Статті в журналах з теми "Magneto- capacitance spectroscopy"
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Upadhyay, Sanjay Kumar, P. L. Paulose, Kartik K. Iyer, and E. V. Sampathkumaran. "Spin-glass behavior and pyroelectric anomalies in a new lithium-based oxide, Li3FeRuO5." Physical Chemistry Chemical Physics 18, no. 33 (2016): 23348–53. http://dx.doi.org/10.1039/c6cp04179e.
Повний текст джерелаRADANTSEV, V. F., G. I. KULAEV, and V. V. KRUZHAEV. "KINETIC CONFINEMENT AND ZERO–ELECTRIC–FIELD BINDING IN HgCdTe ACCUMULATION LAYERS." International Journal of Modern Physics B 18, no. 27n29 (November 30, 2004): 3637–40. http://dx.doi.org/10.1142/s0217979204027189.
Повний текст джерелаKailuweit, P., D. Reuter, A. D. Wieck, O. Wibbelhoff, A. Lorke, U. Zeitler, and J. C. Maan. "Mapping of the hole wave functions of self-assembled InAs-quantum dots by magneto-capacitance–voltage spectroscopy." Physica E: Low-dimensional Systems and Nanostructures 32, no. 1-2 (May 2006): 159–62. http://dx.doi.org/10.1016/j.physe.2005.12.031.
Повний текст джерелаKailuweit, Peter, Dirk Reuter, Andreas D. Wieck, Oliver Wibbelhoff, Axel Lorke, Uli Zeitler, and J. C. Maan. "Erratum to “Mapping of the hole wave functions of self-assembled InAs-quantum dots by magneto-capacitance–voltage spectroscopy”." Physica E: Low-dimensional Systems and Nanostructures 40, no. 4 (February 2008): 935–36. http://dx.doi.org/10.1016/j.physe.2007.08.074.
Повний текст джерелаMukhopadhyay, K., M. Ghosh, P. K. Mallick, and P. K. Chakrabarti. "Enhanced electric property and magneto-capacitance co-efficient co-related with modulated Raman spectroscopy of GaFeO3 in (GaFeO3)0.50(Ni0.40Zn0.40Cu0.20Fe2O4)0.50." Materials Science and Engineering: B 189 (November 2014): 51–57. http://dx.doi.org/10.1016/j.mseb.2014.07.010.
Повний текст джерелаBunoiu, Madalin, Eugen Mircea Anitas, Gabriel Pascu, Larisa Marina Elisabeth Chirigiu, and Ioan Bica. "Electrical and Magnetodielectric Properties of Magneto-Active Fabrics for Electromagnetic Shielding and Health Monitoring." International Journal of Molecular Sciences 21, no. 13 (July 6, 2020): 4785. http://dx.doi.org/10.3390/ijms21134785.
Повний текст джерелаShauyenova, Danagul, Sol Jung, Haneul Yang, Haein Yim, and Heongkyu Ju. "Electrical and Optical Properties of Co75Si15B10 Metallic Glass Nanometric Thin Films." Materials 14, no. 1 (December 31, 2020): 162. http://dx.doi.org/10.3390/ma14010162.
Повний текст джерелаBalberg, I., and E. Gal. "Capacitance spectroscopy of a-Si:H." Journal of Non-Crystalline Solids 77-78 (December 1985): 323–26. http://dx.doi.org/10.1016/0022-3093(85)90666-0.
Повний текст джерелаAlim, Mohammad A., Sanjida Khanam, and Martin A. Seitz. "Immittance Spectroscopy of Smart Components and Novel Devices." Active and Passive Electronic Components 16, no. 3-4 (1994): 153–70. http://dx.doi.org/10.1155/1994/25820.
Повний текст джерелаZhang, Hui, Yong Wei Song, and Zhen Lun Song. "Electrodeposited Ni/Al2O3 Composite Coating on NdFeB Permanent Magnets." Key Engineering Materials 373-374 (March 2008): 232–35. http://dx.doi.org/10.4028/www.scientific.net/kem.373-374.232.
Повний текст джерелаTessmer, S. H., I. Kuljanishvili, C. Kayis, J. F. Harrison, C. Piermarocchi, and T. A. Kaplan. "Nanometer-scale capacitance spectroscopy of semiconductor donor molecules." Physica B: Condensed Matter 403, no. 19-20 (October 2008): 3774–80. http://dx.doi.org/10.1016/j.physb.2008.07.003.
Повний текст джерелаMoertelmaier, M., H. P. Huber, C. Rankl, and F. Kienberger. "Continuous capacitance–voltage spectroscopy mapping for scanning microwave microscopy." Ultramicroscopy 136 (January 2014): 67–72. http://dx.doi.org/10.1016/j.ultramic.2013.07.011.
