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Статті в журналах з теми "Ultrafast microscopy"

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Автор: Grafiati

Опубліковано: 10 грудня 2022

Оновлено: 28 січня 2023

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1

Yarotski, Dzmitry, and Antoinette J. Taylor. "Microscopy: Ultrafast Scanning Tunneling Microscopy." Optics and Photonics News 13, no. 12 (December 1, 2002): 26. http://dx.doi.org/10.1364/opn.13.12.000026.

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2

Dyba, M., T. A. Klar, S. Jakobs, and S. W. Hell. "Ultrafast dynamics microscopy." Applied Physics Letters 77, no. 4 (July 24, 2000): 597–99. http://dx.doi.org/10.1063/1.127056.

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3

Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev, and L. Schäfer. "ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY." Fine Chemical Technologies 12, no. 1 (February 28, 2017): 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.

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Анотація:

Ultrafast laser spectral and electron diffraction methods complement each other and open up new possibilities in chemistry and physics to light up atomic and molecular motions involved in the primary processes governing structural transitions. Since the 1980s, scientific laboratories in the world have begun to develop a new field of research aimed at this goal. “Atomic-molecular movies” will allow visualizing coherent dynamics of nuclei in molecules and fast processes in chemical reactions in real time. Modern femtosecond and picosecond laser sources have made it possible to significantly change the traditional approaches using continuous electron beams, to create ultrabright pulsed photoelectron sources, to catch ultrafast processes in the matter initiated by ultrashort laser pulses and to achieve high spatio-temporal resolution in research. There are several research laboratories all over the world experimenting or planning to experiment with ultrafast electron diffraction and possessing electron microscopes adapted to operate with ultrashort electron beams. It should be emphasized that creating a new-generation electron microscope is of crucial importance, because successful realization of this project demonstrates the potential of leading national research centers and their ability to work at the forefront of modern science.

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4

Liebel, Matz, Franco V. A. Camargo, Giulio Cerullo, and Niek F. van Hulst. "Ultrafast Transient Holographic Microscopy." Nano Letters 21, no. 4 (February 4, 2021): 1666–71. http://dx.doi.org/10.1021/acs.nanolett.0c04416.

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5

Weiss, S., D. F. Ogletree, D. Botkin, M. Salmeron, and D. S. Chemla. "Ultrafast scanning probe microscopy." Applied Physics Letters 63, no. 18 (November 1993): 2567–69. http://dx.doi.org/10.1063/1.110435.

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6

Yang, D. S., O. F. Mohammed, and A. H. Zewail. "Scanning ultrafast electron microscopy." Proceedings of the National Academy of Sciences 107, no. 34 (August 9, 2010): 14993–98. http://dx.doi.org/10.1073/pnas.1009321107.

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7

Baiz, Carlos R., Denise Schach, and Andrei Tokmakoff. "Ultrafast 2D IR microscopy." Optics Express 22, no. 15 (July 25, 2014): 18724. http://dx.doi.org/10.1364/oe.22.018724.

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8

King, Wayne E., Geoffrey H. Campbell, Alan Frank, Bryan Reed, John Schmerge, Bradley Siwick, Brent Stuart, and Peter Weber. "Toward Ultrafast Electron Microscopy." Microscopy and Microanalysis 10, S03 (August 2004): 14–15. http://dx.doi.org/10.1017/s1431927604555733.

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Анотація:

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

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9

Errico, Claudia, Olivier Couture, and Mickael Tanter. "Ultrafast ultrasound localization microscopy." Journal of the Acoustical Society of America 141, no. 5 (May 2017): 3951. http://dx.doi.org/10.1121/1.4988974.

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10

Taheri, Mitra L., Nigel D. Browning, and John Lewellen. "Symposium on Ultrafast Electron Microscopy and Ultrafast Science." Microscopy and Microanalysis 15, no. 4 (July 3, 2009): 271. http://dx.doi.org/10.1017/s1431927609090771.

