Статті в журналах з теми "Metrology of electromagnetism"
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Cahan, David. "The awarding of the Copley Medal and the ‘discovery’ of the law of conservation of energy: Joule, Mayer and Helmholtz revisited." Notes and Records of the Royal Society 66, no. 2 (November 16, 2011): 125–39. http://dx.doi.org/10.1098/rsnr.2011.0045.
Повний текст джерелаStorey, L. R. O. "<i>Letter to the Editor</i>: Revision of the basic equations of wave distribution function analysis." Annales Geophysicae 16, no. 5 (May 31, 1998): 651–53. http://dx.doi.org/10.1007/s00585-998-0651-3.
Повний текст джерелаKim, Sung, Jack Surek, and James Baker-Jarvis. "Electromagnetic Metrology on Concrete and Corrosion." Journal of Research of the National Institute of Standards and Technology 116, no. 3 (May 2011): 655. http://dx.doi.org/10.6028/jres.116.011.
Повний текст джерелаHao, Ling, John C. Gallop, and Jie Chen. "Electromagnetic Metrology for Nano- Electromechanical Systems." IEEE Transactions on Instrumentation and Measurement 68, no. 6 (June 2019): 1827–32. http://dx.doi.org/10.1109/tim.2018.2879068.
Повний текст джерелаNeyezhmakov, Pavel, Serhii Buriakovskyi, Olena Vasylieva, Volodymyr Velychko, Fedir Venislavskyi, and Serhii Rudenko. "Implementation of NATO standards to improve the electromagnetic immunity and compatibility of equipment of the critical infrastructure objects." Ukrainian Metrological Journal, no. 1 (April 12, 2023): 9–20. http://dx.doi.org/10.24027/2306-7039.1.2023.282464.
Повний текст джерелаYuan, Guang Hui, and Nikolay I. Zheludev. "Detecting nanometric displacements with optical ruler metrology." Science 364, no. 6442 (May 9, 2019): 771–75. http://dx.doi.org/10.1126/science.aaw7840.
Повний текст джерелаNIKOLAEV, M. YU, E. V. NIKOLAEVA, and A. K. NIKITIN. "PROCESS MODELING AND METROLOGY IN ELECTRICAL IMPULSE SYSTEMS." Actual Issues Of Energy 4, no. 1 (2022): 070–74. http://dx.doi.org/10.25206/2686-6935-2022-4-1-70-74.
Повний текст джерелаSafarov, Abdurauf, Khurshid Sattarov, Makhammatyokub Bazarov, and Almardon Mustafoqulov. "Issues of the electromagnetic current transformers searching projecting." E3S Web of Conferences 264 (2021): 05038. http://dx.doi.org/10.1051/e3sconf/202126405038.
Повний текст джерелаVasylieva, Olena, and Pavel Neyezhmakov. "Metrological traceability of the results of testing for electromagnetic compatibility in accordance with the NATO standards." Ukrainian Metrological Journal, no. 2 (July 5, 2023): 7–15. http://dx.doi.org/10.24027/2306-7039.2.2023.286707.
Повний текст джерелаBaker-Jarvis, James. "Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations." Entropy 10, no. 4 (October 8, 2008): 411–29. http://dx.doi.org/10.3390/e10040411.
Повний текст джерелаNikolaev, M. Yu, E. V. Nikolaeva, N. Yu Khokriakov, A. A. Kovalevsky, and К. I. Stolyarchuk. "SIMULATION OF ELECTRIC PULSES, THEIR PRACTICAL APPLICATION AND ISSUES OF METROLOGY." ACTUAL ISSUES OF ENERGY 5, no. 1 (2023): 67–75. http://dx.doi.org/10.25206/2686-6935-2023-5-1-67-75.
Повний текст джерелаIff, W. A., J. P. Hugonin, C. Sauvan, M. Besbes, P. Chavel, G. Vienne, L. Milord, et al. "Electromagnetic analysis for optical coherence tomography based through silicon vias metrology." Applied Optics 58, no. 27 (September 16, 2019): 7472. http://dx.doi.org/10.1364/ao.58.007472.
Повний текст джерелаPham, Hoang-Lam, Thomas Alcaire, Sebastien Soulan, Delphine Le Cunff, and Jean-Hervé Tortai. "Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures." Nanomaterials 12, no. 22 (November 9, 2022): 3951. http://dx.doi.org/10.3390/nano12223951.
