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Статті в журналах з теми "Microanalyis"

Автор: Grafiati

Опубліковано: 28 вересня 2022

Оновлено: 28 січня 2023

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1

Ashino, R., S. J. Desjardins, C. Heil, M. Nagase, and R. Vaillancourt. "Smooth tight frame wavelets and image microanalyis in the fourier domain." Computers & Mathematics with Applications 45, no. 10-11 (May 2003): 1551–79. http://dx.doi.org/10.1016/s0898-1221(03)00136-6.

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2

Meisenkothen, Frederick, Robert Wheeler, Michael D. Uchic, Robert D. Kerns, and Frank J. Scheltens. "Electron Channeling: A Problem for X-Ray Microanalysis in Materials Science." Microscopy and Microanalysis 15, no. 2 (March 16, 2009): 83–92. http://dx.doi.org/10.1017/s1431927609090242.

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AbstractElectron channeling effects can create measurable signal intensity variations in all product signals that result from the scattering of the electron beam within a crystalline specimen. Of particular interest to the X-ray microanalyst are any variations that occur within the characteristic X-ray signal that are not directly related to a specimen composition variation. Many studies have documented the effect of crystallographic orientation on the local X-ray yield; however, the vast majority of these studies were carried out on thin foil specimens examined in transmission. Only a few studies have addressed these effects in bulk specimen materials, and these analyses were generally carried out at common scanning electron microscope microanalysis overvoltages (>1.5). At these overvoltage levels, the anomalous transmission effect is weak. As a result, the effect of electron channeling on the characteristic X-ray signal intensity has traditionally been overlooked in the field of quantitative electron probe microanalysis. The present work will demonstrate that electron channeling can produce X-ray variations of up to 26%, between intensity maxima and minima, in low overvoltage X-ray microanalyses of bulk specimens. Intensity variations of this magnitude will significantly impact the accuracy of qualitative and quantitative X-ray microanalyses at low overvoltage on engineering structural materials.

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3

Cliff, Graham, and Peter B. Kenway. "Atomic AEM - poissonian problems from gaussian probes!" Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1228–29. http://dx.doi.org/10.1017/s0424820100130778.

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In a previous paper, the authors have described the engineering requirements needed to detect one atom in the analytical electron microscope (AEM) by using x-ray microanalyis. Whilst the requirements to achieve this goal cannot be specified at present for a particular instrument, the specification for machines being developed by Vacuum Generators have a calculated minimum detection limit (MDL) of fewer than 4 atoms. At these detection limits the usual Gaussian statistics which have applied in AEM give way to Poissonian statistics. This paper will look at some of the interesting consequences of AEM at the atomic level.The energy dispersive x-ray spectrometers (EDS) used in AEM have percentage detection limits usually quoted as about 0.1 wt. %. For this to equal 1 atom as the MDL, the analysed volume, defined by the probe diameter and the specimen thickness, must contain about 1000 atoms. For a field emission gun (FEG) on an AEM, sufficient current (1nA) can be obtained in a small enough probe (1nm FWHM) to allow analysis from a volume containing 1000 atoms (assuming adequate x-ray detection sensitivity) if the sample is about 20 atoms thick.

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4

Zaluzec, Nestor J. "Microscopy Society of America." Microscopy and Microanalysis 17, S1 (July 4, 2011): 40–48. http://dx.doi.org/10.1017/s1431927611000742.

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Fellow Microscopists and Microanalysts, Colleagues and most importantly Students, welcome to Microscopy & Microanalysis 2011 here in Nashville, Tennessee, our seventeenth conference under that appellation.

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5

Friel, John J., and Richard B. Mott. "Energy-Dispersive Spectrometry from Then until Now: A Chronology of Innovation." Microscopy and Microanalysis 4, no. 6 (December 1998): 559–66. http://dx.doi.org/10.1017/s1431927698980539.

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Анотація:

As part of the Microbeam Analysis Society (MAS) symposium marking 30 years of energy-dispersive spectrometry (EDS), this article reviews many innovations in the field over those years. Innovations that added a capability previously not available to the microanalyst are chosen for further description. Included are innovations in both X-ray microanalysis and digital imaging using the EDS analyzer.