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Анотація:

Dynamic characterization techniques have been utilized in the fields of biology, chemistry, physics, and materials science for many years. Techniques range from neutron scattering to X-ray diffraction. Two of the fields experiencing much development recently have been electron-based techniques. Namely, ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) have been advancing rapidly, but unfortunately, in parallel. We are approaching an era where the convergence of these two techniques could open up a wide range of scientific and technological opportunities and advancements.

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11

Garming, Mathijs W. H., I. Gerward C. Weppelman, Martin Lee, Thijs Stavenga, and Jacob P. Hoogenboom. "Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution." Applied Physics Reviews 9, no. 2 (June 2022): 021418. http://dx.doi.org/10.1063/5.0085597.

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Ultrafast scanning electron microscopy images carrier dynamics and carrier induced surface voltages using a laser pump electron probe scheme, potentially surpassing all-optical techniques in probe resolution and surface sensitivity. Current implementations have left a four order of magnitude gap between optical pump and electron probe resolution, which particularly hampers spatial resolution in the investigation of carrier induced local surface photovoltages. Here, we present a system capable of focusing the laser using an inverted optical microscope built into an ultrafast scanning electron microscopy setup to enable high numerical aperture pulsed optical excitation in conjunction with ultrafast electron beam probing. We demonstrate an order of magnitude improvement in optical pump resolution, bringing this to sub-micrometer length scales. We further show that temporal laser pump resolution can be maintained inside the scanning electron microscope by pre-compensating dispersion induced by the components required to bring the beam into the vacuum chamber and to a tight focus. We illustrate our approach using molybdenum disulfide, a two-dimensional transition metal dichalcogenide, where we measure ultrafast carrier relaxation rates and induced negative surface potentials between different flakes selected with the scanning electron microscope as well as on defined positions within a single flake.

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12

Montgomery, Eric, Darrin Leonhardt, and John Roehling. "Ultrafast Transmission Electron Microscopy: Techniques and Applications." Microscopy Today 29, no. 5 (September 2021): 46–54. http://dx.doi.org/10.1017/s1551929521001140.

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Abstract:With the growing applications of temporally resolved electron microscopy for probing basic phenomena and reducing beam-induced damage, a multifaceted introduction to the field of ultrafast transmission electron microscopy is provided. This primer includes techniques and equipment as well as implementation perspectives. Historical developments and recent technical advances will provide insight into ultrafast capabilities for research as well as educate electron microscopists on the general techniques. This technology review also includes applications enabled by ultrafast techniques using various sample stimuli from multidisciplinary fields.

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13

Zhu, Tong, Jordan M. Snaider, Long Yuan, and Libai Huang. "Ultrafast Dynamic Microscopy of Carrier and Exciton Transport." Annual Review of Physical Chemistry 70, no. 1 (June 14, 2019): 219–44. http://dx.doi.org/10.1146/annurev-physchem-042018-052605.

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We highlight the recent progress in ultrafast dynamic microscopy that combines ultrafast optical spectroscopy with microscopy approaches, focusing on the application transient absorption microscopy (TAM) to directly image energy and charge transport in solar energy harvesting and conversion systems. We discuss the principles, instrumentation, and resolutions of TAM. The simultaneous spatial, temporal, and excited-state-specific resolutions of TAM unraveled exciton and charge transport mechanisms that were previously obscured in conventional ultrafast spectroscopy measurements for systems such as organic solar cells, hybrid perovskite thin films, and molecular aggregates. We also discuss future directions to improve resolutions and to develop other ultrafast imaging contrasts beyond transient absorption.

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14

Leonhardt, Darrin, Eric Montgomery, Chunguang Jing, Bart Wyderski, Yubin Zhao, Spencer Reisbick, Yimei Zhu, June Lau, and John Roehling. "Advancements in UltraFast Electron Microscopy." Microscopy and Microanalysis 28, S1 (July 22, 2022): 1802–3. http://dx.doi.org/10.1017/s1431927622007127.

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15

Kim, Ye-Jin, and Oh-Hoon Kwon. "Cathodoluminescence in Ultrafast Electron Microscopy." ACS Nano 15, no. 12 (December 13, 2021): 19480–89. http://dx.doi.org/10.1021/acsnano.1c06260.

