Добірка наукової літератури з теми "Micro-Electronics industry"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся зі списками актуальних статей, книг, дисертацій, тез та інших наукових джерел на тему "Micro-Electronics industry".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Статті в журналах з теми "Micro-Electronics industry"
Hayward, Keith. "Micro-electronics: an industry in transition." International Affairs 65, no. 2 (1989): 338. http://dx.doi.org/10.2307/2622111.
Повний текст джерелаVelinova, R. "Statistical modelling of wastewater quality: The case of micro-electronics industry." Water Research 29, no. 11 (November 1995): 2541–47. http://dx.doi.org/10.1016/0043-1354(95)00080-5.
Повний текст джерелаXu, Shu Bo, and Wen Cai Xu. "Printed Electronics Based on Precision Coating." Applied Mechanics and Materials 312 (February 2013): 550–53. http://dx.doi.org/10.4028/www.scientific.net/amm.312.550.
Повний текст джерелаOxley, C. H., R. H. Hopper, G. Hill, and G. A. Evans. "Improved infrared (IR) microscope measurements and theory for the micro-electronics industry." Solid-State Electronics 54, no. 1 (January 2010): 63–66. http://dx.doi.org/10.1016/j.sse.2009.09.022.
Повний текст джерелаLin, Y. P., L. L. Yen, L. Y. Pan, P. J. Chang, and T. J. Cheng. "Emerging epidemic in a growing industry: cigarette smoking among female micro-electronics workers in Taiwan." Public Health 119, no. 3 (March 2005): 184–88. http://dx.doi.org/10.1016/j.puhe.2004.03.005.
Повний текст джерелаAcero Cacho, Raquel, Jorge Santolaria Mazo, and Marcos Pueo Arteta. "Double Flank Roll Testing as Verification Technique for Micro Gears." Key Engineering Materials 615 (June 2014): 45–50. http://dx.doi.org/10.4028/www.scientific.net/kem.615.45.
Повний текст джерелаAkhtar, Mohd Majid, Mohammad Zubair Khan, Mohd Abdul Ahad, Abdulfattah Noorwali, Danish Raza Rizvi, and Chinmay Chakraborty. "Distributed ledger technology based robust access control and real-time synchronization for consumer electronics." PeerJ Computer Science 7 (June 1, 2021): e566. http://dx.doi.org/10.7717/peerj-cs.566.
Повний текст джерелаBurling, Steven, Gary Nicholls, Stewart Hemsley, Sadayuki Nagatomo, and Kazuhiko Shiokawa. "Current Developments in Precious Metal Plating for the Semi - Conductor/Micro - Electronics Markets." International Symposium on Microelectronics 2015, no. 1 (October 1, 2015): 000112–20. http://dx.doi.org/10.4071/isom-2015-tp44.
Повний текст джерелаNodin, Muhamad Nor, and Mohd Sallehuddin Yusof. "A Preliminary Study of PDMS Stamp towards Flexography Printing Technique: An Overview." Advanced Materials Research 844 (November 2013): 201–4. http://dx.doi.org/10.4028/www.scientific.net/amr.844.201.
Повний текст джерелаBočková, Nina, and Tomáš Meluzín. "R&D investments as Possible Factors of Company’s Competitiveness." Acta Universitatis Agriculturae et Silviculturae Mendelianae Brunensis 64, no. 6 (2016): 1857–67. http://dx.doi.org/10.11118/actaun201664061857.
Повний текст джерелаДисертації з теми "Micro-Electronics industry"
Blair, Daniel P. "SolarBridge Technologies: Entrepreneurship in the Solar Inverter Industry." Case Western Reserve University School of Graduate Studies / OhioLINK, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=case1301506263.
Повний текст джерелаAl-Kharaz, Mohammed. "Analyse multivariée des alarmes de diagnostic en vue de la prédiction de la qualité des produits." Electronic Thesis or Diss., Aix-Marseille, 2021. http://theses.univ-amu.fr.lama.univ-amu.fr/211207_ALKHARAZ_559anw633vgnlp70s324svilo_TH.pdf.