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6

Berry, J. P., R. Masse, F. Escaig, and P. Galle. "Intracellular Localization of Cerium. A Microanalytical Study using an Electron Microprobe and Ionic Microanalysis." Human Toxicology 8, no. 6 (November 1989): 511–20. http://dx.doi.org/10.1177/096032718900800614.

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Radioactive cerium is a nuclear toxicant. Metallic cerium is used in industry. Aspects of the intracellular metabolism of this element were studied following intraperitoneal injection and aerosol exposure in rat. Two microanalytic methods, an electron microprobe and ionic microanalysis, enabled the sites of incorporation and the process of intracellular concentration of cerium to be determined in the liver, lung, kidney, bone marrow and bone tissue. The very high sensitivity of ionic analysis enabled very low concentrations of cerium to be detected with a spatial resolution of 0.5 μm. Microanalysis by electron microprobe permitted: (i) the lysosomal localization of cerium to be determined; and (ii) the lysosomal coprecipitation of cerium with phosphorus to be demonstrated. Results are discussed in relation to aspects of radiological protection.

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7

Bull, Peter. "The Microanalysis of Political Discourse." Philologia Hispalensis 1, no. 16 (2012): 79–93. http://dx.doi.org/10.12795/ph.2012.v26.i01.04.

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8

Miksza, Peter, Jennifer Blackwell, and Nicholas E. Roseth. "Self-Regulated Music Practice: Microanalysis as a Data Collection Technique and Inspiration for Pedagogical Intervention." Journal of Research in Music Education 66, no. 3 (July 26, 2018): 295–319. http://dx.doi.org/10.1177/0022429418788557.

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Анотація:

The purpose of this study was to explore a microanalysis technique for measuring instrumentalists’ self-regulation tendencies during music practice. A secondary purpose was to investigate whether an intervention informed by the features of the microanalysis technique would increase the students’ self-regulated learning tendencies. Three undergraduate instrumental music education majors volunteered to participate in this study. This study was designed as a multiple-baselines experiment spanning 15 consecutive days. Data sources included (a) entrance interviews; (b) daily practice efficacy ratings; (c) data gathered from pre- and posttest microanalysis sessions; (d) detailed behavioral analyses of video-recorded, pre- and posttest practice sessions; and (e) a focus group exit interview. The microanalytic intervention designed for this study involved a coaching session in which a member of the research team explicitly drew attention to the affective, behavioral, and metacognitive qualities related to effective practicing during a student’s practice session. The pretest microanalysis data revealed distinct learning profiles for each student that were corroborated with information from the other data sources. The intervention had modest effects that varied across participants, suggesting that it was useful for bringing to light and addressing individuals’ specific self-regulatory deficiencies in a manner respective to their needs.

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9

Hunt, J. A., A. J. Strutt, and D. B. Williams. "Quantitative light-element analysis using parallel EELS." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 722–23. http://dx.doi.org/10.1017/s0424820100087926.

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Electron energy-loss spectrometry (EELS) is theoretically superior to x-ray emission spectrometry (XES) for light element microanalysis. The x-ray fluorescence yield decreases proportional to Z4, thus dramatically reducing characteristic x-ray production. However, the ionization cross section increases and so EELS becomes more efficient as Z decreases. Despite these advantages light element microanalysis using XES is often preferred to EELS. There are two major reasons why EELS is not more widespread. First, very thin specimens are needed to minimize plural scattering so quantification can proceed assuming single scattering. Secondly, many experimental variables make EELS difficult, particularly for microanalysts accustomed to the x-ray 'turn-key' approach to quantification. The former problem is being overcome with multiple least-squares (MLS) fitting deconvolution routines, while the latter has largely been solved by the development of parallel EELS (PEELS) and powerful analysis software. In this paper we show the quality of data currently available using PEELS.

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10

Long, J. V. P. "Microanalysis." Micron 24, no. 2 (January 1993): 143–48. http://dx.doi.org/10.1016/0968-4328(93)90065-9.

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11

Hamburger, Andreas. "Rhythmus, Störung und Reenactment." Paragrana 27, no. 1 (August 28, 2018): 62–77. http://dx.doi.org/10.1515/para-2018-0004.

