Статті в журналах з теми "Length metrology"
Оформте джерело за APA, MLA, Chicago, Harvard та іншими стилями
Ознайомтеся з топ-50 статей у журналах для дослідження на тему "Length metrology".
Біля кожної праці в переліку літератури доступна кнопка «Додати до бібліографії». Скористайтеся нею – і ми автоматично оформимо бібліографічне посилання на обрану працю в потрібному вам стилі цитування: APA, MLA, «Гарвард», «Чикаго», «Ванкувер» тощо.
Також ви можете завантажити повний текст наукової публікації у форматі «.pdf» та прочитати онлайн анотацію до роботи, якщо відповідні параметри наявні в метаданих.
Переглядайте статті в журналах для різних дисциплін та оформлюйте правильно вашу бібліографію.
Lee, Dong-Yeon, Dong-Min Kim, and Dae-Gab Gweon. "Atomic Force Microscope for Standard Length Metrology." Transactions of the Korean Society of Mechanical Engineers A 30, no. 12 (December 1, 2006): 1611–17. http://dx.doi.org/10.3795/ksme-a.2006.30.12.1611.
Повний текст джерелаStone, Jack A. "Uncalibrated Helium-Neon Lasers in Length Metrology." NCSLI Measure 4, no. 3 (September 2009): 52–58. http://dx.doi.org/10.1080/19315775.2009.11721483.
Повний текст джерелаGarcía-Asenjo, Luis, Sergio Baselga, Chris Atkins, and Pascual Garrigues. "Development of a Submillimetric GNSS-Based Distance Meter for Length Metrology." Sensors 21, no. 4 (February 6, 2021): 1145. http://dx.doi.org/10.3390/s21041145.
Повний текст джерелаBuchta, Zdeněk, Martin Šarbort, Martin Čížek, Václav Hucl, Šimon Řeřucha, Tomáš Pikálek, Štěpánka Dvořáčková, et al. "System for automatic gauge block length measurement optimized for secondary length metrology." Precision Engineering 49 (July 2017): 322–31. http://dx.doi.org/10.1016/j.precisioneng.2017.03.002.
Повний текст джерелаWieczorowski, Michał, Paweł Pawlus, and Bartosz Gapiński. "Perspectives of modern metrology." Mechanik 92, no. 12 (December 9, 2019): 767–73. http://dx.doi.org/10.17814/mechanik.2019.12.106.
Повний текст джерелаTANAKA, Shinichi. "Non-Contact 3D Metrology by Multi Wave-Length Interferometer." Journal of the Japan Society for Precision Engineering 85, no. 8 (August 5, 2019): 695–98. http://dx.doi.org/10.2493/jjspe.85.695.
Повний текст джерелаBlumröder, Ulrike, Ronald Füßl, Thomas Fröhlich, Eberhard Manske, and Rostyslav Mastylo. "FREQUENCY COMB-COUPLED METROLOGY LASERS FOR NANOPOSITIONING AND NANO MEASURING MACHINES." Measuring Equipment and Metrology 82, no. 4 (2021): 36–42. http://dx.doi.org/10.23939/istcmtm2021.04.036.
Повний текст джерелаJing, Ren, and Xin Chang. "A determinate method of metrology attribute benchmark of commercial banks’ management efficiency." PLOS ONE 17, no. 8 (August 4, 2022): e0272286. http://dx.doi.org/10.1371/journal.pone.0272286.
Повний текст джерелаMateo, Ana Baselga, and Zeb W. Barber. "Precision and accuracy testing of FMCW ladar-based length metrology." Applied Optics 54, no. 19 (June 26, 2015): 6019. http://dx.doi.org/10.1364/ao.54.006019.
Повний текст джерелаRöske, Dirk. "Some problems concerning the lever arm length in torque metrology." Measurement 20, no. 1 (January 1997): 23–32. http://dx.doi.org/10.1016/s0263-2241(97)00006-7.
Повний текст джерелаWieczorowski, Michał. "Digitalization of surfaces in micro, meso and macro applications." Mechanik 91, no. 11 (November 12, 2018): 944–49. http://dx.doi.org/10.17814/mechanik.2018.11.166.