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16

Garg, Manish, Alberto Martin-Jimenez, Yang Luo, and Klaus Kern. "Ultrafast Photon-Induced Tunneling Microscopy." ACS Nano 15, no. 11 (November 1, 2021): 18071–84. http://dx.doi.org/10.1021/acsnano.1c06716.

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17

Seo, M., S. Boubanga-Tombet, J. Yoo, Z. Ku, A. V. Gin, S. T. Picraux, S. R. J. Brueck, A. J. Taylor, and R. P. Prasankumar. "Ultrafast optical wide field microscopy." Optics Express 21, no. 7 (April 2, 2013): 8763. http://dx.doi.org/10.1364/oe.21.008763.

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18

Shakya, Pratistha, and Brett Barwick. "Ultrafast Point Projection Electron Microscopy." Microscopy and Microanalysis 21, S3 (August 2015): 809–10. http://dx.doi.org/10.1017/s1431927615004845.

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19

Lobastov, V. A., R. Srinivasan, and A. H. Zewail. "Four-dimensional ultrafast electron microscopy." Proceedings of the National Academy of Sciences 102, no. 20 (May 9, 2005): 7069–73. http://dx.doi.org/10.1073/pnas.0502607102.

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20

Garming, Mathijs W. H., Pieter Kruit, and Jacob P. Hoogenboom. "Imaging resonant micro-cantilever movement with ultrafast scanning electron microscopy." Review of Scientific Instruments 93, no. 9 (September 1, 2022): 093702. http://dx.doi.org/10.1063/5.0089086.

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Анотація:

Here, we demonstrate ultrafast scanning electron microscopy (SEM) for making ultrafast movies of mechanical oscillators at resonance with nanoscale spatiotemporal resolution. Locking the laser excitation pulse sequence to the electron probe pulses allows for video framerates over 50 MHz, well above the detector bandwidth, while maintaining the electron beam resolution and depth of focus. The pulsed laser excitation is tuned to the oscillator resonance with a pulse frequency modulation scheme. We use an atomic force microscope cantilever as a model resonator, for which we show ultrafast real-space imaging of the first and even the 2 MHz second harmonic oscillation as well as verification of power and frequency response via the ultrafast movies series. We detect oscillation amplitudes as small as 20 nm and as large as 9 μm. Our implementation of ultrafast SEM for visualizing nanoscale oscillatory dynamics adds temporal resolution to the domain of SEM, providing new avenues for the characterization and development of devices based on micro- and nanoscale resonant motion.

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21

Ryabov, Andrey, and Peter Baum. "Ultrafast electron microscopy of electromagnetic waveforms." EPJ Web of Conferences 205 (2019): 08003. http://dx.doi.org/10.1051/epjconf/201920508003.

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Анотація:

We advance ultrafast electron microscopy from atomic motions into the domain of electron-dynamics. Sub-light-cycle electron pulses deflected by time-frozen fields reveal the electromagnetic fields around a metamaterial element with sub-cycle and sub-wavelength resolution.

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22

Aseyev, Sergei A., Evgeny A. Ryabov, Boris N. Mironov, and Anatoly A. Ischenko. "The Development of Ultrafast Electron Microscopy." Crystals 10, no. 6 (May 31, 2020): 452. http://dx.doi.org/10.3390/cryst10060452.

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Time-resolved electron microscopy is based on the excitation of a sample by pulsed laser radiation and its probing by synchronized photoelectron bunches in the electron microscope column. With femtosecond lasers, if probing pulses with a small number of electrons—in the limit, single-electron wave packets—are used, the stroboscopic regime enables ultrahigh spatiotemporal resolution to be obtained, which is not restricted by the Coulomb repulsion of electrons. This review article presents the current state of the ultrafast electron microscopy (UEM) method for detecting the structural dynamics of matter in the time range from picoseconds to attoseconds. Moreover, in the imaging mode, the spatial resolution lies, at best, in the subnanometer range, which limits the range of observation of structural changes in the sample. The ultrafast electron diffraction (UED), which created the methodological basis for the development of UEM, has opened the possibility of creating molecular movies that show the behavior of the investigated quantum system in the space-time continuum with details of sub-Å spatial resolution. Therefore, this review on the development of UEM begins with a description of the main achievements of UED, which formed the basis for the creation and further development of the UEM method. A number of recent experiments are presented to illustrate the potential of the UEM method.

