Статті в журналах з теми "Microscopy – Data processing"
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Rosenthaler, L., H. ‐R Hidber, A. Tonin, L. Eng, U. Staufer, R. Wiesendanger, and H. ‐J Güntherodt. "Data processing for scanning tunneling microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 6, no. 2 (March 1988): 393–97. http://dx.doi.org/10.1116/1.575402.
Повний текст джерелаKrivanek, O. L., W. J. de Ruijter, C. E. Meyer, M. L. Leber, and J. Wilbrink. "Data acquisition and processing for automated electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 546–47. http://dx.doi.org/10.1017/s0424820100148563.
Повний текст джерелаNečas, David, and Petr Klapetek. "Synthetic Data in Quantitative Scanning Probe Microscopy." Nanomaterials 11, no. 7 (July 2, 2021): 1746. http://dx.doi.org/10.3390/nano11071746.
Повний текст джерелаYoung, P. A., A. Grislis, P. R. Barber, P. J. Keely, and K. W. Eliceiri. "Data Processing for Time-Domain Fluorescence Lifetime Imaging Microscopy." Microscopy and Microanalysis 19, S2 (August 2013): 758–59. http://dx.doi.org/10.1017/s1431927613005783.
Повний текст джерелаRowenhorst, D. J., and A. C. Lewis. "Image processing and analysis of 3-D microscopy data." JOM 63, no. 3 (March 2011): 53–57. http://dx.doi.org/10.1007/s11837-011-0046-x.
Повний текст джерелаSarahan, MC, QM Ramasse, and ND Browning. "Data Processing Techniques for Aberration-Corrected STEM." Microscopy and Microanalysis 16, S2 (July 2010): 112–13. http://dx.doi.org/10.1017/s1431927610055327.
Повний текст джерелаNevernov, Igor, Marco Sartore, and Riccardo Galletti. "Object-oriented data model for scanning probe microscopy image processing." Image and Vision Computing 14, no. 6 (June 1996): 435–43. http://dx.doi.org/10.1016/0262-8856(95)01069-6.
Повний текст джерелаHattne, Johan, Francis E. Reyes, Brent L. Nannenga, Dan Shi, M. Jason de la Cruz, Andrew G. W. Leslie, and Tamir Gonen. "MicroED data collection and processing." Acta Crystallographica Section A Foundations and Advances 71, no. 4 (July 1, 2015): 353–60. http://dx.doi.org/10.1107/s2053273315010669.
Повний текст джерелаCueva, P., R. Hovden, J. A. Mundy, H. L. Xin, and D. A. Muller. "New Approaches to Data Processing for Atomic Resolution EELS." Microscopy and Microanalysis 18, S2 (July 2012): 970–71. http://dx.doi.org/10.1017/s1431927612006708.
Повний текст джерелаMoeck, Peter, Taylor Bilyeu, Axel Mainzer Koenig, and Jack Straton. "Advances in Crystallographic Image Processing for Scanning Probe Microscopy." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1607. http://dx.doi.org/10.1107/s2053273314083922.
Повний текст джерелаNefedev, Konstantin, Vitalii Y. Kapitan, and Yuriy Shevchenko. "The Inverse Task for Magnetic Force Microscopy Data." Applied Mechanics and Materials 328 (June 2013): 744–47. http://dx.doi.org/10.4028/www.scientific.net/amm.328.744.
Повний текст джерелаAmat, Fernando, Burkhard Höckendorf, Yinan Wan, William C. Lemon, Katie McDole, and Philipp J. Keller. "Efficient processing and analysis of large-scale light-sheet microscopy data." Nature Protocols 10, no. 11 (October 1, 2015): 1679–96. http://dx.doi.org/10.1038/nprot.2015.111.
Повний текст джерелаHugelier, S., M. Sliwa, and C. Ruckebusch. "A Perspective on Data Processing in Super-resolution Fluorescence Microscopy Imaging." Journal of Analysis and Testing 2, no. 3 (July 2018): 193–209. http://dx.doi.org/10.1007/s41664-018-0076-2.
