Статті в журналах з теми "Optical surface profiling"
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See, Chung Wah, Michael G. Somekh, and Richard D. Holmes. "Scanning optical microellipsometer for pure surface profiling." Applied Optics 35, no. 34 (December 1, 1996): 6663. http://dx.doi.org/10.1364/ao.35.006663.
Повний текст джерелаFUKATSU, Hiroya. "Optical Profiling Techniques for Engineered Surface Topography." Journal of the Japan Society for Precision Engineering 76, no. 9 (2010): 995–98. http://dx.doi.org/10.2493/jjspe.76.995.
Повний текст джерелаGolnabi, H. "Surface profiling using a double-fiber optical design." Optics and Lasers in Engineering 48, no. 4 (April 2010): 421–26. http://dx.doi.org/10.1016/j.optlaseng.2009.09.007.
Повний текст джерелаJuškaitis, R., and T. Wilson. "Surface profiling with scanning optical microscopes using two-mode optical fibers." Applied Optics 31, no. 22 (August 1, 1992): 4569. http://dx.doi.org/10.1364/ao.31.004569.
Повний текст джерелаKane, D. M., A. M. Joyce, G. R. Staib, and M. E. Herberstein. "Optical surface profiling of orb-web spider capture silks." Bioinspiration & Biomimetics 5, no. 3 (August 16, 2010): 036004. http://dx.doi.org/10.1088/1748-3182/5/3/036004.
Повний текст джерелаChauhan, B. S., K. Thirumalaivelu, M. P. Kothiyal, and R. S. Sirohi. "Confocal Scanning Optical Microscope and its Use for Surface Profiling." Journal of Optics 23, no. 4 (December 1994): 163–71. http://dx.doi.org/10.1007/bf03549278.
Повний текст джерелаDowning, R. G., and G. P. Lamaze. "Near-surface profiling of semiconductor materials using neutron depth profiling." Semiconductor Science and Technology 10, no. 11 (November 1, 1995): 1423–31. http://dx.doi.org/10.1088/0268-1242/10/11/001.
Повний текст джерелаRuschin, S., J. Y. Xu, W. S. C. Chang, and H. Chung. "A filtered-transform scanning microscopic method for refractive-index profiling of optical waveguides and surface profiling." Journal of Lightwave Technology 8, no. 11 (1990): 1703–8. http://dx.doi.org/10.1109/50.60569.
Повний текст джерелаHung, Min-Hsiung, en-Tzong Jeng, Chia-Lun Shu, and Jia-Chiang Wang. "Optical Body-Surface Profiling with Coded Markers for Medical Image Registration." International Journal of Automation and Smart Technology 3, no. 2 (June 1, 2013): 85–90. http://dx.doi.org/10.5875/ausmt.v3i2.193.
Повний текст джерелаFUKATSU, Hiroya, and Kazuhisa YANAGI. "Development of an Optical Stylus Displacement Sensor for Surface Profiling Measurement." Transactions of the Japan Society of Mechanical Engineers Series C 70, no. 694 (2004): 1737–42. http://dx.doi.org/10.1299/kikaic.70.1737.
Повний текст джерелаXie, Hongbo, Min Jiang, Yao Wang, Xiaotian Pang, Chao Wang, Yongpeng Su, and Lei Yang. "Aspheric optical surface profiling based on laser scanning and auto-collimation." Review of Scientific Instruments 88, no. 11 (November 2017): 113106. http://dx.doi.org/10.1063/1.4995685.
Повний текст джерелаEix, Ilos, Andrei V. Zvyagin, and David D. Sampson. "HIGH-SPEED GATED SURFACE PROFILING WITH CLOSED-LOOP OPTICAL COHERENCE TOPOGRAPHY." Biomedizinische Technik/Biomedical Engineering 47, s1a (2002): 189–90. http://dx.doi.org/10.1515/bmte.2002.47.s1a.189.
Повний текст джерелаFukatsu, Hiroya, and Kazuhisa Yanagi. "Development of an optical stylus displacement sensor for surface profiling instruments." Microsystem Technologies 11, no. 8-10 (August 2005): 582–89. http://dx.doi.org/10.1007/s00542-005-0558-9.
