Добірка наукової літератури з теми "Noncontact characterization"
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Статті в журналах з теми "Noncontact characterization"
Jen, Cheng-Kuei, Paolo Cielo, Xavier Maldague, and Kamal El-Assal. "Noncontact Ultrasonic Characterization of Ceramics." Journal of the American Ceramic Society 68, no. 6 (June 1985): C—146—C—146. http://dx.doi.org/10.1111/j.1151-2916.1985.tb15222.x.
Повний текст джерелаJones, C. E., M. E. Boyd, W. H. Konkel, S. Perkowitz, and R. Braunstein. "Noncontact electrical characterization of epitaxial HgCdTe." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 4, no. 4 (July 1986): 2056–60. http://dx.doi.org/10.1116/1.574026.
Повний текст джерелаStolyarov, Alexander M., Ryan M. Sullenberger, David R. Crompton, Thomas H. Jeys, Brian G. Saar, and William D. Herzog. "Photothermal speckle modulation for noncontact materials characterization." Optics Letters 40, no. 24 (December 10, 2015): 5786. http://dx.doi.org/10.1364/ol.40.005786.
Повний текст джерелаWang, Xinwei, Zhanrong Zhong, and Jun Xu. "Noncontact thermal characterization of multiwall carbon nanotubes." Journal of Applied Physics 97, no. 6 (March 15, 2005): 064302. http://dx.doi.org/10.1063/1.1854725.
Повний текст джерелаKainerstorfer, J. M., P. D. Smith, and A. H. Gandjbakhche. "Noncontact Wide-Field Multispectral Imaging for Tissue Characterization." IEEE Journal of Selected Topics in Quantum Electronics 18, no. 4 (July 2012): 1343–54. http://dx.doi.org/10.1109/jstqe.2011.2175708.
Повний текст джерелаMogildea, George, Marian Mogildea, Cristina Popa, and Gabriel Chiritoi. "The Assessment of Carbon Dioxide Dissociation Using a Single-Mode Microwave Plasma Generator." Molecules 25, no. 7 (March 28, 2020): 1558. http://dx.doi.org/10.3390/molecules25071558.
Повний текст джерелаSHEN, YANTAO, YONGXIONG WANG, and NING XI. "A MULTIFUNCTIONAL AND PORTABLE OPTICAL SENSOR FOR QUANTITATIVE CHARACTERIZATION OF 3D SURFACE TEXTURE PROPERTIES." International Journal of Information Acquisition 07, no. 04 (December 2010): 269–84. http://dx.doi.org/10.1142/s0219878910002282.
Повний текст джерелаBlumrosen, G., M. Uziel, B. Rubinsky, and D. Porrat. "Noncontact Tremor Characterization Using Low-Power Wideband Radar Technology." IEEE Transactions on Biomedical Engineering 59, no. 3 (March 2012): 674–86. http://dx.doi.org/10.1109/tbme.2011.2177977.
Повний текст джерелаMittleman, D. M., J. Cunningham, M. C. Nuss, and M. Geva. "Noncontact semiconductor wafer characterization with the terahertz Hall effect." Applied Physics Letters 71, no. 1 (July 7, 1997): 16–18. http://dx.doi.org/10.1063/1.119456.
Повний текст джерелаDoss, J. D., D. W. Cooke, C. W. McCabe, and M. A. Maez. "Noncontact methods used for characterization of high‐Tc superconductors." Review of Scientific Instruments 59, no. 4 (April 1988): 659–61. http://dx.doi.org/10.1063/1.1139857.
Повний текст джерелаКниги з теми "Noncontact characterization"
Williams, James H. Characterization of noncontact piezoelectric transducer with conically shaped piezoelement. [Washington, D.C.]: National Aeronautics and Space Administration, Scientific and Technical Information Division, 1988.
Знайти повний текст джерелаCenter, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаNoncontact acousto-ultrasonics for material characterization. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаNoncontact acousto-ultrasonics for material characterization. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаCenter, Lewis Research, ed. Noncontact acousto-ultrasonics for material characterization. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаNational Aeronautics and Space Administration (NASA) Staff. Characterization of Noncontact Piezoelectric Transducer with Conically Shaped Piezoelement. Independently Published, 2018.
Знайти повний текст джерелаЧастини книг з теми "Noncontact characterization"
Johnson, John A., and Nancy M. Carlson. "Noncontact Ultrasonic Sensing of Weld Pools for Automated Welding." In Nondestructive Characterization of Materials, 854–61. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-84003-6_99.
Повний текст джерелаMukherjee, Prajukta, Aritra Acharyya, Hiroshi Inokawa, and Arindam Biswas. "Noncontact Characterization Techniques of GaN-Based Terahertz Devices." In Lecture Notes in Electrical Engineering, 29–42. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-33-4489-1_3.
Повний текст джерелаOhtani, Toshihiro, Hirotsugu Ogi, Tomohiro Morishita, and Masahiko Hirao. "Noncontact Ultrasonic Spectroscopy for Detecting Creep Damage in 2.25Cr-1Mo Steel." In Nondestructive Characterization of Materials VIII, 139–44. Boston, MA: Springer US, 1998. http://dx.doi.org/10.1007/978-1-4615-4847-8_22.
Повний текст джерелаBaykara, Mehmet Z. "Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces." In Surface Science Tools for Nanomaterials Characterization, 273–316. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-662-44551-8_8.
Повний текст джерелаSpicer, James B., and James W. Wagner. "Fiber-optic Based Heterodyne Interferometer for Noncontact Ultrasonic Determination of Acoustic Velocity and Attenuation in Materials." In Nondestructive Characterization of Materials, 691–98. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-84003-6_80.
