Готові списки джерел за темами / Optoelectronic measuring system

Добірка наукової літератури з теми "Optoelectronic measuring system"

Автор: Grafiati

Опубліковано: 30 травня 2022

Оновлено: 31 травня 2022

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Статті в журналах з теми "Optoelectronic measuring system"

Liu, Ji, Donge Zhao, Yangjun Li, and Hanchang Zhou. "Optoelectronic System for Measuring Warhead Fragments Velocity." Journal of Physics: Conference Series 276 (February 1, 2011): 012136. http://dx.doi.org/10.1088/1742-6596/276/1/012136.

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Markina, O. M., and M. O. Tykhan. "Research of illuminating parameters halogen-filled and LED lamp for optoelectronic measuring system." Archives of Materials Science and Engineering 1, no. 94 (November 1, 2018): 18–26. http://dx.doi.org/10.5604/01.3001.0012.7804.

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Purpose: The purpose of this paper is to study and compare the light and technical characteristics of halogen and LED-lamps and to determine the effect of lighting quality on the accuracy of the measurement of the optoelectronic control system for the micrometer sizes of the prescription objects. Design/methodology/approach: The research approach is determined by the analysis and comparison of the lighting characteristics of lamps manufactured for mass production and the detection of the possibility of using these sources for optoelectronic measuring systems for the micrometric range. Lighting characteristics were investigated by the goniophotometric method and the method of the integration sphere. Findings: During the analysis of the results of experimental studies, a discrepancy in the lighting characteristics of the lamps was found compared to those indicated by the manufacturers. This difference in the indicators of the lighting characteristics was: for the light flux 2.92% halogen lamp (13.4% LED); correlated colour temperature by 0.7% halogen lamp (1.6% LED); for current – 7.34% halogen lamp (8.7% LED); for power – 7.31% halogen lamp (7.54% LED). The accuracy of measuring the size with a halogen lamp is 20 ± 0.96 μm, and with LED – 20 ± 0.23 μm. Research limitations/implications: The result of comparing the accuracy of the measurement for the optoelectronic measuring system of the geometric dimensions is the measure of absolute contrast with the use of LED lighting is four times better than halogen. Practical implications: Using the results of the study of the light characteristics of lamps described in the article, it is possible to improve any optoelectronic measuring system. Originality/value: The originality of the results of the article is the experimental data of the lighting characteristics studies of the lamps used in the optoelectronic measuring system.

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Vasilevskii, A. M., G. A. Konoplev, D. A. Svetlov, V. A. Gerasimov, D. K. Kostrin, and A. A. Ukhov. "Optoelectronic Data Measuring System for Monitoring Polyhexamethylene Guanidine-Based Decontaminants." Biomedical Engineering 48, no. 1 (May 2014): 13–16. http://dx.doi.org/10.1007/s10527-014-9405-6.

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Markina, O. M. "Lighting setting features of opto-electronic measuring system for controlling adhesive joints optical components." Journal of Achievements in Materials and Manufacturing Engineering 2, no. 84 (October 1, 2017): 49–57. http://dx.doi.org/10.5604/01.3001.0010.7781.

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Purpose: The purpose of this article is to study the features of setting and selecting the source of illumination of the optoelectronic measuring system for the control of adhesive joints of optical parts. Design/methodology/approach: The research and analysis of the lighting characteristics of halogen and LED lamps, used as a source of illumination in the measuring system, was carried out. Findings: In the course of experimental studies, the sensitivity and resolution of fixing defects of adhesive joints of optical parts were increased and the measurement error was reduced from 10 ± 1.2 microns to 10 ± 0.3 microns. Research limitations/implications: The limitations of the accuracy of the measurement are 10 ± 0.3 microns of adhesive defects, since the studies were conducted on separate samples of glues that did not cover all adhesives for the connection of optical surfaces and the thickness of glass surfaces was 1 mm and 2 mm. Practical implications: With the application of the lighting system approach described in the article, it is possible to improve any optoelectronic measuring system, thereby increasing the accuracy of the measurement. Originality/value: The originality of the results of the article is the experimental data of the studies of light-technical characteristics of the halogen lamp, which is used in the optoelectronic measuring system.

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Savich, A. I., and V. V. Makarenko. "Optical tracking system containing an optoelectronic converter for measuring complicated shapes." Measurement Techniques 30, no. 11 (November 1987): 1095–98. http://dx.doi.org/10.1007/bf00865067.