Повний текст джерелаChiffre, L. De, D. González-Madruga, G. Dalla Costa, M. R. Sonne, A. Mohammadi, J. H. Hattel, H. N. Hansen, et al. "Accurate measurements in a production environment using dynamic length metrology (DLM)." Procedia CIRP 75 (2018): 343–48. http://dx.doi.org/10.1016/j.procir.2018.04.074.
Повний текст джерелаNiwa, Y., K. Arai, A. Ueda, M. Sakagami, N. Gouda, Y. Kobayashi, Y. Yamada, and T. Yano. "Laser interferometric high-precision geometry (angle and length) monitor for JASMINE." Proceedings of the International Astronomical Union 3, S248 (October 2007): 280–81. http://dx.doi.org/10.1017/s1743921308019315.
Повний текст джерелаCenteno González, Luz María, Eduardo Castillo Castañeda, Luis Omar Becerra Santiago, and Alberto Rochín García. "A magnetic suspension system for measuring liquid density." Ingeniería e Investigación 33, no. 1 (January 1, 2013): 46–51. http://dx.doi.org/10.15446/ing.investig.v33n1.37666.
Повний текст джерелаSchamp, C. T. "High-Resolution Metrology in the TEM." Microscopy Today 20, no. 3 (May 2012): 46–49. http://dx.doi.org/10.1017/s1551929512000363.
Повний текст джерелаPostek, Michael T., Marylyn Bennett, Nestor J. Zaluzec, Thomas Wheatley, and Samuel Jones. "National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed." Microscopy and Microanalysis 4, S2 (July 1998): 22–23. http://dx.doi.org/10.1017/s1431927600020237.
Повний текст джерелаZhao, Yan, Xing Hua Qu, Yong Tian, Rui Jun Lu, and Hong Guang Liu. "Investigation on the Metrology of Conical Thread Gauge." Key Engineering Materials 693 (May 2016): 150–54. http://dx.doi.org/10.4028/www.scientific.net/kem.693.150.
Повний текст джерелаKupcevičová, Jelena. "Русская и украинская историческая метрология и её отражение в паремиях". Studia Slavica XXVI, № 1 (2022): 55–66. http://dx.doi.org/10.15452/studiaslavica.2022.26.0004.
Повний текст джерелаRickgauer, John Peter, Derek N. Fuller, and Douglas E. Smith. "DNA as a Metrology Standard for Length and Force Measurements with Optical Tweezers." Biophysical Journal 91, no. 11 (December 2006): 4253–57. http://dx.doi.org/10.1529/biophysj.106.089524.
Повний текст джерелаMINOSHIMA, Kaoru, Thomas R. SCHIBLI, Hajime INABA, Youichi BITOU, Feng-Lei HONG, Atsushi ONAE, and Hirokazu MATSUMOTO. "Precision Length Metrology Based on the Time and Frequency Standards Using Optical Combs." Review of Laser Engineering 35, no. 10 (2007): 642–48. http://dx.doi.org/10.2184/lsj.35.642.
Повний текст джерелаBarwood, G. P., P. Gill, and W. R. C. Rowley. "High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes." Measurement Science and Technology 9, no. 7 (July 1, 1998): 1036–41. http://dx.doi.org/10.1088/0957-0233/9/7/005.
Повний текст джерелаWilson, Marshall, Alexandre Savtchouk, Igor Tasarov, John D'Amico, Piotr Edelman, Nick Kochey, and Jacek Lagowski. "Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers." ECS Transactions 16, no. 6 (December 18, 2019): 285–301. http://dx.doi.org/10.1149/1.2980312.
Повний текст джерелаFranz, Christoph, Peter Abels, Raphael Rolser, and Michael Becker. "Energy Input per Unit Length – High Accuracy Kinematic Metrology in Laser Material Processing." Physics Procedia 12 (2011): 411–20. http://dx.doi.org/10.1016/j.phpro.2011.03.151.
Повний текст джерелаNaeim, Ihab H. "In-Depth Practical Study of Length Metrology With Laser Interferometers Applying Different Techniques." International Journal of Applied Physics 7, no. 2 (August 25, 2020): 36–42. http://dx.doi.org/10.14445/23500301/ijap-v7i2p106.
