Добірка наукової літератури з теми "Optical surface profiling"
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Статті в журналах з теми "Optical surface profiling"
See, Chung Wah, Michael G. Somekh, and Richard D. Holmes. "Scanning optical microellipsometer for pure surface profiling." Applied Optics 35, no. 34 (December 1, 1996): 6663. http://dx.doi.org/10.1364/ao.35.006663.
Повний текст джерелаFUKATSU, Hiroya. "Optical Profiling Techniques for Engineered Surface Topography." Journal of the Japan Society for Precision Engineering 76, no. 9 (2010): 995–98. http://dx.doi.org/10.2493/jjspe.76.995.
Повний текст джерелаGolnabi, H. "Surface profiling using a double-fiber optical design." Optics and Lasers in Engineering 48, no. 4 (April 2010): 421–26. http://dx.doi.org/10.1016/j.optlaseng.2009.09.007.
Повний текст джерелаJuškaitis, R., and T. Wilson. "Surface profiling with scanning optical microscopes using two-mode optical fibers." Applied Optics 31, no. 22 (August 1, 1992): 4569. http://dx.doi.org/10.1364/ao.31.004569.
Повний текст джерелаKane, D. M., A. M. Joyce, G. R. Staib, and M. E. Herberstein. "Optical surface profiling of orb-web spider capture silks." Bioinspiration & Biomimetics 5, no. 3 (August 16, 2010): 036004. http://dx.doi.org/10.1088/1748-3182/5/3/036004.
Повний текст джерелаChauhan, B. S., K. Thirumalaivelu, M. P. Kothiyal, and R. S. Sirohi. "Confocal Scanning Optical Microscope and its Use for Surface Profiling." Journal of Optics 23, no. 4 (December 1994): 163–71. http://dx.doi.org/10.1007/bf03549278.
Повний текст джерелаDowning, R. G., and G. P. Lamaze. "Near-surface profiling of semiconductor materials using neutron depth profiling." Semiconductor Science and Technology 10, no. 11 (November 1, 1995): 1423–31. http://dx.doi.org/10.1088/0268-1242/10/11/001.
Повний текст джерелаRuschin, S., J. Y. Xu, W. S. C. Chang, and H. Chung. "A filtered-transform scanning microscopic method for refractive-index profiling of optical waveguides and surface profiling." Journal of Lightwave Technology 8, no. 11 (1990): 1703–8. http://dx.doi.org/10.1109/50.60569.
Повний текст джерелаHung, Min-Hsiung, en-Tzong Jeng, Chia-Lun Shu, and Jia-Chiang Wang. "Optical Body-Surface Profiling with Coded Markers for Medical Image Registration." International Journal of Automation and Smart Technology 3, no. 2 (June 1, 2013): 85–90. http://dx.doi.org/10.5875/ausmt.v3i2.193.
Повний текст джерелаFUKATSU, Hiroya, and Kazuhisa YANAGI. "Development of an Optical Stylus Displacement Sensor for Surface Profiling Measurement." Transactions of the Japan Society of Mechanical Engineers Series C 70, no. 694 (2004): 1737–42. http://dx.doi.org/10.1299/kikaic.70.1737.
Повний текст джерелаДисертації з теми "Optical surface profiling"
Holmes, R. D. "Coherent optical detection techniques in surface metrology." Thesis, University of Nottingham, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294698.
Повний текст джерелаJaturunruangsri, Supaporn. "Evaluation of material surface profiling methods : contact versus non-contact." Thesis, Brunel University, 2015. http://bura.brunel.ac.uk/handle/2438/10431.
Повний текст джерелаCaber, Paul James 1959. "The use of digital signal processing techniques for the interferometric profiling of rough surfaces." Thesis, The University of Arizona, 1991. http://hdl.handle.net/10150/277998.
Повний текст джерелаRoig, Blandine. "Caractérisation de tissus cutanés par spectroscopie bimodale : Réflectance Diffuse et Raman." Thesis, Reims, 2015. http://www.theses.fr/2015REIMS031/document.