Повний текст джерелаHein, Robert, Arseni Borissov, Martin D. Smith, Paul D. Beer, and Jason J. Davis. "A halogen-bonding foldamer molecular film for selective reagentless anion sensing in water." Chemical Communications 55, no. 33 (2019): 4849–52. http://dx.doi.org/10.1039/c9cc00335e.
Повний текст джерелаSizmann, R., J. Chu, F. Koch, J. Ziegler, and H. Maier. "Sub-band and resonant level spectroscopy from capacitance measurements." Semiconductor Science and Technology 5, no. 3S (March 1, 1990): S111—S114. http://dx.doi.org/10.1088/0268-1242/5/3s/024.
Повний текст джерелаOk, Betül, Metin Gencten, Melih B. Arvas, and Yucel Sahin. "Preparation of Copper Doped Conducting Polymers and Their Supercapacitor Applications." ECS Journal of Solid State Science and Technology 11, no. 3 (March 1, 2022): 033004. http://dx.doi.org/10.1149/2162-8777/ac57f5.
Повний текст джерелаLi, Jian V., Adam T. Neal, Shin Mou та Man Hoi Wong. "Investigation of a defect in the β-Ga2O3 substrate material from capacitance transients". Journal of Vacuum Science & Technology B 40, № 6 (грудень 2022): 064001. http://dx.doi.org/10.1116/6.0002045.
Повний текст джерелаBrezna, W., T. Roch, G. Strasser, and J. Smoliner. "Quantitative scanning capacitance spectroscopy on GaAs and InAs quantum dots." Semiconductor Science and Technology 20, no. 9 (July 22, 2005): 903–7. http://dx.doi.org/10.1088/0268-1242/20/9/002.
Повний текст джерелаRaeissi, B., J. Piscator, O. Engström, S. Hall, O. Buiu, M. C. Lemme, H. D. B. Gottlob, P. K. Hurley, K. Cherkaoui, and H. J. Osten. "High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy." Solid-State Electronics 52, no. 9 (September 2008): 1274–79. http://dx.doi.org/10.1016/j.sse.2008.04.005.
Повний текст джерелаReuter, Dirk, Razvan Roescu, Minisha Mehta, Mirja Richter, and A. D. Wieck. "Capacitance–voltage spectroscopy of post-growth annealed InAs quantum dots." Physica E: Low-dimensional Systems and Nanostructures 40, no. 6 (April 2008): 1961–64. http://dx.doi.org/10.1016/j.physe.2007.09.061.
Повний текст джерелаSobolev, M. M., and F. Y. Soldatenkov. "Capacitance Spectroscopy of Heteroepitaxial AlGaAs/GaAs p–i–n Structures." Semiconductors 54, no. 10 (October 2020): 1260–66. http://dx.doi.org/10.1134/s1063782620100280.
Повний текст джерелаVollbrecht, Joachim, and Viktor V. Brus. "On Charge Carrier Density in Organic Solar Cells Obtained via Capacitance Spectroscopy." Advanced Electronic Materials 6, no. 10 (September 11, 2020): 2000517. http://dx.doi.org/10.1002/aelm.202000517.
Повний текст джерелаAbouzar, Maryam H., Werner Moritz, Michael J. Schöning, and Arshak Poghossian. "Capacitance-voltage and impedance-spectroscopy characteristics of nanoplate EISOI capacitors." physica status solidi (a) 208, no. 6 (May 5, 2011): 1327–32. http://dx.doi.org/10.1002/pssa.201001211.
Повний текст джерелаShutov, S. D., and A. A. Simashkevich. "Isothermal capacitance transient spectroscopy of gap states in a-As2Se3 film." Journal of Non-Crystalline Solids 176, no. 2-3 (November 1994): 253–57. http://dx.doi.org/10.1016/0022-3093(94)90084-1.
Повний текст джерелаKim, M. C., and S. J. Park. "Isothermal capacitance transient spectroscopy study on (Ba, Sr)TiO3-based ptcr ceramics." Ferroelectrics 153, no. 1 (March 1, 1994): 267–72. http://dx.doi.org/10.1080/00150199408016578.
Повний текст джерелаWibbelhoff, O., C. Meier, A. Lorke, P. Schafmeister, and A. D. Wieck. "Wave function mapping of self-assembled quantum dots by capacitance spectroscopy." Physica E: Low-dimensional Systems and Nanostructures 21, no. 2-4 (March 2004): 516–20. http://dx.doi.org/10.1016/j.physe.2003.11.077.
Повний текст джерелаSobolev, M. M., A. R. Kovsh, V. M. Ustinov, A. Yu Egorov, A. E. Zhukov, and Yu G. Musikhin. "Capacitance spectroscopy of deep states in InAs/GaAs quantum dot heterostructures." Semiconductors 33, no. 2 (February 1999): 157–64. http://dx.doi.org/10.1134/1.1187663.