Повний текст джерелаThis thesis addresses the prediction of product quality and improving the performance of diagnostic alarms in a semiconductor facility. For this purpose, we exploit the alarm history collected during production. First, we propose an approach to model and estimate the degradation risk of the final product associated with each alarm triggered according to its activation behavior on all products during production. Second, using the estimated risk values for any alarm, we propose an approach to predict the final quality of the product's lot. This approach models the link between process alarm events and the final quality of product lot through machine learning techniques. We also propose a new approach based on alarm event text processing to predict the final product quality. This approach improves performance and exploits more information available in the alarm text. Finally, we propose a framework for analyzing alarm activations through performance evaluation tools and several interactive visualization techniques that are more suitable for semiconductor manufacturing. These allow us to closely monitor alarms, evaluate performance, and improve the quality of products and event data collected in history. The effectiveness of each of the above approaches is demonstrated using a real data set obtained from a semiconductor manufacturing facility
Книги з теми "Micro-Electronics industry"
Kaplinsky, Raphael. Micro-electronics and employment revisited: A review. Geneva: International Labour Office, 1987.
Знайти повний текст джерелаMicro-electronics and employment revisited: A review. Geneva: International Labour Office, 1987.
Знайти повний текст джерелаHoffman, Kurt. Micro-electronics and clothing: The impact of technical change on a global industry. New York: Praeger, 1988.
Знайти повний текст джерелаHoward, Rush, and International Labour Organization, eds. Micro-electronics and clothing: The impact of technical change on a global industry. New York: Praeger, 1988.
Знайти повний текст джерелаMicro-Electronics: An Industry in Transition. Taylor & Francis Group, 2018.
Знайти повний текст джерелаMicro-Electronics: An Industry in Transition. Taylor & Francis Group, 2020.
Знайти повний текст джерелаЧастини книг з теми "Micro-Electronics industry"
Schwarz, Bernd, Hans Jürgen Albrecht, Gunnar Petzold, Jörg Deliga, and Christian Wegener. "Simulation in the Industry." In Benefiting from Thermal and Mechanical Simulation in Micro-Electronics, 1–16. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3159-0_1.
Повний текст джерелаHalder, Kumaresh, Dibyendu Mandal, Karabi Ganguly, Swati Sikdar, and Sandip Bag. "The Effects of Metal Ion Doped Ceramic Fillers into Poly (Vinylidene Fluoride) Matrix: A Comparative Investigation and Its Application in Micro-Electronics Industry." In Studies in Autonomic, Data-driven and Industrial Computing, 309–24. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-16-7305-4_31.
Повний текст джерелаIslam, Nazrul, and Ndubuisi Ekekwe. "Disruptive Technologies, Innovation and Global Redesign." In Disruptive Technologies, Innovation and Global Redesign, 1–11. IGI Global, 2012. http://dx.doi.org/10.4018/978-1-4666-0134-5.ch001.
Повний текст джерелаHarcourt, Alison, George Christou, and Seamus Simpson. "The Internet of Things." In Global Standard Setting in Internet Governance, 189–209. Oxford University Press, 2020. http://dx.doi.org/10.1093/oso/9780198841524.003.0011.
Повний текст джерелаKwon, Hyeong-ki. "Transition II." In Changes by Competition, 108–27. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198866060.003.0006.
Повний текст джерелаWang, Chia-Hui, Ray-I. Chang, and Jan-Ming Ho. "Collaborative Video Surveillance for Distributed Visual Data Mining of Potential Risk and Crime Detection." In Surveillance Technologies and Early Warning Systems, 194–204. IGI Global, 2011. http://dx.doi.org/10.4018/978-1-61692-865-0.ch010.
