Книги з теми "X-RAY DEVICE"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся з топ-50 книг для дослідження на тему "X-RAY DEVICE".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Переглядайте книги для різних дисциплін та оформлюйте правильно вашу бібліографію.
S, Swaminathan. Characterisation of III-V quaternary multilayer semiconductor device materials by x-ray diffraction. [s.l.]: typescript, 1985.
Знайти повний текст джерелаMcGovern, Mark Edward. Monolayer chemistry - interaction of OTS with quartz/glass surfaces in various solvents probed by x-ray photoelectron spectroscopy and surface acoustic wave device. Ottawa: National Library of Canada, 1993.
Знайти повний текст джерелаM, Ceglio Natale, Dhez Pierre, Society of Photo-optical Instrumentation Engineers., and University of Alabama in Huntsville. Center for Applied Optics., eds. Multilayer structures and laboratory X-ray laser research: 19-20 August 1986, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Знайти повний текст джерелаStarr, Richard. Annual report for Catholic University co-operative agreement NCC-5-83, 1 April 1997 through 31 March 1998. [Washington, DC: National Aeronautics and Space Administration, 1998.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Знайти повний текст джерелаF, Marshall Gerald, and Society of Photo-optical Instrumentation Engineers., eds. Applications of thin-film multilayered structures to figured X-ray optics: August 20-22, 1985, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.
Знайти повний текст джерелаFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Знайти повний текст джерелаFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Знайти повний текст джерелаCenter, Goddard Space Flight, ed. Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1997.
Знайти повний текст джерелаWang, Jiajun, ed. Advanced X-ray Imaging of Electrochemical Energy Materials and Devices. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-16-5328-5.
Повний текст джерелаShvyd'ko, Yuri. X-ray optics: High-energy-resolution applications. Berlin: Springer, 2004.
Знайти повний текст джерелаSayre, David. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988.
Знайти повний текст джерелаCenter, Goddard Space Flight, ed. Theory and development of position-sensitive quantum calorimeters. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 2001.
Знайти повний текст джерелаHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), and Ōyō Butsuri Gakkai, eds. Photomask and X-ray mask technology VI: 13-14 April, 1999, Yokohama, Japan. Bellingham, Wash., USA: SPIE, 1999.
Знайти повний текст джерелаVangi, Dario, and Virginio Rivano, eds. Ricostruzione della dinamica degli incidenti stradali. L'ambito giuridico, la strada, il conducente e il veicolo. Florence: Firenze University Press, 2011. http://dx.doi.org/10.36253/978-88-8453-398-2.
Повний текст джерелаHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. Bellingham, Wash: SPIE, 2010.
Знайти повний текст джерелаD, Holland Andrew, Society of Photo-optical Instrumentation Engineers., and American Astronomical Society, eds. High-energy detectors in astronomy: 22-23 June 2004, Glasgow, Scotland, United Kingdom. Bellingham, Wash: SPIE, 2004.
Знайти повний текст джерелаHosono, Kunihiro. Photomask and next-generation lithography mask technology XVI: 8-10 April 2009, Yokohama, Japan. Edited by Photomask Japan, BACUS (Technical group), and SPIE (Society). Bellingham, Wash: SPIE, 2009.
Знайти повний текст джерелаHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. Edited by SPIE (Society) and Photomask Japan. Bellingham, Wash: SPIE, 2010.
Знайти повний текст джерелаKonishi, Toshio. Photomask and next-generation lithography mask technology XVIII: 13-15 April 2011. Bellingham: SPIE, 2011.
Знайти повний текст джерелаHiroyoshi, Tanabe, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology X: 16-18 April, 2003, Yokohama, Japan. Bellingham, Wash: SPIE, 2003.
Знайти повний текст джерелаHidehiro, Watanabe, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIV: 17-19 April 2007, Yokohama, Japan. Bellingham, Wash: SPIE, 2007.
Знайти повний текст джерелаMorihisa, Hoga, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIII: 18-20 April, 2006, Yokohama, Japan. Bellingham, Wash: SPIE, 2006.
Знайти повний текст джерелаHiroichi, Kawahira, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology IX: 23-25 April, 2002, Yokohama, Japan. Bellingham, Wash: SPIE, 2002.
