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Статті в журналах з теми "Near-field microwave microscopy"

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Автор: Grafiati

Опубліковано: 30 травня 2022

Оновлено: 31 травня 2022

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1

Knoll, B., F. Keilmann, A. Kramer, and R. Guckenberger. "Contrast of microwave near-field microscopy." Applied Physics Letters 70, no. 20 (May 19, 1997): 2667–69. http://dx.doi.org/10.1063/1.119255.

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2

Reznik, A. N., and M. A. Galin. "Wave effects in near-field microwave microscopy." Bulletin of the Russian Academy of Sciences: Physics 78, no. 12 (December 2014): 1367–73. http://dx.doi.org/10.3103/s1062873814120387.

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3

Cortés, R., V. Coello, R. Arriaga, and N. Elizondo. "Collection mode near-field scanning microwave microscopy." Optik 125, no. 10 (May 2014): 2400–2404. http://dx.doi.org/10.1016/j.ijleo.2013.10.085.

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4

Gao, C., and X. D. Xiang. "Quantitative microwave near-field microscopy of dielectric properties." Review of Scientific Instruments 69, no. 11 (November 1998): 3846–51. http://dx.doi.org/10.1063/1.1149189.

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5

Farina, Marco, Davide Mencarelli, Andrea Di Donato, Giuseppe Venanzoni, and Antonio Morini. "Calibration Protocol for Broadband Near-Field Microwave Microscopy." IEEE Transactions on Microwave Theory and Techniques 59, no. 10 (October 2011): 2769–76. http://dx.doi.org/10.1109/tmtt.2011.2161328.

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6

Imtiaz, Atif, Marc Pollak, Steven M. Anlage, John D. Barry, and John Melngailis. "Near-field microwave microscopy on nanometer length scales." Journal of Applied Physics 97, no. 4 (February 15, 2005): 044302. http://dx.doi.org/10.1063/1.1844614.

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7

Belichenko, Viktor, Andrey Zapasnoy, and Aleksandr Mironchev. "Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials." MATEC Web of Conferences 155 (2018): 01021. http://dx.doi.org/10.1051/matecconf/201815501021.

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Анотація:

A schematic solution of the near-field interference microwave microscopy technology is discussed. This solution is implemented in the form of a maximally simplified microscope structure. Testing was conducted to determine the capabilities of this microscope. It is shown that technology can be used to solve a number of hygroscopy and defectoscopy problems.

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8

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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Анотація:

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

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9

Gao, Chen, Tao Wei, Fred Duewer, Yalin Lu, and X. D. Xiang. "High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope." Applied Physics Letters 71, no. 13 (September 29, 1997): 1872–74. http://dx.doi.org/10.1063/1.120444.

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10

Bakli, Hind, Kamel Haddadi, and Tuami Lasri. "Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications." IEEE Transactions on Instrumentation and Measurement 63, no. 5 (May 2014): 1281–86. http://dx.doi.org/10.1109/tim.2013.2296416.

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11

Zhang, Qinxin, and Paul J. McGinn. "Imaging of oxide dielectrics by near-field microwave microscopy." Journal of the European Ceramic Society 25, no. 4 (April 2005): 407–16. http://dx.doi.org/10.1016/j.jeurceramsoc.2004.02.013.

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12

Kantor, R., and I. V. Shvets. "Measurement of electric-field intensities using scanning near-field microwave microscopy." IEEE Transactions on Microwave Theory and Techniques 51, no. 11 (November 2003): 2228–34. http://dx.doi.org/10.1109/tmtt.2003.818938.

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13

Chen, Yi-Chun, Yeong-Der Yao, Yun-Shuo Hsieh, Hsiu-Fung Cheng, Chih-Ta Chia, and I.-Nan Lin. "Microwave Dielectric Mechanism Studied by Microwave Near-Field Microscopy and Raman Spectroscopy." Journal of Electroceramics 13, no. 1-3 (July 2004): 281–86. http://dx.doi.org/10.1007/s10832-004-5113-z.

