Статті в журналах з теми "Reference-free X-ray fluorescence"
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Ознайомтеся з топ-28 статей у журналах для дослідження на тему "Reference-free X-ray fluorescence".
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Wählisch, André, Cornelia Streeck, Philipp Hönicke, and Burkhard Beckhoff. "Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films." Journal of Analytical Atomic Spectrometry 35, no. 8 (2020): 1664–70. http://dx.doi.org/10.1039/d0ja00171f.
Повний текст джерелаBeckhoff, B., M. Kolbe, O. Hahn, A. G. Karydas, Ch Zarkadas, D. Sokaras, and M. Mantler. "Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic." X-Ray Spectrometry 37, no. 4 (July 2008): 462–65. http://dx.doi.org/10.1002/xrs.1073.
Повний текст джерелаUnterumsberger, Rainer, Philipp Hönicke, Yves Kayser, Beatrix Pollakowski-Herrmann, Saeed Gholhaki, Quanmin Guo, Richard E. Palmer, and Burkhard Beckhoff. "Interaction of nanoparticle properties and X-ray analytical techniques." Journal of Analytical Atomic Spectrometry 35, no. 5 (2020): 1022–33. http://dx.doi.org/10.1039/d0ja00049c.
Повний текст джерелаUnterumsberger, Rainer, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben, Matthias Müller, and Burkhard Beckhoff. "Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters." Journal of Analytical Atomic Spectrometry 33, no. 6 (2018): 1003–13. http://dx.doi.org/10.1039/c8ja00046h.
Повний текст джерелаSoltwisch, Victor, Philipp Hönicke, Yves Kayser, Janis Eilbracht, Jürgen Probst, Frank Scholze, and Burkhard Beckhoff. "Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence." Nanoscale 10, no. 13 (2018): 6177–85. http://dx.doi.org/10.1039/c8nr00328a.
Повний текст джерелаCara, Eleonora, Luisa Mandrile, Alessio Sacco, Andrea M. Giovannozzi, Andrea M. Rossi, Federica Celegato, Natascia De Leo, et al. "Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy." Journal of Materials Chemistry C 8, no. 46 (2020): 16513–19. http://dx.doi.org/10.1039/d0tc04364h.
Повний текст джерелаKolbe, Michael, Burkhard Beckhoff, Michael Krumrey, and Gerhard Ulm. "Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range." Applied Surface Science 252, no. 1 (September 2005): 49–52. http://dx.doi.org/10.1016/j.apsusc.2005.01.112.
Повний текст джерелаBeckhoff, Burkhard, Rolf Fliegauf, Michael Kolbe, Matthias Müller, Jan Weser, and Gerhard Ulm. "Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation." Analytical Chemistry 79, no. 20 (October 2007): 7873–82. http://dx.doi.org/10.1021/ac071236p.
Повний текст джерелаReinhardt, Falk, János Osán, Szabina Török, Andrea Edit Pap, Michael Kolbe, and Burkhard Beckhoff. "Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis." J. Anal. At. Spectrom. 27, no. 2 (2012): 248–55. http://dx.doi.org/10.1039/c2ja10286b.
Повний текст джерелаKolbe, M., B. Beckhoff, M. Krumrey, and G. Ulm. "F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry." Powder Diffraction 20, no. 2 (June 2005): 174. http://dx.doi.org/10.1154/1.1979030.
Повний текст джерелаKolbe, Michael, Burkhard Beckhoff, Michael Krumrey, Michael A. Reading, Jaap Van den Berg, Thierry Conard, and Stefan De Gendt. "Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation." ECS Transactions 25, no. 3 (December 17, 2019): 293–300. http://dx.doi.org/10.1149/1.3204419.
Повний текст джерелаKolbe, Michael, Burkhard Beckhoff, Michael Krumrey, and Gerhard Ulm. "Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry." Spectrochimica Acta Part B: Atomic Spectroscopy 60, no. 4 (April 2005): 505–10. http://dx.doi.org/10.1016/j.sab.2005.03.018.
Повний текст джерелаNoro, Junji, Takashi Korenaga, Masaru Kozaki, Satoshi Kawada, Kazuhiko Kurusu, Manabu Mizuhira, Akihiro Ono, et al. "Development of Lead-Free Solder Alloy Certified Reference Materials (JSAC 0131-0134) for X-Ray Fluorescence Analysis." BUNSEKI KAGAKU 59, no. 2 (2010): 107–16. http://dx.doi.org/10.2116/bunsekikagaku.59.107.
Повний текст джерелаHönicke, Philipp, Ina Holfelder, Michael Kolbe, Janin Lubeck, Beatrix Pollakowski-Herrmann, Rainer Unterumsberger, Jan Weser, and Burkhard Beckhoff. "Determination of SiO2and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis." Metrologia 54, no. 4 (June 28, 2017): 481–86. http://dx.doi.org/10.1088/1681-7575/aa765f.
Повний текст джерелаHönicke, Philipp, Blanka Detlefs, Matthias Müller, Erik Darlatt, Emmanuel Nolot, Helen Grampeix, and Burkhard Beckhoff. "Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis." physica status solidi (a) 212, no. 3 (February 4, 2015): 523–28. http://dx.doi.org/10.1002/pssa.201400204.
