Статті в журналах з теми "Scanning Tunneling Microscopy [Tool]"
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Chiang, Shirley, and Robert J. Wilson. "Scanning Tunneling Microscopy: A Surface Structural Tool." Analytical Chemistry 59, no. 21 (November 1987): 1267A—1270A. http://dx.doi.org/10.1021/ac00148a748.
Повний текст джерелаStemmer, A., A. Engel, R. Häring, R. Reichelt, and U. Aebi. "Scanning tunneling microscopy of biomacromolecules." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 444–45. http://dx.doi.org/10.1017/s0424820100104285.
Повний текст джерелаDenley, D. R. "Practical applications of scanning tunneling microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 18–19. http://dx.doi.org/10.1017/s0424820100152069.
Повний текст джерелаvan de Walle, G. F. A., B. J. Nelissen, L. L. Soethout, and H. van Kempen. "Scanning tunneling microscopy: A powerful tool for surface analysis." Fresenius' Zeitschrift für analytische Chemie 329, no. 2-3 (January 1987): 108–12. http://dx.doi.org/10.1007/bf00469119.
Повний текст джерелаRohrer, H. "Scanning tunneling microscopy: a surface science tool and beyond." Surface Science 299-300 (January 1994): 956–64. http://dx.doi.org/10.1016/0039-6028(94)90709-9.
Повний текст джерелаBracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.
Повний текст джерелаEdel’man, V. S. "The scanning tunneling microscopy combined with the scanning electron microscopy—A tool for the nanometry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 2 (March 1991): 618. http://dx.doi.org/10.1116/1.585471.
Повний текст джерелаBetzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.
Повний текст джерелаElings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.
Повний текст джерелаXIE, XIAN NING, HONG JING CHUNG, and ANDREW THYE SHEN WEE. "SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION." COSMOS 03, no. 01 (November 2007): 1–21. http://dx.doi.org/10.1142/s0219607707000207.
Повний текст джерелаSONG, SHAOTANG, JIE SU, XINNAN PENG, XINBANG WU, and MYKOLA TELYCHKO. "RECENT ADVANCES IN BOND-RESOLVED SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 28, no. 08 (March 25, 2021): 2140007. http://dx.doi.org/10.1142/s0218625x21400072.
Повний текст джерелаMcCord, M. A., and R. F. W. Pease. "Scanning tunneling microscope as a micromechanical tool." Applied Physics Letters 50, no. 10 (March 9, 1987): 569–70. http://dx.doi.org/10.1063/1.98137.
Повний текст джерелаYu, Edward T. "Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures." MRS Bulletin 22, no. 8 (August 1997): 22–26. http://dx.doi.org/10.1557/s0883769400033765.
Повний текст джерелаFarrell, H. H., and M. Levinson. "Scanning tunneling microscope as a structure-modifying tool." Physical Review B 31, no. 6 (March 15, 1985): 3593–98. http://dx.doi.org/10.1103/physrevb.31.3593.
Повний текст джерелаReiss, G., and H. Brückl. "Electronic transport in metallic films — a tool for scanning tunneling microscopy investigations." Superlattices and Microstructures 11, no. 2 (January 1992): 171–74. http://dx.doi.org/10.1016/0749-6036(92)90245-z.
Повний текст джерелаGarcía-García, Ricardo, and Juan JoséSáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science Letters 251-252 (July 1991): A320. http://dx.doi.org/10.1016/0167-2584(91)90859-p.
Повний текст джерелаGarcía-García, Ricardo, and Juan José Sáenz. "Is scanning tunneling microscopy a useful tool for probing the surface potential?" Surface Science 251-252 (July 1991): 223–27. http://dx.doi.org/10.1016/0039-6028(91)90986-3.
Повний текст джерелаVang, Ronnie T., Jeppe V. Lauritsen, Erik Lægsgaard, and Flemming Besenbacher. "Scanning tunneling microscopy as a tool to study catalytically relevant model systems." Chemical Society Reviews 37, no. 10 (2008): 2191. http://dx.doi.org/10.1039/b800307f.
Повний текст джерелаLiu, J. B., Boyd Clark, and R. M. Fisher. "Applications of Scanning Tunneling Microscopy in the Materials Characterization Laboratory." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 316–17. http://dx.doi.org/10.1017/s0424820100180331.
Повний текст джерелаMack, James F., Philip B. Van Stockum, Hitoshi Iwadate, and Fritz B. Prinz. "A combined scanning tunneling microscope–atomic layer deposition tool." Review of Scientific Instruments 82, no. 12 (December 2011): 123704. http://dx.doi.org/10.1063/1.3669774.