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14

Friedman, Barry, Brian Oetiker, and Kiejin Lee. "A Finite Element Model of Near-Field Scanning Microwave Microscopy." Journal of the Korean Physical Society 52, no. 3 (March 15, 2008): 588–94. http://dx.doi.org/10.3938/jkps.52.588.

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15

Rammal, Jamal, Olivier Tantot, Nicolas Delhote, and Serge Verdeyme. "Near-field microwave microscopy for the characterization of dielectric materials." International Journal of Microwave and Wireless Technologies 6, no. 6 (September 2, 2014): 549–54. http://dx.doi.org/10.1017/s175907871400110x.

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Анотація:

In this paper, we present a near-field microwave microscopy method for the characterization of dielectric materials samples in the Industrial, Scientific and Medical (ISM) band. The system proposed is composed of a probe coupled to a dielectric resonator (DR) operating in the TE011mode. Latter this is used to fix the resonance frequency of the resonator at 2.45 GHz. This system is used for the characterization of dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms, but a small plane surface.The same device is used for a multi-frequency characterization (4–20 GHz) using resonance frequencies of the cavity instead of one resonance frequency of the DR.

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16

Haddadi, Kamel, Jaouad Marzouk, Sijia Gu, Steve Arscott, Gilles Dambrine, and Tuami Lasri. "Interferometric Near-field Microwave Microscopy Platform for Electromagnetic Micro-analysis." Procedia Engineering 87 (2014): 388–91. http://dx.doi.org/10.1016/j.proeng.2014.11.733.

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17

Weber, J. C., P. T. Blanchard, A. W. Sanders, A. Imtiaz, T. M. Wallis, K. J. Coakley, K. A. Bertness, P. Kabos, N. A. Sanford, and V. M. Bright. "Gallium nitride nanowire probe for near-field scanning microwave microscopy." Applied Physics Letters 104, no. 2 (January 13, 2014): 023113. http://dx.doi.org/10.1063/1.4861862.

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18

Coakley, K. J., S. Berweger, T. M. Wallis, and P. Kabos. "Disentangling topographic contributions to near-field scanning microwave microscopy images." Ultramicroscopy 197 (February 2019): 53–64. http://dx.doi.org/10.1016/j.ultramic.2018.11.003.

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19

Talanov, Vladimir V., Christopher Del Barga, Lee Wickey, Irakli Kalichava, Edward Gonzales, Eric A. Shaner, Aaron V. Gin, and Nikolai G. Kalugin. "Few-Layer Graphene Characterization by Near-Field Scanning Microwave Microscopy." ACS Nano 4, no. 7 (June 10, 2010): 3831–38. http://dx.doi.org/10.1021/nn100493f.

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20

Tselev, Alexander. "Near-Field Microwave Microscopy: Subsurface Imaging for In Situ Characterization." IEEE Microwave Magazine 21, no. 10 (October 2020): 72–86. http://dx.doi.org/10.1109/mmm.2020.3008241.

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21

Berweger, Samuel, T. Mitch Wallis, and Pavel Kabos. "Nanoelectronic Characterization: Using Near-Field Microwave Microscopy for Nanotechnological Research." IEEE Microwave Magazine 21, no. 10 (October 2020): 36–51. http://dx.doi.org/10.1109/mmm.2020.3008305.

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22

Chu, Zhaodong, Lu Zheng, and Keji Lai. "Microwave Microscopy and Its Applications." Annual Review of Materials Research 50, no. 1 (July 1, 2020): 105–30. http://dx.doi.org/10.1146/annurev-matsci-081519-011844.

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Анотація:

Understanding the nanoscale electrodynamic properties of a material at microwave frequencies is of great interest for materials science, condensed matter physics, device engineering, and biology. With specialized probes, sensitive detection electronics, and improved scanning platforms, microwave microscopy has become an important tool for cutting-edge materials research in the past decade. In this article, we review the basic components and data interpretation of microwave imaging and its broad range of applications. In addition to the general-purpose mapping of permittivity and conductivity, microwave microscopy is now exploited to perform quantitative measurements on semiconductor devices, photosensitive materials, ferroelectric domains and domain walls, and acoustic-wave systems. Implementation of the technique in low-temperature and high-magnetic-field chambers has also led to major discoveries in quantum materials with strong correlation and topological order. We conclude the review with an outlook of the ultimate resolution, operation frequency, and future industrial and academic applications of near-field microwave microscopy.

