Готові списки джерел за темами / Metallized film capacitor

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Добірка наукової літератури з теми "Metallized film capacitor"

Автор: Grafiati
Опубліковано: 21 грудня 2024

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Статті в журналах з теми "Metallized film capacitor"

1

Jia Zhanqiang, 贾占强, 蔡金燕 Cai Jinyan, 梁玉英 Liang Yuying, and 韩春辉 Han Chunhui. "Reliability assessment of metallized film pulse capacitor." High Power Laser and Particle Beams 23, no. 1 (2011): 272–76. http://dx.doi.org/10.3788/hplpb20112301.0272.

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2

Vuillermet, Y., O. Chadebec, J. M. Lupin, A. Saker, G. Meunier, and J. L. Coulomb. "Optimization of Low-Voltage Metallized Film Capacitor Geometry." IEEE Transactions on Magnetics 43, no. 4 (April 2007): 1569–72. http://dx.doi.org/10.1109/tmag.2007.892473.

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3

Ho, Janet, T. Jow, and Steven Boggs. "Implications of advanced capacitor dielectrics for performance of metallized film capacitor windings." IEEE Transactions on Dielectrics and Electrical Insulation 15, no. 6 (December 2008): 1754–60. http://dx.doi.org/10.1109/tdei.2008.4712681.

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4

Du, Guoqiang, and Jie Zhang. "Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage." Electronics 13, no. 14 (July 22, 2024): 2886. http://dx.doi.org/10.3390/electronics13142886.

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Анотація:
Self-healing (SH) in metallized polypropylene film capacitors (MPPFCs) can lead to irreversible damage to electrode and dielectric structures, resulting in capacitance loss and significant stability degradation, especially under cumulative SH conditions. To enhance the reliability assessment of MPPFCs post-SH, this study conducted SH experiments on MPPFCs, examined the damage patterns of the electrodes and dielectric films, and proposed a novel capacitance evaluation method for MPPFCs under cumulative SH conditions. The results reveal that with increasing SH voltage, the number of dielectric layers experiencing single SH breakdowns rises, SH energy significantly escalates, and the loss area of the electrode due to high-temperature evaporation expands. Under cumulative SH conditions, the number of SH events is linearly correlated with the total number of SH-breakdown film layers and shows an exponential decay with the average single SH energy. By utilizing a Support Vector Machine (SVM) to classify the SH condition and damage features within the capacitor based on the correlation and distribution patterns of SH feature parameters, this study introduces an advanced method for evaluating the capacitance of MPPFCs under cumulative SH conditions. This method promises to improve the predictive maintenance and reliability of power electronic systems utilizing MPPFCs.
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Li Hua, Lin Fuchang, Zhong Heqing, Dai Ling, Han Yongxia, and Kong Zhonghua. "Study on Metallized Film Capacitor and Its Voltage Maintaining Performance." IEEE Transactions on Magnetics 45, no. 1 (January 2009): 327–30. http://dx.doi.org/10.1109/tmag.2008.2008863.

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Chen Yaohong, 陈耀红, 章妙 Zhang Miao, 李化 Li Hua, 林福昌 Lin Fuchang, 李智威 Li Zhiwei, 吕霏 Lü Fei, and 刘德 Liu De. "Insulation resistance characteristics of metallized film capacitor under high electric field." High Power Laser and Particle Beams 24, no. 4 (2012): 797–800. http://dx.doi.org/10.3788/hplpb20122404.0797.

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Kong, M. G., and Y. P. Lee. "Impact of surface discharge plasmas on performance of a metallized film capacitor." Journal of Applied Physics 90, no. 6 (September 15, 2001): 3069–78. http://dx.doi.org/10.1063/1.1389072.

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Li, Hua, Yaohong Chen, Fuchang Lin, Bo Peng, Fei Lv, Miao Zhang, and Zhiwei Li. "The capacitance loss mechanism of metallized film capacitor under pulsed discharge condition." IEEE Transactions on Dielectrics and Electrical Insulation 18, no. 6 (December 2011): 2089–94. http://dx.doi.org/10.1109/tdei.2011.6118648.

