Дисертації: "Integrated circuits Very large scale integration"

1

Hong, Won-kook. "Single layer routing : mapping topological to geometric solutions." Thesis, McGill University, 1986. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=66030.

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2

Matsumori, Barry Alan. "QUALIFICATION RESEARCH FOR RELIABLE, CUSTOM LSI/VLSI ELECTRONICS." Thesis, The University of Arizona, 1985. http://hdl.handle.net/10150/275313.

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3

Jafar, Mutaz 1960. "THERMAL MODELING/SIMULATION OF LEVEL 1 AND LEVEL 2 VLSI PACKAGING." Thesis, The University of Arizona, 1986. http://hdl.handle.net/10150/276959.

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4

Voranantakul, Suwan 1962. "CONDUCTIVE AND INDUCTIVE CROSSTALK COUPLING IN VLSI PACKAGES." Thesis, The University of Arizona, 1986. http://hdl.handle.net/10150/277037.

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5

Dagenais, Michel R. "Timing analysis for MOSFETS, an integrated approach." Thesis, McGill University, 1987. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=75459.

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Анотація:

Timing and electrical verification is an essential part of the design of VLSI digital MOS circuits. It consists of determining the maximum operating frequency of a circuit, and verifying that the circuit will always produce the expected logical behavior at or under this frequency. This complex task requires considerable computer and human resources.
The classical simulation approach cannot be used to insure the timing and electrical correctness of the large circuits that are now being designed. The huge number of possible states in large circuits renders this method impractical. Worst-case analysis tools alleviate the problem by restricting the analysis to a limited set of states which correspond to the worst-case operating conditions. However, existing worst-case analysis tools for MOS circuits present several problems. Their accuracy is inherently limited since they use a switch-level model. Also, these procedures have a high computational complexity because they resort to path enumeration to find the latest path in each transistor group. Finally, they lack the ability to analyze circuits with arbitrarily complex clocking schemes.
In this text, a new procedure for circuit-level timing analysis is presented. Because it works at electronic circuit level, the procedure can detect electrical errors, and attains an accuracy that is impossible to attain by other means. Efficient algorithms, based on graph theory, have been developed to partition the circuits in a novel way, and to recognize series and parallel combinations. This enables the efficient computation of worst-case, earliest and latest, waveforms in the circuit, using specially designed algorithms. The new procedure extracts automatically the timing requirements from these waveforms and can compute the clocking parameters, including the maximum clock frequency, for arbitrarily complex clocking schemes.
A computer program was written to demonstrate the effectiveness of the new procedure and algorithms developed. It has been used to determine the clocking parameters of circuits using different clocking schemes. The accuracy obtained on these parameters is around 5 to 10% when compared with circuit-level simulations. The analysis time grows linearly with the circuit size and is approximately 0.5s per transistor, on a microVAX II computer. This makes the program suitable for VLSI circuits.

6

Liu, Yansong. "Passivity checking and enforcement in VLSI model reduction exercise." Click to view the E-thesis via HKUTO, 2008. http://sunzi.lib.hku.hk/hkuto/record/B41290690.

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7

Hong, Seong-Kwan. "Performance driven analog layout compiler." Diss., Georgia Institute of Technology, 1994. http://hdl.handle.net/1853/15037.

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8

Davis, Jeffrey Alan. "A hierarchy of interconnect limits and opportunities for gigascale integration (GSI)." Diss., Georgia Institute of Technology, 1999. http://hdl.handle.net/1853/15803.

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9

Anbalagan, Pranav. "Limitations and opportunities for wire length prediction in gigascale integration." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/22670.

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Анотація:

Thesis (Ph. D.)--Electrical and Computer Engineering, Georgia Institute of Technology, 2007.
Committee Chair: Dr. Jeff Davis; Committee Member: Dr. James D. Meindl; Committee Member: Dr. Paul Kohl; Committee Member: Dr. Scott Wills; Committee Member: Dr. Sung Kyu Lim.

10

Ivanov, André. "Dynamic testibility measures and their use in ATPG." Thesis, McGill University, 1985. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63324.

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11

Zhao, Wenhui, and 趙文慧. "Efficient circuit simulation via adaptive moment matching and matrix exponential techniques." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2013. http://hdl.handle.net/10722/197488.