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23

Rosner, Björn T., Toralf Bork, Vivek Agrawal, and Daniel W. van der Weide. "Microfabricated silicon coaxial field sensors for near-field scanning optical and microwave microscopy." Sensors and Actuators A: Physical 102, no. 1-2 (December 2002): 185–94. http://dx.doi.org/10.1016/s0924-4247(02)00341-2.

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24

Machida, Tadashi, Marat B. Gaifullin, Shuuichi Ooi, Takuya Kato, Hideaki Sakata, and Kazuto Hirata. "Local Measurement of Microwave Response with Local Tunneling Spectra Using Near Field Microwave Microscopy." Applied Physics Express 2 (February 13, 2009): 025006. http://dx.doi.org/10.1143/apex.2.025006.

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25

Karbassi, A., C. A. Paulson, A. B. Kozyrev, M. Banerjee, Y. Wang, and D. W. van der Weide. "Quadraxial probe for high resolution near-field scanning rf/microwave microscopy." Applied Physics Letters 89, no. 15 (October 9, 2006): 153113. http://dx.doi.org/10.1063/1.2358945.

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26

Reznik, Alexander N., and Sergey A. Korolyov. "Monopole antenna in quantitative near-field microwave microscopy of planar structures." Journal of Applied Physics 119, no. 9 (March 7, 2016): 094504. http://dx.doi.org/10.1063/1.4943068.

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27

Gu, Sijia, Tianjun Lin, and Tuami Lasri. "Dielectric properties characterization of saline solutions by near-field microwave microscopy." Measurement Science and Technology 28, no. 1 (December 6, 2016): 014014. http://dx.doi.org/10.1088/1361-6501/28/1/014014.

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28

Lee, Jonghee, Christian J. Long, Haitao Yang, Xiao-Dong Xiang, and Ichiro Takeuchi. "Atomic resolution imaging at 2.5 GHz using near-field microwave microscopy." Applied Physics Letters 97, no. 18 (November 2010): 183111. http://dx.doi.org/10.1063/1.3514243.

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29

Ben Mbarek, Sofiane, Fethi Choubani, and Bernard Cretin. "Investigation of new micromachined coplanar probe for near-field microwave microscopy." Microsystem Technologies 24, no. 7 (February 7, 2018): 2887–93. http://dx.doi.org/10.1007/s00542-018-3766-9.

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30

Tselev, Alexander, Nickolay V. Lavrik, Andrei Kolmakov, and Sergei V. Kalinin. "Scanning Near-Field Microwave Microscopy of VO2and Chemical Vapor Deposition Graphene." Advanced Functional Materials 23, no. 20 (April 2, 2013): 2635–45. http://dx.doi.org/10.1002/adfm.201203435.

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31

Berweger, Samuel, Robert Tyrell-Ead, Houchen Chang, Mingzhong Wu, Na Zhu, Hong X. Tang, Hans Nembach, et al. "Imaging of magnetic excitations in nanostructures with near-field microwave microscopy." Journal of Magnetism and Magnetic Materials 546 (March 2022): 168870. http://dx.doi.org/10.1016/j.jmmm.2021.168870.

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32

Feng, Tao, Tian Wen Pang, Wei Qiang Sun, and Sheng Yong Xu. "Microwave Near-Field Detection of the Ion Concentration in Sealed Fluidic Systems." Advanced Materials Research 699 (May 2013): 904–8. http://dx.doi.org/10.4028/www.scientific.net/amr.699.904.

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Анотація:

We have developed a near-field scanning microwave microscopy (NSMM) system that contains a high-quality factor resonator, a sharp metallic probe tip, a 6-degree scanning stage and a vector network analyzer. By applying incident GHz microwaves through the probe tip over samples under test and measuring the magnitude and phase shift of the reflection parameter S11, we have precisely detected the ion concentration of electrolytes in a variety of fluidic systems which are sealed under a 50 μm thick dielectric cover. As expected, the measured magnitude of S11 monotonically increases with the ion concentration, but not linearly, and is sensitive to the tip-sample spacing. This technique offers a useful way for on-site, real-time monitoring of the changes in electrolyte fluids of limited volume in a sealed device. Further work is needed to reveal the exact correlation between the deflection magnitude and ion concentration.

