Статті в журналах з теми "TEM ANALYSIS"
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Du, Z. W., A. S. Liu, B. L. Shao, Z. Y. Zhang, X. S. Zhang, and Z. M. Sun. "TEM analysis of Gd5Si1.85Ge2.15 alloy." Materials Characterization 59, no. 9 (September 2008): 1241–44. http://dx.doi.org/10.1016/j.matchar.2007.10.005.
Повний текст джерелаRajan, Krishna, and Peter Sewell. "Surface Analysis in the TEM." JOM 38, no. 10 (October 1986): 34–35. http://dx.doi.org/10.1007/bf03258578.
Повний текст джерелаMizunaga, Hideki, and Toshiaki Tanaka. "Development of Temtool for TEM analysis." BUTSURI-TANSA(Geophysical Exploration) 67, no. 2 (2014): 135–42. http://dx.doi.org/10.3124/segj.67.135.
Повний текст джерелаOkamoto, Tatsuki, Masaki Kanegami, and Naohiro Hozumi. "TEM Analysis of Polyethylene with EELS." IEEJ Transactions on Fundamentals and Materials 118, no. 7-8 (1998): 767–72. http://dx.doi.org/10.1541/ieejfms1990.118.7-8_767.
Повний текст джерелаHIROSE, Yukinori, and Koji FUKUMOTO. "Evaluation and Analysis Technique Using TEM." Journal of the Surface Finishing Society of Japan 54, no. 1 (2003): 21–25. http://dx.doi.org/10.4139/sfj.54.21.
Повний текст джерелаStöger-Pollach, M., A. Steiger-Thirsfeld, and S. Schwarz. "Low voltage TEM for semiconductor analysis." Journal of Physics: Conference Series 326 (November 9, 2011): 012027. http://dx.doi.org/10.1088/1742-6596/326/1/012027.
Повний текст джерелаRowlands, Neil, and Simon Burgess. "Energy dispersive analysis in the TEM." Materials Today 12 (2010): 46–48. http://dx.doi.org/10.1016/s1369-7021(10)70145-0.
Повний текст джерелаDahmen, U., N. Thangaraj, and R. Kilaas. "Quantitative TEM analysis of microstructural anisotropy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 682–83. http://dx.doi.org/10.1017/s0424820100171146.
Повний текст джерелаBauer, Natalie, Jyoti Rai, Hairu Chen, Lillianne Harris, Lalita Shevde, Tim Moore, and Judy King. "Microparticles/Exosomes: Isolation and TEM Analysis." Microscopy Today 17, no. 2 (March 2009): 42–45. http://dx.doi.org/10.1017/s1551929500054493.
Повний текст джерелаNeumann, Wolfgang, Holm Kirmse, Ines Häusler, Reinhard Otto, and Irmela Hähnert. "Quantitative TEM analysis of quantum structures." Journal of Alloys and Compounds 382, no. 1-2 (November 2004): 2–9. http://dx.doi.org/10.1016/j.jallcom.2004.05.066.
Повний текст джерелаCho, Yong-Heui. "Dispersion Analysis for Rectangular Coaxial Line and TEM Cell." Journal of the Korea Contents Association 7, no. 1 (January 28, 2007): 124–30. http://dx.doi.org/10.5392/jkca.2007.7.1.124.
Повний текст джерелаLi, Xiaoguang, and Yangmei Li. "Error Analysis of TEM-4 Dictation and Teaching Suggestions to TEM-4 Dictation." Open Journal of Social Sciences 04, no. 11 (2016): 187–93. http://dx.doi.org/10.4236/jss.2016.411015.
Повний текст джерелаBalzuweit, Karla, Thais MIlagres, Von Braun Nascimento, Vagner de Carvalho, Edmar Soares, and Luiz Ladeira. "LEED and TEM analysis of Bismuth Telluride." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C194. http://dx.doi.org/10.1107/s2053273314098052.
Повний текст джерелаKomoto, Tadashi. "TEM Analysis of Tribology of Polymeric Materials." Kobunshi 43, no. 2 (1994): 104–5. http://dx.doi.org/10.1295/kobunshi.43.104.
Повний текст джерелаEfimova, N. A., V. A. Kaloshin, and E. A. Skorodumova. "Analysis of a horn-lens TEM antenna." Journal of Communications Technology and Electronics 57, no. 9 (September 2012): 1031–38. http://dx.doi.org/10.1134/s1064226912090045.
Повний текст джерелаLi, Huafang, Parag Banerjee, and Kathy Flores. "Understanding EDXS Analysis of Nanostructures in TEM." Microscopy and Microanalysis 23, S1 (July 2017): 1086–87. http://dx.doi.org/10.1017/s1431927617006092.
Повний текст джерелаRossouw, D., T. Mirkovic, GD Scholes, and GA Botton. "TEM Analysis of EuS/CdSe Nano Heterostructures." Microscopy and Microanalysis 16, S2 (July 2010): 1292–93. http://dx.doi.org/10.1017/s1431927610062951.
