Статті в журналах з теми "Thermal imaging microscopy"
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Oesterschulze, E., and M. Stopka. "Photothermal imaging by scanning thermal microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14, no. 3 (May 1996): 1172–77. http://dx.doi.org/10.1116/1.580261.
Повний текст джерелаBoudreau, B. D., J. Raja, R. J. Hocken, S. R. Patterson, and J. Patten. "Thermal imaging with near-field microscopy." Review of Scientific Instruments 68, no. 8 (August 1997): 3096–98. http://dx.doi.org/10.1063/1.1148248.
Повний текст джерелаSmallwood, R., P. Metherall, D. Hose, M. Delves, H. Pollock, A. Hammiche, C. Hodges, V. Mathot, and P. Willcocks. "Tomographic imaging and scanning thermal microscopy: thermal impedance tomography." Thermochimica Acta 385, no. 1-2 (March 2002): 19–32. http://dx.doi.org/10.1016/s0040-6031(01)00705-5.
Повний текст джерелаNAKABEPPU, Osamu. "Quantitative Temperature Imaging by Scanning Thermal Microscopy." Journal of the Visualization Society of Japan 23, no. 90 (2003): 151–56. http://dx.doi.org/10.3154/jvs.23.151.
Повний текст джерелаThomas, R. L., and L. D. Favro. "From Photoacoustic Microscopy to Thermal-Wave Imaging." MRS Bulletin 21, no. 10 (October 1996): 47–52. http://dx.doi.org/10.1557/s088376940003164x.
Повний текст джерелаZhang, Hao F., Konstantin Maslov, George Stoica, and Lihong V. Wang. "Imaging acute thermal burns by photoacoustic microscopy." Journal of Biomedical Optics 11, no. 5 (2006): 054033. http://dx.doi.org/10.1117/1.2355667.
Повний текст джерелаHammiche, A., H. M. Pollock, M. Song, and D. J. Hourston. "Sub-surface imaging by scanning thermal microscopy." Measurement Science and Technology 7, no. 2 (February 1, 1996): 142–50. http://dx.doi.org/10.1088/0957-0233/7/2/004.
Повний текст джерелаSuzuki, Yoshihiko. "Novel Microcantilever for Scanning Thermal Imaging Microscopy." Japanese Journal of Applied Physics 35, Part 2, No. 3A (March 1, 1996): L352—L354. http://dx.doi.org/10.1143/jjap.35.l352.
Повний текст джерелаKeuren, Edward Van, David Littlejohn, and Wolfgang Schrof. "Three-dimensional thermal imaging using two-photon microscopy." Journal of Physics D: Applied Physics 37, no. 20 (September 30, 2004): 2938–43. http://dx.doi.org/10.1088/0022-3727/37/20/024.
Повний текст джерелаNakabeppu, O., M. Chandrachood, Y. Wu, J. Lai, and A. Majumdar. "Scanning thermal imaging microscopy using composite cantilever probes." Applied Physics Letters 66, no. 6 (February 6, 1995): 694–96. http://dx.doi.org/10.1063/1.114102.
Повний текст джерелаKwon, Ohmyoung, Li Shi, and Arun Majumdar. "Scanning Thermal Wave Microscopy (STWM)." Journal of Heat Transfer 125, no. 1 (January 29, 2003): 156–63. http://dx.doi.org/10.1115/1.1518492.
Повний текст джерелаChen, Zixuan, Xiaonan Shan, Yan Guan, Shaopeng Wang, Jun-Jie Zhu, and Nongjian Tao. "Imaging Local Heating and Thermal Diffusion of Nanomaterials with Plasmonic Thermal Microscopy." ACS Nano 9, no. 12 (October 12, 2015): 11574–81. http://dx.doi.org/10.1021/acsnano.5b05306.
Повний текст джерелаCannara, Rachel J., Abu Sebastian, Bernd Gotsmann, and Hugo Rothuizen. "Scanning Thermal Microscopy for Fast Multiscale Imaging and Manipulation." IEEE Transactions on Nanotechnology 9, no. 6 (November 2010): 745–53. http://dx.doi.org/10.1109/tnano.2010.2045232.