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This dissertation presents two efficient circuit simulation techniques for very large scale integrated (VLSI) circuits. Model order reduction (MOR) plays a significant role in VLSI circuit simulation as nowadays the system model may contain millions of equations or variables. MOR is needed to reduce the order of the original system to allow the simulation to be performed with an acceptable amount of time, reasonable storage and reliable accuracy. Multi-point moment matching is one of the state-of-the-art methods for MOR. However, the moment order and expansion points are usually selected in a heuristic way, which cannot guarantee the global accuracy of the reduced-order model (ROM). Therefore, it is important to utilize an adaptive algorithm in exercising multi-point moment matching. In this regard, we propose a novel automatic adaptive multi-point moment matching algorithm for MOR of linear descriptor systems. The algorithm implements both adaptive frequency expansion point selection and automatic moment order control guided by a transfer function-based error metric. Without a priori information of the system response, the proposed algorithm leads to a much higher global accuracy compared with standard multipoint moment matching without adaptation. The moments are computed via a generalized Sylvester equation which is subsequently solved by a newly proposed generalized alternating direction implicit (GADI) method. Another technique for circuit simulation proposed in this thesis is the matrix exponential (MEXP) method. MEXP method has been demonstrated to be a competitive candidate for transient simulation of VLSI circuits. Nevertheless, the performance of MEXP based on ordinary Krylov subspace is unsatisfactory for stiff circuits, because the underlying Arnoldi process tends to oversample the high magnitude part of the system spectrum while under-sampling the low magnitude part that is important to the final accuracy. In this thesis, we explore the use of extended Krylov subspace to generate more accurate and efficient approximation for MEXP.We also develop a formulation, called generalized extended Krylov subspace, that allows unequal positive and negative dimensions in the subspace for better performance, and propose an adaptive scheme based on the generalized extended Krylov subspace to select the ratio between the positive and negative dimensions.
published_or_final_version
Electrical and Electronic Engineering
Master
Master of Philosophy

12

Hum, Herbert Hing-Jing. "A linear unification processor /." Thesis, McGill University, 1987. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63790.

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13

Chu, Chung-kwan, and 朱頌君. "Computationally efficient passivity-preserving model order reduction algorithms in VLSI modeling." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2007. http://hub.hku.hk/bib/B38719551.

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14

Venkatesan, Raguraman. "Multilevel interconnect architectures for gigascale integration (GSI)." Diss., Georgia Institute of Technology, 2003. http://hdl.handle.net/1853/13370.

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15

Narayanan, Prakash. "Analytical modeling and simulation of bicmos for VLSI circuits." Thesis, Virginia Tech, 1990. http://hdl.handle.net/10919/42199.

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Interest in BiCMOS technology has been generated recently due to the potential advantages this technology offers over conventional CMOS which enjoys widespread use in today’s semiconductor industry. However, before BiCMOS can be readily adopted by the VLSI community, an understanding of the design issues and tradeoffs involved when utilizing it, must be achieved. The principal focus of this research is to move towards such an understanding through the means of analytical modeling and circuit simulation using PSPICE [1]. The device chosen for the modeling approach is the basic BiCMOS Inverting Buffer Driver. The model yields equations that characterize output rise and fall transients and quantify the delays incurred therein. At the end of the analysis, we have a composite set of delay equations that are a measure of the total gate delay and reflect the importance of individual device and circuit parameters in determining this delay. Further investigations conducted to determine the influence of device, circuit and process parameters on BiCMOS, indicate that this technology is far more resilient to variations in such parameters than CMOS. At the end of this research, we are able to make a definitive judgement about BiCMOS performance and its superiority over CMOS in the switching speed domain.
Master of Science

16

張永泰 and Wing-tai Cheung. "Geometric programming and signal flow graph assisted design of interconnect and analog circuits." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2007. http://hub.hku.hk/bib/B39558526.

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17

Wilson, Denise M. "Analog VLSI architecture for chemical sensing microsystems." Diss., Georgia Institute of Technology, 1995. http://hdl.handle.net/1853/13322.

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18

Peckel, Marcos David. "A MOS delay model for switch-level simulation /." Thesis, McGill University, 1985. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=65990.

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19

Panda, Uma R. "An efficient single-latch scan-design scheme/." Thesis, McGill University, 1985. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=63266.

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20

KRISHT, MUHAMMED HUSSEIN, and MUHAMMED HUSSEIN KRISHT. "LPCVD TUNGSTEN MULTILAYER METALLIZATION FOR VLSI SYSTEMS." Diss., The University of Arizona, 1985. http://hdl.handle.net/10150/187983.

