Статті в журналах з теми "TCAD ANALYSIS"
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Wang, Ke, Haodong Jiang, Yiming Liao, Yue Xu, Feng Yan, and Xiaoli Ji. "Degradation Prediction of GaN HEMTs under Hot-Electron Stress Based on ML-TCAD Approach." Electronics 11, no. 21 (November 2, 2022): 3582. http://dx.doi.org/10.3390/electronics11213582.
Повний текст джерелаPan, Zijin, Cheng Li, Mengfu Di, Feilong Zhang, and Albert Wang. "3D TCAD Analysis Enabling ESD Layout Design Optimization." IEEE Journal of the Electron Devices Society 8 (2020): 1289–96. http://dx.doi.org/10.1109/jeds.2020.3027034.
Повний текст джерелаGupta, Vaibhav. "Performance Analysis of TFET and VDSTFET for Low Power Application using the Work Function Engineering." International Journal for Research in Applied Science and Engineering Technology 9, no. VI (June 25, 2021): 2722–27. http://dx.doi.org/10.22214/ijraset.2021.35534.
Повний текст джерелаKim, Won-Young, Gee Young Suh, Jin Won Huh, Sung-Han Kim, Min-ju Kim, Yun Seong Kim, Hye-Ryoun Kim, et al. "Triple-Combination Antiviral Drug for Pandemic H1N1 Influenza Virus Infection in Critically Ill Patients on Mechanical Ventilation." Antimicrobial Agents and Chemotherapy 55, no. 12 (October 3, 2011): 5703–9. http://dx.doi.org/10.1128/aac.05529-11.
Повний текст джерелаPasseri, D., M. Baroncini, P. Ciampolini, G. M. Bilei, A. Santocchia, B. Checcucci, and E. Fiandrini. "TCAD-based analysis of radiation-hardness in silicon detectors." IEEE Transactions on Nuclear Science 45, no. 3 (June 1998): 602–8. http://dx.doi.org/10.1109/23.682456.
Повний текст джерелаScheinemann, Artur, and Andreas Schenk. "TCAD-based DLTS simulation for analysis of extended defects." physica status solidi (a) 211, no. 1 (January 2014): 136–42. http://dx.doi.org/10.1002/pssa.201300233.
Повний текст джерелаLi, Fuxing, Changchun Chai, Yuqian Liu, Yanxing Song, Lei Wang, and Yintang Yang. "Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment." Micromachines 14, no. 3 (March 4, 2023): 600. http://dx.doi.org/10.3390/mi14030600.
Повний текст джерелаHajj, Ibrahim N. "Extended Nodal Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, no. 1 (January 2012): 89–100. http://dx.doi.org/10.1109/tcad.2011.2167330.
Повний текст джерелаJongyoon Jung and Taewhan Kim. "Variation-Aware False Path Analysis Based on Statistical Dynamic Timing Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, no. 11 (November 2012): 1684–97. http://dx.doi.org/10.1109/tcad.2012.2202392.
Повний текст джерелаVytyaz, Igor, David C. Lee, Pavan Kumar Hanumolu, Un-Ku Moon, and Kartikeya Mayaram. "Sensitivity Analysis for Oscillators." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 27, no. 9 (September 2008): 1521–34. http://dx.doi.org/10.1109/tcad.2008.927731.
Повний текст джерелаKobayashi, Koji, Ryosuke Okuyama, Takeshi Kadono, Ayumi Onaka-Masada, Ryo Hirose, Akihiro Suzuki, Yoshihiro Koga, Koji Sueoka, and Kazunari Kurita. "TEM Image Analysis and Simulation Physics for Two-Step Recrystallization of Discretely Amorphized C3H5-Molecular-Ion-Implanted Silicon Substrate Surface." Crystals 14, no. 2 (January 24, 2024): 112. http://dx.doi.org/10.3390/cryst14020112.
Повний текст джерелаRigaud-Minet, Florian, Julien Buckley, William Vandendaele, Matthew Charles, Marie-Anne Jaud, Elise Rémont, Hervé Morel, et al. "Capacitance Temperature Dependence Analysis of GaN-on-Si Power Transistors." Energies 15, no. 19 (September 26, 2022): 7062. http://dx.doi.org/10.3390/en15197062.
Повний текст джерелаBoufouss, E., J. Alvarado, and D. Flandre. "Compact modeling of the high temperature effect on the single event transient current generated by heavy ions in SOI 6T-SRAM." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2010, HITEC (January 1, 2010): 000077–82. http://dx.doi.org/10.4071/hitec-eboufouss-ta25.
Повний текст джерелаVakili, Aref, Lucio Pancheri, Mahsa Farasat, Antonino La Magna, David Mascali, and Matteo Bregoli. "Analysis of the performance of low gain avalanche diodes for future particle detectors." Journal of Instrumentation 18, no. 07 (July 1, 2023): P07052. http://dx.doi.org/10.1088/1748-0221/18/07/p07052.
