Статті в журналах з теми "Thin film studies"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся з топ-50 статей у журналах для дослідження на тему "Thin film studies".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.
Jianqiang Gu, Jianqiang Gu, Changlei Wang Changlei Wang, Zhen Tian Zhen Tian, Feng Liu Feng Liu, Xueqian Zhang Xueqian Zhang, Jiaguang Han Jiaguang Han, Mingxia He Mingxia He, et al. "Systematic studies of terahertz metamaterials fabricated on thin Mylar film." Chinese Optics Letters 9, s1 (2011): s10404–310406. http://dx.doi.org/10.3788/col201109.s10404.
Повний текст джерелаHwang, Young Kyu, Ajit Singh Mamman, K. R. Patil, Lee Kyung Kim, Jin Soo Hwang, and Jong San Chang. "Reflectometry Studies of Mesoporous Silica Thin Films." Solid State Phenomena 135 (February 2008): 31–34. http://dx.doi.org/10.4028/www.scientific.net/ssp.135.31.
Повний текст джерелаZhang, Yaoping, Hong Zhou, Junqi Fan, and Hong Xu. "Studies on properties of YbF3 thin film by different deposition parameters." Chinese Optics Letters 11, S1 (2013): S10215. http://dx.doi.org/10.3788/col201311.s10215.
Повний текст джерелаBalasundraprabhu, Rangasamy, E. V. Monakhov, N. Muthukumarasamy, and B. G. Svensson. "Studies on Nanostructure ITO Thin Films on Silicon Solar Cells." Advanced Materials Research 678 (March 2013): 365–68. http://dx.doi.org/10.4028/www.scientific.net/amr.678.365.
Повний текст джерелаSubba Rao, K., R. Tamm, S. C. Wimbush, G. H. Cao, C. G. Oertel, Werner Skrotzki, and B. Holzapfel. "Texture Studies on Borocarbide Thin Films." Materials Science Forum 495-497 (September 2005): 1425–30. http://dx.doi.org/10.4028/www.scientific.net/msf.495-497.1425.
Повний текст джерелаMahalingam, T., V. Dhanasekaran, S. Rajendran, R. Chandramohan, Luis Ixtlilco, and P. J. Sebastian. "Electrosynthesis and Studies on CdZnSe Thin Films." Journal of New Materials for Electrochemical Systems 15, no. 1 (December 6, 2011): 37–42. http://dx.doi.org/10.14447/jnmes.v15i1.86.
Повний текст джерелаBharathi, B., S. Thanikaikarasan, P. V. Chandrasekar, Pratap Kollu, T. Mahalingam, and Luis Ixtlilco. "Studies on Electrodeposited NiS Thin Films." Journal of New Materials for Electrochemical Systems 17, no. 3 (October 3, 2014): 167–71. http://dx.doi.org/10.14447/jnmes.v17i3.417.
Повний текст джерелаXie, Jian Sheng, Jin Hua Li, and Ping Luan. "Thin CuInSi Film Deposited by Magnetron Co-Sputtering." Advanced Materials Research 433-440 (January 2012): 302–5. http://dx.doi.org/10.4028/www.scientific.net/amr.433-440.302.
Повний текст джерелаMoustakas, Theodore D. "Molecular Beam Epitaxy: Thin Film Growth and Surface Studies." MRS Bulletin 13, no. 11 (November 1988): 29–36. http://dx.doi.org/10.1557/s0883769400063892.
Повний текст джерелаMalikov, Vladimir N., Alexey V. Ishkov, Alexey A. Grigorev, Denis A. Fadeev, and Mihail A. Ryasnoi. "Investigation of Ni-Al Intermetallic Thin Films." Key Engineering Materials 854 (July 2020): 140–47. http://dx.doi.org/10.4028/www.scientific.net/kem.854.140.
Повний текст джерелаPatil, M. M., K. P. Joshi, and S. B. Patil. "Studies on nanocomposites nanoplates and pervoskite nanorod thin films." YMER Digital 20, no. 12 (December 15, 2021): 303–13. http://dx.doi.org/10.37896/ymer20.12/27.
