Статті в журналах з теми "Piezo Force Microscopy"
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Xiao, Bailong. "Levering Mechanically Activated Piezo Channels for Potential Pharmacological Intervention." Annual Review of Pharmacology and Toxicology 60, no. 1 (January 6, 2020): 195–218. http://dx.doi.org/10.1146/annurev-pharmtox-010919-023703.
Повний текст джерелаMoreland, John. "Tunneling stabilized magnetic-force microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1034–35. http://dx.doi.org/10.1017/s0424820100151003.
Повний текст джерелаFried, G., K. Balss, and P. W. Bohn. "Imaging Electrochemical Controlled Chemical Gradients Using Pulsed Force Mode Atomic Force Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 726–27. http://dx.doi.org/10.1017/s1431927600036126.
Повний текст джерелаWei, Yaocheng, Xuejun Zheng, Liang Chu, and Hui Dong. "Piezo-Phototronic Enhancement of Vertical Structure Photodetectors Based on 2D CsPbBr3 Nanosheets." Journal of Nanoelectronics and Optoelectronics 17, no. 5 (May 1, 2022): 769–74. http://dx.doi.org/10.1166/jno.2022.3250.
Повний текст джерелаGraça, Sergio, Rogerio Colaço, and Rui Vilar. "Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials." Materials Science Forum 514-516 (May 2006): 1598–602. http://dx.doi.org/10.4028/www.scientific.net/msf.514-516.1598.
Повний текст джерелаMiller, Nathaniel C., Haley M. Grimm, W. Seth Horne, and Geoffrey R. Hutchison. "Accurate electromechanical characterization of soft molecular monolayers using piezo force microscopy." Nanoscale Advances 1, no. 12 (2019): 4834–43. http://dx.doi.org/10.1039/c9na00638a.
Повний текст джерелаCalahorra, Yonatan, Michael Smith, Anuja Datta, Hadas Benisty, and Sohini Kar-Narayan. "Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique." Nanoscale 9, no. 48 (2017): 19290–97. http://dx.doi.org/10.1039/c7nr06714c.
Повний текст джерелаSasaki, Michiko, and Masahiro Goto. "Piezoelectric effect of crystal nanodomains on the friction force." Journal of Vacuum Science & Technology B 40, no. 5 (September 2022): 052803. http://dx.doi.org/10.1116/6.0001881.
Повний текст джерелаZhang, Guitao, Xi Chen, Weihe Xu, Wei-Dong Yao, and Yong Shi. "Piezoelectric property of PZT nanofibers characterized by resonant piezo-force microscopy." AIP Advances 12, no. 3 (March 1, 2022): 035203. http://dx.doi.org/10.1063/5.0081109.
Повний текст джерелаMangamma, G., B. Ramachandran, T. N. Sairam, M. S. R. Rao, S. Dash, and A. K. Tyagi. "Imaging of Nanometric Ferroelectric Domains in BaTiO3 Using Atomic Force Acoustic Microscopy and Piezo Force Microscopy." Journal of Advanced Microscopy Research 6, no. 1 (February 1, 2011): 29–34. http://dx.doi.org/10.1166/jamr.2011.1056.
Повний текст джерелаFranck, Christian, Guruswami Ravichandran, and Kaushik Bhattacharya. "Characterization of domain walls in BaTiO3 using simultaneous atomic force and piezo response force microscopy." Applied Physics Letters 88, no. 10 (March 6, 2006): 102907. http://dx.doi.org/10.1063/1.2185640.
Повний текст джерелаCalahorra, Yonatan, Xin Guan, Nripendra N. Halder, Michael Smith, Shimon Cohen, Dan Ritter, Jose Penuelas, and Sohini Kar-Narayan. "Exploring piezoelectric properties of III–V nanowires using piezo-response force microscopy." Semiconductor Science and Technology 32, no. 7 (June 30, 2017): 074006. http://dx.doi.org/10.1088/1361-6641/aa6c85.
Повний текст джерелаHuey, B. D., R. Nath, R. E. Garcia, and J. E. Blendell. "Challenges and Results for Quantitative Piezoelectric Hysteresis Measurements by Piezo Force Microscopy." Microscopy and Microanalysis 11, S03 (December 2005): 6–9. http://dx.doi.org/10.1017/s1431927605050762.
Повний текст джерелаHuey, Bryan D., Chandra Ramanujan, Musuvathi Bobji, John Blendell, Grady White, Robert Szoszkiewicz, and Andrzej Kulik. "The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy." Journal of Electroceramics 13, no. 1-3 (July 2004): 287–91. http://dx.doi.org/10.1007/s10832-004-5114-y.