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Анотація:

Advances in microlithography, dry etching, scaling of devices, ion-implantation, process control, and computer aid design brought the integrated circuit technology into the era of VLSI circuits. Those circuits are characterized by high packing density, improved performance, complex circuits, and large chip sizes. Interconnects and their spacing dominate the chip area of VLSI circuits and they degrade the circuit performance through the unacceptable high time delays. Multilayer metallization enables shorter interconnects, ease of design and yet higher packing density for VLSI circuits. It was shown in this dissertation that, tungsten films deposited in a cold-wall LPCVD reactor offer viable solution to the problems of VLSI multilayer interconnects. Experiments showed that LPCVD tungsten films have good uniformity, high purity, low resistivity, low stress-good adherence and are readily patterned into high resolution lines. Moreover, a multilayer interconnect system consisting of three layers of tungsten metallization followed by a fourth layer of aluminum metallization has been designed, fabricated and tested. The interlevel dielectric used to separate the metal layers was CVD phosphorus doped silicon dioxide. Low ohmic contacts were achieved for heavily doped silicon. Also, low resistance tungsten-tungsten intermetallic contacts were obtained. In addition to excellent step coverage, high electromigration resistance of interconnects was realized. Finally, CMOS devices and logic gates were successfully fabricated and tested using tungsten multilayer metallization schemes.

21

Karunaratne, Maddumage Don Gamini. "An intelligent function level backward state justification search for ATPG." Diss., The University of Arizona, 1989. http://hdl.handle.net/10150/184921.

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This dissertation describes an innovative approach to the state justification portion of the sequential circuit automatic test pattern generation (ATPG) process. Given the absence of a stored fault an ATPG controller invokes some combinational circuit test generation procedure, such as the D-algorithm, to identify a circuit state (goal state) and input vectors that will sensitize a selected fault. The state justification phase then finds a transfer sequence to the goal from the present state. A forward fault propogation search can be successfully guided through state space from the present state but the forward justification search is less efficient and the failure rate is high. The backward function level search invokes inverse RTL level primitives and exploits easy movement of data vectors in structured VLSI circuits. Examples illustrated are in AHPL. This search is equally applicable to an RTL level subset of VHDL. Combinational logic units are treated as functions and the circuit states are partitioned into control states and data states. The search proceeds backwards over the control state space starting from the goal state node and data states are transformed according to the control flow. Vectorized data paths in VLSI circuits and search guiding heuristics which favor convenient inverse functions keep the number of search nodes low. Partial covers, conceptually similar to singular covers in D-algorithm, model the inverse functions of combinational logic units. The search successfully terminates when a child state node logically matches the present state and the present state values can satisfy all the constraints encountered along the search path.

22

Howells, Michael C. "A cluster-proof approach to yield enhancement of large area binary tree architectures /." Thesis, McGill University, 1987. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=66194.

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23

Geller, Ronnie Dee. "A VLSI architecture for a neurocomputer using higher-order predicates." Full text open access at:, 1987. http://content.ohsu.edu/u?/etd,137.

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24

Al-Mahmood, Saiyid Jami Islah Ahmad. "A distributed design rule checker for VLSI layouts." Thesis, This resource online, 1990. http://scholar.lib.vt.edu/theses/available/etd-11012008-063423/.

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25

Tyagi, Dhawal. "TENOR : an ATPG for transition faults in combinational circuits /." Thesis, This resource online, 1994. http://scholar.lib.vt.edu/theses/available/etd-06302009-040525/.

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26

Kelley, Brian T. "VLSI computing architectures for high speed seismc migration." Diss., Georgia Institute of Technology, 1992. http://hdl.handle.net/1853/13919.

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27

Bragg, Julian Alexander. "A biomorphic analog VLSI implementation of a mammalian motor unit." Diss., Georgia Institute of Technology, 2002. http://hdl.handle.net/1853/20693.

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28

Tan, Chong Guan. "Another approach to PLA folding." Thesis, McGill University, 1985. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=66054.

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29

高雲龍 and Wan-lung Ko. "A new optimization model for VLSI placement." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1998. http://hub.hku.hk/bib/B29812938.

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30

Rasafar, Hamid 1954. "THE HIGH FREQUENCY AND TEMPERATURE DEPENDENCE OF DIELECTRIC PROPERTIES OF PRINTED CIRCUIT BOARD MATERIALS." Thesis, The University of Arizona, 1987. http://hdl.handle.net/10150/276509.