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Dai, Xiying, Zhaoliang Xing, Wei Yang, Chong Zhang, Fei Li, Xin Chen, Chen Li, Jianjun Zhou, and Lin Li. "The Effect of Annealing on the Structure and Electric Performance of Polypropylene Films." International Journal of Polymer Science 2022 (November 8, 2022): 1–12. http://dx.doi.org/10.1155/2022/5970484.

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Анотація:
Biaxially oriented polypropylene (BOPP) and uniaxially oriented polypropylene (UOPP) films were annealed. The effect of annealing temperature (Ta) on dielectric strength was studied. The electric breakdown strength (Eb) of BOPP and UOPP films changes in a quite different trend with the annealing process. Eb of BOPP films decreases with the increase in Ta, whereas Eb of UOPP films increases first and then decreases with Ta. The structural changes during annealing were investigated. The crystallinity rises with Ta, while the orientation degree and Eb show a similar trend with Ta. Although the crystallinity and crystal structure can affect Eb of polypropylene films, the orientation of chain segments has a much larger correlation with Eb. Our results indicate that the deterioration of the metallized BOPP film capacitor may originate from the orientation degree decrease of chain segments after experiencing high temperature.
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Yoon, Jung-Rag, Young-Kwang Kim, Serk-Won Lee, and Heun-Young Lee. "The Design and Reliability Evaluation of Metallized Film Capacitor for Power Electronic Applications." Journal of the Korean Institute of Electrical and Electronic Material Engineers 24, no. 5 (May 1, 2011): 381–86. http://dx.doi.org/10.4313/jkem.2011.24.5.381.

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Дисертації з теми "Metallized film capacitor"

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Mello, Tiago Chaves. "Influência dos parâmetros do processo de serramento no corte de capacitores de filme metalizado ultrafino." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2015. http://hdl.handle.net/10183/127878.

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Анотація:
Visando determinar os valores ótimos para o processo de serramento de anéis bobinados de filme metalizado ultrafino de alumínio com dielétrico de poliéster a partir das condições atuais do processo de fabricação de capacitores pela empresa Epcos do Brasil, realizou-se a avaliação de diferentes tipos de serras circulares variando-se a velocidade de rotação (n) e o tempo de corte (tc). Desenvolvido projeto de experimento desses três fatores a fim de obter o resultado das interações entre eles quanto à resistência de isolamento (Riso) das peças cortadas. A serra de 160 dentes de metal-duro com revestimento de filme de carbono tipo diamante (DLC) apresentou os melhores resultados quanto à “Riso” acima de 0,378 G e quanto ao número de peças com valor abaixo deste. Constatou-se que “n” não influencia significativamente para a distribuição de “Riso”; porém, gera menos peças abaixo do especificado. Já “tc” não influencia significativamente o processo. Quanto ao tipo de dente, o perfil reto obteve melhor resultado para lâminas de serra com 80 dentes e perfil curvo para lâminas com 160 dentes. Já a espessura da lâmina não influenciou de forma expressiva o processo. A lâmina de aço-rápido apresentou adesão de alumínio na lateral do corpo da serra e, consequentemente, adesão de material na superfície de corte. As lâminas de metal-duro sem revestimento apresentaram falhas no filme metalizado por causa do atrito gerado entre a superfície de corte e a lateral da lâmina; esse inconveniente é eliminado quando ela é revestida com filme DLC apresentando melhorias quanto à “Riso” das peças para “n” menores. Também houve adesão de alumínio na parte inferior do dente devido a uma delaminação da camada de filme DLC.
In order to determine the optimal values for the sawing process of wound rings of metalized ultra-thin film with dielectric of polyester from current conditions of capacitor manufacturing process by Epcos company in Brazil, it was performed the evaluation of different types of circular saws varying the rotational speed (n) and the cutting time (tc). Developed experiment design methodology for these three factors in order to get the result of the interactions between them regarding to the insulation resistance (Riso) of cut parts. Through the analysis of the main effects, the cemented carbide saw with 160 teeth and diamond-like carbon (DLC) film coating showed the best results in terms of "Riso" above 0,378 G and regarding to the number of parts with value below the specified. It was found that "n" does not influence significantly the distribution of "Riso"; however, generates fewer parts below the specified. Now "tc" does not significantly influence the process. Regarding the tooth type, straight profile obtained better results for saw blades with 80 teeth and curved profile for blades with 160 teeth. However the thickness of the blade did not influence significantly the process. The high speed steel blade presented adhesion of aluminum on the side of the saw body and, consequently, adhesion of material on the cutting surface. The cemented carbide blades uncoated presented failures on metalized film because of the friction generated between the cutting surface and the side of the blade; this drawback is eliminated when it is coated with DLC film presenting improvements to the parts "Riso" for lower "n". There was also aluminum adhesion on the bottom of the tooth due to a delamination of the DLC film layer.
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Lee, Yuen-Pen. "Electrically and thermally activated ageing mechanisms in metallised polymer film capacitors." Thesis, Loughborough University, 2001. https://dspace.lboro.ac.uk/2134/33870.