Повний текст джерелаDhanasekaran, V., T. Mahalingam, S. Rajendran, Jin Koo Rhee, and D. Eapen. "Electroplated CuO Thin Films from High Alkaline Solutions." Journal of New Materials for Electrochemical Systems 15, no. 1 (December 6, 2011): 49–55. http://dx.doi.org/10.14447/jnmes.v15i1.88.
Повний текст джерелаDavid Theodore, N., Renu Sharma, and Juan Carrejo. "TEM/AFM correlative studies of thin-film metallization." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1414–15. http://dx.doi.org/10.1017/s042482010013170x.
Повний текст джерелаChamlek, Onanong, S. Pratontep, Teerakiat Kerdcharoen, and Tanakorn Osotchan. "Spectroscopys Studies of Iron Phthalocyanine Thin Films." Advanced Materials Research 55-57 (August 2008): 301–4. http://dx.doi.org/10.4028/www.scientific.net/amr.55-57.301.
Повний текст джерелаNo, Kwangsoo, Dae Sung Yoon, and Jae Myung Kim. "SEM and Auger studies of a PLZT thin film." Journal of Materials Research 8, no. 2 (February 1993): 245–48. http://dx.doi.org/10.1557/jmr.1993.0245.
Повний текст джерелаStudenyak, I. P., M. Kranjčec, V. Yu Izai, V. I. Studenyak, M. M. Pop, and L. M. Suslikov. "Ellipsometric and Spectrometric Studies of (Ga0.2In0.8)2Se3 Thin Film." Ukrainian Journal of Physics 65, no. 3 (March 26, 2020): 231. http://dx.doi.org/10.15407/ujpe65.3.231.
Повний текст джерелаMäntymäki, Miia, Kenichiro Mizohata, Mikko J. Heikkilä, Jyrki Räisänen, Mikko Ritala, and Markku Leskelä. "Studies on Li3AlF6 thin film deposition utilizing conversion reactions of thin films." Thin Solid Films 636 (August 2017): 26–33. http://dx.doi.org/10.1016/j.tsf.2017.05.026.
Повний текст джерелаArasu, P. Adal, and R. Victor Williams. "The dielectric studies on sol–gel routed molybdenum oxide thin film." Journal of Advanced Dielectrics 07, no. 02 (April 2017): 1750011. http://dx.doi.org/10.1142/s2010135x17500114.
Повний текст джерелаLee, J. L., C. A. Weiss, R. A. Buhrman, and J. Silcox. "Electron Microscopy Studies of The Chemistry And Microstructure of BaF2 / YBa2Cu3O7-x Thin Films." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 796–97. http://dx.doi.org/10.1017/s0424820100171717.
Повний текст джерелаČížek, Jakub, Marián Vlček, František Lukáč, Martin Vlach, I. Procházka, Gerhard Brauer, Wolfgang Anwand, et al. "Structural Studies of Nanocrystalline Thin Pd Films Electrochemically Doped with Hydrogen." Defect and Diffusion Forum 331 (September 2012): 137–47. http://dx.doi.org/10.4028/www.scientific.net/ddf.331.137.
Повний текст джерелаRyu, Donghyeon, and Alfred Mongare. "Corrugated Photoactive Thin Films for Flexible Strain Sensor." Materials 11, no. 10 (October 13, 2018): 1970. http://dx.doi.org/10.3390/ma11101970.
Повний текст джерелаFujisawa, N., M. V. Swain, N. L. James, R. N. Tarrant, J. C. Woodard, and D. R. McKenzie. "Nanoindentation studies of brittle thin films on a titanium alloy substrate." Journal of Materials Research 17, no. 4 (April 2002): 861–70. http://dx.doi.org/10.1557/jmr.2002.0125.
Повний текст джерелаKraft, O., L. B. Freund, R. Phillips, and E. Arzt. "Dislocation Plasticity in Thin Metal Films." MRS Bulletin 27, no. 1 (January 2002): 30–37. http://dx.doi.org/10.1557/mrs2002.17.
Повний текст джерелаSong, Myeong-Ho, Woon-San Ko, Geun-Ho Kim, Dong-Hyeuk Choi, and Ga-Won Lee. "Studies on Oxygen Permeation Resistance of SiCN Thin Film and RRAM Applications." Nanomaterials 12, no. 23 (December 6, 2022): 4342. http://dx.doi.org/10.3390/nano12234342.