Повний текст джерелаKiracofe, Daniel, and Arvind Raman. "Quantitative force and dissipation measurements in liquids using piezo-excited atomic force microscopy: a unifying theory." Nanotechnology 22, no. 48 (November 9, 2011): 485502. http://dx.doi.org/10.1088/0957-4484/22/48/485502.
Повний текст джерелаXu, Xin, Marisol Koslowski, and Arvind Raman. "Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy – magnetic vs. dither piezo excitation." Journal of Applied Physics 111, no. 5 (March 2012): 054303. http://dx.doi.org/10.1063/1.3689815.
Повний текст джерелаRoy, S. K., and W. K. Hiebert. "Effect of Bulk Acoustic Wave in Piezo Driven Nanomechanical Motion." Journal of Scientific Research 14, no. 1 (January 1, 2022): 269–80. http://dx.doi.org/10.3329/jsr.v14i1.56046.
Повний текст джерелаSatoh, Nobuo, Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, and Hirofumi Yamada. "Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes." e-Journal of Surface Science and Nanotechnology 11 (2013): 13–17. http://dx.doi.org/10.1380/ejssnt.2013.13.
Повний текст джерелаTsuji, Toshihiro, Hisato Ogiso, Jun Akedo, Shigeru Saito, Kenji Fukuda, and Kazushi Yamanaka. "Evaluation of Domain Boundary of Piezo/Ferroelectric Material by Ultrasonic Atomic Force Microscopy." Japanese Journal of Applied Physics 43, no. 5B (May 28, 2004): 2907–13. http://dx.doi.org/10.1143/jjap.43.2907.
Повний текст джерелаMcGilly, L., D. Byrne, C. Harnagea, A. Schilling, and J. M. Gregg. "Imaging domains in BaTiO3 single crystal nanostructures: comparing information from transmission electron microscopy and piezo-force microscopy." Journal of Materials Science 44, no. 19 (October 2009): 5197–204. http://dx.doi.org/10.1007/s10853-009-3626-1.
Повний текст джерелаYin, Bo Hua, Dai Xie Chen, Yun Sheng Lin, Ying Ying Gao, Han Li, and Dong Han. "Large Scanning Range and Rapid AFM for Biological Cell Topography Imaging." Key Engineering Materials 562-565 (July 2013): 697–700. http://dx.doi.org/10.4028/www.scientific.net/kem.562-565.697.
Повний текст джерелаKizuka, Tokushi. "Atomistic Visualization of Mechanical Interaction in Gold Crystalline Boundaries by Time-Resolved High Resolution Transmission Electron Microscopy." Surface Review and Letters 05, no. 03n04 (June 1998): 739–45. http://dx.doi.org/10.1142/s0218625x98001110.
Повний текст джерелаRafiq, Muhammad Asif, Maria Elisabete Costa, Paula Maria Vilarinho, and Ian M. Reaney. "Ferroelectric Domain Studies of KNN Single Crystals by Piezo-force and Transmission Electron Microscopy." Microscopy and Microanalysis 18, S5 (August 2012): 113–14. http://dx.doi.org/10.1017/s1431927612013220.
Повний текст джерелаRavi Sankar, M. S., K. Pramod, and Ramesh Babu Gangineni. "Local ferroelectric studies on interconnected PVDF nano-dot thin films using piezo force microscopy." Journal of Materials Science: Materials in Electronics 30, no. 23 (November 13, 2019): 20716–24. http://dx.doi.org/10.1007/s10854-019-02464-w.
Повний текст джерелаLiu, Xiaochen, Lihao Wang, Yinfang Zhu, Junyuan Zhao, Jinying Zhang, Jinling Yang, and Fuhua Yang. "A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing." Journal of Micromechanics and Microengineering 28, no. 11 (August 29, 2018): 115003. http://dx.doi.org/10.1088/1361-6439/aad927.
Повний текст джерелаNebalueva, Anna S., Alexandra A. Timralieva, Roman V. Sadovnichii, Alexander S. Novikov, Mikhail V. Zhukov, Aleksandr S. Aglikov, Anton A. Muravev, et al. "Piezo-Responsive Hydrogen-Bonded Frameworks Based on Vanillin-Barbiturate Conjugates." Molecules 27, no. 17 (September 2, 2022): 5659. http://dx.doi.org/10.3390/molecules27175659.
Повний текст джерелаIvanov M. S., Buryakov A. M., and Silibin M. V. "Investigation of Local Piezo- and Ferroelectric Properties in a Single-Ion Zn/Dy Molecular Complex." Technical Physics Letters 48, no. 10 (2022): 58. http://dx.doi.org/10.21883/tpl.2022.10.54801.19247.
