Статті в журналах з теми "Thin film thermal conductivity measurement"
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Shaw-Klein, L. J., T. K. Hatwar, S. J. Burns, S. D. Jacobs, and J. C. Lambropoulos. "Anisotropic thermal conductivity of rare earth–transition metal thin films." Journal of Materials Research 7, no. 2 (February 1992): 329–34. http://dx.doi.org/10.1557/jmr.1992.0329.
Повний текст джерелаMoon, Seung Jae. "Determination of Thermal Conductivity of Amorphous Silicon Thin Films via Non-Contacting Optical Probing." Key Engineering Materials 326-328 (December 2006): 689–92. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.689.
Повний текст джерелаAlajlouni, Sami, David Alberto Lara Ramos, Kerry Maize, Nicolás Pérez, Kornelius Nielsch, Gabi Schierning, and Ali Shakouri. "Estimating thin-film thermal conductivity by optical pump thermoreflectance imaging and finite element analysis." Journal of Applied Physics 131, no. 18 (May 14, 2022): 185111. http://dx.doi.org/10.1063/5.0084566.
Повний текст джерелаWang, Xinwei, Hanping Hu, and Xianfan Xu. "Photo-Acoustic Measurement of Thermal Conductivity of Thin Films and Bulk Materials." Journal of Heat Transfer 123, no. 1 (June 25, 2000): 138–44. http://dx.doi.org/10.1115/1.1337652.
Повний текст джерелаZeng, J. S. Q., P. C. Stevens, A. J. Hunt, R. Grief, and Daehee Lee. "Thin-film-heater thermal conductivity apparatus and measurement of thermal conductivity of silica aerogel." International Journal of Heat and Mass Transfer 39, no. 11 (July 1996): 2311–17. http://dx.doi.org/10.1016/0017-9310(95)00307-x.
Повний текст джерелаChu, Dachen, Maxat Touzelbaev, Kenneth E. Goodson, Sergey Babin, and R. Fabian Pease. "Thermal conductivity measurements of thin-film resist." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 19, no. 6 (2001): 2874. http://dx.doi.org/10.1116/1.1421557.
Повний текст джерелаChien, Heng-Chieh, Da-Jeng Yao, Mei-Jiau Huang, and Tien-Yao Chang. "Thermal conductivity measurement and interface thermal resistance estimation using SiO2 thin film." Review of Scientific Instruments 79, no. 5 (May 2008): 054902. http://dx.doi.org/10.1063/1.2927253.
Повний текст джерелаIndermuehle, S. W., and R. B. Peterson. "A Phase-Sensitive Technique for the Thermal Characterization of Dielectric Thin Films." Journal of Heat Transfer 121, no. 3 (August 1, 1999): 528–36. http://dx.doi.org/10.1115/1.2826013.
Повний текст джерелаMakarova, E. S., and A. V. Novotelnova. "Estimating the uncertainty of measurements of thermal conductivity of thin films of thermoelectrics with the 3-omega method." Journal of Physics: Conference Series 2057, no. 1 (October 1, 2021): 012108. http://dx.doi.org/10.1088/1742-6596/2057/1/012108.
Повний текст джерелаAllmaras, J. P., A. G. Kozorezov, A. D. Beyer, F. Marsili, R. M. Briggs, and M. D. Shaw. "Thin-Film Thermal Conductivity Measurements Using Superconducting Nanowires." Journal of Low Temperature Physics 193, no. 3-4 (July 24, 2018): 380–86. http://dx.doi.org/10.1007/s10909-018-2022-0.
Повний текст джерелаBauer, M. L., C. M. Bauer, M. C. Fish, R. E. Matthews, G. T. Garner, A. W. Litchenberger та P. M. Norris. "Thin-film aerogel thermal conductivity measurements via 3ω". Journal of Non-Crystalline Solids 357, № 15 (липень 2011): 2960–65. http://dx.doi.org/10.1016/j.jnoncrysol.2011.03.042.
Повний текст джерелаForsythe, Carlos, Madeleine P. Gordon та Jeffrey J. Urban. "3ω techniques for measurement of volumetric heat capacity and anisotropic thermal conductivity of a solution processable, hybrid organic/inorganic film, Te-PEDOT:PSS". Journal of Applied Physics 131, № 10 (14 березня 2022): 105109. http://dx.doi.org/10.1063/5.0079328.
Повний текст джерелаLee, Byeonghee, Joon Sik Lee, Sun Ung Kim, Kyeongtae Kim, Ohmyoung Kwon, Seungkoo Lee, Jong Hoon Kim, and Dae Soon Lim. "Simultaneous measurement of thermal conductivity and interface thermal conductance of diamond thin film." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 27, no. 6 (2009): 2408. http://dx.doi.org/10.1116/1.3259911.