Повний текст джерелаKassim, A., Z. Zainal, N. Saravanan, R. Vikneshwari, and S. Malathi. "Preparation and Studies of Electrodeposited CuSe Thin Films." Eurasian Chemico-Technological Journal 6, no. 2 (July 12, 2017): 107. http://dx.doi.org/10.18321/ectj598.
Повний текст джерелаGao, Fei, Xiao Yan Liu, Li Yun Zheng, Mei Xia Li, and Rui Jiao Jiang. "Studies on the Microstructure and Properties of TiO2/(Ag) Thin Films." Advanced Materials Research 503-504 (April 2012): 378–81. http://dx.doi.org/10.4028/www.scientific.net/amr.503-504.378.
Повний текст джерелаHelan, P. Prathiba Jeya, K. Mohanraj, and G. Sivakumar. "Studies on structural, optical and electrical properties of electron beam evaporated Cu2SnSe3 thin films." Materials Science-Poland 34, no. 4 (December 1, 2016): 703–7. http://dx.doi.org/10.1515/msp-2016-0106.
Повний текст джерелаMa, Qing. "X-ray Scattering Studies of amorphous thin film materials." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C859. http://dx.doi.org/10.1107/s2053273314091402.
Повний текст джерелаXie, Jian Sheng, Ping Luan, and Jin Hua Li. "Optical Properties of Nano-CuInSi Thin Films Prepared by Multilayer Synthesized Method." Advanced Materials Research 403-408 (November 2011): 1094–98. http://dx.doi.org/10.4028/www.scientific.net/amr.403-408.1094.
Повний текст джерелаDhanisha, K. M., M. Manoj Christopher, M. Abinaya, P. Deepak Raj, and M. Sridharan. "Studies on Magnetron-Sputtered NiO/Si3N4 Thin Films." International Journal of Nanoscience 17, no. 03 (May 21, 2018): 1760039. http://dx.doi.org/10.1142/s0219581x17600390.
Повний текст джерелаWakiwaka, H., K. Tashiro, K. Ohtake, N. Itoh, T. Kiyomiya, and M. Makimura. "Kerr Microscopy Studies of SmFe Thin Film." Sensor Letters 7, no. 3 (June 1, 2009): 240–43. http://dx.doi.org/10.1166/sl.2009.1066.
Повний текст джерелаAbhyankar, N. M., R. N. Karekar, R. N. Prasad, T. S. Rao, and S. D. Phadke. "Studies of PbCl2 thin film galvanic cells." Thin Solid Films 151, no. 3 (August 1987): 325–32. http://dx.doi.org/10.1016/0040-6090(87)90131-3.
Повний текст джерелаWhitehead, Andrew J., and Trevor F. Page. "Nanoindentation studies of thin film coated systems." Thin Solid Films 220, no. 1-2 (November 1992): 277–83. http://dx.doi.org/10.1016/0040-6090(92)90585-y.
Повний текст джерелаChen, Tze-Chiun, Tingkai Li, Xubai Zhang, and Seshu B. Desu. "Structure Development Studies of SrBi2(Ta1−xNbx)2O9 Thin Films." Journal of Materials Research 12, no. 8 (August 1997): 2165–74. http://dx.doi.org/10.1557/jmr.1997.0290.
Повний текст джерелаLarson, David J., Alfred Cerezo, Jean Juraszek, Kazuhiro Hono, and Guido Schmitz. "Atom-Probe Tomographic Studies of Thin Films and Multilayers." MRS Bulletin 34, no. 10 (October 2009): 732–37. http://dx.doi.org/10.1557/mrs2009.247.
Повний текст джерелаXie, Jian Sheng, Jin Hua Li, and Ping Luan. "Copper Indium Silicon Nanocomposite Thin Film Deposited by Magnetron Co-Sputtering." Applied Mechanics and Materials 110-116 (October 2011): 3289–92. http://dx.doi.org/10.4028/www.scientific.net/amm.110-116.3289.
Повний текст джерелаTeodorescu, Valentin S., and Marie-Genevieve Blanchin. "Fast and Simple Specimen Preparation for TEM Studies of Oxide Films Deposited on Silicon Wafers." Microscopy and Microanalysis 15, no. 1 (January 15, 2009): 15–19. http://dx.doi.org/10.1017/s1431927609090011.
