Статті в журналах з теми "SUB MICRON TECHNOLOGIES"
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DESPOTULI, ALEXANDER, and ALEXANDRA ANDREEVA. "A SHORT REVIEW ON DEEP-SUB-VOLTAGE NANOELECTRONICS AND RELATED TECHNOLOGIES." International Journal of Nanoscience 08, no. 04n05 (August 2009): 389–402. http://dx.doi.org/10.1142/s0219581x09006328.
Повний текст джерелаYamazaki, T., K. Imai, H. Yoshida, Y. Kinoshita, and H. Suzuki. "Process integration technologies for sub-half micron BiCMOS LSls." Electrical Engineering 79, no. 5 (October 1996): 329–33. http://dx.doi.org/10.1007/bf01235873.
Повний текст джерелаBude, J. D., and M. Mastrapasqua. "Impact ionization and distribution functions in sub-micron nMOSFET technologies." IEEE Electron Device Letters 16, no. 10 (October 1995): 439–41. http://dx.doi.org/10.1109/55.464810.
Повний текст джерелаManolopoulos, Spyros, K. Mathieson, and R. Turchetta. "Simulation of monolithic active pixels in deep sub-micron technologies." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 487, no. 1-2 (July 2002): 181–87. http://dx.doi.org/10.1016/s0168-9002(02)00963-4.
Повний текст джерелаBoyes, E. D. "LVEDS For Advanced Materials and Semiconductor Technologies." Microscopy and Microanalysis 5, S2 (August 1999): 314–15. http://dx.doi.org/10.1017/s1431927600014896.
Повний текст джерелаDuruk, Alper, Ece Olcay Güneş, and Hakan Kuntman. "A new low voltage CMOS differential OTRA for sub-micron technologies." AEU - International Journal of Electronics and Communications 61, no. 5 (May 2007): 291–99. http://dx.doi.org/10.1016/j.aeue.2006.05.009.
Повний текст джерелаKaloyeros, Alain E., and Michael A. Fury. "Chemical Vapor Deposition of Copper for Multilevel Metallization." MRS Bulletin 18, no. 6 (June 1993): 22–29. http://dx.doi.org/10.1557/s0883769400047291.
Повний текст джерелаBude, Jeff D. "Monte Carlo Simulations of Impact Ionization Feedback in MOSFET Structures." VLSI Design 8, no. 1-4 (January 1, 1998): 13–19. http://dx.doi.org/10.1155/1998/10649.
Повний текст джерелаVishnoi, U., and T. G. Noll. "Area- and energy-efficient CORDIC accelerators in deep sub-micron CMOS technologies." Advances in Radio Science 10 (September 18, 2012): 207–13. http://dx.doi.org/10.5194/ars-10-207-2012.
Повний текст джерелаGul, Waqas, Maitham Shams, and Dhamin Al-Khalili. "SRAM Cell Design Challenges in Modern Deep Sub-Micron Technologies: An Overview." Micromachines 13, no. 8 (August 17, 2022): 1332. http://dx.doi.org/10.3390/mi13081332.
Повний текст джерелаBaldi, L., B. Franzini, D. Pandini, and R. Zafalon. "Design solutions for the interconnection parasitic effects in deep sub-micron technologies." Microelectronic Engineering 55, no. 1-4 (March 2001): 11–18. http://dx.doi.org/10.1016/s0167-9317(00)00423-8.
Повний текст джерелаGelpey, Jeffrey C., Steve McCoy, Dave Camm, and Wilfried Lerch. "An Overview of ms Annealing for Deep Sub-Micron Activation." Materials Science Forum 573-574 (March 2008): 257–67. http://dx.doi.org/10.4028/www.scientific.net/msf.573-574.257.
Повний текст джерелаArmigliato, A., R. Balboni, G. P. Carnevale, P. Colpani, S. Frabboni, and G. Pavia. "Strain Field Distribution in Submicron Devices by TEM/CBED. A European Project." Microscopy and Microanalysis 6, S2 (August 2000): 1076–77. http://dx.doi.org/10.1017/s1431927600037879.
Повний текст джерелаLudeke, Sascha, and Arto Javanainen. "Proton Direct Ionization in Sub-Micron Technologies: Numerical Method for RPP Parameter Extraction." IEEE Transactions on Nuclear Science 69, no. 3 (March 2022): 254–63. http://dx.doi.org/10.1109/tns.2022.3147592.