Повний текст джерелаCosta, Sílvia, and Manuel Abreu. "Simulation and development of a prototype for high precision surface metrology." Journal of Physics: Conference Series 2407, no. 1 (December 1, 2022): 012017. http://dx.doi.org/10.1088/1742-6596/2407/1/012017.
Повний текст джерелаHIRABAYASHI, Akira. "Fast Surface Profiling by White-Light Interferometry Using Symmetric Spectral Optical Filter." IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E93-A, no. 2 (2010): 542–49. http://dx.doi.org/10.1587/transfun.e93.a.542.
Повний текст джерелаMohamed-Kassim, N. Syafiqah, and M. Kamil Abd-Rahman. "Plastic optical fibre power splitter for surface profiling of 3-D object." IOP Conference Series: Materials Science and Engineering 767 (March 21, 2020): 012055. http://dx.doi.org/10.1088/1757-899x/767/1/012055.
Повний текст джерелаSHEN, YANTAO, YONGXIONG WANG, and NING XI. "A MULTIFUNCTIONAL AND PORTABLE OPTICAL SENSOR FOR QUANTITATIVE CHARACTERIZATION OF 3D SURFACE TEXTURE PROPERTIES." International Journal of Information Acquisition 07, no. 04 (December 2010): 269–84. http://dx.doi.org/10.1142/s0219878910002282.
Повний текст джерелаSon, Sungmin, Sho C. Takatori, Brian Belardi, Marija Podolski, Matthew H. Bakalar, and Daniel A. Fletcher. "Molecular height measurement by cell surface optical profilometry (CSOP)." Proceedings of the National Academy of Sciences 117, no. 25 (June 8, 2020): 14209–19. http://dx.doi.org/10.1073/pnas.1922626117.
Повний текст джерелаIvanov, A. S., and A. E. Medvedev. "Optical surface plasmon resonance biosensors in molecular fishing." Biomeditsinskaya Khimiya 61, no. 2 (2015): 231–38. http://dx.doi.org/10.18097/pbmc20156102231.
Повний текст джерелаZayats, Sergey, John Alexander, Sergei Magonov, and Dmitry Kazantsev. "Practical Realization of Apertureless Scanning Near-field Optical Microscopy Using Hybrid Mode Atomic Force Microscopy." MRS Proceedings 1754 (2015): 97–102. http://dx.doi.org/10.1557/opl.2015.257.
Повний текст джерелаZvyagin, Andrei V., Ilos Eix, and David D. Sampson. "High-speed, high-sensitivity, gated surface profiling with closed-loop optical coherence topography." Applied Optics 41, no. 11 (April 8, 2002): 2179. http://dx.doi.org/10.1364/ao.41.002179.
Повний текст джерелаSchweitzer, M. A., and J. F. Power. "Optical Depth Profiling of Thin Films by Impulse Mirage Effect Spectroscopy. Part I: Theory." Applied Spectroscopy 48, no. 9 (September 1994): 1054–75. http://dx.doi.org/10.1366/0003702944029550.
Повний текст джерелаPereira, Tânia, Mariana Sequeira, Pedro Vaz, Ana Tomé, Helena C. Pereira, Carlos Correia, and João Cardoso. "Submicron Surface Vibration Profiling Using Doppler Self-Mixing Techniques." Advances in Optics 2014 (July 23, 2014): 1–7. http://dx.doi.org/10.1155/2014/576380.
Повний текст джерелаZeng, Quan Ren, Geng Liu, Lan Liu, and Rui Ting Tong. "Surface Texture’s Role in Assessing Surface Integrity of Machined Parts." Applied Mechanics and Materials 34-35 (October 2010): 1145–48. http://dx.doi.org/10.4028/www.scientific.net/amm.34-35.1145.
Повний текст джерелаŁętocha, Aneta. "Study the influence of selected new filtration methods on roughness of standard surfaces." Mechanik 90, no. 3 (March 6, 2017): 224–28. http://dx.doi.org/10.17814/mechanik.2017.3.43.
Повний текст джерелаPARK, SEUNG-KYU, SUNG-HOON BAIK, HYUNG-KI CHA, YONG-MOO CHEONG, WOON-IL KIM, CHANG-HO CHO, and YOUNG-JUNE KANG. "LASER ULTRASONIC INSPECTION SYSTEM WITH A 3D SURFACE PROFILOMETRY TO DETECT SURFACE CRACKS." Modern Physics Letters B 22, no. 11 (May 10, 2008): 1051–56. http://dx.doi.org/10.1142/s0217984908015826.