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Pulov, Dimcho, and Tsanko Karadzhov. "OPTOELECTRONIC DEVICE FOR MEASURING THE POWER OF LASER RADIATION." ENVIRONMENT. TECHNOLOGIES. RESOURCES. Proceedings of the International Scientific and Practical Conference 3 (June 16, 2021): 286–90. http://dx.doi.org/10.17770/etr2021vol3.6590.

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A device for measuring the power of the laser radiation.has been designed. The device consists of transmitter and receiving part. The transmitter includes optical radiation source and optical system for collimation of radiation. The receiver part consists of silicon photodiodes, electronic signal processing unit and unit for measurements.

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Arakantsev, Konstantin G., Igor A. Konyakhin, and Alexander N. Timofeev. "Inner-Base Optoelectronic System for the Control of Linear Displacements." Key Engineering Materials 437 (May 2010): 237–41. http://dx.doi.org/10.4028/www.scientific.net/kem.437.237.

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The control of railway track position is an important application area for coordinate measuring optoelectronic systems. One of the methods for the railway track control consists in determination of railway track position relatively to reference marks, which are mounted along the track [1]. In general case this system should be mounted on liner-tamper-surfacer and provide measurements of reference marks coordinates. Marks can be positioned up to 10 meters from track and measurements must be carried out in automatic mode. It has been decided to project the system on basis of inner-base rangefinder’s scheme [2].

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Parfiryev, A. V., O. V. Parfiryeva, and A. V. Dushkin. "Optimization of the algorithm of information analysis and processing in the optoelectronic system." Proceedings of Universities. Electronics 27, no. 1 (February 2022): 106–19. http://dx.doi.org/10.24151/1561-5405-2022-27-1-106-119.

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The accuracy of the coordinates of ground objects measured using optical instruments by unmanned aerial vehicles depends on many factors including: errors in measuring the angular coordinates of the optical system, the distance to the object, the presence of heterogeneous terrain, etc. Traditional use of optoelectronic systems functioning based on inertial sensors demonstrated their flaws, such as low accuracy at ground objects positioning for target designation to unmanned aerial vehicles due to declination angle and azimuth determination inaccuracy. In this work, a variant of optimizing the algorithm for analyzing and processing information in an optoelectronic system for determining the coordinates of ground objects from an unmanned aerial vehicle is presented. An algorithm and a method for determining geographical coordinates based on an electronic height matrix have been developed. An increase in the accuracy of calculating the coordinates of an object was achieved by minimizing the error of measuring the declination angle, azimuth on a ground object and inclined range. A description of a full-scale experiment with a car on the ground is given. Its essence was that according to several freeze frames obtained by the optoelectronic system of an unmanned aerial vehicle at a considerable distance with a large inclined range, the geographical coordinates of the car were determined in two ways (traditional and developed). With the help of the method proposed by the authors, the accuracy of determining coordinates has been increased several times. The developed algorithm and method for information processing make it possible to create a variety of hardware and software solutions for guidance and target designation systems of unmanned aerial vehicles.

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Liu, Qi Fang. "Measuring Coaxiality with Optoelectronic and Non-Contact Based on Helical Scanning." Advanced Materials Research 588-589 (November 2012): 1002–5. http://dx.doi.org/10.4028/www.scientific.net/amr.588-589.1002.

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In view of the characteristic of the inefficiency on measuring coaxiality manually in industry, we put forward to studying on a laser triangulation san method[1] for measuring distance to measure coaxiality. It takes relative motion between the measurement thing and displacement laser sensor to implement helical scan motion and gain the data of spiral scanning projection based on step servo system by gyration and the axial feed. This method can improve manufacture efficiency and achieve the demand of online automatic testing. Finally, the way of implementation of this system would be discussed in this paper, meanwhile, it would provide simulation results of the method and actually feasibility analysis .

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Konyakhin, I. A., A. D. Merson, and D. Y. Zubenko. "Optoelectronic System for Roll Angles Measuring of Maneuvering Objects Based on Anamorphosis Effect." Journal of Physics: Conference Series 48 (October 1, 2006): 988–91. http://dx.doi.org/10.1088/1742-6596/48/1/184.

