Готові списки джерел за темами / Long-term electrical reliability

Добірка наукової літератури з теми "Long-term electrical reliability"

Автор: Grafiati
Опубліковано: 6 вересня 2023

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Статті в журналах з теми "Long-term electrical reliability"

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Xie, Jingsong, Ming Sun, Michael Pecht, and David F. Barbe. "Why Gold Flash Can Be Detrimental to Long-Term Reliability." Journal of Electronic Packaging 126, no. 1 (March 1, 2004): 37–40. http://dx.doi.org/10.1115/1.1646425.

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Most connectors are made from copper or copper alloys, with beryllium copper and phosphor bronze being the most common base materials due to their high electrical conductivity, low stress relaxation, and competitive cost. The most significant drawback is copper’s low resistance to corrosion, which can lead to electrical failure of connectors. For this reason, a layer of gold is often plated on the surfaces of connectors to seal off the base metal from being directly exposed to the environment. As an economical practice, gold flashing has been used to protect electrical contacts from corrosion. However, there is increasing evidence indicating that gold flashing can be detrimental in applications calling for long-term reliability. This paper provides insight into reliability issues of gold flash.
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2

Lenner, Miklos, Andreas Frank, Lin Yang, Tomas Mikael Roininen, and Klaus Bohnert. "Long-Term Reliability of Fiber-Optic Current Sensors." IEEE Sensors Journal 20, no. 2 (January 15, 2020): 823–32. http://dx.doi.org/10.1109/jsen.2019.2944346.

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3

Peterson, D. K., M. L. Nochomovitz, T. A. Stellato, and J. T. Mortimer. "Long-term intramuscular electrical activation of the phrenic nerve: safety and reliability." IEEE Transactions on Biomedical Engineering 41, no. 12 (1994): 1115–26. http://dx.doi.org/10.1109/10.335860.

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4

Miyake, Takuma, Yoshihiro Arata, Tatsuya Sakoda, Masahisa Otsubo, Yasufumi Sonoda, and Hiroshi Yamaguchi. "Assessing Long-term Reliability of Polymeric Housing Materials." IEEJ Transactions on Power and Energy 131, no. 6 (2011): 530–31. http://dx.doi.org/10.1541/ieejpes.131.530.

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Plumbridge, W. J. "Long term mechanical reliability with lead‐free solders." Soldering & Surface Mount Technology 16, no. 2 (August 2004): 13–20. http://dx.doi.org/10.1108/09540910410537291.

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6

Kim, Bal-Ho H. "A Study on Reliability Differentiated Pricing of Long-Term Transactions." Journal of Electrical Engineering and Technology 6, no. 1 (January 1, 2011): 8–13. http://dx.doi.org/10.5370/jeet.2011.6.1.008.

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7

Golovanov, Igor', Pavel Maslihov, Uulu Turatbek, and Natal'ya Bel'dyagina. "STUDY OF THE RELIABILITY OF ELECTRICAL EQUIPMENT OF THE ELECTRICAL POWER SUPPLY SYSTEM, HAVING A LARGE PERIOD OF WORKING." Bulletin of the Angarsk State Technical University 1, no. 12 (December 18, 2018): 29–31. http://dx.doi.org/10.36629/2686-777x-2018-1-12-29-31.

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8

Pecht, Judy, Michael Pecht, and Anthony J. Rafanelli. "Long-Term Non-Operating Reliability of Electronic Products." Journal of Electronic Packaging 119, no. 2 (June 1, 1997): 145–46. http://dx.doi.org/10.1115/1.2792222.

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Matsumoto, Michito, Tadashi Haibara, Yutaka Katsuyama, Masamitsu Tokuda, Tadatoshi Tanifuji, Regular Members, and Mitsuru Miyauchi, Regular Member. "Long-term reliability assurance for arc-fusion spliced fiber." Electronics and Communications in Japan (Part I: Communications) 68, no. 2 (February 1985): 73–81. http://dx.doi.org/10.1002/ecja.4410680210.

