Статті в журналах з теми "Scan testing"
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Maunder, Colin. "Boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 258. http://dx.doi.org/10.1016/0141-9331(93)90001-n.
Повний текст джерелаSachdev, M. "Testing Defects in Scan Chains." IEEE Design and Test of Computers 12, no. 4 (1995): 45. http://dx.doi.org/10.1109/mdt.1995.473312.
Повний текст джерелаSachdev, M. "Testing defects in scan chains." IEEE Design & Test of Computers 12, no. 4 (1995): 45–51. http://dx.doi.org/10.1109/54.491237.
Повний текст джерелаArvaniti, Efi, and Yiorgos Tsiatouhas. "Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique." Journal of Electronic Testing 30, no. 3 (May 22, 2014): 329–41. http://dx.doi.org/10.1007/s10836-014-5453-9.
Повний текст джерелаMojtabavi Naeini, Mahshid, and Chia Yee Ooi. "A Novel Scan Architecture for Low Power Scan-Based Testing." VLSI Design 2015 (April 22, 2015): 1–13. http://dx.doi.org/10.1155/2015/264071.
Повний текст джерелаTouati, Aymen, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda, and Etienne Auvray. "Scan-Chain Intra-Cell Aware Testing." IEEE Transactions on Emerging Topics in Computing 6, no. 2 (April 1, 2018): 278–87. http://dx.doi.org/10.1109/tetc.2016.2624311.
Повний текст джерелаXijiiang Lin, R. Press, J. Rajski, P. Reuter, T. Rinderknecht, B. Swanson, and N. Tamarapalli. "High-frequency, at-speed scan testing." IEEE Design & Test of Computers 20, no. 5 (September 2003): 17–25. http://dx.doi.org/10.1109/mdt.2003.1232252.
Повний текст джерелаDervisoglu, B. I. "Scan-path architecture for pseudorandom testing." IEEE Design & Test of Computers 6, no. 4 (August 1989): 32–48. http://dx.doi.org/10.1109/54.32420.
Повний текст джерелаKavousianos, Xrysovalantis, Dimitris Bakalis, and Dimitris Nikolos. "Efficient partial scan cell gating for low-power scan-based testing." ACM Transactions on Design Automation of Electronic Systems 14, no. 2 (March 2009): 1–15. http://dx.doi.org/10.1145/1497561.1497571.
Повний текст джерелаLi, Jia, Yu Hu, and XiaoWei Li. "Scan chain design for shift power reduction in scan-based testing." Science China Information Sciences 54, no. 4 (February 28, 2011): 767–77. http://dx.doi.org/10.1007/s11432-011-4205-z.
Повний текст джерелаHuh, Kyung-Hoi, Yong-Seok Kang, and Sungho Kang. "Efficient Path Delay Testing Using Scan Justification." ETRI Journal 25, no. 3 (June 9, 2003): 187–94. http://dx.doi.org/10.4218/etrij.03.0102.0304.
Повний текст джерелаHuang, T. C., and K. J. Lee. "Token scan cell for low power testing." Electronics Letters 37, no. 11 (2001): 678. http://dx.doi.org/10.1049/el:20010463.
Повний текст джерелаDoumanidis,, C. C. "Thermomechanical Modeling and Testing of Scan Weldments." Journal of the Mechanical Behavior of Materials 6, no. 1 (December 1995): 1–10. http://dx.doi.org/10.1515/jmbm.1995.6.1.1.
Повний текст джерелаZhong, Fei, Wei Zhang, Biao Qiang Jiao, and Yue Xian Zhong. "Survey of Materials Testing Using Ultrasonic." Advanced Materials Research 146-147 (October 2010): 412–16. http://dx.doi.org/10.4028/www.scientific.net/amr.146-147.412.
Повний текст джерелаMa, Hong Wei, Ming Dong, Yuan Chen, and Qing Hua Mao. "Development of Ultrasonic Automatic Testing System for Flaws of Rotary Parts." Applied Mechanics and Materials 128-129 (October 2011): 575–79. http://dx.doi.org/10.4028/www.scientific.net/amm.128-129.575.
Повний текст джерелаChoi, Yoon-Hwa, and Edward Jung. "Configuring a boundary scan chain for optimal testing of non-scan logic clusters." International Journal of Electronics 87, no. 3 (March 2000): 281–91. http://dx.doi.org/10.1080/002072100132183.
Повний текст джерелаGong, Yin Shui, and Hui Yun Li. "FPGA Based Testing Method to Improve Digital IC Testability." Applied Mechanics and Materials 130-134 (October 2011): 3920–23. http://dx.doi.org/10.4028/www.scientific.net/amm.130-134.3920.
Повний текст джерелаKim, Jung-Tae, In-Soo Kim, Keon-Ho Lee, Yong-Hyun Kim, Chul-Ki Baek, Kyu-Taek Lee, and Hyoung-Bok Min. "A Novel High Performance Scan Architecture with Dmuxed Scan Flip-Flop (DSF) for Low Shift Power Scan Testing." Journal of Electrical Engineering and Technology 4, no. 4 (December 1, 2009): 559–65. http://dx.doi.org/10.5370/jeet.2009.4.4.559.
