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Статті в журналах з теми "Testable conception"
Gunitsky, Seva. "Rival Visions of Parsimony." International Studies Quarterly 63, no. 3 (May 1, 2019): 707–16. http://dx.doi.org/10.1093/isq/sqz009.
Повний текст джерелаKAN, STEVEN S. "ENTREPRENEURSHIP, TRANSACTION COSTS, AND SUBJECTIVIST ECONOMICS." Journal of Enterprising Culture 01, no. 02 (November 1993): 159–82. http://dx.doi.org/10.1142/s0218495893000099.
Повний текст джерелаDeutsch, David, Artur Ekert, and Rossella Lupacchini. "Machines, Logic and Quantum Physics." Bulletin of Symbolic Logic 6, no. 3 (September 2000): 265–83. http://dx.doi.org/10.2307/421056.
Повний текст джерелаGreen, Leslie. "Support for the System." British Journal of Political Science 15, no. 2 (April 1985): 127–42. http://dx.doi.org/10.1017/s0007123400004129.
Повний текст джерелаWikander, Richard. "Parsimony and testability: a reply to Dunbar." Canadian Journal of Zoology 63, no. 3 (March 1, 1985): 728–32. http://dx.doi.org/10.1139/z85-102.
Повний текст джерелаHodin, Jason, Matthew C. Ferner, Gabriel Ng, Christopher J. Lowe, and Brian Gaylord. "Rethinking competence in marine life cycles: ontogenetic changes in the settlement response of sand dollar larvae exposed to turbulence." Royal Society Open Science 2, no. 6 (June 2015): 150114. http://dx.doi.org/10.1098/rsos.150114.
Повний текст джерелаCariani, Peter. "Different Roles for Multiple Perspectives and Rigorous Testing in Scientific Theories and Models: Towards More Open, Context-Appropriate Verificationism." Philosophies 7, no. 3 (May 19, 2022): 54. http://dx.doi.org/10.3390/philosophies7030054.
Повний текст джерелаNiiniluoto, Ilkka. "Unification and Abductive Confirmation." THEORIA. An International Journal for Theory, History and Foundations of Science 31, no. 1 (February 17, 2016): 107–23. http://dx.doi.org/10.1387/theoria.13084.
Повний текст джерелаTovar-Gálvez, Julio César, and Germán Antonio García Contreras. "Epistemología de la tecnología y sus implicaciones didácticas: estudio de concepciones de estudiantes de ingenierías / Epistemology of Technology and its Educational Implications: Study of Engineering Students Conceptions." Revista Internacional de Tecnología, Ciencia y Sociedad 5, no. 1 (March 30, 2016): 143–55. http://dx.doi.org/10.37467/gka-revtechno.v5.464.
Повний текст джерелаARNETT, PETER A., FIONA H. BARWICK, and JOE E. BEENEY. "Depression in multiple sclerosis: Review and theoretical proposal." Journal of the International Neuropsychological Society 14, no. 5 (September 2008): 691–724. http://dx.doi.org/10.1017/s1355617708081174.
Повний текст джерелаДисертації з теми "Testable conception"
Fleury, Hervé. "Conception testable de circuits à partir d'une description comportementale." Grenoble INPG, 2000. http://www.theses.fr/2000INPG0098.
Повний текст джерелаDo, Huy Vu. "Conception testable et test de logiciels flots de données." Grenoble INPG, 2006. http://www.theses.fr/2006INPG0107.
Повний текст джерелаThis work concerns the testability analysis of data-flow designs of reactive systems developed by using two development environments SCADE and SIMULINK. The testability, which is used to estimate the facility to test a system, is a combination of two measures : controllability an observability. We use the SATAN technology, which is based on the information theory, to model the transfer of information in the system. The testability measures are computed from the loss of information in the system, where each operator contributes to this loss. The loss of information of an operator can be evaluatedeither exhaustively by basing on the "truth table" of the function of the operator, or statistically by basing on the simulation results of the operator. Our approach is integrated in a tool allowing an automatic analysis of testability of graphical data-flow designs of reactive systems
Baudry, Benoit. "Assemblage testable et validation de composants." Rennes 1, 2003. http://www.theses.fr/2003REN10048.
Повний текст джерелаZaourar, Lilia Koutchoukali. "Recherche opérationnelle et optimisation pour la conception testable de circuits intégrés complexes." Grenoble, 2010. http://www.theses.fr/2010GRENM055.
