Книги з теми "Microstructure and Characterization"
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Brandon, D. G. Microstructural characterization of materials. 2nd ed. Chichester, England: John Wiley, 2008.
Знайти повний текст джерелаA, Leonhardt Todd, and United States. National Aeronautics and Space Administration., eds. Fluorescence microscopy for the characterization of structural integrity. [Washington, DC]: National Aeronautics and Space Administration, 1991.
Знайти повний текст джерелаD, Kaplan Wayne, ed. Microstructural characterization of materials. Chichester: J. Wiley, 1999.
Знайти повний текст джерелаStruble, Leslie J. Epoxy impregnation of hardened cement pastes for characterization of microstructure. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Знайти повний текст джерела1953-, Gerhardt Rosario A., Taylor S. R. 1953-, and Garboczi Edward J, eds. Electrically based microstructural characterization: Symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1996.
Знайти повний текст джерелаSingh, Jag J. Microstructural characterization of polymers by positron lifetime spectroscopy. [Washington, D.C: National Aeronautics and Space Administration, 1996.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration., ed. Microstructural characterization of polymers by positron lifetime spectroscopy. [Washington, D.C: National Aeronautics and Space Administration, 1996.
Знайти повний текст джерелаA, Leonhardt T., and United States. National Aeronautics and Space Administration., eds. Microstructural characterization of reaction-formed silicon carbide ceramics. [Washington, D.C: National Aeronautics and Space Administration, 1995.
Знайти повний текст джерелаSingh, M. Microstructural characterization of reaction-formed silicon carbide ceramics. [Washington, D.C: National Aeronautics and Space Administration, 1995.
Знайти повний текст джерелаZ, Voyiadjis G., American Society of Mechanical Engineers. Materials Division., ASME Summer Structural Mechanics Conference (1992 : Tempe, Ariz.), and ASME Summer Materials Conference (1992 : Tempe, Ariz.), eds. Microstructural characterization in constitutive modeling of metals and granular media. New York, N.Y: American Society of Mechanical Engineers, 1992.
Знайти повний текст джерелаN, Shenoy R., and Langley Research Center, eds. Microstructural characterization of aluminum-lithium alloys 1460 and 2195. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1998.
Знайти повний текст джерелаN, Shenoy R., and Langley Research Center, eds. Microstructural characterization of aluminum-lithium alloys 1460 and 2195. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1998.
Знайти повний текст джерела1953-, Gerhardt Rosario A., Alim Mohammad A, and Taylor S. R. 1953-, eds. Electrically based microstructural characterization II: Symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A. Warrendale, Pa: Materials Research Society, 1998.
Знайти повний текст джерелаCuevas, Antonio Contreras, Ramiro Pérez Campos, and Rodrigo A. Esparza Muñoz. Structural and chemical characterization of metals, alloys and compounds: Selected peer reviewed papers from the International Materials Research Congress (IMRC 2012), Symposium on Structural and Chemical Characterization of Metals, Alloys and Compounds, August 12-17, 2012, Cancun, Mexico. Durnten-Zurich, Switzerland: TTP, Trans Tech Publications Ltd., 2013.
Знайти повний текст джерелаRamiro, Pérez Campos, Contreras Cuevas Antonio, Esparza Muñoz Rodrigo A, Materials Research Society, Mexican Materials Research Society, and International Materials Research Congress (20th : 2011 : Cancún, Mexico), eds. Structural and chemical characterization of metals, alloys and compounds, 2011: Symposium held August 14-19, 2011, Cancún, Mexico. Warrendale, Pa: Materials Research Society, 2012.
Знайти повний текст джерелаSingh, Jag J. Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy. [Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1997.
Знайти повний текст джерелаSingh, Jag J. Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1996.
Знайти повний текст джерелаH, Pater Ruth, Eftekhari Abe, and Langley Research Center, eds. Microstructural characterization of semi-interpenetrating polymer networks by positron lifetime spectroscopy. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1996.
Знайти повний текст джерелаR, Wheeler Donald, Dickerson Robert M, and United States. National Aeronautics and Space Administration., eds. Tensile strength and microstructural characterization of uncoated and coated HPZ ceramic fibers. [Washington, DC]: National Aeronautics and Space Administration, 1996.
Знайти повний текст джерелаA, DiCarlo James, and NASA Glenn Research Center, eds. Thermomechanical characterization of SiC fiber tows and implications for CMC. [Cleveland, Ohio]: National Aeronautics and Space Administration, Glenn Research Center, 1999.
Знайти повний текст джерелаBansal, Narottam P. Microstructural, chemical and mechanical characterization of polymer-derived Hi-Nicalon fibers with surface coatings. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаBansal, Narottam P. Microstructural, chemical and mechanical characterization of polymer-derived Hi-Nicalon fibers with surface coatings. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаJ, Verrilli Michael, Gabb Timothy Paul 1958-, and United States. National Aeronautics and Space Administration., eds. Characterization of failure processes in tungsten copper composites under fatigue loading conditions. [Washington, D.C.]: NASA, 1989.