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Більше джерел

Дисертації з теми "Optoelectronic measuring system"

Драч, Юрій Олександрович. "Підвищення точності вимірювання геометричних розмірів мікрометричного діапазону шляхом вдосконалення вузла освітлення оптико-електронної системи". Master's thesis, КПІ ім. Ігоря Сікорського, 2020. https://ela.kpi.ua/handle/123456789/38419.

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В даній магістерській дисертаційній роботі проведено аналітичне дослідження будови оптико-електронної вимірювальної системи, її складових вузлів та особливостей налаштування. З самої теми дисертації «Підвищення точності вимірювання геометричних розмірів мікрометричного діапазону шляхом вдосконалення вузла освітлення оптико-електронної системи» видно, що шляхом підвищення точності вимірювання геометричних розмірів у мікрометричному діапазону є вдосконалення джерела освітлення. Ми визначили основні відомі методи визначення світло-технічних характеристик джерел освітлення у другому розділі дисертації. В розділі нами проаналізовано методи «інтегруючої сфери» та «гоніофотометричний» для визначення світлового потоку освітлювальних систем з різним типом світлового розподілу. Звісно, ми розглядали методи світового досвіду визначення цих характеристик та вітчизняного досвіду, адже ми планували проведення експериментальних досліджень власного джерела випромінювання, що відповідало б світовому рівню. У третьому розділі ми навели приклади трьох джерел освітлення з зазначенням світлотехнічних характеристик. Ми зазначили спектральні характеристики для кожного джерела освітлення. У четвертому розділі ми навели матеріали, щодо побудови нами оптико- електронної вимірювальної системи. Свою вимірювальну систему для визначення геометричних розмірів мікрометричного діапазону, ми спроектували на базі оптичного мікроскопу, телевізійної камери, що закріплювалась до тіла оптичного мікроскопу з застосуванням перехідників (тубусів). Отримане, CCD матрицею телевізійної камери, випромінювання від об’єкту дослідження геометричних розмірів, надходило до персонального комп’ютеру з необхідним програмним забезпеченням, що дозволило нам за випромінюванням визначати розміри об’єкту або дефекту об’єкту. Хочемо зазначити, що програмне забезпечення ми в магістерській дисертації не розробляли, а користувались готовим програмним продуктом. Адже такого завдання перед нами не стояло. Більшість наших зусиль було спрямовано на дослідження джерела освітлення. Проте, хочемо зазначити, що після отриманих результатів щодо дослідження світло-технічних характеристик нового джерела освітлення, ми провели ряд вимірювань геометричних розмірів у мікрометричному діапазоні. Щоб порівняти точність вимірювання мікрометричних геометричних розмірів. Для цього ми проводили вимірювання на еталонному зразку лінійних геометричних розмірів ГОСТ 15114-78 Даний комплект мір використовують встановлення роздільної здатності телескопічних систем, кутові геометричні розміри ми не вимірювали. Хочемо зазначити, що ми обрали у якості нового джерела освітлення світлодіодну лампу та порівнювали отримані результати світлотехнічних характеристик з джерелом, що є стандартним (базовим) для моделі оптичного мікроскопу. Отже нами проведено ряд експериментальних досліджень світлотехнічних характеристик найпопулярнішого джерела освітлення - світлодіодної ламп. Аналіз результатів дослідження показав, що перед тим як застосовувати лампу масового виробництва виготовлену за будь-якою технологією у вимірювальній системі (оптико-електронна система) необхідно після спеціалізованого дослідження у центрах випробувань і діагностики надпровідникових джерел світла та освітлювальних систем. Адже зазначені світлотехнічні характеристики від виробників не відповідають тим, що визначено дослідним шляхом.
In this master's dissertation an analytical study of the structure of the optoelectronic measuring system, its components and features of the setting. From the topic of the dissertation "Improving the accuracy of measuring the geometric dimensions of the micrometric range by improving the lighting unit of the optoelectronic system" it is clear that by improving the accuracy of measuring geometric dimensions in the micrometric range is improving the light source. We have identified the main known methods for determining the lighting characteristics of light sources in the second section of the dissertation. In this section we analyze the methods of "integrating sphere" and "goniophometric" to determine the luminous flux of lighting systems with different types of light distribution. Of course, we considered the methods of world experience in determining these characteristics and domestic experience, because we planned to conduct experimental studies of our own radiation source, which would correspond to the world level. In the third section, we gave examples of three light sources with lighting characteristics. We noted the spectral characteristics for each light source. In the fourth section, we presented materials on the construction of our optoelectronic measuring system. We designed our measuring system to determine the geometric dimensions of the micrometric range on the basis of an optical microscope, a television camera, which was attached to the body of the optical microscope using adapters (tubes). The radiation received from the geometric dimensions object by the CCD matrix of the television camera was sent to a personal computer with the necessary software, which allowed us to determine the dimensions of the object or the defect of the object by the radiation. We would like to note that we did not develop the software in the master's dissertation, but used the finished software product. After all, we did not face such a task. Most of our efforts have been focused on researching the light source. However, we would like to note that after the results obtained on the study of lighting characteristics of the new light source, we conducted a series of measurements of geometric dimensions in the micrometric range. To compare the accuracy of measuring micrometric geometric dimensions. To do this, we performed measurements on a reference sample of linear geometric dimensions GOST 15114-78 This set of measures uses the establishment of the resolution of telescopic systems, we did not measure the angular geometric dimensions. We would like to note that we chose an LED lamp as a new light source and compared the obtained results of lighting characteristics with a source that is standard (basic) for the optical microscope model. Therefore, we conducted a number of experimental studies of the lighting characteristics of the most popular light source - LED lamps. Analysis of the results of the study showed that before using a mass-produced lamp made by any technology in a measuring system (optoelectronic system) it is necessary after a specialized study in the centers of testing and diagnostics of superconducting light sources and lighting systems. After all, these lighting characteristics from the manufacturers do not correspond to those determined experimentally. Although the characteristics of the LED lamp were not significantly different from the halogen lamp. The impact on the measurement accuracy of the optoelectronic measuring system of these light sources, we determined using a bar measure of absolute contrast and concluded that the efficiency of LED lighting is four times higher than halogen lighting when building a measuring system as described in dissertation.