Повний текст джерелаThis thesis relates to the combination of two in vivo skin characterization techniques. On the one hand, Diffuse Reflectance Spectroscopy (DRS) enables skin optical properties characterization by quantifying light absorption and light elastic scattering. On the other hand, Raman microspectroscopy provides information on molecular compositions of tissues with no need of labeling. Localization and quantification functions of Raman microspectroscopy are both distorted in scattering media such as skin. Therefore, the aim of this thesis was to assess the effect of light-matter interactions on these functions. A bimodal method is proposed to achieve quantitative biochemical characterization of cutaneous tissues in vivo. The main idea is to develop a procedure of Raman spectra correction based on the quantified optical properties provided by DRS. This work was divided in three complementary approaches: the development of a system enabling diffuse reflectance and optical properties measurements in the same zone as Raman microspectroscopy; the fabrication of optical phantoms improving our knowledge on absorption, elastic scattering and Raman scattering phenomena; and the development of a Raman spectra correction model as function of the skin optical properties given by DRS measurements
Kosmata, Marcel. "Elastische Rückstoßatomspektrometrie leichter Elemente mit Subnanometer-Tiefenauflösung." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2012. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-84041.
Повний текст джерелаIn this thesis the QQDS magnetic spectrometer that is used for high resolution ion beam analysis (IBA) of light elements at the Helmholtz-Zentrum Dresden-Rossendorf is presented for the first time. In addition all parameters are investigated that influence the analysis. Methods and models are presented with which the effects can be minimised or calculated. There are five focal points of this thesis. The first point is the construction and commissioning of the QQDS magnetic spectrometer, the corresponding scattering chamber with all the peripherals and the detector, which is specially developed for high resolution elastic recoil detection. Both the reconstructed spectrometer and the detector were adapted to the specific experimental conditions needed for high-resolution Ion beam analysis of light elements and tested for routine practice. The detector consists of two compo-nents. At the back end of the detector a Bragg ionization chamber is mounted, which is used for the particle identification. At the front end, directly behind the entrance window a proportional counter is mounted. This proportional counter includes a high-resistance anode. Thus, the position of the particles is determined in the detector. The following two points concern fundamental studies of ion-solid interaction. By using a magnetic spectrometer the charge state distribution of the particles scattered from the sample after a binary collision is both possible and necessary for the analysis. For this reason the charge states are measured and compared with existing models. In addition, a model is developed that takes into account the charge state dependent energy loss. It is shown that without the application of this model the depth profiles do not correspond with the quantitative measurements by conventional IBA methods and with the thickness obtained by transmission electron microscopy. The second fundamental ion-solid interaction is the damage and the modification of the sample that occurs during heavy ion irradiation. It is shown that the used energies occur both electronic sputtering and electronically induced interface mixing. Electronic sputtering is minimised by using optimised beam parameters. For most samples the effect is below the detection limit for a fluence sufficient for the analysis. However, the influence of interface mixing is so strong that it has to be included in the analysis of the layers of the depth profiles. It is concluded from these studies that at the Rossendorf 5 MV tandem accelerator chlorine ions with an energy of 20 MeV deliver the best results. In some cases, such as the analysis of boron, the energy must be reduced to 6.5 MeV in order to retain the electronic sputtering below the detection limit. The fourth focus is the study of the influence of specific sample properties, such as surface roughness, on the shape of a measured energy spectra and respectively on the analysed depth profile. It is shown that knowledge of the roughness of a sample at the surface and at the interfaces for the analysis is needed. In addition, the contribution parameters limiting the depth resolution are calculated and compared with the conventional ion beam analysis. Finally, a comparison is made between the high-resolution ion beam analysis and complementary methods published by other research groups. The fifth and last focus is the analysis of light elements in ultra thin layers. All models presented in this thesis to reduce the influence of beam damage are taken into account. The dynamic non-equilibrium charge state is also included for the quantification of elements. Depth profiling of multilayer systems is demonstrated for systems consisting of SiO2-Si3N4Ox-SiO2 on silicon, boron implantation profiles for ultra shallow junctions and ultra thin oxide layers, such as used as high-k materials
Tu, Wei-Sho, and 杜維修. "Application of Optical Trapping in Surface Profiling." Thesis, 2001. http://ndltd.ncl.edu.tw/handle/17033784723244931790.
Повний текст джерелаLal, Surbhi. "Profiling the near field of nanoshells using surface enhanced Raman spectroscopy and fluorescence spectroscopy." Thesis, 2006. http://hdl.handle.net/1911/18932.
Повний текст джерелаKosmata, Marcel. "Elastische Rückstoßatomspektrometrie leichter Elemente mit Subnanometer-Tiefenauflösung." Doctoral thesis, 2011. https://tud.qucosa.de/id/qucosa%3A25920.