Повний текст джерелаKim, Kyeongtae, та Ohmyoung Kwon. "Thermal conductivity measurement of Ge2Sb2Te5 thin film using improved 3ω method". High Temperatures-High Pressures 48, № 1-2 (2019): 71. http://dx.doi.org/10.32908/hthp.v48.696.
Повний текст джерелаHuang, Shuo, Xiaodong Ruan, Jun Zou, Xin Fu, and Huayong Yang. "Raman Scattering Characterization of Transparent Thin Film for Thermal Conductivity Measurement." Journal of Thermophysics and Heat Transfer 23, no. 3 (July 2009): 616–21. http://dx.doi.org/10.2514/1.40976.
Повний текст джерелаRuoho, Mikko, Kjetil Valset, Terje Finstad, and Ilkka Tittonen. "Measurement of thin film thermal conductivity using the laser flash method." Nanotechnology 26, no. 19 (April 22, 2015): 195706. http://dx.doi.org/10.1088/0957-4484/26/19/195706.
Повний текст джерелаOkamoto, Yoichi, Junichi Saeki, Tetsunari Ohtsuki, and Hiroaki Takiguchi. "Thermal Conductivity Measurement of Si/(Ge+Au) Artificial Superlattice Thin Film." Applied Physics Express 1 (October 17, 2008): 117001. http://dx.doi.org/10.1143/apex.1.117001.
Повний текст джерелаChoi, Sun Rock, Dong Sik Kim, and Sung Hoon Choa. "Thermal Transport Properties of Various Thin Films for MEMS Applications." Key Engineering Materials 326-328 (December 2006): 293–96. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.293.
Повний текст джерелаLatronico, Giovanna, Saurabh Singh, Paolo Mele, Abdalla Darwish, Sergey Sarkisov, Sian Wei Pan, Yukihiro Kawamura, et al. "Synthesis and Characterization of Al- and SnO2-Doped ZnO Thermoelectric Thin Films." Materials 14, no. 22 (November 16, 2021): 6929. http://dx.doi.org/10.3390/ma14226929.
Повний текст джерелаKim, Gwantaek, Moojoong Kim, and Hyunjung Kim. "Feasibility of Novel Rear-Side Mirage Deflection Method for Thermal Conductivity Measurements." Sensors 21, no. 17 (September 6, 2021): 5971. http://dx.doi.org/10.3390/s21175971.
Повний текст джерелаYamaguchi, Shingi, Takuma Shiga, Shun Ishioka, Tsuguyuki Saito, Takashi Kodama та Junichiro Shiomi. "Anisotropic thermal conductivity measurement of organic thin film with bidirectional 3ω method". Review of Scientific Instruments 92, № 3 (1 березня 2021): 034902. http://dx.doi.org/10.1063/5.0030982.
Повний текст джерелаYang, Liangliang, Jiangtao Wei, Yuanhao Qin, Lei Wei, Peishuai Song, Mingliang Zhang, Fuhua Yang, and Xiaodong Wang. "Thermoelectric Properties of Cu2Se Nano-Thin Film by Magnetron Sputtering." Materials 14, no. 8 (April 20, 2021): 2075. http://dx.doi.org/10.3390/ma14082075.
Повний текст джерелаChen, Qiyu, Fabian Javier Medina, Sien Wang, and Qing Hao. "In-plane thermal conductivity measurements of Si thin films under a uniaxial tensile strain." Journal of Applied Physics 133, no. 3 (January 21, 2023): 035103. http://dx.doi.org/10.1063/5.0125422.
Повний текст джерелаIslam, Mohammad Aminul, Yasmin Abdu Wahab, Mayeen Uddin Khandaker, Abdullah Alsubaie, Abdulraheem S. A. Almalki, David A. Bradley, and Nowshad Amin. "High Mobility Reactive Sputtered CuxO Thin Film for Highly Efficient and Stable Perovskite Solar Cells." Crystals 11, no. 4 (April 7, 2021): 389. http://dx.doi.org/10.3390/cryst11040389.
Повний текст джерелаWang, Haitao, Yibin Xu, Masahiro Goto, Yoshihisa Tanaka, Masayoshi Yamazaki, Akira Kasahara, and Masahiro Tosa. "Thermal Conductivity Measurement of Tungsten Oxide Nanoscale Thin Films." MATERIALS TRANSACTIONS 47, no. 8 (2006): 1894–97. http://dx.doi.org/10.2320/matertrans.47.1894.
