Книги з теми "Microscopy – Data processing"

Cheng, P. C. Multidimensional Microscopy. New York, NY: Springer New York, 1994.

Russ, John C. Computer-assisted microscopy: The measurement and analysisof images. New York: Plenum Press, 1990.

Computer operation for microscope photometry. Boca Raton, Fla: CRC Press, 1998.

Russ, John C. Computer-assisted microscopy: The measurement and analysis of images. New York: Plenum Press, 1990.

Sarid, Dror. Exploring scanning probe microscopy with mathematica. 2nd ed. Weinheim: Wiley-VCH, 2007.

Koehler, James K. Advanced Techniques in Biological Electron Microscopy III. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986.

International Metallographic Society. Technical Meeting. Computer-aided microscopy and metallography: Proceedings of the Twenty-Second Annual Technical Meeting of the International Metallographic Society. Columbus, Ohio USA: The Society, 1990.

Gao fen zi yan jiu fang fa. Beijing Shi: Zhongguo shi hua chu ban she, 2011.

Sarid, Dror. Exploring scanning probe microscopy with mathematica. 2nd ed. Weinheim: Wiley-VCH, 2007.

Sarid, Dror. Exploring scanning probe microscopy with Mathematica. New York: Wiley, 1997.

Xing, Zhu, and Ohtsu Motoichi, eds. Near-field optics: Principles and applications : the second Asia-Pacific Workshop on Near Field Optics, Beijing, China, October 20-23, 1999. Singapore: World Scientific, 2000.

Friel, John J. X-ray microanalysis and computer-aided imaging. Princeton, NJ (1200 State Rd., Princeton 08540): PGT, 1990.

Arock, Michel. Autoformation et aide au diagnostic en hématologie avec le logiciel ADH. Paris: Springer-Verlag France, Paris, 2008.

National Research Council (U.S.). Committee on Applied and Theoretical Statistics, ed. Steps toward large-scale data integration in the sciences: Summary of a workshop. Washington, D.C: National Academies Press, 2010.

Dr, Gutiérrez Rafael, ed. Co-existence and co-release of classical neurotransmitters: Ex uno plures. New York, NY: Springer, 2009.

Earnshaw, Rae A. An introductory guide to scientific visualization. Berlin: Springer-Verlag, 1992.

Michel, Mareschal, Holian Brad Lee, and North Atlantic Treaty Organization. Scientific Affairs Division., eds. Microscopic simulations of complex hydrodynamic phenomena. New York: Plenum Press, 1992.

J, Broughton, Krakow William, Pantelides Sokrates T, and Materials Research Society, eds. Computer-based microscopic description of the structure and properties of materials: Symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1986.

Jeffrey, Williams, and Johnson David, eds. NT Server 4 in the enterprise: Microscoft certified systems engineer. Scottsdale, Ariz: Certification Insider Press, 1998.

Hawkes, Peter W. Advances in Imaging and Electron Physics, Volume 144. Burlington: Elsevier, 2006.

Quantitative Data Processing in Scanning Probe Microscopy. Elsevier, 2013. http://dx.doi.org/10.1016/c2011-0-09615-1.

Quantitative Data Processing in Scanning Probe Microscopy. Elsevier, 2018. http://dx.doi.org/10.1016/c2016-0-04404-2.

Goldstein, D. J. Understanding the Light Microscope: A Computer-Aided Introduction (With CD-ROM). Academic Press, 1999.

Understanding the Light Microscope: A Computer-Aided Introduction (With CD-ROM). Academic Press, 1999.

Goldstein, D. J. Understanding the Light Microscope: A Computer-Aided Introduction. Elsevier Science & Technology Books, 1999.

(Editor), Jiang Gu, and Robert W. Ogilvie (Editor), eds. Virtual Microscopy and Virtual Slides in Teaching, Diagnosis, and Research (Advances in Pathology, Microscopy, and Molecular Morphology). CRC, 2005.

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. William Andrew, 2012.

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier, 2018.

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier Science & Technology Books, 2018.

Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology. Elsevier Science & Technology Books, 2012.

Russ, John C. Computer Assisted Microscopy: The Measurement and Analysis of Images. North Carolina State Univ, 1988.

Dr, Gutiérrez Rafael, ed. Co-existence and co-release of classical neurotransmitters: Ex uno plures. New York, NY: Springer, 2009.

Motoichi, Ohtsu, Jutamulia Suganda, Asakura Toshimitsu 1934-, and Society of Photo-optical Instrumentation Engineers., eds. Near-field optics: Physics, devices, and information processing : 22-23 July, 1999, Denver, Colorado. Bellingham, Wash: SPIE, 1999.

Hawkes, Peter W. Advances in Imaging and Electron Physics: Advances in Electron Microscopy and Diffraction. Elsevier Science & Technology Books, 2002.

Suganda, Jutamulia, Asakura Toshimitsu 1934-, and Society of Photo-optical Instrumentation Engineers., eds. Far- and near-field optics: Physics and information processing : 23-24 July 1998, San Diego, California. Bellingham, Wash., USA: SPIE, 1998.

Bertero, Mario, Patrizia Boccacci, and Valeria Ruggiero. Inverse Imaging with Poisson Data: From Cells to Galaxies. Iop Publishing Ltd, 2019.

Hawkes, Peter W., and Martin Hÿtch. Advances in Imaging and Electron Physics: Computer Techniques for Image Processing in Electron Microscopy. Elsevier Science & Technology Books, 2020.

Head, A. K. Computed Electron Micrographs and Defect Identification. Elsevier Science & Technology Books, 2012.

Hawkes, Peter W. Advances in Imaging and Electron Physics: Aberration-Corrected Microscopy. Elsevier Science & Technology Books, 2008.

Sarid, Dror. Exploring Scanning Probe Microscopy with MATHEMATICA. 2nd ed. Wiley-VCH, 2007.

R, Wootton, Springall D. R, and Polak Julia M, eds. Image analysis in histology: Conventional and confocal microscopy. Cambridge: Published in association with the Royal Postgraduage Medical School, University of London by Cambridge University Press, 1995.

(Editor), Xing Zhu, and Motoichi Ohtsu (Editor), eds. 2AP NFO Near-Field Optics: Principes and Applications: The Second Asia Pacific Workshop on Near Field Optics. World Scientific Publishing Company, 2000.

Hawkes, Peter W., Dmitry Greenfield, and Mikhael Monastyrskii. Advances in Imaging and Electron Physics: Selected Problems of Computational Charged Particle Optics. Elsevier Science & Technology Books, 2008.

Advances in Imaging and Electron Physics. Elsevier Science & Technology Books, 2010.

Advances in imaging and electron physics: Optics of charged particle analyzers. London: Academic, 2010.

Nano-optics and Nano-structures (SPIE Proceedings). SPIE Society of Photo-Optical Instrumentation Engi, 2002.

Xing, Zhu, Chou Stephen Y, Arakawa Yasuhiko, Society of Photo-optical Instrumentation Engineers., Zhongguo guang xue xue hui., Shanghai jiao tong da xue., and Guo jia zi ran ke xue ji jin wei yuan hui (China), eds. Nano-optics and nano-structures: 15-16 October, 2002, Shanghai, China. Bellingham, Washington: SPIE, 2003.

Graham, Jim, and Richard Baldock. Image Processing and Analysis. Oxford University Press, 2000.

Hawkes, Peter W. Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy. Elsevier Science & Technology Books, 2009.

Jim, Graham, and Baldock Richard, eds. Image processing and analysis: A practical approach. Oxford: Oxford University Press, 2000.