Знайти повний текст джерелаH, Titran Robert, and United States. National Aeronautics and Space Administration., eds. Characterization of the microstructure of Nb-1wt%Zr-0.1%C tubes as affected by thermomechanical processing. [Washington, DC: National Aeronautics and Space Administration, 1994.
Знайти повний текст джерелаJ, Birt M., and Langley Research Center, eds. Characterization of Al-Cu-Li alloy 2090 near net shape extrusion. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1998.
Знайти повний текст джерелаRong, Yonghua. Characterization of Microstructures by Analytical Electron Microscopy (AEM). Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20119-6.
Повний текст джерелаCharacterization of Microstructures by Analytical Electron Microscopy (AEM). Berlin, Heidelberg: Springer Berlin Heidelberg, 2012.
Знайти повний текст джерелаYoo, Abraham. Microstructural and magnetic characterization of electrodeposited nanocrystalline nickel. Ottawa: National Library of Canada, 2003.
Знайти повний текст джерелаProceeding of the 106th Annual Meeting of the American Ceramic Society, Indianapolis, Indiana, USA (2004). Characterization and modeling control sintered ceramic microstructures and properties. Westerville, OH: American Ceramic Society, 2004.
Знайти повний текст джерела1951-, Stoller R. E., U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., and Oak Ridge National Laboratory, eds. Microstructural characterization of selected AEA/UCSB model FeCuMn alloys. Washington, DC: Division of Engineering Technology, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1996.
Знайти повний текст джерелаS, Neogy, and Bhabha Atomic Research Centre, eds. Understanding hydride formation in Zr-1Nb alloy through microstructural characterization. Mumbai: Bhabha Atomic Research Centre, 2003.
Знайти повний текст джерелаSingh, Jag J. Low-energy positron flux generator for microstructural characterization of thin films. Hampton, Va: Langley Research Center, 1991.
Знайти повний текст джерелаAbe, Eftekhari, St Clair Terry L, and United States. National Aeronautics and Space Administration. Scientific and Technical Information Division., eds. Low-energy positron flux generator for microstructural characterization of thin films. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1991.
Знайти повний текст джерелаSingh, Jag J. Low-energy positron flux generator for microstructural characterization of thin films. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, 1991.
Знайти повний текст джерелаCenter, Lewis Research, ed. Tensile properties and microstructural characterization of Hi-Nicalon SiC/RBSN composites. [Cleveland, Ohio]: National Aeronautics and Space Administration, Lewis Research Center, 1998.
Знайти повний текст джерелаSymposium on Composites: Processing, Microstructure, and Properties (1990 Orlando, Fla.). Advanced composite materials: Processing, microstructures, bulk, and interfacial properties, characterization methods, and applications. Westerville, Ohio: American Ceramic Society, 1991.
Знайти повний текст джерелаHalladay, Timothy R. Microstructural characterization of TI-44AL-11NB in the chill-cast and directionally solidified configurations. Monterey, Calif: Naval Postgraduate School, 1998.
Знайти повний текст джерела(Editor), David D. Brandon, and Wayne D. Kaplan (Editor), eds. Microstructural Characterization of Materials. 2nd ed. John Wiley & Sons Inc, 2008.
Знайти повний текст джерелаŪnlū, M. Selim, Javier Piqueras, Nader M. Kalkhoran, and Takashi Sekiguchi. Optical Microstructural Characterization of Semiconductors: Volume 588. University of Cambridge ESOL Examinations, 2014.
Знайти повний текст джерелаKaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2008.
Знайти повний текст джерелаKaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2013.
Знайти повний текст джерелаMicrostructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2000.
Знайти повний текст джерелаBrandon, David D., and Wayne D. Kaplan. Microstructural Characterization of Materials. Wiley & Sons, Limited, John, 2008.
Знайти повний текст джерелаMicrostructural Characterization of Materials. 2nd ed. Wiley, 2008.
Знайти повний текст джерелаKaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2008.
Знайти повний текст джерелаGerhardt, Rosario A., Mohammed A. Alim, and S. Ray Taylor. Electrically Based Microstructural Characterization II: Volume 500. University of Cambridge ESOL Examinations, 2014.
Знайти повний текст джерелаMicrostructural Characterization of Metals and Alloys. Inst of Materials Ashgate Pub, 1986.
Знайти повний текст джерелаKaplan, Wayne D., and David Brandon. Microstructural Characterization of Materials. Wiley & Sons, Incorporated, John, 2013.
Знайти повний текст джерелаSong, Yujun. Characterization of Condensed Matter: Composition, Microstructure, and Surface Methods. Wiley & Sons, Limited, John, 2023.
Знайти повний текст джерелаChoi, Gyeong Man, Rosario A. Gerhardt, Andrew P. Washabaugh, and M. A. Alim. Electrically Based Microstructural Characterization III: Volume 699. University of Cambridge ESOL Examinations, 2014.
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