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33

Yamasue, Kohei, and Yasuo Cho. "Boxcar Averaging Scanning Nonlinear Dielectric Microscopy." Nanomaterials 12, no. 5 (February 26, 2022): 794. http://dx.doi.org/10.3390/nano12050794.

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Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors. This microscopy method has often been combined with contact-mode atomic force microscopy (AFM) for simultaneous topography imaging and contact force regulation. The combination SNDM with intermittent contact AFM is also beneficial for imaging a sample prone to damage and using a sharp microscopy tip for improving spatial resolution. However, SNDM with intermittent contact AFM can suffer from a lower signal-to-noise (S/N) ratio than that with contact-mode AFM because of the shorter contact time for a given measurement time. In order to improve the S/N ratio, we apply boxcar averaging based signal acquisition suitable for SNDM with intermittent contact AFM. We develop a theory for the S/N ratio of SNDM and experimentally demonstrate the enhancement of the S/N ratio in SNDM combined with peak-force tapping (a trademark of Bruker) AFM. In addition, we apply the proposed method to the carrier concentration distribution imaging of atomically thin van der Waals semiconductors. The proposed method clearly visualizes an anomalous electron doping effect on few-layer Nb-doped MoS2. The proposed method is also applicable to other scanning near-field microwave microscopes combined with peak-force tapping AFM such as scanning microwave impedance microscopy. Our results indicate the possibility of simultaneous nanoscale topographic, electrical, and mechanical imaging even on delicate samples.

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34

Takeuchi, I., T. Wei, Fred Duewer, Y. K. Yoo, X. D. Xiang, V. Talyansky, S. P. Pai, G. J. Chen, and T. Venkatesan. "Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films." Applied Physics Letters 71, no. 14 (October 6, 1997): 2026–28. http://dx.doi.org/10.1063/1.119776.

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35

Usanov, D. A., A. V. Skripal’, A. V. Abramov, A. S. Bogolyubov, B. N. Korotin, V. B. Feklistov, D. V. Ponomarev, and A. P. Frolov. "Near-field microwave microscopy of nanometer-scale metal layers on dielectric substrates." Semiconductors 46, no. 13 (December 2012): 1622–26. http://dx.doi.org/10.1134/s1063782612130179.

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36

Wu, Zhe, Zhiliao Du, Kun Peng, Weiwei Gan, Xianfeng Zhang, Gao Liu, Shan Yang, Jianlong Liu, Yubin Gong, and Baoqing Zeng. "Defect Detection in Graphene Preparation Based on Near-Field Scanning Microwave Microscopy." IEEE Microwave and Wireless Components Letters 30, no. 8 (August 2020): 757–60. http://dx.doi.org/10.1109/lmwc.2020.3006233.

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37

Karbassi, A., D. Ruf, A. D. Bettermann, C. A. Paulson, Daniel W. van der Weide, H. Tanbakuchi, and R. Stancliff. "Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement." Review of Scientific Instruments 79, no. 9 (2008): 094706. http://dx.doi.org/10.1063/1.2953095.

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38

Imtiaz, Atif, Thomas Mitchell Wallis, and Pavel Kabos. "Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology." IEEE Microwave Magazine 15, no. 1 (January 2014): 52–64. http://dx.doi.org/10.1109/mmm.2013.2288711.

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39

Balusek, Curtis, Barry Friedman, Darwin Luna, Brian Oetiker, Arsen Babajanyan, and Kiejin Lee. "A three-dimensional finite element model of near-field scanning microwave microscopy." Journal of Applied Physics 112, no. 8 (October 15, 2012): 084318. http://dx.doi.org/10.1063/1.4759253.