Повний текст джерелаChen, X. Y., J. A. Johansen, C. Salm, and A. D. van Rheenen. "On low-frequency noise of polycrystalline GexSi1−x for sub-micron CMOS technologies." Solid-State Electronics 45, no. 11 (November 2001): 1967–71. http://dx.doi.org/10.1016/s0038-1101(01)00242-8.
Повний текст джерелаBalasubramanian, A., A. L. Sternberg, B. L. Bhuva, and L. W. Massengill. "Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies." IEEE Transactions on Nuclear Science 53, no. 6 (December 2006): 3306–11. http://dx.doi.org/10.1109/tns.2006.884675.
Повний текст джерелаPak, Murat, Zeliha Yilmaz, and Aylin Ersoy. "A Novel OPC Technique for 2D Critical Dimension Optimization of Sub-micron Patterns using an Experimental Methodology." International Symposium on Microelectronics 2012, no. 1 (January 1, 2012): 000702–9. http://dx.doi.org/10.4071/isom-2012-wa56.
Повний текст джерелаNGAN, A. H. W., P. C. WO, L. ZUO, H. LI, and N. AFRIN. "THE STRENGTH OF SUBMICRON-SIZED MATERIALS." International Journal of Modern Physics B 20, no. 25n27 (October 30, 2006): 3579–86. http://dx.doi.org/10.1142/s0217979206040027.
Повний текст джерелаNunes, A. M., S. A. Moshkalev, P. J. Tatsch, and A. M. Daltrini. "Plasma Etching of Polycrystalline Silicon using Thinning Technology for Application in CMOS and MEMS Technologies." Journal of Integrated Circuits and Systems 2, no. 2 (November 18, 2007): 74–80. http://dx.doi.org/10.29292/jics.v2i2.269.
Повний текст джерелаSHANG, Kefeng, Wudi CAO, Weiwei HUAN, Nan JIANG, Na LU, and Jie LI. "Effect of megapore particles packing on dielectric barrier discharge, O3 generation and benzene degradation." Plasma Science and Technology 24, no. 1 (November 22, 2021): 015501. http://dx.doi.org/10.1088/2058-6272/ac3379.
Повний текст джерелаFossum, Jon Otto. "Clay nanolayer encapsulation, evolving from origins of life to future technologies." European Physical Journal Special Topics 229, no. 17-18 (November 2020): 2863–79. http://dx.doi.org/10.1140/epjst/e2020-000131-1.
Повний текст джерелаKrishna, R., and Punithavathi Duraiswamy. "Low leakage 10T SRAM cell with improved data stability in deep sub-micron technologies." Analog Integrated Circuits and Signal Processing 109, no. 1 (May 6, 2021): 153–63. http://dx.doi.org/10.1007/s10470-021-01870-7.
Повний текст джерелаFobelets, K., W. Jeamsaksiri, C. Papavasilliou, T. Vilches, V. Gaspari, J. E. Velazquez-Perez, K. Michelakis, T. Hackbarth, and U. König. "Comparison of sub-micron Si:SiGe heterojunction nFETs to Si nMOSFET in present-day technologies." Solid-State Electronics 48, no. 8 (August 2004): 1401–6. http://dx.doi.org/10.1016/j.sse.2004.01.017.
Повний текст джерелаNing, Zhenqiu, Yuri Sneyders, Wim Vanderbauwhede, Renaud Gillon, Marnix Tack, and Paul Raes. "A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies." Microelectronics Reliability 41, no. 12 (December 2001): 1939–45. http://dx.doi.org/10.1016/s0026-2714(01)00100-7.
Повний текст джерелаJo, Seongmin, and Yong Ho Song. "Leakage-aware adaptive routing for pipelined on-chip networks in ultra-deep sub-micron technologies." IEICE Electronics Express 9, no. 24 (2012): 1887–92. http://dx.doi.org/10.1587/elex.9.1887.
Повний текст джерелаSamanta, Smrutilekha, Bhawna Tiwari, Pydi Ganga Bahubalindruni, Pedro Barquinha, and Joao Goes. "Threshold voltage extraction techniques adaptable from sub-micron CMOS to large-area oxide TFT technologies." International Journal of Circuit Theory and Applications 45, no. 12 (April 5, 2017): 2201–10. http://dx.doi.org/10.1002/cta.2340.