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AbstractThis chapter presents “Scenic Narrative Microanalysis” and its potential contribution to research on significant interactive moments. It discusses the method’s roots at the intersection of two paradigm shifts. The first is the interactive turn in psychoanalysis, which itself is situated within the overarching cultural context of a performative turn. Second, as an approach addressing short-term interactions (moments), SNMA points to the temporal turn in sociology, economics and technology, the background for microanalytic infant research approaches that have been influential since the 1970s. Finally, the future prospects of interdisciplinary method triangulation within the research group are discussed.

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12

Lyman, Charles. "One Year with the Re-Styled Magazine." Microscopy Today 18, no. 4 (July 2010): 5. http://dx.doi.org/10.1017/s1551929510000519.

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This is the seventh issue of Microscopy Today in its new format. The re-styled magazine has received favorable comments from both readers and advertisers. Article submission has increased, and many authors have used Microscopy Today to highlight and summarize their work published in other venues. In this issue we begin two new occasional departments. One is called “Microscopy Protocols.” I invite readers to contribute protocols and procedures useful for microscopists and microanalysts. The other new department is called “Your Point of View” where we will publish the results of periodic surveys concerning the microscopy and microanalysis communities.

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13

Griffin, Brenden J. "Meeting of the Australian Microbeam Analysis Society, University of Sydney, February 16–19, 1999: Introduction." Microscopy and Microanalysis 6, no. 1 (January 2000): 11. http://dx.doi.org/10.1017/s1431927600010114.

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In February 1999, an international workshop on environmental scanning electron microscopy (ESEM) was held following the fifth biennial symposium of the Australian Microbeam Analysis Society (AMAS V) in Sydney, Australia. In conjunction with this meeting was the second conference of the Australian Scanned Probe Microscope Society (SPM II). The coincidence of timing allowed a strong international flavor at these sessions, which attracted 160 microscopists and microanalysts from around the world. This issue of Microscopy and Microanalysis presents a selection of full-length papers on ESEM, and the following issue will feature full-length papers from SPM II.

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14

Scott, John Henry J. "Microanalysis Society." Microscopy and Microanalysis 17, S1 (July 4, 2011): 50–56. http://dx.doi.org/10.1017/s1431927611000754.

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Анотація:

On behalf of the membership of the Microanalysis Society (MAS), welcome to Microscopy and Microanalysis 2011 and to Nashville. The Microscopy and Microanalysis (M&M) meeting was established in 1996 as the joint annual meeting of the Microscopy Society of America (MSA) and MAS. Since 2002, M&M has also served as the annual meeting of the International Metallographic Society (IMS), and it is now the premier meeting in our field, spanning the full spectrum of activities in microanalysis and the varied disciplines of microscopy. I thank my counterparts in the joining societies, MSA President Nestor Zaluzec and IMS President Nat Saenz, for all the time and effort they have invested to make this meeting a success.

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15

Nordquist, G. "Kalecki's microanalysis." History of Political Economy 21, no. 2 (January 1, 1989): 400–402. http://dx.doi.org/10.1215/00182702-21-2-400.

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16

Adams, F., A. Adriaens, P. Berghmans, and K. Janssens. "Surface microanalysis." Analytica Chimica Acta 283, no. 1 (November 1993): 19–34. http://dx.doi.org/10.1016/0003-2670(93)85207-z.

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17

Cleary, Timothy J., Gregory L. Callan, and Barry J. Zimmerman. "Assessing Self-Regulation as a Cyclical, Context-Specific Phenomenon: Overview and Analysis of SRL Microanalytic Protocols." Education Research International 2012 (2012): 1–19. http://dx.doi.org/10.1155/2012/428639.

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The primary purpose of this paper is to review relevant research related to the use of an assessment technique, called Self-Regulated Learning (SRL) Microanalysis. This structured interview is grounded in social-cognitive theory and research and thus seeks to evaluate students' regulatory processes as they engage in well-defined academic or nonacademic tasks and activities. We illustrate the essential features of this contextualized assessment approach and detail a simple five-step process that researchers can use to apply this approach to their work. Example questions and administration procedures for five key self-regulation subprocesses (i.e., including goal-setting, strategic planning, monitoring, self-evaluation, and attributions) are highlighted, with particular emphasis placed on causal attributions. The psychometric properties of SRL microanalytic assessment protocols and potential areas of future research are presented.