Повний текст джерелаMartinek, Jan, Miroslav Valtr, Václav Hortvík, Petr Grolich, Danick Briand, Marjan Shaker, and Petr Klapetek. "Large area scanning thermal microscopy and infrared imaging system." Measurement Science and Technology 30, no. 3 (February 14, 2019): 035010. http://dx.doi.org/10.1088/1361-6501/aafa96.
Повний текст джерелаGadre, Chaitanya A., Xingxu Yan, Qichen Song, Jie Li, Lei Gu, Huaixun Huyan, Toshihiro Aoki, et al. "Nanoscale imaging of phonon dynamics by electron microscopy." Nature 606, no. 7913 (June 8, 2022): 292–97. http://dx.doi.org/10.1038/s41586-022-04736-8.
Повний текст джерелаBodzenta, Jerzy, and Anna Kaźmierczak-Bałata. "Scanning thermal microscopy and its applications for quantitative thermal measurements." Journal of Applied Physics 132, no. 14 (October 14, 2022): 140902. http://dx.doi.org/10.1063/5.0091494.
Повний текст джерелаHammiche, A. "Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 2 (March 1, 1996): 1486. http://dx.doi.org/10.1116/1.589124.
Повний текст джерелаPai, Jing-Hong, Tianqing Liu, Hung-Yao Hsu, A. Bruce Wedding, Benjamin Thierry, and Pierre O. Bagnaninchi. "Molecular photo-thermal optical coherence phase microscopy using gold nanorods." RSC Adv. 4, no. 51 (2014): 27067–73. http://dx.doi.org/10.1039/c4ra03041a.
Повний текст джерелаMajumdar, A., J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi. "Thermal imaging by atomic force microscopy using thermocouple cantilever probes." Review of Scientific Instruments 66, no. 6 (June 1995): 3584–92. http://dx.doi.org/10.1063/1.1145474.
Повний текст джерелаBagani, Kousik. "Scanning SQUID-on-tip Magnetic and Thermal Microscopy." Science Dialectica 01, no. 1 (September 17, 2021): 1–3. http://dx.doi.org/10.54162/sd01-25201/01.
Повний текст джерелаOesterschulze, E., and M. Stopka. "Imaging of thermal properties and topography by combined scanning thermal and scanning tunneling microscopy." Microelectronic Engineering 31, no. 1-4 (February 1996): 241–48. http://dx.doi.org/10.1016/0167-9317(95)00347-9.
Повний текст джерелаAshida, Koji, Toru Aiso, Manabu Okamoto, Hirokazu Seki, Makoto Kitabatake, and Tadaaki Kaneko. "Low Energy Electron Channeling Contrast Imaging from 4H-SiC Surface by SEM and its Comparison with CDIC-OM and PL Imaging." Materials Science Forum 897 (May 2017): 193–96. http://dx.doi.org/10.4028/www.scientific.net/msf.897.193.
Повний текст джерелаMajumdar, A., and J. Varesi. "Nanoscale Temperature Distributions Measured by Scanning Joule Expansion Microscopy." Journal of Heat Transfer 120, no. 2 (May 1, 1998): 297–305. http://dx.doi.org/10.1115/1.2824245.
Повний текст джерелаSedmak, Ivan, Iztok Urbančič, Rok Podlipec, Janez Štrancar, Michel Mortier, and Iztok Golobič. "Submicron thermal imaging of a nucleate boiling process using fluorescence microscopy." Energy 109 (August 2016): 436–45. http://dx.doi.org/10.1016/j.energy.2016.04.121.
Повний текст джерелаUlrich, Georg, Emanuel Pfitzner, Arne Hoehl, Jung-Wei Liao, Olga Zadvorna, Guillaume Schweicher, Henning Sirringhaus, et al. "Thermoelectric nanospectroscopy for the imaging of molecular fingerprints." Nanophotonics 9, no. 14 (August 21, 2020): 4347–54. http://dx.doi.org/10.1515/nanoph-2020-0316.
Повний текст джерелаKaźmierczak-Bałata, Anna, Justyna Juszczyk, Dominika Trefon-Radziejewska, and Jerzy Bodzenta. "Influence of probe-sample temperature difference on thermal mapping contrast in scanning thermal microscopy imaging." Journal of Applied Physics 121, no. 11 (March 21, 2017): 114502. http://dx.doi.org/10.1063/1.4977101.
