that X-ray topograms revealed dendritic structure and macro strain areas. The defects areas which have appeared on topograms were also investigated by X-ray diffraction mapping technique by EFG diffractometer. Additionally, the X-ray investigation was complemented by macro SEM images obtained by stitching several images of microstructure. The X-ray maps of misorientation angle and X-ray topograms revealed deviation between the γ’ direction and the blade axis and rotation of the primary dendrite arm around this axis.

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27

Segmüller, Armin. "Characterization of Epitaxial Films by X-Ray Diffraction." Advances in X-ray Analysis 29 (1985): 353–66. http://dx.doi.org/10.1154/s0376030800010454.

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AbstractIn this paper, the application of recently developed x-ray diffraction techniques to the characterization of thin epitaxial films will be discussed. The double-crystal diffractometer, with high resolution in the non-dispersive arrangement, enables the materials scientist to study epitaxial systems having a very small mismatch with high precision. A key part of the characterization of an epitaxial film is the determination of the strain tensor by measuring lattice spacing! in various directions The determination of strain and composition profiles in ion-implanted films, epitaxial layers and superlattices by rocking-curve analysis will also be reviewed. Grazingincidence diffraction, an emerging new technique, can be used to obtain structural details parallel to the interface on films with thicknesses ranging down to a few atomic layers. The synchroton has now become increasingly available as a powerful source of x radiation which will facilitate the application of conventional and grazing-incidence diffraction to ultra-thin films.

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28

Garbauskas, Mary F., Donald G. LeGrand, and Raymond P. Goehner. "Application of Grazing Incidence X-Ray Diffraction to Polymer Blends." Advances in X-ray Analysis 36 (1992): 373–77. http://dx.doi.org/10.1154/s037603080001898x.

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AbstractThe physical properties of polymer blends consisting of one or more crystallizable components are affected by the microstructure of these materials. In particular, the degree of crystallinity can be influenced by processing parameters, and the crystallinity, as well as the phase distribution, may vary as a function of depth through an injection molded part. Conventional x-ray diffraction techniques can provide information regarding both phase composition and degree of crystallinity, but, because of the relative transparency of these materials to wavelengths generally available in the laboratory, these techniques provide information representative of only the bulk. By employing parallel beam optics at varying grazing incidence angles, the x-ray sampling depth can be varied without loss of resolution, This technique can be used to vary the effective analysis depth from the top several hundred angstroms for low grazing incidence to centimeters for transmission diffraction patterns, Grazing incidence techniques have found initial application in the characterization of thin metallic and ceramic films. This paper demonstrates the feasibility of using parallel beam optics to depth profile low atomic number materials. The specific application of this technique to the characterization of injection molded polymers, including a blend of bisphenol-A polycarbonate (PC) and polybutylene terephthalate (PBT), will be presented.

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29

Katsaras, J. "X-ray diffraction studies of oriented lipid bilayers." Biochemistry and Cell Biology 73, no. 5-6 (May 1, 1995): 209–18. http://dx.doi.org/10.1139/o95-025.

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This brief review of the X-ray diffraction technique used to study oriented lipid bilayer systems is primarily intended to demonstrate to the nonspecialist in the lipid field the amount of detailed information that can be obtained simply by visually inspecting the diffraction pattern and making some measurements with a ruler and protractor. The information that can be extracted from X-ray diffraction data is illustrated by selected examples of our most recent work.Key words: X-ray diffraction, oriented multibilayers, electron density profiles, subgel phase, phase problem.

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30

Bosikov, Igor I., Nikita V. Martyushev, Roman V. Klyuev, Vadim S. Tynchenko, Viktor A. Kukartsev, Svetlana V. Eremeeva, and Antonina I. Karlina. "Complex Assessment of X-ray Diffraction in Crystals with Face-Centered Silicon Carbide Lattice." Crystals 13, no. 3 (March 19, 2023): 528. http://dx.doi.org/10.3390/cryst13030528.

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X-ray diffraction analysis is essential in studying stacking faults. Most of the techniques used for this purpose are based on theoretical studies. These studies suggest that the observed diffraction patterns are caused by random stacking faults in crystals. In reality, however, the condition of randomness for stacking faults may be violated. The purpose of the study was to develop a technique that can be used to calculate the diffraction effects of the axis of the thin plates of twin, new phases, as well as other variations in defective structures. Materials and methods. This was achieved through modern X-ray diffraction methods using differential equations (transformations and Fourier transforms) and the construction of the Ewald sphere, mathematical analysis, mathematical logic, and mathematical modeling (complex Markov chain). Conclusion. The study made it possible to develop a technique for the calculation of the diffraction effects of the axis of the thin plates of twin, new phases and other variations in defective structures. The technique makes it possible to solve several complex, urgent problems related to the calculation of X-ray diffraction for crystals with face-centered lattices containing different types of stacking faults. At the same time, special attention was paid to the correlations between the relative positions of faults. The calculations showed that the proposed method can help to determine the nature and structure of stacking faults by identifying the partial and vertex dislocations limiting them in twin crystals with a face-centered cubic structure of silicon carbide based on X-ray diffraction analysis.