Повний текст джерелаSchwenzfeier, Kai A., and Markus Valtiner. "Design and testing of drift free force probe experiments with absolute distance control." Review of Scientific Instruments 93, no. 7 (July 1, 2022): 073705. http://dx.doi.org/10.1063/5.0083834.
Повний текст джерелаPariy, Igor O., Anna A. Ivanova, Vladimir V. Shvartsman, Doru C. Lupascu, Gleb B. Sukhorukov, Tim Ludwig, Ausrine Bartasyte, Sanjay Mathur, Maria A. Surmeneva, and Roman A. Surmenev. "Piezoelectric Response in Hybrid Micropillar Arrays of Poly(Vinylidene Fluoride) and Reduced Graphene Oxide." Polymers 11, no. 6 (June 20, 2019): 1065. http://dx.doi.org/10.3390/polym11061065.
Повний текст джерелаRuss, J. C., and P. J. Scott. "Quantitative Scanned Probe Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 874–75. http://dx.doi.org/10.1017/s042482010016683x.
Повний текст джерелаKofahl, Claudia, Friedrich Güthoff, and Götz Eckold. "Topological defects driving the growth of nanoscaled ferroelectric domains observed by piezo response force microscopy." Ferroelectrics 584, no. 1 (November 18, 2021): 1–11. http://dx.doi.org/10.1080/00150193.2021.1984767.
Повний текст джерелаRajeev, Sreenidhi Prabha, S. Sabarinath, CK Subash, Uvais Valiyaneerilakkal, Pattiyil Parameswaran та Soney Varghese. "α- & β-crystalline phases in polyvinylidene fluoride as tribo-piezo active layer for nanoenergy harvester". High Performance Polymers 31, № 7 (28 серпня 2018): 785–99. http://dx.doi.org/10.1177/0954008318796141.
Повний текст джерелаShakya, Jyoti, Gayathri H N, and Arindam Ghosh. "Defects-assisted piezoelectric response in liquid exfoliated MoS2 nanosheets." Nanotechnology 33, no. 7 (November 26, 2021): 075710. http://dx.doi.org/10.1088/1361-6528/ac368b.
Повний текст джерелаSerrado-Nunes, Jivago, Vitor Sencadas, Ai Ying Wu, Paula M. Vilarinho та Senentxu Lanceros-Méndez. "Electrical and Microstructural Changes of β-PVDF under Uniaxial Stress Studied by Scanning Force Microscopy". Materials Science Forum 514-516 (травень 2006): 915–19. http://dx.doi.org/10.4028/www.scientific.net/msf.514-516.915.
Повний текст джерелаLeitner, Michael, Hannah Seferovic, Sarah Stainer, Boris Buchroithner, Christian H. Schwalb, Alexander Deutschinger, and Andreas Ebner. "Atomic Force Microscopy Imaging in Turbid Liquids: A Promising Tool in Nanomedicine." Sensors 20, no. 13 (July 2, 2020): 3715. http://dx.doi.org/10.3390/s20133715.
Повний текст джерелаLab, Max J., Anamika Bhargava, Peter T. Wright, and Julia Gorelik. "The scanning ion conductance microscope for cellular physiology." American Journal of Physiology-Heart and Circulatory Physiology 304, no. 1 (January 1, 2013): H1—H11. http://dx.doi.org/10.1152/ajpheart.00499.2012.
Повний текст джерелаBaykara, Mehmet Z., Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman, and Udo D. Schwarz. "Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction." Beilstein Journal of Nanotechnology 3 (September 11, 2012): 637–50. http://dx.doi.org/10.3762/bjnano.3.73.
Повний текст джерелаHang, Qi Ming, Xin Hua Zhu, Zhen Jie Tang, Ye Song, and Zhi Guo Liu. "Self-Assembled Perovskite Epitaxial Multiferroic BiFeO3 Nanoislands." Advanced Materials Research 197-198 (February 2011): 1325–31. http://dx.doi.org/10.4028/www.scientific.net/amr.197-198.1325.
Повний текст джерелаKofahl, Claudia, Friedrich Güthoff, and Götz Eckold. "Direct observation of polar nanodomains in the incommensurate phase of (K0.96Rb0.04)2ZnCl4 crystals using piezo force microscopy." Ferroelectrics 540, no. 1 (February 17, 2019): 10–17. http://dx.doi.org/10.1080/00150193.2019.1611115.