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10

Kaga, T., and T. Hagiwara. "Short- and long-term reliability of nitrided oxide MISFETs." IEEE Transactions on Electron Devices 35, no. 7 (July 1988): 929–34. http://dx.doi.org/10.1109/16.3347.

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Книги з теми "Long-term electrical reliability"

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F, Nelson C., Sandia National Laboratories, and U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Long-term aging and loss-of-coolant accident (LOCA) testing of electrical cables: U.S./French Cooperative Research Program. Washington, DC: U.S. Nuclear Regulatory Commission, 1996.

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2

Powers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.

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3

Powers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.

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4

Powers, Charles E. Long-term life testing of Geostationary Operational Environmental Satellite (GOES) encoder lamps. Greenbelt, Md: Goddard Space Flight Center, 1992.

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5

Powers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. Washington, D.C: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.

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6

Powers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.

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Частини книг з теми "Long-term electrical reliability"

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Pecht, Judy, and Michael Pecht. "Electrical Failure Mechanisms." In Long-Term Non-Operating Reliability of Electronic Products, 23–28. CRC Press, 2019. http://dx.doi.org/10.1201/9781351074179-3.

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2

Sovcik, Michal, Lukas Nagy, Viera Stopjakova, and Daniel Arbet. "Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability." In Practical Applications in Reliability Engineering. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.96609.

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Анотація:
This chapter deals with digital method of calibration for analog integrated circuits as a means of extending its lifetime and reliability, which consequently affects the reliability the analog electronic system as a whole. The proposed method can compensate for drift in circuit’s electrical parameters, which occurs either in a long term due to aging and electrical stress or it is rather more acute, being caused by process, voltage and temperature variations. The chapter reveals the implementation of ultra-low voltage on-chip system of digitally calibrated variable-gain amplifier (VGA), fabricated in CMOS 130 nm technology. It operates reliably under supply voltage of 600mV with 10% variation, in temperature range from −20°C to 85°C. Simulations suggest that the system will preserve its parameters for at least 10 years of operation. Experimental verification over 10 packaged integrated circuit (IC) samples shows the input offset voltage of VGA is suppressed in range of 13μV to 167μV. With calibration the VGA closely meets its nominally designed essential specifications as voltage gain or bandwidth. Digital calibration is comprehensively compared to its widely used alternative, Chopper stabilization through its implementation for the same VGA.
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3

Qamber, Isa S., and Mohamed Y. Alhamad. "Smart Grid-Integrated Electric Vehicle Charging Infrastructure." In Developing Charging Infrastructure and Technologies for Electric Vehicles, 1–24. IGI Global, 2022. http://dx.doi.org/10.4018/978-1-7998-6858-3.ch001.

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The movements for any type of electric vehicle (EV) can be powered by wheels or driven by rotary motors. EVs derive their power from various sources, including fossil fuels. In the long term, reducing the cost of electrically powered vehicles (EDV) is seen as an essential ingredient to increase consumer acceptance. In addition, it aims to reduce the weight and volume of EDV. Moreover, the focus is on improving the performance, efficiency, and reliability of the EDV. The development of innovative modules is important when the acceleration of production and marketing needs to be improved. Consumers are looking for the production and transmission of electrical energy. This contributes to a greener environment. One of the most important parts of an EV is its battery. A proposed model presented in this chapter considers several parameters: solar radiation (PV panels), EV backup battery, and main charger. The model allows energy storage to be developed efficiently.
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4

Wang, Lizhi, and Nan Kong. "Security Constrained Economic Dispatch." In Innovations in Information Systems for Business Functionality and Operations Management, 306–21. IGI Global, 2012. http://dx.doi.org/10.4018/978-1-4666-0933-4.ch018.