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31

Hansford, Graeme Mark. "Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphology." Journal of Applied Crystallography 44, no. 3 (April 22, 2011): 514–25. http://dx.doi.org/10.1107/s0021889811012696.

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A novel X-ray diffraction (XRD) technique, which exhibits almost complete insensitivity to the morphology of and distance to the sample, is presented for the first time. This technique applies energy-dispersive XRD (EDXRD) in a back-reflection geometry, with 2θ ≃ 180°. Although this geometry leads to low resolution of diffraction peaks and the greatest overlap with fluorescence peaks, it nevertheless yields a combination of properties that are unique in the field of X-ray diffractometry. It is likely that diffraction patterns can be obtained with no or very minimal sample preparation. Furthermore, the intrinsic geometry of the method and the simplicity inherent to EDXRD enables a compact lightweight instrument design, suitable for field-portable or hand-held XRD and X-ray fluorescence analysis. Application to geological and planetary science is emphasized in this paper. The characteristics of the technique are elucidatedviatheoretical considerations and ray-trace modelling, and the simplest possible implementation is described.

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32

Nikulin, A. Y., A. V. Darahanau, R. Horney, and T. Ishikawa. "High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique." Physica B: Condensed Matter 349, no. 1-4 (June 2004): 281–95. http://dx.doi.org/10.1016/j.physb.2004.03.248.

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33

Sekiguchi, Yuki, Tomotaka Oroguchi, Yuki Takayama, and Masayoshi Nakasako. "Data processing software suiteSITENNOfor coherent X-ray diffraction imaging using the X-ray free-electron laser SACLA." Journal of Synchrotron Radiation 21, no. 3 (March 15, 2014): 600–612. http://dx.doi.org/10.1107/s1600577514003439.

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Coherent X-ray diffraction imaging is a promising technique for visualizing the structures of non-crystalline particles with dimensions of micrometers to sub-micrometers. Recently, X-ray free-electron laser sources have enabled efficient experiments in the `diffraction before destruction' scheme. Diffraction experiments have been conducted at SPring-8 Angstrom Compact free-electron LAser (SACLA) using the custom-made diffraction apparatus KOTOBUKI-1 and two multiport CCD detectors. In the experiments, ten thousands of single-shot diffraction patterns can be collected within several hours. Then, diffraction patterns with significant levels of intensity suitable for structural analysis must be found, direct-beam positions in diffraction patterns determined, diffraction patterns from the two CCD detectors merged, and phase-retrieval calculations for structural analyses performed. A software suite namedSITENNOhas been developed to semi-automatically apply the four-step processing to a huge number of diffraction data. Here, details of the algorithm used in the suite are described and the performance for approximately 9000 diffraction patterns collected from cuboid-shaped copper oxide particles reported. Using theSITENNOsuite, it is possible to conduct experiments with data processing immediately after the data collection, and to characterize the size distribution and internal structures of the non-crystalline particles.

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34

Li, Z. G. "Using Electron Diffraction Technique to Solve Real World Problems." Microscopy and Microanalysis 7, S2 (August 2001): 554–55. http://dx.doi.org/10.1017/s1431927600028841.

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Electron diffraction can be a very useful technique in solving real world structure-related problems. However, electron diffraction is much less widely used in industry compared to x-ray diffraction for several reasons. So far, application of electron diffraction has been limited to large-sized companies either to characterize newly synthesized materials in a research division or to directly support business activities in an analytical laboratory. New materials produced on a commercial scale are more and more complex with micro-, even nano-meter sized structures. Development of these materials on a commercial scale, for example, high temperature superconducting compounds, fullerenes, and giant magneoresistance devices [1-7], has increased demand for electron diffraction techniques considerably. Here, I would like to review how electron microscopists in industry solve their real world problems using electron diffraction techniques [8].Unit cell determination. Unit cell parameters and atom coordinates of a crystal can be routinely determined by single crystal x-ray technique if the crystal is large enough (about 0.1 mm in size).

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35

Fiala, J., M. Kolega, and V. Mentl. "Degradation assessment of welded joints by X-ray diffraction technique." Materials at High Temperatures 23, no. 3 (August 15, 2006): 267–71. http://dx.doi.org/10.3184/096034006782739222.

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36

Chu, Y. S., F. De Carlo, J. D. Almer, and D. C. Mancini. "Development of in situ x-ray tomography-diffraction technique (abstract)." Review of Scientific Instruments 73, no. 3 (March 2002): 1656. http://dx.doi.org/10.1063/1.1448133.