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Анотація:
This dissertation describes a combined computational and experimental study to understand the fundamental electrostatic, thermal, electromagnetic, and discharge related processes during the ageing of metallised polymer film capacitors. In the event of internal breakdowns, these capacitors are capable of "self-healing" through a controlled isolation of defects on the electrode surfaces by mosaic patterning the electrode. The objective of this project is to develop viable computer models to unravel electrothermally activated ageing processes in capacitors. To provide the necessary validation to any capacitor models developed, our work is supported by comprehensive experiments including industrial standard accelerated life tests and associated breakdown damage analyses of tested capacitors.
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Brown, Robert Winston, and rwb@rmit edu au. "Electrical and Thermal Modelling of Low Power Metallised Polypropylene Capacitors." RMIT University. Electrical and Computer Engineering, 2007. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20080130.155318.

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Анотація:
Metallised polypropylene (MPP) capacitors, the dominant capacitor type used in a wide range of power and electronic circuit applications, offer high volumetric capacitor density, low cost, excellent frequency characteristics and a unique ability to recover from point failures in the dielectric film. However MPP capacitors have a generic weakness that is not well understood, failure of the self-healing process leading to ongoing catastrophic failure. The work described in this thesis includes the derivation of an improved electrical model of a capacitor and the uncovering of a mechanism for the catastrophic failure mode. Corrosion of the thin metallic field is firmly linked to drastic increases in metal film current densities and generation of hot spots in capacitors. In the work, novel formulae were derived relating capacitor parameters such as equivalent series resistance and equivalent series capacitance to frequency and physical characteristics such as metal film resistivity and physical dimensions of multiple layer capacitors. Modelling using numerical methods and diffusion equation showed that capacitors with double-end connection topology have more uniform voltage and power distribution than single-end connected capacitors. External characteristics of both connection topologies were shown to be virtually identical up to frequencies well above typical self-resonance. The aggregate spatial distribution of power from both layers and the voltage across the dielectric were found to be fundamentally different in the two circuit connection topologies. In this work it was shown that above singularity frequencies defined by distributed capacitance and metal film spreading resistance, equivalent series resistance and capacitance both fall with the square root of frequency Analysis of the inductance of typical MPP capacitors for single-end and double-end connected topologies and for circumferentially connected capacitor metallization showed that the magnitude and effect of distributed inductance in typical MPP power capacitors was insignificant compared to packaging inductance. Thermal and electrical modelling and experimental measurements showed that corrosion effects could readily account for the generic catastrophic failure mode of metallised polypropylene capacitors. Modelling showed that remnant vestiges of metal bridging corrosion gaps between the schooping and the metallic film could also pose serious thermal danger to the affected capacitor. Fusing current modelling and experimental measurement showed that fusing in metallic films typically occurred for current densities of several hundred thousand amperes per square centimetre. The partial disconnection of the metallic layers from the schooping edge by corrosion for example, was shown to result in large increases in dissipation factor and power loss in a capacitor readily explaining how capacitors
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Rochefort, Claire. "Analyse du vieillissement, estimation de la durée de vie et méthode de surveillance de l’état de santé des condensateurs à film métallisé." Electronic Thesis or Diss., Lyon 1, 2024. http://www.theses.fr/2024LYO10183.