Повний текст джерелаJiang, J. C., X. Q. Pan, Q. Gan, and C. B. Eom. "Domain Structure of Epitaxial SrRuO3 Thin Films on (001) LaA1O3." Microscopy and Microanalysis 4, S2 (July 1998): 578–79. http://dx.doi.org/10.1017/s1431927600023011.
Повний текст джерелаLee, Harold O., Muhammed Hasib, and Sam-Shajing Sun. "Proton Radiation Studies on Conjugated Polymer Thin Films." MRS Advances 2, no. 51 (2017): 2967–72. http://dx.doi.org/10.1557/adv.2017.389.
Повний текст джерелаWURMEHL, SABINE, and JÜRGEN T. KOHLHEPP. "NMR SPECTROSCOPY ON HEUSLER THIN FILMS — A REVIEW." SPIN 04, no. 04 (December 2014): 1440019. http://dx.doi.org/10.1142/s2010324714400190.
Повний текст джерелаSamuel, V., and V. J. Rao. "Optical and valence band studies of ZnP2 thin films." Journal of Materials Research 4, no. 1 (February 1989): 185–88. http://dx.doi.org/10.1557/jmr.1989.0185.
Повний текст джерелаShu, Yuanjie, Liaoliang Ke, Jie Su, and Fei Shen. "Experimental Studies on Fretting Wear Behavior of PVDF Piezoelectric Thin Films." Materials 14, no. 4 (February 4, 2021): 734. http://dx.doi.org/10.3390/ma14040734.
Повний текст джерелаWayne Goodman, D. "Surface spectroscopic studies of model supported-metal catalysts." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 394–95. http://dx.doi.org/10.1017/s0424820100138348.
Повний текст джерелаShajudheen, V. P. Muhamed, K. Anitha Rani, V. Senthil Kumar, A. Uma Maheswari, M. Sivakumar, and S. Saravana Kumar. "Optical and Corrosion Studies of Spray Pyrolysis Coated Titanium Dioxide Thin Films." Advanced Science Letters 24, no. 8 (August 1, 2018): 5836–42. http://dx.doi.org/10.1166/asl.2018.12206.
Повний текст джерелаPatel, K. J., M. S. Desai, and C. J. Panchal. "Studies of ZrO2 electrolyte thin-film thickness on the all-solid thin-film electrochromic devices." Journal of Solid State Electrochemistry 19, no. 1 (August 8, 2014): 275–79. http://dx.doi.org/10.1007/s10008-014-2600-2.
Повний текст джерелаSheng, K. C., S. J. Lee, Y. H. Shen, X. K. Wang, E. D. Rippert, R. P. Van Duyne, J. B. Ketterson, and R. P. H. Chang. "Raman studies of reactive DC-magnetron sputtered thin films of YBaCuO on MgO." Journal of Materials Research 4, no. 6 (December 1989): 1312–19. http://dx.doi.org/10.1557/jmr.1989.1312.
Повний текст джерелаNiesen, T. P., M. R. De Guire, J. Bill, F. Aldinger, M. Rühle, A. Fischer, F. C. Jentoft, and R. Schlögl. "Atomic force microscopic studies of oxide thin films on organic self-assembled monolayers." Journal of Materials Research 14, no. 6 (June 1999): 2464–75. http://dx.doi.org/10.1557/jmr.1999.0331.
Повний текст джерелаRodzi, A. S. M., Mohamad Hafiz Mamat, M. N. Berhan, and Mohamad Rusop Mahmood. "Stability Studies on Optical and Structure Properties of Zinc Oxide Thin Films Exposed to Different Environment." Advanced Materials Research 667 (March 2013): 549–52. http://dx.doi.org/10.4028/www.scientific.net/amr.667.549.
Повний текст джерелаDemczyk, B. G. "Domains and domain nucleation in magnetron-sputtered CoCr thin films." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1046–47. http://dx.doi.org/10.1017/s0424820100151064.
Повний текст джерелаPantelić, N., A. Piruska, and Carl J. Seliskar. "Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy." Materials Science Forum 518 (July 2006): 431–38. http://dx.doi.org/10.4028/www.scientific.net/msf.518.431.
Повний текст джерела