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37

Liu, H., L. Wang, Z. Yu, L. Kong, J. Zhao, D. Dong, C. Li, and Z. Liu. "Synchrotron X-ray diffraction tomography technique using diamond anvil cell." Acta Crystallographica Section A Foundations of Crystallography 67, a1 (August 22, 2011): C113. http://dx.doi.org/10.1107/s0108767311097236.

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38

Stragier, H., J. O. Cross, J. J. Rehr, Larry B. Sorensen, C. E. Bouldin, and J. C. Woicik. "Diffraction anomalous fine structure: A new x-ray structural technique." Physical Review Letters 69, no. 21 (November 23, 1992): 3064–67. http://dx.doi.org/10.1103/physrevlett.69.3064.

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39

Antonio, Cadena-Arenas, Kryshtab Tetyana, Palacios-Gómez Jesús, and Kryvko Andriy. "Extinction Phenomenon in X-Ray Diffraction Technique for Texture Analysis." Ingeniería, Investigación y Tecnología 15, no. 2 (April 2014): 241–52. http://dx.doi.org/10.1016/s1405-7743(14)72214-0.

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40

Qiu, Jing-bo, Gang Li, Yue Sheng, and Mu-rong Zhu. "Quantification of febuxostat polymorphs using powder X-ray diffraction technique." Journal of Pharmaceutical and Biomedical Analysis 107 (March 2015): 298–303. http://dx.doi.org/10.1016/j.jpba.2015.01.005.

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41

Tiwari, Manisha, Garima Chawla, and Arvind K. Bansal. "Quantification of olanzapine polymorphs using powder X-ray diffraction technique." Journal of Pharmaceutical and Biomedical Analysis 43, no. 3 (February 2007): 865–72. http://dx.doi.org/10.1016/j.jpba.2006.08.030.

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42

Kharin, A. Yu, R. B. Assilbayeva, Yu V. Kargina, and V. Yu Timoshenko. "Comparative analysis of silicon nanostructures by x-ray diffraction technique." IOP Conference Series: Materials Science and Engineering 475 (February 18, 2019): 012010. http://dx.doi.org/10.1088/1757-899x/475/1/012010.

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43

Fiala, J., M. Kolega, and V. Mentl. "Degradation assessment of welded joints by X-ray diffraction technique." Materials at High Temperatures 23, no. 3-4 (January 2006): 267–71. http://dx.doi.org/10.1179/mht.2006.024.

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44

Panchenko, A. V., N. D. Tolstykh, and S. A. Gromilov. "The technique of X-ray diffraction investigation of crystal aggregates." Journal of Structural Chemistry 55, no. 7 (December 2014): 1209–14. http://dx.doi.org/10.1134/s002247661407004x.

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45

Hansford, G. M., S. M. R. Turner, P. Degryse, and A. J. Shortland. "High-resolution X-ray diffraction with no sample preparation." Acta Crystallographica Section A Foundations and Advances 73, no. 4 (June 29, 2017): 293–311. http://dx.doi.org/10.1107/s2053273317008592.

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Анотація:

It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique allows high-quality X-ray diffraction analysis of samples that have not been prepared and is therefore completely non-destructive. The experimental technique was implemented on beamline B18 at the Diamond Light Source synchrotron in Oxfordshire, UK. The majority of the experiments in this study were performed with pre-characterized geological materials in order to elucidate the characteristics of this novel technique and to develop the analysis methods. Results are presented that demonstrate phase identification, the derivation of precise unit-cell parameters and extraction of microstructural information on unprepared rock samples and other sample types. A particular highlight was the identification of a specific polytype of a muscovite in an unprepared mica schist sample, avoiding the time-consuming and difficult preparation steps normally required to make this type of identification. The technique was also demonstrated in application to a small number of fossil and archaeological samples. Back-reflection EDXRD implemented in a high-resolution configuration shows great potential in the crystallographic analysis of cultural heritage artefacts for the purposes of scientific research such as provenancing, as well as contributing to the formulation of conservation strategies. Possibilities for moving the technique from the synchrotron into museums are discussed. The avoidance of the need to extract samples from high-value and rare objects is a highly significant advantage, applicable also in other potential research areas such as palaeontology, and the study of meteorites and planetary materials brought to Earth by sample-return missions.

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46

Fry, A. Tony, and Jerry D. Lord. "Measuring the Variation of Residual Stress with Depth: A Validation Exercise for Fine Incremental Hole Drilling." Materials Science Forum 524-525 (September 2006): 531–37. http://dx.doi.org/10.4028/www.scientific.net/msf.524-525.531.