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18

Lyman, Charles. "Progress in Microanalysis." Microscopy Today 21, no. 3 (May 2013): 7. http://dx.doi.org/10.1017/s1551929513000400.

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Many researchers view microanalysis as the determination of composition and structure of individual phases at a spatial resolution of 1 μm or better. It is remarkable to me that much of what we know about the phases shown in equilibrium phase diagrams was determined using bulk analysis techniques like powder X-ray diffraction in combination with light microscopy of flat-polished sections of materials. The identities and amounts of phases were deduced from systematic experiments because there was no way to analyze micrometer-sized phases in situ.

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19

Matthews, M. "Microanalysis of Plutonium." Microscopy and Microanalysis 14, S2 (August 2008): 652–53. http://dx.doi.org/10.1017/s1431927608088879.

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20

Nováková, Soňa, Sigrid Van Dyck, Ann Van Schepdael, Jos Hoogmartens, and Zdeněk Glatz. "Electrophoretically mediated microanalysis." Journal of Chromatography A 1032, no. 1-2 (April 2004): 173–84. http://dx.doi.org/10.1016/j.chroma.2003.12.025.

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21

R�der, Andreas. "Secondary electron microanalysis." Mikrochimica Acta 107, no. 3-6 (May 1992): 105–16. http://dx.doi.org/10.1007/bf01244465.

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22

Leviso, David A. "Microanalysis in histopathology." Journal of Pathology 157, no. 2 (February 1989): 95–97. http://dx.doi.org/10.1002/path.1711570203.

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23

Camacho Puebla, Ana Laura. "Miradas tecnológicas: Historical Technology, Materials and Conservation: SEM and Microanalysis." Intervención Revista Internacional de Conservación Restauración y Museología 1, no. 1 (May 1, 2010): 72–76. http://dx.doi.org/10.30763/intervencion.2013.8.101.

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24

Von Seckendorff, Volker. "Detection limits of selected rare-earth elements in electron-probe microanalysis." European Journal of Mineralogy 12, no. 1 (February 7, 2000): 73–93. http://dx.doi.org/10.1127/ejm/12/1/0073.

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25

Clode, Peta L., and Alan T. Marshall. "Low temperature X-ray microanalysis of calcium in a scleractinian coral:evidence of active transport mechanisms." Journal of Experimental Biology 205, no. 22 (November 15, 2002): 3543–52. http://dx.doi.org/10.1242/jeb.205.22.3543.

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SUMMARY Element concentrations were measured by X-ray microanalysis in seawater(SW) compartments and mucocytes in bulk, frozen-hydrated preparations of the scleractinian coral Galaxea fascicularis. Quantitative X-ray microanalysis of polyps sampled in the daytime revealed that concentrations of the elements Na, S, K and Ca were all significantly higher in a thin (10-20μm) external SW layer adjacent to the oral ectoderm (P<0.05,<0.05, <0.0001 and <0.01, respectively) than in standard SW. In polyps sampled during night-time, concentrations of Ca and S in this external SW layer were significantly reduced (P<0.05). Ca concentration in the coelenteron and extrathecal coelenteron was significantly higher(P<0.001) than in the external SW layer, regardless of time of sampling, suggesting that Ca2+ transport across the oral epithelium occurs via an active, transcellular route. X-ray microanalyses of mucocytes revealed that the concentration of S was high and did not vary between epithelial layers, while that of Ca increased in an inward gradient toward the skeleton. We suggest that throughout the day, secreted mucus behaves as a Donnan matrix at the oral ectoderm—SW interface,facilitating intracellular Ca2+ uptake. The accumulation within internal SW compartments of high concentrations of Ca relative to standard SW levels, however, appears to be independent of mucus secretion and is likely to be a consequence of active transport processes.

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26

Helms, C. R. "Techniques for Materials Microanalysis." MRS Bulletin 12, no. 6 (September 1987): 22–25. http://dx.doi.org/10.1557/s0883769400067178.