Повний текст джерелаNIKOLAEV, M. YU, V. A. ZAKHARENKO, E. V. NIKOLAEVA, and A. K. NIKITIN. "MODELING OF INTERACTION PROCESSES AND METROLOGY IN ELECTRIC PULSE SYSTEMS." Actual Issues Of Energy 3, no. 1 (2021): 058–62. http://dx.doi.org/10.25206/2686-6935-2021-3-1-58-62.
Повний текст джерелаBarrera, Gabriele, Michele Borsero, Oriano Bottauscio, Federica Celegato, Mario Chiampi, Marco Coïsson, Domenico Giordano, et al. "Metrology to support therapeutic and diagnostic techniques based on electromagnetics and nanomagnetics." Rendiconti Lincei 26, S2 (February 17, 2015): 245–54. http://dx.doi.org/10.1007/s12210-015-0386-5.
Повний текст джерелаMoczała, M., W. Majstrzyk, A. Sierakowski, R. Dobrowolski, P. Grabiec, and T. Gotszalk. "Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopy." Micron 84 (May 2016): 1–6. http://dx.doi.org/10.1016/j.micron.2016.02.008.
Повний текст джерелаBaker-Jarvis, James, and Jack Surek. "Transport of Heat and Charge in Electromagnetic Metrology Based on Nonequilibrium Statistical Mechanics." Entropy 11, no. 4 (November 3, 2009): 748–65. http://dx.doi.org/10.3390/e11040748.
Повний текст джерелаBailey, A. E., H. W. Hellwig, T. Nemoto, and S. Okamura. "International organization in electromagnetic metrology and international comparison of RF and microwave standards." Proceedings of the IEEE 74, no. 1 (1986): 9–14. http://dx.doi.org/10.1109/proc.1986.13390.
Повний текст джерелаSenyk, I. V., Y. A. Kuryptya, V. Z. Barsukov, O. O. Butenko, and V. G. Khomenko. "Development and Application of Thin Wide-Band Screening Composite Materials." Physics and Chemistry of Solid State 21, no. 4 (December 31, 2020): 771–78. http://dx.doi.org/10.15330/pcss.21.4.771-778.
Повний текст джерелаZhao, Shuai, Yu Yang, Huiting Liu, Ziwen Huang, Lei Zhang, Qiuping Wang, and Keyi Wang. "X-ray wavefront sensing and optics metrology using a microfocus x-ray grating interferometer with electromagnetic phase stepping." Applied Physics Letters 120, no. 18 (May 2, 2022): 181105. http://dx.doi.org/10.1063/5.0093152.
Повний текст джерелаĆirić, Zoran, and Mihajlo Ristić. "Declaration of conformity of excitation system of synchronous machines." Zbornik radova Elektrotehnicki institut Nikola Tesla, no. 33 (2023): 33–48. http://dx.doi.org/10.5937/zeint33-48333.
Повний текст джерелаShi, Peng, Luping Du, Congcong Li, Anatoly V. Zayats, and Xiaocong Yuan. "Transverse spin dynamics in structured electromagnetic guided waves." Proceedings of the National Academy of Sciences 118, no. 6 (February 1, 2021): e2018816118. http://dx.doi.org/10.1073/pnas.2018816118.
Повний текст джерелаOvsiannikov, Vitaly D., Vitaly G. Palchikov, and Igor L. Glukhov. "Microwave Field Metrology Based on Rydberg States of Alkali-Metal Atoms." Photonics 9, no. 9 (September 3, 2022): 635. http://dx.doi.org/10.3390/photonics9090635.
Повний текст джерелаTarr, Larry W. "Electromagnetic Metrology Challenges in the U.S. Department of Defense and the Global War on Terrorism." NCSLI Measure 2, no. 4 (December 2007): 16–20. http://dx.doi.org/10.1080/19315775.2007.11721395.
Повний текст джерелаDavis, Timothy J., David Janoschka, Pascal Dreher, Bettina Frank, Frank-J. Meyer zu Heringdorf, and Harald Giessen. "Ultrafast vector imaging of plasmonic skyrmion dynamics with deep subwavelength resolution." Science 368, no. 6489 (April 23, 2020): eaba6415. http://dx.doi.org/10.1126/science.aba6415.