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Edworthy, Robert Mark. "A vehicle-mounted television measuring system for railway structure gauging." Thesis, Brunel University, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.277415.

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Poizat, Jean-Philippe. "Réalisation et caractérisation de mesures quantiques non-destructives en optique." Phd thesis, Université Paris Sud - Paris XI, 1993. http://pastel.archives-ouvertes.fr/pastel-00714222.

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L'objectif d'un dispositif de mesure qnd est de contrôler l'action en retour, imposée par la mécanique quantique, qui se produit sur un système soumis a une mesure. Il est, en effet, possible de rejeter cette perturbation entièrement sur l'observable complémentaire de celle mesurée, laissant cette dernière inchangées. Nous présentons ici, de manière détaillée, un ensemble de critères quantitatifs permettant d'évaluer les performances d'un dispositif mesurant l'intensité d'un faisceau lumineux. Ces critères permettent en particulier de séparer clairement des domaines classique et quantique de fonctionnement d'un tel dispositif. La première expérience realisee utilise le couplage par effet kerr croise de deux faisceaux laser dans un milieu non linéaire. Ce milieu est compose d'un jet atomique de sodium place dans une cavite optique doublement résonnante. Nous avons effectue une analyse théorique complète des proprietes de bruit quantique d'un tel système. Nous avons identifie un régime de paramètres, base sur des effets de déplacement lumineux, pour lequel il existe un transfert efficace d'information du faisceau incident vers la voie de mesure, sans dégradation appréciable du signal. Ces prévisions théoriques ont ensuite été vérifiées dans notre expérience. Nous présentons également une deuxième expérience utilisant la détection puis la réémission de la lumière par des composants optoélectroniques a semi-conducteur. Nous montrons que lorsque les taux de conversion photon-électron pour les photodiodes et électron-photon our les diodes electro-luminescentes sont proches de l'unité, ce dispositif permet de mesurer puis de recréer les fluctuations quantiques du faisceau incident. La démonstration de principe que nous avons realisee laisse présager des applications possibles dans le domaine des réseaux de télécommunication optique.

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Chen, Chun-Jen, and 陳俊仁. "The developments of multi-degree-of-freedom optoelectronic measuring systems by using the skew-ray tracing method." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/57945347565817449526.