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Анотація:
Très largement utilisés, les condensateurs à films métallisés sont une cause commune de panne des systèmes d’électronique de puissance. Leur défaillance peut engendrer des risques d’explosion et d’incendie. Outre l’enjeu de sécurité, l’étude des défaillances est justifiée par les enjeux économiques relatifs à la maintenance des systèmes. L’objectif est de prédire l’évolution du vieillissement pour estimer la durée de vie utile restante et d’anticiper les pannes soudaines. A ce jour, les lois de vieillissement les plus utilisées nécessitent d’effectuer préalablement des essais de vieillissement accéléré afin d’identifier leurs paramètres et de permettre leur extrapolation. Ces paramètres varient grandement selon les différentes séries de condensateurs et leurs fabricants. Ces lois sont donc coûteuses à exploiter et non robustes. D’autres lois sont basées sur des processus stochastiques ou sur les mécanismes de défaillance. Il reste cependant à évaluer leur robustesse et leur portée prédictive. Enfin, si des dispositifs sont mis en place pour diminuer l’occurrence des défaillances catalectiques et leurs impacts, des accidents subsistent. Il reste nécessaire de prévenir ce type de défaillance catalectique indépendamment des spécificités internes et de l’historique du condensateur. Afin de répondre à ces problématiques, des travaux ont été menés en collaboration avec Schneider Electric dans le cadre d’un contrat CIFRE. Plusieurs essais de vieillissement accéléré ont été effectués sur un total de 111 condensateurs provenant de fabricants différents. Une première campagne de test s’est focalisée sur un vieillissement dans des conditions fixes en tension alternative et en température. La seconde a ajouté la contrainte de l’humidité. Des analyses post-mortem ont montré que les différentes campagnes de vieillissement conduisaient à la prévalence d’un type de mécanisme de défaillance spécifique. La première campagne a mis en évidence les effets des auto-cicatrisations et la seconde, ceux de la corrosion. Grâce à ces résultats, des modélisations de l’évolution de la capacité selon ces deux mécanismes ont pu être établies. Ces dernières ont été validées par les données au regard de lois existantes. Une première modélisation de la dégradation de la résistance de métallisation sous l’effet d’auto-cicatrisations a également été proposée. En parallèle, un grand nombre d’emballements thermiques de condensateurs ont pu être constatés. Grâce à des relevés d’indicateurs de santé, mesurés en temps réel, une étude approfondie du processus a pu être réalisée. Des signes précurseurs du claquage thermique ont été mis en évidence. Il devient ainsi possible de détecter précocement les emballements et d’agir pour prévenir leurs dégâts. Sur ce principe, une méthode générique de prévention des risques de claquages thermiques a été proposée. Sa faisabilité a été démontrée et évaluée expérimentalement
Widely used, the metallized film capacitors are a common cause of electronic system failure. Some of their failures can lead to serious accidents and severe damage to their surroundings, such as explosions or fires. In addition to these safety issues, the failures analysis is justified by the economic issues related to the maintenance of these systems. The objective is to estimate the remaining useful lifetime and to prevent the sudden failures. Nowadays, the most used ageing laws require performing preliminary ageing tests to identify their parameters and enable their extrapolation. These parameters strongly depend on the series and the manufacturer of the capacitor itself. For these reasons, these ageing laws are costly to use and not robust. Other types of laws based on stochastic processes and related to failure mechanisms are emerging. However, their robustness and predictive capability need to be evaluated. Finally, even if measures are implemented to reduce the occurrence of catastrophic failures, risks persist. There is a need to prevent these types of failures without solely relying on the internal characteristics and the background of the capacitors. To address these issues, this work was carried out in collaboration with Schneider Electric as part of a CIFRE contract. Several accelerated ageing tests were carried out on a total of 111 capacitors from different manufacturers. The first test campaign focused on ageing under fixed conditions of alternating voltage and temperature, while the second added the additional constraint of humidity. Post-mortem analysis revealed that the different ageing campaigns led to the prevalence of a specific type of failure mechanism. The first campaign highlighted the effects of self-healing, and the second, those of corrosion. Based on these results, models of the capacitance evolution according to these two mechanisms were established. These were validated by the data in comparison to some existing laws. A first model based on the metallization resistance degradation due to self-healing effects was also proposed. Simultaneously, a large number of thermal runaways on capacitors were observed. Through real-time health indicator measurements, an in-depth study of the process was conducted. Early signs of thermal breakdown were identified. These results enable the early detection of thermal runaway and the implementation of damage prevention measures. Based on this principle, a generic method for preventing the risk of thermal breakdown was proposed. Its feasibility has been demonstrated and experimentally evaluated
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Makdessi, Maawad. "Modélisation, vieillissement et surveillance de l'état de santé des condensateurs films utilisés dans des applications avioniques." Phd thesis, Université Claude Bernard - Lyon I, 2014. http://tel.archives-ouvertes.fr/tel-01058227.