Повний текст джерелаZhang, Xi Te, Qian Min Mao, Zhi Gang Nie, Zhen Wei Huang, and Wen Xin Shen. "A Study of Composite Flow Meter Based on the Theory of Electromagnetic and Ultrasonic." Applied Mechanics and Materials 568-570 (June 2014): 309–14. http://dx.doi.org/10.4028/www.scientific.net/amm.568-570.309.
Повний текст джерелаShi, Peng, Luping Du, and Xiaocong Yuan. "Spin photonics: from transverse spin to photonic skyrmions." Nanophotonics 10, no. 16 (October 21, 2021): 3927–43. http://dx.doi.org/10.1515/nanoph-2021-0046.
Повний текст джерелаVikram, Vikram, and Bhisaji Surve. "An Overview of Performance Validation, Testing Protocols, and Standards for Smart Meters." Journal of Cognitive Human-Computer Interaction 07, no. 1 (2024): 17–25. http://dx.doi.org/10.54216/jchci.070102.
Повний текст джерелаLi, Detian, Meiru Guo, Zhenhua Xi, Huzhong Zhang, and Bowen Li. "Electromagnetic Technology for Vacuum Metrology in the Typical Development of a Metrological-Grade Spinning Rotor Gauge." Electromagnetic Science 1, no. 3 (September 2023): 1–12. http://dx.doi.org/10.23919/emsci.2023.0006.
Повний текст джерелаHeo, Seung Yun, Jeonghyun Kim, Philipp Gutruf, Anthony Banks, Pinghung Wei, Rafal Pielak, Guive Balooch, et al. "Wireless, battery-free, flexible, miniaturized dosimeters monitor exposure to solar radiation and to light for phototherapy." Science Translational Medicine 10, no. 470 (December 5, 2018): eaau1643. http://dx.doi.org/10.1126/scitranslmed.aau1643.
Повний текст джерелаNeyezhmakov, Pavel, Alexander Prokopov, Tatiana Panasenko, and Andrii Shloma. "Analysis of the temperature component of the combined standard uncertainty of the refractive index according to the test data of the control system for meteorological parameters developed for the Lyptsi geodetic polygon." Ukrainian Metrological Journal, no. 4 (December 30, 2021): 34–38. http://dx.doi.org/10.24027/2306-7039.4.2021.250411.
Повний текст джерелаEfimov, A. G. "Electromagnetic and magnetic methods of non-destructive testing for control of damage accumulation in structural steels and alloys (review)." Industrial laboratory. Diagnostics of materials 86, no. 8 (August 14, 2020): 49–57. http://dx.doi.org/10.26896/1028-6861-2020-86-8-49-57.
Повний текст джерелаBardalen, Eivind, Muhammad Nadeem Akram, Helge Malmbekk, and Per Ohlckers. "Review of Devices, Packaging, and Materials for Cryogenic Optoelectronics." Journal of Microelectronics and Electronic Packaging 12, no. 4 (October 1, 2015): 189–204. http://dx.doi.org/10.4071/imaps.485.
Повний текст джерелаSarma, Raktim, Abigail Pribisova, Bjorn Sumner, and Jayson Briscoe. "Classification of Intensity Distributions of Transmission Eigenchannels of Disordered Nanophotonic Structures Using Machine Learning." Applied Sciences 12, no. 13 (June 30, 2022): 6642. http://dx.doi.org/10.3390/app12136642.
Повний текст джерелаBooth, James C., Nathan Orloff, Christian Long, Aaron Hagerstrom, Angela Stelson, Nicholas Jungwirth, and Luckshitha Suriyasena Liyanage. "(Invited, Digital Presentation) Nonlinear and Electro-Thermo-Mechanical Effects in Heterogeneous Electronics at Microwave Frequencies." ECS Meeting Abstracts MA2022-02, no. 17 (October 9, 2022): 862. http://dx.doi.org/10.1149/ma2022-0217862mtgabs.
Повний текст джерелаСухоруков and Vasiliy Sukhorukov. "Magnetic Nondestructive Testing: Metrological Parameters Evaluation." NDT World 18, no. 4 (December 16, 2015): 65–70. http://dx.doi.org/10.12737/13529.
Повний текст джерелаNotzon, Gordon, Robert Storch, Thomas Musch, and Michael Vogt. "A low-noise and flexible FPGA-based binary signal measurement generator." International Journal of Microwave and Wireless Technologies 11, no. 5-6 (March 18, 2019): 447–55. http://dx.doi.org/10.1017/s1759078719000254.