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The main objective of electric power dispatch is to provide electricity to the customers at low cost and high reliability. Transmission line failures constitute a great threat to the electric power system security. We use a Markov decision process (MDP) approach to model the sequential dispatch decision making process where demand level and transmission line availability change from hour to hour. The action space is defined by the electricity network constraints. Risk of the power system is the loss of transmission lines, which could cause involuntary load shedding or cascading failures. The objective of the model is to minimize the expected long-term discounted cost (including generation, load shedding, and cascading failure costs). Policy iteration can be used to solve this model. At the policy improvement step, a stochastic mixed integer linear program is solved to obtain the optimal action. We use a PJM network example to demonstrate the effectiveness of our approach.
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Тези доповідей конференцій з теми "Long-term electrical reliability"

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Heo, J. H., H. G. Park, E. C. Lee, C. S. Oh, S. W. Kim, S. W. Lee, J. S. Lim, K. H. Lee, and S. H. Choi. "Evaluation of long-term reliability of power cable including nano-conductive layer." In 2017 International Symposium on Electrical Insulating Materials (ISEIM). IEEE, 2017. http://dx.doi.org/10.23919/iseim.2017.8166572.

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2

Nakanishi, Takahiro, Ken Suzuki, and Hideo Miura. "Improvement of the Long-Term Reliability of Interconnection by Controlling the Crystallinity of Grain Boundaries." In ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels. American Society of Mechanical Engineers, 2015. http://dx.doi.org/10.1115/ipack2015-48200.

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Electroplated copper thin films have started to be employed as the interconnection material in TSV structures of 3D semiconductor modules because of its low electric resistivity and high thermal conductivity. However, electrical and mechanical properties of electroplated copper thin-films have been found to vary drastically depending on their microtexture. In particular, the crystallographic quality (crystallinity) of grain boundaries in the electroplated copper thin-films plays an important role on the variations of these properties and the long-term reliability of the interconnections. This is because grain boundaries are the area where the atomic alignment of mateerials is disordered and thus, various defects such as vacancies, dislocations, impurities, and strain easily concentrate around them. This disorder of the atomic alignment causes the increase in the electrical resistivity, diffusion constant along the grain boundaries, and the brittleness of the material. Therefore, it is very important to evaluate the characteristics of a grain boundary quantitatively in order to control and assure the properties of the electroplated copper thin films. In this study, a novel tensile test method that can measure the strength of a grain boundary has been developed by using a focused ion beam system. In order to investigate the effect of the crystallinity of grain boundaries on their strength, an electron back-scatter diffraction method (EBSD) was employed for the quantitative characterization of grain boundaries. It was confirmed that the strength of grain boundaries with low crystallinity was much lower than that with high crystallinity.
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3

Wood, R. A., and T. E. Salem. "Long-term operation and reliability study of a 1200-V, 880-A all-SiC dual module." In 2012 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM 2012). IEEE, 2012. http://dx.doi.org/10.1109/speedam.2012.6264530.

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4

Ruiz Flores, Luis Ivan, Rafael Castellanos Bustamante, and Jorge Guillermo Calderon Guizar. "Operational Reliability and Modernization of Refineries in Mexico: How?, Why? and Where?" In ASME 2016 Power Conference collocated with the ASME 2016 10th International Conference on Energy Sustainability and the ASME 2016 14th International Conference on Fuel Cell Science, Engineering and Technology. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/power2016-59146.

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This article presents the “Why?” to modernize the electrical systems in the six refineries in Mexico, derived that since 1979 there has not built a new refinery, and the primary electrical equipment at each refinery to process fuel requires of imperative upgrading. It also presents the “How?” partial changes are being implemented in some refineries such as replacing electrical equipment in the short-term and implementation of new distribution systems in the long term. Also, it comes in “Where?” They are making the necessary changes including the integration of new electrical generators to supply the energy deficit. The state of the art in operational reliability today in Mexico is presented as part of a projection to fulfill the following objectives: a) optimize the security of personnel integration of new electrical equipment meeting international standards, b) Contribute the least damage to the primary electrical equipment in each refinery and c) allow tangible service continuity in the process of oil production. The result of this work is to show conditions change in Mexican refineries with an electric approach and culture in the safety of staff and the facilities themselves.
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5

Hung, Tzu-Chieh, and Kuei-Yuan Chan. "Probability-Based Power Dispatch in Wind-Integrated Electrical Grid for Energy Storage Capacity Determination." In ASME 2016 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/detc2016-59809.