Повний текст джерелаFuchs, H., W. Eustachi, and R. Seifert. "A data acquisition and image processing system for scanning tunneling microscopy." Scanning 11, no. 3 (1989): 139–46. http://dx.doi.org/10.1002/sca.4950110305.
Повний текст джерелаPeters, Klaus-Ruediger, and Eisaku Oho. "New digital image processing technology for FSEM microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 212–13. http://dx.doi.org/10.1017/s0424820100146904.
Повний текст джерелаNewell, Bruce D. "Image processing and analysis fundamentals for microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 678–79. http://dx.doi.org/10.1017/s0424820100139767.
Повний текст джерелаPichkur, Evgeny, Timur Baimukhametov, Anton Teslyuk, Anton Orekhov, Roman Kamyshinsky, Yury Chesnokov, Viacheslav Ilyin, Alexander Vasiliev, and Vasily Velikhov. "Towards on-the-fly Cryo-Electron Microscopy Data Processing by High Performance Data Analysis." Journal of Physics: Conference Series 955 (January 2018): 012005. http://dx.doi.org/10.1088/1742-6596/955/1/012005.
Повний текст джерелаJones, L., and P. D. Nellist. "Post-processing of STEM Data for Instability and Drift Compensation." Microscopy and Microanalysis 18, S2 (July 2012): 1232–33. http://dx.doi.org/10.1017/s143192761200801x.
Повний текст джерелаWeis, Felix, and Wim J. H. Hagen. "Combining high throughput and high quality for cryo-electron microscopy data collection." Acta Crystallographica Section D Structural Biology 76, no. 8 (July 27, 2020): 724–28. http://dx.doi.org/10.1107/s2059798320008347.
Повний текст джерелаDodson, T. A., T. A. Nolan, L. F. Allard, and E. Völki. "Building Data Storage Systems And Data Networks To Support Digital Microscopy." Microscopy Today 3, no. 9 (November 1995): 12–13. http://dx.doi.org/10.1017/s1551929500065792.
Повний текст джерелаRheinberger, Jan, Gert Oostergetel, Guenter P. Resch, and Cristina Paulino. "Optimized cryo-EM data-acquisition workflow by sample-thickness determination." Acta Crystallographica Section D Structural Biology 77, no. 5 (April 27, 2021): 565–71. http://dx.doi.org/10.1107/s205979832100334x.
Повний текст джерелаChung, Jeong Min, Clarissa L. Durie, and Jinseok Lee. "Artificial Intelligence in Cryo-Electron Microscopy." Life 12, no. 8 (August 19, 2022): 1267. http://dx.doi.org/10.3390/life12081267.
Повний текст джерелаWaithe, Dominic, Falk Schneider, Jakub Chojnacki, Mathias P. Clausen, Dilip Shrestha, Jorge Bernardino de la Serna, and Christian Eggeling. "Optimized processing and analysis of conventional confocal microscopy generated scanning FCS data." Methods 140-141 (May 2018): 62–73. http://dx.doi.org/10.1016/j.ymeth.2017.09.010.
Повний текст джерелаJiang, Shi-hong, and John G. Walker. "Non-scanning fluorescence confocal microscopy using speckle illumination and optical data processing." Optics Communications 256, no. 1-3 (December 2005): 35–45. http://dx.doi.org/10.1016/j.optcom.2005.06.055.
Повний текст джерелаClausen, Alexander, Dieter Weber, Karina Ruzaeva, Vadim Migunov, Anand Baburajan, Abijith Bahuleyan, Jan Caron, et al. "LiberTEM: Software platform for scalable multidimensional data processing in transmission electron microscopy." Journal of Open Source Software 5, no. 50 (June 20, 2020): 2006. http://dx.doi.org/10.21105/joss.02006.
Повний текст джерелаBlack, D. L., S. C. Stoker, and J. R. Minter. "Hybrid Imaging in Electron Microscopy." Microscopy and Microanalysis 7, S2 (August 2001): 840–41. http://dx.doi.org/10.1017/s1431927600030270.