Повний текст джерелаShedd, G. M., and P. Russell. "The scanning tunneling microscope as a tool for nanofabrication." Nanotechnology 1, no. 1 (July 1, 1990): 67–80. http://dx.doi.org/10.1088/0957-4484/1/1/012.
Повний текст джерелаHesjedal, T. "Scanning acoustic tunneling microscopy and spectroscopy: A probing tool for acoustic surface oscillations." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 15, no. 4 (July 1997): 1569. http://dx.doi.org/10.1116/1.589402.
Повний текст джерелаÁvila Bernal, Alba Graciela, and Ruy Sebastián Bonilla Osorio. "A study of surfaces using a scanning tunneling microscope (STM)." Ingeniería e Investigación 29, no. 3 (September 1, 2009): 121–27. http://dx.doi.org/10.15446/ing.investig.v29n3.15194.
Повний текст джерелаHsu, Julia W. P. "Semiconductor Defect Studies Using Scanning Probes." Microscopy and Microanalysis 6, S2 (August 2000): 704–5. http://dx.doi.org/10.1017/s1431927600036011.
Повний текст джерелаJoy, David C. "The Resolution of the SEM." Microscopy and Microanalysis 3, S2 (August 1997): 1173–74. http://dx.doi.org/10.1017/s1431927600012757.
Повний текст джерелаChernoff, Donald A. "Atomic-force microscopy: Exotic invention or practical tool?" Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 526–27. http://dx.doi.org/10.1017/s0424820100148460.
Повний текст джерелаSchönenberger, C., S. F. Alvarado, and C. Ortiz. "Scanning tunneling microscopy as a tool to study surface roughness of sputtered thin films." Journal of Applied Physics 66, no. 9 (November 1989): 4258–61. http://dx.doi.org/10.1063/1.343967.
Повний текст джерелаJu, Bing-Feng, Wu-Le Zhu, Shunyao Yang, and Keji Yang. "Scanning tunneling microscopy-basedin situmeasurement of fast tool servo-assisted diamond turning micro-structures." Measurement Science and Technology 25, no. 5 (March 14, 2014): 055004. http://dx.doi.org/10.1088/0957-0233/25/5/055004.
Повний текст джерелаFisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.
Повний текст джерелаDrost, Robert, Maximilian Uhl, Piotr Kot, Janis Siebrecht, Alexander Schmid, Jonas Merkt, Stefan Wünsch, et al. "Combining electron spin resonance spectroscopy with scanning tunneling microscopy at high magnetic fields." Review of Scientific Instruments 93, no. 4 (April 1, 2022): 043705. http://dx.doi.org/10.1063/5.0078137.
Повний текст джерелаBilger, R., H. J. Cantow, J. Heinze, and S. Magonov. "Scanning tunneling microscope images of doped polypyrrole on ITO glass." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 16–17. http://dx.doi.org/10.1017/s0424820100152057.
Повний текст джерелаRatner, Buddy D., Reto Luginbühll, Rene Overney, Michael Garrison, and Thomas Boland. "Recognition, Specificity, Scanning Probe Microscopy and Biomaterials." Microscopy and Microanalysis 7, S2 (August 2001): 130–31. http://dx.doi.org/10.1017/s1431927600026726.
Повний текст джерелаBonnell, Dawn A., and Qian Zhong. "Local geometric and electronic structure of oxides using scanning tunneling microscopy/spectroscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1480–81. http://dx.doi.org/10.1017/s0424820100132030.
Повний текст джерелаYao, J. E., and G. Y. Shang. "A Simple Scanning Tunneling Microscope with Very Wide Scanning Range." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 314–15. http://dx.doi.org/10.1017/s042482010018032x.
Повний текст джерелаWang, Xuewen, Xuexia He, Hongfei Zhu, Linfeng Sun, Wei Fu, Xingli Wang, Lai Chee Hoong, et al. "Subatomic deformation driven by vertical piezoelectricity from CdS ultrathin films." Science Advances 2, no. 7 (July 2016): e1600209. http://dx.doi.org/10.1126/sciadv.1600209.
Повний текст джерелаKossakovski, Dmitri A., John D. Baldeschwieler, and J. L. Beauchamp. "Chemical Imaging With a Scanning Probe Microscope." Microscopy and Microanalysis 5, S2 (August 1999): 970–71. http://dx.doi.org/10.1017/s1431927600018171.
Повний текст джерелаRevel, Jean-Paul. "Attaboy! Attoboys, or the new Zeptoscopists." Microscopy Today 1, no. 8 (December 1993): 2–3. http://dx.doi.org/10.1017/s1551929500069029.