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Implementing microgrids has become a current trend in the electric utility industry to either improve system reliability or energy access for energy sustainability. This study proposes a probability-based strategy for both long- and short-term power dispatch with wind and load uncertainty. The long-term power dispatch is used to determine a suitable capacity of energy storage, and the short-term power dispatch is used for real-time operation. For both short- and long-term power dispatch, the trends of wind energy and electricity demand are extracted using the wavelet packet analysis method and the moving average technique. The uncertainties from wind speed and power generation data are modeled with log-normal and extreme value distributions, respectively. From the obtained power dispatch and model forecasting, the capacity of energy storage is determined. To validate the proposed approach, a real-time operating simulation is used as a case study to observe the behavior of the wind-integrated electrical system. Results show that the proposed method can estimate the uncertainty variation range of wind energy and the state of charge of energy storage effectively.
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6

Mohammedjawad Almukharriq, Ali, Ahmed Ali Khalaf, Saud Abdulaziz Alquwizani, and Francis Eugene Dominguez. "A Comprehensive ESP Preventive Maintenance Program for Long-Term Reliability, Better Life Cycle and Maximum Availability." In SPE/IATMI Asia Pacific Oil & Gas Conference and Exhibition. SPE, 2021. http://dx.doi.org/10.2118/205751-ms.

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Abstract The reliability of Electrical Submersible Pumps (ESPs) is a critical target for companies managing artificially lifted fields. While efforts to continuously improve the reliability in the downhole system are crucial, it is necessary to focus on the health and long-term reliability of the ESP surface equipment. One effective approach toward achieving this goal is through conducting a comprehensive Preventive Maintenance Program (PMP) for the different components of the ESP surface system. An ESP PMP should be managed without jeopardizing production strategy. The design of the PMP must meet the production demand while maintaining the best-in-class PMP practices. The well operating condition, frequency, weather, well location, required periodic inspection and preemptive servicing and replacement of surface equipment components must be considered, based on studied criterion. The design of the PMP considers equipment upgrades and thermal imaging surveillance to guarantee healthy electrical systems. The mentioned activities have to be captured in a dedicated checklist to cover all requirements. To ensure adequate PMP planning, a well-structured tracking mechanism must be followed. Implementing the recommended PMP framework contributes to minimizing ESP surface equipment component defects like transformer failures, blown fuses, jammed fans, obsolete drive controllers, etc. The proposed PMP is structured to achieve maximum production availability while maintaining a healthier run-life of surface equipment with minimal outages. To ensure minimal ESP surface equipment malfunctions, a comprehensive periodic checkup and well-designed replacement mechanism of surface equipment components should be implemented. The operator company and the maintenance service provider will be able to easily identify the bad actors without complicating the overall process. Consequently, efforts will be made to assign and implement corrective actions to avoid similar problems. The PMP will significantly enhance the ESP surface equipment reliability and prolong the uptime of the fixed/variable speed drives, associated transformers, and other auxiliary equipment. In addition, it should reduce the ESP trips attributed to the malfunction of any surface equipment component and consequently minimize the operational and financial impact of production disruptions. Ultimately, the operator company will be able to maximize its production availability and comply with its planned strategies to meet its target. As a result, the PMP will significantly improve the ESP Key Performance Indicator(KPI) records. In this paper, an innovative and structured framework for ESP surface equipment PMP will be illustrated in details. Additionally, a prototype that contains the main formulas and tools in the program, which were derived from huge historical records and data analytics, will be shown. The paper will explain why and how the PMP can help any operator company or service provider to excel in maintaining healthy ESP systems while meeting its production commitments.
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Ruiz Flores, Luis Ivan, and Francisco Cuauhtémoc Poujol Galván. "Reliability of Power Electric Systems in Pemex Refining: Experiences and Realities." In ASME 2014 Power Conference. American Society of Mechanical Engineers, 2014. http://dx.doi.org/10.1115/power2014-32210.