Повний текст джерелаBelfi, J., N. Beverini, D. Cuccato, A. Di Virgilio, E. Maccioni, A. Ortolan, and R. Santagata. "Interferometric length metrology for the dimensional control of ultra-stable ring laser gyroscopes." Classical and Quantum Gravity 31, no. 22 (October 28, 2014): 225003. http://dx.doi.org/10.1088/0264-9381/31/22/225003.
Повний текст джерелаTaylor, S., J. Mardinly, M. A. O'Keefe, and R. Gronsky. "HRTEM Image Simulations for Gate Oxide Metrology." Microscopy and Microanalysis 6, S2 (August 2000): 1080–81. http://dx.doi.org/10.1017/s1431927600037892.
Повний текст джерелаZakharenko, Y. G., N. A. Kononova, V. L. Fedorin, Z. V. Fomkina, and K. V. Chekirda. "Prospects of development of the reference base of the Russian Federation in the field of length measurements." Izmeritel`naya Tekhnika, no. 2 (2020): 3–5. http://dx.doi.org/10.32446/0368-1025it.2020-2-3-5.
Повний текст джерелаMedvedev, P. A., and M. V. Novgorodskaya. "Mathematical models’ analysis of rectangular coordinates’calculation in the expanded zones of Gauss Kruger conformal projection." Geodesy and Cartography 921, no. 3 (April 20, 2017): 14–19. http://dx.doi.org/10.22389/0016-7126-2017-921-3-14-19.
Повний текст джерелаWolańczyk, Franciszek. "Gallium as a Metrology Substance for Measuring Thermal Conductivity of Metals." Applied Mechanics and Materials 831 (April 2016): 144–50. http://dx.doi.org/10.4028/www.scientific.net/amm.831.144.
Повний текст джерелаChen, Jin Long, He Min Wang, Yu Wen Qin, and Xin Hua Ji. "An Experimental Study of the Displacement and Strain Fields across Interphases in Thermoplastic Composites." Key Engineering Materials 306-308 (March 2006): 959–64. http://dx.doi.org/10.4028/www.scientific.net/kem.306-308.959.
Повний текст джерелаBlumröder, Ulrike, Paul Köchert, Thomas Fröhlich, Thomas Kissinger, Ingo Ortlepp, Jens Flügge, Harald Bosse та Eberhard Manske. "A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm". Sensors 23, № 3 (3 лютого 2023): 1734. http://dx.doi.org/10.3390/s23031734.
Повний текст джерелаKatić, Marko, Nenad Ferdelji, and Danijel Šestan. "Investigation of Temperature-Induced Errors in XCT Metrology." International Journal of Automation Technology 14, no. 3 (May 5, 2020): 484–90. http://dx.doi.org/10.20965/ijat.2020.p0484.
Повний текст джерелаDobosz, Marek. "Laser diode distance measuring interferometer - metrological properties." Metrology and Measurement Systems 19, no. 3 (October 1, 2012): 553–64. http://dx.doi.org/10.2478/v10178-012-0048-1.
Повний текст джерелаHolá, Miroslava, Jan Hrabina, Martin Sarbort, Jindrich Oulehla, Ondrej Cíp, and Josef Lazar. "Contribution of the Refractive Index Fluctuations to the Length Noise in Displacement Interferometry." Measurement Science Review 15, no. 5 (October 1, 2015): 263–67. http://dx.doi.org/10.1515/msr-2015-0036.
Повний текст джерелаSanchidrián-Vaca, Carlos, and Carlos Sabín. "Parameter Estimation of Wormholes beyond the Heisenberg Limit." Universe 4, no. 11 (November 6, 2018): 115. http://dx.doi.org/10.3390/universe4110115.
Повний текст джерелаMiller, Tatiana, Krzysztof Gajda, and Aneta Łętocha. "Reliability of measurements performed in the IZTW accredited laboratory in the field of surface topography and product geometry." Mechanik 91, no. 4 (April 9, 2018): 307–10. http://dx.doi.org/10.17814/mechanik.2018.4.47.
Повний текст джерелаThywissen, J. H. "Using neutral atoms and standing light waves to form a calibration artifact for length metrology." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 16, no. 6 (November 1998): 3841. http://dx.doi.org/10.1116/1.590420.