Повний текст джерелаBryant, R. E. "Boolean Analysis of MOS Circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, no. 4 (July 1987): 634–49. http://dx.doi.org/10.1109/tcad.1987.1270310.
Повний текст джерелаGnudi, A., P. Ciampolini, R. Guerrieri, M. Rudan, and G. Baccarani. "Sensitivity Analysis for Device Design." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, no. 5 (September 1987): 879–85. http://dx.doi.org/10.1109/tcad.1987.1270330.
Повний текст джерелаJianwen Zhu and S. Calman. "Context sensitive symbolic pointer analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, no. 4 (April 2005): 516–31. http://dx.doi.org/10.1109/tcad.2005.844092.
Повний текст джерелаVygen, J. "Slack in static timing analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 9 (September 2006): 1876–85. http://dx.doi.org/10.1109/tcad.2005.858348.
Повний текст джерелаKouroussis, D., R. Ahmadi, and F. N. Najm. "Voltage-Aware Static Timing Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 10 (October 2006): 2156–69. http://dx.doi.org/10.1109/tcad.2005.860953.
Повний текст джерелаSinha, Debjit, and Hai Zhou. "Statistical Timing Analysis With Coupling." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 12 (December 2006): 2965–75. http://dx.doi.org/10.1109/tcad.2006.882482.
Повний текст джерелаChoudhury, M. R., and K. Mohanram. "Reliability Analysis of Logic Circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, no. 3 (March 2009): 392–405. http://dx.doi.org/10.1109/tcad.2009.2012530.
Повний текст джерелаYe, Zuochang, Zhenhai Zhu, and Joel R. Phillips. "Incremental Large-Scale Electrostatic Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, no. 11 (November 2009): 1641–53. http://dx.doi.org/10.1109/tcad.2009.2030267.
Повний текст джерелаFinder, Alexander, Andre Sulflow, and Gorschwin Fey. "Latency Analysis for Sequential Circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 33, no. 4 (April 2014): 643–47. http://dx.doi.org/10.1109/tcad.2013.2292501.
Повний текст джерелаLu, Zhonghai, and Xueqian Zhao. "xMAS-Based QoS Analysis Methodology." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, no. 2 (February 2018): 364–77. http://dx.doi.org/10.1109/tcad.2017.2706561.
Повний текст джерелаJung, Hakkee. "Analysis of Subthreshold Swing of Symmetric Junctionless Double Gate MOSFET Using Gaussian Doping Profile." International Journal of Emerging Technology and Advanced Engineering 12, no. 1 (January 16, 2022): 23–30. http://dx.doi.org/10.46338/ijetae0122_03.
Повний текст джерелаJeong, Jee-Hun, Ogyun Seok, and Ho-Jun Lee. "Analysis of Electrical Characteristics in 4H-SiC Trench-Gate MOSFETs with Grounded Bottom Protection p-Well Using Analytical Modeling." Applied Sciences 11, no. 24 (December 18, 2021): 12075. http://dx.doi.org/10.3390/app112412075.
Повний текст джерелаHerrera-Moreno, Alfonso, José Luis García-Gervacio, Héctor Villacorta-Minaya, and Héctor Vázquez-Leal. "TCAD analysis and modeling for NBTI mechanism in FinFET transistors." IEICE Electronics Express 15, no. 14 (2018): 20180502. http://dx.doi.org/10.1587/elex.15.20180502.
Повний текст джерелаPetrosyants, K. O., A. A. Pugachev, I. A. Kharitinov, and B. G. Lvov. "I-V- Characteristics analysis of betavoltaic microbatteries using TCAD model." Journal of Physics: Conference Series 1353 (November 2019): 012093. http://dx.doi.org/10.1088/1742-6596/1353/1/012093.
Повний текст джерелаWang, Jinghui, Padhraic L. Mulligan, and Lei R. Cao. "Transient current analysis of a GaN radiation detector by TCAD." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 761 (October 2014): 7–12. http://dx.doi.org/10.1016/j.nima.2014.05.098.
Повний текст джерелаHanson, D. A., R. J. G. Goossens, M. Redford, J. McGinty, J. K. Kibarian, and K. W. Michaels. "Analysis of mixed-signal manufacturability with statistical technology CAD (TCAD)." IEEE Transactions on Semiconductor Manufacturing 9, no. 4 (1996): 478–88. http://dx.doi.org/10.1109/66.542163.
Повний текст джерелаFleury, C., G. Notermans, H. M. Ritter, and D. Pogany. "TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs." Microelectronics Reliability 76-77 (September 2017): 698–702. http://dx.doi.org/10.1016/j.microrel.2017.06.070.