Повний текст джерелаStreet, Robert A., Yang Yang, Barry C. Thompson, and Iain McCulloch. "Capacitance Spectroscopy of Light Induced Trap States in Organic Solar Cells." Journal of Physical Chemistry C 120, no. 39 (September 20, 2016): 22169–78. http://dx.doi.org/10.1021/acs.jpcc.6b06561.
Повний текст джерелаDe Visschere, Patrick, and Karel Vanbesien. "Capacitance spectroscopy of alumina sol–gel capacitors with Al top contacts." Journal of Sol-Gel Science and Technology 45, no. 3 (January 31, 2008): 225–35. http://dx.doi.org/10.1007/s10971-008-1687-2.
Повний текст джерелаLin, Yu-Yao, Adam T. Neal, Shin Mou та Jian V. Li. "Study of defects in β-Ga2O3 by isothermal capacitance transient spectroscopy". Journal of Vacuum Science & Technology B 37, № 4 (липень 2019): 041204. http://dx.doi.org/10.1116/1.5109088.
Повний текст джерелаJiang, Huaning, Ying Tian, Xuewei Dong, and Guozhi Zhao. "Gas–Liquid Co-Deposition Fabrication of MnO2 Nanosphere and Its Capacitive Properties in Alkaline and Neutral Electrolytes." Journal of Nanoelectronics and Optoelectronics 17, no. 4 (April 1, 2022): 642–51. http://dx.doi.org/10.1166/jno.2022.3249.
Повний текст джерелаPlaczek-Popko, E., E. Zielony, J. Trzmiel, J. Szatkowski, Z. Gumienny, T. Wojtowicz, G. Karczewski, P. Kruszewski, and L. Dobaczewski. "Capacitance spectroscopy of CdTe self-assembled quantum dots embedded in ZnTe matrix." Physica B: Condensed Matter 404, no. 23-24 (December 2009): 5173–76. http://dx.doi.org/10.1016/j.physb.2009.08.274.
Повний текст джерелаKapteyn, C. M. A., M. Lion, R. Heitz, D. Bimberg, C. Miesner, T. Asperger, K. Brunner, and G. Abstreiter. "Hole Emission from Ge/Si Quantum Dots Studied by Time-Resolved Capacitance Spectroscopy." physica status solidi (b) 224, no. 1 (March 2001): 261–64. http://dx.doi.org/10.1002/1521-3951(200103)224:1<261::aid-pssb261>3.0.co;2-3.
Повний текст джерелаFilikhin, I., E. Deyneka, and B. Vlahovic. "Single-electron levels of InAs/GaAs quantum dot: Comparison with capacitance spectroscopy." Physica E: Low-dimensional Systems and Nanostructures 31, no. 1 (January 2006): 99–102. http://dx.doi.org/10.1016/j.physe.2005.10.002.
Повний текст джерелаIzpura, I., A. Mondaray, E. Munoz, and E. Calleja. "On the spectroscopy of DX centres by transient techniques at constant capacitance." Semiconductor Science and Technology 10, no. 1 (January 1, 1995): 25–31. http://dx.doi.org/10.1088/0268-1242/10/1/004.
Повний текст джерелаUrbaniak, A., A. Czudek, J. Dagar, and E. L. Unger. "Capacitance spectroscopy of thin-film formamidinium lead iodide based perovskite solar cells." Solar Energy Materials and Solar Cells 238 (May 2022): 111618. http://dx.doi.org/10.1016/j.solmat.2022.111618.
Повний текст джерелаAkilavasan, Jeganathan, and Frank Marlow. "Electrochemical Impedance Spectroscopy at Redox-Type Liquid|Liquid Interfaces: The Capacitance Lag." Journal of Physical Chemistry C 124, no. 7 (January 28, 2020): 4101–8. http://dx.doi.org/10.1021/acs.jpcc.9b10116.
Повний текст джерелаLiu, W. L., Y. L. Chen, A. A. Balandin, and K. L. Wang. "Capacitance–Voltage Spectroscopy of Trapping States in GaN/AlGaN Heterostructure Field-Effect Transistors." Journal of Nanoelectronics and Optoelectronics 1, no. 2 (August 1, 2006): 258–63. http://dx.doi.org/10.1166/jno.2006.212.
Повний текст джерелаLi, Q., Y. F. Zhang, X. R. Han, C. Ju, and Z. L. Wang. "A comparison of MoO3 nanorods and C/MoO3 nanocomposites for high-performance supercapacitor electrode." Chalcogenide Letters 18, no. 7 (July 2021): 413–20. http://dx.doi.org/10.15251/cl.2021.187.413.