Повний текст джерелаLi, Weixuan, Jihao Wang, Jing Zhang, Wenjie Meng, Caihong Xie, Yubin Hou, Zhigang Xia, and Qingyou Lu. "Atomic-Resolution Imaging of Micron-Sized Samples Realized by High Magnetic Field Scanning Tunneling Microscopy." Micromachines 14, no. 2 (January 22, 2023): 287. http://dx.doi.org/10.3390/mi14020287.
Повний текст джерелаWang, Meng-Jiao, Siegfried Wolff, and Burkhard Freund. "Filler-Elastomer Interactions. Part XI. Investigation of the Carbon-Black Surface by Scanning Tunneling Microscopy." Rubber Chemistry and Technology 67, no. 1 (March 1, 1994): 27–41. http://dx.doi.org/10.5254/1.3538665.
Повний текст джерелаRakovan, John, and F. Hochella Michael. "Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study." Microscopy and Microanalysis 4, S2 (July 1998): 600–601. http://dx.doi.org/10.1017/s1431927600023126.
Повний текст джерелаAle Crivillero, Maria Victoria, Jean C. Souza, Vicky Hasse, Marcus Schmidt, Natalya Shitsevalova, Slavomir Gabáni, Konrad Siemensmeyer, Karol Flachbart, and Steffen Wirth. "Detection of Surface States in Quantum Materials ZrTe2 and TmB4 by Scanning Tunneling Microscopy." Condensed Matter 8, no. 1 (January 16, 2023): 9. http://dx.doi.org/10.3390/condmat8010009.
Повний текст джерелаBogy, D. B. "Surface Modification and Measurement Using a Scanning Tunneling Microscope With a Diamond Tip." Journal of Tribology 114, no. 3 (July 1, 1992): 493–98. http://dx.doi.org/10.1115/1.2920910.
Повний текст джерелаBarbier, Luc, and Denis Gratias. "High resolution scanning tunneling microscopy studies of quasicrystal surfaces: an efficient tool to investigate quasiperiodic atomic structures." Progress in Surface Science 75, no. 3-8 (August 2004): 177–89. http://dx.doi.org/10.1016/j.progsurf.2004.05.006.
Повний текст джерелаKelly, Thomas F., Keith Thompson, Emmanuelle A. Marquis, and David J. Larson. "Atom Probe Tomography Defines Mainstream Microscopy at the Atomic Scale." Microscopy Today 14, no. 4 (July 2006): 34–41. http://dx.doi.org/10.1017/s1551929500050264.
Повний текст джерелаHuang, Haiming, Mingming Shuai, Yulong Yang, Rui Song, Yanghui Liao, Lifeng Yin, and Jian Shen. "Cryogen free spin polarized scanning tunneling microscopy and magnetic exchange force microscopy with extremely low noise." Review of Scientific Instruments 93, no. 7 (July 1, 2022): 073703. http://dx.doi.org/10.1063/5.0095271.
Повний текст джерелаWang, X., A. P. Liu, and X. H. Yang. "System design and new applications for atomic force microscope based on tunneling." International Journal of Modern Physics B 29, no. 25n26 (October 14, 2015): 1542039. http://dx.doi.org/10.1142/s0217979215420394.
Повний текст джерелаDe Feyter, Steven, André Gesquière, Mohamed M. Abdel-Mottaleb, Petrus C. M. Grim, Frans C. De Schryver, Christian Meiners, Michel Sieffert, Suresh Valiyaveettil, and Klaus Müllen. "Scanning Tunneling Microscopy: A Unique Tool in the Study of Chirality, Dynamics, and Reactivity in Physisorbed Organic Monolayers." Accounts of Chemical Research 33, no. 8 (August 2000): 520–31. http://dx.doi.org/10.1021/ar970040g.
Повний текст джерелаChen, Kui, Wenkai Xiao, Zhengwu Li, Jiasheng Wu, Kairong Hong, and Xuefeng Ruan. "Effect of Graphene and Carbon Nanotubes on the Thermal Conductivity of WC–Co Cemented Carbide." Metals 9, no. 3 (March 24, 2019): 377. http://dx.doi.org/10.3390/met9030377.
Повний текст джерелаCui, Daling, Jennifer M. MacLeod, and Federico Rosei. "Probing functional self-assembled molecular architectures with solution/solid scanning tunnelling microscopy." Chemical Communications 54, no. 75 (2018): 10527–39. http://dx.doi.org/10.1039/c8cc04341h.
Повний текст джерелаJeon, Sangjun, Yonglong Xie, Jian Li, Zhijun Wang, B. Andrei Bernevig, and Ali Yazdani. "Distinguishing a Majorana zero mode using spin-resolved measurements." Science 358, no. 6364 (October 12, 2017): 772–76. http://dx.doi.org/10.1126/science.aan3670.
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