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23

Gage, Thomas, Haihua Liu, and Ilke Arslan. "Photocathode Investigation for Ultrafast Electron Microscopy." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2968–69. http://dx.doi.org/10.1017/s1431927621010321.

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24

Yang, Huaixin, Shuaishuai Sun, Ming Zhang, Zhongwen Li, Zian Li, Peng Xu, Huanfang Tian, and Jianqi Li. "Ultrafast electron microscopy in material science." Chinese Physics B 27, no. 7 (July 2018): 070703. http://dx.doi.org/10.1088/1674-1056/27/7/070703.

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25

Botkin, D., J. Glass, D. S. Chemla, D. F. Ogletree, M. Salmeron, and S. Weiss. "Advances in ultrafast scanning tunneling microscopy." Applied Physics Letters 69, no. 9 (August 26, 1996): 1321–23. http://dx.doi.org/10.1063/1.117581.

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26

Ho, F., A. S. Hou, B. A. Nechay, and D. M. Bloom. "Ultrafast voltage-contrast scanning probe microscopy." Nanotechnology 7, no. 4 (December 1, 1996): 385–89. http://dx.doi.org/10.1088/0957-4484/7/4/014.

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27

Baskin, J. S., H. Liu, and A. H. Zewail. "4D multiple-cathode ultrafast electron microscopy." Proceedings of the National Academy of Sciences 111, no. 29 (July 8, 2014): 10479–84. http://dx.doi.org/10.1073/pnas.1411650111.

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28

Freeman, M. R., R. W. Hunt, and G. M. Steeves. "Noise imaging in stroboscopic ultrafast microscopy." Applied Physics Letters 77, no. 5 (July 31, 2000): 717–19. http://dx.doi.org/10.1063/1.127096.

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29

Dupriez, Pascal. "Ultrafast Fiber Lasers for Multiphoton Microscopy." PhotonicsViews 16, no. 4 (August 2019): 70–73. http://dx.doi.org/10.1002/phvs.201900034.

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30

Vogelsang, Jan, Germann Hergert, Andreas Wöste, Dong Wang, Petra Groß, and Christoph Lienau. "Plasmon-driven ultrafast point-projection electron microscopy." EPJ Web of Conferences 205 (2019): 08010. http://dx.doi.org/10.1051/epjconf/201920508010.

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Анотація:

We implement a plasmon-driven ultrafast electron source in a point-projection electron microscope. A proof-of-principle experiment investigating the charge propagation in a single nanoresonator demonstrates an unprecedented spatiotemporal resolution of 20 nm and 25 fs.

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31

Hassan, Mohammed T., Haihua Liu, John Spencer Baskin, and Ahmed H. Zewail. "Photon gating in four-dimensional ultrafast electron microscopy." Proceedings of the National Academy of Sciences 112, no. 42 (October 5, 2015): 12944–49. http://dx.doi.org/10.1073/pnas.1517942112.

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Ultrafast electron microscopy (UEM) is a pivotal tool for imaging of nanoscale structural dynamics with subparticle resolution on the time scale of atomic motion. Photon-induced near-field electron microscopy (PINEM), a key UEM technique, involves the detection of electrons that have gained energy from a femtosecond optical pulse via photon–electron coupling on nanostructures. PINEM has been applied in various fields of study, from materials science to biological imaging, exploiting the unique spatial, energy, and temporal characteristics of the PINEM electrons gained by interaction with a “single” light pulse. The further potential of photon-gated PINEM electrons in probing ultrafast dynamics of matter and the optical gating of electrons by invoking a “second” optical pulse has previously been proposed and examined theoretically in our group. Here, we experimentally demonstrate this photon-gating technique, and, through diffraction, visualize the phase transition dynamics in vanadium dioxide nanoparticles. With optical gating of PINEM electrons, imaging temporal resolution was improved by a factor of 3 or better, being limited only by the optical pulse widths. This work enables the combination of the high spatial resolution of electron microscopy and the ultrafast temporal response of the optical pulses, which provides a promising approach to attain the resolution of few femtoseconds and attoseconds in UEM.