Повний текст джерелаWang, Chia-Hui, Ray-I. Chang, and Jan-Ming Ho. "Collaborative Video Surveillance for Distributed Visual Data Mining of Potential Risk and Crime Detection." In Wireless Technologies, 713–24. IGI Global, 2012. http://dx.doi.org/10.4018/978-1-61350-101-6.ch313.
Повний текст джерелаТези доповідей конференцій з теми "Micro-Electronics industry"
Oxley, C. H., R. H. Hopper, and G. A. Evans. "Improved infrared (IR) microscope measurements for the micro-electronics industry." In 2008 2nd Electronics Systemintegration Technology Conference. IEEE, 2008. http://dx.doi.org/10.1109/estc.2008.4684352.
Повний текст джерелаBrijs, B. "Advanced RBS analysis of thin films in micro-electronics." In The CAARI 2000: Sixteenth international conference on the application of accelerators in research and industry. AIP, 2001. http://dx.doi.org/10.1063/1.1395351.
Повний текст джерелаZhang, Fei, Jun Duan, XiaoYan Zeng, and XiangYou Li. "355nm DPSS UV laser micro-processing for the semiconductor and electronics industry." In SPIE LASE, edited by Hiroyuki Niino, Michel Meunier, Bo Gu, and Guido Hennig. SPIE, 2010. http://dx.doi.org/10.1117/12.845689.
Повний текст джерелаChang, Jen-Shih, H. Tsubone, G. D. Harvel, and K. Urashima. "Capillary/Narrow Flow Channel Driven EHD Gas Pump for an Advanced Thermal Management of Micro-Electronics." In 2008 IEEE Industry Applications Society Annual Meeting (IAS). IEEE, 2008. http://dx.doi.org/10.1109/08ias.2008.91.
Повний текст джерелаLei, Weisheng, Wentao Hu, and Qiang Fu. "Micro-machining applications of green (second harmonic) solid state lasers in the electronics manufacturing industry." In ICALEO® 2001: Proceedings of the Laser Materials Processing Conference and Laser Microfabrication Conference. Laser Institute of America, 2001. http://dx.doi.org/10.2351/1.5059846.
Повний текст джерелаWang, Li, Kuo-Hua Liu, Ching-Chuan Tseng, Anton V. Prokhorov, Hazlie Mokhlis, Chua Kein Huat, and Manoj Tripathy. "Evaluation of Summation Results of Injected Third-Order Harmonic Currents Produced by Micro Hydro Generators with Power-Electronics Converters Using a Probabilistic Approach." In 2021 IEEE Industry Applications Society Annual Meeting (IAS). IEEE, 2021. http://dx.doi.org/10.1109/ias48185.2021.9677190.
Повний текст джерелаGajapath, Satya S., Sushanta K. Mitra, and Patricio F. Mendez. "Modeling of Micro Electron Beam Welding With Melting and Evaporation." In ASME 2012 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/imece2012-88427.
Повний текст джерелаKorotash, I. V., and E. M. Rudenko. "Optical test method of HTSC structures for creating miniature elements and devices for the optical-instrument-building industry." In International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, edited by Sergey V. Svechnikov and Mikhail Y. Valakh. SPIE, 1995. http://dx.doi.org/10.1117/12.226164.
Повний текст джерелаZhao, Zheng, Beibei Feng, Xingtuan Yang, and Yanfei Sun. "Prospect of MAO Technology Application in Nuclear Power Industry." In 2013 21st International Conference on Nuclear Engineering. American Society of Mechanical Engineers, 2013. http://dx.doi.org/10.1115/icone21-15435.
Повний текст джерелаWilson, Merrill A., Kurt Recknagle, and Kriston Brooks. "Design and Development of a Low-Cost, High Temperature Silicon Carbide Micro-Channel Recuperator." In ASME Turbo Expo 2005: Power for Land, Sea, and Air. ASMEDC, 2005. http://dx.doi.org/10.1115/gt2005-69143.
Повний текст джерела