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The science and technology of ultrasmall three-dimensional materials systems has been developing rapidly the last 20 years or so. Catalysts, coatings, composites, as well as electronic device structures—all rely on materials properties on an atomic scale. To develop such new materials and understand the chemical and physical properties that determine their unique behavior, we also require analytical tools with atomic level spatial resolution and at the same time the desired measurement capability. This need, along with extensive scientific interest in the fundamental chemical and physical properties of free surfaces, has led to the continued development of microanalytical chemical analysis techniques over the past 20 years. Most readers will be familiar with many of these techniques with acronyms such as AES, XPS, RBS, SIMS, ESCA, etc. This issue of the MRS BULLETIN will review some recent advances in the development of these techniques as well as introduce new techniques with significant advantages over the older ones.As you can see from the thickness of this issue, it is difficult to cover the entire field in a finite amount of space. This led us to limit the discussion to those microanalytical tools which can easily be applied to the analysis of buried interface structures such as those found in semiconductor devices.

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27

Ginzburg and S. R. Gilbert. "Minutiae, Close-up, Microanalysis." Critical Inquiry 34, no. 1 (2007): 174. http://dx.doi.org/10.2307/4497766.

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28

Brodal, BjØRn P., and Bente B. Gehrken. "Enzymatic microanalysis of glycogen." Scandinavian Journal of Clinical and Laboratory Investigation 46, no. 2 (January 1986): 193–95. http://dx.doi.org/10.3109/00365518609083658.

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29

Vijayakumar, M., V. V. Rama Rao, and P. C. Angelo. "Scanning Electron Probe Microanalysis." Defence Science Journal 39, no. 1 (January 1, 1989): 13–32. http://dx.doi.org/10.14429/dsj.39.4744.

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30

Ginzburg, Carlo. "Minutiae, Close‐up, Microanalysis." Critical Inquiry 34, no. 1 (September 2007): 174–89. http://dx.doi.org/10.1086/526091.

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31

Berthier, B., E. Berthoumieux, J. P. Gallien, C. Moreau, and A. C. Raoux. "Nuclear models and microanalysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 130, no. 1-4 (July 1997): 224–29. http://dx.doi.org/10.1016/s0168-583x(97)00373-x.

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32

Carpenter, R. W. "Precipitation in silicon: Microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 474–75. http://dx.doi.org/10.1017/s0424820100104431.

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Interest in precipitation processes in silicon appears to be centered on transition metals (for intrinsic and extrinsic gettering), and oxygen and carbon in thermally aged materials, and on oxygen, carbon, and nitrogen in ion implanted materials to form buried dielectric layers. A steadily increasing number of applications of microanalysis to these problems are appearing. but still far less than the number of imaging/diffraction investigations. Microanalysis applications appear to be paced by instrumentation development. The precipitation reaction products are small and the presence of carbon is often an important consideration. Small high current probes are important and cryogenic specimen holders are required for consistent suppression of contamination buildup on specimen areas of interest. Focussed probes useful for microanalysis should be in the range of 0.1 to 1nA, and estimates of spatial resolution to be expected for thin foil specimens can be made from the curves shown in Fig. 1.

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33

Callahan, Daniel L. "Microanalysis of plastic strain." Ultramicroscopy 69, no. 1 (August 1997): 13–23. http://dx.doi.org/10.1016/s0304-3991(97)00029-6.

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34

Williams, David B., and S. Michael Zemyan. "Microanalysis At Intermediate Voltages." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 480–81. http://dx.doi.org/10.1017/s0424820100181154.

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Microanalysis using x-ray emission spectrometry (XES) or electron energy-loss spectrometry (EELS) at intermediate voltages should offer advantages over 100kV instruments. Brightness increases linearly with kV (for thermionic sources), but the inelastic scattering cross section decreases. Potential improvements in detectability limit and spatial resolution in both XES and EELS have been major factors spurring the development of intermediate voltage AEMs.The x-ray peak to background ratio increases with kV (Figure 1), and improvements in detectability limits have been reported at 300kV. The variation of detectability with spatial resolution is discussed elsewhere in these proceedings. Beam spreading should decrease linearly with kV, but experimentally the spatial resolution (Figure 2a,2b) does not show the expected improvement. This may be due to increased beam broadening from fast secondary electrons. The smallest probe size consistent with generating sufficient signal (i.e. an FEG) is better than increased kV for improved spatial resolution3. Increased kV has seen the return of the ‘hole count’ problem in XES. Higher voltage electrons generate harder x-rays at the C aperture, and current aperture design cannot sufficiently restrict the xray flux. The flux at 300kV can contribute up to 10% of the characteristic x-ray signal, which severely compromises the microanalysis quality. An FEG with reduced source size may help. At intermediate voltages, intrinsic Ge (IG) detectors can be used for analysis of Kα, lines from high atomic number elements. K line analysis gives improved accuracy compared with L and M line analysis for which Cliff- Lorimer k factors, (both experimental and theoretical) are extremely variable, possibly due to fast secondaries also. IG detectors can detect Au K lines, resolve Kα1Kα2 lines, (see Figure 3) offer improved energy resolution (~120eV) over Si(Li) detectors, and may be more stable under electron irradiation. Continued improvement in IG detectors may result in their displacing Si(Li) detectors from most AEMs.