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博士
國立成功大學
機械工程學系碩博士班
95
High-accuracy laser-based optoelectronic motion and position measuring systems typically utilize light rays that travel from one optical assembly to another to perform motion and/or position measurements. It is not a simple task to accurately determine the equations of these sensor readings in terms of positional/angular motions. This problem is addressed in this paper by application of the analytic skew-ray tracing methodology as computed by finite difference methodology. An illustrative example of a motion measurement system and comparison of the Position Sensing Detector (PSD) readings are given to validate the proposed methodology. It is shown that the proposed methodology can provide accurate expressions of PSD readings. Based on the proposed methodology, the following three optoelectronic multi-degree-of-freedom measurement systems are established: an optoelectronic inclinometer, a high angular accuracy measurement system and a six Degree-Of-Freedom (DOF) motion measurement system. The optoelectronic inclinometer which can measure inclination angles along two orthogonal directions simultaneously by using a simple pendulum, two mirrors, a 2-axis PSD, and a laser diode. To validate the proposed methodology, an actual prototype system is built, and its calibration and stability experiments are performed. The high accuracy angle measurement system performs angle measurement by use of laser-diodes, 2-axis PSDs and a series of reflections between two first-surface-mirrors. Calibration and stability experiments are performed. Experimental results show the accuracy and measurement range are, respectively, 0.05 arc sec and ±250 arc sec. The six-DOF measurement system comprises a pyramid-polygon- mirror, three laser diodes and three 2-axis PSDs. To validate the proposed methodology, a laboratory prototype system is built. System verification and stability tests are conducted to evaluate its performance. Stability test results show that measurement errors and maximum crosstalk are within ±1 μm in translation and ±1.5 arc sec in rotation.

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Книги з теми "Optoelectronic measuring system"

F, Fagan William, Europtica-Services I. C, and Society of Photo-optical Instrumentation Engineers., eds. Industrial optoelectronic measurement systems using coherent light. Bellingham, Wash., USA: The Society, 1988.

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Частини книг з теми "Optoelectronic measuring system"

Yanbing, Liu, and Zhang Jinru. "An Optical Fibre Magnetic Field Sensor System for Measuring Low Frequency Fields." In Laser/Optoelektronik in der Technik / Laser/Optoelectronics in Engineering, 770–73. Berlin, Heidelberg: Springer Berlin Heidelberg, 1990. http://dx.doi.org/10.1007/978-3-642-48372-1_163.

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Zhang, J. R., Y. J. Zhang, and B. Chen. "Improving the measuring accuracy and reliability of a binocular structured light measurement system." In Frontier Research and Innovation in Optoelectronics Technology and Industry, 57–62. London, UK : CRC Press/Balkema, an imprint of the Taylor & Francis Group, [2019]: CRC Press, 2018. http://dx.doi.org/10.1201/9780429447082-8.

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Dvoynishnikov, Sergey Vladimirovich, and Vladimir Genrievich Meledin. "Optoelectronic Differential Cloudy Triangulation Method for Measuring Geometry of Hot Moving Objects." In Optoelectronics in Machine Vision-Based Theories and Applications, 49–78. IGI Global, 2019. http://dx.doi.org/10.4018/978-1-5225-5751-7.ch003.

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The new differential cloudy triangulation method for quick and precise measurement of thickness of hot dynamic objects is proposed. The method is based on laser cloudy triangulation, used in the synchronous differential mode. The experimental model of the laser system for thickness measurements, which implements the proposed method, has been developed. Laboratory and industrial tests of the laser system have been performed. They confirm efficiency and possibilities of differential cloudy triangulation in metallurgy. The differential cloudy triangulation method may be used for geometry measurement of hot dynamic objects in a wide range of strong optical refractions in media.

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Lindner, Lars. "Laser Scanners." In Developing and Applying Optoelectronics in Machine Vision, 108–45. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch004.

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The presented book chapter provides an overview and detailed description about actual used laser scanner systems. It explains and compares the mainly used coordinate measurement methods, like Time-of-flight, Phasing and Triangulation and Imaging. A Technical Vision System, developed by the engineering institute at the Autonomous University Baja California (UABC) is presented. The mostly used mechanical principles to position a laser beam in a field of view are described and which mechanical actuators are applied. The reflected laser beam gets measured by light sensors or image sensors, which are explained and some principle measuring circuits are provided. The received measuring data gets post-processed by different algorithm or principles, which close the chapter.