Повний текст джерелаHangas, J., and A. D. Roche. "TEM Analysis of a Thermal Sprayed Steel." Microscopy and Microanalysis 8, S02 (August 2002): 1276–77. http://dx.doi.org/10.1017/s1431927602104818.
Повний текст джерелаLingle, Wilma L., Ronald P. Clay, and David Porter. "TEM analysis of basidiosporogenesis in Panellus stypticus." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 874–75. http://dx.doi.org/10.1017/s042482010012477x.
Повний текст джерелаShaffer, O. L., M. S. El-Aasser, and J. W. Vanderhoff. "TEM analysis of core/shell latex morphology." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 502–3. http://dx.doi.org/10.1017/s0424820100127153.
Повний текст джерелаCole, M. W., J. F. Harvey, R. A. Lux, and D. W. Eckart. "TEM analysis of light emitting porous silicon." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1398–99. http://dx.doi.org/10.1017/s0424820100131620.
Повний текст джерелаRozeveld, S., DA Blom, LF Allard, T. Richardson, C. Todd, and JH Blackson. "Analysis of Catalysts using Aberration-Corrected TEM." Microscopy and Microanalysis 14, S2 (August 2008): 1390–91. http://dx.doi.org/10.1017/s1431927608085887.
Повний текст джерелаKC, Bilash, Jinglong Guo, Robert Klie, D. Bruce Buchholz, Guennadi Evmenenko, Jae Jin Kim, Timothy Fister, and Brian Ingram. "TEM Analysis of Multivalent Ion Battery Cathode." Microscopy and Microanalysis 26, S2 (July 30, 2020): 3170–72. http://dx.doi.org/10.1017/s1431927620024058.
Повний текст джерелаLi, X., J. Xingxing, W. Zi-qin, R. J. Lee, G. R. Dunmyre, and K. L. Anderson. "Thin film standardless analysis used in TEM asbestos EDS analysis." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 966–67. http://dx.doi.org/10.1017/s0424820100106892.
Повний текст джерелаHlavenková, Zuzana, Dimple Karia, Miloš Malínský, Daniel Němeček, Fanis Grollios, Vojtěch Doležal, Ondřej Sháněl, et al. "Thermo Scientific™ Tundra Cryo-TEM: 100kV Cryo-TEM dedicated for Single Particle Analysis." Microscopy and Microanalysis 27, S1 (July 30, 2021): 1330–32. http://dx.doi.org/10.1017/s1431927621004967.
Повний текст джерелаYoon, Byungun, and Yongtae Park. "Development of New Technology Forecasting Algorithm: Hybrid Approach for Morphology Analysis and Conjoint Analysis of Patent Information." IEEE Transactions on Engineering Management 54, no. 3 (August 2007): 588–99. http://dx.doi.org/10.1109/tem.2007.900796.
Повний текст джерелаArlet, Guillaume, Sylvie Goussard, Patrice Courvalin та Alain Philippon. "Sequences of the Genes for the TEM-20, TEM-21, TEM-22, and TEM-29 Extended-Spectrum β-Lactamases". Antimicrobial Agents and Chemotherapy 43, № 4 (1 квітня 1999): 969–71. http://dx.doi.org/10.1128/aac.43.4.969.
Повний текст джерелаBooker, Jane M., and Maurice C. Bryson. "Decision analysis in project management: An overview." IEEE Transactions on Engineering Management EM-32, no. 1 (1985): 3–9. http://dx.doi.org/10.1109/tem.1985.6447630.
Повний текст джерелаLiberatore, Matthew J. "Critical Path Analysis With Fuzzy Activity Times." IEEE Transactions on Engineering Management 55, no. 2 (May 2008): 329–37. http://dx.doi.org/10.1109/tem.2008.919678.
Повний текст джерелаLerch, Martin, and Patrick Spieth. "Innovation Project Portfolio Management: A Qualitative Analysis." IEEE Transactions on Engineering Management 60, no. 1 (February 2013): 18–29. http://dx.doi.org/10.1109/tem.2012.2201723.
Повний текст джерелаChipulu, Maxwell, Jun Guan Neoh, Udechukwu Ojiako, and Terry Williams. "A Multidimensional Analysis of Project Manager Competences." IEEE Transactions on Engineering Management 60, no. 3 (August 2013): 506–17. http://dx.doi.org/10.1109/tem.2012.2215330.
Повний текст джерелаDhir, Krishna S. "Formulating management policies for value engineering/value analysis." IEEE Transactions on Engineering Management EM-34, no. 3 (August 1987): 161–71. http://dx.doi.org/10.1109/tem.1987.6498877.
Повний текст джерелаAbbas, A. E. "Entropy methods for joint distributions in decision analysis." IEEE Transactions on Engineering Management 53, no. 1 (February 2006): 146–59. http://dx.doi.org/10.1109/tem.2005.861803.