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40

Gu, Sijia, Xin Zhou, Tianjun Lin, Henri Happy, and Tuami Lasri. "Broadband non-contact characterization of epitaxial graphene by near-field microwave microscopy." Nanotechnology 28, no. 33 (July 20, 2017): 335702. http://dx.doi.org/10.1088/1361-6528/aa7a36.

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41

Qureshi, Naser, Oleg V. Kolokoltsev, César L. Ordoñez-Romero, and Guillermo López-Maldonado. "An active resonator based on magnetic films for near field microwave microscopy." Journal of Applied Physics 111, no. 7 (April 2012): 07A504. http://dx.doi.org/10.1063/1.3672081.

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42

Kantor, R., and I. V. Shvets. "Method of increasing spatial resolution of the scanning near-field microwave microscopy." Journal of Applied Physics 93, no. 9 (May 2003): 4979–85. http://dx.doi.org/10.1063/1.1522486.

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43

Hovsepyan, A. B. "Evaluation of local photoconductivity of solar cells by microwave near-field microscopy technique." Journal of Contemporary Physics (Armenian Academy of Sciences) 44, no. 4 (July 2, 2009): 174–77. http://dx.doi.org/10.3103/s1068337209040045.

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44

Coakley, K. J., A. Imtiaz, T. M. Wallis, J. C. Weber, S. Berweger, and P. Kabos. "Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images." Ultramicroscopy 150 (March 2015): 1–9. http://dx.doi.org/10.1016/j.ultramic.2014.11.014.

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45

Galin, M. A., E. V. Demidov, and A. N. Reznik. "Determination of the sheet resistance of semiconductor films via near-field microwave microscopy." Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 8, no. 3 (May 2014): 477–83. http://dx.doi.org/10.1134/s1027451014030045.

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46

Chen, Yi-Chun, Yun-Shuo Hsieh, Hsiu-Fung Cheng, and I.-Nan Lin. "Study of Microwave Dielectric Properties of Perovskite Thin Films by Near-Field Microscopy." Journal of Electroceramics 13, no. 1-3 (July 2004): 261–65. http://dx.doi.org/10.1007/s10832-004-5109-8.

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47

Zhang, Xianfeng, Zhe Wu, Quansong Lan, Zhiliao Du, Quanxin Zhou, Ruirui Jiang, Jianlong Liu, Yubin Gong, and Baoqing Zeng. "Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy." AIP Advances 11, no. 3 (March 1, 2021): 035114. http://dx.doi.org/10.1063/5.0045355.

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48

Lann, A. F., M. Abu-Teir, M. Golosovsky, D. Davidov, A. Goldgirsch, and V. Beilin. "Magnetic-field-modulated microwave reflectivity of high- Tc superconductors studied by near-field mm-wave microscopy." Applied Physics Letters 75, no. 12 (September 20, 1999): 1766–68. http://dx.doi.org/10.1063/1.124813.

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49

Wang, Yahui, Ziqian Wei, Yujie Chen, Quanxin Zhou, Yubin Gong, Baoqing Zeng, and Zhe Wu. "An approach to determine solution properties in micro pipes by near-field microwave microscopy." Journal of Physics: Condensed Matter 34, no. 5 (November 11, 2021): 054001. http://dx.doi.org/10.1088/1361-648x/ac3308.

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Анотація:

Abstract In this article, we propose a quantitative, non-destructive and noninvasive approach to obtain electromagnetic properties of liquid specimens utilizing a home-designed near-field microwave microscopy. The responses of aqueous solutions can be acquired with varying concentrations, types (CaCl2, MgCl2, KCl and NaCl) and tip–sample distances. An electromagnetic simulation model also successfully predicts the behaviors of saline samples. For a certain type of solutions with varying concentrations, the results are concaves with different bottoms, and the symmetric graphs of concave extractions can clearly identify different specimens. Moreover, we obtain electromagnetic images of capillaries with various saline solutions, as well as a Photinia × fraseri Dress leaf.

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50

Kramer, A., F. Keilmann, B. Knoll, and R. Guckenberger. "The coaxial tip as a nano-antenna for scanning near-field microwave transmission microscopy." Micron 27, no. 6 (December 1996): 413–17. http://dx.doi.org/10.1016/s0968-4328(96)00047-9.

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