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Castillo, Javier Rivera, Moises Rivas-Lopez, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio Cesar Rodríguez-Quiñonez, and Daniel Hernandez-Balbuena. "Machine Vision Optical Scanners for Landslide Monitoring." In Developing and Applying Optoelectronics in Machine Vision, 206–35. IGI Global, 2017. http://dx.doi.org/10.4018/978-1-5225-0632-4.ch007.

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An application of landslide monitoring using optical scanner as vision system is presented. The method involves finding the position of non-coherent light sources located at strategic points susceptible to landslides. The position of the light source is monitored by measuring its coordinates using a scanner based on a 45° sloping surface cylindrical mirror. This chapter also provides a background about the concept of landslides and technologies for monitoring. finally, the results of experiments of position light source monitoring in laboratory environment using the proposed method are presented.

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Miranda-Vega, Jesús Elias, Javier Rivera-Castillo, Moisés Rivas-López, Wendy Flores-Fuentes, Oleg Sergiyenko, Julio C. Rodríguez-Quiñonez, and Daniel Hernández-Balbuena. "Reducing the Optical Noise of Machine Vision Optical Scanners for Landslide Monitoring." In Examining Optoelectronics in Machine Vision and Applications in Industry 4.0, 103–33. IGI Global, 2021. http://dx.doi.org/10.4018/978-1-7998-6522-3.ch004.

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An application of landslide monitoring using optical scanner as vision system is presented. The method involves finding the position of non-coherent light sources located at strategic points susceptible to landslides. The position of the light source is monitored by measuring its coordinates using a scanner based on a 45° sloping surface cylindrical mirror. This chapter shows experiments of position light source monitoring in laboratory environment. This work also provides improvements for the optical scanner by using digital filter to smooth the opto-electronic signal captured from a real environment. The results of these experiments were satisfactory by implementing the moving average filter and median filter.

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Тези доповідей конференцій з теми "Optoelectronic measuring system"

Galiulin, Ravil M. "Optoelectronic computer-aided measuring OPTEL system." In Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life, edited by Yuri V. Chugui, Sergei N. Bagayev, Albert Weckenmann, and P. Herbert Osanna. SPIE, 2002. http://dx.doi.org/10.1117/12.484600.

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Szebeszczyk, Janina, and Joanna Straszecka. "Achilles tendon reflex measuring system." In Optoelectronic and Electronic Sensors, edited by Ryszard Jachowicz and Zdzislaw Jankiewicz. SPIE, 1995. http://dx.doi.org/10.1117/12.213153.

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Ligeza, P. "Modeling of complex hot-wire measuring system." In Optoelectronic and Electronic Sensors IV, edited by Jerzy Fraczek. SPIE, 2001. http://dx.doi.org/10.1117/12.435913.

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Hypszer, Ryszard, Jerzy Plucinski, and Pawel Wierzba. "System for measuring thickness of opaque dielectric layers." In Optoelectronic and Electronic Sensors II, edited by Zdzislaw Jankiewicz and Henryk Madura. SPIE, 1997. http://dx.doi.org/10.1117/12.266718.

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Li, Hegao. "Measuring system of digital-optical power spectrum." In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294710.

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Zhang, Yuheng, Siyang Liu, Linsheng Zhong, Shenzhan Zhang, Xiaofang Wu, and Zhujun Wan. "An Optical System for Measuring the Pitch of a Fiber Array." In Optoelectronic Devices and Integration. Washington, D.C.: OSA, 2018. http://dx.doi.org/10.1364/oedi.2018.ot4a.75.

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Zhang, Yunxiang. "Optical fibre-CCD area endoscope image measuring system." In International Conference on Optoelectronic Science and Engineering '90. SPIE, 1990. http://dx.doi.org/10.1117/12.2294877.

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Gao, Wei, Yi Zeng, Yan Dong, Ye Gu, and Guangheng Tong. "Design of automatic image measuring system based on RTX simulation system." In International Symposium on Optoelectronic Technology and Application 2014, edited by Gaurav Sharma, Fugen Zhou, and Jennifer Liu. SPIE, 2014. http://dx.doi.org/10.1117/12.2073163.

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Hao, Qun, Yongtian Wang, and Dingguo Sha. "Online measuring system for amorphous strip thickness." In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, edited by Shulian Zhang and Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403835.

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Zheng, Yingjun, and Yongmei Huang. "New soft-measuring system of polarized light." In Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, edited by Shulian Zhang and Wei Gao. SPIE, 2000. http://dx.doi.org/10.1117/12.403894.

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