Повний текст джерелаStreeck, C., B. Beckhoff, F. Reinhardt, M. Kolbe, B. Kanngießer, C. A. Kaufmann, and H. W. Schock. "Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 268, no. 3-4 (February 2010): 277–81. http://dx.doi.org/10.1016/j.nimb.2009.09.051.
Повний текст джерелаLopez-Astacio, Hiram J., Lisandro Cunci, and Christopher Pollock. "Development and Improvement of an Electrochemical Cell for X-Ray Fluorescence and Absorption Spectroscopy." ECS Meeting Abstracts MA2022-02, no. 60 (October 9, 2022): 2472. http://dx.doi.org/10.1149/ma2022-02602472mtgabs.
Повний текст джерелаHönicke, Philipp, Blanka Detlefs, Emmanuel Nolot, Yves Kayser, Uwe Mühle, Beatrix Pollakowski, and Burkhard Beckhoff. "Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization." Journal of Vacuum Science & Technology A 37, no. 4 (July 2019): 041502. http://dx.doi.org/10.1116/1.5094891.
Повний текст джерелаWendeln, Christian, Edith Steinhäuser, Lutz Stamp, Bexy Dosse-Gomez, Elisa Langhammer, Sebastian Reiber, Sebastian Dünnebeil, and Sandra Röseler. "Novel formaldehyde-free electroless copper for plating on next-generation substrates." International Symposium on Microelectronics 2018, no. 1 (October 1, 2018): 000628–33. http://dx.doi.org/10.4071/2380-4505-2018.1.000628.
Повний текст джерелаDemirsar Arli, Belgin, Gulsu Simsek Franci, Sennur Kaya, Hakan Arli, and Philippe Colomban. "Portable X-ray Fluorescence (p-XRF) Uncertainty Estimation for Glazed Ceramic Analysis: Case of Iznik Tiles." Heritage 3, no. 4 (November 10, 2020): 1302–29. http://dx.doi.org/10.3390/heritage3040072.
Повний текст джерелаAffoué Delphine KOUASSI, Fatou Diane Micheline BAGUIA-BROUNE, Kohué Christelle Chantal N’GAMAN-KOUASSI, Janat Akhanovna MAMYRBEKOVA-BEKRO, and Yves-Alain BEKRO. "Mineral and phenolic compositions, antioxidant activity and GC-MS analysis of the leaves of Anchomanes difformis (Blume) Engl. from Côte d’Ivoire." GSC Advanced Research and Reviews 10, no. 1 (January 30, 2022): 145–55. http://dx.doi.org/10.30574/gscarr.2022.10.1.0035.
Повний текст джерелаSomlyo, A. P. "Where Art Thou, Calcium?" Microscopy and Microanalysis 3, S2 (August 1997): 913–14. http://dx.doi.org/10.1017/s1431927600011454.
Повний текст джерелаSichov, Mikhail, Kostiantyn Boriak, and Leonid Kolomiets. "Technology for obtaining high-pure magnesium compounds using the hydrolytic processes of sedimentation." Eastern-European Journal of Enterprise Technologies 1, no. 6(115) (February 28, 2022): 43–52. http://dx.doi.org/10.15587/1729-4061.2022.253544.
Повний текст джерелаMénesguen, Yves, and Marie-Christine Lépy. "Reference‐Free Combined X‐Ray Reflectometry−Grazing Incidence X‐Ray Fluorescence at the French Synchrotron SOLEIL." physica status solidi (a), August 8, 2021, 2100423. http://dx.doi.org/10.1002/pssa.202100423.
Повний текст джерела"Nanolayer Characterisation by Reference-free X-ray Fluorescence Analysis with Synchrotron Radiation." ECS Meeting Abstracts, 2009. http://dx.doi.org/10.1149/ma2009-02/22/1975.
Повний текст джерелаZech, Claudia, Marco Evertz, Markus Börner, Yves Kayser, Philipp Hönicke, Martin Winter, Sascha Nowak, and Burkhard Beckhoff. "Quantitative manganese dissolution investigation in lithium-ion batteries by means of X-ray spectrometry techniques." Journal of Analytical Atomic Spectrometry, 2021. http://dx.doi.org/10.1039/d0ja00491j.
Повний текст джерелаTack, Pieter, Ella De Pauw, Beverley Tkalcec, Miles Lindner, Benjamin Bazi, Bart Vekemans, Frank Brenker, et al. "Rare earth element identification and quantification in millimetre-sized Ryugu rock fragments from the Hayabusa2 space mission." Earth, Planets and Space 74, no. 1 (September 28, 2022). http://dx.doi.org/10.1186/s40623-022-01705-3.
Повний текст джерелаJones, Cerys, Nathan S. Daly, Catherine Higgitt, and Miguel R. D. Rodrigues. "Neural network-based classification of X-ray fluorescence spectra of artists’ pigments: an approach leveraging a synthetic dataset created using the fundamental parameters method." Heritage Science 10, no. 1 (June 13, 2022). http://dx.doi.org/10.1186/s40494-022-00716-3.
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