Повний текст джерелаCahan, David. "Helmholtz and the British scientific elite: From force conservation to energy conservation." Notes and Records of the Royal Society 66, no. 1 (November 16, 2011): 55–68. http://dx.doi.org/10.1098/rsnr.2011.0044.
Повний текст джерелаBahatskji, Oleksiy, and Valentyn Bahatskji. "Review and Analysis of the Characteristics of IoT Sensors." Cybernetics and Computer Technologies, no. 4 (December 4, 2023): 62–75. http://dx.doi.org/10.34229/2707-451x.23.4.8.
Повний текст джерелаFujiwara, Akira, Gento Yamahata, Nathan Johnson, Shuji Nakamura, and Nobuhisa Kaneko. "(Invited) Silicon Quantum Dot Single-Electron Pumps for the Closure of the Quantum Metrology Triangle." ECS Meeting Abstracts MA2023-02, no. 30 (December 22, 2023): 1532. http://dx.doi.org/10.1149/ma2023-02301532mtgabs.
Повний текст джерелаYan, Zheng, Mengdi Han, Yan Shi, Adina Badea, Yiyuan Yang, Ashish Kulkarni, Erik Hanson, et al. "Three-dimensional mesostructures as high-temperature growth templates, electronic cellular scaffolds, and self-propelled microrobots." Proceedings of the National Academy of Sciences 114, no. 45 (October 25, 2017): E9455—E9464. http://dx.doi.org/10.1073/pnas.1713805114.
Повний текст джерелаNi, Wei-Tou. "Equivalence principles, spacetime structure and the cosmic connection." International Journal of Modern Physics D 25, no. 04 (March 10, 2016): 1630002. http://dx.doi.org/10.1142/s0218271816300020.
Повний текст джерелаRyzhov, Yevhen, Lev Sakovych, Sergey Glukhov, and Yuriy Nastishin. "Assessment of the influence of diagnostic support on reliability of radio electronic systems." Military Technical Collection, no. 24 (May 20, 2021): 3–8. http://dx.doi.org/10.33577/2312-4458.24.2021.3-8.
Повний текст джерелаPustelny, Tadeusz Piotr. "Electroluminescent optical fiber sensor for detection of a high intensity electric field." Photonics Letters of Poland 12, no. 1 (March 31, 2020): 19. http://dx.doi.org/10.4302/plp.v12i1.980.
Повний текст джерелаvan der Sijs, Thomas, Omar El Gawhary, and Paul Urbach. "Electromagnetic scattering beyond the weak regime: Solving the problem of divergent Born perturbation series by Padé approximants." EPJ Web of Conferences 238 (2020): 06019. http://dx.doi.org/10.1051/epjconf/202023806019.
Повний текст джерелаLavanya, Maruthasalam, Duraisamy Thiruarul, Karuppaiya Balasundaram Rajesh, and Zbigniew Jaroszewicz. "Generating novel focal patterns for radial variant vector beam focusing through a dielectric interface." Photonics Letters of Poland 15, no. 1 (April 2, 2023): 7–9. http://dx.doi.org/10.4302/plp.v15i1.1198.
Повний текст джерелаSukumaran Nair, Arya, Peter Czurratis, and Denis Bogucanin. "Application of Machine Learning Algorithm for Defect Analysis in Semiconductors Using High Resolved Scanning Acoustic Microscopy." ECS Meeting Abstracts MA2023-02, no. 33 (December 22, 2023): 1590. http://dx.doi.org/10.1149/ma2023-02331590mtgabs.
Повний текст джерелаYates, Luke, Andrew T. Binder, Anthony Rice, Andrew M. Armstrong, Jeffrey Steinfeldt, Vincent M. Abate, Michael L. Smith, et al. "(Invited) Recent Progress in Medium-Voltage Vertical GaN Power Devices." ECS Meeting Abstracts MA2023-02, no. 35 (December 22, 2023): 1682. http://dx.doi.org/10.1149/ma2023-02351682mtgabs.
Повний текст джерела"Electromagnetic Metrology Symposium." IEEE Antennas and Propagation Magazine 53, no. 6 (December 2011): 258. http://dx.doi.org/10.1109/map.2011.6157769.
Повний текст джерела"Electromagnetic Metrology Symposium." IEEE Antennas and Propagation Magazine 54, no. 2 (April 2012): 223. http://dx.doi.org/10.1109/map.2012.6230760.
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