Повний текст джерелаDodson, T. A., T. A. Nolan, L. F. Allard, and E. Völkl. "Building data storage systems and data networks to support digital microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 32–33. http://dx.doi.org/10.1017/s0424820100136532.
Повний текст джерелаChiaramonti, Ann N., and Laurence D. Marks. "Atomic Resolution Transmission Electron Microscopy of Surfaces." Journal of Materials Research 20, no. 7 (July 1, 2005): 1619–27. http://dx.doi.org/10.1557/jmr.2005.0211.
Повний текст джерелаFaruqi, A. R., and Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy." Quarterly Reviews of Biophysics 33, no. 1 (February 2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.
Повний текст джерелаKozubek, Michal, Petr Matula, Pavel Matula, and Stanislav Kozubek. "Automated acquisition and processing of multidimensional image data in confocal in vivo microscopy." Microscopy Research and Technique 64, no. 2 (2004): 164–75. http://dx.doi.org/10.1002/jemt.20068.
Повний текст джерелаWuhrer, R., and K. Moran. "Post Processing Hyper-Spectral Data and Generating More Information from X-ray Maps." Microscopy and Microanalysis 19, S2 (August 2013): 828–29. http://dx.doi.org/10.1017/s1431927613006132.
Повний текст джерелаMaluenda, D., T. Majtner, P. Horvath, J. L. Vilas, A. Jiménez-Moreno, J. Mota, E. Ramírez-Aportela, et al. "Flexible workflows for on-the-fly electron-microscopy single-particle image processing using Scipion." Acta Crystallographica Section D Structural Biology 75, no. 10 (October 1, 2019): 882–94. http://dx.doi.org/10.1107/s2059798319011860.
Повний текст джерелаXiao, Xianghui, Zhengrui Xu, Feng Lin, and Wah-Keat Lee. "TXM-Sandbox: an open-source software for transmission X-ray microscopy data analysis." Journal of Synchrotron Radiation 29, no. 1 (January 1, 2022): 266–75. http://dx.doi.org/10.1107/s1600577521011978.
Повний текст джерелаOliver, William R. "Image Processing and Scientific Misconduct." Microscopy Today 6, no. 4 (May 1998): 12–13. http://dx.doi.org/10.1017/s1551929500067213.
Повний текст джерелаTietz, R. "Principles and Practice of On-Line Data Acquisition For Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 528–29. http://dx.doi.org/10.1017/s0424820100181397.
Повний текст джерелаPerdigão, Luís M. A., Neville B. y. Yee, Elaine M. L. Ho, Avery H. Pennington, Oliver N. F. King, Michele C. Darrow, and Mark Basham. "Computing for Optimized Biological Microscopy Data Processing and Analysis at The Rosalind Franklin Institute." Microscopy and Microanalysis 28, S1 (July 22, 2022): 1462–64. http://dx.doi.org/10.1017/s1431927622005931.
Повний текст джерелаHuber, Daniel E., John M. Sosa, Jim Riedel, Chas D. Ellerbrock, and D. M. McComb. "Implementing High Performance Workstation Virtualization for Data Processing in a Multi-User Microscopy Facility." Microscopy and Microanalysis 23, S1 (July 2017): 1070–71. http://dx.doi.org/10.1017/s1431927617006018.
Повний текст джерелаSungur, E., G. Taupier, O. Crégut, D. Gindre, L. Pieuchot, J. L. Evrard, A. C. Schmit, L. Mager, and K. D. Dorkenoo. "Multiphotonic microscopy as a processing tool for optical data storage and imaging in biophysics." Annales de Physique 32, no. 2-3 (2007): 147–49. http://dx.doi.org/10.1051/anphys:2008029.
Повний текст джерелаBeverte, Ilze. "Determination of highly porous plastic foam structural characteristics by processing light microscopy images data." Journal of Applied Polymer Science 131, no. 4 (July 3, 2013): n/a. http://dx.doi.org/10.1002/app.39477.