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35

Gorbounov, Valeri, Petr Kuban, Purnendu K. Dasgupta, and Henryk Temkin. "A Nanoinjector for Microanalysis." Analytical Chemistry 75, no. 15 (August 2003): 3919–23. http://dx.doi.org/10.1021/ac034342+.

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36

Ruiz, Teresa. "Microscopy & Microanalysis 2013." Microscopy Today 22, no. 1 (January 2014): 42–45. http://dx.doi.org/10.1017/s155192951300120x.

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37

Lyman, Charles. "Microanalysis & Microscopy 2014." Microscopy Today 22, no. 1 (January 2014): 7. http://dx.doi.org/10.1017/s1551929513001296.

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38

Bell, David C. "Microscopy & Microanalysis 2014." Microscopy Today 23, no. 1 (January 2015): 38–41. http://dx.doi.org/10.1017/s1551929514001394.

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39

Sanders, Mark A. "Microscopy & Microanalysis 2015." Microscopy Today 24, no. 1 (January 2016): 34–37. http://dx.doi.org/10.1017/s1551929515001157.

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40

Michael, Joseph. "Microscopy & Microanalysis 2016." Microscopy Today 24, no. 6 (October 26, 2016): 52–55. http://dx.doi.org/10.1017/s1551929516000948.

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41

Potts, Jay. "Microscopy & Microanalysis 2017." Microscopy Today 26, no. 1 (January 2018): 36–37. http://dx.doi.org/10.1017/s1551929517001250.

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42

Picard, Yoosuf. "Microscopy & Microanalysis 2018." Microscopy Today 26, no. 3 (May 2018): 46–47. http://dx.doi.org/10.1017/s1551929518000512.

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43

Picard, Yoosuf. "Microscopy & Microanalysis 2018." Microscopy Today 27, no. 1 (January 2019): 30–31. http://dx.doi.org/10.1017/s1551929518001244.

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44

Dohnalkova, Alice. "Microscopy & Microanalysis 2019." Microscopy Today 28, no. 1 (January 2020): 12–14. http://dx.doi.org/10.1017/s1551929519001214.

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45

Levi-Setti, R., J. M. Chabala, C. Girod-Hallegot, P. Hallegot, and Y. L. Wang. "Secondary ion imaging microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 8–9. http://dx.doi.org/10.1017/s042482010015201x.

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Анотація:

The goals of high spatial resolution and high elemental sensitivity in the imaging microanalysis of biological tissues and materials have, to a large extent, been attained by using the method of secondary ion mass spectrometry (SIMS) following bombardment of a sample surface by a focused beam of heavy ions. The instrument that we will discuss and which has achieved these goals is a scanning ion microprobe originally developed in collaboration with Hughes Research Laboratories (UC-HRL SIM). It utilizes a 40-60 keV Ga+ probe, extracted from a point-like liquid metal ion source, that can be focused to a spot as small as 20 nm in diameter. During the past five years, much effort has been devoted to a reappraisal of well known SIMS methodologies in regard to their applicability to a range of lateral resolution (20-1000 nm) previously unexplored. Furthermore, of particular concern has been the identification of research areas whose demands could most profitably be matched by the performance of this new class of microprobes. The results of this effort are contained in over 21 topical publications and 14 review articles covering both instrumental aspects of our development and applications to a variety of interdisciplinary problems.

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46

Joy, David C. "Fundamental parameters for microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 474–75. http://dx.doi.org/10.1017/s0424820100164830.