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Анотація:

New VLSI and VHSIC devices require increased performance from electronic packages. The major challenge that must be met in materials/process development for high complexity and high speed integrated circuits is the processing of even larger amounts of signals with low propagation delay. Hence, materials with low dielectric constant and low dissipation factor are being sought. In this investigation the dielectric properties of the most commonly used composite materials for printed circuit boards, Teflon-glass and Epoxy-glass, were measured in the frequency and temperature intervals of 100 HZ-1 GHZ and 25-260°C, respectively. From the measured results, it is concluded that Teflon-glass is more suitable for the board level packaging of high performance circuits due to its lower dielectric constant and low dissipation factor.

31

Chen, Ing-yi 1962. "Efficient reconfiguration by degradation in defect-tolerant VLSI arrays." Thesis, The University of Arizona, 1989. http://hdl.handle.net/10150/277195.

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This thesis addresses the problem of constructing a flawless subarray from a defective VLSI/WSI array consists of identical cells such as memory cells or processors. In contrast to the redundancy approach in which some cells are dedicated as spares, all the cells in the degradation approach are treated in a uniform way. Each cell can be either fault-free or defective and a subarray which contains no faulty cell is derived under constraints of switching and routing mechanisms. Although extensive literatures exist concerning spare allocation and reconfiguration in arrays with redundancy, little research has been published on optimal reconfiguration in a degradable array. A systematic method based on graph theoretic models is developed to deal with the problem. The complexities of reconfiguration are analyzed for schemes using different switching mechanisms. Efficient heuristic algorithms are presented to determine a target subarray from the defective host array.

32

Holland, Kenneth Chris. "Probability of latching single event upset errors in VLSI circuits." Thesis, Virginia Tech, 1991. http://hdl.handle.net/10919/41980.

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The ability of radiation to cause transient faults in space borne as well as ground based computers is well known. with the density of VLSI circuits increasing every year, the probability of an upset by radiation is becoming more likely. However, research in this area has matured over the last decade, and the mechanisms which cause such faults are better understood. This understanding enables us to propose ideas to eliminate or lessen the effects of radiation on VLSI circuits.

Most of the research to date has concentrated on the effect of transient faults on flip-flops rather than combinational logic. This is due to several reasons. First, transient faults, also known as Single Event Upsets (SEU), were first observed in memory circuits located on board satellites. Second, an SEU can leave a lasting effect on a circuit if it occurs in a flip-flop, and third, SEUs can cause the output of a flip-flop to change state more easily if it occurs directly in the flip-flop rather than in the combinational logic.

In combinational logic, the node struck by the radiation is completely disjoint from the flip-flops output node. This in effect causes the SEU to satisfy more criteria in order to change the flip-flops output state. The criteria that the SEU must satisfy tend to be complex, and this complexity has caused many researchers to believe that SEUs that occur in combinational logic cause negligible errors in the state of flip-flops.

Thus, in this thesis, the criteria for latching a SEU are discussed, and original methods are presented that can be used to determine the probability of an SEU occurring at any node in a circuit will cause a change in the output state of a flip-flop. The methods are then incorporated into a program, named SUPER II, that is able to evaluate the circuit to determine the nodes with the highest probability of having a SEU error latched. The results from the program show that SEUs that occur in combinational logic can have a significant probability of becoming latched.
Master of Science

33

Lee, Hoi-Ming Bonny 1961. "The evaluation of the PODEM algorithm as a mechanism to generate goal states for a sequential circuit test search." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276730.

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In a VLSI design environment, a more efficient test generation algorithm is definitely needed. This thesis evaluates a test generation algorithm, PODEM, as mechanism to generate the goal states in a sequential circuit test search system, SCIRTSS. First, a hardware description language, AHPL, is used to describe the behavior of a sequential circuit. Next, SCIRTSS is used to generate the test vectors. Several circuits are evaluated and experimental results are compared with data from a previous version of SCIRTSS which was implemented with the D-Algorithm. Depending on the number of reconvergent fanouts in a circuit, it is found that PODEM is 1 to 23 times faster than the D-Algorithm.

34

Tang, Maolin. "Intelligent approaches to VLSI routing." Thesis, Edith Cowan University, Research Online, Perth, Western Australia, 2000. https://ro.ecu.edu.au/theses/1375.