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32

Sealy, Cordelia. "Ultrafast electron microscopy captures nanoscale phase changes." Nano Today 37 (April 2021): 101113. http://dx.doi.org/10.1016/j.nantod.2021.101113.

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33

Flannigan, D. J., B. Barwick, and A. H. Zewail. "Biological imaging with 4D ultrafast electron microscopy." Proceedings of the National Academy of Sciences 107, no. 22 (May 17, 2010): 9933–37. http://dx.doi.org/10.1073/pnas.1005653107.

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34

Dolocan, A., D. P. Acharya, P. Zahl, P. Sutter, and N. Camillone. "Two-Color Ultrafast Photoexcited Scanning Tunneling Microscopy." Journal of Physical Chemistry C 115, no. 20 (April 27, 2011): 10033–43. http://dx.doi.org/10.1021/jp111875f.

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35

Piatkowski, Lukasz, Nicolò Accanto, Gaëtan Calbris, Sotirios Christodoulou, Iwan Moreels, and Niek F. van Hulst. "Ultrafast stimulated emission microscopy of single nanocrystals." Science 366, no. 6470 (December 5, 2019): 1240–43. http://dx.doi.org/10.1126/science.aay1821.

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Single-molecule detection is a powerful method used to distinguish different species and follow time trajectories within the ensemble average. However, such detection capability requires efficient emitters and is prone to photobleaching, and the slow, nanosecond spontaneous emission process only reports on the lowest excited state. We demonstrate direct detection of stimulated emission from individual colloidal nanocrystals at room temperature while simultaneously recording the depleted spontaneous emission, enabling us to trace the carrier population through the entire photocycle. By capturing the femtosecond evolution of the stimulated emission signal, together with the nanosecond fluorescence, we can disentangle the ultrafast charge trajectories in the excited state and determine the populations that experience stimulated emission, spontaneous emission, and excited-state absorption processes.

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36

Login, G. R., W. B. Stavinoha, and A. M. Dvorak. "Ultrafast microwave energy fixation for electron microscopy." Journal of Histochemistry & Cytochemistry 34, no. 3 (March 1986): 381–87. http://dx.doi.org/10.1177/34.3.3950387.

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We demonstrate that microwave (MW) energy can be used in conjunction with chemical cross-linking agents to fix tissue blocks rapidly for electron microscopy in as brief a time as 26 msec. The optimal ultrafast MW fixation methodology involved immersing tissue blocks up to 2 mm3 in dilute aldehyde fixative and immediately irradiating the specimens in a 7.3 kW MW oven for 26-90 msec, reaching a fixation temperature range of 32-42 degrees C. Ultrastructural preservation of samples irradiated by MW energy was comparable to that of the control samples immersed in aldehyde fixative for 2 hr at 25 degrees C. Potential applications for this new fixation technology include investigation of rapid intracellular processes (e.g., vesicular transport) and preservation of proteins that are difficult to demonstrate with routine fixation methods (e.g., antigens and enzymes).

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37

Freeman, M. R., A. Y. Elezzabi, G. M. Steeves, and G. Nunes. "Ultrafast time resolution in scanning tunneling microscopy." Surface Science 386, no. 1-3 (October 1997): 290–300. http://dx.doi.org/10.1016/s0039-6028(97)00306-3.

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38

Feist, Armin, Katharina E. Echternkamp, Jakob Schauss, Sergey V. Yalunin, Sascha Schafer, and Claus Ropers. "Ultrafast Transmission Electron Microscopy with nanoscale Photoemitters." Microscopy and Microanalysis 21, S3 (August 2015): 1203–4. http://dx.doi.org/10.1017/s1431927615006807.