Повний текст джерелаBasole, Rahul C., Hyunwoo Park, and Raul O. Chao. "Visual Analysis of Venture Similarity in Entrepreneurial Ecosystems." IEEE Transactions on Engineering Management 66, no. 4 (November 2019): 568–82. http://dx.doi.org/10.1109/tem.2018.2855435.
Повний текст джерелаTomiya, Shigetaka. "TEM Analysis of Degraded ZnCdSe Quantum Well Strructures." Materia Japan 40, no. 12 (2001): 1002. http://dx.doi.org/10.2320/materia.40.1002.
Повний текст джерелаGoyal, Garima. "Analysis of Alignment of TEM Image using ECC." IOSR Journal of Computer Engineering 16, no. 3 (2014): 112–15. http://dx.doi.org/10.9790/0661-1633112115.
Повний текст джерелаGuo, Wen-Bo, Guo-Qiang Xue, Xiu Li, and Yin-Ai Liu. "Correlation analysis and imaging technique of TEM data." Exploration Geophysics 43, no. 3 (September 2012): 137–48. http://dx.doi.org/10.1071/eg11034.
Повний текст джерелаSong, Xiangyun, Yanbao Fu, Chengyu Song, and Vincent Battaglia. "TEM failure analysis of electrochemically delithiated LiNi0.5Mn1.5O4 spinel." MRS Advances 5, no. 27-28 (2020): 1405–13. http://dx.doi.org/10.1557/adv.2020.105.
Повний текст джерелаMoreaud, Maxime, Renaud Revel, Dominique Jeulin, and Vincent Morard. "SIZE OF BOEHMITE NANOPARTICLES BY TEM IMAGES ANALYSIS." Image Analysis & Stereology 28, no. 3 (May 3, 2011): 187. http://dx.doi.org/10.5566/ias.v28.p187-193.
Повний текст джерелаReyes-Gasga, José, and Nancy Vargas-Becerril. "TEM Phase Transitions Analysis in Human Tooth Enamel." Microscopy and Microanalysis 26, S1 (March 2020): 169–70. http://dx.doi.org/10.1017/s1431927620001063.
Повний текст джерелаFalke, M., A. Kaeppel, S. Scheller, W. Hahn, R. Terborg, M. Rohde, Q. Ramasse, et al. "SDD-EDS: Element Analysis of Nanostructures in TEM." Microscopy and Microanalysis 18, S2 (July 2012): 1058–59. http://dx.doi.org/10.1017/s1431927612007143.
Повний текст джерелаLewis, Nathan, Krishna Shenai, and Ernest L. Hall. "TEM analysis of TiSi2 on Si and polysilicon." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 886–87. http://dx.doi.org/10.1017/s0424820100106491.
Повний текст джерелаBrennan, M., Masaru Kuno, and S. Rouvimov. "TEM Analysis of CsPbBr3 Nanocrystals: Challenges and Perspectives." Microscopy and Microanalysis 23, S1 (July 2017): 2096–97. http://dx.doi.org/10.1017/s143192761701114x.
Повний текст джерелаPark, S., NT Nuhfer, DE Laughlin, and J.-G. Zhu. "Complementary Analytical TEM Analysis of Perpendicular Recording Media." Microscopy and Microanalysis 15, S2 (July 2009): 1318–19. http://dx.doi.org/10.1017/s1431927609096871.
Повний текст джерелаGeiss, RH, E. Mansfield, and JA Fagan. "Methods for TEM Analysis of NIST’s SWCNT SRM." Microscopy and Microanalysis 16, S2 (July 2010): 1792–93. http://dx.doi.org/10.1017/s1431927610062331.
Повний текст джерелаButtry, R. W., C. R. Hills, G. C. Nelson, and T. Tribble. "Auger and TEM analysis of multilayer IC contacts." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 818–19. http://dx.doi.org/10.1017/s0424820100171821.
Повний текст джерелаScheerschmidt, Kurt, and Volker Kuhlmann. "Nanostructures simulated by molecular dynamics for TEM analysis." Microscopy and Microanalysis 9, S03 (September 2003): 232–33. http://dx.doi.org/10.1017/s1431927603022268.
Повний текст джерелаMartinez, L., J. M. Briceño-Valero, S. A. López-Rivera, K. Moore, and J. T. Thorthon. "Micropattern analysis of ZnIn2S4 using AFM and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 476–77. http://dx.doi.org/10.1017/s0424820100138750.
Повний текст джерелаOlivier, E. J., та J. H. Neethling. "TEM analysis of planar defects in β-SiC". International Journal of Refractory Metals and Hard Materials 27, № 2 (березень 2009): 443–48. http://dx.doi.org/10.1016/j.ijrmhm.2008.09.013.
Повний текст джерелаSHIMIZU, Yuko, Takao SHINKAWA, Miyuki TSUDA, Yoshikazu SASAKI, and Munetaka Nakata. "Analysis of TEM Images Using Akaike's Information Criterion." Hyomen Kagaku 33, no. 4 (2012): 242–46. http://dx.doi.org/10.1380/jsssj.33.242.
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