Повний текст джерелаIgalson, Malgorzata, Aleksander Urbaniak, and Marika Edoff. "Reinterpretation of defect levels derived from capacitance spectroscopy of CIGSe solar cells." Thin Solid Films 517, no. 7 (February 2009): 2153–57. http://dx.doi.org/10.1016/j.tsf.2008.10.092.
Повний текст джерелаGudovskikh, A. S., A. I. Baranov, A. V. Uvarov, D. A. Kudryashov, and J.-P. Kleider. "Space charge capacitance study of GaP/Si multilayer structures grown by plasma deposition." Journal of Physics D: Applied Physics 55, no. 13 (December 30, 2021): 135103. http://dx.doi.org/10.1088/1361-6463/ac41fa.
Повний текст джерелаKiyota, H., H. Okushi, K. Okano, Y. Akiba, T. Kurosu, and M. Iida. "Isothermal capacitance transient spectroscopy study of defect states in polycrystalline diamond films." Diamond and Related Materials 2, no. 8 (May 1993): 1179–84. http://dx.doi.org/10.1016/0925-9635(93)90166-y.
Повний текст джерелаLim, Youngjoon, and Sang-Yup Lee. "Capacitance Measurement of SiO2@BSA Core–Shell Nanoparticles Using AC Impedance Spectroscopy." Journal of The Electrochemical Society 162, no. 8 (2015): G48—G53. http://dx.doi.org/10.1149/2.0751508jes.
Повний текст джерелаKapteyn, C. M. A., M. Lion, R. Heitz, D. Bimberg, P. Brunkov, B. Volovik, S. G. Konnikov, A. R. Kovsh, and V. M. Ustinov. "Time-Resolved Capacitance Spectroscopy of Hole and Electron Levels in InAs/GaAs Quantum Dots." physica status solidi (b) 224, no. 1 (March 2001): 57–60. http://dx.doi.org/10.1002/1521-3951(200103)224:1<57::aid-pssb57>3.0.co;2-r.
Повний текст джерелаSchmidt, Matthias, Kerstin Brachwitz, Florian Schmidt, Martin Ellguth, Holger von Wenckstern, Rainer Pickenhain, Marius Grundmann, Gerhard Brauer, and Wolfgang Skorupa. "Nickel-related defects in ZnO - A deep-level transient spectroscopy and photo-capacitance study." physica status solidi (b) 248, no. 8 (March 10, 2011): 1949–55. http://dx.doi.org/10.1002/pssb.201046634.
Повний текст джерелаSobolev, M. M., O. S. Ken, O. M. Sreseli, D. A. Yavsin, and S. A. Gurevich. "Capacitance spectroscopy of structures with Si nanoparticles deposited onto crystalline silicon p-Si." Semiconductor Science and Technology 34, no. 8 (July 5, 2019): 085003. http://dx.doi.org/10.1088/1361-6641/ab2c21.
Повний текст джерелаRather, Mudasir Hussain, Feroz Ahmad Mir, and Peerzada Ajaz Ahmad. "Performance of a PANI/MnO2 Nanocomposite-Based Supercapacitor/Diode Under DC Magnetic Field and Visible and Ultraviolet Photon Irradiation." ECS Journal of Solid State Science and Technology 12, no. 3 (March 1, 2023): 033004. http://dx.doi.org/10.1149/2162-8777/acbfde.
Повний текст джерелаMuret, Pierre R. "Comprehensive characterization of interface and oxide states in metal/oxide/semiconductor capacitors by pulsed mode capacitance and differential isothermal capacitance spectroscopy." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 32, no. 3 (May 2014): 03D114. http://dx.doi.org/10.1116/1.4865912.
Повний текст джерелаPoghossian, A., D. T. Mai, Yu Mourzina, and M. J. Schöning. "Impedance effect of an ion-sensitive membrane: characterisation of an EMIS sensor by impedance spectroscopy, capacitance–voltage and constant–capacitance method." Sensors and Actuators B: Chemical 103, no. 1-2 (September 2004): 423–28. http://dx.doi.org/10.1016/j.snb.2004.04.071.
Повний текст джерелаWetzler, R., C. M. A. Kapteyn, R. Heitz, A. Wacker, E. Sch�ll, and D. Bimberg. "Capacitance-Voltage Spectroscopy of Self-Organized InAs/GaAs Quantum Dots Embedded in a pn Diode." physica status solidi (b) 224, no. 1 (March 2001): 79–83. http://dx.doi.org/10.1002/1521-3951(200103)224:1<79::aid-pssb79>3.0.co;2-b.
Повний текст джерелаGudovskikh, A. S., J. P. Kleider, and R. Stangl. "New approach to capacitance spectroscopy for interface characterization of a-Si:H/c-Si heterojunctions." Journal of Non-Crystalline Solids 352, no. 9-20 (June 2006): 1213–16. http://dx.doi.org/10.1016/j.jnoncrysol.2005.11.100.
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