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39

Yurtsever, Aycan. "Nanoscale Probes in Ultrafast Transmission Electron Microscopy." Microscopy and Microanalysis 21, S3 (August 2015): 1413–14. http://dx.doi.org/10.1017/s1431927615007849.

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40

Desailly, Yann, Juliette Pierre, Olivier Couture, and Mickael Tanter. "Resolution limits of ultrafast ultrasound localization microscopy." Physics in Medicine and Biology 60, no. 22 (October 28, 2015): 8723–40. http://dx.doi.org/10.1088/0031-9155/60/22/8723.

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41

Zewail, Ahmed H. "4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY." Annual Review of Physical Chemistry 57, no. 1 (May 2006): 65–103. http://dx.doi.org/10.1146/annurev.physchem.57.032905.104748.

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42

Yang, Jinfeng. "New crystallography using relativistic femtosecond electron pulses." Impact 2019, no. 10 (December 30, 2019): 76–78. http://dx.doi.org/10.21820/23987073.2019.10.76.

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Анотація:

Ultrafast electron microscopy (UEM) with femtosecond temporal resolution has long been a cherished dream tool for scientists wishing to study ultrafast structural dynamics in materials, appealing to researchers from across a wide range of speciality areas. Associate Professor Jinfeng Yang, from the Institute of Scientific and Industrial Research, at Osaka University in Japan, leads a team working on ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) development. 'Through the study of ultrafast phenomena with the UEM, we hope to gain a deeper understanding of materials and their physical properties and achieve a novel breakthrough in materials science,' he highlights. 'We fully expect to facilitate new knowledge and discoveries as a result of our work.' The team's work on relativistic UEM has led to the creation of unprecedented innovative technology that enables femtosecond atomic-scale imaging using just a single shot measurement. This will pave the way for the study of dynamics of irreversible processes within materials sciences. Not only does the group's work represent a huge step forward in innovative technology for researchers working across a number of scientific fields, but it is also progress in developing a very compact, ultra-high voltage electron microscopy. It can also be used in a variety of settings such as general research institutions and laboratories. In addition, through its provision of a solution to the problem of femtosecond temporal resolution our technology is breaking new ground in electronic microscopy developments,' says Yang.

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43

TIAN, YE, FAN YANG, CHAOYU GUO, and YING JIANG. "RECENT ADVANCES IN ULTRAFAST TIME-RESOLVED SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 25, Supp01 (December 2018): 1841003. http://dx.doi.org/10.1142/s0218625x18410032.

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Making smaller and faster functional devices has led to an increasing demand for a microscopic technique that allows the investigation of carrier and phonon dynamics with both high spatial and temporal resolutions. Traditional optical pump–probe methods can achieve femtosecond temporal resolution but fall short in the spatial resolution due to the diffraction limit. Scanning tunneling microscopy (STM), on the contrary, has realized atomic-scale spatial resolution relying on the high sensitivity of the tunneling current to the tip-sample distance. However, limited by the electronics bandwidth, STM can only push the temporal resolution to the microseconds scale, restricting its applications to probe various ultrafast dynamic processes. The combination of these two methods takes advantages of optical pump–probe techniques and highly localized tunneling currents of STM, providing one viable solution to track atomic-scale ultrafast dynamics in single molecules and low-dimensional materials. In this review, we will focus on several ultrafast time-resolved STM methods by coupling the tunneling junctions with pulsed electric waves, THz, near-infrared and visible laser. Their applications to probe the carrier dynamics, spin dynamics, and molecular motion will be highlighted. In the end, we will present an outlook on the challenges and new opportunities in this field.

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44

Block, A., M. Liebel, R. Yu, M. Spector, Y. Sivan, F. J. García de Abajo, and N. F. van Hulst. "Tracking ultrafast hot-electron diffusion in space and time by ultrafast thermomodulation microscopy." Science Advances 5, no. 5 (May 2019): eaav8965. http://dx.doi.org/10.1126/sciadv.aav8965.