Повний текст джерелаKim, In-Goo, Eun-Ji Oh, Yong-Soo Kim, Sok-Won Kim, In-Sung Park, and Won-Kyu Lee. "Thermal Conductivity Measurement of High-k Oxide Thin Films." Journal of the Korean Vacuum Society 19, no. 2 (March 30, 2010): 141–47. http://dx.doi.org/10.5757/jkvs.2010.19.2.141.
Повний текст джерелаGubler, Ulrich, Matthias Raunhardt, and Andrin Stump. "Measurement technique for thermal conductivity of thin polymer films." Thin Solid Films 515, no. 4 (December 2006): 1737–40. http://dx.doi.org/10.1016/j.tsf.2006.06.019.
Повний текст джерелаChen, Zhen, Juekuan Yang, Ping Zhuang, Minhua Chen, Jian Zhu, and Yunfei Chen. "Thermal conductivity measurement of InGaAs/InGaAsP superlattice thin films." Chinese Science Bulletin 51, no. 23 (December 2006): 2931–36. http://dx.doi.org/10.1007/s11434-006-2208-8.
Повний текст джерелаMeinders, Erwin R. "Measurement of the thermal conductivity of thin layers using a scanning thermal microscope." Journal of Materials Research 16, no. 9 (September 2001): 2530–43. http://dx.doi.org/10.1557/jmr.2001.0347.
Повний текст джерелаJ. L. Hostetler, A. N. Smith, and P. "THIN-FILM THERMAL CONDUCTIVITY AND THICKNESS MEASUREMENTS USING PICOSECOND ULTRASONICS." Microscale Thermophysical Engineering 1, no. 3 (July 1997): 237–44. http://dx.doi.org/10.1080/108939597200250.
Повний текст джерелаMiyake, Shugo, Genzou Matsui, Hiromichi Ohta, Kimihito Hatori, Kohei Taguchi, and Suguru Yamamoto. "Wide-range measurement of thermal effusivity using molybdenum thin film with low thermal conductivity for thermal microscopes." Measurement Science and Technology 28, no. 7 (June 19, 2017): 075006. http://dx.doi.org/10.1088/1361-6501/aa72d0.
Повний текст джерелаHAGINO, Harutoshi, Yosuke KAWAHARA, Aimi GOTO, Toru HIWADA, and Koji Miyazaki. "411 In-Plane Thermal Conductivity and Electrical Conductivity Measurements of Silicon Thin Film." Proceedings of Conference of Kyushu Branch 2012.65 (2012): 139–40. http://dx.doi.org/10.1299/jsmekyushu.2012.65.139.
Повний текст джерелаAleksandrova, Mariya, Ivailo Pandiev та Ajaya Kumar Singh. "Implementation of 3ω Method for Studying the Thermal Conductivity of Perovskite Thin Films". Crystals 12, № 10 (20 вересня 2022): 1326. http://dx.doi.org/10.3390/cryst12101326.
Повний текст джерелаLe Thi, Hao, Shambel Abate Marye, and Niall Tumilty. "AC conductivity of hBN thin film on Si(111): A high temperature study." Journal of Applied Physics 132, no. 19 (November 21, 2022): 195101. http://dx.doi.org/10.1063/5.0121443.
Повний текст джерелаKim, Hojun, Daeyoon Kim, Nagyeong Lee, Yurim Lee, Kwangbae Kim, and Ohsung Song. "Measurement of the Thermal Conductivity of a Polycrystalline Diamond Thin Film via Light Source Thermal Analysis." Korean Journal of Materials Research 31, no. 12 (December 30, 2021): 665–71. http://dx.doi.org/10.3740/mrsk.2021.31.12.665.
Повний текст джерелаFUTSUTA, Akihiro, and Hajime NAKAMURA. "GS0608 Measurement of Thermal Conductivity of Low Thermal Resistance Thin Film by Guarded Hot Plate Method." Proceedings of Conference of Kanto Branch 2016.22 (2016): _GS0608–1_—_GS0608–2_. http://dx.doi.org/10.1299/jsmekanto.2016.22._gs0608-1_.
Повний текст джерелаThuau, D., I. Koymen, and R. Cheung. "A microstructure for thermal conductivity measurement of conductive thin films." Microelectronic Engineering 88, no. 8 (August 2011): 2408–12. http://dx.doi.org/10.1016/j.mee.2010.12.119.
Повний текст джерелаYang, Junyou, Jiansheng Zhang, Hui Zhang, and Yunfeng Zhu. "Thermal conductivity measurement of thin films by a dc method." Review of Scientific Instruments 81, no. 11 (November 2010): 114902. http://dx.doi.org/10.1063/1.3481787.
