Статті в журналах з теми "Microwave microscopy"
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Antoniou, Nicholas. "Scanning Microwave Impedance Microscopy: Overview and Low Temperature Operation." EDFA Technical Articles 25, no. 1 (February 1, 2023): 9–13. http://dx.doi.org/10.31399/asm.edfa.2023-1.p009.
Повний текст джерелаGao, Chen, Fred Duewer, and X. D. Xiang. "Quantitative microwave evanescent microscopy." Applied Physics Letters 75, no. 19 (November 8, 1999): 3005–7. http://dx.doi.org/10.1063/1.125216.
Повний текст джерелаChu, Zhaodong, Lu Zheng, and Keji Lai. "Microwave Microscopy and Its Applications." Annual Review of Materials Research 50, no. 1 (July 1, 2020): 105–30. http://dx.doi.org/10.1146/annurev-matsci-081519-011844.
Повний текст джерелаLeonard, J. B., and S. P. Shepardson. "A comparison of heating modes in rapid fixation techniques for electron microscopy." Journal of Histochemistry & Cytochemistry 42, no. 3 (March 1994): 383–91. http://dx.doi.org/10.1177/42.3.8308256.
Повний текст джерелаAnderson, Geoffrey. "Scanning Microwave Microscopy for Nanoscale Electrical Characterization." Microscopy Today 21, no. 6 (November 2013): 32–36. http://dx.doi.org/10.1017/s1551929513000965.
Повний текст джерелаAnlage, S. M., C. P. Vlahacos, S. Dutta, and F. C. Wellstood. "Scanning microwave microscopy of active superconducting microwave devices." IEEE Transactions on Appiled Superconductivity 7, no. 2 (June 1997): 3686–89. http://dx.doi.org/10.1109/77.622218.
Повний текст джерелаSun, Jie, Wei Ming Shi, Wei Guang Yang, Ping Sheng Zhou, and Lin Jun Wang. "Ni-Induced Lateral Fast Crystallization of Amorphous Silicon Film by Microwave Annealing." Advanced Materials Research 337 (September 2011): 133–37. http://dx.doi.org/10.4028/www.scientific.net/amr.337.133.
Повний текст джерелаSchichnes, Denise, Jeffrey A. Nemson, and Steven E. Ruzin. "Microwave Protocols for Plant and Animal Paraffin Microtechnique." Microscopy Today 13, no. 3 (May 2005): 50–53. http://dx.doi.org/10.1017/s1551929500051658.
Повний текст джерелаLai, K., W. Kundhikanjana, H. Peng, Y. Cui, M. A. Kelly, and Z. X. Shen. "Tapping mode microwave impedance microscopy." Review of Scientific Instruments 80, no. 4 (April 2009): 043707. http://dx.doi.org/10.1063/1.3123406.
Повний текст джерелаMeckenstock, R., D. Spoddig, D. Dietzel, and J. Pelzl. "Scanning thermal microwave resonance microscopy." Superlattices and Microstructures 35, no. 3-6 (March 2004): 289–95. http://dx.doi.org/10.1016/j.spmi.2003.09.001.
Повний текст джерелаXiang, X. D., and C. Gao. "Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscope." Materials Characterization 48, no. 2-3 (April 2002): 117–25. http://dx.doi.org/10.1016/s1044-5803(02)00277-2.
Повний текст джерелаZheng, Lu, Linbo Shao, Marko Loncar, and Keji Lai. "Imaging Acoustic Waves by Microwave Microscopy: Microwave Impedance Microscopy for Visualizing Gigahertz Acoustic Waves." IEEE Microwave Magazine 21, no. 10 (October 2020): 60–71. http://dx.doi.org/10.1109/mmm.2020.3008240.
Повний текст джерелаHioki, Tomosato, Tomonao Araki, Kosuke Umemura, Koujiro Hoshi, and Eiji Saitoh. "Real-space observation of standing spin-wave modes in a magnetic disk." Applied Physics Letters 121, no. 13 (September 26, 2022): 132402. http://dx.doi.org/10.1063/5.0098772.
Повний текст джерелаGao, Chen, Tao Wei, Fred Duewer, Yalin Lu, and X. D. Xiang. "High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope." Applied Physics Letters 71, no. 13 (September 29, 1997): 1872–74. http://dx.doi.org/10.1063/1.120444.
Повний текст джерелаGiberson, R. T. "Advances in Microwave-Assisted Processing For Electron Microscopy." Microscopy and Microanalysis 7, S2 (August 2001): 1192–93. http://dx.doi.org/10.1017/s1431927600032037.
Повний текст джерелаShan, Jun-Yi, Adam Pierce, and Eric Y. Ma. "Universal signal scaling in microwave impedance microscopy." Applied Physics Letters 121, no. 12 (September 19, 2022): 123507. http://dx.doi.org/10.1063/5.0115833.