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Анотація:

Very Large Scale Integrated-circuit (VLSI) routing involves many large-size and complex problems and most of them have been shown to be NP-hard or NP-complete. As a result, conventional approaches, which have been successfully used to handle relatively small-size routing problems, are not suitable to be used in tackling large-size routing problems because they lead to 'combinatorial explosion' in search space. Hence, there is a need for exploring more efficient routing approaches to be incorporated into today's VLSI routing system. This thesis strives to use intelligent approaches, including symbolic intelligence and computational intelligence, to solve three VLSI routing problems: Three-Dimensional (3-D) Shortest Path Connection, Switchbox Routing and Constrained Via Minimization. The 3-D shortest path connection is a fundamental problem in VLSI routing. It aims to connect two terminals of a net that are distributed in a 3-D routing space subject to technological constraints and performance requirements. Aiming at increasing computation speed and decreasing storage space requirements, we present a new A* algorithm for the 3-D shortest path connection problem in this thesis. This new A*algorithm uses an economical representation and adopts a novel back- trace technique. It is shown that this algorithm can guarantee to find a path if one exists and the path found is the shortest one. In addition, its computation speed is fast, especially when routed nets are spare. The computational complexities of this A* algorithm at the best case and the worst case are O(Ɩ) and 0(Ɩ3), respectively, where Ɩ is the shortest path length between the two terminals. Most importantly, this A' algorithm is superior to other shortest path connection algorithms as it is economical in terms of storage space requirement, i.e., 1 bit/grid. The switchbox routing problem aims to connect terminals at regular intervals on the four sides of a rectangle routing region. From a computational point of view, the problem is NP-hard. Furthermore, it is extremely complicated and as the consequence no existing algorithm can guarantee to find a solution even if one exists no matter how high the complexity of the algorithm is. Previous approaches to the switch box routing problem can be divided into algorithmic approaches and knowledge-based approaches. The algorithmic approaches are efficient in computational time, but they are unsucessful at achieving high routing completion rate, especially for some dense and complicated switchbox routing problems. On the other hand, the knowledge-based approaches can achieve high routing completion rate, but they are not efficient in computation speed. In this thesis we present a hybrid approach to the switchbox routing problem. This hybrid approach is based on a new knowledge-based routing technique, namely synchronized routing, and combines some efficient algorithmic routing techniques. Experimental results show it can achieve the high routing completion rate of the knowledge-based approaches and the high efficiency of the algorithmic approaches. The constrained via minimization is an important optimization problem in VLSI routing. Its objective is to minimize the number of vias introduced in VLSI routing. From computational perspective, the constrained via minimization is NP-complete. Although for a special case where the number of wire segments splits at a via candidate is not more than three, elegant theoretical results have been obtained. For a general case in which there exist more than three wire segment splits at a via candidate few approaches have been proposed, and those approaches are only suitable for tackling some particular routing styles and are difficult or impossible to adjust to meet practical requirements. In this thesis we propose a new graph-theoretic model, namely switching graph model, for the constrained via minimization problem. The switching graph model can represent both grid-based and grid less routing problems, and allows arbitrary wire segments split at a via candidate. Then on the basis of the model, we present the first genetic algorithm for the constrained via minimization problem. This genetic algorithm can tackle various kinds of routing styles and be configured to meet practical constraints. Experimental results show that the genetic algorithm can find the optimal solutions for most cases in reasonable time.

35

Liu, Yansong, and 劉岩松. "Passivity checking and enforcement in VLSI model reduction exercise." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2008. http://hub.hku.hk/bib/B41290690.

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36

Khordoc, Karim. "A MOS switch-level simulator with delay calculation /." Thesis, McGill University, 1986. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=65461.

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37

Whipple, Thomas Driggs 1961. "Design and implementation of an integrated VLSI packaging support software environment." Thesis, The University of Arizona, 1989. http://hdl.handle.net/10150/277105.

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An interactive software shell has been developed which integrates several packaging simulation tools developed at the University of Arizona which are used to analyze electro-magnetic coupling between interconnects in an integrated circuit. This software shell uses experimental frames to manage this simulation process. Through the experimental frames, the model descriptions and the model inputs are separated, and input data is verified for correctness. This model/input separation allows several model variations to be tested based on several input variations. The results of these simulations are then analyzed and displayed graphically. Further work for the software shell is discussed. This tool provides a user-friendly, efficient method for performing coupled-line analyses in interconnect systems.