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Анотація:
In this paper, we present the experience of 10 years of collaboration between the Electric Research Institute and Pemex Refining to modernize the power electric systems of the National Refining System in Mexico, collaborating together to design an electrical energy system for distribution that can operate reliably at the increase in the quantity and quality of oil products with the integration of new processing plants. We present the extensive cooperation between the personnel involved and in contrast unexecuted planning to implement the solutions. Also, after a decade of collaboration, we present the different scenarios, factors and challenges in the medium and long term that will assure that the electrical systems are in healthier conditions to operate for the next years and will achieve the required reliability of the national refining system for gasoline demand, to result in an operational reliability conferring to a World Class utility practice.
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8

Marzinotto, M., and G. Mazzanti. "Some hints at the combined effects of load cycles and electrothermal stress on HVDC extruded cable reliability in the long term prequalification test." In 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2012). IEEE, 2012. http://dx.doi.org/10.1109/ceidp.2012.6378802.

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Fernandez, Charles, Shashi Bhushan Kumar, Wai Lok Woo, Rosemary Norman, and Arun Kr. Dev. "Real-Time Prediction of Reliability of Dynamic Positioning Sub-Systems for Computation of Dynamic Positioning Reliability Index (DP-RI) Using Long Short Term Memory (LSTM)." In ASME 2020 39th International Conference on Ocean, Offshore and Arctic Engineering. American Society of Mechanical Engineers, 2020. http://dx.doi.org/10.1115/omae2020-18844.

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Abstract In this study, a framework using Long Short Term Memory (LSTM) for prediction of reliability of Dynamic Positioning (DP) sub-systems for computation of Dynamic Positioning Reliability Index (DP-RI) has been proposed. The DP System is complex with significant levels of integration between many sub-systems such as the Reference System, DP Control System, Thruster / Propulsion System, Power System, Electrical System and the Environment System to perform diverse control functions. The proposed framework includes a mathematical computation approach to compute reliability of DP sub-systems and a data driven approach to predict the reliability at a sub-system level for evaluation of model performance and accuracy. The framework results demonstrate excellent performance under a wide range of data availability and guaranteed lower computational burden for real-time non-linear optimization. There are three main components of the proposed architecture for the mathematical formulation of the DP sub-systems based on individual sensor arrangements within the sub-system, computation of reliability of sub-systems and optimized LSTM deep learning algorithm for prediction of its reliability. Firstly, the mathematical formulation for the reliability of sub-systems is determined based on the series/parallel arrangement of the sensors of each individual equipment item within the sub-systems. Secondly, the computation of the reliability of sub-systems is achieved through an integrated approach during complex operation of the vessel. Thirdly, the novel optimized LSTM network is constructed to predict the reliability of the subsystems while minimizing integral errors in the algorithm. In this paper, numerical simulations are set-up using a state-of-the-art advisory decision-making tool with mock-up and real-world data to give insights into the model performance and validate it against the existing risk assessment methodologies. Furthermore, we have analyzed the efficiency and stability of the proposed model against various levels of data availability. In conclusion the prediction accuracy of the proposed model is scalable and higher when compared with other model results.
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Spinner, Stefan, Michael Doelle, Patrick Ruther, Oliver Paul, Ilia Polian, and Bernd Becker. "A System for Electromechanical Reliability Testing of MEMS Devices." In ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0147.

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Abstract This paper reports on a setup and a method that enables automated analysis of mechanical stress impact on microelectromechanical systems (MEMS). In this setup both electrical and optical inspection are available. Reliability testing is possible on a single chip as well as on the wafer level. Mechanical stress is applied to the tested structure with programmable static forces up to 3.6 N and dynamic loads at frequencies up to 20 Hz. The applications of the presented system include the postmanufacturing test, characterization and stress screens as well as reliability studies. We report preliminary results of long-term reliability testing obtained for a CMOS-based stress sensor.
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