Повний текст джерелаIn this thesis the QQDS magnetic spectrometer that is used for high resolution ion beam analysis (IBA) of light elements at the Helmholtz-Zentrum Dresden-Rossendorf is presented for the first time. In addition all parameters are investigated that influence the analysis. Methods and models are presented with which the effects can be minimised or calculated. There are five focal points of this thesis. The first point is the construction and commissioning of the QQDS magnetic spectrometer, the corresponding scattering chamber with all the peripherals and the detector, which is specially developed for high resolution elastic recoil detection. Both the reconstructed spectrometer and the detector were adapted to the specific experimental conditions needed for high-resolution Ion beam analysis of light elements and tested for routine practice. The detector consists of two compo-nents. At the back end of the detector a Bragg ionization chamber is mounted, which is used for the particle identification. At the front end, directly behind the entrance window a proportional counter is mounted. This proportional counter includes a high-resistance anode. Thus, the position of the particles is determined in the detector. The following two points concern fundamental studies of ion-solid interaction. By using a magnetic spectrometer the charge state distribution of the particles scattered from the sample after a binary collision is both possible and necessary for the analysis. For this reason the charge states are measured and compared with existing models. In addition, a model is developed that takes into account the charge state dependent energy loss. It is shown that without the application of this model the depth profiles do not correspond with the quantitative measurements by conventional IBA methods and with the thickness obtained by transmission electron microscopy. The second fundamental ion-solid interaction is the damage and the modification of the sample that occurs during heavy ion irradiation. It is shown that the used energies occur both electronic sputtering and electronically induced interface mixing. Electronic sputtering is minimised by using optimised beam parameters. For most samples the effect is below the detection limit for a fluence sufficient for the analysis. However, the influence of interface mixing is so strong that it has to be included in the analysis of the layers of the depth profiles. It is concluded from these studies that at the Rossendorf 5 MV tandem accelerator chlorine ions with an energy of 20 MeV deliver the best results. In some cases, such as the analysis of boron, the energy must be reduced to 6.5 MeV in order to retain the electronic sputtering below the detection limit. The fourth focus is the study of the influence of specific sample properties, such as surface roughness, on the shape of a measured energy spectra and respectively on the analysed depth profile. It is shown that knowledge of the roughness of a sample at the surface and at the interfaces for the analysis is needed. In addition, the contribution parameters limiting the depth resolution are calculated and compared with the conventional ion beam analysis. Finally, a comparison is made between the high-resolution ion beam analysis and complementary methods published by other research groups. The fifth and last focus is the analysis of light elements in ultra thin layers. All models presented in this thesis to reduce the influence of beam damage are taken into account. The dynamic non-equilibrium charge state is also included for the quantification of elements. Depth profiling of multilayer systems is demonstrated for systems consisting of SiO2-Si3N4Ox-SiO2 on silicon, boron implantation profiles for ultra shallow junctions and ultra thin oxide layers, such as used as high-k materials.
Книги з теми "Optical surface profiling"
J, Roth Don, and NASA Glenn Research Center, eds. 3-D surface depression profiling using high frequency focused air-coupled ultrasonic pulses. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 1999.
Знайти повний текст джерелаZydroń, Tymoteusz. Wpływ systemów korzeniowych wybranych gatunków drzew na przyrost wytrzymałości gruntu na ścinanie. Publishing House of the University of Agriculture in Krakow, 2019. http://dx.doi.org/10.15576/978-83-66602-46-5.
Повний текст джерелаЧастини книг з теми "Optical surface profiling"
Pant, L. M., Dali R. Burada, A. Ghosh, Gufran S. Khan, and Chandra Shakher. "Optical Surface Profiling Using Beamlet Deflection Method." In Springer Proceedings in Physics, 529–32. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-15-9259-1_121.
Повний текст джерелаLee, Kwon H., and Man S. Wong. "Vertical Profiling of Aerosol Optical Properties From LIDAR Remote Sensing, Surface Visibility, and Columnar Extinction Measurements." In Remote Sensing of Aerosols, Clouds, and Precipitation, 23–43. Elsevier, 2018. http://dx.doi.org/10.1016/b978-0-12-810437-8.00002-5.
Повний текст джерела"Profiling of the Form-Cutting Tools of Optimal Design." In Kinematic Geometry of Surface Machining, 153–216. CRC Press, 2007. http://dx.doi.org/10.1201/9781420063417.ch5.