38

Bishop, Gregory Raymond H. ""On stochastic modelling of very large scale integrated circuits : an investigation into the timing behaviour of microelectronic systems" /." Title page, contents and abstract only, 1993. http://web4.library.adelaide.edu.au/theses/09PH/09phb6222.pdf.

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39

Kosaraju, Chakravarthy S. "A set of behavioral modeling primitives." Thesis, Virginia Tech, 1990. http://hdl.handle.net/10919/41989.

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Modeling is an essential step in the design of digital circuits [71. The coding of behavioral models for complex devices is a labor intensive task. Even with the use of a to01like the "Modeler's Assistant" [4}, the development of behavioral models is time consuming and labor intensive. The use of re-usable code along with a tool like the Modeler's Assistant can speed up model development. This thesis defines a set of higher level primitives which can be used for this purpose. These primitives are built as a macro library into the tool. The Modeler's Assistant together with the modeling primitives provides us with a tool that can simplify the process of model development.

Master of Science

40

Cho, Chang H. "A formal model for behavioral test generation." Diss., This resource online, 1994. http://scholar.lib.vt.edu/theses/available/etd-06062008-170406/.

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41

Deng, Chaodan. "Process development for si-based nanostructures using pulsed UV laser induced epitaxy." Full text open access at:, 1995. http://content.ohsu.edu/u?/etd,206.

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42

Moini, Alireza. "Synthesis of biological vision models using analog VLSI /." Title page, contents and abstract only, 1997. http://web4.library.adelaide.edu.au/theses/09PH/09phm712.pdf.

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43

Tan, Wei-Siong. "A VLSI parallel processor structure for scientific computing." Diss., Georgia Institute of Technology, 1989. http://hdl.handle.net/1853/13455.

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44

Patel, Girish N. "A neuromorphic architecture for modeling intersegmental coordination." Diss., Georgia Institute of Technology, 1999. http://hdl.handle.net/1853/13528.

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45

Gordon, Christal. "An adaptive floating-gate network using action-potential signaling." Thesis, Georgia Institute of Technology, 2000. http://hdl.handle.net/1853/15683.

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46

Măndoiu, Ion I. "Approximation algorithms for VLSI routing." Diss., Georgia Institute of Technology, 2000. http://hdl.handle.net/1853/9128.

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47

梁迅中 and Shun-chung Leung. "Silicon compiler for bit-serial signal processing architecture with automatic time alignment." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1987. http://hub.hku.hk/bib/B31207741.

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48

袁志勤 and Chi-kan Yuen. "A double-track greedy algorithm for VLSI channel routing." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1997. http://hub.hku.hk/bib/B31220241.

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49

Ma, Min. "Model order reduction for efficient modeling and simulation of interconnect networks." Thesis, McGill University, 2007. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=103269.

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Анотація:

As operating frequency increases and device sizes shrink, the complexity of current state-of-the-art designs has increased dramatically. One of the main contributors to this complexity is high speed interconnects. At high frequencies, interconnects become dominant contributors to signal degradation, and their effects such as delays, reflections, and crosstalk must be accurately simulated. Time domain analysis of such structures is however very difficult because, at high frequencies, they must be modeled as distributed transmission lines which, after discretization, result in very large networks. In order to improve the simulation efficiency of such structures, model order reduction has been proposed in the literature. Conventional model order reduction methods based on Krylov subspace have a number of limitations in many practical simulation problems. This restricts their usefulness in general commercial simulators.
In this thesis, a number of new reduction techniques were developed in order to address the key shortcomings of current model order reduction methods. Specifically a new approach for handling macromodels with a very large number of ports was developed, a multi-level reduction and sprasification method was proposed for regular as well as parametric macromodels, and finally a new time domain reduction method was presented for the macromodeling of nonlinear parametric systems. Using these approaches, CPU speedups of 1 to 2 orders of magnitude were obtained.

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Shope, David Allen 1958. "Thermal characterization of VLSI packaging." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276686.

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With electronic packaging becoming more complex, simple hand methods to model the thermal performance of the package are insufficient. As computer aided modeling methods came into use, a test system was developed to verify the predictions produced by such modeling methods. The test system is evaluated for operation and performance. Further, the premise of this type of test (the accurate calibration of packaged temperature-sensitive-parameter devices can be done) is investigated using a series of comparative tests. From this information, causes of possible/probable errors in calibration are identified and related to the different methodologies and devices used. Finally, conclusions are presented regarding the further improvement of the test system and methodologies used in this type of testing.

Дисертації з теми "Integrated circuits Very large scale integration"

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