Повний текст джерелаPrince, P. Grace Kanmani, R. Rajkumar Immanuel, B. Revathy, B. Jeyanthi, J. Premalatha, and A. Sivasangari. "Characterization of Signals of Noncontact Respiration Sensor for Emotion Detection Using Intelligent Techniques." In Health Information Science, 161–74. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-68723-6_7.
Повний текст джерелаCrean, G. M., C. Jeynes, M. G. Somekh, and R. P. Webb. "Characterization of Shallow Junction Ion Implantation Profiles: Correlation Between a Noncontact Photodisplacement Thermal Wave Technique and Rutherford Backscattering Analysis." In ESSDERC ’89, 929–32. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-52314-4_193.
Повний текст джерелаMorita, Seizo, and Yasuhiro Sugawara. "Characterization of semiconductor surfaces with noncontact atomic force microscopy." In Nanotechnology and Nano-Interface Controlled Electronic Devices, 429–53. Elsevier, 2003. http://dx.doi.org/10.1016/b978-044451091-4/50022-4.
Повний текст джерелаEiche, C., W. Joerger, R. Schwarz, and K. W. Benz. "Noncontact characterization of CdTe doped with V or Ti." In Selected Topics in Group IV and II–VI Semiconductors, 271–76. Elsevier, 1996. http://dx.doi.org/10.1016/b978-0-444-82411-0.50135-2.
Повний текст джерелаLee, Christine U., and James F. Glockner. "Case 6.1." In Mayo Clinic Body MRI Case Review, edited by Christine U. Lee and James F. Glockner, 283–84. Oxford University Press, 2014. http://dx.doi.org/10.1093/med/9780199915705.003.0150.
Повний текст джерелаТези доповідей конференцій з теми "Noncontact characterization"
Glay, David, Tuami Lasri, Ahmed Mamouni, and Yves Leroy. "Noncontact microwave material characterization." In International Symposium on Optical Science and Technology, edited by Cam Nguyen. SPIE, 2001. http://dx.doi.org/10.1117/12.450171.
Повний текст джерелаRuzyllo, Jerzy, P. Roman, D. O. Lee, M. Brubaker, and Emil Kamieniecki. "Gate dielectric monitoring using noncontact electrical characterization." In Microelectronic Manufacturing '99, edited by Sergio A. Ajuria and Jerome F. Jakubczak. SPIE, 1999. http://dx.doi.org/10.1117/12.361335.
Повний текст джерелаMa, Zhaoyun, and Lingyu Yu. "Noncontact/Remote Material Characterization Using Ultrasonic Guided Wave Methods." In ASME 2020 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. American Society of Mechanical Engineers, 2020. http://dx.doi.org/10.1115/smasis2020-2288.
Повний текст джерелаChristofferson, James, Daryoosh Vashaee, Ali Shakouri, and Philip Melese. "High-resolution noncontact thermal characterization of semiconductor devices." In Photonics West 2001 - LASE, edited by Kenneth W. Tobin, Jr. and Fred Lakhani. SPIE, 2001. http://dx.doi.org/10.1117/12.429354.
Повний текст джерелаMurtagh, Martin E., Patrick Kelly, Breda O'Looney, Frank Murphy, and Mircea Modreanu. "Heterojunction bipolar transistor characterization using noncontact optical spectroscopy." In OPTO Ireland, edited by Thomas J. Glynn. SPIE, 2003. http://dx.doi.org/10.1117/12.467862.
Повний текст джерелаWhitaker, John F., Gerard A. Mourou, and Kul A. Bhasin. "Millimeter-wave MMIC characterization by noncontact electro-optic sampling." In 1987 Twelth International Conference on Infrared and Millimeter Waves. IEEE, 1987. http://dx.doi.org/10.1109/irmm.1987.9126925.
Повний текст джерелаXiao, Wenfeng, Stephen Howden, and Lingyu Yu. "Composite bond quality nondestructive evaluation with noncontact Lamb wave system." In Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV, edited by Peter J. Shull, Tzu-Yang Yu, Andrew L. Gyekenyesi, and H. Felix Wu. SPIE, 2020. http://dx.doi.org/10.1117/12.2558296.
Повний текст джерелаCumani, Aldo, Antonio Guiducci, Paolo Grattoni, and Giuseppe Pettiti. "Characterization of commercial solid state TV cameras for noncontact metrology." In Optical Tools for Manufacturing and Advanced Automation, edited by Sabry F. El-Hakim. SPIE, 1993. http://dx.doi.org/10.1117/12.162119.
Повний текст джерелаLafond, Emmanuel F., Joseph P. Gerhardstein, and Pierre H. Brodeur. "Noncontact characterization of static paper materials using a photorefractive interferometer." In Nondestructive Evaluation Techniques for Aging Infrastructures & Manufacturing, edited by David M. Pepper. SPIE, 1999. http://dx.doi.org/10.1117/12.339967.
Повний текст джерелаEllison, Joseph F., and Steven VanKerkhove. "Characterization of symmetric aberrations in aspheric surfaces using noncontact profilometry." In Optical Science and Technology, SPIE's 48th Annual Meeting, edited by H. Philip Stahl. SPIE, 2004. http://dx.doi.org/10.1117/12.508042.
Повний текст джерелаЗвіти організацій з теми "Noncontact characterization"
Baral, Aniruddha, Jeffery Roesler, and Junryu Fu. Early-age Properties of High-volume Fly Ash Concrete Mixes for Pavement: Volume 2. Illinois Center for Transportation, September 2021. http://dx.doi.org/10.36501/0197-9191/21-031.
Повний текст джерела