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The ultrafast response of metals to light is governed by intriguing nonequilibrium dynamics involving the interplay of excited electrons and phonons. The coupling between them leads to nonlinear diffusion behavior on ultrashort time scales. Here, we use scanning ultrafast thermomodulation microscopy to image the spatiotemporal hot-electron diffusion in thin gold films. By tracking local transient reflectivity with 20-nm spatial precision and 0.25-ps temporal resolution, we reveal two distinct diffusion regimes: an initial rapid diffusion during the first few picoseconds, followed by about 100-fold slower diffusion at longer times. We find a slower initial diffusion than previously predicted for purely electronic diffusion. We develop a comprehensive three-dimensional model based on a two-temperature model and evaluation of the thermo-optical response, taking into account the delaying effect of electron-phonon coupling. Our simulations describe well the observed diffusion dynamics and let us identify the two diffusion regimes as hot-electron and phonon-limited thermal diffusion, respectively.

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45

Ortega-Arroyo, Jaime, and Philipp Kukura. "Interferometric scattering microscopy (iSCAT): new frontiers in ultrafast and ultrasensitive optical microscopy." Physical Chemistry Chemical Physics 14, no. 45 (2012): 15625. http://dx.doi.org/10.1039/c2cp41013c.

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46

Schroeder, W. A., J. A. Berger, A. W. Nicholls, N. J. Zaluzec, and D. J. Miller. "Photoemission Processes for Ultrafast TEM." Microscopy and Microanalysis 18, S2 (July 2012): 582–83. http://dx.doi.org/10.1017/s143192761200476x.

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47

Orlikowska, H., and L. Piatkowski. "Modulation Transfer Microscopy - Versatile Tool for Ultrafast Nanoscopy." Acta Physica Polonica A 139, no. 3 (March 2021): 288–99. http://dx.doi.org/10.12693/aphyspola.139.288.

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48

Ortalan, Volkan. "Catching them in Action: Ultrafast Transmission Electron Microscopy." Microscopy and Microanalysis 27, S1 (July 30, 2021): 3124–26. http://dx.doi.org/10.1017/s1431927621010813.

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49

Liu, Haihua, Thomas E. Gage, Prem Singh, Amit Jaiswal, Richard D. Schaller, Jau Tang, Sang Tae Park, Stephen K. Gray, and Ilke Arslan. "Visualization of Plasmonic Couplings Using Ultrafast Electron Microscopy." Nano Letters 21, no. 13 (June 21, 2021): 5842–49. http://dx.doi.org/10.1021/acs.nanolett.1c01824.

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50

Dai, Yanan, Zhikang Zhou, Atreyie Ghosh, Karan Kapoor, Maciej Dąbrowski, Atsushi Kubo, Chen-Bin Huang, and Hrvoje Petek. "Ultrafast microscopy of a twisted plasmonic spin skyrmion." Applied Physics Reviews 9, no. 1 (March 2022): 011420. http://dx.doi.org/10.1063/5.0084482.

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We report a transient plasmonic spin skyrmion topological quasiparticle within surface plasmon polariton vortices, which is described by analytical modeling and imaging of its formation by ultrafast interferometric time-resolved photoemission electron microscopy. Our model finds a twisted skyrmion spin texture on the vacuum side of a metal/vacuum interface and its integral opposite counterpart in the metal side. The skyrmion pair forming a hedgehog texture is associated with co-gyrating anti-parallel electric and magnetic fields, which form intense pseudoscalar E·B focus that breaks the local time-reversal symmetry and can drive magnetoelectric responses of interest to the axion physics. Through nonlinear two-photon photoemission, we record attosecond precision images of the plasmonic vectorial vortex field evolution with nanometer spatial and femtosecond temporal (nanofemto) resolution, from which we derive the twisted plasmonic spin skyrmion topological textures, their boundary, and topological charges; the modeling and experimental measurements establish a quantized integer photonic topological charge that is stable over the optical generation pulse envelope.

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