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Анотація:
Le domaine aéronautique connait de nos jours un engouement sans précédent autour de l'avion plus électrique. L'importance du nombre d'équipements électriques est à un tel point que l'amélioration de leur fiabilité devient incontournable. Actuellement, les composants passifs occupent 75 % des éléments électroniques utilisés en avionique dont la moitié correspond à des condensateurs. Ces derniers doivent donc répondre aux exigences environnementales avioniques assez contraignantes. C'est dans ce contexte que nous nous sommes intéressés particulièrement à l'étude des condensateurs à technologie film utilisant le polypropylène ou le polyester comme diélectrique. Afin de mieux comprendre le comportement fréquentiel de cette technologie, deux modèles fins de condensateurs films ont été développés, permettant ainsi de suivre les évolutions de leurs grandeurs électriques dans des conditions cohérentes avec l'application. Dans un deuxième temps, l'effet des contraintes en tension et en température constantes a été étudié sous la forme de facteurs d'accélération du vieillissement. Cela a été établi par l'intermédiaire de plusieurs essais, permettant d'établir les lois d'évolutions temporelles des paramètres électriques des condensateurs. Comme ces contraintes constantes ne sont pas toujours représentatives des conditions réelles d'utilisation, les cinétiques de dégradation ont été comparées à celles où les condensateurs sont sollicités par de fortes ondulations de courant, seules ou associées à une tension continue. Enfin, la dernière partie de notre travail expose l'utilisation des données expérimentales issues des essais de vieillissement dans un objectif de diagnostic en ligne. Les techniques utilisées assurent l'analyse de la dégradation de ces composants, étape essentielle dans la prédiction de l'état de santé des condensateurs en ligne
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Частини книг з теми "Metallized film capacitor"

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Yu, Hongyu, Li Ran, Hao Feng, and Jinxiao Wei. "Design of Increasing Dielectric Constant of Metallized Film Capacitor to Reduce Its Volume in MMC." In The Proceedings of 2022 International Conference on Wireless Power Transfer (ICWPT2022), 975–82. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-0631-4_97.

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Xiao, Meng, Boxue Du, Ranran Xu, Zhaoyu Ran, Haoliang Liu, Jiwen Xing, and Kailun Fan. "Improvement of Dielectric Properties of Polypropylene Film for HVDC Metallized Film Capacitors." In Polymer Insulation Applied for HVDC Transmission, 627–51. Singapore: Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-9731-2_25.