Повний текст джерелаThis thesis is a research contribution interfacing operations research and microelectronics. It considers the use of combinatorial optimization techniques for DFT (Design For Test) of Integrated Circuits (IC). With the growing complexity of current IC both quality and cost during manufacturing testing have become important parameters in the semiconductor industry. To ensure proper functioning of the IC, the testing step is more than ever a crucial and difficult step in the overall IC manufacturing process. To answer market requirements, chip testing should be fast and effective in uncovering defects. For this, it becomes essential to apprehend the test phase from the design steps of IC. In this context, DFT techniques and methodologies aim at improving the testability of IC. In previous research works, several problems of optimization and decision making were derived from the micro- electronics domain. Most of previous research contributions dealt with problems of combinatorial optimization for placement and routing during IC design. In this thesis, a higher design level is considered where the DFT problem is analyzed at the Register Transfer Level (RTL) before the logic synthesis process starts. This thesis is structured into three parts. In the first part, preliminaries and basic concepts of operations research, IC design and manufacturing are introduced. Next, both our approach and the solution tools which are used in the rest of this work are presented. In the second part, the problem of optimizing the insertion of scan chains is considered. Currently, " internal scan" is a widely adopted DFT technique for sequential digital designs where the design flip-flops are connected into a daisy chain manner with a full controllability and observability from primary inputs and outputs. In this part of the research work, different algorithms are developed to provide an automated and optimal solution during the generation of an RTL scan architecture where several parameters are considered: area, test time and power consumption in full compliance with functional performance. This problem has been modelled as the search for short chains in a weighted graph. The solution methods used are based on finding minimal length Hamiltonian chains. This work was accomplished in collaboration with DeFacTo Technologies, an EDA start-up close to Grenoble. The third part deals with the problem of sharing BIST (Built In Self Test) blocks for testing memories. The problem can be formulated as follows: given the memories with various types and sizes, and sharing rules for series and parallel wrappers, we have to identify solutions to the problem by associating a wrapper with each memory. The solution should minimize the surface, the power consumption and test time of IC. To solve this problem, we designed a prototype called Memory BIST Optimizer (MBO). It consists of two steps of resolution and a validation phase. The first step creates groups of compatibility in accordance with the rules of abstraction and sharing that depend on technologies. The second phase uses genetic algorithms for multi-objective optimization in order to obtain a set of non dominated solutions. Finally, the validation verifies that the solution provided is valid. In addition, it displays all solutions through a graphical or textual interface. This allows the user to choose the solution that fits best. The tool MBO is currently integrated into an industrial flow within ST-microelectronics
Karoui, Kamel. "Conception de logiciels de communication testables." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1997. http://www.collectionscanada.ca/obj/s4/f2/dsk2/tape16/PQDD_0023/NQ32650.pdf.
Повний текст джерелаMAROUFI, WALID. "Aide a la conception de systemes testables." Paris 6, 1999. http://www.theses.fr/1999PA066328.
Повний текст джерелаSoueidan, Mohammad. "Conception d'un microprocesseur reconfigurable." Phd thesis, Grenoble INPG, 1989. http://tel.archives-ouvertes.fr/tel-00332858.
Повний текст джерелаNg, Paulino. "Conception d'architectures testables et détermination des vecteurs de test pour les circuits spécifiques fortement intégrés de la machine MaRS (machine à réduction symbolique)." Toulouse, ENSAE, 1990. http://www.theses.fr/1990ESAE0003.
Повний текст джерелаZaourar, Lilia. "Recherche opérationnelle et optimisation pour la conception testable de circuits intégrés complexes." Phd thesis, 2010. http://tel.archives-ouvertes.fr/tel-00959786.
Повний текст джерелаКниги з теми "Testable conception"
Weede, Erich. The Expansion of Economic Freedom and the Capitalist Peace. Oxford University Press, 2016. http://dx.doi.org/10.1093/acrefore/9780190228637.013.276.
Повний текст джерелаЧастини книг з теми "Testable conception"
Letheby, Chris. "Conclusion." In Philosophy of Psychedelics, 205–22. Oxford University Press, 2021. http://dx.doi.org/10.1093/med/9780198843122.003.0010.
Повний текст джерелаMarinopoulou, Anastasia. "Critical realism." In Critical Theory and Epistemology. Manchester University Press, 2017. http://dx.doi.org/10.7228/manchester/9781526105370.003.0006.
Повний текст джерела