Повний текст джерелаHerrera-Perez, G., O. Solis-Canto, J. Holguin-Momaca, S. Olive-Mendez, E. Guerrero-Lestarjette, G. Tapia-Padilla, A. Reyes-Rojas, and L. E. Fuentes-Cobas. "Microstructure Patterns by Switching Spectroscopy Piezo-response Force Microscopy of Lead Free Perovskite-type Polycrystalline Thin Films." Microscopy and Microanalysis 23, S1 (July 2017): 1648–49. http://dx.doi.org/10.1017/s143192761700890x.
Повний текст джерелаUrdinola, Kaory Barrientos, Paula Andrea Marín Muñoz, Pedronel Araque Marín, and Marisol Jaramillo Grajales. "In-Silico Prediction on the MSAMS-Assisted Immobilization of Bovine Serum Albumin on 10MHz Piezoelectric Immunosensors." Journal of Molecular and Engineering Materials 07, no. 01n02 (March 2019): 1950001. http://dx.doi.org/10.1142/s2251237319500011.
Повний текст джерелаAbas, Asim, Tao Geng, Wenjie Meng, Jihao Wang, Qiyuan Feng, Jing Zhang, Ze Wang, Yubin Hou, and Qingyou Lu. "Compact Magnetic Force Microscope (MFM) System in a 12 T Cryogen-Free Superconducting Magnet." Micromachines 13, no. 11 (November 7, 2022): 1922. http://dx.doi.org/10.3390/mi13111922.
Повний текст джерелаTiron, Vasile, Roxana Jijie, Teodora Matei, Ioana-Laura Velicu, Silviu Gurlui, and Georgiana Bulai. "Piezo-Enhanced Photocatalytic Performance of Bismuth Ferrite-Based Thin Film for Organic Pollutants Degradation." Coatings 13, no. 8 (August 12, 2023): 1416. http://dx.doi.org/10.3390/coatings13081416.
Повний текст джерелаPellegrino, Paolo, Alessandro Paolo Bramanti, Isabella Farella, Mariafrancesca Cascione, Valeria De Matteis, Antonio Della Torre, Fabio Quaranta, and Rosaria Rinaldi. "Pulse-Atomic Force Lithography: A Powerful Nanofabrication Technique to Fabricate Constant and Varying-Depth Nanostructures." Nanomaterials 12, no. 6 (March 17, 2022): 991. http://dx.doi.org/10.3390/nano12060991.
Повний текст джерелаXia, Fangzhou, Chen Yang, Yi Wang, Kamal Youcef-Toumi, Christoph Reuter, Tzvetan Ivanov, Mathias Holz, and Ivo W. Rangelow. "Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes." Nanomaterials 9, no. 7 (July 14, 2019): 1013. http://dx.doi.org/10.3390/nano9071013.
Повний текст джерелаWeng, Yuanqi, Fei Yan, Runkang Chen, Ming Qian, Yun Ou, Shuhong Xie, Hairong Zheng, and Jiangyu Li. "PIEZO channel protein naturally expressed in human breast cancer cell MDA-MB-231 as probed by atomic force microscopy." AIP Advances 8, no. 5 (May 2018): 055101. http://dx.doi.org/10.1063/1.5025036.
Повний текст джерелаDorozhkin, P., E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov. "AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications." Microscopy Today 18, no. 6 (November 2010): 28–32. http://dx.doi.org/10.1017/s1551929510000982.
Повний текст джерелаKim, Uk Su, Seung-Yub Baek, Tae-Wan Kim, and Jeong Woo Park. "Cold Tribo-Nanolithography on Metallic Thin-Film Surfaces." Journal of Nanoscience and Nanotechnology 20, no. 7 (July 1, 2020): 4318–21. http://dx.doi.org/10.1166/jnn.2020.17558.
Повний текст джерелаLuiten, Willemijn M., Verena M. van der Werf, Noureen Raza, and Rebecca Saive. "Investigation of the dynamic properties of on-chip coupled piezo/photodiodes by time-resolved atomic force and Kelvin probe microscopy." AIP Advances 10, no. 10 (October 1, 2020): 105121. http://dx.doi.org/10.1063/5.0028481.
Повний текст джерелаStiubianu, George-Theodor, Adrian Bele, Alexandra Bargan, Violeta Otilia Potolinca, Mihai Asandulesa, Codrin Tugui, Vasile Tiron, Corneliu Hamciuc, Mihaela Dascalu, and Maria Cazacu. "All-Polymer Piezo-Composites for Scalable Energy Harvesting and Sensing Devices." Molecules 27, no. 23 (December 3, 2022): 8524. http://dx.doi.org/10.3390/molecules27238524.
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