Повний текст джерелаLorenzo, Juárez P., Moisés Cywiak, Bernardino Barrientos, and J. M. Flores Moreno. "Three Gaussian beam heterodyne interferometer for surface profiling." Optics Communications 268, no. 2 (December 2006): 209–14. http://dx.doi.org/10.1016/j.optcom.2006.07.021.
Повний текст джерелаChen, Liang-Chia, Duc-Hieu Duong, and Chin-Sheng Chen. "Optical 3-D Profilometry for Measuring Semiconductor Wafer Surfaces with Extremely Variant Reflectivities." Applied Sciences 9, no. 10 (May 19, 2019): 2060. http://dx.doi.org/10.3390/app9102060.
Повний текст джерелаLi, Boren, and Tomonari Furukawa. "Microtexture Road Profiling System Using Photometric Stereo." Tire Science and Technology 43, no. 2 (April 1, 2015): 117–43. http://dx.doi.org/10.2346/tire.15.430204.
Повний текст джерелаEkgasit, Sanong, and Hatsuo Ishida. "Optical Depth Profiling by Attenuated Total Reflection Fourier Transform Infrared Spectroscopy: A New Approach." Applied Spectroscopy 50, no. 9 (September 1996): 1187–95. http://dx.doi.org/10.1366/0003702963905178.
Повний текст джерелаFUKATSU, Hiroya, Kazuhisa YANAGI, and Atsushi SHIMAMOTO. "P-IM-02 DEVELOPMENT OF A NOVEL OPTICAL STYLUS SENSOR FOR SURFACE PROFILING INSTRUMENT." Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE 2003 (2003): 337–38. http://dx.doi.org/10.1299/jsmemipe.2003.337.
Повний текст джерелаZhu, Yun Hu, Jie Fu, Chao Zheng, and Zhong Ji. "Fabrication and Characterization of Micro-Dent Produced by Laser Shock Peening on Zr-Based Bulk Metallic Glass." Materials Science Forum 849 (March 2016): 14–21. http://dx.doi.org/10.4028/www.scientific.net/msf.849.14.
Повний текст джерелаJiang, Jing Bo, Zuo Tao Ni, Si Ren Li, and De Jun Gong. "A Wave-Powered Technique for Water Column Profiling." Applied Mechanics and Materials 284-287 (January 2013): 1739–43. http://dx.doi.org/10.4028/www.scientific.net/amm.284-287.1739.
Повний текст джерелаOnodera, Ribun, Hiroki Wakaumi, and Yukihiro Ishii. "Measurement technique for surface profiling in low-coherence interferometry." Optics Communications 254, no. 1-3 (October 2005): 52–57. http://dx.doi.org/10.1016/j.optcom.2005.05.019.
Повний текст джерелаThakur, M., C. Quan, and C. J. Tay. "Surface profiling using fringe projection technique based on Lau effect." Optics & Laser Technology 39, no. 3 (April 2007): 453–59. http://dx.doi.org/10.1016/j.optlastec.2005.12.002.
Повний текст джерелаPolyakova, V. V., I. N. Kots, V. A. Smirnov, and O. A. Ageev. "Nanoscaled Profiling of Silicon Surface via Local Anodic Oxidation." Russian Microelectronics 48, no. 2 (March 2019): 66–71. http://dx.doi.org/10.1134/s1063739719020082.
Повний текст джерелаMatousek, P., N. Everall, M. Towrie, and A. W. Parker. "Depth Profiling in Diffusely Scattering Media Using Raman Spectroscopy and Picosecond Kerr Gating." Applied Spectroscopy 59, no. 2 (February 2005): 200–205. http://dx.doi.org/10.1366/0003702053085115.
Повний текст джерелаVander Rhodes, G. H., J. M. Pomeroy, M. S. Ünlü, B. B. Goldberg, K. J. Knopp, and D. H. Christensen. "Pump intensity profiling of vertical-cavity surface-emitting lasers using near-field scanning optical microscopy." Applied Physics Letters 72, no. 15 (April 13, 1998): 1811–13. http://dx.doi.org/10.1063/1.121192.