Повний текст джерелаRahman, Md Siddiqur, Yoshitaka Nagai, H. Akiko Popiel, Muzahed Uddin Ahmed, Md Jalal Uddin, and Talsushi Toda. "Genetic testing for Spinocerebellar Ataxias (SCA) in Parkinsonism." Bangladesh Journal of Neuroscience 28, no. 1 (November 30, 2013): 16–23. http://dx.doi.org/10.3329/bjn.v28i1.17188.
Повний текст джерелаP, Reshma, and M. Geetha Priya. "Power Management During Scan Based Sequential Circuit Testing." Advanced Computing: An International Journal 2, no. 3 (May 31, 2011): 9–20. http://dx.doi.org/10.5121/acij.2011.2302.
Повний текст джерелаKishinevsky, M., A. Kondratyev, L. Lavagno, A. Saldanha, and A. Taubin. "Partial-scan delay fault testing of asynchronous circuits." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 17, no. 11 (1998): 1184–99. http://dx.doi.org/10.1109/43.736191.
Повний текст джерелаDettmer, Roger. "JTAG—setting the standard for boundary-scan testing." IEE Review 35, no. 2 (1989): 49. http://dx.doi.org/10.1049/ir:19890023.
Повний текст джерелаHaga, Susanne B., and Ariel Kantor. "Horizon Scan Of Clinical Laboratories Offering Pharmacogenetic Testing." Health Affairs 37, no. 5 (May 2018): 717–23. http://dx.doi.org/10.1377/hlthaff.2017.1564.
Повний текст джерелаVinoski, S. "RISE++: a symbolic environment for scan-based testing." IEEE Design & Test of Computers 10, no. 2 (June 1993): 46–54. http://dx.doi.org/10.1109/54.211528.
Повний текст джерелаHosseinabady, Mohammad, Shervin Sharifi, Fabrizio Lombardi, and Zainalabedin Navabi. "A Selective Trigger Scan Architecture for VLSI Testing." IEEE Transactions on Computers 57, no. 3 (2008): 316–28. http://dx.doi.org/10.1109/tc.2007.70806.
Повний текст джерелаBareisa, Eduardas, Vacius Jusas, Kestutis Motiejunas, and Rimantas Seinauskas. "Delay fault testing using partial multiple scan chains." Microelectronics Reliability 53, no. 12 (December 2013): 2070–77. http://dx.doi.org/10.1016/j.microrel.2013.07.002.
Повний текст джерелаMiles, J. R. "Testing terminated printed circuit interconnections using boundary scan." Electronics Letters 29, no. 3 (1993): 294. http://dx.doi.org/10.1049/el:19930201.
Повний текст джерелаYau, Chi W., James Beausang, F. Edward Crane, Najml T. Jarwala, and Rodham E. Tulloss. "Boundary-Scan Testing for Electronic Subassemblies and Systems." AT&T Technical Journal 73, no. 2 (March 4, 1994): 40–48. http://dx.doi.org/10.1002/j.1538-7305.1994.tb00577.x.
Повний текст джерелаDong Xiang, Dianwei Hu, Qiang Xu, and A. Orailoglu. "Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28, no. 7 (July 2009): 1101–5. http://dx.doi.org/10.1109/tcad.2009.2018775.
Повний текст джерелаXiang, Dong, Kaiwei Li, Hideo Fujiwara, Krishnaiyan Thulasiraman, and Jiaguang Sun. "Constraining Transition Propagation for Low-Power Scan Testing Using a Two-Stage Scan Architecture." IEEE Transactions on Circuits and Systems II: Express Briefs 54, no. 5 (May 2007): 450–54. http://dx.doi.org/10.1109/tcsii.2007.892393.
Повний текст джерелаFreiling, Isabelle, and Lisa Weidmuller. "Scan method tracks reader attention, engagement." Newspaper Research Journal 38, no. 4 (November 14, 2017): 449–61. http://dx.doi.org/10.1177/0739532917739874.
Повний текст джерелаLee, Sangjun, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, and Sungho Kang. "Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks." Sensors 21, no. 18 (September 12, 2021): 6111. http://dx.doi.org/10.3390/s21186111.
Повний текст джерелаWu, Wei, Ling Yun Zhu, and Guang Feng Wu. "Bond Interface Evaluation by Ultrasonic Testing and SEM for Radial Friction Welding Joints of Copper and Steel." Advanced Materials Research 328-330 (September 2011): 1457–61. http://dx.doi.org/10.4028/www.scientific.net/amr.328-330.1457.
Повний текст джерелаZheng, Xiang Ming, Jie Hu, and Yao Sheng Chen. "The Development of an Automatic Ultrasonic Non-Destructive Testing System." Applied Mechanics and Materials 599-601 (August 2014): 1120–23. http://dx.doi.org/10.4028/www.scientific.net/amm.599-601.1120.
Повний текст джерелаGooch, Robert, Lisa Bryski, and Ewa Courvoisier-Grzywacz. "Surviving a stressful MIBI scan." CJEM 15, no. 06 (November 2013): 392–96. http://dx.doi.org/10.2310/8000.2013.130997.