Повний текст джерелаAbdullah, Iram. "Manufacturing of Kevlar/Polyester Composite by Resin Transfer Moulding using Conventional and Microwave Heating." Pakistan Journal of Scientific & Industrial Research Series A: Physical Sciences 58, no. 1 (April 27, 2015): 34–40. http://dx.doi.org/10.52763/pjsir.phys.sci.58.1.2015.34.40.
Повний текст джерелаLiu, Ya Jing, Tao Jiang, Zhi Deng, Xiang Xin Xue, and Pei Ning Duan. "Stuy on Microwave-Assisted Grinding of Low-Grade Ludwigite." Materials Science Forum 814 (March 2015): 214–19. http://dx.doi.org/10.4028/www.scientific.net/msf.814.214.
Повний текст джерелаZhang, Zhenrong, Huanfei Wen, Liangjie Li, Tao Pei, Hao Guo, Zhonghao Li, Jun Tang, and Jun Liu. "Developments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy." Scanning 2022 (August 12, 2022): 1–15. http://dx.doi.org/10.1155/2022/1306000.
Повний текст джерелаDixon-Warren, St J., and B. Drevniok. "Practical Quantitative Scanning Microwave Impedance Microscopy." EDFA Technical Articles 19, no. 3 (August 1, 2017): 22–27. http://dx.doi.org/10.31399/asm.edfa.2017-3.p022.
Повний текст джерелаPrevite, Michael J. R., and Chris D. Geddes. "Fluorescence microscopy in a microwave cavity." Optics Express 15, no. 18 (August 29, 2007): 11640. http://dx.doi.org/10.1364/oe.15.011640.
Повний текст джерелаTuca, Silviu-Sorin, Manuel Kasper, Ferry Kienberger, and Georg Gramse. "Interferometer Scanning Microwave Microscopy: Performance Evaluation." IEEE Transactions on Nanotechnology 16, no. 6 (November 2017): 991–98. http://dx.doi.org/10.1109/tnano.2017.2725383.
Повний текст джерелаKnoll, B., F. Keilmann, A. Kramer, and R. Guckenberger. "Contrast of microwave near-field microscopy." Applied Physics Letters 70, no. 20 (May 19, 1997): 2667–69. http://dx.doi.org/10.1063/1.119255.
Повний текст джерелаHern�ndez, F., and R. Guill�n. "Microwave Processing for Scanning Electron Microscopy." European Journal of Morphology 38, no. 2 (April 1, 2000): 109–11. http://dx.doi.org/10.1076/0924-3860(200004)38:2;1-f;ft109.
Повний текст джерелаReznik, A. N., S. A. Korolyov, and M. N. Drozdov. "Microwave microscopy of diamond semiconductor structures." Journal of Applied Physics 121, no. 16 (April 28, 2017): 164503. http://dx.doi.org/10.1063/1.4982676.
Повний текст джерелаLogin, Gary R., and Ann M. Dvorak. "Methods of Microwave Fixation for Microscopy." Progress in Histochemistry and Cytochemistry 27, no. 4 (January 1994): iii—119. http://dx.doi.org/10.1016/s0079-6336(11)80021-5.
Повний текст джерелаAmster, Oskar, Fred Stanke, Stuart Friedman, Yongliang Yang, St J. Dixon-Warren, and B. Drevniok. "Practical quantitative scanning microwave impedance microscopy." Microelectronics Reliability 76-77 (September 2017): 214–17. http://dx.doi.org/10.1016/j.microrel.2017.07.082.
Повний текст джерелаPetrali, John P., and Kenneth R. Mills. "Microwave-Assisted Immunoelectron Microscopy of Skin." Microscopy and Microanalysis 4, S2 (July 1998): 1114–15. http://dx.doi.org/10.1017/s1431927600025691.
Повний текст джерелаGerrity, Ross G., and George W. Forbes. "Microwave Processing in Diagnostic Electron Microscopy." Microscopy and Microanalysis 8, S02 (August 2002): 152–53. http://dx.doi.org/10.1017/s1431927602102157.
Повний текст джерелаGerrity, Ross G., and George W. Forbes. "Microwave Processing in Diagnostic Electron Microscopy." Microscopy Today 11, no. 6 (December 2003): 38–41. http://dx.doi.org/10.1017/s155192950005344x.
Повний текст джерелаChintala, Ravi Chandra, and Yongliang Yang. "Advances in Scanning Microwave Impedance Microscopy." Microscopy and Microanalysis 26, S2 (July 30, 2020): 2494–95. http://dx.doi.org/10.1017/s1431927620021777.
Повний текст джерелаJoffe, Roman, Reuven Shavit, and Eugene Kamenetskii. "Multiresonance Measurement Method for Microwave Microscopy." IEEE Transactions on Instrumentation and Measurement 66, no. 8 (August 2017): 2174–80. http://dx.doi.org/10.1109/tim.2017.2674338.
Повний текст джерелаSeifert, W., E. Gerner, M. Stachel, and K. Dransfeld. "Scanning tunneling microscopy at microwave frequencies." Ultramicroscopy 42-44 (July 1992): 379–87. http://dx.doi.org/10.1016/0304-3991(92)90296-v.