Повний текст джерелаPasqueron de Fommervault, Orens, Paula Perez-Brunius, Pierre Damien, Victor F. Camacho-Ibar, and Julio Sheinbaum. "Temporal variability of chlorophyll distribution in the Gulf of Mexico: bio-optical data from profiling floats." Biogeosciences 14, no. 24 (December 15, 2017): 5647–62. http://dx.doi.org/10.5194/bg-14-5647-2017.
Повний текст джерелаUrbaniak, Mirosław, Ryszard Dębkowski, Marcin Gołąbczak, and Marcin Skowron. "Device of magnesium alloy grinding using periodic cleaning of the active surface of grinding wheel during machining." Mechanik 91, no. 11 (November 12, 2018): 1023–25. http://dx.doi.org/10.17814/mechanik.2018.11.182.
Повний текст джерелаHooker, Stanford B., Henry F. Houskeeper, Randall N. Lind, Raphael M. Kudela, and Koji Suzuki. "Verification and Validation of Hybridspectral Radiometry Obtained from an Unmanned Surface Vessel (USV) in the Open and Coastal Oceans." Remote Sensing 14, no. 5 (February 23, 2022): 1084. http://dx.doi.org/10.3390/rs14051084.
Повний текст джерелаEvincent, Warwick E., Isabelle Laurion, and Reinhard Pienitz. "Arctic and Antarctic lakes as optical indicators of global change." Annals of Glaciology 27 (1998): 691–96. http://dx.doi.org/10.3189/1998aog27-1-691-696.
Повний текст джерелаHAMMAD, TALAAT MOUSSA. "ELECTRICAL AND OPTICAL PROPERTIES OF MULTILAYER SOL GEL ZnO COATINGS." International Journal of Modern Physics B 20, no. 23 (September 20, 2006): 3357–64. http://dx.doi.org/10.1142/s0217979206035473.
Повний текст джерелаWeng, Chun-Jen, Ken-Yuh Hsu, and Yung-Fu Chen. "Exploiting the image of the surface reflectivity to measure refractive index profiling for various optical fibers." Optics Express 23, no. 9 (April 24, 2015): 11755. http://dx.doi.org/10.1364/oe.23.011755.
Повний текст джерелаOgilvie, Steven, Evgeny Isakov, Colin Taylor, and Paul Glover. "A NEW HIGH RESOLUTION OPTICAL METHOD FOR OBTAINING THE TOPOGRAPHY OF FRACTURE SURFACES IN ROCKS." Image Analysis & Stereology 21, no. 1 (May 3, 2011): 61. http://dx.doi.org/10.5566/ias.v21.p61-66.
Повний текст джерелаJellison, G. E., D. H. Lowndes, and J. W. Sharp. "Time-resolved optical studies of oxide-encapsulated silicon during pulsed laser melting." Journal of Materials Research 3, no. 3 (June 1988): 498–505. http://dx.doi.org/10.1557/jmr.1988.0498.
Повний текст джерелаAraguás Rodríguez, Silvia, Tomáš Jelínek, Jan Michálek, Álvaro Yáñez González, Fiona Schulte, Christopher Pilgrim, Jorg Feist, and Stephen J. Skinner. "Accelerated thermal profiling of gas turbine components using luminescent thermal history paints." Journal of the Global Power and Propulsion Society 2 (April 25, 2018): S3KTGK. http://dx.doi.org/10.22261/jgpps.s3ktgk.
Повний текст джерелаChen, Liang-Chia, and Ching-Wen Liang. "Novel Boundary Edge Detection for Accurate 3D Surface Profilometry Using Digital Image Correlation." Applied Sciences 8, no. 12 (December 7, 2018): 2541. http://dx.doi.org/10.3390/app8122541.
Повний текст джерелаKim, Ju Wan, Jae Sung Ahn, Joo Beom Eom, and Byeong Ha Lee. "Magnification-invariant surface profiling technique for structured illumination imaging and microscopy." Optics Communications 434 (March 2019): 257–63. http://dx.doi.org/10.1016/j.optcom.2018.10.052.
Повний текст джерелаZhang, Rui, Xing Ai, Yi Wan, Zhanqiang Liu, Dong Zhang, and Sheng Feng. "Surface Corrosion Resistance in Turning of Titanium Alloy." International Journal of Corrosion 2015 (2015): 1–8. http://dx.doi.org/10.1155/2015/823172.
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