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In order to perform quantitative X-ray microanalysis many parameters, representing the various stages of Xray generation and transport through the specimen at the chosen experimental conditions, must be known for all of the elements that might be encountered. Although ideally quantification is done by reference to standards so that only the functional variation of these parameters is required, in current practice it is increasingly necessary to work in situations where standardization is impossible and consequently where absolute magnitudes must be known. The quality and quantity of data that is now available varies widely.Ionization cross sectionsAlthough the amount of experimental data is limited, particularly in the energy range between 1 and 20keV, a critical assessment has concluded that for K-shell excitations both the magnitude of the cross-section σ and its variation with energy are adequately well known for overvoltages greater than about 2. For L- and M-shell excitations, however, and in all cases when the operational overvoltage is less than 2, the situation is much less satisfactory.

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47

Reffner, John A., and William T. Wihlborg. "Molecular Microanalysis of Tissues." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 268–69. http://dx.doi.org/10.1017/s0424820100134946.

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Fourier transform infrared (FT-IR) microspectroscopy is the most direct and facile technology available for detecting, identifying and mapping molecular species. Biologists have a need to relate molecular chemistry with a tissue's microstructure. While electron microbeam analyses provide elemental maps and both SIMS and micro-Raman spectroscopy demonstrated limited molecular mapping capabilities, complex inorganic and organic materials are not readily amenable to these techniques. Infrared spectroscopic analyses of micro-domains have gained wide-spread acceptance since high sensitivity FT-IR spectrometers and research quality, reflecting optical microscopes were united.Morphologically distinct parts of plant tissue can vary in their chemical composition and these variations can effect the plant's value. Plant biologists and agronomists have been endeavoring to localize the chemical species to individual botanical parts. While microscopy has been useful in establishing plant microstucture, chemical information on cellular components has been difficult to obtain. Molecular microspectral mapping renders these chemical analyses more tractable.The microstructure of the outer portion of a cereal grain consists of four distinct regions, see Figure 1.

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48

Beisler, Amy T., Caroline Geary, Moon Chul Jung, Rong Meng, Hong Zhao, and Stephen G. Weber. "Nanoscience, bio- and microanalysis." TrAC Trends in Analytical Chemistry 22, no. 5 (May 2003): x—xiv. http://dx.doi.org/10.1016/s0165-9936(03)00511-9.

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49

Sorbier, Loïc, Elisabeth Rosenberg, and Claude Merlet. "Microanalysis of Porous Materials." Microscopy and Microanalysis 10, no. 6 (December 2004): 745–52. http://dx.doi.org/10.1017/s1431927604040681.

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A signal loss is generally reported in electron probe microanalysis (EPMA) of porous, highly divided materials like heterogeneous catalysts. The hypothesis generally proposed to explain this signal loss refers to porosity, roughness, energy losses at interfaces, or charging effects. In this work we investigate by Monte Carlo simulation all these physical effects and compare the simulated results with measurements obtained on a mesoporous alumina. A program using the PENELOPE package and taking into account these four physical phenomena has been written. Simulation results show clearly that neither porosity nor roughness, nor specific energy losses at interfaces, nor charging effects are responsible for the observed signal loss. Measurements performed with analysis of carbon and oxygen lead to a correct total of concentration. The signal loss is thus explained by a composition effect due to a carbon contamination brought by the sample preparation and to a lesser extent by a stoichiometry of the porous alumina different from a massive alumina. For this kind of high specific surface porous sample, a little surface contamination layer becomes an important volume contamination that can produce large quantification errors if the contaminant is not analyzed.

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50

Joy, David C. "Fundamental Parameters For Microanalysis." Microscopy Today 4, no. 8 (October 1996): 14–15. http://dx.doi.org/10.1017/s1551929500063641.

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Анотація:

In order to perform quantitative X-ray microanalysis many parameters, representing the various stages of X-ray generation and transport through the specimen at the chosen experimental conditions, must be known for all of the elements that might be encountered. Although ideally quantification is done by reference to standards so that only the functional variation of these parameters is required, in current practice it is increasingly necessary to work in situations where standardization is impossible and consequently where absolute magnitudes must be known. The quality and quantity of data that is now available varies widely.

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