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Hole drilling along with X-Ray diffraction, is one of the most widely used techniques for measuring residual stress, but the conventional approach is limited in the near surface detail that can be resolved. Because of concerns regarding the levels of induced residual stress that might develop during machining and surface treatment processes, there is significant interest in developing a technique that can obtain near surface residual stress information by the application of fine increment hole drilling. Through a cross comparison with X-ray diffraction and neutron diffraction the procedure of fine incremental drilling has been validated, and the advantages of this technique demonstrated.

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47

Schriber, Elyse A., Daniel W. Paley, Robert Bolotovsky, Daniel J. Rosenberg, Raymond G. Sierra, Andrew Aquila, Derek Mendez, et al. "Chemical crystallography by serial femtosecond X-ray diffraction." Nature 601, no. 7893 (January 19, 2022): 360–65. http://dx.doi.org/10.1038/s41586-021-04218-3.

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AbstractInorganic–organic hybrid materials represent a large share of newly reported structures, owing to their simple synthetic routes and customizable properties1. This proliferation has led to a characterization bottleneck: many hybrid materials are obligate microcrystals with low symmetry and severe radiation sensitivity, interfering with the standard techniques of single-crystal X-ray diffraction2,3 and electron microdiffraction4–11. Here we demonstrate small-molecule serial femtosecond X-ray crystallography (smSFX) for the determination of material crystal structures from microcrystals. We subjected microcrystalline suspensions to X-ray free-electron laser radiation12,13 and obtained thousands of randomly oriented diffraction patterns. We determined unit cells by aggregating spot-finding results into high-resolution powder diffractograms. After indexing the sparse serial patterns by a graph theory approach14, the resulting datasets can be solved and refined using standard tools for single-crystal diffraction data15–17. We describe the ab initio structure solutions of mithrene (AgSePh)18–20, thiorene (AgSPh) and tethrene (AgTePh), of which the latter two were previously unknown structures. In thiorene, we identify a geometric change in the silver–silver bonding network that is linked to its divergent optoelectronic properties20. We demonstrate that smSFX can be applied as a general technique for structure determination of beam-sensitive microcrystalline materials at near-ambient temperature and pressure.

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48

Huang, T. C., A. Segmuller, W. Lee, V. Lee, D. Bullock, and R. Karimi. "X-ray Diffraction Analysis of High Tc Superconducting Thin Films." Advances in X-ray Analysis 32 (1988): 269–78. http://dx.doi.org/10.1154/s0376030800020577.

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AbstractX-ray diffraction techniques have been used for the structure characterization of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O thin films. A powder diffraction analysis of Y-Ba-Cu-O films showed that the films deposited at 650°C on Si are polycrystalline and have an orthorhambic structure similar to that of the YBa2Cu3O7 bulk superconductors. In addition to the conventional powder diffraction technique, both the rocking curve and the grazing incidence diffraction methods were used to characterize a YBa2Cu3O7 film on (110) SrTiO3 substrate. Results showed that the film was epitaxially grown and aligned with its substrate in a true epitaxy. Phase identification and line broadening analyses of Tl-Ca-Ba-Cu-O films showed that the films are comprised of one or more superconducting phases and probably contain stacking faults.

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49

Bhambroo, Rajan. "Phase Analysis Primer: How to Select the Right Analytical Technique." AM&P Technical Articles 181, no. 1 (January 1, 2023): 32–35. http://dx.doi.org/10.31399/asm.amp.2023-01.p032.

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Abstract This article reviews the analytical techniques used for phase identification in components, including x-ray diffraction, metallography/microscopy, electron backscatter diffraction, trasmission electron microscopy,and atom probe tomography. The article addresses the advantages and disadvantages of each technique compared to the other approaches.

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50

Chushkin, Y., and F. Zontone. "Upsampling speckle patterns for coherent X-ray diffraction imaging." Journal of Applied Crystallography 46, no. 2 (March 14, 2013): 319–23. http://dx.doi.org/10.1107/s0021889813003117.

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Coherent X-ray diffraction imaging is a lensless imaging technique where an iterative phase-retrieval algorithm is applied to the speckle pattern, the far-field diffraction pattern produced by an isolated object. To ensure convergence to a unique solution, the diffraction pattern must be oversampled by a factor of two or more. Since the resolution in real space depends on the maximum wave vector where the intensity is detected,i.e.on the detector field of view, there is a practical limitation on oversampling in reciprocal space and resolution in real space that is ultimately determined by the number of pixels. This work shows that it is possible to reduce the effective pixel size and maintain the detector field of view by applying a linear combination method to shifted diffraction patterns. The feasibility of the method is demonstrated by reconstructing the images of test objects from diffraction patterns oversampled in each dimension by factors of 1.3 and 1.8 only. The described approach can be applied to any diffraction or imaging technique where the resolution is compromised by a large pixel size.

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