Повний текст джерелаD’Acunto, M., and O. Salvetti. "Pattern recognition methods for thermal drift correction in Atomic Force Microscopy imaging." Pattern Recognition and Image Analysis 21, no. 1 (March 2011): 9–19. http://dx.doi.org/10.1134/s1054661811010056.
Повний текст джерелаHolstein, W. L. "Imaging of thermal and elastic surface properties by scanning electron acoustic microscopy." Journal of Electron Microscopy Technique 5, no. 1 (January 1987): 91–103. http://dx.doi.org/10.1002/jemt.1060050110.
Повний текст джерелаBarbosa, Nicholas, and Andrew J. Slifka. "Spatially and temporally resolved thermal imaging of cyclically heated interconnects by use of scanning thermal microscopy." Microscopy Research and Technique 71, no. 8 (August 2008): 579–84. http://dx.doi.org/10.1002/jemt.20589.
Повний текст джерелаCurry, Erin B., Kaitlin C. Lyszak, Donal Sheets, Lauren M. Gorman, Rainer J. Hebert, and Jason N. Hancock. "Broadband infrared confocal imaging for applications in additive manufacturing." Review of Scientific Instruments 93, no. 12 (December 1, 2022): 123702. http://dx.doi.org/10.1063/5.0124817.
Повний текст джерелаVöpel, Tobias, Rebecca Scholz, Luca Davico, Magdalena Groß, Steffen Büning, Sabine Kareth, Eckhard Weidner, and Simon Ebbinghaus. "Infrared laser triggered release of bioactive compounds from single hard shell microcapsules." Chemical Communications 51, no. 32 (2015): 6913–16. http://dx.doi.org/10.1039/c4cc09745a.
Повний текст джерелаLU, KECHENG, SHUANGMU ZHUO, ZHIBIN HONG, GUANNAN CHEN, XINGSHAN JIANG, LIQIN ZHENG, and JIANXIN CHEN. "NON-LINEAR SPECTRAL IMAGING MICROSCOPY STUDIES OF HUMAN HYPERTROPHIC SCAR." Journal of Innovative Optical Health Sciences 02, no. 01 (January 2009): 61–66. http://dx.doi.org/10.1142/s1793545809000395.
Повний текст джерелаZhou, Li, Shen, He, Zhang, Yu, and Tornari. "Tip Crack Imaging on Transparent Materials by Digital Holographic Microscopy." Journal of Imaging 5, no. 10 (October 1, 2019): 80. http://dx.doi.org/10.3390/jimaging5100080.
Повний текст джерелаHull, R., J. Demarest, D. Dunn, E. A. Stach, and Q. Yuan. "Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices." Microscopy and Microanalysis 4, no. 3 (June 1998): 308–16. http://dx.doi.org/10.1017/s143192769898031x.
Повний текст джерелаBaral, Susil, Ali Rafiei Miandashti, and Hugh H. Richardson. "Near-field thermal imaging of optically excited gold nanostructures: scaling principles for collective heating with heat dissipation into the surrounding medium." Nanoscale 10, no. 3 (2018): 941–48. http://dx.doi.org/10.1039/c7nr08349a.
Повний текст джерелаGarcia, V. G., and M. Farzaneh. "Transient thermal imaging of a vertical cavity surface-emitting laser using thermoreflectance microscopy." Journal of Applied Physics 119, no. 4 (January 28, 2016): 045105. http://dx.doi.org/10.1063/1.4940710.
Повний текст джерелаZhang, Jing, Yu Huang, Chin-Jung Chuang, Mariya Bivolarska, Chung W. See, Michael G. Somekh, and Mark C. Pitter. "Polarization modulation thermal lens microscopy for imaging the orientation of non-spherical nanoparticles." Optics Express 19, no. 3 (January 27, 2011): 2643. http://dx.doi.org/10.1364/oe.19.002643.
Повний текст джерелаJohnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (July 1, 2008): 359–83. http://dx.doi.org/10.5254/1.3548214.
Повний текст джерелаFranceschi, J. L., R. Murillo, A. Bastié, M. Ez-Zejjari, H. El Abdary, and N. Boughanmi. "In Situ Scanning Electron Acoustic Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 408–9. http://dx.doi.org/10.1017/s0424820100180793.