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Yan, Fei, and Xiang Huang. "Study on Factors Influencing Self-healing Energy of Metallized Film Capacitors." In Lecture Notes in Electrical Engineering, 111–23. Singapore: Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-99-7401-6_11.

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Cui, Yanjie, Yong Sun, Wenhao Lu, Cheng Yao, and Chunhong Zhou. "Research on the Influence of Safety Film on the Thermal Field Distribution of Metallized Film Capacitors." In Lecture Notes in Electrical Engineering, 447–55. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-7413-9_42.

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Cui, Huize, Zhaoliang Xing, and Chong Zhang. "Influence Mechanism of Hot-Press Setting Time and Winding Tension on the Performance of Metallized Film Capacitors." In Lecture Notes in Electrical Engineering, 713–22. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-7413-9_68.

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Тези доповідей конференцій з теми "Metallized film capacitor"

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Zhang, Jie, Feipeng Wang, Jian Zhou, Yushuang He, and Guoqiang Du. "Dependence of Self-Healing Arc on Metal Vaporization Contributions for Metallized Film Capacitor." In 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613128.

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Xiao, Meng, Liangtian Zhang, Xiaodan Du, Xiangyu Dong, and Boxue Du. "Study on Partial Discharge Characteristics of Dielectric Films for Metallized Film Capacitors." In 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613102.

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Yi, Chengqian, Bo Zhang, Chaoran Li, and Yufan Yao. "Charge-discharge current distribution among elements in metallized film capacitors used for MMC." In 2024 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/ichve61955.2024.10676226.

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Xiao, Meng, Liangtian Zhang, Zhiyuan Zhang, Yuyan Cheng, Zening Lu, and Boxue Du. "Research on Partial Discharge and Self-Healing Characteristics for Metallized Film of Capacitors." In 2024 IEEE 5th International Conference on Dielectrics (ICD), 1–4. IEEE, 2024. http://dx.doi.org/10.1109/icd59037.2024.10613348.

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Zuo, Qianglin, Yanjun Zhao, and Xu Han. "Research on Application of Self-Healing Metallized Film Capacitors of DC Filter for HVDC System." In 2024 International Conference on HVDC (HVDC), 347–54. IEEE, 2024. http://dx.doi.org/10.1109/hvdc62448.2024.10723079.

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Ho, J., T. R. Jow, and S. A. Boggs. "Implications of Advanced Capacitor Dielectrics for Performance of Metallized Film Capacitor Windings." In 2008 IEEE International Power Modulators and High Voltage Conference (IPMC). IEEE, 2008. http://dx.doi.org/10.1109/ipmc.2008.4743718.

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Li, Hua, Fuchang Lin, Heqing Zhong, Ling Dai, Yongxia Han, and Zhonghua Kong. "Study on Metallized Film Capacitor and its Voltage Maintaining Performance." In 2008 14th Symposium on Electromagnetic Launch Technology. IEEE, 2008. http://dx.doi.org/10.1109/elt.2008.81.

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He, Yushuang, Feipeng Wang, Jianyu Pan, Haider M. Umran, Li Ran, and Zhengyong Huang. "Effect of Temperature on Dielectric Properties of Metallized Film Capacitor." In 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE). IEEE, 2021. http://dx.doi.org/10.1109/icempe51623.2021.9509161.

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Sun, Yuting, Mingyu Wang, and Li Ran. "Capacitance Monitoring Method for Metallized Polypropylene Film Capacitor in MMC." In 2019 IEEE Sustainable Power and Energy Conference (iSPEC). IEEE, 2019. http://dx.doi.org/10.1109/ispec48194.2019.8974877.

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Pan, Wei, Junni Su, Qihao Zhong, Lingfeng Wei, and Jianhao Zhou. "Reliable Application of Metallized Film Capacitor for Flexible HVDC Valve." In 2022 IEEE 5th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE). IEEE, 2022. http://dx.doi.org/10.1109/auteee56487.2022.9994446.

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