Повний текст джерелаEdbert, Daniel, Ni Made Mertaniasih, Pepy Dwi Endraswari, and Eko Budi Koendhori. "Light wave filtration by colored cellophane to optimize microscopic contrast ratio in pulmonary tuberculosis sputum observation." F1000Research 11 (March 1, 2022): 254. http://dx.doi.org/10.12688/f1000research.109146.1.
Повний текст джерелаPenczek, P., Ch M. T. Spahn, R. K. Agrawal, I. S. Gabashvili, R. A. Grassucci, and J. Frank. "Advances in High Resolution Cryo-EM Studies: the Quartenary Structure of the 70S E.Coli Ribosome Revealed at 11.5Å Resolution." Microscopy and Microanalysis 6, S2 (August 2000): 262–63. http://dx.doi.org/10.1017/s1431927600033808.
Повний текст джерелаWells, Wendy A., Michael Thrall, Anastasia Sorokina, Jeffrey Fine, Savitri Krishnamurthy, Attiya Haroon, Babar Rao, et al. "In Vivo and Ex Vivo Microscopy: Moving Toward the Integration of Optical Imaging Technologies Into Pathology Practice." Archives of Pathology & Laboratory Medicine 143, no. 3 (December 10, 2018): 288–98. http://dx.doi.org/10.5858/arpa.2018-0298-ra.
Повний текст джерелаEschweiler, Dennis, Malte Rethwisch, Mareike Jarchow, Simon Koppers, and Johannes Stegmaier. "3D fluorescence microscopy data synthesis for segmentation and benchmarking." PLOS ONE 16, no. 12 (December 2, 2021): e0260509. http://dx.doi.org/10.1371/journal.pone.0260509.
Повний текст джерелаMAURER, MAURICIO RAFAEL, HELIO PEDRINI, and MARCO ANTONIO FERREIRA RANDI. "PROCESSING AND VISUALIZATION OF LIGHT MICROSCOPE IMAGES." International Journal of Image and Graphics 09, no. 03 (July 2009): 369–88. http://dx.doi.org/10.1142/s0219467809003484.
Повний текст джерелаWakonig, Klaus, Hans-Christian Stadler, Michal Odstrčil, Esther H. R. Tsai, Ana Diaz, Mirko Holler, Ivan Usov, Jörg Raabe, Andreas Menzel, and Manuel Guizar-Sicairos. "PtychoShelves, a versatile high-level framework for high-performance analysis of ptychographic data." Journal of Applied Crystallography 53, no. 2 (March 13, 2020): 574–86. http://dx.doi.org/10.1107/s1600576720001776.
Повний текст джерелаYaminsky, Igor, and Assel Akhmetova. "Atomi c-force microscopy of viruses and bacteria." Medicina i vysokie tehnologii 2 (February 2021): 18–21. http://dx.doi.org/10.34219/2306-3645-2021-11-2-18-21.
Повний текст джерелаErickson, Blake W., Séverine Coquoz, Jonathan D. Adams, Daniel J. Burns, and Georg E. Fantner. "Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing." Beilstein Journal of Nanotechnology 3 (November 13, 2012): 747–58. http://dx.doi.org/10.3762/bjnano.3.84.
Повний текст джерелаFischione, P. E., J. Ringnalda, Y. Feng, T. Krekels, H. O. Colijn, M. J. Mills, and J. M. Wiezorek. "The Use of a Cold Gas Plasma for the Final Processing of Contamination-Free TEM Specimens." Microscopy and Microanalysis 3, S2 (August 1997): 985–86. http://dx.doi.org/10.1017/s1431927600011818.
Повний текст джерелаStoll, E. P. "Picture processing and three-dimensional visualization of data from scanning tunneling and atomic force microscopy." IBM Journal of Research and Development 35, no. 1.2 (January 1991): 67–77. http://dx.doi.org/10.1147/rd.351.0067.
Повний текст джерелаBORRETT, S., and L. HUGHES. "Reporting methods for processing and analysis of data from serial block face scanning electron microscopy." Journal of Microscopy 263, no. 1 (January 21, 2016): 3–9. http://dx.doi.org/10.1111/jmi.12377.
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