Повний текст джерелаZhang, Haijun, Dongxian Zhang, and Xiaofeng Lin. "Dual imaging-unit atomic force microscope for nanometer order length metrology based on reference scales." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 20, no. 5 (2002): 1935. http://dx.doi.org/10.1116/1.1502700.
Повний текст джерелаZhang, Dongxian, Haijun Zhang, and Xiaofeng Lin. "Wide-range length metrology by dual-imaging-unit atomic force microscope based on porous alumina." Microscopy Research and Technique 64, no. 3 (2004): 223–27. http://dx.doi.org/10.1002/jemt.20060.
Повний текст джерелаNeyezhmakov, Pavel, Alexander Prokopov, Tatiana Panasenko, and Andrii Shloma. "Analysis of the temperature component of the combined standard uncertainty of the refractive index according to the test data of the control system for meteorological parameters developed for the Lyptsi geodetic polygon." Ukrainian Metrological Journal, no. 4 (December 30, 2021): 34–38. http://dx.doi.org/10.24027/2306-7039.4.2021.250411.
Повний текст джерелаKovalchuk, V. V., and M. V. Smorzh. "Metrology of the Real Nanoclusters: Structure and Optical Characteristics." Metrology and instruments, no. 1 (March 2, 2020): 54–58. http://dx.doi.org/10.33955/2307-2180(1)2020.54-58.
Повний текст джерелаGastaldi, B., L. Vieira, F. Huerta Yshikawa, B. Faust, and B. Eves. "Calibration of angle standards." Metrologia 60, no. 1A (January 1, 2023): 04002. http://dx.doi.org/10.1088/0026-1394/60/1a/04002.
Повний текст джерелаPratt, Jon R., Douglas T. Smith, David B. Newell, John A. Kramar, and Eric Whitenton. "Progress toward Système International d'Unités traceable force metrology for nanomechanics." Journal of Materials Research 19, no. 1 (January 2004): 366–79. http://dx.doi.org/10.1557/jmr.2004.19.1.366.
Повний текст джерелаKeck, Christian, and René Schödel. "Reference Measurement of Roundwood by Fringe Projection." Forest Products Journal 71, no. 4 (October 1, 2021): 352–61. http://dx.doi.org/10.13073/fpj-d-21-00024.
Повний текст джерелаQuagliotti, Danilo. "Modeling the systematic behavior at the micro and nano length scales." Surface Topography: Metrology and Properties 10, no. 1 (January 25, 2022): 015011. http://dx.doi.org/10.1088/2051-672x/ac4ba7.
Повний текст джерелаFang, Wenqiang, Joyce Mok, and Haneesh Kesari. "Effects of geometric nonlinearity in an adhered microbeam for measuring the work of adhesion." Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences 474, no. 2211 (March 2018): 20170594. http://dx.doi.org/10.1098/rspa.2017.0594.
Повний текст джерелаSiewert, F., J. Buchheim, T. Zeschke, M. Störmer, G. Falkenberg, and R. Sankari. "On the characterization of ultra-precise X-ray optical components: advances and challenges inex situmetrology." Journal of Synchrotron Radiation 21, no. 5 (August 27, 2014): 968–75. http://dx.doi.org/10.1107/s1600577514016221.
Повний текст джерелаPakkratoke, Montree, Nitiwat Sasom, Koichiro Hattori, and Nae Hyung Tak. "APMP.M.H-S5 final report of the supplementary comparison of Brinell hardness." Metrologia 59, no. 1A (January 1, 2022): 07019. http://dx.doi.org/10.1088/0026-1394/59/1a/07019.
Повний текст джерелаPakkratoke, Montree, Nitiwat Sasom, Koichiro Hattori, and Nae Hyung Tak. "APMP.M.H-S6 final report of the supplementary comparison of Vickers hardness." Metrologia 59, no. 1A (January 1, 2022): 07020. http://dx.doi.org/10.1088/0026-1394/59/1a/07020.
Повний текст джерелаLipus, L. C., B. Acko, and J. Tompa. "Experimental determination of influences on a gauge block’s stack length." Advances in Production Engineering & Management 17, no. 3 (September 30, 2022): 339–49. http://dx.doi.org/10.14743/apem2022.3.440.
Повний текст джерела