Повний текст джерелаHumer, I., O. Bethge, M. Bodnarchuk, M. Kovalenko, M. Yarema, W. Heiss, H. P. Huber, et al. "Scanning microwave microscopy and scanning capacitance microscopy on colloidal nanocrystals." Journal of Applied Physics 109, no. 6 (March 15, 2011): 064313. http://dx.doi.org/10.1063/1.3553867.
Повний текст джерелаIadarola, Linda, and Paul Webster. "Can Microwave Ovens Reduce Immunocytochemical Labeling Times?" Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 38–39. http://dx.doi.org/10.1017/s042482010016265x.
Повний текст джерелаSanders, MA, TE Anderson, and R. Giberson. "Microwave Methods - Evidence to Support a Microwave Effect." Microscopy and Microanalysis 12, S02 (July 31, 2006): 296–97. http://dx.doi.org/10.1017/s1431927606068966.
Повний текст джерелаYamasue, Kohei, and Yasuo Cho. "Boxcar Averaging Scanning Nonlinear Dielectric Microscopy." Nanomaterials 12, no. 5 (February 26, 2022): 794. http://dx.doi.org/10.3390/nano12050794.
Повний текст джерелаZhi, Qingong, Wenhan Guan, and Yongjing Guo. "Pyrolysis Process of Microwave-Enhanced Recovery of Sucker Rod Carbon Fiber Composite." International Journal of Heat and Technology 40, no. 1 (February 28, 2022): 151–56. http://dx.doi.org/10.18280/ijht.400118.
Повний текст джерелаBelichenko, Viktor, Andrey Zapasnoy, and Aleksandr Mironchev. "Near-Field Interference Microwave Diagnostics of Cultural Plants and Wood Materials." MATEC Web of Conferences 155 (2018): 01021. http://dx.doi.org/10.1051/matecconf/201815501021.
Повний текст джерелаBuchanan, JoAnn. "Microwave Processing of Drosophila Tissues for Electron Microscopy." Microscopy Today 12, no. 6 (November 2004): 42. http://dx.doi.org/10.1017/s1551929500065986.
Повний текст джерелаDemaree, R. S. "Microwave Tissue Procesing: History and SEM Techniques." Microscopy and Microanalysis 7, S2 (August 2001): 1190–91. http://dx.doi.org/10.1017/s1431927600032025.
Повний текст джерелаGordienko, Yu Ye, I. M. Shcherban, and A. V. Levchenko. "NATURALIZATION OF IMAGES IN SCANNING MICROWAVE MICROSCOPY." Telecommunications and Radio Engineering 76, no. 19 (2017): 1769–75. http://dx.doi.org/10.1615/telecomradeng.v76.i19.70.
Повний текст джерелаReznik, A. N., and M. A. Galin. "Wave effects in near-field microwave microscopy." Bulletin of the Russian Academy of Sciences: Physics 78, no. 12 (December 2014): 1367–73. http://dx.doi.org/10.3103/s1062873814120387.
Повний текст джерелаCui, Yong-Tao, Eric Yue Ma, and Zhi-Xun Shen. "Quartz tuning fork based microwave impedance microscopy." Review of Scientific Instruments 87, no. 6 (June 2016): 063711. http://dx.doi.org/10.1063/1.4954156.
Повний текст джерелаJohnston, Scott R., Eric Yue Ma, and Zhi-Xun Shen. "Optically coupled methods for microwave impedance microscopy." Review of Scientific Instruments 89, no. 4 (April 2018): 043703. http://dx.doi.org/10.1063/1.5011391.
Повний текст джерелаLogin, G. R., W. B. Stavinoha, and A. M. Dvorak. "Ultrafast microwave energy fixation for electron microscopy." Journal of Histochemistry & Cytochemistry 34, no. 3 (March 1986): 381–87. http://dx.doi.org/10.1177/34.3.3950387.
Повний текст джерелаMartín Pimentel, P., B. Leven, B. Hillebrands, and H. Grimm. "Kerr microscopy studies of microwave assisted switching." Journal of Applied Physics 102, no. 6 (September 15, 2007): 063913. http://dx.doi.org/10.1063/1.2783997.
Повний текст джерелаSchweinböck, T., and S. Hommel. "Quantitative Scanning Microwave Microscopy: A calibration flow." Microelectronics Reliability 54, no. 9-10 (September 2014): 2070–74. http://dx.doi.org/10.1016/j.microrel.2014.07.024.
Повний текст джерелаHommel, S., N. Killat, T. Schweinboeck, A. Altes, and F. Kreupl. "Resolving trapping effects by scanning microwave microscopy." Microelectronics Reliability 92 (January 2019): 179–81. http://dx.doi.org/10.1016/j.microrel.2018.11.018.
Повний текст джерелаHumphrey, E. "Microwave Processing in a Modern Microscopy Facilty." Microscopy and Microanalysis 12, S02 (July 31, 2006): 194–95. http://dx.doi.org/10.1017/s1431927606069340.
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