Повний текст джерелаDishari, Shudipto K. "(Invited) Novel Nature-Inspired Concepts to Design Ionomeric Nanomaterials for Energy Conversion and Storage Devices." ECS Meeting Abstracts MA2022-01, no. 38 (July 7, 2022): 1707. http://dx.doi.org/10.1149/ma2022-01381707mtgabs.
Повний текст джерелаZhao, Gaoyang, Zhen Wei, Weilei Wang, Daohuan Feng, Aoxue Xu, Weili Liu, and Zhitang Song. "Review on modeling and application of chemical mechanical polishing." Nanotechnology Reviews 9, no. 1 (March 12, 2020): 182–89. http://dx.doi.org/10.1515/ntrev-2020-0016.
Повний текст джерелаHwang, T., G. W. Wang, Y. Chang, and C. L. Lau. "Comparison of Single and Tri‐Layer Technologies for Volume Production of Sub‐Half Micron Gate GaAs MESFETs." Journal of The Electrochemical Society 139, no. 2 (February 1, 1992): 625–28. http://dx.doi.org/10.1149/1.2069269.
Повний текст джерелаJavaheri, Reza, and Reza Sedaghat. "Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies." Microelectronics Reliability 49, no. 2 (February 2009): 178–85. http://dx.doi.org/10.1016/j.microrel.2008.11.010.
Повний текст джерелаWaghmare, Parag C., Samadhan B. Patil, Alka Kumbhar, R. O. Dusane, and V. Ramgopal Rao. "Ultra-thin silicon nitride by hot wire chemical vapor deposition (HWCVD) for deep sub-micron CMOS technologies." Microelectronic Engineering 61-62 (July 2002): 625–29. http://dx.doi.org/10.1016/s0167-9317(02)00575-0.
Повний текст джерелаMillan, Alejandro, Manuel J. Bellido, Jorge Juan, David Guerrero, Paulino Ruiz-de-Clavijo, and Julian Viejo. "Comprehensive Analysis on the Internal Power Dissipation of Static CMOS Cells in Ultra-Deep Sub-Micron Technologies." Journal of Low Power Electronics 6, no. 1 (April 1, 2010): 93–102. http://dx.doi.org/10.1166/jolpe.2010.1059.
Повний текст джерелаRao Tirumalasetty, Venkata, C. V. Mohan Krishna, K. Sai Sree Tanmaie, T. Lakshmi Naveena, and Ch Jonathan. "A novel design of high performance1-bit adder circuit at deep sub-micron technology." International Journal of Engineering & Technology 7, no. 1.1 (December 21, 2017): 660. http://dx.doi.org/10.14419/ijet.v7i1.1.10822.
Повний текст джерелаBashirpour, Mohammad, Wei Cui, Angela Gamouras, and Jean-Michel Ménard. "Scalable Fabrication of Nanogratings on GaP for Efficient Diffraction of Near-Infrared Pulses and Enhanced Terahertz Generation by Optical Rectification." Crystals 12, no. 5 (May 10, 2022): 684. http://dx.doi.org/10.3390/cryst12050684.
Повний текст джерелаCox Jr, Kevin L., Sai Guna Ranjan Gurazada, Keith E. Duncan, Kirk J. Czymmek, Christopher N. Topp, and Blake C. Meyers. "Organizing your space: The potential for integrating spatial transcriptomics and 3D imaging data in plants." Plant Physiology 188, no. 2 (November 2, 2021): 703–12. http://dx.doi.org/10.1093/plphys/kiab508.
Повний текст джерелаPandey, Ayush, Yixin Xiao, Maddaka Reddeppa, Yakshita Malhotra, Jiangnan Liu, Jungwook Min, Yuanpeng Wu, and Zetian Mi. "A red-emitting micrometer scale LED with external quantum efficiency >8%." Applied Physics Letters 122, no. 15 (April 10, 2023): 151103. http://dx.doi.org/10.1063/5.0129234.
Повний текст джерелаChrzanowska-Jeske, Malgorzata, Yang Xu, and Marek Perkowski. "Logic Synthesis for a Regular Layout." VLSI Design 10, no. 1 (January 1, 1999): 35–55. http://dx.doi.org/10.1155/1999/85272.
