Добірка наукової літератури з теми "MID-IR photothermal beam deflection"
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Статті в журналах з теми "MID-IR photothermal beam deflection"
Palmer, Richard A., and Matthew J. Smith. "Rapid-scanning Fourier-transform infrared spectroscopy with photothermal beam-deflection (mirage effect) detection at the solid–liquid interface." Canadian Journal of Physics 64, no. 9 (September 1, 1986): 1086–92. http://dx.doi.org/10.1139/p86-187.
Повний текст джерелаVarlashkin, P. G., and M. J. D. Low. "IR spectral depth profiling using fourier transform photothermal beam deflection." Infrared Physics 26, no. 3 (May 1986): 171–78. http://dx.doi.org/10.1016/0020-0891(86)90020-5.
Повний текст джерелаVarlashkin, P. G., and M. J. D. Low. "FT-IR Photothermal Beam Deflection Spectroscopy of Solids Submerged in Liquids." Applied Spectroscopy 40, no. 8 (November 1986): 1170–76. http://dx.doi.org/10.1366/0003702864507783.
Повний текст джерелаYounes, J., Z. Harajli, M. Soueidan, D. Fabrègue, Y. Zaatar, and M. Kazan. "Mid-IR photothermal beam deflection technique for fast measurement of thermal diffusivity and highly sensitive subsurface imaging." Journal of Applied Physics 127, no. 17 (May 7, 2020): 173101. http://dx.doi.org/10.1063/1.5144174.
Повний текст джерелаVarlashkin, P. G., and M. J. D. Low. "FT-IR Photothermal Beam Deflection Spectroscopy of Black Inks on Paper." Applied Spectroscopy 40, no. 4 (May 1986): 507–13. http://dx.doi.org/10.1366/0003702864508999.
Повний текст джерелаLow, M. J. D., and C. Morterra. "Infrared Surface Studies of Opaque or Scattering Materials Using Photothermal Beam Deflection Spectroscopy." Adsorption Science & Technology 2, no. 2 (June 1985): 131–50. http://dx.doi.org/10.1177/026361748500200206.
Повний текст джерелаSmith, Matthew J., and Richard A. Palmer. "The Reverse Mirage Effect: Catching the Thermal Wave at the Solid/Liquid Interface." Applied Spectroscopy 41, no. 7 (September 1987): 1106–13. http://dx.doi.org/10.1366/0003702874447437.
Повний текст джерелаEinsiedel, Heiko, Maximilian Kreiter, Mario Leclerc, and Silvia Mittler-Neher. "Photothermal beam deflection spectroscopy in the near IR on poly[3-alkylthiophene]s." Optical Materials 10, no. 1 (March 1998): 61–68. http://dx.doi.org/10.1016/s0925-3467(97)00141-9.
Повний текст джерелаPeoples, Margie E., Matthew J. Smith, and Richard A. Palmer. "FT-IR Photothermal Beam Deflection Spectroscopy (PBDS) Studies of Polymer-Modified Graphite Electrodes." Applied Spectroscopy 41, no. 7 (September 1987): 1257–59. http://dx.doi.org/10.1366/0003702874447608.
Повний текст джерелаVarlashkin, P. G., M. J. D. Low, G. A. Parodi, and C. Morterra. "A Comparison of FT-IR/PA and FT-IR/PBD Spectra of Powders." Applied Spectroscopy 40, no. 5 (July 1986): 636–41. http://dx.doi.org/10.1366/0003702864508539.
Повний текст джерелаДисертації з теми "MID-IR photothermal beam deflection"
Harajli, Zeinab. "Synthesis, characterisation and thermal evaluation of a new generation of metalised ceramic materials." Thesis, Lyon, 2022. http://www.theses.fr/2022LYSEI016.
Повний текст джерелаEfficient thermal management is often considered a key step towards a successful technological system. The fast removal of excess heat from electronic systems exposed to temperature extremes improves the reliability and prevents the premature failure of these systems. Nowadays, the usual approaches to evacuate heat and maintain the system at the desired temperature consist in using a semiconductor heat sink or a complex fan speed control system that relies on continuous temperature measurement. However, the optimization of a highly efficient semiconductor heat sink requires the control of diverse intrinsic and extrinsic properties at different scales because the macroscopic thermal flow and heat transport depend on microscopic vibrational properties. Besides, widespread use of highly efficient semiconductor heat sinks requires the ability to metalize them and form multilayer structures. Due to its high phonon group velocities, Aluminium Nitride (AlN) appears to be one of the best candidates for the manufacturing of efficient semiconductor heat sinks. In this PhD. thesis work, we intend to develop a new substrate technology Metal/AlN/Metal structures with high thermal diffusivity for integrated power systems for high-temperature applications (>300°C). This PhD. Aims at developing highly efficient, integrated and reliable power electronics technologies operating at high temperatures for automotive, aeronautic, and energy applications
Частини книг з теми "MID-IR photothermal beam deflection"
Palmer, R. A., M. J. Smith, C. J. Manning, J. L. Chao, A. C. Boccara, and D. Fournier. "Step-and-Integrate Interferometry in the Mid-Infrared with Photothermal Beam Deflection and Sample-Gas-Microphone Detection." In Photoacoustic and Photothermal Phenomena, 50–52. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988. http://dx.doi.org/10.1007/978-3-540-48181-2_12.
Повний текст джерелаТези доповідей конференцій з теми "MID-IR photothermal beam deflection"
Shen, Sheng, Avind Narayanaswamy, Shireen Goh, and Gang Chen. "Thermal Conductance of Bi-Material AFM Cantilevers." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68078.
Повний текст джерелаTofighi, Salimeh, Natalia Munera, David J. Hagan, and Eric W. Van Stryland. "Beam Deflection Measurement of Air n2 in Mid-IR." In Frontiers in Optics. Washington, D.C.: OSA, 2019. http://dx.doi.org/10.1364/fio.2019.jw3a.43.
Повний текст джерелаTofighi, Salimeh, Natalia Munera, Munan Gao, David J. Hagan, and Eric W. Van Stryland. "Beam Deflection Measurements of Transient Nonlinear Refraction in Air in the Mid-IR." In Nonlinear Optics. Washington, D.C.: OSA, 2019. http://dx.doi.org/10.1364/nlo.2019.nm3a.3.
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