Повний текст джерелаDu, Min Jie, Jin Yan Ai, Li Min Liu, and Sai Zhu. "Summarization on the Techniques of Testing Electronical System." Advanced Materials Research 433-440 (January 2012): 6437–40. http://dx.doi.org/10.4028/www.scientific.net/amr.433-440.6437.
Повний текст джерелаSundar, Dr M. Shyam. "Area Efficient Thermal Aware Testing Using Scan Chain Architecture." International Journal for Research in Applied Science and Engineering Technology V, no. XI (November 23, 2017): 1842–49. http://dx.doi.org/10.22214/ijraset.2017.11266.
Повний текст джерелаBen Ahmed, Asma, Olfa Mosbahi, Mohamed Khalgui, and Zhiwu Li. "Boundary Scan Extension for Testing Distributed Reconfigurable Hardware Systems." IEEE Transactions on Circuits and Systems I: Regular Papers 66, no. 7 (July 2019): 2699–708. http://dx.doi.org/10.1109/tcsi.2019.2894441.
Повний текст джерелаLee, Kuen-Jong, Tian-Pao Lee, Rong-Chang Wen, and Zhe-Yi Lin. "Analogue boundary scan architecture for DC and AC testing." Electronics Letters 32, no. 8 (1996): 704. http://dx.doi.org/10.1049/el:19960501.
Повний текст джерелаBassett, R. W., M. E. Turner, J. H. Panner, P. S. Gillis, S. F. Oakland, and D. W. Stout. "Boundary-scan design principles for efficient LSSD ASIC testing." IBM Journal of Research and Development 34, no. 2.3 (March 1990): 339–54. http://dx.doi.org/10.1147/rd.342.0339.
Повний текст джерелаBleeker, Harry. "An economic, hands-on start to boundary-scan testing." Microprocessors and Microsystems 17, no. 5 (June 1993): 299–303. http://dx.doi.org/10.1016/0141-9331(93)90007-t.
Повний текст джерелаLin, Wei, and Wenlong Shi. "A new circuit for at-speed scan SoC testing." Journal of Semiconductors 34, no. 12 (December 2013): 125012. http://dx.doi.org/10.1088/1674-4926/34/12/125012.
Повний текст джерелаXu, Zhen Ying, Shu Yuan Gao, Jun Huang, and Yun Wang. "Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy." Advanced Materials Research 764 (September 2013): 9–13. http://dx.doi.org/10.4028/www.scientific.net/amr.764.9.
Повний текст джерелаLopes-Cendes, Iscia, Carlos E. Steiner, Isabel Silveira, Walter Pinto-Junior, Jayme A. Maciel, and Guy A. Rouleau. "Clinical and molecular characteristics of a Brazilian family with spinocerebellar ataxia type 1." Arquivos de Neuro-Psiquiatria 54, no. 3 (September 1996): 412–18. http://dx.doi.org/10.1590/s0004-282x1996000300009.
Повний текст джерелаKim, Jeong Guk, Jong Duk Chung, Joon Hyun Lee, Yeon Uk Jeong, Yong Ki Hong, Won Kyung Kim, Jang Sik Pyun, and Dae Sung Bae. "Damage Characterization of Ceramic Matrix Composites (CMCs) during Tensile Testing." Key Engineering Materials 297-300 (November 2005): 2533–38. http://dx.doi.org/10.4028/www.scientific.net/kem.297-300.2533.
Повний текст джерелаKrstulović-Opara, Lovre, Petra Bagavac, Antun Božanić, and Željko Domazet. "NDT of Composites Based on Active Infrared Thermography and Ultrasound Testing." Journal of Energy - Energija 70, no. 2 (June 30, 2021): 3–6. http://dx.doi.org/10.37798/202170210.
Повний текст джерелаStanbridge, A. B., D. J. Ewins, and A. Z. Khan. "Modal Testing Using Impact Excitation and a Scanning LDV." Shock and Vibration 7, no. 2 (2000): 91–100. http://dx.doi.org/10.1155/2000/527389.
Повний текст джерелаYamato, Yuta, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, and Michael A. Kochte. "LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing." IEEE Design & Test 30, no. 4 (August 2013): 60–70. http://dx.doi.org/10.1109/mdt.2012.2221152.
Повний текст джерелаMoro, Adriana, Renato Puppi Munhoz, Walter Oleschko Arruda, Salmo Raskin, and Hélio Afonso Ghizoni Teive. "Clinical relevance of "bulging eyes" for the differential diagnosis of spinocerebellar ataxias." Arquivos de Neuro-Psiquiatria 71, no. 7 (July 2013): 428–30. http://dx.doi.org/10.1590/0004-282x20130056.
Повний текст джерелаPrasad N, Nagendra, and Dr Kiran V. "I2C Master Scan Chain Insertion and Functional Coverage." International Journal of Research and Review 9, no. 11 (November 3, 2022): 54–59. http://dx.doi.org/10.52403/ijrr.20221108.
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