Повний текст джерелаKenrow, J. A. "Characterization and Analysis of OFET Devices Based on TCAD Simulations." IEEE Transactions on Electron Devices 52, no. 9 (September 2005): 2034–41. http://dx.doi.org/10.1109/ted.2005.854281.
Повний текст джерелаCeric, Hajdin, Orio de, Wolfhard Zisser, and Siegfried Selberherr. "Microstructural impact on electromigration: A TCAD study." Facta universitatis - series: Electronics and Energetics 27, no. 1 (2014): 1–11. http://dx.doi.org/10.2298/fuee1401001c.
Повний текст джерелаBlaauw, D., V. Zolotov, and S. Sundareswaran. "Slope propagation in static timing analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 21, no. 10 (October 2002): 1180–95. http://dx.doi.org/10.1109/tcad.2002.802274.
Повний текст джерелаVrudhula, S., D. T. Blaauw, and S. Sirichotiyakul. "Probabilistic analysis of interconnect coupling noise." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, no. 9 (September 2003): 1188–203. http://dx.doi.org/10.1109/tcad.2003.816212.
Повний текст джерелаHongliang Chang and S. S. Sapatnekar. "Statistical timing analysis under spatial correlations." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, no. 9 (September 2005): 1467–82. http://dx.doi.org/10.1109/tcad.2005.850834.
Повний текст джерелаHaifeng Qian, S. R. Nassif, and S. S. Sapatnekar. "Power grid analysis using random walks." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, no. 8 (August 2005): 1204–24. http://dx.doi.org/10.1109/tcad.2005.850863.
Повний текст джерелаTseng, K., and M. Horowitz. "False coupling exploration in timing analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, no. 11 (November 2005): 1795–805. http://dx.doi.org/10.1109/tcad.2005.852435.
Повний текст джерелаRuibing Lu and Cheng-Kok Koh. "Performance analysis of latency-insensitive systems." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 3 (March 2006): 469–83. http://dx.doi.org/10.1109/tcad.2005.854636.
Повний текст джерелаZhang, M., and N. R. Shanbhag. "Soft-Error-Rate-Analysis (SERA) Methodology." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 10 (October 2006): 2140–55. http://dx.doi.org/10.1109/tcad.2005.862738.
Повний текст джерелаMiskov-Zivanov, Natasa, and Diana Marculescu. "Circuit Reliability Analysis Using Symbolic Techniques." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 25, no. 12 (December 2006): 2638–49. http://dx.doi.org/10.1109/tcad.2006.882592.
Повний текст джерелаLasbouygues, Benoit, Robin Wilson, Nadine Azemard, and Philippe Maurine. "Temperature- and Voltage-Aware Timing Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 26, no. 4 (April 2007): 801–15. http://dx.doi.org/10.1109/tcad.2006.884860.
Повний текст джерелаJongeun Lee and Aviral Shrivastava. "Static Analysis of Register File Vulnerability." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 30, no. 4 (April 2011): 607–16. http://dx.doi.org/10.1109/tcad.2010.2095630.
Повний текст джерелаMakarenko, D. D., and J. Tartar. "A Statistical Analysis of PLA Folding." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 5, no. 1 (January 1986): 39–51. http://dx.doi.org/10.1109/tcad.1986.1270176.
Повний текст джерелаFeiten, Linus, Matthias Sauer, Tobias Schubert, Victor Tomashevich, Ilia Polian, and Bernd Becker. "Formal Vulnerability Analysis of Security Components." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 34, no. 8 (August 2015): 1358–69. http://dx.doi.org/10.1109/tcad.2015.2448687.
Повний текст джерелаHua, Wenmian, and Rajit Manohar. "Exact Timing Analysis for Asynchronous Systems." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, no. 1 (January 2018): 203–16. http://dx.doi.org/10.1109/tcad.2017.2693268.
Повний текст джерелаBryant, R. E. "Algorithmic Aspects of Symbolic Switch Network Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 6, no. 4 (July 1987): 618–33. http://dx.doi.org/10.1109/tcad.1987.1270309.
Повний текст джерелаGang Li and N. R. Aluru. "Efficient mixed-domain analysis of electrostatic MEMS." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, no. 9 (September 2003): 1228–42. http://dx.doi.org/10.1109/tcad.2003.816210.
Повний текст джерелаHashimoto, M., Y. Yamada, and H. Onodera. "Equivalent Waveform Propagation for Static Timing Analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23, no. 4 (April 2004): 498–508. http://dx.doi.org/10.1109/tcad.2004.825858.
Повний текст джерелаRan, Y., A. Kondratyev, K. H. Tseng, Y. Watanabe, and M. Marek-Sadowska. "Eliminating false positives in crosstalk noise analysis." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 24, no. 9 (September 2005): 1406–19. http://dx.doi.org/10.1109/tcad.2005.850829.
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