Повний текст джерелаRossmo, D. Kim, Ian Laverty, and Brad Moore. "Geographic Profiling for Serial Crime Investigation." In Geographic Information Systems and Crime Analysis, 102–17. IGI Global, 2005. http://dx.doi.org/10.4018/978-1-59140-453-8.ch006.
Повний текст джерела"Profiling of Form-Cutting Tools of Optimal Design for Machining a Given Part Surface." In Generation of Surfaces, 279–386. CRC Press, 2014. http://dx.doi.org/10.1201/b16398-12.
Повний текст джерелаТези доповідей конференцій з теми "Optical surface profiling"
Paul Kumar, U., N. Krishna Mohan, and M. P. Kothiyal. "Multiple wavelength interferometry for surface profiling." In Optical Engineering + Applications, edited by Joanna Schmit, Katherine Creath, and Catherine E. Towers. SPIE, 2008. http://dx.doi.org/10.1117/12.793571.
Повний текст джерелаLin, Yao, Peter Z. Takacs, Thomas Tsang, Karen Furenlid, and Runwen Wang. "Development of optical surface-profiling instrumentation." In San Diego '92, edited by Katherine Creath and John E. Greivenkamp. SPIE, 1992. http://dx.doi.org/10.1117/12.139242.
Повний текст джерелаIno, Tomomi, and Toyohiko Yatagai. "Oblique incidence interferometry for gear-tooth surface profiling." In International Symposium on Optical Fabrication, Testing, and Surface Evaluation, edited by Jumpei Tsujiuchi. SPIE, 1992. http://dx.doi.org/10.1117/12.132156.
Повний текст джерелаToba, Hidemitsu, Shigeru Nakayama, Hideaki Homma, Takashi Gemma, and Kiyoshi Uchikawa. "Numerical noise reduction via diffraction for surface profiling interferometry." In SPIE Optical Metrology, edited by Peter H. Lehmann, Wolfgang Osten, and Kay Gastinger. SPIE, 2011. http://dx.doi.org/10.1117/12.888918.
Повний текст джерелаTruax, Bruce E., and James F. Biegen. "Surface profiling-instruments, techniques and applications." In ICALEO® ‘88: Proceedings of the Optical Sensing and Measurement Conference. Laser Institute of America, 1988. http://dx.doi.org/10.2351/1.5058046.
Повний текст джерелаMcMackin, Lenore. "Scalable surface profiling using multiwavelength heterodyne interferometry." In Optical Science and Technology, SPIE's 48th Annual Meeting, edited by John D. Gonglewski, Mikhail A. Vorontsov, and Mark T. Gruneisen. SPIE, 2003. http://dx.doi.org/10.1117/12.511873.
Повний текст джерелаZhao, Hongzhi, Rong Liang, Yongjun Wu, Dacheng Li, and Mang Cao. "Optical heterodyne surface profiling interferometer with automatic focusing." In ISMA '97 International Symposium on Microelectronics and Assembly, edited by Anthony T. S. Ho, Sreenivas Rao, and Lee Ming Cheng. SPIE, 1997. http://dx.doi.org/10.1117/12.284032.
Повний текст джерелаGhim, Young-Sik, Hyug-Gyo Rhee, Angela D. Davies, Ho-Soon Yang, and Yun-Woo Lee. "Optical interferometry for 3D surface profiling of freeform optics." In Computational Optical Sensing and Imaging. Washington, D.C.: OSA, 2014. http://dx.doi.org/10.1364/cosi.2014.jtu5a.2.
Повний текст джерелаFrancini, F., G. Molesini, F. Quercioli, and B. Tiribilli. "Distance Sensing And Surface Profiling With A Spectral Optical Probe." In 1986 Int'l European Conf on Optics, Optical Systems, and Applications, edited by Stefano Sottini and Silvana Trigari. SPIE, 1987. http://dx.doi.org/10.1117/12.937062.
Повний текст джерелаIrick, Steven C., and Wayne R. McKinney. "Advancements in one-dimensional profiling with a long-trace profiler." In International Symposium on Optical Fabrication, Testing, and Surface Evaluation, edited by Jumpei Tsujiuchi. SPIE, 1992. http://dx.doi.org/10.1117/12.132173.
Повний текст джерелаЗвіти організацій з теми "Optical surface profiling"
Ishida, Hatsuo. Application of Optical Theory to Quantitative Surface FT-IR with Emphasis on Molecular Depth Profiling. Fort Belvoir, VA: Defense Technical Information Center, May 1992. http://dx.doi.org/10.21236/ada250525.
Повний текст джерела