Знайти повний текст джерелаHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), Society of Photo-optical Instrumentation Engineers., Ōyō Butsuri Gakkai, Seimitsu Kōgakkai, Denki Gakkai (1888), and Semiconductor Equipment and Materials International (Japan), eds. Photomask and next-generation lithography mask technology VII: 12-13 April 2000, Yokohama, Japan. Bellingham, Wash., USA: SPIE, 2000.
Знайти повний текст джерелаastronomer, Dorn David A., Holland Andrew D, Society of Photo-optical Instrumentation Engineers., and American Astronomical Society, eds. High energy, optical, and infrared detectors for astronomy II: 24-27 May, 2006, Orlando, Florida, USA. Bellingham, Wash: SPIE, 2006.
Знайти повний текст джерела(Society), SPIE, ed. High energy, optical, and infrared detectors for astronomy IV: 27-30 June 2010, San Diego, California United States. Bellingham, Wash: SPIE, 2010.
Знайти повний текст джерелаApplications of synchrotron radiation: Micro beams in cell micro biology and medicine. Berlin: Springer, 2007.
Знайти повний текст джерелаH, Yock Douglas, ed. Imaging of CNS disease: A CT and MR teaching file. 2nd ed. St. Louis: Mosby Year Book, 1991.
Знайти повний текст джерелаAmerica, Optical Society of, ed. Fourier transform spectroscopy: February 10-12, 1997, Hilton Hotel, Santa Fe, New Mexico. Washington, DC: The Society, 1997.
Знайти повний текст джерелаSepowski, Stephen J., ed. The Ultimate Hint Book. Old Saybrook, CT: The Ultimate Game Club Ltd., 1991.
Знайти повний текст джерелаDevice for Spatially Orienting an X-Ray Optical Unit and Apparatus Having Such a Device: United States Patent 9971121. Independently Published, 2020.
Знайти повний текст джерелаHughes, Jim. Exposures and image quality. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780198813170.003.0004.
Повний текст джерелаMartin, Colin J. Interaction of ionizing radiations with matter. Oxford University Press, 2015. http://dx.doi.org/10.1093/med/9780199655212.003.0002.
Повний текст джерелаNational Aeronautics and Space Administration (NASA) Staff. Modifications Developed to Improve X-Ray Detection Devices. Independently Published, 2018.
Знайти повний текст джерелаParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2015. http://dx.doi.org/10.1093/med/9780199687039.003.0019.
Повний текст джерелаParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2016. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_001.
Повний текст джерелаParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_002.
Повний текст джерелаParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_003.
Повний текст джерелаX-ray transmission microscope development: Final report; NASA contract NAS8-40185; period of performance, 02/28/95-08/31/97. Huntsville, AL: Center for Microgravity and Materials Research, University of Alabama in Huntsville, 1997.
Знайти повний текст джерелаWang, Jiajun. Advanced X-Ray Imaging of Electrochemical Energy Materials and Devices. Springer Singapore Pte. Limited, 2021.
Знайти повний текст джерелаWang, Jiajun. Advanced X-Ray Imaging of Electrochemical Energy Materials and Devices. Springer, 2022.
Знайти повний текст джерелаTiwari, Sandip. Electromagnetic-matter interactions and devices. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198759874.003.0006.
Повний текст джерелаShvyd'ko, Yuri. X-Ray Optics: High-Energy-Resolution Applications. Springer London, Limited, 2006.
Знайти повний текст джерелаX-Ray Optics: High-Energy-Resolution Applications. Springer, 2010.
Знайти повний текст джерелаHolland, Andrew D., and James W. Beletic. High Energy, Optical, and Infrared Detectors for Astronomy V. SPIE, 2012.
Знайти повний текст джерелаBodenham, Andrew R. Vascular access during anaesthesia. Edited by Michel M. R. F. Struys. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199642045.003.0049.
Повний текст джерелаSayre, David. X-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987". Springer, 2013.
Знайти повний текст джерелаSayre, David, Malcolm Howells, and Janos Kirz. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer, 2014.
Знайти повний текст джерела