Книги з теми "Integrated measurements"
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Oettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Знайти повний текст джерелаOettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Знайти повний текст джерелаWiesław, Marciniak, and Przewłocki Henryk M, eds. Diagnostic measurements in LSI/VLSI integrated circuits production. Singapore: World Scientific, 1991.
Знайти повний текст джерелаMagrab, Edward B. Computer integrated experimentation. Berlin: Springer-Verlag, 1991.
Знайти повний текст джерела1954-, Rubio Antonio, ed. Thermal testing of integrated circuits. Boston: Kluwer Academic Publishers, 2002.
Знайти повний текст джерелаEisenstadt, William Richard. High frequency measurements of integrated circuit devices and interconnect. Stanford, CA: StanfordUniversity, 1986.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Swinging. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаAltet, Josep. Thermal Testing of Integrated Circuits. Boston, MA: Springer US, 2002.
Знайти повний текст джерелаMagrab, Edward B. Computer Integrated Experimentation. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991.
Знайти повний текст джерелаHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and SPIE Symposium on Microlithography (1994 : San Jose, Calif.), eds. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.
Знайти повний текст джерелаHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and SPIE Symposium on Microlithography (1994 : San Jose, Calif.), eds. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Paper clips. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Roller coasters. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаUniversity of Wisconsin--Madison. Water Resources Center. and Geological Survey (U.S.). Water Resources Division. Wisconsin District., eds. An integrated water-monitoring network for Wisconsin. Madison, WI: Wisconsin Water Resources Center, University of Wisconsin-Madison, 1998.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Clean water. San Antonio, Tex: Psychological Corp., 1992.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Spinning tops. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Send it flying. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаCorporation, Psychological, ed. Integrated assessment system.: Animals of long ago. San Antonio, Tex: Psychological Corporation, 1992.
Знайти повний текст джерелаHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., and Semiconductor Equipment and Materials International., eds. Integrated circuit metrology, inspection, and process control IX: 20-22 February 1995, Santa Clara, California. Bellingham, Wash., USA: SPIE, 1995.
Знайти повний текст джерелаN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаN, Varner Ruth, Potzick James E, and National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаHarald, Bosse, Bodermann Bernd, Silver Richard M, Wissenschaftliche Gesellschaft Lasertechnik, SPIE Europe, European Optical Society, and Society of Photo-optical Instrumentation Engineers., eds. Modeling aspects in optical metrology: 18-19 June 2007, Munich, Germany. Bellingham, Wash: SPIE, 2007.
Знайти повний текст джерелаEurope, SPIE, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik, and SPIE (Society), eds. Modeling aspects in optical metrology II: 15-16 June 2009, Munich, Germany. Bellingham, Wash: SPIE, 2009.
Знайти повний текст джерелаIEEE International Symposium on Virtual and Intelligent Measurement Systems (7th 2002 Girdwood, Anchorage, Alaska). VIMS 2002: 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems : Distributed intelligent sensing for advanced integrated virtual environments : Alyeska resort, Girdwood, Alaska, USA, 19-20 May 2002. Piscataway, N.J: IEEE, 2002.
Знайти повний текст джерелаDickey, Donyall D. The integrated approach to student achievement: A results-driven model for improving performance, leadership, and the culture of instruction at your school. Highlands, TX: aha Process, Inc., 2010.
Знайти повний текст джерелаVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаXuping, Zhang, Zhongguo yi qi yi biao xue hui, Zhongguo guang xue xue hui, SPIE (Society), and Zhongguo yi qi yi biao xue hui. Optoelectronic-Mechanic Technology and System Integration Chapter, eds. 2009 International Conference on Optical Instruments and Technology: Optoelectronic devices and integration : 19-21 October 2009, Shanghai, China. Bellingham, Wash: SPIE, 2009.
Знайти повний текст джерелаVezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Знайти повний текст джерелаE, Martner Brooks, and Wave Propagation Laboratory, eds. A Field evaluation of remote sensor measurements of wind, temperature, and moisture for ARM integrated sounding system research. Boulder, Colo: United States Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, Wave Propagation Laboratory, 1991.
Знайти повний текст джерелаGiannetti, Rosario. Turning up the heat!: A unit of study investigating heat energy : an integrated unit for grade 7. [Ontario: s.n.], 2001.
Знайти повний текст джерелаVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Знайти повний текст джерелаVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Знайти повний текст джерелаVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Знайти повний текст джерелаVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Знайти повний текст джерелаSeaward, P. Gareth R. Integrated maternal serum screening and nuchal skin fold thickness measurements in the second trimester prenatal diagnosis of fetal down syndrome. Ottawa: National Library of Canada, 2003.
Знайти повний текст джерелаPeters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Знайти повний текст джерелаPeters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Знайти повний текст джерелаS, Murdoch Peter, Dalton Frank N, University of Virginia, and Geological Survey (U.S.), eds. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Знайти повний текст джерелаRincón-Mora, Gabriel A. Voltage references: From diodes to precision high-order bandgap circuits. Piscataway, NJ: IEEE Press, 2002.
Знайти повний текст джерелаUnited States. National Aeronautics and Space Administration, ed. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.
Знайти повний текст джерелаHouse, Frederick Bishop. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.
Знайти повний текст джерелаS, Heyman Joseph, and Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center), eds. Electronics reliability and measurement technology: Nondestructive evaluation. Park Ridge, N.J., U.S.A: Noyes Data Corp., 1988.
Знайти повний текст джерелаKourtev, Ivan S. Timing Optimization Through Clock Skew Scheduling. Boston, MA: Springer US, 2000.
Знайти повний текст джерелаDartman, Torbjo rn. Procams integrated ego-meter system: The computer system : computerised garment distribution system for taking individual measurements of customers in shops connected on-line to garment manufacturing factories. [Go teborg?]: Chalmers Teknicka Ho gakda, 1987.
Знайти повний текст джерелаIEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.). 1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California. Piscataway, NJ: IEEE Service Center, 1997.
Знайти повний текст джерелаPiziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.
Знайти повний текст джерелаPiziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.
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