Повний текст джерелаSteinbach, Gábor, and Radek Kaňa. "Automated Microscopy: Macro Language Controlling a Confocal Microscope and its External Illumination: Adaptation for Photosynthetic Organisms." Microscopy and Microanalysis 22, no. 2 (April 2016): 258–63. http://dx.doi.org/10.1017/s1431927616000556.
Повний текст джерелаMikolaszek, Barbara, Marzena Jamrógiewicz, Krystyna Mojsiewicz-Pieńkowska, and Małgorzata Sznitowska. "Microscopic and Spectroscopic Imaging and Thermal Analysis of Acrylates, Silicones and Active Pharmaceutical Ingredients in Adhesive Transdermal Patches." Polymers 14, no. 14 (July 16, 2022): 2888. http://dx.doi.org/10.3390/polym14142888.
Повний текст джерелаZech, M., C. Boedefeld, F. Otto, and D. Andres. "Magnetic Imaging on the Nanometer Scale Using Low-Temperature Scanning Probe Techniques." Microscopy Today 19, no. 6 (October 28, 2011): 34–38. http://dx.doi.org/10.1017/s1551929511001180.
Повний текст джерелаHSUEH, CHIU-MEI, WEN LO, SUNG-JAN LIN, TSUNG-JEN WANG, FUNG-RUNG HU, HSIN-YUAN TAN, and CHEN-YUAN DONG. "MULTIPHOTON MICROSCOPY: A NEW APPROACH, IN PHYSIOLOGICAL STUDIES AND PATHOLOGICAL DIAGNOSIS FOR OPHTHALMOLOGY." Journal of Innovative Optical Health Sciences 02, no. 01 (January 2009): 45–60. http://dx.doi.org/10.1142/s1793545809000309.
Повний текст джерелаIvanov, Konstantin. "Characteristic Features and Thermal Stability of Molybdenum Processed by Different Ways of Severe Plastic Deformation." Materials Science Forum 584-586 (June 2008): 917–22. http://dx.doi.org/10.4028/www.scientific.net/msf.584-586.917.
Повний текст джерелаPereira, Maria J., Joao S. Amaral, Nuno J. O. Silva, and Vitor S. Amaral. "Nano-Localized Thermal Analysis and Mapping of Surface and Sub-Surface Thermal Properties Using Scanning Thermal Microscopy (SThM)." Microscopy and Microanalysis 22, no. 6 (November 21, 2016): 1270–80. http://dx.doi.org/10.1017/s1431927616011867.
Повний текст джерелаZakgeim, A. L., G. L. Kuryshev, M. N. Mizerov, V. G. Polovinkin, I. V. Rozhansky, and A. E. Chernyakov. "A study of thermal processes in high-power InGaN/GaN flip-chip LEDs by IR thermal imaging microscopy." Semiconductors 44, no. 3 (March 2010): 373–79. http://dx.doi.org/10.1134/s1063782610030176.
Повний текст джерелаZhang, Xiao Feng. "Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution." Microscopy Today 24, no. 1 (January 2016): 24–29. http://dx.doi.org/10.1017/s1551929515000930.
Повний текст джерелаGyollai, Ildikó, Ildikó Gyollai, Szaniszló Bérczi, Krisztián Fintor, Szabolcs Nagy, and Arnold Gucsik. "Thermal metamorphism of the Mócs meteorite (L6) revealed by optical microscopy and BSE imaging." Central European Geology 58, no. 4 (December 2015): 321–33. http://dx.doi.org/10.1556/24.58.2015.4.3.
Повний текст джерелаXie, Xu, Kyle L. Grosse, Jizhou Song, Chaofeng Lu, Simon Dunham, Frank Du, Ahmad E. Islam, et al. "Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy." ACS Nano 6, no. 11 (October 22, 2012): 10267–75. http://dx.doi.org/10.1021/nn304083a.
Повний текст джерелаZhang, Y., P. S. Dobson, and J. M. R. Weaver. "High temperature imaging using a thermally compensated cantilever resistive probe for scanning thermal microscopy." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 30, no. 1 (January 2012): 010601. http://dx.doi.org/10.1116/1.3664328.
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