Повний текст джерелаKühnel, Fabian, Christoph Metzke, Jonas Weber, Josef Schätz, Georg S. Duesberg, and Günther Benstetter. "Investigation of Heater Structures for Thermal Conductivity Measurements of SiO2 and Al2O3 Thin Films Using the 3-Omega Method." Nanomaterials 12, no. 11 (June 4, 2022): 1928. http://dx.doi.org/10.3390/nano12111928.
Повний текст джерелаRausch, S., D. Rauh, C. Deibel, S. Vidi та H. P. Ebert. "Thin-Film Thermal-Conductivity Measurement on Semi-Conducting Polymer Material Using the 3ω Technique". International Journal of Thermophysics 34, № 5 (7 березня 2012): 820–30. http://dx.doi.org/10.1007/s10765-012-1174-4.
Повний текст джерелаAshraf, Forsberg, Mattsson, and Thungström. "Thermoelectric Properties of n-Type Molybdenum Disulfide (MoS2) Thin Film by Using a Simple Measurement Method." Materials 12, no. 21 (October 26, 2019): 3521. http://dx.doi.org/10.3390/ma12213521.
Повний текст джерелаYang, Seunggen, Kyoungah Cho, and Sangsig Kim. "Enhanced Thermoelectric Characteristics of Ag2Se Nanoparticle Thin Films by Embedding Silicon Nanowires." Energies 13, no. 12 (June 13, 2020): 3072. http://dx.doi.org/10.3390/en13123072.
Повний текст джерелаKról, Danuta, Przemysław Motyl, Joanna Piotrowska-Woroniak, Mirosław Patej, and Sławomir Poskrobko. "Heat Reflective Thin-Film Polymer Insulation with Polymer Nanospheres—Determination of Thermal Conductivity Coefficient." Energies 15, no. 17 (August 29, 2022): 6286. http://dx.doi.org/10.3390/en15176286.
Повний текст джерелаZHANG, Xing, Huaqing XIE, Motoo FUJII, Koji TAKAHASHI, Hiroki AGO, Tetsuo SHIMIZU, and Hidekazu ABE. "Measurements of In-Plane Thermal Conductivity and Electrical Conductivity of Suspended Platinum Thin Film." Netsu Bussei 19, no. 1 (2005): 9–14. http://dx.doi.org/10.2963/jjtp.19.9.
Повний текст джерелаJournal, Baghdad Science. "Study the effect of thickness and annealing temperature on the Electrical Properties of CdTe thin Films." Baghdad Science Journal 5, no. 3 (September 7, 2008): 449–53. http://dx.doi.org/10.21123/bsj.5.3.449-453.
Повний текст джерелаHapenciuc, C. L., I. Negut, A. Visan, T. Borca-Tasciuc, and I. N. Mihailescu. "The effect of the contact point asymmetry on the accuracy of thin films thermal conductivity measurement by scanning thermal microscopy using Wollaston probes." Journal of Applied Physics 131, no. 9 (March 7, 2022): 094902. http://dx.doi.org/10.1063/5.0069273.
Повний текст джерелаKhoerunnisa, Fitri, Esti Septiani, Hendrawan Hendrawan, and Yaya Sonjaya. "Effect of SWCNT Filler on Mechanical Properties and Electrical Conductivity of PVA/CS/GA/SWCNT Nanocomposite Thin Film." Key Engineering Materials 840 (April 2020): 441–47. http://dx.doi.org/10.4028/www.scientific.net/kem.840.441.
Повний текст джерелаZhou, Yuanyuan, Chunhua Li, David Broido, and Li Shi. "A differential thin film resistance thermometry method for peak thermal conductivity measurements of high thermal conductivity crystals." Review of Scientific Instruments 92, no. 9 (September 1, 2021): 094901. http://dx.doi.org/10.1063/5.0061049.
Повний текст джерелаShyju, T. S., S. Anandhi, R. Sivakumar, and R. Gopalakrishnan. "Studies on Lead Sulfide (PbS) Semiconducting Thin Films Deposited from Nanoparticles and Its NLO Application." International Journal of Nanoscience 13, no. 01 (February 2014): 1450001. http://dx.doi.org/10.1142/s0219581x1450001x.
Повний текст джерелаM. Ali, Sarmad M., Alia A. A. Shehab, and Samir A. Maki. "Effect of Cu doping on the electrical Properties of ZnTe by Vacuum Thermal Evaporation." Ibn AL- Haitham Journal For Pure and Applied Science 31, no. 3 (November 25, 2018): 20. http://dx.doi.org/10.30526/31.3.2023.
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