Повний текст джерелаXu, Yux, Ping Xiang, and Xiaopeng Xie. "Comprehensive understanding of dark count mechanisms of single-photon avalanche diodes fabricated in deep sub-micron CMOS technologies." Solid-State Electronics 129 (March 2017): 168–74. http://dx.doi.org/10.1016/j.sse.2016.11.009.
Повний текст джерелаVerhaege, Koen G., and Christian C. Russ. "Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies." Microelectronics Reliability 41, no. 11 (November 2001): 1739–49. http://dx.doi.org/10.1016/s0026-2714(01)00030-0.
Повний текст джерелаSexton, B. A., and R. J. Marnock. "Characterization of High Resolution Resists and Metal Shims by Scanning Probe Microscopy." Microscopy and Microanalysis 6, no. 2 (March 2000): 129–36. http://dx.doi.org/10.1007/s100059910012.
Повний текст джерелаMaj, P. "Fast and precise algorithms for calculating offset correction in single photon counting ASICs built in deep sub-micron technologies." Journal of Instrumentation 9, no. 07 (July 9, 2014): C07009. http://dx.doi.org/10.1088/1748-0221/9/07/c07009.
Повний текст джерелаTANIGUCHI, Kazuhiro. "New Technologies for Scaled-down Cu Interconnection in Ultra-Large Scale Integrated Circuits. Copper Deposition System for Sub-micron Patterning." Journal of the Surface Finishing Society of Japan 49, no. 11 (1998): 1176–79. http://dx.doi.org/10.4139/sfj.49.1176.
Повний текст джерелаByeon, Kyeong Jae, Sung Hoon Hong, Ki Yeon Yang, Seung Hyun Ra, Jin Ho Ahn, and Heon Lee. "Embossing Lithography on Sticky Thermoset Polymer Using Ni Template." Solid State Phenomena 124-126 (June 2007): 147–51. http://dx.doi.org/10.4028/www.scientific.net/ssp.124-126.147.
Повний текст джерелаXiao, Tong, and Malgorzata Marek-Sadowska. "Using Temporal and Functional Information in Crosstalk Aware Static Timing Analysis." VLSI Design 15, no. 3 (January 1, 2002): 647–66. http://dx.doi.org/10.1080/1065514021000012264.
Повний текст джерелаWaghmare, Parag C., Samadhan B. Patil, Alka A. Kumbhar, Ramgopal Rao, and R. O. Dusane. "Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies." Thin Solid Films 430, no. 1-2 (April 2003): 189–91. http://dx.doi.org/10.1016/s0040-6090(03)00108-1.
Повний текст джерелаChatterjee, Sayan. "Study and Analysis of Full Adder in Different Sub-Micron Technologies with an Area Efficient Layout of 4-Bit Ripple Carry Adder." International Journal of Innovative Research in Computer and Communication Engineering 03, no. 06 (June 10, 2015): 4979–84. http://dx.doi.org/10.15680/ijircce.2015.0306005.
Повний текст джерелаNadeem, Irfan, Rehan Akhter, Shazeen Akhtar, and Anjum Tauqir. "Optimization of Pulsed Fiber Laser Texturing for Solid Lubricant Deposition on a Ti/TiN Coated Aerospace Alloy." Key Engineering Materials 875 (February 2021): 337–45. http://dx.doi.org/10.4028/www.scientific.net/kem.875.337.
Повний текст джерелаFaraji Rad, Zahra, Philip D. Prewett, and Graham J. Davies. "An overview of microneedle applications, materials, and fabrication methods." Beilstein Journal of Nanotechnology 12 (September 13, 2021): 1034–46. http://dx.doi.org/10.3762/bjnano.12.77.
Повний текст джерелаParadhasaradhi, Damarla, Kollu Jaya Lakshmi, Yadavalli Harika, Busa Ravi Teja Sai, and Golla Jayanth Krishna. "Comparative analysis of SRAM cell with leakage power reduction approaches." International Journal of Engineering & Technology 7, no. 2.7 (March 18, 2018): 863. http://dx.doi.org/10.14419/ijet.v7i2.7.11083.
Повний текст джерелаHeimbrook, L. A. "Analytical solutions for complex problems using multiple diagnostic techniques." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 686–87. http://dx.doi.org/10.1017/s0424820100139809.
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